Impedance tester

Abstract

An impedance tester comprises a host, a probe, an automatic calibration module, a data processing module, a display module and a multi-band signal generation module, the host is provided with a control unit, a storage unit and a power module interface, and a shell is detachably designed and comprises an upper shell body and a lower shell body; the probe adopts a replaceable design, is provided with a coaxial interface, a clamping device and a signal transmission cable, and is internally provided with an impedance matching circuit; and the automatic calibration module is integrated in the host, is adjacent to the control unit, and comprises a calibration control module, a calibration signal generator, a reference impedance element and a high-speed storage device. The data processing module is composed of a high-speed DSP chip and an FPGA, and the display module is arranged on a front panel and used for displaying a measurement result and an operation interface; the multi-band signal generation module is arranged in the host and comprises a plurality of DDS signal generators and power amplifiers, and each channel is connected with external equipment through an output interface. According to the utility model, high-precision and high-reliability impedance test requirements are met.

Description

Technical Field

[0001] The utility model relates to an impedance tester. Background Art

[0002] Impedance refers to the resistance to alternating current signals in an electrical system, which includes components such as resistance, inductance, and capacitance, and reflects the electrical characteristics of the electrical system. The measurement and analysis of impedance are of great significance for the design, optimization, debugging, and fault diagnosis of electrical systems. Therefore, impedance testers are measurement instruments widely used in fields such as electronics, communications, power, and medicine.

[0003] Currently, the common principles and methods of impedance testers mainly include the following:

[0004] Automatic balance bridge method: This method uses the balance condition of the bridge to calculate the impedance value of the object under test by measuring the voltage and current at both ends of the bridge. This method has the advantages of high measurement accuracy, wide impedance measurement range, and flexible electrical measurement conditions. However, its disadvantage is that the measurement frequency range is limited by the frequency response characteristics of the bridge and is generally only suitable for low-frequency (<100 MHz) impedance testing.

[0005] RF I-V method: This method uses a high-frequency current probe and a voltage probe to measure the current and voltage of the object under test respectively, and then calculates the impedance value of the object under test according to Ohm's law. This method has the advantages of wide measurement frequency range, wide impedance measurement range, and suitability for testing grounded devices. However, its disadvantages are low measurement accuracy, being affected by the performance of the current probe and voltage probe, and the need to calibrate and match the probes.

[0006] Network analyzer method: This method uses a network analyzer to calculate the impedance value of the object under test by measuring the reflection coefficient or transmission coefficient of the object under test and then according to the transmission line theory. This method has the advantages of the widest measurement frequency range and the fastest measurement speed. However, its disadvantages are low measurement accuracy, limited impedance measurement range, and the need to calibrate and match the network analyzer.

[0007] The above three methods each have their own advantages and disadvantages, but none of them can meet all the requirements of impedance testing. Especially in high-frequency, high-precision, and high-reliability impedance testing, there is still a lot of room for improvement.

[0008] In summary, the technical background part of this patent aims to elaborate on the current situation in the existing technical field. The content of this part will provide necessary background information for understanding the technical contributions and innovation points of this patent. The signals disclosed in this background art part are only intended to increase the understanding of the overall background of the utility model and should not be regarded as implying subjective consciousness in any form. Summary of the Utility Model

[0009] In view of the above, the object of the present utility model is to provide an impedance tester to solve the technical problems of treating external discharge and subsequent maintenance.

