Test clamp for testing GIS loop resistance

By designing a test clamp for testing GIS loop resistance, and using an external support spring to maintain the separate state of the conductive head of the test clamp, the problem of difficulty in maintaining separation of the test terminals and poor fixed retention in the prior art is solved, efficient and accurate test results are achieved, and operation risks are reduced.

CN222994525UActive Publication Date: 2025-06-17SHANDONG ELECTRIC POWER CONSTR NO 2
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Patent Information

Application Number
CN202421779632.8
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-07-25
Publication Date
2025-06-17
Estimated Expiration
2034-07-25

AI Technical Summary

Technical Problem

When the existing GIS loop resistance test tool is inserted into the screw hole, it is difficult to maintain the test terminals in a separate state, easy to contact and affect the test results, and poor fixed retention, resulting in low testing efficiency and safety risks in operation.

Method used

A test clamp for testing GIS loop resistance was designed, using two test clamp halves set up in a rotary assembly, and kept it separate through an external support spring to ensure that the conductive head of the test clamp is in close contact with the inner wall of the detection port and avoid contact.

Benefits of technology

The external support spring maintains the separation state of the conductive head of the test pliers, ensuring the accuracy and stability of the test results, improving the testing efficiency, reducing operating risks, and enhancing the anti-detachment effect of the test pliers.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model discloses a test clamp used for testing GIS loop resistance, comprising two test clamp half bodies and an external support spring, the end portions of the two test clamp half bodies are respectively and correspondingly connected with test clamp conductive heads, the two test clamp half bodies are respectively connected with test leads, and the external support spring is arranged on the test clamp conductive heads. The test clamp conductive heads are electrically connected with the test wires on the corresponding test clamp half bodies, and the electric connection positions of the test clamp conductive heads and the test wires are arranged in the corresponding test clamp half bodies; according to the utility model, the conductive heads of the two test clamps are always kept in a separated state, and the distance between the conductive heads is kept constant after the conductive heads are inserted into a detection port of the GIS, so that the phenomenon of contact in the port is avoided, and the accuracy of a test result is ensured; the device is simple, convenient and fast to operate, and can reduce the test time of the loop resistance, thereby improving the test efficiency, and greatly shortening the working time of testers near high-voltage power equipment.
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Description

Technical Field

[0001] The utility model relates to the technical field of power equipment detection tools, in particular to a test clamp for testing the loop resistance of GIS. Background Art

[0002] In high-voltage equipment, it is one of the important conditions to ensure the safe operation of GIS circuit breakers that the conductive circuit of GIS circuit breakers needs to maintain good contact. Therefore, it is very necessary to detect and maintain the GIS circuit breaker loop. For example, by implementing the GIS loop resistance test to check the connection and contact conditions of the contacts in the conductive circuit to ensure the safe operation of the equipment. Currently, the tools used in the test of GIS loop resistance are as Figure 4 shown. The test terminals of the voltage wire and the current wire are inserted and held in the screw holes of the GIS circuit breaker by pliers. The problems of the above operation method are as follows:

[0003] First, the test terminals of the voltage wire and the current wire need to be inserted into the screw hole at the same time, and the two need to be kept non-contact in the hole to avoid affecting the test results. Since the test terminals are located in the hole, it is difficult to observe and adjust them in real time.

[0004] Second, the inner diameter of the screw hole is small, and the fixed retention of the two test terminals in the separated state is poor when inserted at the same time, and it is very easy to fall off or touch, so the adjustment operation has to be repeated, resulting in low test efficiency.

[0005] Third, the test personnel need to climb to a height to maintain the state of detecting the test terminals and test clips, which is close to power equipment such as GIS circuit breakers. The low-efficiency and long-term climbing detection operation increases the risk of the operation.

[0006] In the prior art, there are also tests with the help of test clips, that is, a wire is connected to each of the two test clips. During the test, the two test clips are clamped on the hole wall of the screw hole at the same time, and the voltage and current are led out through the correspondingly connected wires. Although the operation is simple and does not require manual auxiliary fixation, the clamping area required by the test clips is large while the inner diameter of the nut is small, so it is easier to contact and fall off each other. Summary of the Utility Model

[0007] The technical problem to be solved by the utility model is to provide a test clamp for testing the loop resistance of GIS, which has good fixed retention after being inserted into the detection port, and the two test ends will not contact in the hole, so as not to affect the detection results, and thus helps to improve the test efficiency.

[0008] To solve the above technical problems, the technical solution of the present utility model is as follows: A test clamp for testing the loop resistance of a GIS includes two test clamp halves that are rotatably assembled. An external support spring for keeping the two in a separated state is connected between the two test clamp halves. Test clamp conductive heads are respectively connected to the ends of the two test clamp halves. Test wires are also respectively connected to the two test clamp halves. The test clamp conductive heads are electrically connected to the corresponding test wires on the test clamp halves, and the electrical connection position between the test clamp conductive heads and the test wires is arranged inside the corresponding test clamp halves.

