Double-sided photoluminescence imaging detection device and system

Abstract

The utility model relates to a solar cell photoluminescence imaging detection device, in particular to a double-sided photoluminescence imaging detection device and a double-sided photoluminescence imaging detection system. The detection device comprises a slide glass mechanism used for bearing a to-be-detected laminated solar cell, and the bottom of the slide glass mechanism is provided with a light-transmitting area; the first detection unit and the second detection unit are respectively arranged at two horizontal positions with different heights and are suitable for simultaneously detecting the laminated solar cells from the upper side and the lower side of the slide glass mechanism respectively; the first detection unit comprises a first light source and a first detector, and the first light source and the first detector are both arranged above the slide glass mechanism; and the second detection unit comprises a second light source and a second detector, and the second light source and the second detector are both arranged below the slide glass mechanism. The detection device and the detection system can perform optical detection on the top cell on the top surface and the bottom cell on the bottom surface of the laminated solar cell at the same time, and the width of a test band gap is large.

Description

Technical Field

[0001] The utility model relates to a solar cell detection device, in particular to a double-sided photoluminescence imaging detection device and a detection system using the device. Background Art

[0002] Tandem solar cells have attracted widespread attention due to their higher energy conversion efficiency and lower manufacturing cost.

[0003] Photoluminescence imaging technology has been widely used in single-junction cell inspection, providing important support for the detection of good quality single-junction cells. However, with the rapid development of stacked solar cells, detection methods face a series of challenges, including the compatibility of traditional detection methods with stacked cell devices and the quality inspection standards for multi-layer thin films of stacked devices. Taking the existing crystalline silicon photoluminescence imaging system as an example, a surface light source with a wavelength of 850nm is used to illuminate the upper surface of the crystalline silicon. Combined with a CCD (Charge-coupled Device) infrared sensing imaging system, the luminescence intensity near 1150nm is tested to obtain the crystallization, defect, and composite characteristics of all positions on the entire silicon wafer.

[0004] Existing detection equipment only inputs light from a single side. Due to the limitation of the light source test wavelength range, the band gap width that can be tested by single-sided light input is relatively limited, and the crystallization performance of the back semiconductor cannot be clearly and effectively tested during the test process. Utility Model Content

[0005] In view of this, the present invention provides a double-sided photoluminescence imaging detection system to solve the problem that the current solar cell photoluminescence imaging detection device has a limited band gap width when testing light from a single side and cannot test the crystallization performance of the back semiconductor.

[0006] The utility model provides a double-sided photoluminescence imaging detection device, which is used for detecting stacked solar cells, comprising: a carrier mechanism for carrying the stacked solar cell to be detected, and a light-transmitting area is provided at the bottom of the carrier mechanism; a first detection unit and a second detection unit, which are respectively arranged at two horizontal positions of different heights and are suitable for simultaneously detecting the stacked solar cell from the upper and lower sides of the carrier mechanism; the first detection unit comprises a first light source and a first detector, and the first light source and the first detector are both arranged above the carrier mechanism; the second detection unit comprises a second light source and a second detector, and the second light source and the second detector are both arranged below the carrier mechanism.

[0007] Optionally, the first light source is a top excitation light source, configured to illuminate the top cell on the top surface of the tandem solar cell with top excitation light, thereby exciting valence band electrons in the top cell to generate first excitation light; the top excitation light has a wavelength range of 300nm to 700nm. The second light source is a bottom excitation light source, configured to illuminate the bottom cell on the bottom surface of the tandem solar cell with bottom excitation light, thereby exciting valence band electrons in the bottom cell to generate second excitation light; the bottom excitation light has a wavelength range of 850nm to 1100nm.

[0008] Optionally, the first detector is a top cell imaging system, configured to perform a first optical detection of the first excitation light; the top cell imaging system can detect light with a wavelength range of 200 nm to 800 nm. The second detector is a bottom cell imaging system, configured to perform a second optical detection of the second excitation light; the bottom cell imaging system can detect light with a wavelength range of 800 nm to 1200 nm.

[0009] Optionally, the first detection unit and the second detection unit are respectively connected by a support frame, and the support frame extends from the carrier mechanism to the top and bottom of the carrier mechanism. The first detection unit is arranged at the part of the support frame located above the carrier mechanism, and the second detection unit is arranged at the part of the support frame located below the carrier mechanism.

