Testing device

Abstract

The utility model relates to a testing device, which comprises a machine table, a carrier plate, a crimping module and a testing module, and is characterized in that the carrier plate is arranged on the machine table and is provided with a bearing position for bearing a to-be-tested product; the crimping module is movably arranged on the machine table and can move in the direction close to or away from the bearing position; the test module is arranged on the machine table and comprises a plurality of probe modules, and when the crimping module crimps the to-be-tested product, any probe module can abut against the test point of the to-be-tested product to form a test loop. According to the test device provided by the invention, any one probe module can abut against the test point of the to-be-tested product to form the test loop, the probe modules are mutually independent, and the test point of the to-be-tested product is selectively and electrically connected with one or more probe modules. The test device is suitable for crimping tests of to-be-tested products of different specifications and different positions or spacing test points of the to-be-tested products, and the application scene of the test device is expanded.

Description

Technical Field

[0001] This application relates to the technical field of product testing, and particularly to a testing device. Background Art

[0002] In manufacturing and modern industrial production, product performance, quality, etc. are detected before the products are put into use to ensure their compliance. For example, with the sharp increase in the market demand for electronic components, electronic components such as IC chips, circuit boards, and touch screens are tested for performance before use.

[0003] Currently, with the replacement and upgrade of products, electronic components tend to develop in the direction of diversification and miniaturization. Usually, the test module can only be used for the electrical crimping test of specific specification electronic components. If the position of the test point of the electronic component changes, it is necessary to frequently replace the appropriate test module to perform the electrical crimping test on different electronic components, resulting in an increase in test costs. Summary of the Invention

[0004] Based on this, in view of the problem that the existing test module cannot be used for the electrical crimping test of different electronic components, it is necessary to provide a testing device.

[0005] A testing device, the testing device includes:

[0006] A machine platform;

[0007] A carrier board, the carrier board is arranged on the machine platform and has a carrying position for carrying the product to be tested;

[0008] A crimping module, the crimping module is movably arranged on the machine platform and can move in a direction approaching or departing from the carrying position;

[0009] A test module, the test module is arranged on the machine platform, the test module includes a plurality of probe modules, and when the crimping module crimps the product to be tested, any one of the probe modules can abut against the test point of the product to be tested and form a test circuit.

[0010] In one embodiment, the test module further includes a fixing seat, and the fixing seat is detachably arranged on the machine platform;

[0011] The plurality of probe modules are arranged on the fixing seat at intervals, and the interval distance between two adjacent probe modules is 0.3 mm to 0.6 mm.

[0012] In one embodiment, the probe module includes a probe base, a test board, and a probe group. The probe base is disposed on the fixed base. The probe group is floatingly disposed on the probe base and is electrically connected to the test board. When the crimping module crimps the product under test, the probe group can abut against the test points of the product under test to form a test circuit.

[0013] In one embodiment, the probe module further includes a floating block, a gland, and a tail cover. The floating block is disposed on the probe base, and an elastic member is provided between the floating block and the probe base. The probe group is disposed on the floating block. The gland and the tail cover are respectively disposed on opposite sides of the probe base, and the gland presses on the floating block. The tail cover is provided for the movable insertion of the probe group.

[0014] In one embodiment, the tail cover protrudes with a plurality of positioning pins, and the test board has a plurality of positioning holes. The plurality of positioning holes can be correspondingly fitted with the plurality of positioning pins.

[0015] In one embodiment, there are three probe modules. When the crimping module crimps the product under test, all three probe modules abut against the test points of the product under test to form a test circuit.

[0016] In one embodiment, the testing device further includes a code scanning module. The code scanning module is movably disposed on the machine table and is used for scanning the product information of the product under test.

[0017] In one embodiment, the testing device further includes a mounting bracket. The mounting bracket is disposed on the machine table. The code scanning module is movably disposed on the mounting bracket. The code scanning module can move in a first direction, a second direction, and a third direction on the mounting bracket and can rotate relative to the mounting bracket.

[0018] Wherein, the first direction, the second direction, and the third direction are perpendicular to each other in pairs.

[0019] In one embodiment, the mounting bracket includes a first fixing plate, a second fixing plate, and a third fixing plate.

