Four-probe high-precision testing mechanism for inner board card and outer board card of LED light splitting machine

Abstract

The utility model discloses a four-probe high-precision testing mechanism for inner and outer board cards of an LED light splitting machine, and relates to the technical field of light splitting machines. The left probe mechanism is respectively connected with the inner board card and the outer board card through test lines, the right probe mechanism is respectively connected with the inner board card and the outer board card through test lines, the left probe mechanism and the right probe mechanism are respectively contacted with pins on corresponding sides of an LED lamp bead to be tested, and the left probe mechanism and the right probe mechanism are respectively used for detecting a left side pin and a right side pin of the LED lamp bead. The probe is connected with the board card through the test line, so that signals are interactively transmitted between the probe and the board card, and test and debugging are facilitated; the LED lamp beads are fixed and positioned on the index plate through the clamping mechanism, and the index plate intermittently conveys the LED lamp beads. The device improves the photoelectric test precision, enhances the measurement stability, improves the light splitting efficiency, saves the purchase cost, and is wide in application prospect.

Description

Technical Field

[0001] The utility model relates to the technical field of optical splitters, in particular to a high-precision testing mechanism with four probes for internal and external boards of an LED optical splitter. Background Art

[0002] The LED spectrometer sorts LEDs based on various parameters, such as electrical properties, brightness, and light color. When SMD LEDs are transferred from the vibrating plate to the graduated plate for photoelectric performance testing, the test probes first contact the LED pins and illuminate the LEDs under test. Only then can the illuminated LEDs be tested for photoelectric performance. The LED components are then sorted into corresponding collection bins based on these parameters. The current spectrometer testing mechanism consists of a dual-probe test structure and an internal board. The probes are dual-probe, meaning each probe drives the positive and negative pins of the LEDs. A single internal test board is used to test and screen LED performance.

[0003] LED spectrophotometry and color separation are performed by powering the internal and external test boards of the test host computer through probes to illuminate the selected components. Optical fibers and light intensity detectors on the integrating sphere then collect light parameters, which are fed back to the spectrometer for measurement. The spectrometer then performs sorting of the selected components' voltage, brightness, color temperature, wavelength, and color coordinates within the test software's set ranges. The circuit communicates with the PCI data acquisition card and sorting equipment via a peripheral communication interface to achieve online testing and sorting. The LED light passes through a spectroscope and reaches the spectrometer and photodetector, respectively. Each pixel on the linear CCD in the spectrometer corresponds to the energy characteristics of each LED wavelength. After sampling and amplification by the CCD and conversion by the PCI data acquisition card, it is fed into the computer. After processing, the spectral power distribution function p(λ) is obtained, allowing calculation of the LED light source's chromaticity coordinates (x, y), purity, peak wavelength, and dominant wavelength. When the spectrometer operates at high speed, the probe rapidly contacts and separates from the LED pins. Variations in the clamping force between the probe and the LED pin can easily lead to poor contact between the probe and the LED chip under test, resulting in excessive resistance deviation between the test chips, which can affect the photoelectric performance of the LED.

[0004] Specifically, the current internal board and dual-probe test mechanism has the following disadvantages:

[0005] (1) Contact resistance and edge effect cause excessive voltage fluctuation, mainly due to the following reasons:

[0006] ① When the spectrometer is working at high speed, the clamping force is unstable and the contact position of the probe is inconsistent each time, resulting in poor contact between the probe and the bottom of the LED lamp bead pin, and the resistance deviation is too large, which causes voltage abnormality.

[0007] ②LED lamp bead pin problem:

[0008] i. The smaller LED pins reduce the probe contact surface, which can easily lead to poor contact. For example, the 5050 and 5054 LED pins are larger and protrude from the bottom plastic, resulting in a larger probe contact surface. The 5054 pins are smaller and embedded in the bottom plastic, leaving no protrusion, resulting in a smaller probe contact surface.

[0009] ⅱ. Problems such as copper oxidation on the lamp bead pins and probe wear will affect the change of contact resistance.

[0010] ③Single board problem:

[0011] i. Since only one board is responsible for both driving and measuring, the influence of contact resistance and edge effect may be more significant, resulting in increased measurement errors.

[0012] ⅱ. Single board card cannot accurately control current and voltage.

[0013] ⅲ. Single board cards are easily affected by external factors, and their stability and reliability are relatively low, resulting in unstable or biased test results.