[0010] The technical solution adopted to achieve the object of the present utility model is an impedance tester, which includes a mainframe, a probe, an automatic calibration module, a data processing module, a display module and a multi-band signal generation module. The mainframe includes a control unit, a storage unit and a power module interface. The control unit realizes data acquisition, processing and control. The storage unit includes a high-speed memory and a large-capacity hard disk. The power module interface provides stable power. The mainframe housing is designed with a detachable connection. The housing includes an upper housing and a lower housing. The probe is designed to be replaceable. The probe includes a probe body, a coaxial interface, a clamping device for fixing the probe on the device under test and a signal transmission cable. The probe body is fixedly connected to the signal transmission cable and is connected to the corresponding interface of the mainframe through the coaxial interface. The impedance matching circuit built in the probe body is directly matched with the measurement circuit of the mainframe. The clamping device is installed at the end of the probe body. The automatic calibration module is integrated inside the mainframe and is adjacent to the control unit in the middle of the mainframe. The automatic calibration module includes a calibration control module, a calibration signal generator, a reference impedance element and a calibration data storage unit. The calibration signal generator and the reference impedance element are connected to the calibration control module. The calibration signal generator is located at the front of the mainframe, which is convenient for direct connection with the measurement channel to reduce signal loss and interference. The reference impedance element is fixed at the rear of the mainframe and is shielded to avoid the influence of external electromagnetic interference. The calibration data storage unit is connected to the control unit and the calibration control module and is located at the side of the mainframe. High-speed storage devices are used to ensure the fast access and safe storage of calibration data. The calibration control module is connected to the control unit. The data processing module is composed of a high-speed DSP chip and an FPGA and is installed inside the mainframe. The display screen module is arranged on the front panel of the housing and is used to display the measurement results and the operation interface. The multi-band signal generation module is installed inside the mainframe and includes a plurality of signal channels and output interfaces. Each channel contains a DDS signal generator, and each DDS signal generator is connected to a power amplifier. The output interface is arranged on the external interface panel of the mainframe.

[0011] Further, the data processing module includes a high-speed DSP chip, an FPGA, a data bus, a storage unit interface and a data transmission interface. The high-speed DSP chip is connected to the FPGA through the data bus. The storage unit interface is connected to the storage unit in the mainframe. The data transmission interface is used for data exchange with external devices.

[0012] Furthermore, the data processing module is integrated inside the host to ensure that the high-speed DSP chip and FPGA can quickly receive and process data instructions from the control unit; the data bus enables high-speed connection inside the data processing module to ensure the data transmission efficiency between the high-speed DSP chip and FPGA; the storage unit interface is connected to the storage unit of the host through internal connection lines to ensure that the processed data can be quickly stored and retrieved; the data transmission interface is set on the external interface panel of the host to facilitate the user to transfer the data processed by the data processing module to external devices.

[0013] Furthermore, the display module adopts a high-resolution touch screen, which can display the measurement data and analysis results in real time.

[0014] The beneficial effects of the present utility model are as follows:

[0015] 1. The detachable connection shell design is adopted, which is convenient for maintenance and replacement. The replaceable probe design allows different probes to be selected according to different measured objects and test requirements.

[0016] 2. The impedance tester of this patent has an automatic calibration function, which can automatically calibrate the measurement circuit of the impedance tester to eliminate measurement errors and improve the accuracy and reliability of measurement. The impedance tester of this patent adopts an automatic calibration module integrated inside the host, including a calibration control module, a calibration signal generator, a reference impedance element, a calibration data storage unit, etc. It can control the calibration signal generator to generate corresponding calibration signals according to the user's calibration instructions, compare with the measurement circuit through the reference impedance element, calculate the measurement error, and store the calibration data in the calibration data storage unit to correct the measurement data.

[0017] 3. The impedance tester of this patent has a data processing function, which can process and analyze the measurement data, calculate the impedance value and impedance characteristic curve of the measured object, etc., and conduct data exchange with external devices. The impedance tester of this patent adopts a data processing module composed of a high-speed DSP chip and FPGA, which can perform digital signal processing and logical operations on the measurement data to obtain data such as the impedance value and impedance characteristic curve of the measured object, and transmit the data to the control unit through the data bus. The control unit stores the data in the storage unit and displays it to the user through the touch screen of the display module.

[0018] 4. The impedance tester of this patent has a multi - band signal generation function, which can generate test signals of different frequencies for measuring the impedance characteristics of the object under test. The impedance tester of this patent adopts a multi - band signal generation module located inside the mainframe, which includes multiple signal channels and output interfaces. Each channel contains a DDS signal generator, and each DDS signal generator is connected to a power amplifier. The output interface is set on the external interface panel of the mainframe and is used to connect the probe and the object under test. The multi - band signal generation module can generate test signals with different frequencies, amplitudes, and phases according to the user's needs to meet different measurement requirements. Brief Description of the Drawings

[0019] In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the drawings required for use in the description of the embodiments or the prior art. Obviously, the following drawings are only some embodiments of the present invention. For those of ordinary skill in the art, without creative efforts, other drawings can be obtained based on these drawings.

