Probe device and battery test equipment

Abstract

The utility model relates to a probe device and battery testing equipment, the probe device comprises a probe base, a first driving mechanism, a second driving mechanism and a probe clamping mechanism, the first driving mechanism is used for driving the probe base to move along a first direction, and the second driving mechanism is used for driving the probe base to move along a second direction. The first direction is perpendicular to the second direction, the probe clamping mechanism can pull out the probe from the probe base, and a new probe can be installed on the probe base. According to the probe device and the battery test equipment, the positions of the probe base in the first direction and the second direction can be adjusted, so that the positions, where probes need to be replaced, in the probe row on the probe base are aligned with the probe clamping mechanism, and therefore, the replacement efficiency of the probes is improved. Therefore, the probe clamping mechanism can be used for pulling out the probe in the probe base and replacing the probe with a new probe, thereby realizing accurate replacement of the probe and improving the replacement efficiency of the probe.

Description

Technical Field

[0001] This application relates to the field of photovoltaic technology, and in particular to a probe device and a battery testing device. Background Art

[0002] To ensure the quality of solar cells, it is necessary to use battery testing equipment to test solar cell wafers. For BC (Back Contact) batteries, there are no grid lines on both the front and back sides, and the electrodes are all located on the back side and arranged in a cross pattern. This design not only completely eliminates the shading loss caused by grid line electrodes but also maximizes the utilization of incident photons, significantly improving the efficiency and power generation of the battery. At the same time, the BC technology can be combined with technologies such as TOPCon, HJT, and PERC to further improve the efficiency through a stacking process. In addition, since there are no grid lines on the front side, it is more aesthetically pleasing and is particularly suitable for distributed photovoltaic application scenarios.

[0003] In the related art, during the testing process of solar cell wafers, the probe row of the battery testing equipment contacts the back electrode of the solar cell wafer (i.e., the electrode on the side of the solar cell wafer facing away from the sun). If the probe is damaged, poor contact with the back electrode will occur, resulting in inaccurate test results or inability to meet the test requirements.

[0004] However, the probes of the battery testing equipment are not easily disassembled, and are easily damaged during long-term testing operations, requiring frequent replacement of new probes. When replacing the probes, it is necessary to manually disassemble the damaged probes and install new probes to ensure accurate alignment of the new probes with the back electrodes on the solar cell wafer. The efficiency of manually replacing the probes is slow. Summary of the Invention

[0005] Based on this, this application provides a probe device and a battery testing device to solve the technical problem of how to improve the replacement efficiency of probes.

[0006] On the one hand, this application provides a probe device, which includes a probe base, a first driving mechanism, a second driving mechanism, and a probe clamping mechanism. The probe base is used to set a probe row, and the probe row includes a plurality of probes. The first driving mechanism is used to drive the probe base to move in a first direction, and the second driving mechanism is used to drive the probe base to move in a second direction. The first direction and the second direction are perpendicular to each other. The probe clamping mechanism can pull out the probes from the probe base and can install new probes on the probe base.

[0007] In one embodiment, the probe clamping mechanism includes a lifting mechanism, a support arm, a cross beam arm, and a probe clamp. The support arm is connected to the lifting mechanism, and the lifting mechanism can drive the support arm to move up and down. The cross beam arm is connected to the support arm, and the probe clamp is disposed on the cross beam arm. The cross beam arm can move along the support arm.

[0008] In one embodiment, the number of the support arms is two, and the two support arms are parallel to each other. The cross beam arm is connected between the two support arms.

[0009] And / or, the cross beam arm is connected with a plurality of the probe clamps. The support arm extends along the first direction, and the plurality of probe clamps are arranged side by side on the cross beam arm along the second direction.

[0010] In one embodiment, a linear motor is arranged on the support arm, and the linear motor can drive the cross beam arm to move along the support arm.

[0011] And / or, the probe clamp includes a clamping groove for clamping the probe. The clamping groove extends in the vertical direction, and the size of the clamping groove gradually decreases from top to bottom.

[0012] In one embodiment, at least one positioning pin is arranged on the cross beam arm. The probe clamping mechanism includes a camera module, and the camera module can take pictures and position the positioning pin.

