Relay
By setting up a dust-absorbing slot in the relay to accommodate arc splashing substances, the problem of unqualified media voltage withstand in the end of the electrical life is solved, and the media voltage withstand strength is maintained without increasing the size and creepage distance. It is suitable for household appliances, remote control and automated control circuits.
Patent Information
- Application Number
- CN202422312661.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-09-23
- Publication Date
- 2025-07-22
- Estimated Expiration
- 2034-09-23
AI Technical Summary
At the end of the electrical life of existing relays, the accumulation of conductive substances caused by arc splashing, resulting in unqualified media voltage resistance, making it difficult to improve creepage distance and insulation performance under size limitations.
A dust accumulation slot is set up in the relay to accommodate the conductive substances splashed by the arc, maintain the clean surface, avoid dust from being connected together, enhance insulation strength, and do not increase creepage distance and contact gaps.
Without increasing the size and creepage distance, maintain the dielectric pressure resistance strength of the relay at the end of the electrical life to avoid dielectric pressure breakdown, and achieve product miniaturization and compatibility upgrade.
Smart Images

Figure CN223140680U_ABST
Abstract
Description
Technical Field
[0001] The utility model belongs to the technical field of electrical switches, and particularly relates to a relay. Background Art
[0002] Relays are widely used in the control circuits of household appliances, remote control, communication, and automation; they are automatic switches that control the large current in the output circuit by the small current in the control circuit. Due to their switching properties, certain requirements are imposed on their electrical safety and insulation performance. Before the relay is used or before the electrical life test, its dielectric withstand voltage needs to meet certain requirements. After the electrical life test is completed, its dielectric withstand voltage also needs to meet the requirements.
[0003] To improve the dielectric withstand voltage of the product, relays generally increase the creepage distance between conductive components or add an insulating layer on the conductive components. When the air gap between the conductive components is fixed, the increase in creepage distance can be achieved by grooving and ribbing between the two conductors; however, after the size is limited, the withstand voltage value of the relay is basically limited and it is difficult to improve. At the end of the electrical life, due to the arc splash after the relay is switched off multiple times, conductive substances appear between the two conductors, and the dielectric withstand voltage of the product is extremely likely to be unqualified at this time. Summary of the Utility Model
[0004] The utility model provides a relay. By setting dust-accumulating slots to maintain multiple clean surfaces, on the basis of not increasing the size of the relay, the dielectric withstand voltage of the relay can still maintain a certain strength at the end of the electrical life.
[0005] To achieve the above object, the technical solution of the utility model is as follows:
[0006] A relay includes a base, a static reed assembly, and a moving reed assembly corresponding to the static reed assembly. The static reed assembly includes a static reed fixed on the base, and a static contact is arranged on the static reed; the moving reed assembly includes a moving contact arranged on the moving reed, and the static contact and the moving contact are arranged corresponding to each other; multiple dust-accumulating slots are arranged beside the static contact.
[0007] The dust-accumulating slots are opened on the base or on the creepage path between the static contact and the moving contact.
[0008] Further, the base is provided with multiple groups of static reed assemblies, and the dust-accumulating slots are opened on the creepage path between the static contacts.
[0009] The arrangement of the dust-accumulating slots is as follows: the dust-accumulating slots completely surround or semi-surround each static contact, and multiple dust-accumulating slots are arranged in one direction.
[0010] Further, multiple dust-accumulating slots arranged in the same direction are parallel to each other.
[0011] Further, the dust-accumulating slot is formed on the bottom surface and / or the side wall of the base;
[0012] The position where the dust-accumulating slot is formed is as follows:
[0013] Between the static contact and the corresponding moving contact;
[0014] And / or, on the planar area between the static contacts.
[0015] The said planar area is the area corresponding to the creepage path between the static contacts.
[0016] Further, the dust-accumulating slot is formed on the creepage path between the static contacts and on the retaining wall of the isolation slot between the static contacts.
[0017] The width of the dust-accumulating slot is less than 1 mm, and at least two parallel dust-accumulating slots are arranged in the same direction.
[0018] The relay further includes a magnetic circuit part fixed on the base. The magnetic circuit part includes an iron core, a yoke and an armature; wherein, the iron core is fixedly connected with the yoke, and the moving reed is fixed on the armature; the armature is connected with the yoke through an elastic member, and the armature is attracted to or separated from the iron core to achieve a clapper-type action, driving the moving contact to contact or disconnect from the static contact.