[0010] Optionally, the double-sided photoluminescence imaging detection device also includes: a first adjustment device, which is arranged on the support frame, connected to the first light source, and suitable for adjusting the illumination angle of the first light source; a second adjustment device, which is arranged on the support frame, connected to the second light source, and suitable for adjusting the illumination angle of the first light source.

[0011] Optionally, the double-sided photoluminescence imaging detection device also includes: a third adjustment device, which is arranged on the support frame, connected to the first detector, and is suitable for adjusting the position and imaging angle of the first detector; a fourth adjustment device, which is arranged on the support frame, connected to the second detector, and is suitable for adjusting the position and imaging angle of the second detector.

[0012] Optionally, the double-sided photoluminescence imaging detection device also includes a processor, and the first detector and the second detector are both communicatively connected to the processor; the processor is used to receive the detection data of the first optical detection and the detection data obtained by the second optical detection, and to process the detection data of the first optical detection and the detection data of the second optical detection.

[0013] The present invention also provides a double-sided photoluminescence imaging detection system, comprising the above-mentioned double-sided photoluminescence imaging detection device; and further comprising: a cell conveying mechanism; the cell conveying mechanism is used to carry and transport the stacked solar cells to be inspected, and a light-transmitting area is provided at the bottom of the cell conveying mechanism; the cell conveying mechanism serves as a carrier mechanism of the double-sided photoluminescence imaging detection device.

[0014] Optionally, the stacked solar cell includes a top cell and a bottom cell, the top cell includes one of a wide bandgap perovskite solar cell, a polymer solar cell, a wide bandgap copper indium gallium selenide solar cell and a wide bandgap organic solar cell; the stacked solar cell includes a bottom cell, the bottom cell includes one of a narrow bandgap perovskite solar cell, a crystalline silicon solar cell, a copper indium gallium selenide solar cell and an organic solar cell.

[0015] Optionally, the cell conveying mechanism includes: a first conveyor belt and a second conveyor belt; the first conveyor belt and the second conveyor belt are arranged at intervals and in parallel; the first conveyor belt and the second conveyor belt are suitable for supporting the edge areas on opposite sides of the stacked solar cells when conveying the stacked solar cells to be inspected, so that the stacked solar cells are mounted on the cell conveying mechanism and move along the conveying direction; it also includes a plurality of first gaskets and a plurality of second gaskets; the first gaskets are arranged on the first conveyor belt at intervals, and the second gaskets are arranged on the second conveyor belt at intervals, and the positions of the first gaskets and the second gaskets are arranged in a one-to-one correspondence; the first gasket is a resin material or a plastic material; the second gasket is a resin material or a plastic material.

[0016] The beneficial effects of the present invention are:

[0017] The present invention's dual-sided photoluminescence imaging inspection device features a first detection unit and a second detection unit at different heights, each comprising a first light source, a first detector, and a second light source. A light-transmitting area is provided at the bottom of the wafer carrier mechanism, allowing the first and second detectors to simultaneously perform optical inspections on both sides of a tandem solar cell, reducing inspection time and improving mass production efficiency. By introducing the first and second detection units at different heights during the transport of the tandem solar cell, the film quality of the top and bottom cells can be non-destructively inspected. The first and second light sources at the top and bottom sides emit light of different wavelengths, simultaneously exciting valence band electrons in semiconductors with different band gaps in the top and bottom cells. The resulting composite luminescence properties are then used to inspect the crystallization quality of each region, broadening the band gap width of the inspectable cells and making them suitable for solar cells with wider band gaps. Furthermore, since the top and bottom cells emit photons from the top and bottom sides, respectively, mutual interference between the semiconductors is minimized, providing important and reliable inspection for tandem solar cells, reducing inspection time and improving mass production efficiency.