[0013] In one embodiment, the first driving mechanism includes a first motor and a first moving platform. The first moving platform is in transmission connection with the first motor, and the first motor can drive the first moving platform to move along the first direction. The second driving mechanism is arranged on the first moving platform. The second driving mechanism includes a second motor and a second moving platform. The second motor is in transmission connection with the second moving platform, and the second motor can drive the second moving platform to move relative to the first moving platform along the second direction.

[0014] In one embodiment, a lifting platform is arranged on the second moving platform. The lifting platform includes a driving motor, a lead screw, and a support plate. The driving motor is connected to the lead screw, and the lead screw is in transmission connection with the support plate. The driving motor can drive the lead screw to rotate, so that the lead screw drives the support plate to move up and down. The probe base is installed on the support plate.

[0015] In one embodiment, the probe device includes a stacking mechanism. The stacking mechanism includes a mounting plate which is in transmission connection with the lead screw. The mounting plate and the supporting plate are opposite to each other in the up-and-down direction. The lead screw is a double-headed lead screw. When the lead screw rotates, the mounting plate and the supporting plate move in opposite directions. The mounting plate can mount a glass plate. When the glass plate and the probe base approach each other until the probe row on the probe base contacts the back electrode of the battery cell, the glass plate abuts against the front side of the battery cell.

[0016] In one embodiment, the probe device further includes a probe supply mechanism for supplying new probes. The probe clamping mechanism can clamp a new probe from the probe supply mechanism and install the new probe onto the probe base.

[0017] On the other hand, the present application provides a battery testing device. The battery testing device includes a feeding device and the probe device as described above. The feeding device can supply the battery cell to be tested to the position where the probe base is located. The feeding device includes a rotating mechanism and at least one tray for supporting the battery cell. The tray is connected to the rotating mechanism, and the rotating mechanism can drive the tray to rotate so that the tray moves the battery cell above the probe row.

[0018] For the above-mentioned battery testing device and probe device, the first driving mechanism and the second driving mechanism are used to move the probe base with the probe row in the first direction and the second direction, so as to adjust the positions of the probe row in the first direction and the second direction, so that the position where the probe row needs to replace the probe is aligned with the probe clamping mechanism. In this way, the probe in the probe base can be pulled out and a new probe can be replaced by using the probe clamping mechanism, thereby realizing accurate probe replacement and improving the probe replacement efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the related art, the following will briefly introduce the drawings required for use in the description of the embodiments or the related art. Obviously, the drawings in the following description are only some embodiments of the present application. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0020] Figure 1 It is a schematic structural diagram of a battery testing device according to an embodiment of the present application.

[0021] Figure 2 It is a partial structural schematic diagram of the probe device of the battery testing device according to an embodiment of the present application.

[0022] Figure 3In the battery testing device according to an embodiment of the present application, it is a partial structural schematic diagram when the crossbeam arm moves to a position above the probe base.

[0023] Figure 4 It is Figure 3 a partially enlarged structural schematic diagram of the battery testing device.

[0024] Figure 5 In the battery testing device according to an embodiment of the present application, it is a partial structural schematic diagram when the crossbeam arm moves to a position above the probe filling assembly.

[0025] Figure 6 It is Figure 5 a partially enlarged structural schematic diagram of the battery testing device.

[0026] Figure 7 In the battery testing device according to an embodiment of the present application, it is a structural schematic diagram of the probe clamp of the probe clamping mechanism.

[0027] Description of reference numerals:

[0028] 10. Probe device; 101. First direction; 102. Second direction; 103. Vertical direction; 11. Probe base; 111. Probe; 12. First driving mechanism; 121. First motor; 122. First moving table; 13. Second driving mechanism; 131. Second motor; 132. Second moving table; 14. Probe clamping mechanism; 141. Lifting mechanism; 142. Support arm; 1421. Linear motor; 143. Crossbeam arm; 1431. Positioning pin; 144. Probe clamp; 1441. Clamping groove; 145. Camera module; 15. Lifting table; 151. Driving motor; 152. Lead screw; 153. Support plate; 16. Stacking mechanism; 161. Mounting plate; 162. Pressing plate; 163. Glass plate; 17. Probe supply mechanism; 171. Probe filling assembly; 172. Rotating motor; 173. Complementer; 20. Feeding device; 21. Rotating mechanism; 22. Tray. Detailed implementation manners

[0029] To make the above objects, features, and advantages of the present application more obvious and understandable, the following will describe the detailed implementation manners of the present application in conjunction with the accompanying drawings. Many specific details are set forth in the following description to fully understand the present application. However, the present application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar improvements without departing from the connotation of the present application. Therefore, the present application is not limited by the specific embodiments disclosed below.

