Smart card test system

By designing a smart card test system, using radio frequency sensing modules and counters to record the LED optical signal feedback status of the smart card, the problem of lack of durability testing in NFC products is solved, and the durability testing of LED optical signal feedback products is realized.

CN223123168UActive Publication Date: 2025-07-18ZHUHAI RUICHENG TECHNOLOGY CO LTD
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Patent Information

Application Number
CN202520961988.1
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2025-05-16
Publication Date
2025-07-18
Estimated Expiration
2035-05-16

AI Technical Summary

Technical Problem

There is a lack of durability testing instruments for adding LED optical signal feedback to NFC products in the prior art.

Method used

A smart card testing system is designed, including a main control processor, first and second RF sensing modules, time accumulators, counters and power modules, through these components, to obtain and record the feedback status of the LED optical signal of the smart card to achieve durability testing.

Benefits of technology

It realizes durability testing of products with LED optical signal feedback into smart cards, which can record the test duration and number of tests to meet different test needs.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model discloses an intelligent card test system. The system comprises a main control processor, a first radio frequency induction module, a second radio frequency induction module, a time accumulator, a counter and a power supply module, the first radio frequency induction module is used for uninterruptedly reading a test card, acquiring a first light emitting state of an LED lamp of the test card, and outputting a first electric signal to the time accumulator according to the first light emitting state; the time accumulator is used for accumulatively receiving the first electric signal so as to determine the accumulative test time length of the test card; the second radio frequency induction module is used for periodically reading the test card according to a preset time interval, acquiring a second light-emitting state of the LED lamp of the test card, and outputting a second electric signal to the counter according to the second light-emitting state; and the counter is used for accumulating the received second electric signal so as to determine the accumulated test times of the test card, thereby realizing the durability test of the product added with the LED optical signal feedback in the intelligent card.
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Description

Technical Field

[0001] The embodiments of the present utility model relate to the technical field of testing, and in particular, to an intelligent card testing system. Background Art

[0002] Currently, in the field of intelligent cards, there is a new type of product that adds a light signal feedback of a light emitting diode (LED) to near field communication (NFC) products (such as contactless payment bank cards, various types of inductive integrated circuit (IC) recharge cards / consumer cards, etc.). When this new type of product is used in daily life, the LED in the card body will emit light, playing a role in beautification and warning. This new type of product can be widely applied to fields such as payment cards and intelligent access control cards, providing a user interaction experience through LED light signal feedback, such as prompting the card status or successful transaction. However, currently, there is no instrument for testing the durability of products with LED light signal feedback added to NFC on the market. Content of the Utility Model

[0003] The present utility model provides an intelligent card testing system, which realizes the durability testing of products with LED light signal feedback added to intelligent cards.

[0004] The embodiments of the present utility model provide an intelligent card testing system, including: a main control processor, a first radio frequency induction module, a second radio frequency induction module, a timer, a counter, and a power module; the first radio frequency induction module is respectively connected to the power module and the timer; the second radio frequency induction module is respectively connected to the power module and the counter;

[0005] The main control processor is respectively connected to the first radio frequency induction module, the second radio frequency induction module, the timer, the counter, and the power module;

[0006] The power module is used to supply power to the main control processor, the first radio frequency induction module, the second radio frequency induction module, the timer, and the counter;

[0007] The first radio frequency induction module is used to continuously read the test card, obtain the first lighting state of the LED lamp of the test card, and output a first electrical signal to the timer according to the first lighting state; the first lighting state includes the lighting duration of the LED lamp;

[0008] The timer is used to cumulatively receive the first electrical signal to determine the cumulative test duration of the test card;

[0009] The second radio frequency induction module is configured to periodically read the test card at a preset time interval, obtain the second light-emitting state of the LED lamp of the test card, and output a second electrical signal to the counter according to the second light-emitting state; the second light-emitting state includes whether the LED lamp emits light;

[0010] The counter is configured to accumulate the received second electrical signals to determine the cumulative test times of the test card.

[0011] Further, the first radio frequency induction module includes a first NFC card reading module and a first optical signal detection module;

[0012] The first NFC card reading module is configured to continuously read the test card and trigger the LED lamp of the test card;

[0013] The first optical signal detection module is configured to detect the first light-emitting state of the LED lamp, and convert the first light-emitting state into a first electrical signal and output it to the timer.

