Inductance test fixture

By designing an inductance test fixture, using the base, test bench and power source to drive the probe to contact the inductor, the test error problem caused by probe instability is solved, and accurate batch testing of the inductor is achieved.

CN223139775UActive Publication Date: 2025-07-22SICHUAN HUASON ELECTRONICS TECH
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Patent Information

Application Number
CN202421803548.5
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-07-29
Publication Date
2025-07-22
Estimated Expiration
2034-07-29

AI Technical Summary

Technical Problem

In the prior art, the probe is unstable during inductance testing, resulting in inaccurate test results and difficult to achieve batch testing of inductors.

Method used

An inductance testing fixture was designed, including a base, a test bench, a lifting rack and a power source. The probe and the test bench are arranged correspondingly. The lifting rack is driven by the power source to make the probe come into contact with the inductor to achieve stable testing.

Benefits of technology

The probe is more stable during testing, avoiding errors caused by operator jitter, and the test results are more accurate, supporting batch and continuous testing of inductors.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model provides an inductance test fixture. The utility model aims to solve the technical problems that the probe is unstable and the test result is not accurate enough when the inductance of the printed circuit board is tested in the prior art. According to the technical scheme, the inductance testing jig comprises a base, a testing table installed on the top of the base, a lifting frame located above the base and a power source driving the lifting frame to move up and down. Wherein the size of the test board is matched with the size of a printed circuit board to be tested; the lifting frame is provided with a probe, and the probe corresponds to the test bench up and down; the power source is installed on the support, and the support is fixedly connected with the base. According to the utility model, the probe has better stability, and the test result is more accurate; and batch testing of inductors can be realized.
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Description

Technical Field

[0001] The utility model relates to the technical field of inductance testing equipment, and particularly relates to an inductance testing fixture. Background Art

[0002] A printed circuit board is a carrier for electronic components and enables electrical connection of electronic components; the main advantages of using a printed circuit board are that it can greatly reduce wiring and assembly errors and play an important role in mass production of fixed circuits and optimizing the layout of electrical appliances. After the printed circuit board is manufactured, electrical performance and connectivity tests need to be carried out to ensure its quality and reliability.

[0003] Among them, an inductor is an important electronic component of a printed circuit board; when testing an inductor in the prior art, generally, an operator holds the probe of a multimeter or an LCR meter and makes the probe contact both ends of the inductor for testing. This testing method not only has low efficiency but also poor stability, and the test results are prone to errors; currently, the performance requirements of printed circuit boards are getting higher and higher, and the previous testing methods have gradually become difficult to meet the quality requirements of printed circuit boards. Summary of the Invention

[0004] The purpose of the utility model is to provide an inductance testing fixture, which has better stability, more accurate test results, and is conducive to realizing batch testing of inductors.

[0005] To achieve the above purpose, the technical solution adopted by the utility model is:

[0006] An inductance testing fixture includes: a base, a test bench installed on the top of the base, a lifting frame located above the base, and a power source for driving the lifting frame to move up and down; wherein, the size of the test bench is adapted to the size of the printed circuit board to be tested; the lifting frame is installed with probes, and the probes correspond to the test bench up and down; the power source is installed on a bracket, and the bracket is fixedly connected to the base.

[0007] Optionally, the power source is set as a cylinder.

[0008] Optionally, the bracket includes: a cross frame for installing the power source and a vertical frame for supporting the cross frame; the bottom of the vertical frame is fixedly connected to the base.

[0009] Optionally, it further includes: a guide rod extending in the up and down direction; the upper end of the guide rod is connected to the cross frame and the lower end is connected to the placement table; the lifting frame is provided with a guide hole adapted to the guide rod.

[0010] Optionally, the base is provided with positioning holes; the test bench is provided with counterbores corresponding to the positioning holes and adapted to bolts.

[0011] Optionally, a load plate is provided below the lifting frame, and the probe is installed on the load plate; the lifting frame is provided with an internally threaded cylinder extending downward, and the load plate is provided with a first through hole corresponding to the internally threaded cylinder and is adapted to a bolt.

[0012] Optionally, the probe is fixedly connected to the sleeve; the sleeve is provided with an external thread and is adapted to a nut; the load plate is provided with a second through hole for installing the sleeve.