[0030] In the description of the present application, it should be understood that if there are terms such as "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", etc., the orientation or positional relationship indicated by these terms is based on the orientation or positional relationship shown in the drawings, and is only for the convenience of describing the present application and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus should not be construed as a limitation on the present application.

[0031] In addition, if there are terms such as "first" and "second", these terms are only used for descriptive purposes and should not be construed as indicating or implying relative importance or implicitly specifying the quantity of the indicated technical features. Thus, features defined with "first" and "second" may explicitly or implicitly include at least one of such features. In the description of the present application, if there is a term "plurality", the meaning of "plurality" is at least two, such as two, three, etc., unless otherwise specifically and clearly defined.

[0032] In the present application, unless otherwise clearly specified and limited, if there are terms such as "mounted", "connected", "coupled", "fixed", etc., these terms should be understood in a broad sense. For example, it may be a fixed connection, a detachable connection, or integrated; it may be a mechanical connection or an electrical connection; it may be directly connected or indirectly connected through an intermediate medium, and it may be the communication inside two elements or the interaction relationship between two elements, unless otherwise clearly limited. For those of ordinary skill in the art, the specific meanings of the above terms in the present application can be understood according to specific circumstances.

[0033] In the present application, unless otherwise clearly specified and limited, if there is a description such as a first feature being "on" or "under" a second feature, the meaning may be that the first and second features are in direct contact, or the first and second features are indirectly in contact through an intermediate medium. Moreover, the first feature being "above", "over" and "on" the second feature may mean that the first feature is directly above or obliquely above the second feature, or merely indicates that the first feature is at a higher horizontal level than the second feature. The first feature being "under", "beneath" and "under" the second feature may be that the first feature is directly below or obliquely below the second feature, or merely indicates that the first feature is at a lower horizontal level than the second feature.

[0034] It should be noted that if an element is referred to as "fixed to" or "disposed on" another element, it can be directly on the other element or there may be an intermediate element. If an element is considered to be "connected" to another element, it can be directly connected to the other element or there may be an intermediate element at the same time. If present, the terms "vertical", "horizontal", "upper", "lower", "left", "right" and similar expressions used in this application are only for illustrative purposes and do not represent the only implementation.

[0035] Combined with Figure 1 and Figure 2 As shown, a battery testing device provided by an embodiment of the present application includes a probe device 10 and a feeding device 20. In the battery testing device, in order to meet the testing requirements of battery wafers, the probes 111 are arranged in an array, that is, there are multiple probes 111 in the same row and multiple probes 111 in the same column. Regarding the number of the probes 111, no limitation is made here, as long as it can contact the corresponding electrodes on the battery wafer to meet the testing requirements.

[0036] For the sake of easy understanding, in this application, such multiple probes 111 arranged according to the testing requirements are referred to as "probe rows".

[0037] The probe device 10 can provide the probes 111 for testing the battery wafer and can replace the probes 111 in the probe row.

[0038] Combined with Figure 1 and Figure 2 As shown, the probe device 10 includes a probe base 11, a first driving mechanism 12, a second driving mechanism 13 and a probe clamping mechanism 14. The probe row is disposed on the probe base 11. Understandably, the multiple probes 111 distributed on the probe base 11 are arranged in an array. The first driving mechanism 12 is used to drive the probe base 11 to move along the first direction 101, and the second driving mechanism 13 is used to drive the probe base 11 to move along the second direction 102. In this way, the probe base 11 can move the probe row in the first direction 101 and the second direction 102 to adjust the position of the probe row in the first direction 101 and the second direction 102. In this embodiment, the first direction 101 and the second direction 102 are perpendicular to each other, and both the first direction 101 and the second direction 102 are perpendicular to the vertical direction 103. In this application, the vertical direction 103 refers to the moving direction of a structural member that can move up and down during the up and down movement.

[0039] The probe clamping mechanism 14 can pull out the probe 111 from the probe base 11 and can install a new probe 111 on the probe base 11 to realize the replacement of the probe 111.