[0014] Further, the second radio frequency induction module includes a second NFC card reading module and a second optical signal detection module;

[0015] The second NFC card reading module is configured to periodically read the test card at a preset time interval and trigger the LED lamp of the test card;

[0016] The second optical signal detection module is configured to detect the second light-emitting state of the LED lamp, and convert the second light-emitting state into a second electrical signal and output it to the counter.

[0017] Further, the system further includes: a control panel; the control panel is connected to the main control processor; the control panel includes a display module;

[0018] The display module is configured to display the cumulative test duration and / or the cumulative test times of the test card.

[0019] Further, the control panel further includes a reset module; the reset module is connected to the main control processor;

[0020] The reset module is configured to reset the timer and / or the counter.

[0021] Further, the system further includes: a data storage module; the data storage module is connected to the main control processor;

[0022] The data storage module is configured to store the system information of the test process of the test card.

[0023] Further, the system further includes: a communication module; the communication module is connected to the main control processor;

[0024] The communication module is used to transmit the system information to an external device.

[0025] Further, the system further includes: a monitoring module; the monitoring module is connected to the main control processor;

[0026] The monitoring module is used to monitor the system state of the system and transmit the monitored system state to the main control processor.

[0027] Further, the system further includes: a status indication module; the status indication module is connected to the main control processor;

[0028] The status indication module is used to display the system state according to the instruction of the main control processor.

[0029] Further, the system further includes: an alarm module; the alarm module is connected to the main control processor;

[0030] The alarm module is used to give an alarm when the system state is abnormal.

[0031] An embodiment of the present utility model provides an intelligent card testing system. The system includes: a main control processor, a first radio frequency induction module, a second radio frequency induction module, a timer, a counter, and a power supply module; the first radio frequency induction module is respectively connected to the power supply module and the timer; the second radio frequency induction module is respectively connected to the power supply module and the counter; the main control processor is respectively connected to the first radio frequency induction module, the second radio frequency induction module, the timer, the counter, and the power supply module; the power supply module is used to supply power to the main control processor, the first radio frequency induction module, the second radio frequency induction module, the timer, and the counter; the first radio frequency induction module is used to continuously read a test card, obtain a first lighting state of an LED lamp of the test card, and output a first electrical signal to the timer according to the first lighting state; the first lighting state includes the lighting duration of the LED lamp; the timer is used to cumulatively receive the first electrical signal to determine the cumulative test duration of the test card; the second radio frequency induction module is used to periodically read the test card according to a preset time interval, obtain a second lighting state of the LED lamp of the test card, and output a second electrical signal to the counter according to the second lighting state; the second lighting state includes whether the LED lamp emits light; the counter is used to cumulatively receive the second electrical signal to determine the cumulative test times of the test card. Through the above technical solution, the lighting state of the intelligent card is obtained by using the radio frequency induction module, and the test results are recorded by the timer and / or the counter, realizing the durability test of the product with LED optical signal feedback added to the intelligent card. BRIEF DESCRIPTION OF THE DRAWINGS

[0032] Figure 1 A schematic structural diagram of an intelligent card testing system provided by an embodiment of the present utility model;

[0033] Figure 2 A schematic structural diagram of another intelligent card testing system provided by an embodiment of the present utility model;

[0034] Figure 3 A schematic diagram of a control panel provided by an embodiment of the present utility model;

[0035] Figure 4 A schematic diagram of an execution process of an intelligent card testing system provided by an embodiment of the present utility model. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0036] The present utility model will be further described in detail below with reference to the drawings and embodiments. It can be understood that the specific embodiments described herein are only used to explain the present utility model, rather than limiting the present utility model. In addition, it should be noted that for the convenience of description, only parts related to the present utility model are shown in the drawings, rather than all the structures.