[0018] The double-sided photoluminescence imaging detection system provided by the utility model uses the double-sided photoluminescence imaging detection device provided by the utility model, is compatible with the existing solar cell production process, uses a conveyor device to transport the stacked solar cell sheets to the light source coverage area, uses excitation light of different bands to illuminate the top cell and the bottom cell, and synchronously detects the top cell on the top surface and the bottom cell on the bottom surface of the stacked solar cell in real time, further determines the defect properties of the surface film of the stacked solar cell, and conveniently and quickly realizes high-quality production of the stacked solar cell on the production line. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] In order to more clearly illustrate the specific implementation methods of the utility model or the technical solutions in the prior art, the drawings required for use in the specific implementation methods or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are some implementation methods of the utility model. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0020] Figure 1 This is a schematic structural diagram of a double-sided photoluminescence imaging detection device according to an embodiment of the present utility model during detection;

[0021] Figure 2 This is a schematic structural diagram of a battery cell conveying mechanism according to an embodiment of the present invention;

[0022] Figure 3 This is a schematic structural diagram of a stacked solar cell according to an embodiment of the present invention;

[0023] Reference numerals:

[0024] Tandem solar cell 1, top cell 101, bottom cell 102,

[0025] Cell conveying mechanism 2, first conveyor belt 21, second conveyor belt 22, first bracket 23, second bracket 24,

[0026] A first light source 3 , a first detector 4 , a second light source 5 , a second detector 6 , and a processor 7 . DETAILED DESCRIPTION

[0027] Taking the current crystalline silicon photoluminescence imaging system as an example, a surface light source with a wavelength of 850nm is used to illuminate the upper surface of the crystalline silicon. Combined with a CCD (Charge-coupled Device) infrared sensing imaging system, the luminescence intensity near 1150nm is tested to obtain the crystallization, defect, and composite characteristics of all positions on the entire silicon wafer. However, due to the limitations of the light source test wavelength range, the current equipment can only test semiconductor samples with a bandgap width less than 1.46eV and cannot test solar cells with a wider bandgap. Moreover, the current equipment only receives light from a single side, making it impossible to clearly and effectively test the crystallization performance of the semiconductor on the back during the test process.

[0028] Based on this, the utility model provides a double-sided photoluminescence imaging detection device and a double-sided photoluminescence imaging detection system.

[0029] To make the purpose, technical solutions, and advantages of the embodiments of the present invention more clear, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the embodiments described are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without making creative efforts shall fall within the scope of protection of the present invention.

[0030] Example 1

[0031] like Figure 1 As shown, this embodiment provides a double-sided photoluminescence imaging detection system for detecting stacked solar cells, including:

[0032] The wafer carrier mechanism is used for carrying the laminated solar cell 1 to be tested, and a light-transmitting area is provided at the bottom of the wafer carrier mechanism.

[0033] The first detection unit and the second detection unit are respectively arranged at two horizontal positions of different heights, and are suitable for simultaneously detecting the stacked solar cell 1 from the upper and lower sides of the wafer carrier mechanism.

[0034] The first detection unit includes a first light source 3 and a first detector 4, both of which are disposed above the film carrier. The first light source 3 is used to illuminate the top cell on the top surface of the tandem solar cell 1, and the first detector 4 is used to perform a first optical detection on the top cell on the top surface.

[0035] In this embodiment, the first light source 3 and the first detector 4 can be installed at a designated position for detection using, but not limited to, a bracket according to actual use; the top cell on the top surface is subjected to a first optical inspection to detect the defect properties of the thin film of the top cell of the stacked solar cell 1.

[0036] The second light source 5 and the second detector 6 are both arranged below the film carrier mechanism. The second light source 5 is used to illuminate the bottom cell of the bottom surface of the stacked solar cell 1, and the second detector 6 is used to perform a second optical inspection on the bottom cell of the bottom surface.

[0037] The second light source 5 and the second detector 6 in this embodiment can be installed at a designated position for detection using, but not limited to, a bracket according to actual use; the bottom cell on the bottom surface is subjected to a second optical inspection to detect the defect properties of the thin film of the bottom cell of the stacked solar cell 1.