[0040] In the above embodiment, the probe base 11 is moved with the probe row in the first direction 101 and the second direction 102 by the first driving mechanism 12 and the second driving mechanism 13 to adjust the position of the probe row in the first direction 101 and the second direction 102, so that the position of the probe row where the probe 111 needs to be replaced is aligned with the probe clamping mechanism 14, so that the probe clamping mechanism 14 can accurately pull out the probe 111 in the probe base 11 and replace it with a new probe 111, thereby improving the replacement efficiency of the probe 111.

[0041] Continue reading Figure 1 As shown, in some embodiments, the first driving mechanism 12 includes a first motor 121 and a first moving platform 122. The first moving platform 122 is connected to the first motor 121 in a transmission manner, and the first motor 121 can drive the first moving platform 122 to move along the first direction 101. The second driving mechanism 13 is arranged on the first moving platform 122, so that when the first moving platform 122 moves along the first direction 101, the second driving mechanism 13 moves along the first direction 101 driven by the first moving platform 122. The second driving mechanism 13 includes a second motor 131 and a second moving platform 132, and the second motor 131 is connected to the second moving platform 132 in a transmission manner, and the second motor 131 can drive the second moving platform 132 to move relative to the first moving platform 122 along the second direction 102. The probe base 11 is connected to the second moving platform 132, so that when the second moving platform 132 moves relative to the first moving platform 122 along the second direction 102, the probe base 11 moves along the second direction 102 driven by the second moving platform 132. In this embodiment, the first moving stage 122 moves in the first direction 101 and the second moving stage 132 moves in the second direction 102 to achieve movement of the probe base 11 in the first direction 101 and the second direction 102, thereby adjusting the positions of the probe arrays in the first direction 101 and the second direction 102.

[0042] It should be noted that by adjusting the position of the probe row in the first direction 101 and the second direction 102, not only can the position of the probe 111 that needs to be replaced in the probe row be matched to the probe clamping mechanism 14, but also, when the battery cell needs to be tested, the position of the probe row can be adjusted to meet the need for relative positioning with the battery cell located above it, so that the multiple probes 111 in the probe row can contact the corresponding back electrodes on the battery cell, so that the battery testing equipment can test the battery cell.

[0043] It should be noted that the probe base 11 can move up and down, so when the probe row on the probe base 11 is aligned with the battery cell, the probe base 11 is lifted to make the multiple probes 111 in the probe row contact the back electrodes on the battery cell.

[0044] In some embodiments, a lifting platform 15 is provided on the second mobile station 132, and the lifting platform 15 is used to drive the probe base 11 to move up and down. In combination with Figure 2 As shown, the lifting platform 15 includes a driving motor 151, a lead screw 152, and a support plate 153. The driving motor 151 is connected to the lead screw 152, and the lead screw 152 is in transmission connection with the support plate 153. The driving motor 151 can drive the lead screw 152 to rotate, so that the lead screw 152 drives the support plate 153 to move up and down. In this embodiment, the probe base 11 is installed on the support plate 153, so as to drive the probe base 11 to move up and down by using the up and down movement of the support plate 153.

[0045] It should be noted that lifting platforms 15 are provided on both sides of the probe base 11 to improve the stability of the up and down movement of the probe base 11.

[0046] Continuing to combine Figure 1 and Figure 2 As shown, in some embodiments, the probe device 10 includes a stacking mechanism 16, and the stacking mechanism 16 is used to press against the battery cell, so that the back electrode of the battery cell is in good contact with the probe row, thereby improving the test stability.

[0047] The stacking mechanism 16 can share the same power source with the lifting platform 15. That is to say, while the lifting platform 15 realizes the up and down movement of the probe base 11, it can also enable the stacking mechanism 16 to meet the pressing requirement for the battery cell.

