Stable and effective test pin

Abstract

The utility model discloses a stable and effective test pin, which comprises a needle tube and a needle head, the bottom end of the needle tube is symmetrically provided with movable grooves, the top of the needle head is movably provided with a connecting rod, and the movable rod at the top of the connecting rod is driven to be accommodated at the bottom end in the movable grooves along the communication of an L-shaped mounting groove and the movable grooves. Meanwhile, when the needle head is extruded in the semiconductor chip testing process, the movable rod on the connecting rod connected with the needle head is located in the movable groove all the time and used for preventing the needle head from sliding out of the needle tube after being used for a long time, the needle head is pushed to enter a testing state through extrusion of the semiconductor chip on the needle head, and the testing efficiency is improved. Meanwhile, through interference fit installation between the fixing rod and the fixing hole, a movable distance of the needle head is reserved for inclined extrusion of the semiconductor chip on the needle head, and the needle head is used for preventing excessive extrusion between the semiconductor chip and the needle head.

Description

Technical Field

[0001] The utility model relates to the technical field of semiconductor chip detection, in particular to a stable and effective test pin. Background Technique

[0002] The semiconductor chip test pin, also known as a test probe, is an indispensable key component in the semiconductor testing process. The probe is installed inside a socket or fixture and is used to connect the semiconductor chip to the test substrate. By transmitting a certain current and frequency, it determines whether the object under test is qualified.

[0003] The existing semiconductor chip test pins include a needle tube and a needle tip. The needle tip is formed after being riveted and pre-pressed inside the needle tube by a precision instrument. A precision return spring is arranged inside the needle tube. During semiconductor testing, the needle tip of the probe will slide back and forth inside the needle tube. During long-term use, the needle tip is likely to fall off the needle tube, resulting in poor stability and inconvenience in use. At the same time, since the test pins will be installed on the socket of the robot arm, and some of the pins installed on the robot arm are in an inclined state. When the pin contacts the semiconductor chip, it will drive a certain degree of extrusion between the pin and the semiconductor chip. Therefore, it will drive the needle tip to squeeze the inner wall of the needle tube, increasing the diameter of the needle tube and further increasing the risk of the needle tip falling off the needle tube. Content of the Utility Model

[0004] The purpose of the utility model is to provide a stable and effective test pin to solve the problems raised in the above background technique.

[0005] To achieve the above purpose, the utility model provides the following technical solution: A stable and effective test pin, including a needle tube and a needle tip. The bottom end of the needle tube is symmetrically provided with movable grooves. A connecting rod is movably installed at the top of the needle tip. The top of the connecting rod is symmetrically and fixedly installed with movable rods. The movable rods are slidably connected with the movable grooves. A spring is installed inside the needle tube.

[0006] As a further preferred of this technical solution, the bottom end of the needle tube is symmetrically provided with L-shaped installation grooves, and the top end of the L-shaped installation grooves is communicated with the movable grooves.

[0007] As a further preferred of this technical solution, chamfers are provided at the ends and turning points of the movable grooves and the L-shaped installation grooves.

[0008] As a further preferred of this technical solution, a ring is fixedly installed at the bottom end of the spring, and the ring is in contact with the top end of the connecting rod.

[0009] As a further preferred of this technical solution, a fixing hole is provided at the bottom end of the connecting rod, and a fixing rod is fixedly installed at the top of the needle tip. The fixing rod is installed in the fixing hole with an interference fit.

[0010] As a further preference of the technical solution, the distance between the bottom end of the movable groove and the top end of the L-shaped installation groove is greater than the moving distance of the needle during testing.

[0011] As a further preference of the technical solution, an arc-shaped positioning ring is threadedly installed at one end of the movable rod away from the connecting rod.