[0019] Compared with the prior art, the utility model has the following beneficial technical effects:
[0020] For the relay provided by the utility model, by forming a dust-accumulating slot beside the contact, the dust-accumulating slot can accommodate the conductive substances splashed by the contact arc; moreover, the side wall of the dust-accumulating slot can keep a cleaner surface compared with the bottom of the slot, and the dust splashed during the contact breaking process accumulates at the bottom of the dust-accumulating slot, realizing the electrical isolation between the moving and static contacts and between the moving and static contact groups. In this way, the relay can still maintain good dielectric withstand voltage and there will be no breakdown gap in the withstand voltage.
[0021] For the relay provided by the utility model, the slot width of the dust-accumulating slot is <1 mm. Under the same size condition, more slots can be formed, which is beneficial to forming more clean surfaces and also beneficial to the miniaturization of the product.
[0022] For the relay provided by the utility model, the dust-accumulating slot can adopt a semi-surrounding structure to surround the contact therein, which can effectively prevent the conductive substances splashed due to the arc generated during the contact breaking from spreading flat on the plane between the contacts, avoiding poor dielectric withstand voltage of the relay at the end of the electrical life.
[0023] The relay provided by the present utility model realizes that, without increasing the creepage distance and contact gap between the contacts and without adding an insulating layer between the contacts, the dielectric withstand voltage of the relay can still maintain a certain strength at the end of the electrical life; moreover, the present utility model has a good compatibility with the previous product line, and product upgrading can be achieved without changing the original assembly process. BRIEF DESCRIPTION OF THE DRAWINGS
[0024] Figure 1 FIG. is a partial structural schematic diagram of the base of the relay of the present utility model;
[0025] Figure 2 FIG. is a schematic diagram of the layout of the dust accumulation slots of the relay of the present utility model;
[0026] Figure 3 is Figure 2 another perspective schematic diagram of;
[0027] Figure 4 FIG. is a schematic diagram of the dust accumulation slot located between the static contact and the moving contact;
[0028] Figure 5 FIG. is a schematic diagram of the dust accumulation slot located on the retaining wall of the isolation slot.
[0029] Wherein: 1. Base; 11. Retaining wall; 12. Isolation slot; 21. First dust accumulation slot; 22. Second dust accumulation slot; 23. Third dust accumulation slot; 24. Fourth dust accumulation slot; 25. Fifth dust accumulation slot; 3. Static contact; 31. Moving reed; 32. Static reed; 36. Second static contact; 37. Arc; 38. Second moving contact; 39. Side wall of the first dust accumulation slot; 40. Bottom of the first dust accumulation slot; 41. Side wall of the second dust accumulation slot; 42. Bottom of the second dust accumulation slot; 43. Side wall of the third dust accumulation slot. DETAILED DESCRIPTION OF THE EMBODIMENTS
[0030] The following embodiments given in conjunction with the drawings further describe the present utility model in detail.
[0031] In the existing relay, the static contact is riveted on the static reed, and then the static reed is inserted into the base. A retaining wall and an isolation slot are provided between the two contact groups of the base. The purpose of the retaining wall and the isolation slot is to increase the creepage distance and electrical clearance between the contact groups of the relay, so that the dielectric withstand voltage between the contact groups can maintain a certain strength. However, in the later stage of the electrical life, more and more dust will accumulate between the contact groups. Due to the limitation of the product pin positions, a wide slot wider than 1.5 mm cannot be opened between the two contact groups to increase the creepage distance, and finally it will lead to the situation that the dielectric withstand voltage of the product is broken down due to the splashed dust between the contacts.
[0032] If the slot width is less than 1.5 mm, the depth of the slot is not included in the calculation structure of the creepage distance. Then the withstand voltage value of the size-limited latching relay is basically limited and it is difficult to increase. That is to say, when the relay does not allow a slot with a width of 1.5 mm to be opened inside, the creepage distance cannot be increased.