[0048] As Figure 2 shown, the stacking mechanism 16 includes a mounting plate 161, and the mounting plate 161 is in transmission connection with the lead screw 152. The mounting plate 161 is opposite to the support plate 153 up and down, that is, the mounting plate 161 and the support plate 153 are arranged opposite to each other along the vertical direction 103. The lead screw 152 is a double-headed lead screw. When the lead screw 152 rotates, the mounting plate 161 and the support plate 153 move in opposite directions. In this embodiment, the lead screw 152 can drive the mounting plate 161 and the support plate 153 to move towards each other and can also drive the mounting plate 161 and the support plate 153 to move away from each other. The mounting plate 161 can mount a glass plate 163. In this way, the glass plate 163 on the mounting plate 161 and the probe base 11 on the support plate 153 can approach and move away from each other. Therefore, when it is necessary to test the battery cell, the mounting plate 161 and the support plate 153 approach each other to drive the glass plate 163 and the probe base 11 to approach each other. When the probe row on the probe base 11 contacts the back electrode of the battery cell, the glass plate 163 abuts against the front side of the battery cell. Subsequently, the pressing of the glass plate 163 on the battery cell enables the back electrode of the battery cell and the probe row to maintain stable contact.

[0049] It should be noted that, in some embodiments, the stacking mechanism 16 may also adopt a power source independent of the lifting table 15. For example, the stacking mechanism 16 includes a motor-screw structure or a lifting cylinder for realizing the lifting movement of the mounting plate 161. The implementation manner in which the stacking mechanism 16 drives the glass plate 163 to move up and down by using the mounting plate 161 will not be elaborated here.

[0050] Continuing to refer to Figure 2 As shown, a pressing plate 162 may be provided on the mounting plate 161, and the pressing plate 162 can clamp and fix the glass plate 163 to the mounting plate 161.

[0051] In some embodiments, the pressing plate 162 is detachably connected to the mounting plate 161, so that only by detaching the pressing plate 162 from the mounting plate 161, the pressing force of the pressing plate 162 on the glass plate 163 can be released, facilitating the disassembly of the glass plate 163.

[0052] It should be noted that, in the embodiment of using the glass plate 163 to press against the battery cell, since the glass plate 163 is located on the front side of the battery cell, the back electrode of the battery cell is in contact with the probe row. Therefore, when the battery cell is not placed on the probe row, the glass plate 163 covers the probe row. Subsequently, if the probe 111 needs to be replaced, the glass plate 163 covering the probe row needs to be removed to leave space above the probe row to meet the need for replacing the probe 111.

[0053] Combined with Figure 1 、 Figure 3 and Figure 4 As shown, the probe clamping mechanism 14 includes a lifting mechanism 141, a support arm 142, a cross beam arm 143, and a probe clamp 144. The support arm 142 is connected to the lifting mechanism 141, and the cross beam arm 143 is connected to the support arm 142. The probe clamp 144 is provided on the cross beam arm 143. In this embodiment, the lifting mechanism 141 can drive the support arm 142 to move up and down to adjust the height of the probe clamp 144; the cross beam arm 143 can move along the support arm 142, so as to adjust the probe clamp 144 above the probe 111 to meet the need for the probe clamp 144 to clamp the probe 111. In this embodiment, the probe 111 can be replaced by using the probe clamping mechanism 14. Compared with the manual replacement of the probe 111 in the traditional technology, in the probe device 10 of the present application, the probe clamping mechanism 14 improves the replacement efficiency of the probe 111.

[0054] It should be noted that the number of the support arms 142 may be 2, and the 2 support arms 142 are parallel to each other, and the cross beam arm 143 is connected between the 2 support arms 142. The 2 support arms 142 can stably support both ends of the cross beam arm 143, thereby improving the movement stability of the cross beam arm 143.

[0055] The support arm 142 is provided with a linear motor 1421, and the linear motor 1421 can drive the crossbeam arm 143 to move along the support arm 142. The linear motor 1421 includes but is not limited to a strong magnetic motor, as long as the linear motor 1421 can drive the crossbeam arm 143 to move translationally along the support arm 142.

[0056] The support arm 142 extends along the first direction 101. That is to say, the support arm 142 is parallel to the moving direction of the first moving platform 122, and the support arm 142 is parallel to the pallet 153. In this way, the support arm 142 can reduce the movement interference with the pallet 153, so as to facilitate the crossbeam arm 143 to move the probe clamp 144 along the support arm 142 to above the probe row for replacing the probe 111.

[0057] The crossbeam arm 143 is connected with a plurality of probe clamps 144, and the plurality of probe clamps 144 are arranged side by side along the second direction 102 on the crossbeam arm 143. Thus, the probe clamping mechanism 14 can simultaneously grasp a plurality of probes 111 in the same row of the probe row through the plurality of probe clamps 144, thereby improving the efficiency of replacing the probe 111.

