Integrated laser tester

Abstract

The utility model relates to an integrated laser tester, comprising a laser driver unit used for driving a laser to work; the photodiode detection unit is used for receiving feedback voltage and current signals of the laser; the nanoampere-level current measuring unit is used for testing the dark current of the laser in a dark state; the trigger unit is used for providing a measurement synchronization signal; and the laser driver unit, the photodiode detection unit, the nanoampere-level current measurement unit and the trigger unit are respectively connected with the control unit. According to the invention, the laser can be conveniently tested, and the test efficiency is improved.

Description

Technical Field

[0001] The present disclosure belongs to the field of electronic test instruments, and particularly relates to an integrated laser tester. Background Art

[0002] During the factory quality control stage of lasers, it is generally necessary to conduct spot checks on lasers at a certain proportion. During the spot check process, an instrument is required to drive the laser. At the same time, the current and voltage values at the receiving end are collected, and the function of the laser is determined by comparing the voltage and current data. In addition, it is also necessary to test the dark current of the laser to evaluate whether the laser meets the factory requirements. Currently, these driving and detection operations need to be set up separately, resulting in low test accuracy, a cumbersome test process, and low efficiency. Utility Model Content

[0003] The present utility model provides an integrated laser tester, aiming to solve at least one of the technical problems existing in the prior art.

[0004] The technical solution of the present utility model is an integrated laser tester, including:

[0005] A laser driver unit for driving the laser to operate;

[0006] A photodiode detection unit for receiving the feedback voltage and current signals of the laser;

[0007] A nanoampere current measurement unit for testing the dark current of the laser in a lightless state;

[0008] A trigger unit for providing a measurement synchronization signal;

[0009] A control unit, where the laser driver unit, the photodiode detection unit, the nanoampere current measurement unit, and the trigger unit are respectively connected to the control unit.

[0010] Further, the laser driver unit includes a DC bias part, a voltage-current conversion part, a drive amplification part, a feedback part, and an overvoltage protection part.

[0011] The DC bias part and the DDS signal are connected to the voltage-current conversion part through an adder. The output of the voltage-current conversion part is connected to the in-phase input terminal of the drive amplification part. The output terminal of the drive amplification part is used to drive the laser diode. The anti-phase input terminal of the drive amplification part is connected to the input of the feedback part. The output of the feedback part is connected to the input of the voltage-current conversion part through the overvoltage protection part.

[0012] Furthermore, the photodiode detection unit includes a seventh SMB input terminal, an eighth protection diode, a seventh protection diode, a sixth resistor, a 3-A amplifier, a forty-first resistor, a fifty-second capacitor, a fourth resistor, a tenth capacitor, a first resistor, a fifth resistor, a third relay, a first protection diode, a fourth optocoupler, a twenty-seventh optocoupler, a twenty-third resistor, a third resistor, a first relay, a fifty-ninth resistor, a sixtieth resistor, a 15-A amplifier, a sixty-first resistor, an eighty-eighth capacitor, an eighty-ninth capacitor, and a sixty-second resistor.

[0013] The seventh SMB input terminal is connected to the inverting input terminal of the 3-A amplifier through the sixth resistor. The non-inverting input terminal of the 3-A amplifier is connected to the voltage bias terminal V_SET. The seventh SMB input terminal is connected to the second input terminal and the seventh input terminal of the third relay through the first resistor and the fifth resistor connected in parallel. The seventh SMB input terminal is connected to the fourth input terminal and the fifth input terminal of the third relay through the fourth resistor. The two ends of the tenth capacitor are respectively connected to the second end of the sixth resistor and the second end of the first resistor. The two ends of the fifty-second capacitor are respectively connected to the second end of the sixth resistor and the second end of the fourth resistor. The seventh SMB input terminal and the photodiode receiving end PD_INPUT are grounded through the eighth protection diode and the seventh protection diode in sequence.

[0014] Furthermore, the output terminal of the 3-A amplifier, the third output terminal of the third relay, and the sixth output terminal of the third relay are all connected to the second input terminal and the seventh input terminal of the first relay. The third output terminal and the sixth output terminal of the first relay are connected to the fifty-ninth resistor, the sixtieth resistor, and the non-inverting input terminal of the 15-A amplifier in sequence. The inverting input terminal and the output terminal of the 15-A amplifier are connected through the sixty-second resistor. The first end of the fifty-ninth resistor is grounded through the sixty-first resistor. The first end of the sixtieth resistor is grounded through the eighty-eighth capacitor. The second end of the sixtieth resistor is grounded through the eighty-ninth capacitor.

