Camera module test fixture

By designing a camera module test fixture with a double-row probe structure and a floating spring, the problem of unstable probe contact is solved, and the proportion of electrical poor performance is significantly reduced, which improves the accuracy and reliability of the test.

CN223207173UActive Publication Date: 2025-08-08JIANGXI LIANYI OPTICS CO LTD
View PDF 0 Cites 0 Cited by

Patent Information

Application Number
CN202421934149.2
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-08-12
Publication Date
2025-08-08
Estimated Expiration
2034-08-12

AI Technical Summary

Technical Problem

In the prior art, the contact conduction of the probe and the product gold finger & connector is unstable, resulting in a proportion of electrical poor performance during the test of the camera module.

Method used

A camera module test fixture is designed, adopting a double-row probe structure, with a module mount and a limiting plate between the base and the cover plate. The probe is floating and set through the connector and the probe mount, combining the floating spring and limiting spring to ensure stable contact between the probe and the camera module.

Benefits of technology

Through the double-row probe structure, the proportion of electrical poor performance is reduced to less than 2%, improving the accuracy and reliability of the test.

✦ Generated by Eureka AI based on patent content.

Smart Images

  • Figure CN223207173U_ABST
    Figure CN223207173U_ABST
Patent Text Reader

Abstract

The utility model provides a camera module test fixture, which comprises a circuit board, a base, a cover plate, a first probe and a second probe, and is characterized in that the base is fixedly arranged on the upper surface of the circuit board and is used for bearing a camera module to be tested; the cover plate is arranged above the base and is used for clamping a to-be-tested camera module arranged on the base, the lower ends of the first probe and the second probe are electrically connected with the circuit board, and the upper ends of the first probe and the second probe penetrate through the base and are electrically connected with the to-be-tested camera module. A height difference exists between the first probe and the second probe in the direction perpendicular to the upper surface of the circuit board. According to the utility model, the structure is compact and reliable, product testing is carried out by arranging the double rows of probes, and the electrical property undesirable ratio can be reduced from 5% to within 2%.
Need to check novelty before this filing date? Find Prior Art

Description

Technical Field

[0001] The utility model relates to the technical field of test fixtures, in particular to a camera module test fixture. Background Art

[0002] Due to unstable contact and conductivity between the probe and the product's gold fingers and connectors, the electrical failure rate of the single-row probe contacting the gold fingers and connector product module is 5%, affecting the use of the product. Utility Model Content

[0003] In view of the above problems, the purpose of the present invention is to provide a camera module testing fixture that can improve electrical conductivity.

[0004] In order to achieve the above purpose, the technical solution adopted by the utility model is:

[0005] The utility model provides a camera module test fixture, including a circuit board, a base, a cover, a first probe and a second probe, wherein the base is fixedly arranged on the upper surface of the circuit board, the base is used to carry the camera module to be tested, the cover is arranged above the base and is used to clamp the camera module to be tested arranged on the base, the lower ends of the first probe and the second probe are both electrically connected to the circuit board, the upper ends of the first probe and the second probe are both electrically connected to the camera module to be tested through the base, and there is a height difference between the first probe and the second probe in a direction perpendicular to the upper surface of the circuit board.

[0006] Further preferably, a module mounting seat and a module limiting plate are provided between the base and the cover plate, the module mounting seat is fixed on the base, the module mounting seat is used to place the camera module to be tested, and the module limiting plate is used to fix the camera module to be tested set on the module mounting seat.

[0007] Further preferably, it also includes a connector mounting seat and a probe mounting seat, the connector mounting seat is floatingly set on the probe mounting seat, the lower end of the probe mounting seat is set on the circuit board, and the first probe and the second probe pass through the probe mounting seat and the connector mounting seat in sequence.

[0008] Further preferably, a floating spring is further included, wherein the floating spring is arranged between the connector mounting seat and the probe mounting seat, and the floating spring is used to float the connector mounting seat on the probe mounting seat.

[0009] Further preferably, a connector limiting plate is further included, and the connector limiting plate is used to clamp the connector of the camera module to be tested which is arranged on the connector mounting seat.