[0020] The first fixing plate is provided with a plurality of arc-shaped holes. The code scanning module is connected to the arc-shaped holes through a first connecting member, and the first connecting member can move within the arc-shaped holes.

[0021] The second fixing plate is provided with a plurality of first waist-shaped holes. The first fixing plate is connected to the first waist-shaped holes through a second connecting member, and the second connecting member can move in the first direction or the second direction within the first waist-shaped holes.

[0022] The third fixing plate is disposed on the machine table and is provided with a plurality of second waist-shaped holes. The second fixing plate is connected to the second waist-shaped holes through third connecting members, and the third connecting members are movable along the third direction within the second waist-shaped holes.

[0023] In one embodiment, the machine table has a loading position and a testing position. The carrier plate is disposed on the machine table and is movable between the loading position and the testing position.

[0024] For the above testing device, when performing an electrical crimping test on a product to be tested, the product to be tested is placed on the carrier plate. The crimping module moves towards the direction close to the loading position to apply a test pressure to the product to be tested, and a test circuit is formed when the product to be tested abuts against the probe module, so as to perform a crimping test on the product to be tested. For the testing device provided in this application, any probe module can abut against the test point of the product to be tested and form a test circuit. Each probe module is independent of each other. The test points of the product to be tested are selectively electrically connected to one or more probe modules to adapt to the crimping tests of different specifications of products to be tested, different positions or spaced test points of the product to be tested, and expand the applicable scenarios of the testing device. Description of the Drawings

[0025] Figure 1 It is a schematic structural diagram of the testing device provided in some embodiments.

[0026] Figure 2 It is an exploded schematic diagram of the testing device provided in some embodiments.

[0027] Figure 3 It is a schematic structural diagram of the testing module provided in some embodiments.

[0028] Figure 4 It is an exploded schematic diagram of the probe module provided in some embodiments.

[0029] Figure 5 It is a schematic structural diagram of the module composed of the machine table, the carrier plate, the code scanning module, the mounting rack and the second driving member provided in some embodiments.

[0030] Figure 6 For Figure 5 The partial enlarged view of area A in

[0031] Reference Numerals:

[0032] 100, testing device;

[0033] 110. Machine; 111. Loading position; 112. Testing position; 120. Carrier board; 121. Loading position; 130. Crimping module; 131. Pressing head; 132. First driving member; 140. Testing module; 141. Probe module; 1411. Probe base; 1412. Testing board; 1413. Probe group; 1414. Floating block; 1415. Pressing cover; 1416. Tail cover; 1417. Elastic member; 1418. Positioning pin; 1419. Positioning hole; 142. Fixed seat; 150. Scanning code module; 160. Mounting rack; 161. First fixing plate; 1611. Arc-shaped hole; 1612. First connecting member; 162. Second fixing plate; 1621. First waist-shaped hole; 1622. Second connecting member; 163. Third fixing plate; 1631. Second waist-shaped hole; 1632. Third connecting member; 170. Slide rail; 180. Second driving member. Detailed implementation manners

[0034] To make the above objects, features, and advantages of the present application more apparent and understandable, the following will describe the detailed implementation manners of the present application in conjunction with the accompanying drawings. Many specific details are set forth in the following description to facilitate a full understanding of the present application. However, the present application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar improvements without departing from the connotation of the present application. Therefore, the present application is not limited by the specific embodiments disclosed below.

[0035] In the description of the present application, it should be understood that if these terms "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", etc. appear, the orientation or positional relationship indicated by these terms is based on the orientation or positional relationship shown in the accompanying drawings, and is only for the convenience of describing the present application and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be construed as a limitation to the present application.

[0036] In addition, if these terms "first" and "second" appear, these terms are only used for descriptive purposes and should not be construed as indicating or implying relative importance or implicitly indicating the quantity of the indicated technical features. Thus, features defined with "first" and "second" may explicitly or implicitly include at least one of such features. In the description of the present application, if the term "plurality" appears, the meaning of "plurality" is at least two, such as two, three, etc., unless otherwise specifically defined.