[0038] The present invention addresses the problem of solar cell luminescence imaging testing devices being limited to single-side light input testing. The device utilizes first and second detection units positioned at different heights, each comprising a first light source 3, a first detector 4, a second light source 5, and a second detector 6. The first and second detectors 4 and 6 can simultaneously perform optical testing on both sides of a tandem solar cell 1, reducing the time required for testing the tandem solar cell 1 and improving its mass production efficiency. By introducing the first and second detection units at different heights during the transport of the tandem solar cell, the film quality of the top and bottom cells can be non-destructively tested. Furthermore, the first and second light sources 3 and 5 on the upper and lower sides emit light of different wavelengths, simultaneously exciting the valence band electrons of the different bandgap semiconductors in the top and bottom cells. The resulting composite luminescence properties are then used to test the crystallization quality of each region, thereby broadening the bandgap width of the testable cells and making them suitable for solar cells with wider bandgap widths. Furthermore, since the top and bottom cells emit photons from the upper and lower sides, respectively, mutual interference between the semiconductors is minimized, providing important and reliable testing for tandem solar cells, reducing the time required for testing the tandem solar cell and improving their mass production efficiency.

[0039] The processor 7 is connected to the first detector 4 and the second detector 6, and efficiently and synchronously receives the detection data of the optical detection of the stacked solar cell 1 by the two detectors, and judges the defect properties of the stacked solar cell 1 such as thin film pinholes, hidden cracks, dirtiness, etc. based on the detection results. By performing quality inspection on the stacked solar cells, the production line can quickly and conveniently achieve high-quality production of the stacked solar cells.

[0040] In this embodiment, the first light source 3 is a top excitation light source, which is used to irradiate the top cell on the top surface of the stacked solar cell 1 with top excitation light, so that the valence band electrons in the top cell on the top surface are excited to generate the first excitation light.

[0041] The wavelength range of top excitation emission is 300nm to 700nm.

[0042] The first light source 3 irradiates the top-excited light from top to bottom onto the top cell on the top surface of the stacked solar cell 1 . By setting a specific wavelength range of the top-excited light, the top-excited light can be fully absorbed.

[0043] In this embodiment, the second light source is a bottom excitation light source, which is used to illuminate the bottom cell on the bottom surface of the stacked solar cell with bottom excitation light, so that the valence band electrons in the bottom cell on the bottom surface are excited to generate second excitation light.

[0044] The wavelength range of bottom excitation light is 850nm~1100nm.

[0045] The second light source 5 irradiates the bottom-excited light from bottom to top onto the bottom cell on the bottom surface of the stacked solar cell 1 . By setting a specific wavelength range of the bottom-excited light, the bottom-excited light can be fully absorbed.

[0046] In this embodiment, the first detector is a top cell CCD imaging system, which is used to perform a first optical detection on the first excitation light.

[0047] The top cell CCD imaging system can detect light wavelengths ranging from 200nm to 800nm.

[0048] refer to Figure 3 The results of the optical detection of the top cell and the surface of the top cell 101 by the top cell CCD imaging system reflect the thin film properties of the top cell 101 of the stacked solar cell 1; at the same time, the arrangement of the first detector 4 avoids mutual interference between the top cell 101 and the bottom cell 102, making the detection results accurate and reliable.

[0049] In this embodiment, the second detector 6 is a bottom cell CCD imaging system, which is used to perform a second optical detection on the second excitation light.

[0050] The bottom cell CCD imaging system can detect light wavelengths in the range of 800nm to 1200nm.

[0051] The results of the optical detection of the bottom cell on the bottom surface by the bottom cell CCD imaging system reflect the thin film properties of the bottom cell 102 on the bottom surface of the stacked solar cell 1; at the same time, the arrangement of the second detector 6 avoids mutual interference between the top cell 101 part on the top surface and the bottom cell 102 part on the bottom surface, making the detection results accurate and reliable.

[0052] The double-sided photoluminescence imaging detection device also includes a support frame. The first detection unit and the second detection unit are connected by a support frame, respectively. The support frame extends from the film loading mechanism to above and below the film loading mechanism. The first detection unit is disposed in the portion of the support frame located above the film loading mechanism, and the second detection unit is disposed in the portion of the support frame located below the film loading mechanism (not shown).

[0053] Also includes:

[0054] a first adjustment device (not shown), disposed on the support frame and connected to the first light source, adapted to adjust the illumination angle of the first light source;

[0055] The first adjustment device is used to adjust the irradiation angle of the first light source so that the top excitation light can irradiate the top battery at an appropriate angle to generate excitation light.