[0010] Further preferably, a limit spring is included, a spring mounting hole is opened on the module limit plate, the limit spring is partially fixed in the spring mounting hole, and the limit spring is used to press the module limit plate against the module mounting seat.

[0011] Further preferably, the module mounting seat is provided with a module accommodating groove and a first vacuum hole which are connected to each other, and the module accommodating groove is used to accommodate the camera module to be tested.

[0012] Further preferably, a second vacuum hole and a mounting hole passing through the base are provided on the base, the second vacuum hole is connected to the first vacuum hole, and the connector mounting seat and the probe mounting seat are arranged in the mounting hole.

[0013] Further preferably, the first probe and the second probe both include a first connecting part, a main part and a second connecting part connected in sequence, the outermost side of the first connecting part is used to electrically connect to the camera module to be tested, the second connecting part is electrically connected to the circuit board, and the outermost side of the first connecting part is a curved surface structure.

[0014] Further preferably, both the first connecting portion and the second connecting portion are telescopically connected to the main body.

[0015] Compared with the prior art, the beneficial effects of the present invention are:

[0016] The utility model has a compact and reliable structure and can reduce the electrical defect ratio of 5% to less than 2% by arranging double-row probes for product testing. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] The above and / or additional aspects and advantages of the present invention will become apparent and readily understood from the description of the embodiments in conjunction with the following drawings, in which:

[0018] Figure 1 It is a structural diagram of the utility model;

[0019] Figure 2 It is a cross-sectional view of the utility model;

[0020] Figure 3 It is a partial schematic diagram of the utility model;

[0021] Figure 4 This is a structural diagram of the module limiting plate and module mounting seat in the utility model;

[0022] Figure 5 This is a schematic structural diagram of the base in the present utility model;

[0023] Figure 6 Schematic diagram of the structure of the probe in this utility model;

[0024] Illustration: 1-cover plate, 2-connector limit plate, 3-camera module to be tested, 301-connector, 4-module mounting seat, 401-first vacuum hole, 402-module accommodating slot, 5-limiting spring, 6-module limit plate, 601-spring mounting hole, 7-base, 701-second vacuum hole, 702-mounting hole, 8-circuit board, 9-connector mounting seat, 10-first probe, 11-second probe, 12-floating spring, 13-probe mounting seat, 14-first connecting part, 15-main body, 16-second connecting part.

[0025] The following specific embodiments will further illustrate the present invention in conjunction with the above-mentioned drawings. DETAILED DESCRIPTION

[0026] To better understand the present invention, various aspects of the present invention will be described in more detail with reference to the accompanying drawings. It should be understood that these detailed descriptions are merely illustrations of embodiments of the present invention and are not intended to limit the scope of the present invention in any way. Throughout this specification, like reference numerals refer to like elements. The expression "and / or" includes any and all combinations of one or more of the associated listed items.

[0027] Those skilled in the art should understand that, in the disclosure of the present invention, the terms "longitudinal", "transverse", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside" and the like indicating the orientation or position relationship are based on the orientation or position relationship shown in the accompanying drawings, which are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation. Therefore, the above terms cannot be understood as limiting the present invention.

[0028] It should also be understood that the terms "comprises," "including," "having," "includes," and / or "comprising," when used in this specification, indicate the presence of the stated features, elements, and / or components, but do not preclude the presence or addition of one or more other features, elements, components, and / or combinations thereof. In addition, when expressions such as "at least one of..." appear after a list of listed features, they modify the entire list of features rather than modifying the individual elements in the list. In addition, when describing embodiments of the present invention, "may" is used to mean "one or more embodiments of the present invention." Furthermore, the term "exemplary" is intended to refer to an example or illustration.

[0029] Unless otherwise defined, all terms used herein (including technical and scientific terms) have the same meaning as commonly understood by those skilled in the art to which the present invention pertains. It should also be understood that terms (such as those defined in commonly used dictionaries) should be interpreted as having a meaning consistent with their meaning in the context of the relevant technology and will not be interpreted in an idealized or overly formal sense unless explicitly defined herein.

