Rapid detection device for large-scale electronic board card

Abstract

The utility model discloses and provides rapid debugging equipment suitable for a large-scale board card, which not only can simultaneously carry out conduction inspection of multichannel signals of the board card, but also is small in size and capable of freely moving, and can reversely inspect and test a connecting board product when the channel of the large-scale board card is confirmed to be accurate. The device comprises a fixing assembly and a probe assembly, the fixing assembly comprises a pressing plate, a connecting plate product, a product fixing plate and a bottom plate, the connecting plate product is in limiting fit with the product fixing plate, the product fixing plate is in limiting fit with the bottom plate through the pressing plate, the probe assembly is arranged on the bottom plate, and the probe assembly is arranged on the bottom plate. And the probe assembly is matched with a to-be-tested board card. The debugging device is applied to the field of debugging of large-scale electronic board cards.

Description

Technical Field

[0001] The utility model is applied to the debugging field of large electronic boards, and particularly relates to a rapid detection device for large electronic boards. Background Art

[0002] In the non-standard test field of FPC, since it is necessary to test the connected board products during the production process, according to the characteristics of the connected board products, the corresponding test board size needs to be very large to simultaneously compatible with the electrical signals of multi-channel products. In order to verify whether the electrical performance of the large board is working properly, it is necessary to debug and inspect the large board in advance. Currently, the existing board debugging usually uses the test leads of the positive and negative poles of a multimeter to directly connect the electrical signals between the product and the corresponding points of the board to check whether it is conducting. However, since the number of channels of the large board is very large, the points to be tested are more miscellaneous and disorderly. Therefore, using manual inspection will cause a great waste of labor costs, and due to reasons such as dense points, it is very easy to cause problems such as misalignment of detection data due to human factors. If a rapid debugging device suitable for large boards can be designed, not only can it simultaneously conduct the conduction inspection of multi-channel signals of the board, and the device is small in volume and can be moved freely, and when the channels of the large board are confirmed to be accurate, it can also be used to check and test the connected board products in reverse, then the above problems can be well solved. Summary of the Invention

[0003] The technical problem to be solved by the utility model is to overcome the deficiencies of the prior art and provide a rapid debugging device suitable for large boards, which can not only simultaneously conduct the conduction inspection of multi-channel signals of the board, and the device is small in volume and can be moved freely, and when the channels of the large board are confirmed to be accurate, it can also be used to check and test the connected board products in reverse.

[0004] The technical solution adopted by the utility model is as follows: The utility model includes a fixing component and a probe component. The fixing component includes a pressing plate, a connected board product, a product fixing plate and a bottom plate. The connected board product is in limit fit with the product fixing plate. The product fixing plate is in limit fit with the bottom plate through the pressing plate. The probe component is arranged on the bottom plate and is in fit with the board to be tested. Thus, it can be seen that the pressing plate is in limit fit with the product fixing plate, so that the connected board product is tightly attached to the product fixing plate. The connected board product is fixed on the product fixing plate. The connected board product is in fit with the board to be tested through the probe component. Therefore, the electrical performance of each passage of the board to be tested is inspected through the connected board product.

[0005] Further, the probe assembly includes a probe fixing block, probe elements, a tail pin board, and a probe adapter board. The probe elements are fixed on the probe fixing block. The tail pin board is disposed on the upper surface of the base plate. The probe adapter board is disposed on the lower surface of the base plate. The probe elements pass through the tail pin board, the base plate, and the probe adapter board to cooperate with the board under test, and the probe adapter board is in limit cooperation with the board under test.

[0006] Further, a plurality of first positioning pins are provided on the product fixing plate, and the first positioning pins cooperate with a plurality of process hole positions on the connecting plate product.

[0007] Further, a plurality of stud bolts are provided on the lower surface of the base plate, and the two ends of the stud bolts are respectively in limit cooperation with the base plate and the board under test.

[0008] Further, four support columns are provided on the lower surface of the base plate, and the support columns are in limit cooperation with external devices.

[0009] Further, a plurality of second positioning pins, cylindrical pins, and diamond pins are provided on the tail pin board. The second positioning pins are in limit cooperation with the probe fixing block, and both the cylindrical pins and the diamond pins are in limit cooperation with the product fixing plate.

