Power test probe for integrating sphere type optical device

Abstract

An integrating sphere type optical device power test probe comprises a probe base, a mounting cavity, a volumetric sphere dividing cavity, a camera, a power detection circuit board and a probe upper cover. The mounting cavity and the integrating sphere cavity are arranged on the probe base, and the probe upper cover is arranged on the mounting cavity and the integrating sphere cavity; the camera is arranged at one end of the mounting cavity and is used for shooting an optical device; the power detection circuit board is arranged in the mounting cavity; the integrating sphere cavity is provided with a laser incident port and a laser power detection output port, laser in an optical device is emitted into the integrating sphere cavity through the laser incident port, and part of laser subjected to diffuse reflection in the integrating sphere cavity is emitted out through the laser power detection output port and is collected by a power detection circuit board in the mounting cavity.

Description

Technical Field

[0001] The utility model relates to the technical field of optical device testing equipment, in particular to an integrating sphere type optical device power testing probe compatible with a channel sequence rule determination function. Background Art

[0002] Power probes used in optical device testing equipment are specialized for measuring optical power. They are crucial in fields such as fiber-optic communications, laser processing, and scientific research. These probes typically feature high sensitivity and fast response, enabling accurate measurement of optical power levels from microwatts to watts and beyond.

[0003] However, the power test probes on existing optical device testing equipment can only perform power testing and cannot determine the channel sequence rules of optical devices. When the channel sequence of optical devices needs to be known, two indicators can only be tested under different equipment, different workstations and different processes. Therefore, the power test probes on existing optical device testing equipment have low testing efficiency and are prone to re-contamination of the end face of the optical device, requiring repeated inspection and cleaning of the end face of the optical device. Utility Model Content

[0004] In order to solve the above problems, the purpose of the present utility model is to provide an integrating sphere optical device power test probe compatible with the channel sequence rule determination function.

[0005] The utility model provides an integrating sphere type optical device power test probe compatible with the channel sequence rule judgment function, the integrating sphere type optical device power test probe comprising: a probe base, a mounting cavity, an integrating sphere cavity, a camera, a power detection circuit board and a probe cover;

[0006] The mounting cavity and the integrating sphere cavity are arranged on the probe base, and the probe cover is arranged on the mounting cavity and the integrating sphere cavity; the camera is arranged at one end of the mounting cavity for photographing the optical device; the power detection circuit board is arranged in the mounting cavity; the integrating sphere cavity has a laser incident port and a laser power detection output port, the laser in the optical device is emitted into the integrating sphere cavity through the laser incident port, and part of the laser after diffuse reflection in the integrating sphere cavity is emitted from the laser power detection output port and collected by the power detection circuit board in the mounting cavity.

[0007] Optionally, the integrating sphere cavity includes a first cavity and a second cavity, and the first cavity is connected to the second cavity; the laser incident port is located at the edge of the first cavity and is arranged away from the mounting cavity; the laser power detection output port is located at the edge of the second cavity and is arranged close to the mounting cavity, and the second cavity and the mounting cavity are connected through the laser power detection output port.

[0008] Optionally, a camera fixing seat is provided on a side of the installation cavity close to the integrating sphere cavity, and the camera is installed on the camera fixing seat.

[0009] Optionally, the integrating sphere cavity is provided with a camera opening, and the camera opening is arranged opposite to the laser incident port; the camera photographs the optical device through the camera opening.

[0010] Optionally, the diameter of the camera opening is 1 mm.

[0011] Optionally, the camera opening and the laser incident port are located on the same horizontal plane.

[0012] Optionally, the angle between the plane where the camera opening and the laser incident port are located and the horizontal plane is greater than 14°.

[0013] Optionally, a camera driving circuit board is provided inside the installation cavity, and the camera driving circuit board is connected to the camera.

[0014] The integrating sphere optical device power test probe compatible with the channel sequence rule judgment function of the utility model has the following advantages:

[0015] (1) Compatible with the power index test of optical devices and the determination of channel sequence rules;

[0016] (2) The channel sequence rule determination is based on the camera, which is compatible with the channel sequence rule determination of standard and non-standard optical devices;

[0017] (3) The probe can simplify the test process, reduce the number of test stations, and simplify the test of optical devices and reduce costs.