[0037] In this application, unless otherwise clearly defined and limited, if terms such as "installed", "connected", "joined", "fixed", etc. appear, these terms should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or integrated; it can be a mechanical connection or an electrical connection; it can be directly connected or indirectly connected through an intermediate medium, and it can be the communication inside two components or the interaction relationship between two components, unless otherwise clearly limited. For those of ordinary skill in the art, the specific meanings of the above terms in this application can be understood according to specific circumstances.

[0038] In this application, unless otherwise clearly defined and limited, if there is a description such as the first feature being "on" or "under" the second feature, its meaning can be that the first and second features are in direct contact, or the first and second features are indirectly in contact through an intermediate medium. Moreover, the first feature being "above", "over" and "on top of" the second feature can mean that the first feature is directly above or obliquely above the second feature, or simply means that the first feature is at a higher horizontal level than the second feature. The first feature being "under", "beneath" and "underneath" the second feature can be that the first feature is directly below or obliquely below the second feature, or simply means that the first feature is at a lower horizontal level than the second feature.

[0039] It should be noted that if an element is referred to as "fixed to" or "disposed on" another element, it can be directly on the other element or there can also be an intermediate element. If an element is considered to be "connected" to another element, it can be directly connected to the other element or there may be an intermediate element at the same time. If so, the terms "vertical", "horizontal", "up", "down", "left", "right" and similar expressions used in this application are only for the purpose of illustration and do not represent the only implementation.

[0040] The following introduces the technical solutions provided by the embodiments of this application with reference to the accompanying drawings.

[0041] Refer to Figures 1 - 3 As shown, this application provides a test device 100. The test device 100 includes a machine platform 110, a carrier plate 120, a crimping module 130 and a test module 140. The carrier plate 120 is disposed on the machine platform 110. The carrier plate 120 has a loading position 121 for loading the product to be tested. When the product to be tested is loaded on the loading position 121, the test device 100 is used to perform an electrical crimping test on the product to be tested. Among them, in this embodiment, the product to be tested is a chip or a circuit board. Of course, in other feasible embodiments, the product to be tested can also be an electronic component such as a touch screen. The specific component type of the product to be tested is not limited in this application.

[0042] The crimping module 130 is movably disposed on the machine 110, and the crimping module 130 can move in a direction close to or away from the supporting position 121. As in the embodiment, when the crimping module 130 moves in a direction close to the supporting position 121, the crimping module 130 can contact the product to be tested and apply test pressure to the product to be tested to perform a crimping test on the product to be tested; on the contrary, after the test of the product to be tested is completed, the crimping module 130 moves in a direction away from the supporting position 121 to facilitate the picking and placing operation of the product to be tested. Exemplarily, the crimping module 130 includes a pressing head 131 and a first driving member 132. The first driving member 132 is transmission-connected to the pressing head 131. The power output by the first driving member 132 can drive the pressing head 131 to move in a direction close to or away from the supporting position 121 to perform a crimping or avoidance operation on the product to be tested.

[0043] The test module 140 is arranged on the machine 110, and the test module 140 includes a plurality of probe modules 141. When the crimping module 130 is pressed against the product to be tested, any probe module 141 can abut against the test point of the product to be tested and form a test loop. For example, when only one test point of the product to be tested needs to be subjected to an electrical crimping test, any one of the plurality of probe modules 141 can abut against the test point of the product to be tested; when multiple test points of the product to be tested need to be subjected to an electrical crimping test at the same time, the appropriate probe module 141 can be selected to abut against the corresponding test points of the product to be tested according to the position and spacing of each test point of the product to be tested. Specifically, when the product to be tested is subjected to an electrical crimping test, the product to be tested is placed on the carrier 120, and the crimping module 130 moves in a direction close to the carrier position 121 to apply test pressure to the product to be tested, and a test loop is formed when the test point of the product to be tested abuts against the probe module 141, and the product to be tested is subjected to a crimping test.

[0044] In the above-mentioned test device 100, any probe module 141 can abut against the test point of the product to be tested and form a test loop. Each probe module 141 is independent of each other. The test point of the product to be tested is selectively electrically connected to one or more probe modules 141 to adapt to the crimping test of products to be tested of different specifications and test points at different positions or spacings of the products to be tested, thereby expanding the applicable scenarios of the test device 100.