[0012] The utility model provides a stable and effective test pin, which has the following beneficial effects:

[0013] (1) In the utility model, the movable rod at the top of the connecting rod is slid into the L-shaped installation groove. At this time, the connecting rod will compress the spring until the movable rod slides to the top of the L-shaped installation groove. Then, when the needle is rotated, the movable rod will move into the movable groove. The spring's push on the top of the connecting rod will drive the movable rod to be received at the bottom end inside the movable groove, facilitating the installation between the needle and the needle tube. At the same time, during the test of the semiconductor chip, when the needle is squeezed, the semiconductor chip will push the needle in the opposite direction to enter the test state. At this time, the spring will be compressed, and the movable rod on the connecting rod connected to the needle is always inside the movable groove, preventing the needle from sliding out of the needle tube during long-term use.

[0014] (2) In the utility model, the extrusion of the semiconductor chip on the needle will push the needle into the test state. At the same time, through the interference fit installation between the fixing rod and the fixing hole, a movable distance for the needle is left for the inclined extrusion of the semiconductor chip on the needle, preventing excessive extrusion between the semiconductor chip and the needle. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] Figure 1 is the overall structural schematic diagram of the utility model;

[0016] Figure 2 is the overall exploded structural schematic diagram of the utility model;

[0017] Figure 3 is the partial structural schematic diagram of the utility model;

[0018] In the figure: 1, needle tube; 2, needle; 3, movable groove; 4, connecting rod; 5, movable rod; 6, spring; 7, L-shaped installation groove; 8, chamfer; 9, ring; 10, fixing hole; 11, fixing rod; 12, arc-shaped positioning ring. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0019] The following will clearly and completely describe the technical solutions in the embodiments of the utility model with reference to the accompanying drawings in the embodiments of the utility model.

[0020] The utility model provides a technical solution: As Figures 1 to 3As shown, in this embodiment, a stable and effective test pin includes a needle tube 1 and a needle tip 2. The needle tube 1 is made of gold-plated material, and the needle tip 2 is made of tool steel. The bottom end of the needle tube 1 is symmetrically provided with movable grooves 3. The top of the needle tip 2 is movably installed with a connecting rod 4. The top of the connecting rod 4 is symmetrically and fixedly installed with movable rods 5. The movable rods 5 are slidably connected to the movable grooves 3. A spring 6 is installed inside the needle tube 1. The spring 6 is made of gold-plated piano wire and has an elastic force of 150 grams of force, which can not only ensure the movement of the needle tip 2 but also ensure that the needle tip 2 stops immediately when the external force is removed, and can resist the impact during the test.

[0021] As Figures 1 to 3 shown, the bottom end of the needle tube 1 is symmetrically provided with L-shaped installation grooves 7, and the top end of the L-shaped installation grooves 7 is communicated with the movable grooves 3.

[0022] Slide the movable rod 5 at the top of the connecting rod 4 into the L-shaped installation groove 7. At this time, the connecting rod 4 will compress the spring 6 until the movable rod 5 slides to the top of the L-shaped installation groove 7. Then rotate the needle tip 2, and the movable rod 5 will move into the movable groove 3. The spring 6 will push the top of the connecting rod 4 to drive the movable rod 5 to be received at the bottom end inside the movable groove 3, which is convenient for the installation between the needle tip 2 and the needle tube 1.

[0023] As Figures 1 to 3 shown, chamfers 8 are provided at the ends and turning points of the movable grooves 3 and the L-shaped installation grooves 7.

[0024] It is convenient to move the movable rod 5 at the top of the connecting rod 4 into the movable groove 3 and the L-shaped installation groove 7 more conveniently.

[0025] As Figures 1 to 3 shown, a ring 9 is fixedly installed at the bottom end of the spring 6. The ring 9 is made of gold-plated material and can effectively transmit the conduction signal of the needle tip 2. The ring 9 is in contact with the top end of the connecting rod 4.

[0026] The ring 9 effectively connects the movable rod 5 and the spring 6, and at the same time prevents wear when the movable rod 5 contacts the spring 6.

[0027] As Figures 1 to 3 shown, a fixing hole 10 is provided at the bottom end of the connecting rod 4. A fixing rod 11 is fixedly installed at the top of the needle tip 2. The fixing rod 11 is installed with an interference fit with the fixing hole 10 to keep a good conduction effect between the connecting rod 4 and the needle tip 2.