[0020] Figure 1 is a schematic structural diagram of the present invention;

[0021] In the figure, 100 - mainframe, 101 - power module interface, 102 - coaxial interface, 200 - multi - band signal generation module, 201 - signal channel, 3 - display screen module. Detailed Embodiments

[0022] The following will make an explanation of the present invention in this embodiment according to the drawings and some embodiments.

[0023] It should be noted that, without conflict, the embodiments in this application and the features in the embodiments can be combined with each other. The following will refer to the drawings and combine the embodiments to describe the present invention in detail.

[0024] The present invention relates to an impedance tester, which can accurately measure and analyze the impedance of various electronic components, circuits or devices. It has characteristics such as a wide measurement range, fast measurement speed, high measurement accuracy, automatic calibration function, data processing function, display function, and multi - band signal generation function, and is applicable to impedance testing and research in fields such as electronics, communication, power, and medical treatment.

[0025] In order to better illustrate the technical solutions of the present invention, the following will describe the present invention in detail with reference to the drawings and specific embodiments, but the present invention is not limited to the following embodiments.

[0026] See Figure 1 , Figure 1It is a schematic structural diagram of the impedance tester of the present invention. The impedance tester of the present invention includes a main unit, a probe, an automatic calibration module, a data processing module, a display module, and a multi-band signal generation module.

[0027] In this embodiment, the main unit is the core part of the impedance tester, responsible for controlling the entire test process, receiving and sending signals, storing and processing data, providing power, etc. The main unit includes a control unit, a storage unit, and a power module interface. The control unit realizes data acquisition, processing, and control. The storage unit includes a high-speed memory and a large-capacity hard disk, which are used to store test data, calibration data, test parameters, test programs, etc. The power module interface is used to connect to an external power module to provide stable power.

[0028] In this embodiment, the control unit is located at the central position of the main unit and is connected to each module through the system bus to ensure the efficient transmission of data and instructions; the storage unit is arranged around the control unit, and the high-speed memory and the large-capacity hard disk are connected to the control unit to ensure the rapid access of data; the power module is arranged on the side of the main unit, and the power interface (is set outside the main unit for convenient connection to an external power source.

[0029] In this embodiment, the outer shell of the main unit is designed with a detachable connection for easy maintenance and replacement. The outer shell includes an upper shell and a lower shell, and the upper shell and the lower shell are fixedly connected by screws or snap-fasteners.

[0030] In this embodiment, the probe is the input / output part of the impedance tester, responsible for transmitting and receiving signals with the object under test, and fixing the position of the probe on the object under test. The probe adopts a replaceable design, and different probes can be selected according to different objects under test and test requirements. The probe includes a probe body, a coaxial interface, a clamping device, and a signal transmission cable. The probe body is fixedly connected to the signal transmission cable and is connected to the corresponding interface of the main unit through the coaxial interface. The impedance matching circuit built into the probe body is directly matched with the measurement circuit of the main unit to reduce signal reflection and attenuation and improve the measurement accuracy. The clamping device is installed at the end of the probe body and is used to fix the position of the probe on the object under test. The clamping device can be a suction cup, a clip, a magnet, etc., and a suitable clamping device is selected according to the shape and material of the object under test.

[0031] In this embodiment, the automatic calibration module is the calibration part of the impedance tester, which is responsible for automatically calibrating the measurement circuit of the impedance tester to eliminate measurement errors and improve the accuracy and reliability of measurement. The automatic calibration module is integrated inside the mainframe and is adjacent to the control unit in the middle of the mainframe. The automatic calibration module includes a calibration control module, a calibration signal generator, a reference impedance element, and a calibration data storage unit. The calibration signal generator and the reference impedance element are connected to the calibration control module. The calibration signal generator is located at the front of the mainframe, facilitating direct connection to the measurement channel to reduce signal loss and interference. The reference impedance element is fixed at the rear of the mainframe and is shielded to avoid the influence of external electromagnetic interference. The reference impedance element can be a standard resistor, capacitor, inductor, etc., and a suitable reference impedance element is selected according to different test frequencies and ranges. The calibration data storage unit is connected to the control unit and the calibration control module and is located on the side of the mainframe. A high-speed storage device is used to ensure the fast access and secure storage of calibration data. The calibration data includes the frequency, amplitude, phase, etc. of the calibration signal, as well as the impedance value of the reference impedance element, etc. The calibration control module is connected to the control unit, receives the calibration instruction from the control unit, controls the operation of the calibration signal generator and the reference impedance element, and the reading and writing of calibration data.