[0045] In one embodiment, see Figures 1 - 3As shown, the test module 140 further includes a fixing base 142. The fixing base 142 is detachably disposed on the machine table 110. For example, the fixing base 142 is detachably disposed on the machine table 110 by means of screwing, riveting, etc., so that when the test module 140 fails, the connection relationship between the fixing base 142 and the machine table 110 can be released to replace the test module 140, avoiding replacing the entire test device 100 and reducing the test cost of the product to be tested. A plurality of probe modules 141 are spaced apart on the fixing base 142, and the spacing distance between two adjacent probe modules 141 is 0.3 mm to 0.6 mm. Exemplarily, a plurality of probe modules 141 are arranged in an array at intervals on the fixing base 142, and the spacing distance between two adjacent probe modules 141 in the array direction is 0.3 mm to 0.6 mm. Thus, when performing an electrical crimping test on a miniaturized product to be tested, since the spacing between two adjacent test points of the product to be tested is small, setting the spacing distance between two adjacent probe modules 141 to 0.3 mm to 0.6 mm can adapt to the electrical contact test of the small-spacing test points of the product to be tested. Moreover, the test points of the product to be tested are selectively electrically connected to one or more of the probe modules 141, which can adapt to the crimping tests of different specifications of products to be tested, different positions or spacing test points of the product to be tested, and expand the applicable scenarios of the test device 100.

[0046] When specifically setting, the spacing distance between two adjacent probe modules 141 can be any one of 0.3 mm, 0.4 mm, 0.5 mm, and 0.6 mm. The present application does not limit the specific spacing distance between two adjacent probe modules 141.

[0047] In one embodiment, referring to Figures 1 - 3 As shown, there are three probe modules 141. When the crimping module 130 crimps on the product to be tested, all three probe modules 141 are in contact with the test points of the product to be tested and form a test circuit to simultaneously perform an electrical crimping test on the three test points of the product to be tested, and the spacing between two adjacent probe modules 141 is small, which can adapt to the electrical crimping test of the small-spacing test points of the miniaturized product to be tested.

[0048] In one embodiment, continue to refer to Figure 4As shown, the probe module 141 includes a probe base 1411, a test board 1412, and a probe group 1413. The probe base 1411 is disposed on the fixed base 142 by means of screwing, welding, etc. The probe group 1413 is floatingly disposed on the probe base 1411, and the probe group 1413 is electrically connected to the test board 1412. When the crimping module 130 crimps the product to be tested, the probe group 1413 can abut against the test points of the product to be tested and form a test circuit. Since the probe group 1413 is electrically connected to the test board 1412, the product to be tested can be electrically crimped and tested through the test board 1412. Moreover, when the probe group 1413 abuts against the test points of the product to be tested, since the probe group 1413 can float, it can avoid hard contact between the probe group 1413 and the product to be tested during the abutting process, thereby protecting the probe group 1413.

[0049] Among them, in this embodiment, the test board 1412 is a flexible printed circuit (FPC). Of course, in other feasible embodiments, the test board 1412 can also be a ceramic circuit board or others. The specific component type of the test board 1412 is not limited in this application. Moreover, the test boards 1412 of multiple probe modules 141 are all bent toward one side to save the installation space of the multiple test boards 1412 and can avoid other components.

[0050] Further, referring to Figures 2 - 4 As shown, the probe module 141 further includes a floating block 1414, a gland 1415, and a tail cover 1416. The floating block 1414 is disposed on the probe base 1411, and an elastic member 1417 is disposed between the floating block 1414 and the probe base 1411. The elastic member 1417 can make the floating block 1414 floatingly disposed on the probe base 1411. The probe group 1413 is disposed on the floating block 1414. Since the floating block 1414 is floatingly disposed on the probe base 1411, the probe group 1413 is also floatingly disposed on the probe base 1411. The gland 1415 and the tail cover 1416 are respectively disposed on opposite sides of the probe base 1411, and the gland 1415 presses on the floating block 1414 to limit the floating space of the floating block 1414 and avoid damage to the elastic member 1417 due to excessive floating amplitude of the floating block 1414. The tail cover 1416 can be movably inserted by the probe group 1413. Exemplarily, the tail cover 1416 is provided with a socket hole, and the probe group 1413 is movably inserted into the socket hole. The setting of the tail cover 1416 will neither interfere with the floating of the probe group 1413 during the test nor improve the setting stability of the probe group 1413.