[0014] ⅳ. The higher the LED lamp voltage, the greater the jump voltage caused by the change in contact resistance.

[0015] ⅴ. Lack of abnormal screening and comparison measures: There is only one internal test board for testing and screening the performance of LED lamp beads. For problems with excessive voltage fluctuations, it cannot be effectively screened and will be judged as abnormal photoelectric parameters of the LED lamp beads.

[0016] (2) Affecting the splitting efficiency and BIN rate: When the contact resistance deviation is large and the voltage jump is too large and is not screened by the internal board test, the splitting speed will generally be reduced, and the abnormal lamp beads will be split again for many times, resulting in the following problems:

[0017] ① Increase labor costs and affect production capacity: During operation, the splitting efficiency is low, and too much manpower and material resources are used for repeated splitting.

[0018] ② Impact on yield rate: The contact resistance between the probe and the lamp bead pin, the uncontrollable lamp bead voltage jump phenomenon, and the inability to accurately and effectively screen the internal board will cause the lamp bead photoelectric parameters to be unable to be accurately measured, which will directly affect the product BIN classification and yield rate.

[0019] In order to solve the above problems, it is particularly necessary to design a high-precision four-probe testing mechanism for the internal and external boards of the LED spectrometer. Utility Model Content

[0020] In response to the shortcomings of the existing technology, the purpose of this utility model is to provide a high-precision testing mechanism with four probes for the internal and external boards of an LED spectrometer. It has a simple structure and a reasonable design, improves the accuracy of photoelectric testing, enhances measurement stability, improves the spectroscopic efficiency, saves machine purchase costs, and is easy to promote and use.

[0021] In order to achieve the above-mentioned purpose, the utility model is realized through the following technical scheme: a high-precision testing mechanism of four probes for internal and external boards of an LED spectrometer, comprising a left probe mechanism, a right probe mechanism, an internal board, an external board, a test line, a clamping mechanism, and a dividing plate. The left probe mechanism is connected to the internal board and the external board respectively through the test line, and the right probe mechanism is connected to the internal board and the external board respectively through the test line. The left probe mechanism and the right probe mechanism are respectively in contact with the pins on the corresponding sides of the LED lamp beads to be tested. The left probe mechanism and the right probe mechanism are respectively used to detect the left pin and the right pin of the LED lamp bead. The probes are connected to the board through the test line, so that signals are transmitted interactively between the probes and the board for testing and debugging; the LED lamp beads are fixed and positioned on the dividing plate by the clamping mechanism, the dividing plate intermittently conveys the LED lamp beads, and the clamping mechanism ensures that the LED lamp beads are stably transmitted on the dividing plate.

[0022] The left probe mechanism has the same structure as the right probe mechanism, and both are composed of a probe cover, a probe seat, a fixing seat, a probe accommodating groove, a return spring accommodating groove, a probe, a probe tip, and a return spring. The probe seat is fixed on the fixing seat, and a probe cover is arranged above the probe seat. The probe cover, the probe seat, and the fixing seat are fixedly connected by bolts passing through bolt holes. A probe accommodating groove and a return spring accommodating groove are provided in the probe seat, and a probe is installed in the probe accommodating groove. The probe cover presses the probe into the probe seat. The head of the probe is the probe tip that contacts the pin of the LED lamp bead, and the tail end of the probe is connected to the test line for conducting signals; a return spring that matches the probe is installed in the return spring accommodating groove.

[0023] Preferably, the probe is provided with a probe column, which is located under the probe. The probe is abutted against a reset spring through the probe column. One end of the reset spring abuts against the probe column to control the reset action of the probe, playing the role of compression, reset and buffering, thereby providing a certain elastic contact pressure to ensure stable contact between the probe and the pin and avoid damage to the LED lamp beads.

[0024] Preferably, the fixing seat is provided with a fixing hole, and the probe mechanism is fixed to a corresponding position of the spectrometer by passing a bolt fixing member through the fixing hole.

[0025] Preferably, one corner of the LED lamp bead is provided with an LED lamp bead identification corner for distinguishing the positive and negative poles of the lamp bead.