[0030] It should be noted that, in the absence of conflict, the embodiments and features of the embodiments of the present invention can be combined with each other. The present invention will be described in detail below with reference to the accompanying drawings and in combination with the embodiments.

[0031] The present invention provides a camera module test fixture, comprising a circuit board 8, a base 7, a cover 1, a first probe 10 and a second probe 11. The base 7 is fixedly arranged on the upper surface of the circuit board 8, and the base 7 is used to carry the camera module 3 to be tested. The cover 1 is arranged above the base 7 and is used to clamp the camera module 3 to be tested arranged on the base 7. The lower ends of the first probe 10 and the second probe 11 are both electrically connected to the circuit board 8, and the upper ends of the first probe 10 and the second probe 11 are both electrically connected to the camera module 3 to be tested through the base 7. There is a height difference between the first probe 10 and the second probe 11 in the direction perpendicular to the upper surface of the circuit board 8, which effectively improves the test accuracy. The present invention has a compact and reliable structure. By setting a double row of probes for product testing, the electrical defect ratio of 5% can be reduced to less than 2%.

[0032] In order to facilitate the installation and positioning of the camera module 3 to be tested, a module mounting seat 4 and a module limiting plate 6 are provided between the base 7 and the cover plate 1. The module mounting seat 4 is fixed on the base 7. The module mounting seat 4 is used to place the camera module 3 to be tested, and the module limiting plate 6 is used to fix the camera module 3 to be tested set on the module mounting seat 4.

[0033] In order to facilitate the fixation of the connector 301 on the camera module 3 to be tested and the installation of the probe, the camera module test fixture also includes a connector mounting seat 9 and a probe mounting seat 13. The connector mounting seat 9 is floatingly set on the probe mounting seat 13. The lower end of the probe mounting seat 13 is set on the circuit board 8. The first probe 10 and the second probe 11 pass through the probe mounting seat 13 and the connector mounting seat 9 in sequence.

[0034] More specifically, the camera module test fixture also includes a floating spring 12 , which is arranged between the connector mounting seat 9 and the probe mounting seat 13 . The floating spring 12 is used to float the connector mounting seat 9 on the probe mounting seat 13 .

[0035] In order to make the connector 301 more securely fixed, the camera module test fixture also includes a connector limit plate 2, which is used to clamp the connector 301 of the camera module 3 to be tested, which is set on the connector mounting seat 9, so that the probe is in full contact with the gold finger on the connector 301.

[0036] More specifically, the camera module test fixture also includes a limit spring 5, a spring mounting hole 601 is opened on the module limit plate 6, and the limit spring 5 is partially fixed in the spring mounting hole 601. The limit spring 5 is used to press the module limit plate 6 against the module mounting seat 4.

[0037] More specifically, the module mounting seat 4 is provided with a module accommodating groove 402 and a first vacuum hole 401 which are connected to each other, and the module accommodating groove 402 is used to accommodate the camera module 3 to be tested.

[0038] More specifically, a second vacuum hole 701 and a mounting hole 702 passing through the base 7 are provided on the base 7, the connector mounting seat 9 and the probe mounting seat 13 are arranged in the mounting hole 702, and the second vacuum hole 701 and the first vacuum hole 401 are connected, so that an external vacuum generator can lock the camera module 3 to be tested tightly on the base 7 through the vacuum hole.

[0039] More specifically, the first probe 10 and the second probe 11 each include a first connecting portion 14, a main body 15, and a second connecting portion 16 connected in sequence. The outermost side of the first connecting portion 14 is used to electrically connect to the camera module 3 to be tested, and the second connecting portion 16 is electrically connected to the circuit board 8. The outermost side of the first connecting portion 14 is a curved surface structure. The first connecting portion 14 and the second connecting portion 16 can both be telescopically connected to the main body 15. The telescopic connection ensures that the first connecting portion 14 is tightly attached to the camera module 3 to be tested and that the second connecting portion 16 is tightly attached to the circuit board 8, thereby ensuring that the first connecting portion 14 and the second connecting portion 16 are stably electrically connected to the camera module 3 to be tested and the circuit board 8, thereby ensuring the accuracy of the test.