[0015] Furthermore, the photodiode detection unit further includes a fifth SMB input terminal, an eighth resistor, a fifth protection diode, a fourth protection diode, a tenth resistor, a 1-A amplifier, a seventy-ninth capacitor, a seventh resistor, a fifty-second resistor, and a seventy-eighth capacitor.

[0016] The first output terminal of the fifth SMB input terminal is successively connected to the eighth resistor, the non-inverting input terminal of the 1-A amplifier, the fifth two-resistor, and the fourth and fifth input terminals of the first relay. The second terminal of the eighth resistor is successively grounded through the fifth protection diode and the fourth protection diode. The inverting input terminal of the 1-A amplifier is grounded through the first zero resistor. The inverting input terminal of the 1-A amplifier is connected to the fourth and fifth input terminals of the first relay through the seventh resistor. The output terminal of the 1-A amplifier is connected to the fourth and fifth input terminals of the first relay through the fifth two-resistor. The second terminal of the fifth two-resistor is grounded through the seventh-eight capacitor. Both ends of the seventh-nine capacitor are respectively connected to the inverting input terminal and the output terminal of the 1-A amplifier U1-A.

[0017] Further, the nanoampere-level current measurement unit includes a first two SMB input terminal, a fourth relay, a sixth zero resistor, a 33-A amplifier, a thirty-one resistor, a nineteenth capacitor, a twelfth resistor, a thirteenth resistor, a 25-A amplifier, a sixteenth resistor, a twenty-fifth capacitor, an eighteenth capacitor, a forty-fourth resistor, a one-hundredth resistor, a sixteenth capacitor, a fifth relay, an eleventh SMB input terminal, an eighteenth resistor, a twentieth resistor, and a second relay.

[0018] The first end of the first two SMB input terminal is connected to the second input terminal of the fourth relay. The first end of the eleventh SMB input terminal, the eighteenth resistor, and the fourth end of the second relay are successively connected. The twentieth resistor is connected in parallel with the eighteenth resistor. The third output terminal of the second relay is connected to the second input terminal of the fifth relay.

[0019] Further, the first end of the eighteenth capacitor, the first end of the forty-fourth resistor, the first end of the one-hundredth resistor, the first end of the sixteenth capacitor, and the first end of the sixth zero resistor are respectively connected to the third output terminal of the fourth relay. The second end of the eighteenth capacitor and the second end of the forty-fourth resistor are respectively connected to the second input terminal of the fifth relay. The second end of the one-hundredth resistor and the second end of the sixteenth capacitor are respectively connected to the third end of the fifth relay.

[0020] The second terminal of the sixth zero-resistance is connected to the inverting input terminal of the 33-A amplifier. The output terminal of the 33-A amplifier is connected to the first terminal of the 31st resistor and the third terminal of the fifth relay. The second terminal of the 31st resistor is grounded through the 19th capacitor. The second terminal of the 31st resistor is connected to the non-inverting input terminal of the 25-A amplifier through the 12th resistor. The V_SET control terminal is connected to the inverting input terminal of the 25-A amplifier U25-A through the 13th resistor. The output terminal of the 25-A amplifier is grounded through the 16th resistor and the 25th capacitor in sequence.

[0021] Further, the control unit includes the FPGA_SYNC_TRIG_OUT1 port and the FPGA_SYNC_TRIG_OUT2 port. The FPGA_SYNC_TRIG_OUT1 port and the FPGA_SYNC_TRIG_OUT2 port are used to provide a first trigger signal issued by the trigger unit. The first trigger signal is used to control the laser driver unit and the photodiode detection unit to work together.

[0022] Further, the control unit further includes the FPGA_TRIG_OUT1 port and the FPGA_TRIG_OUT2 port. The FPGA_TRIG_OUT1 port and the FPGA_TRIG_OUT2 port are used to provide a second trigger signal issued by the trigger unit. The second trigger signal is used to control the coordinated work of other devices with the integrated laser tester.

[0023] Further, the control unit is a ZYNQ controller.

[0024] The beneficial effects of the present utility model are as follows.

[0025] In this application, a laser generally consists of a laser diode (abbreviated as LD) that emits laser light and a photodiode (abbreviated as PD) that detects laser light. During the laser quality control stage, it is necessary to detect the LD and PD separately. The detection method generally first measures the current of the PD in a state where the LD does not emit light and the ambient light is relatively dim. This current is defined as the dark current, generally in the nA level. Then, the tester generates a driving electrical signal to drive the LD to emit light. After the light is reflected, the tester then detects the feedback signal at the PD end, compares the driving signal and the feedback signal, and comprehensively considers the value of the dark current to finally determine whether the laser meets the factory conditions. This application can facilitate the testing of lasers and improve the testing efficiency. Description of the Drawings

[0026] Figure 1 It is a schematic circuit block diagram of the integrated laser tester of the present utility model.