[0026] Preferably, the LED lamp beads are connected to the inner board and the outer board respectively through an online test circuit, and the inner board and the outer board are connected to the spectroscopic and color separation system. The inner board and the outer board are PCI data acquisition cards, and the IPC control system is responsible for controlling the working status of the inner and outer boards, receiving and processing test data, and interacting with users; the outer board provides a stable current at the positive and negative poles of the LED lamp beads, controls the magnitude and direction of the current, and contacts the LED pins through a probe to form a current loop; the inner board performs voltage testing on the positive and negative poles of the LED lamp beads, measures the voltage change of the LED under the action of external current, and calculates the electrical parameters of the LED's resistivity and conductivity by measuring the relationship between voltage and current; the LED lamp beads are connected to the spectroscopic and color separation system through the light intensity detector on the integrating sphere, and the optical fiber on the integrating sphere is connected to the spectroscopic and color separation system through a CCD spectrometer.

[0027] The beneficial effects of the utility model are as follows: the mechanism can significantly improve the accuracy of photoelectric testing, enhance measurement stability, meet the voltage segmentation requirements of products, and improve the splitting efficiency at the same time. The technology grafting is highly versatile, effectively saves machine purchase costs, and has broad application prospects. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] The present invention will be described in detail below with reference to the accompanying drawings and specific embodiments;

[0029] Figure 1 This is a schematic diagram of the three-dimensional structure of the probe mechanism of the utility model;

[0030] Figure 2 This is a schematic diagram of the exploded structure of the probe mechanism of the present utility model;

[0031] Figure 3 This is a schematic diagram of the installation of the probe base and the fixing base of the utility model;

[0032] Figure 4 Schematic diagram of the three-dimensional structure of the probe of the utility model;

[0033] Figure 5 This is a schematic diagram of the planar structure of the probe of the utility model;

[0034] Figure 6 A three-dimensional schematic diagram of the test application of the utility model;

[0035] Figure 7 A schematic plan view of the test application of the utility model;

[0036] Figure 8 This is a schematic diagram of the installation of the left and right probe mechanism, LED lamp beads and indexing plate of the utility model;

[0037] Figure 9 This is a schematic diagram of the structure of the LED lamp bead of the utility model;

[0038] Figure 10 for Figure 9 Rear view;

[0039] Figure 11 This is the principle diagram of the double-pin test of a single LED chip in this utility model;

[0040] Figure 12 This is a test principle diagram of a single LED chip with two pins extending outward at the voltage detection point of the utility model;

[0041] Figure 13 This is a principle block diagram of the utility model. DETAILED DESCRIPTION

[0042] In order to make the technical means, creative features, objectives and effects achieved by the present invention easier to understand, the present invention is further described below in conjunction with specific implementation methods.

[0043] Reference Figure 1-13 ,This specific embodiment adopts the following technical solution: a high-precision four-probe test mechanism for the inner and outer boards of an LED spectrometer, including a left probe mechanism 1, a right probe mechanism 2, an inner board 3, an outer board 4, a test line 5, a clamping mechanism 6, and a dividing plate 7. The left probe mechanism 1 is connected to the inner board 3 and the outer board 4 through the test line 5, and the right probe mechanism 2 is connected to the inner board 3 and the outer board 4 through the test line 5. The left probe mechanism 1 and the right probe mechanism 2 are respectively in contact with the pins 9 on the corresponding sides of the LED lamp bead 8 to be tested. A corner of the D lamp bead 8 is provided with an LED lamp bead identification corner 10 for distinguishing the positive and negative poles of the lamp bead. The left probe mechanism 1 and the right probe mechanism 2 are respectively used to detect the left pin and the right pin of the LED lamp bead 8. The probe is connected to the board through the test line 5, so that the signal is transmitted interactively between the probe and the board for testing and debugging; the LED lamp bead 8 is fixed and positioned on the dividing plate 7 by the clamping mechanism 6. The dividing plate 7 intermittently transports the LED lamp bead 8, and the clamping mechanism 6 ensures that the LED lamp bead 8 is stably transmitted on the dividing plate.

[0044] The left probe mechanism 1 and the right probe mechanism 2 of this embodiment have the same structure, and both are composed of a probe cover 101, a probe seat 102, a fixing seat 103, a probe receiving groove 104, a return spring receiving groove 105, a probe 106, a probe tip 107, and a return spring 108. The probe seat 102 is fixed on the fixing seat 103, and a probe cover 101 is arranged above the probe seat 102. The probe cover 101, the probe seat 102, and the fixing seat 103 are connected by bolts 109 passing through the bolt holes 11. 0 is fixedly connected, a probe receiving groove 104 and a return spring receiving groove 105 are provided in the probe base 102, a probe 106 is installed in the probe receiving groove 104, and the probe cover 101 presses the probe 106 into the probe base 102. The head of the probe 106 is a probe tip 107 that contacts the pin 9 of the LED lamp bead 8, and the tail end of the probe 106 is connected to the test line 5 for conducting signals; a return spring 108 that cooperates with the probe 106 is installed in the return spring receiving groove 105.