[0028] When the needle 2 contacts the semiconductor chip and squeezes the semiconductor chip, the squeezing of the needle 2 by the semiconductor chip will push the needle 2 into the test state. At the same time, through the interference fit installation between the fixing rod 11 and the fixing hole 10, a movable distance for the needle 2 is left for the inclined squeezing of the needle 2 by the semiconductor chip, so as to prevent excessive squeezing between the semiconductor chip and the needle 2.

[0029] As Figures 1 to 3 shown, the distance between the bottom end of the movable groove 3 and the top end of the L-shaped installation groove 7 is greater than the moving distance of the needle 2 during testing.

[0030] To ensure that the movable rod 5 is always inside the movable groove 3.

[0031] As Figures 1 to 3 shown, an arc-shaped positioning ring 12 is threadedly installed at one end of the movable rod 5 away from the connecting rod 4.

[0032] Limit the installation position of the movable rod 5 to prevent the connecting rod 4 from tilting.

[0033] The present utility model provides a stable and effective test pin, and the specific working principle is as follows:

[0034] When the device is in use, when installing the connecting rod 4 with the needle 2 on the syringe 1, the movable rod 5 at the top of the connecting rod 4 is slid into the L-shaped installation groove 7. At this time, the connecting rod 4 will compress the spring 6 until the movable rod 5 slides to the top of the L-shaped installation groove 7. Then, when the needle 2 is rotated, the movable rod 5 will move into the movable groove 3, and the spring 6 will push the top of the connecting rod 4 to drive the movable rod 5 to be received at the bottom end inside the movable groove 3;

[0035] During the process of squeezing the needle 2 during the test of the semiconductor chip, the semiconductor chip will push the needle 2 in the reverse direction and then enter the test state. At this time, the spring 6 will be compressed, and the movable rod 5 on the connecting rod 4 connected to the needle 2 is always inside the movable groove 3. After the measurement is completed, the needle 2 returns to the original position under the movement of the spring 6.

[0036] Although the embodiments of the present utility model have been shown and described, for those of ordinary skill in the art, it can be understood that various changes, modifications, substitutions, and variations can be made to these embodiments without departing from the principle and spirit of the present utility model. The scope of the present utility model is defined by the appended claims and their equivalents.

Claims

1. A stable and effective test pin, characterized in that: It includes a syringe barrel (1) and a needle head (2). At the bottom end of the syringe barrel (1), movable grooves (3) are symmetrically opened. At the top of the needle head (2), a connecting rod (4) is movably installed. At the top of the connecting rod (4), movable rods (5) are symmetrically and fixedly installed. The movable rods (5) are slidably connected to the movable grooves (3). A spring (6) is installed inside the syringe barrel (1).

2. The stable and effective test pin according to claim 1, characterized in that: At the bottom end of the syringe barrel (1), L-shaped installation grooves (7) are symmetrically opened. The top end of the L-shaped installation groove (7) is communicated with the movable groove (3).

3. A stable and effective test pin according to claim 2, characterized in that: Chamfers (8) are opened at the ends and turning points of the movable groove (3) and the L-shaped installation groove (7).

4. A stable and effective test pin according to claim 1, characterized in that: At the bottom end of the spring (6), a ring (9) is fixedly installed. The ring (9) is in contact with the top end of the connecting rod (4).

5. A stable and effective test pin according to claim 1, characterized in that: At the bottom end of the connecting rod (4), a fixing hole (10) is opened. At the top of the needle head (2), a fixing rod (11) is fixedly installed. The fixing rod (11) is installed in an interference fit with the fixing hole (10).

6. The stable and effective test pin according to claim 2, characterized in that: The distance between the bottom end of the movable groove (3) and the top end of the L-shaped installation groove (7) is greater than the distance that the needle head (2) moves during testing.

7. A stable and effective test pin according to claim 1, characterized in that: At the end of the movable rod (5) away from the connecting rod (4), an arc-shaped positioning ring (12) is installed by threading.

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