[0027] Figure 2 It is a block diagram schematic of the laser driver unit of the integrated laser tester of the present utility model.

[0028] Figure 3 It is a block diagram schematic of the photodiode detection unit of the integrated laser tester of the present utility model.

[0029] Figure 4 It is a circuit diagram of the photodiode detection unit of the integrated laser tester of the present utility model.

[0030] Figure 5 It is a block diagram schematic of the nanoampere current measurement unit of the integrated laser tester of the present utility model.

[0031] Figure 6 It is a circuit diagram of the nanoampere current measurement unit of the integrated laser tester of the present utility model.

[0032] In the above figures, 100 is the laser driver unit; 110 is the DC bias section; 120 is the voltage-current conversion section; 130 is the drive amplification section; 140 is the feedback section; 150 is the overvoltage protection section; 200 is the photodiode detection unit; 300 is the nanoampere current measurement unit; 400 is the trigger unit; 500 is the control unit. Detailed implementation manners

[0033] The following will clearly and completely describe the concept, specific structure and technical effects generated by the present utility model in combination with embodiments and the drawings, so as to fully understand the purpose, solution and effects of the present utility model. It should be noted that, without conflict, the embodiments in this application and the features in the embodiments can be combined with each other.

[0034] It should be noted that, unless otherwise specified, when a certain feature is referred to as "fixed" or "connected" to another feature, it can be directly fixed or connected to the other feature, or indirectly fixed or connected to the other feature. In addition, the up, down, left, right, top, bottom, etc. descriptions used in the present utility model are only relative to the mutual positional relationship of the various components of the present utility model in the drawings.

[0035] In addition, unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those skilled in the technical field to which this technology belongs. The terms used in the description of this specification of the present utility model are only for describing specific embodiments, rather than for limiting the present utility model. The term "and / or" used herein includes any combination of one or more of the related listed items.

[0036] It should be understood that although the terms first, second, third, etc. may be used in this disclosure to describe various elements, these elements should not be limited to these terms. These terms are only used to distinguish elements of the same type from each other. For example, without departing from the scope of this disclosure, the first element may also be referred to as the second element, and similarly, the second element may also be referred to as the first element.

[0037] Referring to Figures 1 to 6 , in this application, an integrated laser tester is proposed. Referring to Figure 1 , it includes:

[0038] A laser driver unit 100, which is used to drive the laser to operate;

[0039] A photodiode detection unit 200, which is used to receive the feedback voltage and current signals of the laser;

[0040] A nanoampere current measurement unit 300, which is used to test the dark current of the laser in a light-off state;

[0041] A trigger unit 400, which is used to provide a measurement synchronization signal;

[0042] A control unit 500, and the laser driver unit 100, the photodiode detection unit 200, the nanoampere current measurement unit 300, and the trigger unit 400 are respectively connected to the control unit 500.

[0043] The beneficial effects of the present utility model are as follows.

[0044] In this application, a laser generally consists of a laser diode (Laser Diode - abbreviated as LD) that emits laser light and a photodiode (Photo Diode - abbreviated as PD) that detects the laser light. During the laser quality control stage, it is necessary to detect the LD and PD separately. The detection method generally first measures the current of the PD in a state where the LD does not emit light and the ambient light is relatively dim. This current is defined as the dark current, generally in the nA level. Then, the tester generates a driving electrical signal to drive the LD to emit light. After this light is reflected, the tester then detects the feedback signal at the PD end, compares the driving signal and the feedback signal, and comprehensively considers the value of the dark current to finally determine whether the laser meets the factory conditions. This application can facilitate the testing of lasers and improve the testing efficiency.

[0045] Specifically, a voltage driving signal including a DC bias is set by adjusting the DDS and DC Offset through instructions, and the voltage signal is converted into a current signal through a V-I converter for driving the laser diode.

[0046] The voltage across the laser diode is measured through the LD Voltage Sense interface. The OVP is the overvoltage protection unit, and the value of the protection voltage can be set through instructions. When the voltage generated across the laser diode by the drive current exceeds the voltage value set by the overvoltage protection, the LD Iout will be decreased to protect the laser diode.

[0047] During the measurement of some laser diodes, it is necessary to monitor the drive current, which may be achieved through a multimeter or an oscilloscope. Therefore, the LD Iout Monitor interface is set for the monitoring device to measure. The signal output by this interface is a voltage signal, and the conversion ratio is 0.5V / mA.

