Laser holographic diffraction efficiency testing device
By designing a laser holographic diffraction efficiency test device including a laser, a sample holder, a lens and a probe, the problem of difficulty in detecting the diffraction efficiency and signal-to-noise ratio of multiple holographic products at the same time is solved, and efficient and low-cost multi-variety detection is achieved.
Patent Information
- Application Number
- CN202422065551.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-08-26
- Publication Date
- 2025-06-17
- Estimated Expiration
- 2034-08-26
AI Technical Summary
The prior art is difficult to detect the diffraction efficiency and signal-to-noise ratio of multiple holographic products at the same time, resulting in high detection costs, waste of resources and difficult quality control.
A laser holographic diffraction efficiency test device is designed, including control circuits, lasers, sample holders, lenses, probes and other components. The laser emits light to irradiate the sample, the lenses and probes collect light intensity signals, and the control circuit performs data processing to realize the detection of multiple holographic products.
It realizes efficient detection of diffraction efficiency and signal-to-noise ratio of various holographic products, reduces detection costs and improves the efficiency of production quality control.
Smart Images

Figure CN222993973U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of inspection and testing, in particular to a laser holographic diffraction efficiency testing device. Background Art
[0002] Holographic products are a relatively popular type of anti-counterfeiting products at present. Their manufacturing technology is difficult and the anti-counterfeiting strength is high, which has been recognized in the anti-counterfeiting technology field. Currently, relatively common holographic products include rainbow holography, dot matrix holography, volume reflection holography, etc. Due to differences in the manufacturing principles of different holographic products and different diffraction light directions, there are also significant differences in the reproduction light source and optical path design of the detection device. One device can only detect one type of holographic product, resulting in problems such as high energy consumption and resource waste, and also increasing the detection cost. At the same time, diffraction efficiency and signal-to-noise ratio are important physical characteristic indicators for measuring holographic products. Many enterprises still rely on visual observation and the experience of personnel operation to determine whether the products are qualified during the production of holographic products. The film pressing process is a key point for quality control. If the diffraction efficiency and signal-to-noise ratio indicators cannot be quantified, there will be certain risks in the quality of the products leaving the factory. Based on the above two aspects of the current situation, it is necessary to develop an integrated device that can complete the detection of multiple varieties and multiple products, and at the same time, the detection device is miniaturized and portable, which can provide detection means for the on-line quality control of production enterprises. Content of the Utility Model
[0003] In view of the above technical problems, the utility model provides a laser holographic diffraction efficiency testing device with convenient operation and high efficiency to solve the measurement problems of the diffraction efficiency and signal-to-noise ratio of holographic products. The technical solution adopted is as follows:
[0004] The specific technical solution is as follows:
[0005] A laser holographic diffraction efficiency testing device includes a control circuit, a first switch, a second switch, a third switch, a laser, a sample holder, a camera, a lens, a lifting knob, and a probe.
[0006] The laser is controlled and switched by the first switch;
[0007] The sample holder is placed below the laser, and the excitation light emitted by the laser irradiates the sample on the sample holder.
[0008] A camera is provided on one side of the sample holder for remote computer monitoring of the picture.
[0009] The lens is used as a tool for holographic diffraction; the lens is installed on the lifting knob, the second switch is the horizontal movement switch of the lens, and the lifting knob is used to adjust the height position of the lens; the lens is also connected to the sample holder; the probe is placed in front of the lens; the third switch is the movement switch of the probe. The direction of toggling the switch is the same as the movement direction of the controlled device.
[0010] The described control circuit is used for data acquisition, converting the light intensity signal collected by the probe into a voltage signal, performing A / D conversion on the voltage signal, and transmitting it to the computer in real time for data processing.
[0011] Furthermore, the lasers are three semiconductor lasers, two of which are 532 nm and one is 650 nm. Parameters such as output power, power stability, frequency stability, beam divergence angle, and beam waist diameter are all required to meet relevant standards, and the three lasers can be rotated.
[0012] Furthermore, the sample holder is used to place samples. It is a two-dimensional moving mechanism composed of an X-axis and a Y-axis, and the placement position of the sample can be manually changed, and multiple samples can be placed simultaneously.