[0033] See Figures 1 - 5 , a latching relay provided by the present utility model includes a base 1, a static reed assembly, and a moving reed assembly corresponding to the static reed assembly. The static reed assembly includes a static reed piece 32 fixed on the base, and a static contact 3 is arranged on the static reed piece; the moving reed assembly includes a moving contact arranged on the moving reed piece, and the static contact 3 and the moving contact are arranged corresponding to each other; a plurality of dust-accumulating slots are arranged beside the static contact;
[0034] The dust-accumulating slot is opened on the base or on the creepage path between the static contact and the moving contact.
[0035] Further, when the base is provided with multiple groups of static reed assemblies, the dust-accumulating slot is also opened on the creepage path between the static contacts.
[0036] Specifically, if there is only one group of corresponding static reed assemblies and moving reed assemblies in the relay, the dust-accumulating slot is opened on the base, corresponding to the position between the static contact and the moving contact.
[0037] If there are multiple groups of corresponding static reed assemblies and moving reed assemblies in the relay, in addition to being arranged between the static contact and the moving contact, the dust-accumulating slot can also be arranged on the creepage path between the static contacts.
[0038] When the relay is turned off, the dust-accumulating slot effectively accommodates the conductive substances splashed by the contact arc. Moreover, the dust splashed during the contact breaking process accumulates at the bottom of the dust-accumulating slot, and the side wall of the dust-accumulating slot can maintain a relatively clean surface, effectively preventing the occurrence of dielectric withstand voltage breakdown at the end of the electrical life of the relay. Therefore, the product can still maintain good dielectric withstand voltage in the later stage of the electrical life.
[0039] The width of the dust-accumulating slot is less than 1 mm, at least two dust-accumulating slots are arranged in the same direction, the slot depth is not limited, and the shape is not limited; the dust-accumulating slot does not increase the creepage distance and electrical clearance between the relay contacts.
[0040] Arranging a dust-accumulating slot between two groups of contact groups can increase the insulation strength of the contact groups.
[0041] Further, the arrangement of the dust-accumulating slot is as follows: the dust-accumulating slot completely surrounds or semi-surrounds each static contact, and multiple dust-accumulating slots are arranged in one direction. In this way, the dust-accumulating slot surrounds the contact therein, which can effectively prevent the conductive substances splashed due to the generation of arc during contact breaking from spreading flat on the plane between the contacts, and avoid poor dielectric withstand voltage of the relay at the end of the electrical life.
[0042] Furthermore, multiple dust accumulation slots arranged in the same direction are parallel to each other.
[0043] In this way, the dust accumulation slots divide the base setting area into several small areas, and slots are also opened between the contact groups to divide the area between the contact groups into several small areas.
[0044] The following is a specific description of the dust accumulation slots.
[0045] In view of the fact that there are planar areas between the contact groups and also between the moving contacts and the static contacts; and these planar areas will become the dust accumulation areas for the dust splashed during the contact breaking process, and the dust in these areas is likely to connect into one piece, causing the product to have a breakdown in withstand voltage;
[0046] Therefore, the present utility model proposes to open the dust accumulation slots in the planar areas between the static contacts (contact groups) and between the moving contacts and the static contacts to prevent the dust from connecting into one piece.
[0047] See Figure 2 、 Figure 3 、 Figure 4 The dust accumulation slots are opened on the bottom surface and / or side wall of the base, which can not only accommodate the dust but also prevent the dust from connecting into one piece, and keep the side walls of the dust accumulation slots clean in these areas;
[0048] The positions where the dust accumulation slots are opened are as follows:
[0049] Between the static contact and the corresponding moving contact; as shown by the fourth dust accumulation slot 24 in terms of the opened dust accumulation slots;
[0050] And / or, on the planar area between the static contacts, specifically, the planar area corresponds to the creepage path between the static contacts; as shown by the third dust accumulation slot 23 and the fifth dust accumulation slot 25 in terms of the opened dust accumulation slots.
[0051] Furthermore, dust accumulation slots are opened on the planar area of the retaining wall between the static contacts (contact groups) to accommodate the dust, keep the side walls of the dust accumulation slots clean, and also increase the creepage distance;
[0052] See Figure 1 、 Figure 2 、 Figure 3 The dust accumulation slots are opened on the creepage path between the static contacts and are located on the retaining wall between the static contacts; as shown by the first dust accumulation slot 21 and the second dust accumulation slot 22 in terms of the opened dust accumulation slots.