[0056] The second adjusting device (not shown in the figure) is provided on the supporting frame, connected to the second light source, and is suitable for adjusting the irradiation angle of the first light source.

[0057] The second adjusting device is used to adjust the irradiation angle of the second light source so that the bottom excitation light can irradiate the bottom cell at an appropriate angle to generate excitation light.

[0058] The first adjusting device and the second adjusting device may be, for example, a gear set, a spherical joint or the like.

[0059] Also includes:

[0060] a third adjusting device (not shown), provided on the support frame and connected to the first detector, adapted to adjust the position and imaging angle of the first detector;

[0061] The third adjustment device adjusts the position and imaging angle of the first detector to ensure accurate imaging results.

[0062] A fourth adjusting device (not shown in the figure) is provided on the supporting frame and connected to the second detector, and is suitable for adjusting the position and imaging angle of the second detector.

[0063] The fourth adjusting device adjusts the position and imaging angle of the second detector to ensure accurate imaging results.

[0064] The third adjusting device and the fourth adjusting device may be, for example, a combination structure including a slide rail, a telescopic rod, a gear set, a spherical joint, etc.

[0065] In this embodiment, the double-sided photoluminescence imaging detection system also includes a processor 7, and the first detector 4 and the second detector 6 are both connected to the processor 7. The processor 7 is used to process the detection data of the first optical detection and the detection data of the second optical detection based on the detection results of the first optical detection and the detection data of the second optical detection.

[0066] Example 2

[0067] This embodiment provides a double-sided photoluminescence imaging detection system, including the double-sided photoluminescence imaging detection device provided in the above-mentioned embodiment 1.

[0068] like Figure 2 As shown, it also includes: a cell conveying mechanism 2; the cell conveying mechanism 2 is used to carry and transport the stacked solar cell 1 to be inspected, and a light-transmitting area is provided at the bottom of the cell conveying mechanism; the cell conveying mechanism serves as a carrier mechanism of the double-sided photoluminescence imaging detection device.

[0069] Specifically, in this embodiment, the cell conveying mechanism 2 includes a first conveyor belt 21 and a second conveyor belt 22. The first conveyor belt 21 and the second conveyor belt 22 are spaced apart and arranged in parallel. The cell conveying mechanism 2 serves as a carrier mechanism of the double-sided photoluminescence imaging detection device.

[0070] The first conveyor belt 21 and the second conveyor belt 22 are adapted to support the edge regions of the stacked solar cell 1 on opposite sides while conveying the stacked solar cell 1 to be inspected, allowing the stacked solar cell 1 to be mounted on the cell conveyor mechanism 2 and moved along the conveying direction. The space between the first conveyor belt 21 and the second conveyor belt 22 constitutes the light-transmitting region.

[0071] The structure of the cell conveying mechanism 2 in this embodiment is set up, and the first conveyor belt 21 and the second conveyor belt 22 are fixed by the first bracket 23 and the second bracket 24, and the stacked solar cell 1 is mounted on the first conveyor belt 21 and the second conveyor belt 22. Since the utility model has two sets of light sources and detectors in relative positions, the stacked solar cell 1 is conveyed to the double-sided photoluminescence imaging detection system for double-sided photoluminescence imaging detection along with the conveyor belt.

[0072] Based on the structure of the cell conveying mechanism 2, since the stacked solar cell 1 is mounted on the first conveyor belt 21 and the second conveyor belt 22, the first conveyor belt 21 and the second conveyor belt 22 contact the edge areas on both sides of the stacked solar cell 1, and there is a space between the two conveyor belts, the structure of the cell conveying mechanism 2 will not block the bottom cell on the bottom surface of the stacked solar cell 1. The second light source 5 and the second detector 6 can directly irradiate and detect the bottom cell on the bottom surface of the stacked solar cell 1, thereby further realizing double-sided photoluminescence imaging detection.

[0073] Combine Figure 1 and Figure 3 The tandem solar cell in this embodiment includes a top cell 101, which includes a wide-bandgap perovskite solar cell, a polymer solar cell, a wide-bandgap copper indium gallium selenide solar cell, and a wide-bandgap organic solar cell. A wide-bandgap refers to a bandgap width of 2 eV or greater.