[0048] The photodiode detection unit 200PD Detector is used to measure the feedback current of the photodiode. Since the photodiode requires a reverse voltage to operate, this voltage is set through Offset Volt. However, we do not want the influence of Offset Volt on the measurement, so Offset Current is needed for neutralization, and Offset Current = Offset Volt / RS.

[0049] The feedback current of the photodiode detection unit 200PD Detector is measured through the PD Current IN interface. After conversion, it is finally sampled by a 2.5MHz ADC, and the actual value of the current is finally calculated.

[0050] Furthermore, the laser driver unit 100 includes a DC bias section 110, a voltage-current conversion section 120, a drive amplification section 130, a feedback section 140, and an overvoltage protection section 150.

[0051] The DC bias section 110 and the DDS signal are connected to the voltage-current conversion section 120 through an adder. The output of the voltage-current conversion section 120 is connected to the non-inverting input terminal of the drive amplification section 130. The output terminal of the drive amplification section 130 is used to drive the laser diode. The inverting input terminal of the drive amplification section 130 is connected to the input of the feedback section 140. The output of the feedback section 140 is connected to the input of the voltage-current conversion section 120 through the overvoltage protection section 150.

[0052] The functional block diagram of the nanoampere current measurement unit 300nA meter is the same as that of the photodiode detection unit 200PD Detector, but because its Rs is larger, it can measure smaller currents.

[0053] The trigger unit 400 is designed for multi-device synchronous operation. When the signal output of the laser driver unit 100LD needs to be controlled by an external signal, the external trigger function can be enabled through an instruction. The signal is connected to the Trigger IN to trigger the LD Driver module to output a signal through an external rising edge or falling edge.

[0054] Similarly, when an external device needs a synchronization signal to achieve synchronous operation with this tester, the TriggerOut signal can also be connected to it.

[0055] The integrated laser tester is a low-power precision instrument with excellent accuracy. It consists of a 2-channel laser driver (abbreviated as LD), a 1-channel photo diode detector (abbreviated as PD Detector), a 1-channel nanoampere current measurement module (nA Meter), and a trigger system (Trigger), and is very suitable for testing VCSEL and various LED light sources.

[0056] Further, referring to Figure 2 , the photo diode detection unit 200 includes a seventh SMB input terminal J7, an eighth protection diode D8, a seventh protection diode D7, a sixth resistor R6, a 3-A amplifier U3-A, a forty-first resistor R41, a fifty-second capacitor C52, a fourth resistor R4, a tenth capacitor C10, a first resistor R1, a fifth resistor R5, a third relay K3, a first protection diode D1, a fourth optocoupler U4, a twenty-seventh optocoupler U27, a twenty-third resistor R23, a third resistor R3, a first relay K1, a fifty-ninth resistor R59, a sixtieth resistor R60, a 15-A amplifier U15-A, a sixty-first resistor R61, an eighty-eighth capacitor C88, an eighty-ninth capacitor C89, a sixty-second resistor R62.

[0057] The seventh SMB input terminal J7 is connected to the inverting input terminal of the 3-A amplifier U3-A through the sixth resistor R6. The non-inverting input terminal of the 3-A amplifier U3-A is connected to the voltage bias terminal V_SET. The seventh SMB input terminal J7 is connected to the second input terminal and the seventh input terminal of the third relay K3 through the first resistor R1 and the fifth resistor R5 connected in parallel. The seventh SMB input terminal J7 is connected to the fourth input terminal and the fifth input terminal of the third relay K3 through the fourth resistor R4. The two ends of the first zero capacitor C10 are respectively connected to the second end of the sixth resistor R6 and the second end of the first resistor R1. The two ends of the fifth two capacitor C52 are respectively connected to the second end of the sixth resistor R6 and the second end of the fourth resistor R4. The seventh SMB input terminal J7 and the photodiode receiving end PD_INPUT are grounded through the eighth protection diode D8 and the seventh protection diode D7 in sequence.

[0058] Further, the output terminal of the 3-A amplifier U3-A, the third output terminal of the third relay K3, and the sixth output terminal of the third relay K3 are all connected to the second input terminal and the seventh input terminal of the first relay K1. The third output terminal and the sixth output terminal of the first relay K1 are connected to the inverting input terminal of the 15-A amplifier U15-A through the fifty-ninth resistor R59, the sixtieth resistor R60 in sequence. The non-inverting input terminal and the output terminal of the 15-A amplifier U15-A are connected through the sixty-second resistor R62. The first end of the fifty-ninth resistor R59 is grounded through the sixty-first resistor R61. The first end of the sixtieth resistor R60 is grounded through the eighty-eighth capacitor C88. The second end of the sixtieth resistor R60 is grounded through the eighty-ninth capacitor C89.