[0009] As a preferred technical solution, a conductive head assembly groove is provided at the end of the test clamp half. The test clamp conductive head is inserted into the corresponding conductive head assembly groove, and a conductive head insulating sleeve is clamped between the test clamp conductive head and the conductive head assembly groove.

[0010] As a preferred technical solution, a wire plug connector is fixedly connected to the end of the test wire. The test wire is detachably inserted into the test clamp half through the wire plug connector.

[0011] As a preferred technical solution, the wire plug connector is provided with a wire electrical connection body that penetrates through the test clamp half and the conductive head insulating sleeve. An electrical connection body slot for plugging and mating with the wire electrical connection body is provided on the test clamp conductive head. An electrical connection body insulating sleeve that is insulated from the test clamp half is sleeved on the wire electrical connection body.

[0012] As an improvement to the above technical solution, the test clamp conductive head includes a conductive head fixing part connected to the test clamp half. A conductive head movable part is rotatably assembled at the end of the conductive head fixing part. The conductive head movable part is used to adapt to the angle change when the test clamp conductive head is inserted into the GIS circuit breaker.

[0013] Due to the adoption of the above technical solution, a test clamp for testing the loop resistance of a GIS includes two test clamp halves that are rotatably assembled. An external support spring for keeping the two in a separated state is connected between the two test clamp halves. Test clamp conductive heads are respectively connected to the ends of the two test clamp halves. Test wires are also respectively connected to the two test clamp halves. The test clamp conductive heads are electrically connected to the corresponding test wires on the test clamp halves, and the electrical connection position between the test clamp conductive heads and the test wires is arranged inside the corresponding test clamp halves. The present utility model has the following beneficial effects:

[0014] 1. Through the cooperation of the external support spring and the two test clamp halves, the two test clamp conductive heads are always kept in a separated state. After being inserted into the detection port of the GIS, the distance between the two remains constant. Therefore, there will be no phenomenon of contact inside the port, which helps to ensure the accuracy of the test results.

[0015] 2. Under the action of the outer support spring, the conductive head of the test clamp enters the detection port and makes close contact with its inner wall, with good stability and a good anti - detachment effect.

[0016] 3. It is simple and convenient to operate, fast, can reduce the test time of loop resistance, thus improving the test efficiency and greatly reducing the working time of testers near high - voltage power equipment. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] The following drawings are only intended to illustrate and explain the present utility model schematically and do not limit the scope of the present utility model. Among them:

[0018] Figure 1 is a schematic structural diagram of an embodiment of the present utility model;

[0019] Figure 2 is a schematic partial cross - sectional structural diagram of an embodiment of the present utility model;

[0020] Figure 3 is a schematic diagram of the angle adaptation state of the movable part of the conductive head in an embodiment of the present utility model;

[0021] Figure 4 is a schematic diagram of the use state of the prior art;

[0022] In the figure: 1 - half body of the test clamp; 2 - outer support spring; 3 - conductive head of the test clamp; 31 - fixed part of the conductive head; 32 - movable part of the conductive head; 4 - test wire; 5 - insulating sleeve of the conductive head; 6 - wire plug; 7 - wire electrical connector; 8 - slot of the electrical connector; 9 - insulating sleeve of the electrical connector. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0023] The present utility model will be further described below in conjunction with the drawings and embodiments. In the following detailed description, only some exemplary embodiments of the present utility model are described by way of illustration. Undoubtedly, those of ordinary skill in the art can recognize that the described embodiments can be modified in various different ways without departing from the spirit and scope of the present utility model. Therefore, the drawings and description are illustrative in nature and not used to limit the protection scope of the claims.

[0024] Such as Figure 1 and Figure 2As shown in the figure, a test clamp for testing the loop resistance of a GIS is inserted into the screw hole of the GIS circuit breaker serving as a detection port during use to detect current and voltage. Specifically, it includes two rotatably assembled test clamp halves 1. An outer support spring 2 for keeping the two test clamp halves 1 in a separated state is connected between the two test clamp halves 1. The end parts of the two test clamp halves 1 are respectively connected with test clamp conductive heads 3. The outer support spring 2 is set as a compression spring, which is used to push the two test clamp halves 1 outwards under normal conditions, so that the two test clamp conductive heads 3 are always kept in a separated state, avoiding contact during use and affecting the test results and the test process. To improve the safety of using the test clamp, insulating handle sleeves are sleeved on the hand-held operation positions of the two test clamp halves 1.

[0025] Test leads 4 are respectively connected to the two test clamp halves 1. The test clamp conductive head 3 is electrically connected to the test lead 4 on the corresponding test clamp half 1, and the electrical connection position of the test clamp conductive head 3 and the test lead 4 is arranged inside the corresponding test clamp half 1. Through the cooperation of the test lead 4 and the test clamp conductive head 3, the voltage, current, etc. obtained from the test are transmitted to devices such as a loop resistance tester for analysis and use. Through the above design in this embodiment, the test lead 4, the test clamp conductive head 3, and the test clamp half 1 form an integrated structure, without disassembly and assembly operations, and the electrical connection points are arranged inside the test clamp half 1, making the external structure simple and regular.