[0018] Based on the following detailed description of specific embodiments of the present invention in conjunction with the accompanying drawings, those skilled in the art will become more aware of the above and other objects, advantages and features of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Various other advantages and benefits will become apparent to those skilled in the art upon reading the detailed description of the preferred embodiment below. The accompanying drawings are for illustration purposes only and are not to be considered as limiting the present invention. The same reference symbols are used throughout the accompanying drawings to represent the same components. In the accompanying drawings:

[0020] Figure 1 This is a schematic structural diagram of an integrating sphere optical device power test probe compatible with the channel sequence rule determination function of an embodiment of the present utility model, wherein the camera angle is 0°;

[0021] Figure 2 This is a schematic structural diagram of an integrating sphere optical device power test probe compatible with a channel sequence rule determination function according to another embodiment of the present invention, wherein the camera angle is 14°;

[0022] Figure 3 This is a schematic diagram of channel coordinate data obtained when the test system software of an embodiment of the utility model determines the channel sequence rule of an optical device;

[0023] Figure 4 This is a schematic diagram of the superimposed area limits of the channel coordinate data obtained when the test system software of the embodiment of the utility model determines the channel sequence rule of the optical device;

[0024] 1-Laser incident port, 2-Laser power detection output port, 3-Camera opening, 4-Camera, 5-Camera fixing seat, 6-Power detection circuit board, 7-Probe cover, 8-Camera drive circuit board, 9-Probe base, 10-Mounting cavity, 11-Integrating sphere cavity, 11a-First cavity, 11b-Second cavity. DETAILED DESCRIPTION

[0025] The following describes the embodiments of the present invention in conjunction with the accompanying drawings. Those skilled in the art should understand that these embodiments are only used to explain the present invention and are not restrictive.

[0026] The present invention provides an integrating sphere type optical device power test probe compatible with the channel sequence rule judgment function, such as Figure 1~Figure 2 As shown, the integrating sphere type optical device power test probe includes: a probe base 9, a mounting cavity 10, an integrating sphere cavity 11, a camera 4, a power detection circuit board 6 and a probe cover 7; the mounting cavity 10 and the integrating sphere cavity 11 are arranged on the probe base 9, and the probe cover 7 is arranged on the mounting cavity 10 and the integrating sphere cavity 11; the camera 4 is arranged at one end of the mounting cavity 10 for photographing optical devices; the power detection circuit board 6 is arranged in the mounting cavity 10; the integrating sphere cavity 11 has a laser incident port 1 and a laser power detection output port 2, the laser in the optical device is emitted into the integrating sphere cavity 11 from the laser incident port 1, and part of the laser light after diffuse reflection in the integrating sphere cavity 11 is emitted from the laser power detection output port 2 and collected by the power detection circuit board 6 in the mounting cavity 10 to perform power index testing of passive optical devices. When testing the power index of passive optical devices, an InGaAs PD detector can be embedded in the laser power detection output port 2 to convert the power evenly distributed on the surface of the integrating sphere into current. The current signal is sent to the power detection circuit board 6 for digital-to-analog conversion to test the power index of the optical device.

[0027] See also Figure 1~Figure 2The integrating sphere cavity 11 includes a first cavity 11a and a second cavity 11b, and the first cavity 11a is connected to the second cavity 11b; the laser incident port 1 is located at the edge of the first cavity 11a and is arranged away from the installation cavity 10; the laser power detection output port 2 is located at the edge of the second cavity 11b and is arranged close to the installation cavity 10, and the second cavity 11b and the installation cavity 10 are connected through the laser power detection output port 2.

[0028] A camera mount 5 is provided on one side of the mounting cavity 10 near the integrating sphere cavity 11, and the camera 4 is mounted on this mount 5. The integrating sphere cavity 11 is provided with a camera aperture 3, which is positioned opposite the laser inlet 1; the camera 4 images the optical device through this aperture 3. A camera driver circuit board 8 is provided within the mounting cavity 10 and is connected to the camera 4. Images captured by the camera 4 are transmitted to a computer via the camera driver circuit board 8 for channel sequence rule determination.

[0029] The diameter of the imaging opening 3 is 1 mm. The imaging opening 3 and the laser incident port 1 are located on the same horizontal plane. The angle between the planes where the imaging opening 3 and the laser incident port 1 are located and the horizontal plane is greater than 14°.

[0030] See also Figure 1 The probe uses the 0° aperture 3 and camera 4 to determine the channel sequence rule of the optical device. The camera driver circuit board 8 transmits the image data to the test system on the computer. The test system software uses the image information to determine the channel sequence rule of the optical device. Optionally, the camera is a micro-focus miniature camera, connected to the computer and camera driver circuit 8 via USB.