[0059] Further, referring to Figure 3 and Figure 4 ,the photodiode detection unit 200 further includes a fifth SMB input terminal J5, an eighth resistor R8, a fifth protection diode D5, a fourth protection diode D4, a first zero resistor R10, a 1-A amplifier U1-A, a seventy-ninth capacitor C89, a seventh resistor R7, a fifty-second resistor R52, a seventy-eighth capacitor C78.

[0060] The first output terminal of the fifth SMB input terminal J5 is successively connected to the in-phase input terminal of the eighth resistor R8, the 1-A amplifier U1-A, the fifth two-resistor R52, and the fourth and fifth input terminals of the first relay K1. The second terminal of the eighth resistor R8 is successively grounded through the fifth protection diode D5 and the fourth protection diode D4. The inverting input terminal of the 1-A amplifier U1-A is grounded through the first zero resistor R10. The inverting input terminal of the 1-A amplifier U1-A is connected to the fourth and fifth input terminals of the first relay K1 through the seventh resistor R7. The output terminal of the 1-A amplifier U1-A is connected to the fourth and fifth input terminals of the first relay K1 through the fifth two-resistor R52. The second terminal of the fifth two-resistor R52 is grounded through the seventy-eightth capacitor C78. The two ends of the seventy-ninth capacitor C89 are respectively connected to the inverting input terminal and the output terminal of the 1-A amplifier U1-A.

[0061] In a specific embodiment, the partial instructions for the photodiode detection unit 200 to measure current and return the 16-bit raw data of the ADC are as follows:

[0062] >PD_SetSnsRes(M0,ResSel=1) / / Select PD module 0; set the current sampling resistor to 1 kΩ

[0063] >PD_SetOffsetVolt(M0,Volt=2V) / / Select PD module 0 and set the offset voltage to 2V.

[0064] >PD_SetOffsetCurr(M0,Curr=2MA) / / Select PD module 0 and set the offset current to 2 mA.

[0065] >PD_Capture_Start(M0,SmpCnt=2) / / Select PD module 0 and set the number of sampling points to 2.

[0066] >PD_Capture_SwTriger(M0) / / Select PD module 0 and trigger the acquisition.

[0067] >PD_Capture_GetRawData(M0) / / Select PD module 0 and obtain the ADC raw data collected by this module.

[0068] Since the raw data of the ADC is obtained by this method, it is necessary to first convert the raw value of the ADC to decimal and then convert the ADC value to the current value through calculation.

[0069] The return value obtained after issuing the command >PD_Capture_GetRawData(M0) is used to obtain the raw data of the ADC through the hexadecimal display (or HEX display) function of the TCP tool as follows:

[0070] The first 4 bytes are the total number of points collected:

[0071] 08 00 00 00 (RawData) → 00000008 (8 bytes) → 2 (2 points)

[0072] After the total number of points, the raw ADC values are collected one by one, 4 bytes for 1 sampling point:

[0073] 6A 18 00 00 → 0000186A DD 9B FF FF → FFFF9BDD

[0074] This data is signed hexadecimal, 32 bits. The calculation method for converting it to decimal is as follows:

[0075] 1. When the raw ADC value is less than 0x80000000, the value is directly converted to decimal:

[0076] 6A 18 00 00 → 0000186A → 6250 (decimal ADC_Data)

[0077] 2. When the raw ADC value is greater than 0x80000000, the raw value needs to be subtracted by 0x100000000, retain the sign, and then be converted to decimal:

[0078] DD 9B FF FF → FFFF9BDD → (0xFFFF9BDD - 0x100000000) → -25635 (decimal ADC_Data)

[0079] The Python demon of this calculation process is as follows:

[0080]

[0081] The formula for converting ADC_Data to current value is as follows:

[0082]

[0083] Among them, Vref = 2.048.

[0084] The value of Rsense is the value set in the command >PD_SetSnsRes(M0, ResSel = 1). In this application, ResSel = 1, and the sampling resistor is 1 kΩ. Therefore, Rsense = 1.

[0085] Therefore, the final current calculation result is as follows:

[0086] 6A 18 00 00 → 0000186A → 6250 (ADC_Data) → 0.0244 mA,

[0087] DD 9B FF FF → FFFF9BDD → -25635 (ADC_Data) → -0.1001 mA.