[0032] In this embodiment, the data processing module is the data processing part of the impedance tester, which is responsible for processing and analyzing the measurement data, calculating the impedance value and impedance characteristic curve of the measured object, etc., and performing data exchange with external devices. The data processing module is composed of a high-speed DSP chip and an FPGA and is installed inside the mainframe. The data processing module includes a high-speed DSP chip, an FPGA, a data bus, a storage unit interface, and a data transmission interface. The high-speed DSP chip and the FPGA are connected through the data bus to achieve high-speed data transmission and exchange. The high-speed DSP chip is responsible for digital signal processing of the measurement data, such as filtering, Fourier transform, data compression, etc. The FPGA is responsible for performing logical operations on the measurement data, such as impedance calculation, curve fitting, data analysis, etc. The storage unit interface is connected to the storage unit in the mainframe to achieve data storage and retrieval. The data transmission interface is used for data exchange with external devices, such as USB interface, network interface, serial port, etc., facilitating users to export or import data.

[0033] In this embodiment, the display module is the display part of the impedance tester, which is responsible for displaying the measurement results and operation interface and interacting with the user. The display module is set on the front panel of the outer shell of the mainframe. The display module uses a high-resolution touch screen and can display the measurement data and analysis results in real time, such as impedance value, phase, frequency response curve, impedance characteristic diagram, etc. Users can operate through the touch screen, such as selecting the measurement frequency, setting measurement parameters, exporting data, viewing historical records, etc.

[0034] In this embodiment, the multi-band signal generation module is the signal source part of the impedance tester, responsible for generating test signals of different frequencies for measuring the impedance characteristics of the object under test. The multi-band signal generation module is arranged inside the mainframe, including multiple signal channels and output interfaces. Each channel contains a DDS (Direct Digital Synthesizer) signal generator, and each DDS signal generator is connected to a power amplifier. The output interface is set on the external interface panel of the mainframe for connecting the probe and the object under test. The multi-band signal generation module can generate test signals of different frequencies, amplitudes, and phases according to the user's requirements to meet different measurement requirements.

[0035] The working principle of the impedance tester of the present invention is as follows:

[0036] 1. When the user needs to test the impedance of an electronic component, circuit, or device, first select a suitable probe, fix the clamping device of the probe on the object under test, make the probe body of the probe contact the object under test, and then connect the probe to the output interface of the mainframe to connect the probe to the measurement circuit of the mainframe.

[0037] 2. Then, the user sets parameters such as the test frequency range, amplitude, phase, etc. through the touch screen of the display module, and selects the impedance parameters to be displayed, such as Z, L, C, R, Q, D, etc. The display module transmits the user's set parameters to the control unit. The control unit controls the multi-band signal generation module to generate corresponding test signals according to the user's set parameters, sends the test signals to the probe through the output interface, and the probe transmits the test signals to the object under test.

[0038] 3. Under the action of the test signal, the object under test generates a corresponding response signal, which contains the impedance information of the object under test. The response signal returns to the measurement circuit of the mainframe through the probe. The measurement circuit sends the voltage and current of the response signal to the high-speed DSP chip and FPGA of the data processing module respectively. The high-speed DSP chip performs digital signal processing on the response signal, such as filtering, Fourier transform, data compression, etc. The FPGA performs logical operations on the response signal, such as impedance calculation, curve fitting, data analysis, etc., to obtain data such as the impedance value and impedance characteristic curve of the object under test, transmits the data to the control unit through the data bus, and the control unit stores the data in the storage unit and displays it to the user through the touch screen of the display module.

[0039] 4. To ensure the accuracy and reliability of the test, the impedance tester of the present invention also has an automatic calibration function. That is, before each test or during the test process, the control unit sends a calibration instruction to the automatic calibration module. The automatic calibration module, according to the calibration instruction, controls the calibration signal generator to generate a corresponding calibration signal, sends the calibration signal into the measurement circuit through the output interface, and at the same time controls the reference impedance element to be connected to the measurement circuit. The measurement circuit compares the calibration signal with the impedance value of the reference impedance element, calculates the measurement error, and stores the calibration data in the calibration data storage unit. The control unit corrects the measurement data according to the calibration data to eliminate the measurement error.