[0037] Figure 1 This is a schematic structural diagram of an intelligent card testing system 10 provided by an embodiment of the present utility model. Referring to Figure 1 , a main control processor 101, a first radio frequency induction module 102, a second radio frequency induction module 103, a timer 104, a counter 105, and a power supply module 106; the first radio frequency induction module 102 is respectively connected to the power supply module 106 and the timer 104; the second radio frequency induction module 103 is respectively connected to the power supply module 106 and the counter 105;

[0038] The main control processor 101 is respectively connected to the first radio frequency induction module 102, the second radio frequency induction module 103, the timer 104, the counter 105, and the power supply module 106;

[0039] The power supply module 106 is used to supply power to the main control processor 101, the first radio frequency induction module 102, the second radio frequency induction module 103, the timer 104, and the counter 105;

[0040] The first radio frequency induction module 102 is used to continuously read the test card, obtain the first light-emitting state of the LED lamp of the test card, and output a first electrical signal to the timer 104 according to the first light-emitting state; the first light-emitting state includes the light-emitting duration of the LED lamp;

[0041] The timer 104 is used to accumulate the received first electrical signal to determine the cumulative test duration of the test card;

[0042] The second radio frequency induction module 103 is used to periodically read the test card according to a preset time interval, obtain the second light-emitting state of the LED lamp of the test card, and output a second electrical signal to the counter 105 according to the second light-emitting state; the second light-emitting state includes whether the LED lamp emits light;

[0043] The counter 105 is used to accumulate the received second electrical signal to determine the cumulative test times of the test card.

[0044] In this embodiment, the main control processor 101 is respectively connected to the first radio frequency induction module 102, the second radio frequency induction module 103, the timer 104, the counter 105, and the power supply module 106. The main control processor 101 can be used to control the execution of each module in the system. Exemplarily, the main control processor 101 can be an ARM Cortex-M4 processor. The power supply module 106 can be a built-in battery or a charging power supply.

[0045] Specifically, the first radio frequency induction module 102 can be a module that continuously performs radio frequency tests on the test card. The first radio frequency induction module 102 can continuously read the test card without interruption to obtain the first light-emitting state of the LED on the test card. Among them, the test card can be a card with LED optical signal feedback added in the NFC product. Exemplarily, the test card can be an NFC smart card containing an LED. It should be noted that the smart card test system 10 provided by the present invention can also be applied to other NFC products embedded with LEDs. The first light-emitting state can be the light-emitting state of the LED obtained by the first radio frequency induction module 102 continuously reading the test card without interruption, and the first light-emitting state can include the light-emitting duration of the LED on the test card.

[0046] Continuing from the above description, after obtaining the first light-emitting state, a first electrical signal can be output to the accumulator 104 according to the first light-emitting state; the accumulator 104 can continuously accumulate time according to the obtained light-emitting duration of the LED to determine the cumulative test duration of the test card, so as to realize the test of the usage duration of the test card.

[0047] Specifically, the second radio frequency induction module 103 can be used to periodically read the test card according to a preset time interval. Among them, the preset time interval can be a preset test interval duration. Exemplarily, the preset time interval can be 0.5 seconds, so that a cycle can be 0.5 seconds, and the test card can be read every 0.5 seconds. That is, it can be understood that the first radio frequency induction module 102 can continuously and uninterruptedly test the test card, and immediately start a new round of tests after one test is completed. The second radio frequency induction module 103 will continue to perform a new round of tests after a certain period of time (such as 0.5 seconds or 1 second, etc.) after one test is completed.

[0048] Each time the test card is read, the LED can emit light once, and the second light-emitting state of the LED on the test card can be obtained. Among them, the second light-emitting state includes whether the LED emits light. After obtaining the second light-emitting state, a second electrical signal can be output according to the second light-emitting state and the second electrical signal can be transmitted to the counter 105. The counter 105 can continuously accumulate the number of times the LED emits light to determine the cumulative test times of the test card, so as to realize the test of the usage times of the test card.

[0049] It should be noted that the test methods for the test card may include: testing the usage duration, testing the number of uses, testing the statistical number of tests within a preset time period, or testing the statistical usage duration under the condition of a preset number of determinations. The specific test method can be determined according to the customer's test requirements. Exemplarily, the customer's test requirements may be that the LED signal lamp can continue to be used after continuous communication for 30,000 hours, the LED signal lamp can continue to be used after repeated communication for 900,000 times, whether 300,000 tests can be carried out within 10,000 hours, and / or the time required to observe 600,000 tests.