[0088] Further, referring to Figure 5 and Figure 6 , the nanoampere-level current measurement unit 300 includes a first SMB input terminal J12, a fourth relay K4, a sixth zero-ohm resistor R60, a 33-A amplifier U33-A, a thirty-first resistor R31, a nineteenth capacitor C19, a twelfth capacitor C12, a thirteenth resistor R13, a 25-A amplifier U25-A, a sixteenth resistor R16, a twenty-fifth capacitor C25, an eighteenth capacitor C18, a forty-fourth resistor R44, a one-hundredth resistor R100, a sixteenth capacitor C16, a fifth relay K5, an eleventh SMB input terminal J11, an eighteenth resistor R18, a twentieth resistor R20, and a second relay K2.

[0089] The first end of the first SMB input terminal J12 is connected to the second input terminal of the fourth relay K4. The first end of the eleventh SMB input terminal J11, the eighteenth resistor R18, and the fourth end of the second relay K2 are connected in sequence. The twentieth resistor R20 is connected in parallel with the eighteenth resistor R18. The third output terminal of the second relay K2 is connected to the second input terminal of the fifth relay K5.

[0090] Further, the first end of the eighteenth capacitor C18, the first end of the forty-fourth resistor R44, the first end of the one-hundredth resistor R100, the first end of the sixteenth capacitor C16, and the first end of the sixth zero-ohm resistor R60 are respectively connected to the third output terminal of the fourth relay K4. The second end of the eighteenth capacitor C18 and the second end of the forty-fourth resistor R44 are respectively connected to the second input terminal of the fifth relay K5. The second end of the one-hundredth resistor R100 and the second end of the sixteenth capacitor C16 are respectively connected to the third end of the fifth relay K5.

[0091] The second terminal of the sixth zero-resistance R60 is connected to the inverting input terminal of the 33-A amplifier U33-A. The output terminal of the 33-A amplifier U33-A is connected to the first terminal of the thirty-first resistor R31 and the third terminal of the fifth relay K5. The second terminal of the thirty-first resistor R31 is grounded through the nineteenth capacitor C19. The second terminal of the thirty-first resistor R31 is connected to the non-inverting input terminal of the 25-A amplifier U25-A through the twelfth capacitor C12. The V_SET control terminal is connected to the inverting input terminal of the 25-A amplifier U25-A through the thirteenth resistor R13. The output terminal of the 25-A amplifier U25-A is grounded through the sixteenth resistor R16 and the twenty-fifth capacitor C25 in sequence.

[0092] Specifically, the nanoampere-level current measurement unit 300nA Meter can usually be used to test the PD dark current or other tiny current amounts.

[0093] >NaAmps_SetOffsetVolt(M0, Volt = 1V) / / Select the nA Meter module 0; set the offset voltage to 1V.

[0094] >NaAmps_RangeSel(M0, Sel = 1) / / Select the nA Meter module 0; set the nA Meter range to -100 to 100nA.

[0095] >NaAmps_Meas(M0) / Select the nA Meter module 0 and measure the current value.

[0096] Further, referring to Figure 1 , the control unit 500 includes the FPGA_SYNC_TRIG_OUT1 port and the FPGA_SYNC_TRIG_OUT2 port. The FPGA_SYNC_TRIG_OUT1 port and the FPGA_SYNC_TRIG_OUT2 port are used to provide a first trigger signal issued by the trigger unit 400. The first trigger signal is used to control the laser driver unit 100 and the photodiode detection unit 200 to work together.

[0097] Further, referring to Figure 1 , the control unit 500 further includes the FPGA_TRIG_OUT1 port and the FPGA_TRIG_OUT2 port. The FPGA_TRIG_OUT1 port and the FPGA_TRIG_OUT2 port are used to provide a second trigger signal issued by the trigger unit 400. The second trigger signal is used to control the coordinated work of other devices with the integrated laser tester.

[0098] Further, referring to Figure 1, the control unit 500 is a ZYNQ controller.

[0099] In a specific embodiment, the integrated laser tester complies with the TCP / IP communication protocol and can be debugged using any TCP tool. Among them, the IP address is 192.168.10.100 and the port is 7600 / 7620.

[0100] Refer to Figure 1 , the control unit is connected to the host computer. Refer to Table 1. Some instructions of the host computer are described as follows.

[0101] Table 1:

[0102]

[0103]

[0104]

[0105]

[0106]

[0107] As mentioned above, it is only a preferred embodiment of the present invention. The present invention is not limited to the above embodiments. As long as it achieves the technical effects of the present invention by the same means, any modifications, equivalent replacements, improvements, etc. made within the spirit and principle of the present disclosure shall be included within the scope of protection of the present disclosure. All should belong to the scope of protection of the present invention. Within the scope of protection of the present invention, its technical solutions and / or implementation manners can have various different modifications and changes.