[0058] Refer to again Figure 1 、 Figure 5 and Figure 6 As shown in, the probe device 10 further includes a probe supply mechanism 17, and the probe supply mechanism 17 is used to supply new probes 111. In this embodiment, the probe clamping mechanism 14 can clamp a new probe 111 from the probe supply mechanism 17 and install the new probe 111 onto the probe base 11.

[0059] In some embodiments, the probe supply mechanism 17 is arranged on the side of the moving path of the crossbeam arm 143 away from the feeding device 20. Since the lifting mechanism 141 can drive the support arm 142 to move up and down, and the crossbeam arm 143 can move along the support arm 142, the probe clamp 144 of the probe clamping mechanism 14 can move along the first direction 101 with the crossbeam arm 143 and move up and down. In this way, the probe clamp 144 can clamp a new probe 111 from the probe supply mechanism 17 and move the new probe 111 along the first direction 101 above the probe base 11, so as to install the new probe 111 onto the probe base 11 under the drive of the lifting mechanism 141.

[0060] As Figure 6 shown, the probe supply mechanism 17 includes a probe filling component 171, a rotating motor 172 and a replenisher 173. The rotating motor 172 is used to drive the probe filling component 171 to move, so that the probe filling component 171 moves the probe 111 in the replenisher 173 out to fill the vacancy after the probe 111 is taken away by the probe clamp 144, achieving the effect of continuously supplying the probe 111.

[0061] Combined withFigure 7 As shown, the probe clamp 144 includes a clamping groove 1441 for clamping the probe 111. The clamping groove 1441 extends along the vertical direction 103, and the size of the clamping groove 1441 gradually decreases from top to bottom, so that the probe clamp 144 can meet the clamping requirements for various probes 111 of different sizes.

[0062] Refer to again Figure 1 As shown, in some embodiments, the probe clamping mechanism 14 includes a camera module 145. The camera module 145 is used to locate the position where the probe clamp 144 clamps the probe 111, which is beneficial to improving the accuracy of the probe clamp 144 for clamping and installing the probe 111.

[0063] Combined with Figure 1 and Figure 6 As shown, in some embodiments, at least one positioning pin 1431 is provided on the cross beam arm 143. The camera module 145 can take pictures and locate the positioning pin 1431 on the cross beam arm 143. Since the position of the positioning pin 1431 relative to the cross beam arm 143 is fixed and the position of the probe clamp 144 relative to the cross beam arm 143 is fixed, the camera module 145 can locate the position of the probe clamp 144 by taking pictures and positioning the positioning pin 1431.

[0064] Furthermore, the camera module 145 is electrically connected to the first motor 121 of the first driving mechanism 12 and the second motor 131 of the second driving mechanism 13 through a controller. In this way, the first driving mechanism 12 and the second driving mechanism 13 drive the probe row to move along the first direction 101 and the second direction 102 according to the position of the positioning pin 1431, so that the probe row moves below the cross beam arm 143, realizing the alignment of the probe 111 in the probe row with the probe clamp 144 on the cross beam arm 143.

[0065] It should be noted that for the probe clamping mechanism 14 to replace the probe 111 in the probe row, the camera module 145 is not necessary. That is to say, even if the camera module 145 is omitted, the probe clamping mechanism 14 can still complete the action of replacing the probe 111. For example, in some embodiments, the probe device 10 has been debugged when it is put into production, so that each mechanism works according to the corresponding operation program, and the probe clamping mechanism 14 in the probe device 10 can clamp the probe 111 at the set position and replace the probe 111 in the probe row.

[0066] For the sake of easy understanding, the working principle of replacing the probe 111 of the probe device 10 in one of the embodiments is described below.

[0067] Before replacing the probe 111, remove the pressing plate 162 to release the clamping and fixing of the glass plate 163 by the pressing plate 162, so as to take out the glass plate 163. In this way, after the glass plate 163 is taken out, the probe row on the probe base 11 is no longer blocked by the glass plate 163, so as to replace the probe 111 subsequently.