[0074] The top cell 101 made of the above materials can well absorb and convert short-wavelength sunlight, while also well transmitting long-wavelength sunlight for the bottom cell 102 to absorb and utilize.

[0075] In this embodiment, the stacked solar cell includes a bottom cell 102 , and the bottom cell 102 includes a narrow-bandgap perovskite solar cell, a crystalline silicon solar cell, a copper indium gallium selenide solar cell, and an organic solar cell.

[0076] The bottom cell 102 made of the above materials has excellent near-infrared absorption and utilization characteristics and can more fully utilize sunlight.

[0077] The double-sided photoluminescence imaging detection system provided by the utility model is compatible with the existing solar cell production process. A conveying device is used to transport the stacked solar cell to the light source coverage area. A first light source is used to illuminate the top cell on the top surface of the stacked solar cell, and a second light source is used to illuminate the bottom cell on the bottom surface of the stacked solar cell. The valence band electrons in the top cell below the top cell on the top surface and the bottom cell above the bottom cell on the bottom surface are excited by excitation light of different wavelengths, and composite light is formed in the top cell on the top surface and the bottom cell on the bottom surface respectively. The two composite lights are detected by the first detector and the second detector. Through processor analysis and processing, the defect properties of the thin film on the surface of the stacked solar cell are further determined, and the crystallization film quality of the thin film on the surface of the stacked solar cell is obtained, so as to conveniently and quickly realize high-quality production of stacked solar cells on the production line.

[0078] Furthermore, in this embodiment, the cell conveying mechanism 2 also includes: a first bracket 23 and a second bracket 24; the first bracket 23 is arranged between the first conveyor belt 21 and the second conveyor belt 22 at one end in the same direction, and the second bracket 24 is arranged between the first conveyor belt 21 and the second conveyor belt 22 at the other end in the same direction; the first conveyor belt 21 and the second conveyor belt 22 are suitable for conveying the stacked solar cells 1 to be inspected, and the first bracket 23 and the second bracket 24 are both used to connect and fix the first conveyor belt 21 and the second conveyor belt 22.

[0079] In some other embodiments, the first conveyor belt 21 and the second conveyor belt 22 may be connected and supported by other means, which are not listed in detail here.

[0080] In addition, in some embodiments, the double-sided photoluminescence imaging inspection system provided in this embodiment further includes a plurality of first gaskets and a plurality of second gaskets (not shown); the first gaskets are spaced apart on the first conveyor belt, and the second gaskets are spaced apart on the second conveyor belt, with the first gaskets and the second gaskets being positioned in a one-to-one correspondence; the first gaskets are made of resin or plastic material; and the second gaskets are made of resin or plastic material. The provision of the first and second gaskets provides a contact buffer and increases friction between the conveyor belt and the stacked solar cells to be inspected, thereby reducing the risk of breakage or falling during loading and unloading.

[0081] In the description of this specification, the description with reference to the terms "this embodiment", "one embodiment", "some embodiments", "example", "specific example", or "some examples" means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present utility model. In this specification, the schematic expressions of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described can be combined in any one or more embodiments or examples in a suitable manner. In addition, those skilled in the art can combine and combine different embodiments or examples described in this specification and the features of different embodiments or examples without contradiction.

[0082] Although the embodiments of the present invention have been described with reference to the accompanying drawings, those skilled in the art may make various modifications and variations without departing from the spirit and scope of the present invention, and such modifications and variations shall fall within the scope defined by the appended claims.

Claims

1. A double-sided photoluminescence imaging detection device, used for detecting stacked solar cells, characterized in that: include: A wafer carrier mechanism, used for carrying the laminated solar cell to be tested, wherein a light-transmitting area is provided at the bottom of the wafer carrier mechanism; The first detection unit and the second detection unit are respectively arranged at two horizontal positions of different heights, and are suitable for simultaneously detecting the stacked solar cell from the upper and lower sides of the carrier mechanism respectively; The first detection unit includes a first light source and a first detector, and the first light source and the first detector are both arranged above the slide mechanism; The second detection unit includes a second light source and a second detector, and the second light source and the second detector are both arranged below the slide mechanism.