[0050] Exemplarily, when the customer's test requirement is that the LED signal lamp can continue to be used after continuous communication for 30,000 hours, the test duration displayed by the timer 104 can be observed without paying attention to the number of times displayed by the counter 105; when the customer's test requirement is that the LED signal lamp can continue to be used after repeated communication for 900,000 times, the number of tests displayed by the counter 105 can be observed without paying attention to the test duration displayed by the timer 104; when the customer's test requirement is whether 300,000 tests can be carried out within 10,000 hours, the timer 104 can be set so that after the timer 104 counts up to 10,000 hours, the timing is stopped, a reminder (such as a beep reminder, a voice reminder, etc.) is issued, and the test is stopped, and it is observed whether the number of tests displayed by the counter 105 has reached 300,000 times; when the customer's test requirement is the time required to observe 600,000 tests, the counter 105 can be set so that after the counter 105 counts up to 600,000 times, the counting is stopped, a reminder (such as a beep reminder, a voice reminder, etc.) is issued, and the test is stopped, and the test duration displayed by the timer 104 is observed.

[0051] In this embodiment, the range of the timer 104 is 999,999 hours. After exceeding the range, the timer 104 can automatically reset to zero; the range of the counter 105 is 999,999 times. After exceeding the range, the counter 105 can automatically reset to zero. It should be noted that after the timer 104 or the counter 105 exceeds its test range, it can be selected whether to continue the test according to the user's test requirements. Specifically, when the user's test requirements are less than the test range of the timer 104 or the counter 105, the test can be carried out normally. When the user's test requirements are greater than or equal to the test range of the timer 104 or the counter 105, after reaching the test range of the timer 104 or the counter 105, a test report can be generated and sent to the main control processor 101, or the tester can be prompted that the timer 104 or the counter 105 has reached the maximum test range. Among them, the tester can be reminded through a buzzer alarm, or a voice module can be added to the main control processor 101 to remind the tester through the voice module that the maximum test range has been reached. When reminding the tester that the maximum test range has been reached, the main control processor 101 can receive the instruction to continue the test provided by the tester and continue the test to complete the user's test requirements.

[0052] Exemplarily, the user's test requirement is to test 2 million times, which has exceeded the test range of the counter 105. When the test technology reaches 999,999 times, a test report is generated and sent to the main control processor 101, and through the voice module in the main control processor 101, "The maximum test times have been reached. Please confirm whether to continue the test" is issued, and the test continues when the instruction to continue the test provided by the tester is received.

[0053] This embodiment provides an intelligent card test system. The system uses a radio frequency induction module to obtain the light-emitting state of the intelligent card, and records the test results through a timer and / or a counter, realizing the durability test of products with LED optical signal feedback added to the intelligent card.

[0054] Based on the above embodiment, Figure 2 is a schematic structural diagram of another intelligent card test system 10 provided by the present invention. Refer to Figure 2 As shown, the first radio frequency induction module 102 includes a first NFC card reading module 1021 and a first optical signal detection module 1022; the first NFC card reading module 1021 is used to continuously read the test card and trigger the LED light of the test card; the first optical signal detection module 1022 is used to detect the first light-emitting state of the LED light, convert the first light-emitting state into a first electrical signal and output it to the timer 104.

[0055] The second radio frequency induction module 103 includes a second NFC card reading module 1031 and a second optical signal detection module 1032; the second NFC card reading module 1031 is used to periodically read the test card according to a preset time interval and trigger the LED light of the test card; the second optical signal detection module 1032 is used to detect the second light emitting state of the LED light and convert the second light emitting state into a second electrical signal and output it to the counter 105.

[0056] Specifically, the first radio frequency induction module 102 includes a first NFC card reading module 1021 and a first optical signal detection module 1022. Among them, the first NFC card reading module 1021 can be used to continuously read the test card and trigger the LED light of the test card, and the first optical signal detection module 1022 is used to detect the first light emitting state of the LED light and convert the light emitting duration of the first light emitting state into a first electrical signal and output it to the accumulator 104.

[0057] Exemplarily, the first NFC card reading module 1021 continuously reads the internal chip of the NFC embedded LED card body, causing the LED light to emit light. The first optical signal detection module 1022 detects the first light emitting state of the LED light, converts the light emitting duration of the first light emitting state into a first electrical signal, and simultaneously feeds it back to the accumulator 104 so that the accumulator 104 can perform timing.