[0068] To adapt to the probe clamp 144 to pull out the probe 111 on the probe base 11, the lifting mechanism 141 drives the support arm 142 to move up and down, so that the cross beam arm 143 drives the probe clamp 144 to move to a suitable height. The linear motor 1421 on the support arm 142 drives the cross beam arm 143 to translate along the support arm 142, so that the probe clamp 144 moves to the position where the probe 111 needs to be replaced in the probe row. In this way, the probe clamp 144 cooperates with the up and down movement of the lifting mechanism 141 to perform the needle pulling action to pull out the probe 111 to be replaced.

[0069] After the needle pulling action is completed, the probe clamp 144 can start to clamp a new probe 111 and perform the needle inserting action to complete the action of replacing the probe 111.

[0070] Refer to again Figure 1 and Figure 2 As shown in, in the battery testing device of the present application, the feeding device 20 can supply the battery wafers to be tested to the position where the probe base 11 is located. Thus, after the feeding device 20 supplies the battery wafers to the position where the probe base 11 is located, the battery wafers cover the probe row on the probe base 11. In this way, the battery testing device can make the multiple probes 111 of the probe row contact the corresponding back electrodes in the battery wafers to test the battery wafers.

[0071] The structure of the feeding device 20 has various possibilities. For example, in some embodiments, the feeding device 20 includes a manipulator that can transfer the battery wafers to the position where the probe row is located to meet the testing requirements. For another example, in some embodiments, the feeding device 20 may include a conveying track that can translate the battery wafers to the position where the probe row is located. For another example, in combination with Figure 2 and Figure 3 As shown in, the feeding device 20 includes a rotating mechanism 21 and at least one tray 22. The tray 22 is used to support the battery wafers. The tray 22 is connected to the rotating mechanism 21, and the rotating mechanism 21 can drive the tray 22 to rotate, so that the tray 22 moves the battery wafers above the probe row. Regarding the structure of the feeding device 20, it is not limited here as long as the feeding device 20 can move the battery wafers above the probe row so that the battery testing device can use the probe row to test the battery wafers.

[0072] The rotating mechanism 21 is connected with 4 trays 22. As the rotating mechanism 21 rotates, the 4 trays 22 can successively move the battery wafers into and out of the position above the probe row. It should be noted that the number of trays 22 can be 1, or 2 or more than 2. The specific number of trays 22 is not limited herein.

[0073] It should be noted that, in the embodiment where the probe device 10 includes the laminating mechanism 16, since the laminating mechanism 16 presses against the front side of the battery wafer through the glass plate 163, in this embodiment, when the battery testing equipment tests the battery wafer, the tray 22 supports the battery wafer and is located between the glass plate 163 and the probe row. After the battery wafer is tested, the mounting plate 161 in the laminating mechanism 16 and the supporting plate 153 in the lifting table 15 move away from each other. Then, the mounting plate 161 drives the glass plate 163 to move upward relative to the tray 22, and the supporting plate 153 drives the probe base 11 to move downward relative to the tray 22. In this way, the glass plate 163 and the probe row move away from each other to release the clamping of the battery wafer on the tray 22. At this time, the tray 22 can support the battery wafer and move it out from between the glass plate 163 and the probe row. Then, the rotating mechanism 21 rotates, so that the tray 22 rotates the tested battery wafer away from the probe device 10 and rotates the next tray 22 to the position corresponding to the probe row, so that the probe row can test the battery wafer supported by the next tray 22.

[0074] The technical features of the above embodiments can be combined arbitrarily. For the sake of concise description, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, it should be considered as the scope recorded in this specification.

[0075] The above embodiments only represent several implementation manners of the present application. The description is relatively specific and detailed, but it should not be understood as a limitation to the patent scope of the present application. It should be pointed out that for those of ordinary skill in the art, without departing from the inventive concept of the present application, several deformations and improvements can still be made, and these all belong to the protection scope of the present application. Therefore, the protection scope of the patent of the present application should be subject to the appended claims.

Claims

1. A probe device (10), characterized in that, The probe device (10) includes a probe base (11), a first driving mechanism (12), a second driving mechanism (13), and a probe clamping mechanism (14). The probe base (11) is used to arrange a probe row, and the probe row includes a plurality of probes (111). The first driving mechanism (12) is used to drive the probe base (11) to move along a first direction (101), and the second driving mechanism (13) is used to drive the probe base (11) to move along a second direction (102). The first direction (101) and the second direction (102) are perpendicular to each other. The probe clamping mechanism (14) can pull out the probe (111) from the probe base (11) and can install a new probe (111) on the probe base (11).