[0010] Further, a plurality of pins, a plurality of third positioning pins, and a plurality of fourth positioning pins are provided on the base plate. The pins are in limit cooperation with the tail pin board and the product fixing plate. The third positioning pins are in cooperation with the tail pin board and the probe fixing block, and the fourth positioning pins are in limit cooperation with the tail pin board. Description of the Drawings

[0011] Figure 1 is the structural view of the present utility model;

[0012] Figure 2 is the exploded structural view of the present utility model;

[0013] Figure 3 is the exploded structural view of the connecting plate product and the product fixing plate;

[0014] Figure 4 is Figure 3 the partial structural view of;

[0015] Figure 5 is the structural view of the tail pin board;

[0016] Figure 6 is the structural view of the base plate. Detailed Description of the Invention

[0017] Such as Figures 1 to 3As shown in the figure, in this embodiment, the utility model includes a fixing component 1 and a probe component 2. The fixing component 1 includes a pressing plate 10, a connecting plate product 11, a product fixing plate 12, and a bottom plate 13. The connecting plate product 11 is in limit cooperation with the product fixing plate 12. The product fixing plate 12 is in limit cooperation with the bottom plate 13 through the pressing plate 10. The probe component 2 is arranged on the bottom plate 13, and the probe component 2 cooperates with the to-be-tested board card 3. Thus, it can be seen that the pressing plate 10 is in limit cooperation with the product fixing plate 12, making the connecting plate product 11 closely adhere to the product fixing plate 12. The connecting plate product 11 is fixed on the product fixing plate 12, and then through the cooperation of the probe component 2 and the to-be-tested board card 3, the power-on performance of each part of the to-be-tested board card 3 is tested through the connecting plate product 11.

[0018] As Figure 2 shown in the figure, in this embodiment, the probe component 2 includes a probe fixing block 20, a probe element 21, a tail pin board 22, and a probe adapter board 23. The probe element 21 is fixed on the probe fixing block 20. The tail pin board 22 is arranged on the upper surface of the bottom plate 13. The probe adapter board 23 is arranged on the lower surface of the bottom plate 13. The probe element 21 passes through the tail pin board 22, the bottom plate 13, and the probe adapter board 23 to cooperate with the to-be-tested board card 3. The probe adapter board 23 is in limit cooperation with the to-be-tested board card 3. Thus, it can be seen that the probe element 21 is fixed on the probe fixing block 20. The probe element 21 passes through the tail pin board 22, the bottom plate 13, and the probe adapter board 23 to contact the to-be-tested board card 3. The tail pin board 22, the bottom plate 13, and the probe adapter board 23 play a role in limiting and positioning the probe element 21, enabling the probe element 21 to accurately cooperate with the corresponding potential on the to-be-tested board card 3.

[0019] As Figures 3 to 4 shown in the figure, in this embodiment, a number of first positioning pins 55 are arranged on the product fixing plate 12. The first positioning pins 55 are in limit cooperation with a number of process holes 56 on the connecting plate product 11. Thus, it can be seen that the first positioning pins 55 are fixed on the product fixing plate 12, and the first positioning pins 55 play a role in positioning and limiting during the cooperation between the product fixing plate 12 and the connecting plate product.

[0020] As Figure 6 shown in the figure, in this embodiment, a number of double-headed screws 130 are arranged on the lower surface of the bottom plate 13. The two ends of the double-headed screws 130 are respectively in limit cooperation with the bottom plate 13 and the to-be-tested board card 3. Thus, it can be seen that the bottom plate 13 is in limit cooperation with the to-be-tested board card 3 through the double-headed screws 130. The double-headed screws 130 play a role in limiting the to-be-tested board card 3 and also improve the working efficiency when replacing the to-be-tested board card 3.

[0021] As shown Figure 6 In this embodiment, four support columns 131 are provided on the lower surface of the bottom plate 13, and the support columns 131 are in limit fit with external equipment. Thus, when the four support columns 131 cooperate with the external equipment to support the bottom plate 13, they play a role in support and limit.

[0022] As shown Figure 5 In this embodiment, a plurality of second positioning pins 65, cylindrical pins 66 and diamond pins 67 are provided on the tail needle plate 22. The second positioning pins 65 are in limit fit with the probe fixing block 20, and both the cylindrical pins 66 and the diamond pins 67 are in limit fit with the product fixing plate 12. Thus, the second positioning pins 65, the cylindrical pins 66 and the diamond pins 67 are all fixed on the tail needle plate 22, and the second positioning pins 65, the cylindrical pins 66 and the diamond pins 67 play a role in positioning and limiting during the cooperation process between the tail needle plate 22 and the probe fixing block 20.