[0058] Specifically, the second radio frequency induction module 103 includes a second NFC card reading module 1031 and a second optical signal detection module 1032; the second NFC card reading module 1031 is used to periodically read the test card according to a preset time interval and trigger the LED light of the test card; the second optical signal detection module 1032 is used to detect the second light emitting state of the LED light and convert the number of times the second light emitting state emits light into a second electrical signal and output it to the counter 105.

[0059] Exemplarily, the second NFC card reading module 1031 reads the internal chip of the NFC embedded LED card body every 0.5 seconds as a cycle, causing the LED light to flash. The second optical signal detection module 1032 detects the second light emitting state of the LED light, and simultaneously converts the number of times the second light emitting state emits light into a second electrical signal, and feeds the second electrical signal back to the counter 105 so that the counter 105 can perform counting.

[0060] Further, the smart card test system 10 further includes: a control panel 107; the control panel 107 is connected to the main control processor 101; the control panel includes a display module 1071;

[0061] The display module 1071 is used to display the cumulative test duration and / or the cumulative test times of the test card.

[0062] Specifically, the display module 1071 can be located on the control panel 107 for displaying the cumulative test duration and / or the cumulative number of tests of the test card.

[0063] Furthermore, the control panel 107 further includes a reset module 1072; the reset module 1072 is connected to the main control processor 101;

[0064] The reset module 1072 is used to reset the timer 104 and / or the counter 105.

[0065] In the present utility model, the reset module 1072 can be used to reset the timer and / or the counter.

[0066] Figure 3 This is a schematic diagram of a control panel provided for this embodiment. Refer to Figure 3 As shown, the control panel includes two display screens for displaying the cumulative time (seconds) and the cumulative number of times (times) respectively. The reset button 1 can reset the timer, and the reset button 2 can reset the counter.

[0067] It should be noted that if the user's test purpose is to see how many times the test has been performed, then it is to see if the counter reaches the desired number of times and stop the test, without paying attention to the time of the timer. If the test purpose is to see how long the test has been performed, then it is necessary to see if the timer reaches the preset test time, and at this time, the number of times of the counter does not need to be concerned. If the user's test purpose is to see how many times the test has been performed within the set time, then to implement this function, the accumulator and the timer need to be connected in parallel simultaneously to meet the user's test requirements.

[0068] Furthermore, the system further includes: a data storage module 108; the data storage module 108 is connected to the main control processor 101;

[0069] The data storage module 108 is used to store the system information of the test process of the test card.

[0070] It can be known that the present utility model may further include a data storage module 108, and the data storage module 108 can store the system information of the test card during the test process. Among them, the system information may include the test data of the test card during the test process.

[0071] Furthermore, the system further includes: a communication module 109; the communication module 109 is connected to the main control processor 101;

[0072] The communication module 109 is used to transmit the system information to an external device.

[0073] It can be known that the present utility model may further include a communication module 109. The main control processor 101 can control the communication module 109 to transmit the system information stored in the data storage module 108 to an external device. Exemplarily, the communication module 109 may be a communication method such as a tape-c interface and / or Bluetooth. Among them, the system information may include test data, test settings, and system exception information during the test of the test card. Further, the system further includes: a monitoring module 110; the monitoring module 110 is connected to the main control processor 101;

[0074] The monitoring module 110 is used to monitor the system state of the system and transmit the monitored system state to the main control processor 101.

[0075] Specifically, the monitoring module 110 can monitor the system state of the smart card test system 10 and transmit the monitored system state to the main control processor 101. Among them, the system state may include the system state of the smart card test system 10, such as: the device connection state, communication state, test process state, power state, etc. of various devices; the system state may also include the test state of the test card, such as: being tested, test ended, etc. Further, the system further includes: a status indication module 111; the status indication module 111 is connected to the main control processor 101;

[0076] The status indication module 111 is used to display the system state according to the instruction of the main control processor 101.

[0077] Specifically, after the main control processor 101 receives the monitoring status of the monitoring module 110, the status indication module 111 can display the system state according to the instruction of the main control processor 101. Exemplarily, the status indication module may be a status indicator light, and the status indicator light is displayed by a multi-color LED. If the status indicator light is green, it is considered that the system state is normal. If the status indicator light is red, it is considered that the system state is abnormal.

[0078] Further, the system further includes: an alarm module 112; the alarm module 112 is connected to the main control processor 101;

[0079] The alarm module 112 is used to give an alarm when the system state is abnormal.

