Scanning lens light spot offset microscopic imaging system

Abstract

The utility model discloses a scanning lens light spot shift microscopic imaging system, which comprises a laser beam combining module, a microscopic imaging module and a spectrum detection analysis module, a laser generates two lasers with the same wavelength, the two lasers are combined through the laser beam combining module, the position of a certain laser focusing sample is changed through a scanning lens, and the light spot shift of the scanning lens is detected through the spectrum detection analysis module. And through the microscopic imaging module and the spectrum detection and analysis module, excitation spectrum detection is simultaneously carried out on different area positions of the sample by two lasers with the same wavelength, and the transmission efficiency of the optical waveguide is observed. According to the utility model, the scanning lens is adopted to realize large-range movement of a laser focusing spot in a sample area, and dual-wavelength common excitation acts on different areas of a sample so as to detect an excitation spectrum and test the optical waveguide transmission efficiency of the sample.

Description

Technical Field

[0001] The utility model relates to the field of excitation spectrum detection, in particular to a scanning lens spot offset microscopic imaging system. Background Art

[0002] In the existing spectrum detection and analysis, usually a single-wavelength laser is used as the excitation light to excite a sample, and illumination imaging is used to select the excitation area; the traditional microscopic imaging system consists of a lighting light source module, an objective lens, a stage, a tube lens, a camera and other structures, which has singularity and fixed function modules. In the existing excitation spectrum detection system, two lasers with the same wavelength act on the sample together, and the two spots can achieve spot overlap, but the two spots cannot be offset and separated, or offset by a certain distance. Summary of the Utility Model

[0003] Purpose of the utility model: The purpose of the utility model is to provide a scanning lens spot offset microscopic imaging system, which changes the position of a certain laser focused on the sample through a scanning lens to achieve offset imaging of two spots.

[0004] Technical solution: The utility model includes a laser beam combining module, a microscopic imaging module and a spectrum detection and analysis module. Two lasers with the same wavelength generated by a laser generator are combined through the laser beam combining module, and the position of a certain laser focused on the sample is changed through a scanning lens, and then through the microscopic imaging module and the spectrum detection and analysis module, excitation spectrum detection is simultaneously carried out on different regions of the sample by two lasers with the same wavelength, and the optical waveguide transmission efficiency is observed.

[0005] Further, the laser beam combining module includes two laser generators, a plurality of reflectors, a scanning lens, a lens, a first beam splitting flat plate and a second beam splitting flat plate, and the lens includes a first lens, a second lens, a third lens and a fourth lens.

[0006] Further, the two laser generators generate two laser beams. One laser beam is collimated by a reflector and enters the scanning lens, and then is combined with the other laser beam through the first beam splitting flat plate, and then enters the objective lens through the first lens and then through the second beam splitting flat plate. The scanning lens and the second lens form a 4f system.

[0007] Further, the first lens and the second lens form a 4f system, and by finely adjusting the position of the first lens, the two laser beams generated by the two laser generators are focused on the same focal plane.

[0008] Furthermore, the microscopic imaging module includes a third beam splitting flat plate, a 550 nm short-wave pass dichroic mirror, a fourth lens, and a camera. The illumination light of the reflective pre-collimated light source is reflected by the third beam splitting flat plate and enters the objective lens to be focused on the sample. The reflected light of the sample outputs parallel light through the infinity objective lens, and the returned light passes through the 550 nm short-wave pass dichroic mirror and is imaged on the target surface of the camera, obtaining a clear image of a certain area on the sample surface.

[0009] Furthermore, the spectral detection and analysis module includes a third lens, a 550 nm short-wave pass dichroic mirror, and a spectrometer. The combined light is reflected by the second beam splitting flat plate and enters the main structure of the microscopic imaging. It enters the objective lens and is focused on the sample surface. Through microscopic imaging, the position of the excitation light on the sample surface can be clearly seen. The spectrum of the returned signal passes through the second beam splitting flat plate and the third beam splitting flat plate, and then is reflected by the 550 nm short-wave pass dichroic mirror and enters the spectral analysis optical path. It is then focused by the third lens. The light returning through the objective lens is parallel light and enters the receiving target surface position of the spectrometer for spectral detection.

[0010] Furthermore, the third lens selects the best-shaped lens with a focal length of 50 mm, so that the distance between the third lens and the receiving part of the spectrometer is the focal length of the lens.