[0026] In this embodiment, a conductive head assembly groove is provided at the end of the test clamp half 1. The test clamp conductive head 3 is inserted into the corresponding conductive head assembly groove, and a conductive head insulating sleeve 5 is clamped between the test clamp conductive head 3 and the conductive head assembly groove, making the test clamp half 1 and the test clamp conductive head 3 form an insertion structure. The conductive head insulating sleeve 5 isolates the test clamp half 1 from the circuit, thus improving the safety of use.

[0027] As Figure 2As described above, a wire plug connector 6 is fixedly connected to the end of the test wire 4. The test wire 4 is detachably inserted into the test clamp half body 1 through the wire plug connector 6, so that the test wire 4 can be separated from the test clamp half body 1, which is convenient for storage and helps to protect the wire, preventing it from being broken or damaged. Specifically, the wire plug connector 6 is provided with a wire electrical connection body 7 that penetrates through the test clamp half body 1 and the conductive head insulating sleeve 5. An electrical connection body slot 8 that is inserted and matched with the wire electrical connection body 7 is provided on the test clamp conductive head 3. An electrical connection body insulating sleeve 9 that is in insulating contact with the test clamp half body 1 is sleeved on the wire electrical connection body 7. After the wire plug connector 6 is inserted into the test clamp half body 1, the end of the wire electrical connection body 7 extends into the electrical connection body slot 8 to contact the test clamp conductive head 3, so as to connect the circuit for transmitting voltage or current. An insulating contact is formed between the wire electrical connection body 7 and the test clamp half body 1 through the electrical connection body insulating sleeve 9 to prevent electric leakage and ensure the safe use of the test clamp half body 1.

[0028] As Figure 3 As shown, in this embodiment, the test clamp conductive head 3 can also be set into two parts, that is, it includes a conductive head fixed part 31 connected to the test clamp half body 1. A conductive head movable part 32 is rotatably assembled at the end of the conductive head fixed part 31. The conductive head movable part 32 is used to adapt to the angle change when the test clamp conductive head 3 is inserted into the GIS circuit breaker. When the test clamp conductive head 3 is inserted into the detection port of the GIS circuit breaker, since the two test clamp half bodies 1 are inclined, the two test clamp conductive heads 3 are also inclined, and thus the contact with the inner wall of the detection port is small, resulting in unstable detection. After the above improvement is made to the test clamp conductive head 3, the end of the conductive head fixed part 31 abuts against the inner wall of the detection port to achieve the support and fixation effect of the entire test clamp. The conductive head movable part 32 automatically adjusts by a corresponding angle under the rotation action, so that its outer wall can closely adhere to the inner wall of the detection port, thereby increasing the contact area with the inner wall of the detection port to improve the stability of the detection.

[0029] The description of the present invention is given for purposes of illustration and description, and is not intended to be exhaustive or to limit the present invention to the disclosed form. Many modifications and variations are obvious to those of ordinary skill in the art. The embodiments are chosen and described in order to best explain the principles of the present invention and its practical application, and to enable those of ordinary skill in the art to understand the present invention so as to design various embodiments with various modifications suitable for specific purposes.

Claims

1. A test clamp for testing GIS loop resistance, comprising two test clamp halves rotatably assembled, an external support spring for keeping the two halves separated connected between the two test clamp halves, characterized in that: The ends of the two test clamp halves are respectively connected to test clamp conductive heads, and the two test clamp halves are also respectively connected to test wires. The test clamp conductive heads are electrically connected to the test wires on the corresponding test clamp halves, and the electrical connection positions between the test clamp conductive heads and the test wires are arranged in the corresponding test clamp halves.

2. The test clamp for testing GIS loop resistance according to claim 1, characterized in that: The end of the test clamp half body is provided with a conductive head assembly groove, the test clamp conductive head is inserted into the corresponding conductive head assembly groove, and a conductive head insulating sleeve is sandwiched between the test clamp conductive head and the conductive head assembly groove.

3. The test clamp for testing GIS loop resistance according to claim 2, characterized in that: The end of the test wire is fixedly connected with a wire plug connector, and the test wire can be detachably plugged into the test clamp half body through the wire plug connector.

4. The test clamp for testing GIS loop resistance according to claim 3, characterized in that: The wire plug connector is provided with a wire electrical connector that passes through the test clamp half and the conductive head insulating sleeve. The test clamp conductive head is provided with an electrical connector slot that is plugged into and matched with the wire electrical connector. The wire electrical connector is covered with an electrical connector insulating sleeve that is insulated and in contact with the test clamp half.

5. The test clamp for testing GIS loop resistance according to claim 1, characterized in that: The conductive head of the test clamp includes a conductive head fixing part connected to the test clamp half, and the end of the conductive head fixing part is rotatably equipped with a conductive head movable part, and the conductive head movable part is used to adapt to the angle change when the conductive head of the test clamp is inserted into the GIS circuit breaker.