[0013] Optionally, the test bench is adapted with a positioning mechanism; the positioning mechanism includes: four positioning units distributed in the front, rear, left, and right of the test bench; the positioning unit includes: a reference member installed on the base, a pushing member located between the reference member and the test bench, and a spring connecting the reference member and the pushing member.

[0014] Optionally, the base is provided with multiple first strip-shaped holes extending in the front-rear direction for installing the reference members on the front and rear sides of the test bench; the base is provided with multiple second strip-shaped holes extending in the left-right direction for installing the reference members on the left and right sides of the test bench.

[0015] Optionally, there are multiple test benches, and multiple groups of probes are correspondingly provided.

[0016] The working principle of the present utility model is as follows: Place the printed circuit board to be tested on the test bench and align the edge of the printed circuit board with the edge of the test bench to complete the positioning of the printed circuit board. Then, make the power source drive the lifting frame to move downward with the probe, so that the probe can contact the corresponding end of the inductor of the printed circuit board, thereby testing the inductor. The number of probes can be set to twice the number of inductors; in this way, multiple inductors of the printed circuit board can be tested simultaneously.

[0017] It can be seen from this that the beneficial effects of the present utility model are: When testing the inductor, the probe is more stable, avoiding errors caused by the shaking of the operator, and can make the test results more accurate; and it is beneficial to realize batch testing and continuous testing of inductors. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following will briefly introduce the drawings required for the description of the embodiments. Obviously, the following drawings are only some embodiments of the present application. For those of ordinary skill in the art, without creative efforts, other drawings can be obtained according to these drawings.

[0019] Figure 1 is a structural schematic diagram of the present utility model;

[0020] Figure 2 is an assembly schematic diagram of the base and the test bench;

[0021] Figure 3 It is a schematic assembly diagram of the probe and the carrier plate;

[0022] Figure 4 It is a schematic assembly diagram of the positioning unit.

[0023] Reference numerals: 1, base; 2, test bench; 3, lifting frame; 4, power source; 5, probe; 6, bracket; 7, guide rod; 8, positioning hole; 9, counterbore; 10, carrier plate; 11, internal thread cylinder; 12, sleeve; 13, reference part; 14, pushing part; 15, spring; 16, first elongated hole; 17, second elongated hole. Detailed implementation manners

[0024] In the following text, only some exemplary embodiments are simply described. As those skilled in the art can recognize, the described embodiments can be modified in various different ways without departing from the spirit or scope of the present invention. Therefore, the drawings and the description are considered to be exemplary in nature rather than restrictive.

[0025] In the description of the present invention, it should be understood that the orientation or positional relationship indicated by terms such as "front", "rear", "left", "right", etc. is based on the orientation or positional relationship shown in the drawings, and is only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus cannot be understood as a limitation to the present invention.

[0026] In addition, the terms "first" and "second" are only used for descriptive purposes, and cannot be understood as indicating or implying relative importance or implicitly indicating the quantity of the indicated technical features. Thus, the features defined with "first" and "second" may explicitly or implicitly include one or more of such features. In the description of the present invention, "a plurality" means two or more, unless otherwise specifically defined.

[0027] In the present invention, unless otherwise clearly specified and limited, terms such as "installation", "connection", "connection", "fixation", etc. should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or integrated; it can be directly connected, or indirectly connected through an intermediate medium, and can be the communication inside two elements or the interaction relationship between two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the present invention can be understood according to specific situations.

[0028] The following disclosure provides many different embodiments or examples for implementing different structures of the present utility model. To simplify the disclosure of the present utility model, components and settings of specific examples are described below. Of course, they are only examples and are not intended to limit the present utility model.

[0029] The embodiments of the present utility model will be described in detail below with reference to the Figure 1 ~ Figure 4 accompanying drawings.

[0030] An embodiment of the present utility model provides an inductance test fixture. The inductance test fixture includes: a base 1, a test bench 2 installed on the top of the base 1, a lifting frame 3 located above the base 1, and a power source 4 for driving the lifting frame 3 to move up and down. Among them, the size of the test bench 2 is adapted to the size of the printed circuit board to be tested; the lifting frame 3 is equipped with a probe 5, and the probe 5 corresponds to the test bench 2 up and down. It should be understood that the probe 5 can be a probe of a multimeter or a probe of an LCR meter; the main purpose of the present utility model is to keep the probe 5 stable when testing the inductance, and the specific test method and principle of the inductance have not changed, and reference can be made to the prior art, which will not be elaborated here. The power source 4 is installed on a bracket 6, and the bracket 6 is fixedly connected to the base 1.