[0080] Specifically, when the system state is abnormal, the alarm module 112 can give an alarm. Exemplarily, the alarm module 112 may be a buzzer.

[0081] Figure 4 It is a schematic diagram of the execution process of a smart card test system provided by the present utility model, as Figure 4As shown, the NFC smart card product embedded in the LED lamp can be continuously sensed by the first radio frequency sensing module to obtain a first electrical signal output, and the first electrical signal is output to the accumulator; alternatively, the NFC product embedded in the LED lamp can be periodically sensed by the second radio frequency sensing module according to a sensing period of 0.5 seconds to obtain a second electrical signal output, and the second electrical signal is output to the counter;

[0082] Note that the above is only a preferred embodiment of the present invention and the technical principles applied. Those skilled in the art will understand that the present invention is not limited to the specific embodiments described herein, and various obvious changes, re-adjustments, and substitutions can be made by those skilled in the art without departing from the protection scope of the present invention. Therefore, although the present invention has been described in more detail through the above embodiments, the present invention is not limited to the above embodiments only. Without departing from the concept of the present invention, more other equivalent embodiments can be included, and the scope of the present invention is determined by the scope of the appended claims.

Claims

1. An intelligent card testing system, characterized in that, Comprising: A main control processor, a first radio frequency induction module, a second radio frequency induction module, a timer, a counter, and a power supply module; The first radio frequency induction module is respectively connected to the power supply module and the timer; the second radio frequency induction module is respectively connected to the power supply module and the counter; The main control processor is respectively connected to the first radio frequency induction module, the second radio frequency induction module, the timer, the counter, and the power supply module; The power supply module is used to supply power to the main control processor, the first radio frequency induction module, the second radio frequency induction module, the timer, and the counter; The first radio frequency induction module is used to continuously read the test card, obtain the first lighting state of the LED lamp of the test card, and output a first electrical signal to the timer according to the first lighting state; the first lighting state includes the lighting duration of the LED lamp; The timer is used to accumulate the received first electrical signals to determine the cumulative test duration of the test card; The second radio frequency induction module is used to periodically read the test card according to a preset time interval, obtain the second lighting state of the LED lamp of the test card, and output a second electrical signal to the counter according to the second lighting state; The second lighting state includes whether the LED lamp is lit; The counter is used to accumulate the received second electrical signals to determine the cumulative test times of the test card.

2. The system according to claim 1, wherein The first radio frequency induction module includes a first NFC card reading module and a first optical signal detection module; The first NFC card reading module is used to continuously read the test card and trigger the LED lamp of the test card; The first optical signal detection module is used to detect the first lighting state of the LED lamp, and convert the first lighting state into a first electrical signal and output it to the timer.

3. The system according to claim 1, wherein The second radio frequency induction module includes a second NFC card reading module and a second optical signal detection module; The second NFC card reading module is used to periodically read the test card according to a preset time interval and trigger the LED lamp of the test card; The second optical signal detection module is used to detect the second lighting state of the LED lamp, and convert the second lighting state into a second electrical signal and output it to the counter.

4. The system according to claim 1, wherein The system further includes: a control panel; the control panel is connected to the main control processor; the control panel includes a display module; The display module is used to display the cumulative test duration and / or the cumulative test times of the test card.

5. The system according to claim 4, characterized in that, The control panel further includes a reset module; the reset module is connected to the main control processor; The reset module is used to reset the timer and / or the counter.

6. The system according to claim 1, wherein The system further includes: a data storage module; the data storage module is connected to the main control processor; The data storage module is used to store the system information of the test process of the test card.

7. The system according to claim 6, characterized in that, The system further includes: a communication module; the communication module is connected to the main control processor; The communication module is used to transmit the system information to an external device.

8. The system according to claim 1, wherein The system further includes: a monitoring module; the monitoring module is connected to the main control processor; The monitoring module is used to monitor the system status of the system and transmit the monitored system status to the main control processor.

9. The system according to claim 8, wherein The system further includes: a status indication module; the status indication module is connected to the main control processor; The status indication module is used to display the system status according to the instruction of the main control processor.

10. The system according to claim 9, wherein The system further includes: an alarm module; the alarm module is connected to the main control processor; The alarm module is used to give an alarm when the system status is abnormal.