[0051] Among them, in this embodiment, the elastic member 1417 is a return spring. Through the elastic deformation and elastic reset of the elastic member 1417, the floating block 1414 can be floatingly arranged on the probe base 1411. Of course, in other feasible embodiments, the elastic member 1417 can also be an elastic sheet or other elements that can deform under force. The application does not limit the type of the elastic member 1417.

[0052] Since the probe group 1413 is electrically connected to the electrical points of the test board 1412, the probe group 1413 is prone to position deviation during the connection process with the test board 1412, resulting in poor electrical contact. In one embodiment, referring to Figures 2 - 4 as shown, the tail cover 1416 protrudes with a plurality of positioning pins 1418. Preferably, the positioning pins 1418 are integrally formed on the tail cover 1416 by injection molding, extrusion, etc., so as to simplify the forming method of arranging the positioning pins 1418 on the tail cover 1416, and the plurality of positioning pins 1418 are arranged at intervals along the circumferential direction of the tail cover 1416. The test board 1412 has a plurality of positioning holes 1419. Preferably, the positioning holes 1419 are integrally formed on the test board 1412 by injection molding, extrusion, etc., so as to simplify the forming method of opening the positioning holes 1419 on the test board 1412. The plurality of positioning holes 1419 can be correspondingly matched with the positioning pins 1418. Specifically, when the test board 1412 needs to be electrically connected to the probe group 1413, by correspondingly inserting the plurality of positioning pins 1418 into the plurality of positioning holes 1419, the relative position between the test board 1412 and the tail cover 1416 can be limited. Since the probe group 1413 is arranged on the tail cover 1416, that is, the relative position between the test board 1412 and the probe group 1413 is limited, ensuring the matching position accuracy between the test board 1412 and the probe group 1413, and avoiding the phenomenon of poor electrical contact due to position deviation during the connection process between the probe group 1413 and the test board 1412.

[0053] In one embodiment, referring to Figure 2 and Figure 5 as shown, the test device 100 further includes a code scanning module 150. The code scanning module 150 is movably arranged on the machine table 110, and the code scanning module 150 is used to scan the product information of the product to be tested. In this way, through the setting of the code scanning module 150, the product information of the product to be tested can be automatically identified without manual identification, which not only saves time and effort and improves the correct discrimination rate of the product to be tested, but also each product to be tested has a unique product information (two-dimensional code identifier). Scanning the code first and then performing the subsequent test operation on the product to be tested can establish a database for each product to be tested, which is convenient for the real-time tracking and statistics of the product to be tested.

[0054] Furthermore, referring to Figure 2 and Figure 5As shown, the testing device 100 further includes a mounting bracket 160. The mounting bracket 160 is disposed on the machine table 110 by means of welding, screwing, etc. The code scanning module 150 is movably disposed on the mounting bracket 160. The code scanning module 150 can move along a first direction ( Figure 5 the X direction shown), a second direction ( Figure 5 the Y direction shown), and a third direction ( Figure 5 the Z direction shown) on the mounting bracket 160, and the code scanning module 150 can rotate relative to the mounting bracket 160. For example, the code scanning module 150 can rotate around the Figure 5 R direction shown relative to the mounting bracket 160. Among them, the first direction, the second direction, and the third direction are perpendicular to each other in pairs.

[0055] For the above-mentioned testing device 100, by the movement of the code scanning module 150 in the first direction, the second direction, and the third direction, that is, the movement of the code scanning module 150 in three-dimensional space, and the rotation action of the code scanning module 150 in the R direction, the position and angle of the code scanning module 150 can be adjusted, so that the code scanning module 150 can comprehensively scan the product information of the product to be tested. And when the position of the product information barcode of the product to be tested changes, the position and angle of the code scanning module 150 can be adaptively adjusted to avoid the bad phenomenon that the product information of the product to be tested cannot be scanned due to the change of the position of the product information barcode of the product to be tested.