Claims

1. An integrated laser tester, characterized in that, Comprising: A laser driver unit (100) for driving a laser to operate; A photodiode detection unit (200) for receiving the feedback voltage and current signals of the laser; A nanoampere current measurement unit (300) for measuring the dark current of the laser in a light-off state; A trigger unit (400) for providing a measurement synchronization signal; A control unit (500), wherein the laser driver unit (100), the photodiode detection unit (200), the nanoampere current measurement unit (300), and the trigger unit (400) are respectively connected to the control unit (500).

2. The integrated laser tester according to claim 1, characterized in that The laser driver unit (100) includes a DC bias section (110), a voltage-current conversion section (120), a drive amplification section (130), a feedback section (140), and an overvoltage protection section (150), The DC bias section (110) and the DDS signal are connected to the voltage-current conversion section (120) through an adder. The output of the voltage-current conversion section (120) is connected to the in-phase input terminal of the drive amplification section (130). The output terminal of the drive amplification section (130) is used to drive a laser diode. The inverting input terminal of the drive amplification section (130) is connected to the input of the feedback section (140). The output of the feedback section (140) is connected to the input of the voltage-current conversion section (120) through the overvoltage protection section (150).

3. The integrated laser tester according to claim 1, characterized in that The photodiode detection unit (200) includes a seventh SMB input terminal (J7), an eighth protection diode (D8), a seventh protection diode (D7), a sixth resistor (R6), a 3-A amplifier (U3-A), a forty-first resistor (R41), a fifty-second capacitor (C52), a fourth resistor (R4), a tenth capacitor (C10), a first resistor (R1), a fifth resistor (R5), a third relay (K3), a first protection diode (D1), a fourth optocoupler (U4), a twenty-seventh optocoupler (U27), a twenty-third resistor (R23), a third resistor (R3), a first relay (K1), a fifty-ninth resistor (R59), a sixtieth resistor (R60), a 15-A amplifier (U15-A), a sixty-first resistor (R61), an eighty-eighth capacitor (C88), an eighty-ninth capacitor (C89), a sixty-second resistor (R62), The seventh SMB input terminal (J7) is connected to the inverting input terminal of the 3-A amplifier (U3-A) through the sixth resistor (R6). The non-inverting input terminal of the 3-A amplifier (U3-A) is connected to the voltage bias terminal (V_SET). The seventh SMB input terminal (J7) is connected to the second input terminal and the seventh input terminal of the third relay (K3) through the first resistor (R1) and the fifth resistor (R5) connected in parallel. The seventh SMB input terminal (J7) is connected to the fourth input terminal and the fifth input terminal of the third relay (K3) through the fourth resistor (R4). The two ends of the first zero capacitor (C10) are respectively connected to the second end of the sixth resistor (R6) and the second end of the first resistor (R1). The two ends of the fifth two capacitor (C52) are respectively connected to the second end of the sixth resistor (R6) and the second end of the fourth resistor (R4). The seventh SMB input terminal (J7) and the photodiode receiving end (PD_INPUT) are grounded through the eighth protection diode (D8) and the seventh protection diode (D7) in sequence.

4. The integrated laser tester according to claim 3, wherein The output terminal of the 3-A amplifier (U3-A), the third output terminal of the third relay (K3), and the sixth output terminal of the third relay (K3) are all connected to the second input terminal and the seventh input terminal of the first relay (K1). The third output terminal and the sixth output terminal of the first relay (K1) are sequentially connected to the fifty-ninth resistor (R59), the sixtieth resistor (R60), and the non-inverting input terminal of the 15-A amplifier (U15-A). The inverting input terminal and the output terminal of the 15-A amplifier (U15-A) are connected through the sixty-second resistor (R62). The first end of the fifty-ninth resistor (R59) is grounded through the sixty-first resistor (R61). The first end of the sixtieth resistor (R60) is grounded through the eighty-eighth capacitor (C88). The second end of the sixtieth resistor (R60) is grounded through the eighty-ninth capacitor (C89).