[0040] The above-described embodiments merely represent several implementation methods of the present invention. While the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the present invention. It should be noted that a person skilled in the art would be able to make various modifications and improvements without departing from the concept of the present invention, and these modifications and improvements fall within the scope of protection of the present invention. Therefore, the scope of protection of the present invention shall be determined by the appended claims.

Claims

1. A camera module test fixture, characterized in that: The invention comprises a circuit board (8), a base (7), a cover plate (1), a first probe (10) and a second probe (11), wherein the base (7) is fixedly arranged on the upper surface of the circuit board (8), the base (7) is used to carry the camera module (3) to be tested, the cover plate (1) is arranged above the base (7) and is used to clamp the camera module (3) to be tested arranged on the base (7), the lower ends of the first probe (10) and the second probe (11) are both electrically connected to the circuit board (8), the upper ends of the first probe (10) and the second probe (11) pass through the base (7) and are electrically connected to the camera module (3) to be tested, and there is a height difference between the first probe (10) and the second probe (11) in a direction perpendicular to the upper surface of the circuit board (8).

2. A camera module test fixture according to claim 1, characterized in that: A module mounting seat (4) and a module limiting plate (6) are provided between the base (7) and the cover plate (1); the module mounting seat (4) is fixed to the base (7); the module mounting seat (4) is used to place the camera module (3) to be tested; and the module limiting plate (6) is used to fix the camera module (3) to be tested arranged on the module mounting seat (4).

3. A camera module test fixture according to claim 2, characterized in that: The invention also includes a connector mounting seat (9) and a probe mounting seat (13), wherein the connector mounting seat (9) is floatingly arranged on the probe mounting seat (13), the lower end of the probe mounting seat (13) is arranged on the circuit board (8), and the first probe (10) and the second probe (11) pass through the probe mounting seat (13) and the connector mounting seat (9) in sequence.

4. A camera module test fixture according to claim 3, characterized in that: It also includes a floating spring (12), which is arranged between the connector mounting seat (9) and the probe mounting seat (13). The floating spring (12) is used to float the connector mounting seat (9) on the probe mounting seat (13).

5. The camera module test fixture according to claim 3, characterized in that: It also includes a connector limiting plate (2), which is used to clamp the connector (301) of the camera module (3) to be tested, which is arranged on the connector mounting seat (9).

6. A camera module test fixture according to claim 4, characterized in that: It also includes a limit spring (5), a spring mounting hole (601) is provided on the module limit plate (6), and the limit spring (5) is partially fixed in the spring mounting hole (601). The limit spring (5) is used to press the module limit plate (6) against the module mounting seat (4).

7. The camera module test fixture according to claim 3, characterized in that: The module mounting seat (4) is provided with a module accommodating groove (402) and a first vacuum hole (401) that are in communication with each other, and the module accommodating groove (402) is used to accommodate the camera module (3) to be tested.

8. The camera module test fixture according to claim 7, characterized in that: The base (7) is provided with a second vacuum hole (701) and a mounting hole (702) penetrating the base (7); the second vacuum hole (701) and the first vacuum hole (401) are connected; and the connector mounting seat (9) and the probe mounting seat (13) are arranged in the mounting hole (702).

9. The camera module test fixture according to claim 1, characterized in that: The first probe (10) and the second probe (11) both comprise a first connecting portion (14), a main portion (15), and a second connecting portion (16) connected in sequence, wherein the outermost portion of the first connecting portion (14) is used for electrically connecting to the camera module (3) to be tested, and the second connecting portion (16) is electrically connected to the circuit board (8), and the outermost portion of the first connecting portion (14) is a curved surface structure.

10. The camera module test fixture according to claim 9, characterized in that: The first connecting portion (14) and the second connecting portion (16) can both be telescopically connected to the main body portion (15).