[0056] Specifically, referring to Figure 2 , Figure 5 and Figure 6 shown, the mounting bracket 160 includes a first fixing plate 161, a second fixing plate 162, and a third fixing plate 163. The first fixing plate 161 is provided with a plurality of arc-shaped holes 1611. The plurality of arc-shaped holes 1611 are arranged at intervals along the circumferential direction of the first fixing plate 161. Preferably, the plurality of arc-shaped holes 1611 can be integrally formed on the first fixing plate 161 by means of injection molding, extrusion, etc. to simplify the forming process of opening the arc-shaped holes 1611 on the first fixing plate 161. The code scanning module 150 is connected to the arc-shaped holes 1611 through a first connecting member 1612, and the first connecting member 1612 can move in the arc-shaped holes 1611. By the movement of the first connecting member 1612 in the arc-shaped holes 1611, the code scanning module 150 can move along the Figure 5Rotate in the R direction shown. The second fixing plate 162 is provided with a plurality of first waist-shaped holes 1621, and the plurality of first waist-shaped holes 1621 are arranged at intervals along the circumferential direction of the second fixing plate 162. Preferably, the plurality of first waist-shaped holes 1621 can be integrally formed on the second fixing plate 162 by injection molding, extrusion, etc., so as to simplify the forming process of opening the first waist-shaped holes 1621 on the second fixing plate 162. The first fixing plate 161 is connected to the first waist-shaped holes 1621 through the second connecting member 1622, and the second connecting member 1622 can move in the first direction or the second direction within the first waist-shaped holes 1621. For example, the length direction of the first waist-shaped holes 1621 extends in the first direction or the second direction. Through the movement of the second connecting member 1622 within the first waist-shaped holes 1621, the first fixing plate 161 moves along Figure 5 the X or Y direction shown. Since the code scanning module 150 is connected to the first fixing plate 161, the first fixing plate 161 can drive the code scanning module 150 to move along Figure 5 the X or Y direction shown. The third fixing plate 163 is arranged on the machine table 110 by welding, screwing, etc. The third fixing plate 163 is provided with a plurality of second waist-shaped holes 1631, and the plurality of second waist-shaped holes 1631 are arranged at intervals along the circumferential direction of the third fixing plate 163. Preferably, the plurality of second waist-shaped holes 1631 can be integrally formed on the third fixing plate 163 by injection molding, extrusion, etc., so as to simplify the forming process of opening the second waist-shaped holes 1631 on the third fixing plate 163. The second fixing plate 162 is connected to the second waist-shaped holes 1631 through the third connecting member 1632, and the third connecting member 1632 can move in the third direction within the second waist-shaped holes 1631. For example, the length direction of the second waist-shaped holes 1631 extends in the third direction. Through the movement of the third connecting member 1632 within the second waist-shaped holes 1631, the second fixing plate 162 moves along Figure 5 the Z direction shown. Since the code scanning module 150 is connected to the second fixing plate 162 through the first fixing plate 161, the second fixing plate 162 can drive the code scanning module 150 to move along Figure 5 the Z direction shown.

[0057] Among them, in this embodiment, the first connecting member 1612, the second connecting member 1622 and the third connecting member 1632 can be any one of screws, pins, etc. The specific types of the first connecting member 1612, the second connecting member 1622 and the third connecting member 1632 are not limited in this application.

[0058] In one embodiment, refer to Figure 1 , Figure 2 and Figure 5As shown, the machine 110 has a loading position 111 and a testing position 112. A carrier plate 120 is disposed on the machine 110 and is movable between the loading position 111 and the testing position 112. The carrier plate 120 can be moved to the loading position 111 to load and load the product to be tested. After the product to be tested is loaded on the loading position 121 of the carrier plate 120, the carrier plate 120 slides on the machine 110 to the testing position 112 to perform an electrical crimping test on the product to be tested.