[0011] Beneficial effects: Compared with the prior art, the present invention has the following advantages: By using a scanning lens, a large-range movement of the laser focusing spot in the sample area is realized, and the dual-wavelength co-excitation is realized to act on different areas of the sample to detect the excitation spectrum and test the optical waveguide transmission efficiency of the sample. Description of the Drawings

[0012] Figure 1 is the schematic diagram of the present invention;

[0013] Figure 2 is the structural model diagram of the present invention. Detailed Embodiments

[0014] The technical solutions of the present invention will be further described below with reference to the drawings.

[0015] As Figure 2 shown, it is the structural model diagram of the present invention. By combining two identical wavelengths and using a scanning lens, a large-range movement of the excitation light focusing spot can be realized, and two positions in different areas of the sample can be simultaneously excited by two lasers with the same wavelength to observe the excitation spectrum and the transmission efficiency of the optical waveguide.

[0016] As Figure 1 shown, it is the schematic diagram of the present invention. The present invention includes a laser beam combining module, a microscopic imaging module, and a spectral detection and analysis module.

[0017] The laser beam combining module includes two lasers, multiple mirrors, a scanning lens 1, lenses, a first beam splitting flat plate 2, and a second beam splitting flat plate 3. The lenses include a first lens 7, a second lens 8, a third lens 9, and a fourth lens 10. Two 532-nm lasers are used. The collimated output of the lasers is adjusted through two silver film mirrors respectively. The 532-nm laser-1 is adjusted through the mirror so that the laser is collimated and input into the scanning lens. After passing through the scanning lens, the light beam passes through the 50:50 first beam splitting flat plate 2; then it enters the second beam splitting flat plate 3 and is reflected into the objective lens; the 532-nm laser-2 is made to be collimated into the second lens 8 through the mirror; it enters the 50:50 first beam splitting flat plate 2 and is reflected through the first lens 7. The first lens 7 and the second lens 8 form a 4f system. By finely adjusting the position of the first lens 7 with a fine adjustment mechanical part, the 532-nm laser-2 and the 532-nm laser-1 are focused on the same focal plane through the objective lens.

[0018] The spot offset is achieved by adjusting the adjustment knob on the mirror mount where the mirror is located, so that the spot of the 532-nm laser-1 can be offset in the sample and can be clearly seen in the camera.

[0019] The microscopic imaging module includes a third beam splitting flat plate 4, a 550-nm short-wave pass dichroic mirror 5, a fourth lens 10, and a camera. The microscopic imaging module is built into an imaging optical path. The reflected pre-collimated light source illumination light is reflected by the 50:50 third beam splitting flat plate 4 and enters the objective lens to be focused on the sample. The light reflected by the sample outputs parallel light through the infinity objective lens. The returned light passes through the 550-nm short-wave pass dichroic mirror 5 and is imaged on the camera target surface through the tube lens, obtaining a clear image of a certain area on the sample surface.

[0020] The spectral detection and analysis module includes a third lens 9, a 550-nm short-wave pass dichroic mirror 5, and a spectrometer 6. The combined 532-nm laser light is reflected by the 50:50 second beam splitting flat plate 3 and enters the main structure of the microscopic imaging. It enters the objective lens and is focused on the sample surface. Through microscopic imaging, the position of the excitation light on the sample surface can be clearly seen. The spectrum of the returned signal passes through the 50:50 second beam splitting flat plate 3 and the 50:50 third beam splitting flat plate 4, and is then reflected by the 550-nm short-wave pass dichroic mirror 5 into the spectral analysis optical path. It is further focused by the third lens 9. The light returned through the objective lens is parallel light. The best-shaped lens with a focal length of 50 mm is selected, so that the distance between the third lens 9 and the receiving position of the spectrometer 6 is the focal length of the lens, and the light enters the receiving target surface position of the spectrometer 6 for spectral detection.