[0031] The specific implementation manner of the present utility model is described below: Place the printed circuit board to be tested on the test bench 2, align the edge of the printed circuit board with the edge of the test bench 2, and the positioning of the printed circuit board can be completed. Then, make the power source 4 drive the lifting frame 3 to move downward with the probe 5, so that the probe 5 can contact the corresponding end of the inductance of the printed circuit board, thereby testing the inductance. The number of probes 5 can be set to twice the number of inductances; in this way, multiple inductances of the printed circuit board can be tested simultaneously. When the present utility model tests the inductance, the probe 5 is more stable, avoiding errors caused by the shaking of the operator, and the test result can be more accurate; and it is beneficial to realize batch testing and continuous testing of inductances.

[0032] Further, the power source 4 is set as a cylinder. It should be understood that setting the power source 4 as a cylinder is a preference based on cost; according to the actual situation requirements, the power source 4 can also be set as an electric push rod or other driving devices.

[0033] Further, the bracket 6 includes: a cross frame for installing the power source 4 and a vertical frame for supporting the cross frame; the bottom of the vertical frame is fixedly connected to the base 1. It should be understood that the vertical frame and the base 1 can be connected by means of bolts, bonding, welding, etc.

[0034] Further, it further includes a guide rod 7 extending in the up and down direction; the upper end of the guide rod 7 is connected to the cross frame, and the lower end is connected to the placement table; the lifting frame 3 is provided with a guide hole adapted to the guide rod 7. It should be understood that through the cooperation of the guide rod 7 and the guide hole, the lifting frame 3 can be prevented from tilting during the up and down process.

[0035] Further, the base 1 is provided with a positioning hole 8; the test bench 2 is provided with a counterbore 9 corresponding to the positioning hole 8 and is adapted to a bolt. It should be understood that by replacing the test bench 2 with different sizes, it can be applicable to testing the inductance of printed circuit boards with different sizes, which is beneficial to increasing the applicable range of the present utility model.

[0036] Further, a load plate 10 is provided below the lifting frame 3, and the probe 5 is installed on the load plate 10; the lifting frame 3 is provided with an internally threaded cylinder 11 extending downward, and the load plate 10 is provided with a first through hole corresponding to the internally threaded cylinder 11 and is adapted to a bolt. It should be understood that by aligning the first through hole with the internally threaded cylinder 11 and screwing on the bolt, the load plate 10 can be installed below the lifting frame 3. There is a gap between the load plate 10 and the lifting frame 3 for the circuit connecting the probe 5 to pass through.

[0037] Further, the probe 5 is fixedly connected to a sleeve 12; the sleeve 12 is provided with an external thread and is adapted to a nut; the load plate 10 is provided with a second through hole for installing the sleeve 12. It should be understood that the probe 5 is generally fixed in the sleeve 12 by bonding; by passing the sleeve 12 through the second through hole and tightening the nuts at both ends of the sleeve 12, the sleeve 12 and the probe 5 can be fixed in the second through hole. When it is necessary to test the inductance of a new type of printed circuit board, if the position of the inductance changes, only a new second through hole needs to be processed at the corresponding position of the load plate 10 to adjust the installation position of the sleeve 12 and the probe 5; in addition, if necessary, a new load plate 10 can also be replaced.

[0038] Further, the test bench 2 is adapted with a positioning mechanism; the positioning mechanism includes: four positioning units distributed in the front, rear, left, and right of the test bench 2; the positioning unit includes: a reference member 13 installed on the base 1, a pushing member 14 located between the reference member 13 and the test bench 2, and a spring 15 connecting the reference member 13 and the pushing member 14. It should be understood that after placing the printed circuit board on the test bench 2, the pushing member 14 will automatically push the printed circuit board to align the edge of the printed circuit board with the edge of the test bench 2.