[0059] For example, in this embodiment, participation Figure 1 、 Figure 2 and Figure 5 As shown, the testing device 100 further includes a slide rail 170 and a second drive member 180. The slide rail 170 is disposed on the machine platform 110 and extends between the loading position 111 and the testing position 112. The carrier plate 120 is slidably disposed on the slide rail 170 and is in transmission connection with the second drive member 180. The second drive member 180 outputs power to drive the carrier plate 120 to reciprocate between the loading position 111 and the testing position 112 on the slide rail 170.

[0060] The technical features of the above-mentioned embodiments can be combined arbitrarily. In order to make the description concise, not all possible combinations of the technical features in the above-mentioned embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0061] The above-described embodiments merely represent several implementation methods of the present application. While the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the patent application. It should be noted that a person of ordinary skill in the art may make various modifications and improvements without departing from the spirit of the present application, and these modifications and improvements fall within the scope of protection of the present application. Therefore, the scope of protection of the present patent application shall be determined by the appended claims.

Claims

1. A testing device, characterized in that, The test device includes: A machine platform; A carrier board, which is arranged on the machine platform and has a carrying position for carrying the product to be tested; A crimping module, which is movably arranged on the machine platform and can move in a direction approaching or departing from the carrying position; A test module, which is arranged on the machine platform. The test module includes a plurality of probe modules. When the crimping module crimps the product to be tested, any one of the probe modules can abut against the test point of the product to be tested and form a test circuit.

2. The test device according to claim 1, characterized in that, The test module further includes a fixing base, which is detachably arranged on the machine platform; A plurality of the probe modules are arranged at intervals on the fixing base, and the interval distance between two adjacent probe modules is 0.3 mm to 0.6 mm.

3. The testing device according to claim 2, characterized in that, The probe module includes a probe base, a test board and a probe group. The probe base is arranged on the fixing base. The probe group is floatingly arranged on the probe base and is electrically connected to the test board. When the crimping module crimps the product to be tested, the probe group can abut against the test point of the product to be tested and form a test circuit.

4. The testing device according to claim 3, wherein The probe module further includes a floating block, a pressing cover and a tail cover. The floating block is arranged on the probe base, and an elastic member is arranged between the floating block and the probe base. The probe group is arranged on the floating block. The pressing cover and the tail cover are respectively arranged on opposite sides of the probe base, and the pressing cover presses on the floating block. The tail cover can be inserted movably by the probe group.

5. The test device according to claim 4, wherein The tail cover protrudes with a plurality of positioning pins, and the test board has a plurality of positioning holes. The plurality of positioning holes can be correspondingly matched with the plurality of positioning pins.

6. The test device according to claim 2, wherein, There are three probe modules. When the crimping module crimps the product to be tested, all three probe modules abut against the test points of the product to be tested and form a test circuit.

7. The test device according to claim 1, characterized in that, The test device further includes a code scanning module, which is movably arranged on the machine platform and is used for scanning the product information of the product to be tested.

8. The test device according to claim 7, characterized in that, The test device further includes a mounting rack, which is arranged on the machine platform. The code scanning module is movably arranged on the mounting rack. The code scanning module can move in a first direction, a second direction and a third direction on the mounting rack and can rotate relative to the mounting rack; Wherein, the first direction, the second direction and the third direction are perpendicular to each other in pairs.

9. The test device according to claim 8, wherein The mounting rack includes a first fixing plate, a second fixing plate and a third fixing plate; The first fixing plate is provided with a plurality of arc-shaped holes. The code scanning module is connected to the arc-shaped holes through a first connecting member, and the first connecting member can move in the arc-shaped holes; The second fixing plate is provided with a plurality of first waist-shaped holes. The first fixing plate is connected to the first waist-shaped holes through a second connecting member, and the second connecting member can move in the first waist-shaped holes in the first direction or the second direction; The third fixing plate is arranged on the machine platform and is provided with a plurality of second waist-shaped holes. The second fixing plate is connected to the second waist-shaped holes through a third connecting member, and the third connecting member can move in the second waist-shaped holes in the third direction.

10. The test device according to claim 1, wherein, The machine platform has a loading position and a testing position. The carrier board is arranged on the machine platform and can move between the loading position and the testing position.

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