5. The integrated laser tester according to claim 3, wherein The photodiode detection unit (200) further includes a fifth SMB input terminal (J5), an eighth resistor (R8), a fifth protection diode (D5), a fourth protection diode (D4), a first zero resistor (R10), a 1-A amplifier (U1-A), a seventy-ninth capacitor (C89), a seventh resistor (R7), a fifty-second resistor (R52), a seventy-eighth capacitor (C78). The first output terminal of the fifth SMB input terminal (J5) is sequentially connected to the eighth resistor (R8), the non-inverting input terminal of the 1-A amplifier (U1-A), the fifth two-resistor (R52), and the fourth and fifth input terminals of the first relay (K1). The second terminal of the eighth resistor (R8) is grounded sequentially through the fifth protection diode (D5) and the fourth protection diode (D4). The inverting input terminal of the 1-A amplifier (U1-A) is grounded through the first zero resistor (R10). The inverting input terminal of the 1-A amplifier (U1-A) is connected to the fourth and fifth input terminals of the first relay (K1) through the seventh resistor (R7). The output terminal of the 1-A amplifier (U1-A) is connected to the fourth and fifth input terminals of the first relay (K1) through the fifth two-resistor (R52). The second terminal of the fifth two-resistor (R52) is grounded through the seventy-eightth capacitor (C78). Both ends of the seventy-ninth capacitor (C89) are respectively connected to the inverting input terminal and the output terminal of the 1-A amplifier (U1-A).

6. The integrated laser tester according to claim 1, wherein The nanoampere-level current measurement unit (300) includes a first two-SMB input terminal (J12), a fourth relay (K4), a sixth zero resistor (R60), a 33-A amplifier (U33-A), a thirty-first resistor (R31), a nineteenth capacitor (C19), a twelfth resistor (C12), a thirteenth resistor (R13), a 25-A amplifier (U25-A), a sixteenth resistor (R16), a twenty-fifth capacitor (C25), an eighteenth capacitor (C18), a forty-fourth resistor (R44), a one-hundredth resistor (R100), a sixteenth capacitor (C16), a fifth relay (K5), an eleventh SMB input terminal (J11), an eighteenth resistor (R18), a twentieth resistor (R20), and a second relay (K2). The first terminal of the first two-SMB input terminal (J12) is connected to the second input terminal of the fourth relay (K4). The first terminal of the eleventh SMB input terminal (J11), the eighteenth resistor (R18), and the fourth terminal of the second relay (K2) are sequentially connected. The twentieth resistor (R20) is connected in parallel with the eighteenth resistor (R18). The third output terminal of the second relay (K2) is connected to the second input terminal of the fifth relay (K5).

7. The integrated laser tester according to claim 6, wherein The first end of the first eight-capacitor (C18), the first end of the fourth four-resistor (R44), the first end of the first hundred-resistor (R100), the first end of the first six-capacitor (C16), and the first end of the sixth zero-resistor (R60) are respectively connected to the third output terminal of the fourth relay (K4). The second end of the first eight-capacitor (C18) and the second end of the fourth four-resistor (R44) are respectively connected to the second input terminal of the fifth relay (K5). The second end of the first hundred-resistor (R100) and the second end of the first six-capacitor (C16) are respectively connected to the third terminal of the fifth relay (K5). The second end of the sixth zero-resistor (R60) is connected to the inverting input terminal of the 33-A amplifier (U33-A). The output terminal of the 33-A amplifier (U33-A) is connected to the first end of the thirty-first resistor (R31) and the third terminal of the fifth relay (K5). The second end of the thirty-first resistor (R31) is grounded through the nineteenth capacitor (C19). The second end of the thirty-first resistor (R31) is connected to the non-inverting input terminal of the 25-A amplifier (U25-A) through the twelfth capacitor (C12). The V_SET control terminal is connected to the inverting input terminal of the 25-A amplifier (U25-A) through the thirteenth resistor (R13). The output terminal of the 25-A amplifier (U25-A) is grounded through the sixteenth resistor (R16) and the twenty-fifth capacitor (C25) in sequence.

8. The integrated laser tester according to claim 1, characterized in that The control unit (500) includes the FPGA_SYNC_TRIG_OUT1 port and the FPGA_SYNC_TRIG_OUT2 port. The FPGA_SYNC_TRIG_OUT1 port and the FPGA_SYNC_TRIG_OUT2 port are used to provide a first trigger signal issued by the trigger unit (400). The first trigger signal is used to control the laser driver unit (100) and the photodiode detection unit (200) to work in cooperation.

9. The integrated laser tester according to claim 1, characterized in that The control unit (500) further includes the FPGA_TRIG_OUT1 port and the FPGA_TRIG_OUT2 port. The FPGA_TRIG_OUT1 port and the FPGA_TRIG_OUT2 port are used to provide a second trigger signal issued by the trigger unit (400). The second trigger signal is used to control the cooperation with other devices of the integrated laser tester.

10. The integrated laser tester according to claim 1, characterized in that The control unit (500) is a ZYNQ controller.

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