[0039] Further, the base 1 is provided with a plurality of first strip-shaped holes 16 extending in the front-rear direction for installing the reference members 13 on the front and rear sides of the test bench 2; the base 1 is provided with a plurality of second strip-shaped holes 17 extending in the left-right direction for installing the reference members 13 on the left and right sides of the test bench 2. It should be understood that the reference member 13 is provided with mounting holes and is adapted to bolts; the reference members 13 on the front and rear sides of the test bench 2 can adjust their positions in the front-rear direction along the first strip-shaped holes 16 and then be locked by the bolts provided in the mounting holes; the reference members 13 on the left and right sides of the test bench 2 can adjust their positions in the left-right direction along the second strip-shaped holes 17 and then be locked by the bolts provided in the mounting holes. In this way, when replacing the test bench 2 of different sizes to test the capacitance of printed circuit boards of different sizes, the positioning mechanism can better adapt to position printed circuit boards of different sizes.

[0040] Further, there are a plurality of the test benches 2, and correspondingly, a plurality of groups of the probes 5 are provided. It should be understood that a plurality of groups of the positioning mechanisms are also correspondingly provided. The number of each group of the probes 5 can usually be set to twice the number of the capacitances of the printed circuit board. In this way, the capacitances of multiple printed circuit boards can be tested simultaneously.

[0041] Although the specific embodiments of the present invention have been described above, those skilled in the art should understand that various changes or modifications can be made to these embodiments without departing from the principle and essence of the present invention, and these changes and modifications all fall within the protection scope of the present invention.

Claims

1. An inductance test fixture, characterized in that, Comprising: A base (1); And A test bench (2) installed on the top of the base (1); And A lifting frame (3) located above the base (1); and A power source (4) for driving the lifting frame (3) to move up and down; Wherein, The size of the test bench (2) is adapted to the size of the printed circuit board to be tested; The lifting frame (3) is installed with probes (5), and the probes (5) correspond to the test bench (2) up and down; The power source (4) is installed on a bracket (6), and the bracket (6) is fixedly connected to the base (1).

2. The inductance test fixture according to claim 1, wherein: The power source (4) is configured as a cylinder.

3. The inductance test fixture according to claim 1, wherein: The bracket (6) includes: a cross frame for installing the power source (4), and a vertical frame for supporting the cross frame; The bottom of the vertical frame is fixedly connected to the base (1).

4. The inductance test fixture according to claim 3, wherein: It further includes: a guide rod (7) extending in the up and down direction; The upper end of the guide rod (7) is connected to the cross frame, and the lower end is connected to the placement table; The lifting frame (3) is provided with a guide hole adapted to the guide rod (7).

5. The inductance test fixture according to claim 1, wherein: The base (1) is provided with a positioning hole (8); the test bench (2) is provided with a counterbore (9) corresponding to the positioning hole (8), and is adapted to a bolt.

6. The inductance test fixture according to any one of claims 1 to 5, wherein: A carrier plate (10) is provided below the lifting frame (3), and the probes (5) are installed on the carrier plate (10); The lifting frame (3) is provided with an internally threaded cylinder (11) extending downward, and the carrier plate (10) is provided with a first through hole corresponding to the internally threaded cylinder (11), and is adapted to a bolt.

7. The inductance test fixture according to claim 6, wherein: The probe (5) is fixedly connected to a sleeve (12); the sleeve (12) is provided with an external thread and is adapted to a nut; the carrier plate (10) is provided with a second through hole for installing the sleeve (12).

8. The inductance test fixture according to any one of claims 1 to 5, wherein: The test bench (2) is adapted with a positioning mechanism; The positioning mechanism includes: four positioning units distributed in the front, rear, left, and right of the test bench (2); The positioning unit includes: a reference member (13) installed on the base (1), a pushing member (14) located between the reference member (13) and the test bench (2), and a spring (15) connecting the reference member (13) and the pushing member (14).

9. The inductance test fixture according to claim 8, wherein: The base (1) is provided with a plurality of first elongated holes (16) extending in the front-rear direction for installing the reference members (13) on the front and rear sides of the test bench (2); The base (1) is provided with a plurality of second elongated holes (17) extending in the left-right direction for installing the reference members (13) on the left and right sides of the test bench (2).

10. The inductance test fixture according to any one of claims 1 to 5, wherein: A plurality of the test benches (2) are provided, and a plurality of groups of the probes (5) are correspondingly provided.