[0021] The 532nm laser - 1 makes the light beam collimated into the scanning lens 1 through the mirror - 1 and the mirror - 2, and then transmits through the 50∶50 first beam - splitting flat plate 2 to achieve beam combination with the 532nm laser - 2. The scanning lens 1 and the first lens 7 form a lens group; the 532nm laser - 2 enters the second lens 8 through reflection by a mirror, and then outputs collimated light through another mirror, and is reflected by the 50∶50 first beam - splitting flat plate 2 into the first lens 7. The first lens 7 and the second lens 8 form a 4f lens group. By finely adjusting the position of the first lens 7, the 532nm laser - 2 and the 532nm laser - 1 are beam - combined through the second beam - splitting flat plate 3 and focused on the same focal plane through the objective lens.

[0022] The LED illumination source is reflected by the 50∶50 second beam - splitting flat plate 3 and enters the 50∶50 third beam - splitting flat plate 4, and then transmits into the objective lens; the parallel light returned by the objective lens passes through the 50∶50 second beam - splitting flat plate 3 and the 50∶50 third beam - splitting flat plate 4, passes through the 550nm short - wave - pass dichroic mirror 5, and is focused on the camera CCD target surface through the tube lens.

[0023] The excitation light of the sample sequentially transmits through the 50∶50 second beam - splitting flat plate 3 and the 50∶50 third beam - splitting flat plate 4, and then is reflected by the 550nm short - wave - pass dichroic mirror 5 and enters the third lens 9 and is coupled into the spectrometer 6.

Claims

1. A scanning lens spot offset microscopic imaging system, characterized in that: It includes a laser beam combining module, a microscopic imaging module, and a spectral detection and analysis module. The laser generates two lasers with the same wavelength, which are combined by the laser beam combining module, and the position of a certain laser focused on the sample is changed through a scanning lens (1). Then, through the microscopic imaging module and the spectral detection and analysis module, the excitation spectra of two lasers with the same wavelength are simultaneously detected at different positions of the sample, and the optical waveguide transmission efficiency is observed.

2. The scanning lens spot offset microscopic imaging system according to claim 1, wherein: The laser beam combining module includes two lasers, multiple reflectors, a scanning lens (1), a lens, a first beam splitting flat plate (2), and a second beam splitting flat plate (3). The lens includes a first lens (7), a second lens (8), a third lens (9), and a fourth lens (10).

3. The scanning lens spot offset microscopic imaging system according to claim 1, wherein: Two lasers generate two laser beams. One laser beam is collimated by a reflector and enters the scanning lens (1), then is combined with the other laser beam through the first beam splitting flat plate (2), and then enters the objective lens through the first lens (7) and then through the second beam splitting flat plate (3). The scanning lens (1) and the second lens (8) form a 4f system.

4. The scanning lens spot offset microscopic imaging system according to claim 2, wherein: The first lens (7) and the second lens (8) form a 4f system. By finely adjusting the position of the first lens (7), the two laser beams generated by the two lasers are focused on the same focal plane.

5. The scanning lens spot offset microscopic imaging system according to claim 1, characterized in that: The microscopic imaging module includes a third beam splitting flat plate (4), a 550nm short-wave pass dichroic mirror (5), a fourth lens (10), and a camera. The illumination light of the reflective pre-collimated light source is reflected by the third beam splitting flat plate (4) and enters the objective lens to be focused on the sample. The reflected light of the sample outputs parallel light through the infinity objective lens, and the returned light passes through the 550nm short-wave pass dichroic mirror (5) and is imaged on the camera target surface to obtain a clear image of a certain area on the sample surface.

6. The scanning lens spot offset microscopic imaging system according to claim 1, wherein: The spectral detection and analysis module includes a third lens (9), a 550nm short-wave pass dichroic mirror (5), and a spectrometer (6). The combined light is reflected by the second beam splitting flat plate (3) and enters the main structure of the microscopic imaging. It enters the objective lens and is focused on the sample surface. Through microscopic imaging, the position of the excitation light on the sample surface can be clearly seen. The spectrum of the returned signal passes through the second beam splitting flat plate (3) and the third beam splitting flat plate (4), and is then reflected by the 550nm short-wave pass dichroic mirror (5) and enters the spectral analysis optical path. It is then focused by the third lens (9). The light returned through the objective lens is parallel light and enters the receiving target surface position of the spectrometer for spectral detection.

7. The scanning lens spot offset microscopic imaging system according to claim 6, wherein: The third lens (9) selects the best-shaped lens with a focal length of 50mm, so that the distance between the third lens (9) and the receiving part of the spectrometer is the focal length of the lens.

Images