[0023] As shown Figure 6 In this embodiment, a plurality of pins 75, a plurality of third positioning pins 76 and a plurality of fourth positioning pins 77 are provided on the bottom plate 13. The pins 75 are in limit fit with the tail needle plate 22 and the product fixing plate 12, the third positioning pins 76 are in limit fit with the tail needle plate 22 and the probe fixing block 20, and the fourth positioning pins 77 are in limit fit with the tail needle plate 22. Thus, the pins 75, the third positioning pins 76 and the fourth positioning pins 77 are all fixed on the bottom plate 13, and the pins 75, the third positioning pins 76 and the fourth positioning pins 77 all play a role in positioning and limiting during the cooperation process between the bottom plate 13 and the tail needle plate 22, the product fixing plate 12 and the probe fixing block 20.

[0024] In this embodiment, the working principle of the present utility model is as follows:

[0025] As shown Figures 1 to 6 The link product 11 is limited and fitted on the product fixing plate 12 through the first positioning pin 55 and the process hole 56. Then, after aligning the pressing plate 10 with the corresponding hole positions on the product fixing plate 12, the pressing plate 10 is horizontally placed on the surface of the link product 11. By tightening the screws, the pressing plate 10 is pressed down, and the link product 11 is fully connected to and tightly attached to the probe fixing block 20. The test board card 3 is connected to an external testing machine and starts testing. By checking the data of the test signal, it is determined whether all channels of the test board card 3 are powered on and working properly. In this way, the debugging and inspection of the large board card can be completed, and the next test board card 3 can be completed in sequence by cycling.

[0026] Although the embodiments of the present utility model are described with actual solutions, they do not constitute a limitation to the meaning of the present utility model. For those skilled in the art, modifications to its implementation solutions according to this specification and combinations with other solutions are obvious.

Claims

1. A rapid detection device for a large electronic board, characterized in that: It includes a fixed component (1) and a probe component (2). The fixed component (1) includes a pressing plate (10), a connecting plate product (11), a product fixing plate (12), and a bottom plate (13). The connecting plate product (11) is in limiting cooperation with the product fixing plate (12). The product fixing plate (12) is in limiting cooperation with the bottom plate (13) through the pressing plate (10). The probe component (2) is arranged on the bottom plate (13), and the probe component (2) cooperates with the board under test (3).

2. The rapid detection device for a large electronic board according to claim 1, wherein: The probe component (2) includes a probe fixing block (20), probe elements (21), a tail pin board (22), and a probe adapter board (23). The probe elements (21) are fixed on the probe fixing block (20). The tail pin board (22) is arranged on the upper surface of the bottom plate (13). The probe adapter board (23) is arranged on the lower surface of the bottom plate (13). The probe elements (21) pass through the tail pin board (22), the bottom plate (13), and the probe adapter board (23) to cooperate with the board under test (3). The probe adapter board (23) is in limiting cooperation with the board under test (3).

3. The rapid detection device for a large electronic board card according to claim 1, wherein: A number of first positioning pins (55) are arranged on the product fixing plate (12), and the first positioning pins (55) are in limiting cooperation with a number of process holes (56) on the connecting plate product (11).

4. The rapid detection device for a large electronic board according to claim 1, characterized in that: A number of through screws (130) are arranged on the lower surface of the bottom plate (13), and the two ends of the through screws (130) are in limiting cooperation with the bottom plate (13) and the board under test (3) respectively.

5. The rapid detection device for a large electronic board card according to claim 1, characterized in that: Four support columns (131) are arranged on the lower surface of the bottom plate (13), and the support columns (131) are in limiting cooperation with external equipment.

6. The rapid detection device for a large electronic board according to claim 2, characterized in that: A number of second positioning pins (65), cylindrical pins (66), and diamond pins (67) are arranged on the tail pin board (22). The second positioning pins (65) are in limiting cooperation with the probe fixing block (20). Both the cylindrical pins (66) and the diamond pins (67) are in limiting cooperation with the product fixing plate (12).

7. The rapid detection device for a large electronic board according to claim 2, characterized in that: A number of pins (75), a number of third positioning pins (76), and a number of fourth positioning pins (77) are arranged on the bottom plate (13). The pins (75) are in limiting cooperation with the tail pin board (22) and the product fixing plate (12). The third positioning pins (76) are in cooperation with the tail pin board (22) and the probe fixing block (20). The fourth positioning pins (77) are in limiting cooperation with the tail pin board (22).

Images