[0040] The above are examples of the specific implementation manners of this patent, for reference only and not limited thereto. Without departing from the spirit and scope of this patent, those skilled in the art can make various changes and modifications to this patent, and these changes and modifications should be included within the protection scope of this patent.

[0041] The specific implementation manners of this patent are only for exemplary illustration and do not limit the protection scope of this patent. Without departing from the gist and spirit of this patent, various changes and modifications can be made to the specific implementation manners of this patent. These changes and modifications all fall within the scope covered by this patent.

[0042] It should be noted that: in the description of this utility model, the meaning of "a plurality of" is two or more, unless otherwise clearly and specifically defined. In this utility model, unless otherwise clearly specified and defined, terms such as "installed", "connected", "connected to", "fixed" and other terms should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection; the circuits described in this utility model are all common circuits in the art, and other related components are all existing common components. For those of ordinary skill in the art, the specific meanings of the above terms in this utility model can be understood according to specific circumstances.

[0043] For those skilled in the art, it is obvious that this utility model patent is not limited to the details of the above exemplary embodiments, and without departing from the spirit or basic characteristics of this utility model patent, this utility model patent can be implemented in other specific forms. Therefore, from any point of view, the embodiments should be regarded as exemplary and non-limiting. The scope of this utility model patent is defined by the appended claims rather than the above description. Therefore, all changes falling within the meaning and scope of the same elements of the claims are intended to be included in this utility model patent. Any reference signs in the claims should not be regarded as limiting the claimed rights.

Claims

1. An impedance tester, comprising a main unit, a probe, an automatic calibration module, a data processing module, a display module and a multi-band signal generation module, characterized in that: The main unit includes a control unit, a storage unit and a power module interface. The main unit housing is designed with a detachable connection. The housing includes an upper shell and a lower shell; The probe is designed to be replaceable. The probe includes a probe body, a coaxial interface, a clamping device for fixing the probe on the device under test and a signal transmission cable. The probe body is fixedly connected to the signal transmission cable and is connected to the corresponding interface of the main unit through the coaxial interface. The impedance matching circuit built in the probe body is directly matched with the measurement circuit of the main unit. The clamping device is installed at the end of the probe body; The automatic calibration module is integrated inside the main unit and is arranged adjacent to the control unit in the middle of the main unit. The automatic calibration module includes a calibration control module, a calibration signal generator, a reference impedance element, and a calibration data storage unit. The calibration signal generator and the reference impedance element are connected to the calibration control module. The calibration signal generator is located at the front of the main unit, and the reference impedance element is fixed at the rear of the main unit, and is designed with shielding to avoid the influence of external electromagnetic interference. The calibration data storage unit is connected to the control unit and the calibration control module and is located at the side of the main unit, using a high-speed storage device. The calibration control module is connected to the control unit; The data processing module is composed of a high-speed DSP chip and an FPGA and is arranged inside the main unit; The display screen module is arranged on the front panel of the housing and is used to display the measurement results and the operation interface; The multi-band signal generation module is arranged inside the main unit and includes a plurality of signal channels and output interfaces. Each channel contains a DDS signal generator, and each DDS signal generator is connected to a power amplifier. The output interface is arranged on the external interface panel of the main unit.

2. The impedance tester according to claim 1, wherein The data processing module includes a high-speed DSP chip, an FPGA, a data bus, a storage unit interface and a data transmission interface. The high-speed DSP chip is connected to the FPGA through the data bus. The storage unit interface is connected to the storage unit in the main unit. The data transmission interface is used for data exchange with external devices.

3. The impedance tester according to claim 2, wherein The data processing module is integrated inside the main unit. The data bus realizes high-speed connection inside the data processing module. The storage unit interface is connected to the storage unit of the main unit through an internal connection line. The data transmission interface is arranged on the external interface panel of the main unit.

4. The impedance tester according to claim 1, wherein The display module uses a high-resolution touch screen and can display the measurement data and analysis results in real time.

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