2. The double-sided photoluminescence imaging detection device according to claim 1, characterized in that: The first light source is a top excitation light source, which is used to irradiate the top cell on the top surface of the stacked solar cell with top excitation light, so that the valence band electrons in the top cell are excited to generate the first excitation light; The wavelength range of top excitation emission is 300nm~700nm; The second light source is a bottom excitation light source, which is used to illuminate the bottom cell on the bottom surface of the stacked solar cell with the bottom excitation light, so that the valence band electrons in the bottom cell are excited to generate the second excitation light; The wavelength range of bottom excitation light is 850nm~1100nm.

3. The double-sided photoluminescence imaging detection device according to claim 2, characterized in that: The first detector is a top cell imaging system for performing a first optical detection on the first excitation light; The top cell imaging system can detect light wavelengths in the range of 200nm to 800nm; The second detector is a bottom cell imaging system for performing a second optical detection on the second excitation light; The bottom cell imaging system can detect light within a wavelength range of 800 nm to 1200 nm.

4. The double-sided photoluminescence imaging detection device according to any one of claims 1 to 3, characterized in that: The first detection unit and the second detection unit are respectively connected by a support frame, and the support frame extends from the carrier mechanism to the top and bottom of the carrier mechanism. The first detection unit is arranged at the part of the support frame located above the carrier mechanism, and the second detection unit is arranged at the part of the support frame located below the carrier mechanism.

5. The double-sided photoluminescence imaging detection device according to claim 4, characterized in that: Also includes: a first adjustment device, disposed on the support frame, connected to the first light source, and adapted to adjust the illumination angle of the first light source; The second adjusting device is arranged on the supporting frame, connected to the second light source, and is suitable for adjusting the irradiation angle of the first light source.

6. The double-sided photoluminescence imaging detection device according to claim 5, characterized in that: Also includes: a third adjusting device, provided on the support frame, connected to the first detector, and adapted to adjust the position and imaging angle of the first detector; The fourth adjusting device is provided on the supporting frame, connected to the second detector, and is suitable for adjusting the position and imaging angle of the second detector.

7. The double-sided photoluminescence imaging detection device according to claim 3, characterized in that: It also includes a processor, and the first detector and the second detector are both communicatively connected to the processor; the processor is used to receive the detection data of the first optical detection and the detection data obtained by the second optical detection, and process the detection data of the first optical detection and the detection data of the second optical detection.

8. A double-sided photoluminescence imaging detection system, characterized in that: A double-sided photoluminescence imaging detection device comprising any one of claims 1 to 7; Also includes: Cell conveying mechanism; the cell conveying mechanism is used to carry and transport the stacked solar cells to be tested, and a light-transmitting area is provided at the bottom of the cell conveying mechanism; the cell conveying mechanism serves as a carrier mechanism of the double-sided photoluminescence imaging detection device.

9. The double-sided photoluminescence imaging detection system according to claim 8, characterized in that: The stacked solar cell includes a top cell and a bottom cell; the top cell includes one of a wide-bandgap perovskite solar cell, a polymer solar cell, a wide-bandgap copper indium gallium selenide solar cell and a wide-bandgap organic solar cell; the bottom cell includes one of a narrow-bandgap perovskite solar cell, a crystalline silicon solar cell, a copper indium gallium selenide solar cell and an organic solar cell.

10. The double-sided photoluminescence imaging detection system according to claim 8, characterized in that: The battery cell conveying mechanism includes: a first conveyor belt and a second conveyor belt, wherein the first conveyor belt and the second conveyor belt are spaced apart and arranged in parallel, and the first conveyor belt and the second conveyor belt are suitable for conveying stacked solar cells to be inspected; The first conveyor belt and the second conveyor belt are adapted to respectively support edge regions on opposite sides of the stacked solar cell when conveying the stacked solar cell to be inspected, so that the stacked solar cell is mounted on the cell conveying mechanism and moves along the conveying direction; the space between the first conveyor belt and the second conveyor belt constitutes the light-transmitting region; Also included are a plurality of first gaskets and a plurality of second gaskets; The first gaskets are arranged on the first conveyor belt at intervals, and the second gaskets are arranged on the second conveyor belt at intervals, and the first gaskets and the second gaskets are arranged in a one-to-one correspondence; The first gasket is made of resin material or plastic material; The second gasket is made of resin material or plastic material.

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