[0013] Furthermore, the outer barrel, spacer ring, lens retaining ring, and retaining ring of the lens in the lens are all required to be treated by oxidation and blackening.
[0014] The laser holographic diffraction efficiency test device provided by the present utility model has a simple principle and convenient operation, filling the technical gap and method gap in the diffraction efficiency and signal-to-noise ratio tests of holographic products. BRIEF DESCRIPTION OF THE DRAWINGS
[0015] Figure 1 is a schematic cross-sectional structure diagram of the device of the present utility model. DETAILED DESCRIPTION OF THE EMBODIMENTS
[0016] The specific embodiments of the present utility model will be described in conjunction with the embodiments.
[0017] As Figure 1 shown, a laser holographic diffraction efficiency test device includes a control circuit 1, a first switch 2, a second switch 3, a third switch 4, a laser 5, a sample holder 6, a camera 7, a lens 8, a lifting knob 9, and a probe 10.
[0018] The laser 5 includes two 532 nm and one 650 nm semiconductor lasers. The laser 5 is controlled and switched by the first switch 2;
[0019] The sample holder 6 includes a two-dimensional moving mechanism composed of an X-axis and a Y-axis. The sample holder 6 is placed below the laser 5, and the excitation light emitted by the laser 5 irradiates the sample on the sample holder 6.
[0020] A camera 7 is provided on one side of the sample holder 6 for remotely monitoring the computer screen.
[0021] The lens 8 serves as a tool for holographic diffraction; the lens 8 is mounted on the lifting knob 9, and the second switch 3 is the horizontal movement switch for the lens 8. The lifting knob 9 is used to adjust the height position of the lens 8; the lens 8 is also connected to the sample holder 6; the probe 10 is placed in front of the lens 8; the third switch 4 serves as the movement switch for the probe 10.
[0022] The described control circuit is used for data acquisition, converts the light intensity signal collected by the probe 10 into a voltage signal, performs A / D conversion on the voltage signal, and transmits it to the computer in real time for data processing.
[0023] The using process is as follows: turn on the control circuit 1, the first switch 2 determines the used laser 5. After the device is powered on and preheated, place the sample to be measured on the sample holder 6, adjust the positions of the second switch 3, the third switch 4 and the lifting knob 9 to ensure the positions of the lens 8 and the probe 10, so that the light emitted by the laser just hits the center of the lens 8 and the light intensity received by the probe 10 is the maximum. The values of the diffraction efficiency and the signal-to-noise ratio can be obtained through formula calculation based on the light intensity value measured by the device.
Claims
1. A laser holographic diffraction efficiency testing device, characterized in that: It comprises a control circuit (1), a first switch (2), a second switch (3), a third switch (4), a laser (5), a sample holder (6), a camera (7), a lens (8), a lifting knob (9), and a probe (10); The laser (5) is switched by the first switch (2); The sample holder (6) is placed below the laser (5), and the excitation light emitted by the laser (5) is irradiated onto the sample on the sample holder (6); A camera (7) is provided on one side of the sample rack (6) for remote computer monitoring of the image; The lens (8) is used as a tool for holographic diffraction; the lens (8) is mounted on a lifting knob (9); the second switch (3) is a horizontal movement switch of the lens (8); the lifting knob (9) is used to adjust the height position of the lens (8); the lens (8) is also connected to a sample holder (6); the probe (10) is placed in front of the lens (8); the third switch (4) is used as a movement switch of the probe (10); The control circuit is used for data collection, converting the light intensity signal collected by the probe (10) into a voltage signal, performing A / D conversion on the voltage signal, and transmitting it to the computer in real time for data processing.
2. The laser holographic diffraction efficiency testing device according to claim 1, characterized in that: The laser (5) comprises two 532nm and one 650nm semiconductor lasers.
3. The laser holographic diffraction efficiency testing device according to claim 1, characterized in that: The sample rack (6) comprises a two-dimensional moving mechanism consisting of an X-axis and a Y-axis.