[0031] When the test system software determines the order rules of the optical device channels through image information, it collects photos of all channels, processes the photo information and sorts them to obtain the coordinate data of each channel, such as Figure 3 As shown. Further, according to the type of optical device, the channel area is delineated and the coordinate data is judged and sorted (such as Figure 4 As shown in Figure 2), this method can be used to determine the channel sequence rules of optical devices.

[0032] The core diameter of the multimode optical fiber is 50 μm, the numerical aperture of the multimode optical fiber is 0.2, and the laser spot is formed at a distance of 1 cm opposite to the laser incident port 1. 2 The actual test spot is 0.78mm removed from the spot. 2The aperture area affects the test power by 0.78%, which translates to 0.03dB of power, keeping within the 0.05dB error of the power test. Multimode optical devices don't deflect the light output angle, so the camera angle can be directly aligned with the light output direction, so a 0° aperture solution is used.

[0033] See also Figure 2 The probe determines the channel sequence rule of the optical device through the 14° camera opening 3 and the camera 4, and transmits the image model to the test system through the camera driver circuit board 8. The test system software determines the channel sequence rule of the optical device through the image information.

[0034] The core diameter of the single-mode fiber is 9 μm, the numerical aperture of the multi-mode fiber is 0.18, and the laser spot is 0.2 cm opposite to the laser incident port 1. 2 The actual test spot is 0.78mm removed from the spot. 2 The aperture area affects the test power by 3.9%, which translates to 0.17dB of power, failing to meet the 0.05dB error required for power testing. Single-mode optical devices have an 8° output angle, so the overlap must deviate from the spot area. The camera angle must be greater than or equal to 14°, so a 14° aperture solution is used.

[0035] The above description is merely a preferred embodiment of the present invention. The scope of protection of the present invention is not limited to the above embodiment. All technical solutions based on the concept of the present invention are within the scope of protection of the present invention. It should be noted that for those skilled in the art, certain improvements and modifications that do not depart from the principles of the present invention should also be considered within the scope of protection of the present invention.

Claims

1. An integrating sphere type optical device power test probe, characterized in that: The integrating sphere type optical device power test probe comprises: a probe base (9), a mounting cavity (10), an integrating sphere cavity (11), a camera (4), a power detection circuit board (6) and a probe cover (7); The mounting cavity (10) and the integrating sphere cavity (11) are arranged on the probe base (9), and the probe upper cover (7) is arranged on the mounting cavity (10) and the integrating sphere cavity (11); the camera (4) is arranged at one end of the mounting cavity (10) for photographing the optical device; the power detection circuit board (6) is arranged in the mounting cavity (10); the integrating sphere cavity (11) has a laser incident port (1) and a laser power detection output port (2); the laser in the optical device is injected into the integrating sphere cavity (11) through the laser incident port (1); part of the laser light after diffuse reflection in the integrating sphere cavity (11) is emitted from the laser power detection output port (2) and collected by the power detection circuit board (6) in the mounting cavity (10).

2. The integrating sphere type optical device power test probe according to claim 1, characterized in that: The integrating sphere cavity (11) comprises a first cavity (11a) and a second cavity (11b), wherein the first cavity (11a) is connected to the second cavity (11b); the laser incident port (1) is located at the edge of the first cavity (11a) and is arranged away from the mounting cavity (10); the laser power detection output port (2) is located at the edge of the second cavity (11b) and is arranged close to the mounting cavity (10), and the second cavity (11b) and the mounting cavity (10) are connected via the laser power detection output port (2).

3. The integrating sphere optical device power test probe according to claim 1, characterized in that: A camera fixing seat (5) is provided on one side of the installation cavity (10) close to the integrating sphere cavity (11), and the camera (4) is mounted on the camera fixing seat (5).

4. The integrating sphere optical device power test probe according to claim 1, characterized in that: The integrating sphere cavity (11) is provided with a camera opening (3), and the camera opening (3) is arranged opposite to the laser incident port (1); the camera (4) photographs the optical device via the camera opening (3).

5. The integrating sphere optical device power test probe according to claim 4, characterized in that: The diameter of the camera opening (3) is 1 mm.

6. The integrating sphere optical device power test probe according to claim 4, characterized in that: The camera opening (3) and the laser incident port (1) are located on the same horizontal plane.

7. The integrating sphere optical device power test probe according to claim 4, characterized in that: The angle between the plane where the camera opening (3) and the laser incident port (1) are located and the horizontal plane is greater than 14°.

8. The integrating sphere optical device power test probe according to any one of claims 1 to 7, characterized in that: A camera drive circuit board (8) is provided inside the installation cavity (10), and the camera drive circuit board (8) is connected to the camera (4).

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