[0053] See Figure 4 、 Figure 5, the dust-accumulating slots divide the dust-accumulating area into several small areas, and the dust splashed during the contact breaking process accumulates at the bottom of the dust-accumulating slots such as the bottom 40 of the first dust-accumulating slot and the bottom 42 of the second dust-accumulating slot; while the side walls of the dust-accumulating slots are clean surfaces. For example, when the relay breaks, the side walls 39 of the first dust-accumulating slot, the side walls 41 of the second dust-accumulating slot, and the side walls 43 of the third dust-accumulating slot can maintain relatively clean surfaces. Due to the existence of these clean surfaces, a good dielectric withstand voltage can still be maintained in the later stage of the electrical life.
[0054] Specifically, refer to Figure 4 , during the breaking process of the second static contact 36 and the second moving contact 38, an arc 37 is generated and advances along the arrow direction. The dust generated by the arc will accumulate at the bottom 40 of the first dust-accumulating slot, and the side wall 39 of the first dust-accumulating slot is the clean surface of the slot.
[0055] Furthermore, the relay of the present invention further includes a magnetic circuit part fixed on the base. The magnetic circuit part includes an iron core, a yoke, and an armature; wherein, the iron core is fixedly connected to the yoke, and the moving reed is fixed on the armature; the armature is connected to the yoke through an elastic member, and the armature is attracted or separated from the iron core to achieve a clapping action, driving the moving contact to contact or disconnect from the static contact.
[0056] For the relay of the present invention, the design of the dust-accumulating slot structure is novel. When the internal space of the relay is limited and the contact gap and the creepage distance of the contact are not increased, the dielectric withstand voltage of the product will not have a large attenuation at the end of the electrical life, effectively preventing the occurrence of dielectric withstand voltage breakdown at the end of the electrical life of the relay, and still meeting the requirements of the product performance.
[0057] The above are only the preferred embodiments of the present invention. It should be noted that for those of ordinary skill in the art, without departing from the creative concept of the present invention, several modifications and improvements can still be made, and these all belong to the protection scope of the present invention.
Claims
1. A relay, comprising a base, a static reed assembly, and a moving reed assembly corresponding to the static reed assembly, characterized in that, The static reed assembly includes a static reed fixed on a base, and a static contact is arranged on the static reed; the moving reed assembly includes a moving contact arranged on a moving reed, and the static contact and the moving contact are arranged corresponding to each other; multiple dust-accumulating narrow grooves are arranged beside the static contact; The dust-accumulating narrow grooves are formed on the base or on the creepage path between the static contact and the moving contact.
2. The relay according to claim 1, characterized in that, The base is provided with multiple groups of static reed assemblies, and the dust-accumulating narrow grooves are formed on the creepage path between the static contacts.
3. The relay according to claim 1 or 2, characterized in that, The arrangement of the dust-accumulating narrow grooves is as follows: the dust-accumulating narrow grooves completely surround or semi-surround each static contact, and multiple dust-accumulating narrow grooves are arranged in one direction.
4. The relay according to claim 3, characterized in that, The multiple dust-accumulating narrow grooves arranged in the same direction are parallel to each other.
5. The relay according to claim 3, wherein The dust-accumulating narrow grooves are formed on the bottom surface and / or the side wall of the base; The position where the dust-accumulating narrow grooves are formed is: Located between the static contact and the corresponding moving contact; And / or, located on the planar area between the static contacts.
6. The relay according to claim 5, characterized in that The planar area is the area corresponding to the creepage path between the static contacts.
7. The relay according to claim 3, characterized in that, The dust-accumulating narrow grooves are formed on the creepage path between the static contacts and on the retaining wall between the static contacts.
8. The relay according to claim 1, characterized in that, The width of the dust-accumulating narrow grooves is less than 1 mm, and at least two parallel dust-accumulating narrow grooves are arranged in the same direction.
9. The relay according to claim 1, characterized in that, It further includes a magnetic circuit part fixed on the base, and the magnetic circuit part includes an iron core, a yoke and an armature; wherein, the iron core is fixedly connected with the yoke, and the moving reed is fixed on the armature; the armature is connected with the yoke through an elastic member, and the armature is attracted to or separated from the iron core to achieve a clapping action, driving the moving contact to contact or disconnect from the static contact.