2. The probe device (10) according to claim 1, characterized in that, The probe clamping mechanism (14) includes a lifting mechanism (141), a support arm (142), a cross beam arm (143), and a probe clamp (144). The support arm (142) is connected to the lifting mechanism (141), and the lifting mechanism (141) can drive the support arm (142) to move up and down. The cross beam arm (143) is connected to the support arm (142), and the probe clamp (144) is arranged on the cross beam arm (143). The cross beam arm (143) can move along the support arm (142).

3. The probe device (10) according to claim 2, characterized in that, The number of the support arms (142) is two, and the two support arms (142) are parallel to each other. The cross beam arm (143) is connected between the two support arms (142); and / or, the cross beam arm (143) is connected with a plurality of the probe clamps (144). The support arm (142) extends along the first direction (101), and the plurality of probe clamps (144) are arranged side by side along the second direction (102) on the cross beam arm (143).

4. The probe device (10) according to claim 2 or 3, characterized in that, The support arm (142) is provided with a linear motor (1421), and the linear motor (1421) can drive the cross beam arm (143) to move along the support arm (142); and / or, the probe clamp (144) includes a clamping groove (1441) for clamping the probe (111). The clamping groove (1441) extends along the vertical direction (103), and the size of the clamping groove (1441) gradually decreases from top to bottom.

5. The probe device (10) according to claim 4, characterized in that, At least one positioning pin (1431) is arranged on the cross beam arm (143). The probe clamping mechanism (14) includes a camera module (145), and the camera module (145) can take pictures and position the positioning pin (1431).

6. The probe device (10) according to claim 1, characterized in that, The first driving mechanism (12) includes a first motor (121) and a first moving platform (122). The first moving platform (122) is in transmission connection with the first motor (121). The first motor (121) can drive the first moving platform (122) to move along the first direction (101). The second driving mechanism (13) is arranged on the first moving platform (122). The second driving mechanism (13) includes a second motor (131) and a second moving platform (132). The second motor (131) is in transmission connection with the second moving platform (132). The second motor (131) can drive the second moving platform (132) to move relative to the first moving platform (122) along the second direction (102).

7. The probe device (10) according to claim 6, characterized in that, An elevating platform (15) is arranged on the second moving platform (132). The elevating platform (15) includes a driving motor (151), a lead screw (152), and a support plate (153). The driving motor (151) is connected to the lead screw (152). The lead screw (152) is in transmission connection with the support plate (153). The driving motor (151) can drive the lead screw (152) to rotate, so that the lead screw (152) drives the support plate (153) to move up and down. The probe base (11) is installed on the support plate (153).

8. The probe device (10) according to claim 7, characterized in that, The probe device (10) includes a laminating mechanism (16). The laminating mechanism (16) includes a mounting plate (161). The mounting plate (161) is in transmission connection with the lead screw (152). The mounting plate (161) is vertically opposite to the support plate (153). The lead screw (152) is a double-headed lead screw. When the lead screw (152) rotates, the mounting plate (161) and the support plate (153) move in opposite directions. The mounting plate (161) can mount a glass plate (163). When the glass plate (163) and the probe base (11) approach each other until the probe row on the probe base (11) contacts the back electrode of the battery cell, the glass plate (163) abuts against the front surface of the battery cell.

9. The probe device (10) according to claim 1, wherein, The probe device (10) further includes a probe supply mechanism (17). The probe supply mechanism (17) is used to supply new probes (111). The probe clamping mechanism (14) can clamp new probes (111) from the probe supply mechanism (17) and install the new probes (111) onto the probe base (11).

10. A battery testing device, characterized in that, The battery testing apparatus includes a feeding device (20) and a probe device (10) as described in any one of claims 1 to 9. The feeding device (20) is capable of supplying a battery cell to be tested to the position where the probe base (11) is located. The feeding device (20) includes a rotating mechanism (21) and at least one tray (22). The tray (22) is used to support the battery cell. The tray (22) is connected to the rotating mechanism (21), and the rotating mechanism (21) is capable of driving the tray (22) to rotate so that the tray (22) moves the battery cell above the probe row.

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