[0045] It is worth noting that the probe 106 is provided with a probe column 111, which is located below the probe 106. The probe 106 is in contact with the reset spring 108 through the probe column 111. One end of the reset spring 108 is against the probe column 111 to control the reset action of the probe 106, playing the role of compression, reset and buffering, thereby providing a certain elastic contact pressure to ensure that the probe 106 is in stable contact with the pin 9 and avoid damage to the LED lamp bead 8.

[0046] In addition, a fixing hole 112 is provided on the fixing seat 103 , and a bolt fixing piece is passed through the fixing hole 112 to fix the probe mechanism at a corresponding position of the spectrometer.

[0047] In this embodiment, the LED lamp beads 8 are connected to the inner board 3 and the outer board 4 respectively through the online test circuit. The online test circuit is used to monitor the working status and performance of the board in real time to ensure the accuracy and reliability of the test data; the inner board 3 and the outer board 4 are connected to the spectroscopic and color separation system. The inner board 3 and the outer board 4 are PCI data acquisition cards. The IPC control system is responsible for controlling the working status of the inner and outer boards, receiving and processing test data, and interacting with the user; the outer board 4 provides a stable current to the positive and negative poles of the LED lamp beads 8, controls the size and direction of the current, and contacts the LED pins through the probe to form an electric The internal board 3 performs voltage testing on the positive and negative poles of the LED lamp bead 8, measures the voltage change of the LED under the action of the external current, and calculates the electrical parameters of the LED, such as the resistivity and conductivity, by measuring the relationship between the voltage and current; the LED lamp bead 8 is connected to the spectroscopic and color separation system through the light intensity detector on the integrating sphere, and the optical fiber on the integrating sphere is connected to the spectroscopic and color separation system through the CCD spectrometer. The optical properties of the LED, such as spectrum and light intensity, are measured by the spectroscope, light intensity detector, optical fiber and CCD spectrometer of the spectroscopic and color separation system, which convert the light signal emitted by the LED into an electrical signal for analysis and processing by the IPC control system.

[0048] The test process is as follows: the left probe mechanism 1 and the right probe mechanism 2 make good contact with the pin 9 of the LED lamp bead 8 on the dividing plate 7, the IPC control system controls the external board card 4 to provide a stable current at the positive and negative poles of the LED lamp bead 8 to form a current loop, and at the same time, the internal board card 3 performs precise voltage testing on the positive and negative poles of the LED lamp bead 8, and the spectroscope, light intensity detector and other equipment simultaneously measure the optical performance of the LED. The IPC control system receives the test data of the internal and external boards and optical measuring equipment, performs comprehensive analysis and processing, and displays the photoelectric test results to the user, including the resistivity, spectrum, light intensity and other parameters of the LED.

[0049] In this specific embodiment, the internal board 3 is mainly responsible for measuring voltage and collecting data. The probe inner 1+ and the probe inner 2- are connected to the voltage measurement module to measure the voltage between the two probes, forming a voltage loop; the external board 4 is mainly responsible for generating and controlling current, providing a stable current source. The current flows from the probe outer 1+ into the LED, and then flows out through the probe outer 2-, forming a current loop; the positive pin of the LED lamp bead is measured simultaneously by the two probes inner 1+ and outer 1+, and the negative pin of the LED lamp bead is measured simultaneously by the two probes inner 2- and outer 2-. Since there is a voltage drop only in the current path, and the internal resistance of the voltmeter is usually very high, the current flowing through the probe inner 1+ and the probe inner 2- is almost zero, so the voltage detection point A is extended outward ( Figure 12 ) does not affect the test results, and can reduce the influence of the probe's own resistance and the contact resistance between the probe and the material on the measurement; based on the measured voltage and current values, a relatively accurate resistivity can be calculated.

[0050] This specific embodiment utilizes an internal and external board and a dual-probe testing mechanism. Specifically, two sets of probe acquisition systems simultaneously probe the selected LED components. Each pin of the LED is tested using two sets of probes driven by the internal and external boards, respectively. Based on Ohm's law, the four-probe tester measures the resistivity of a sample by using four probes, forming two current probes and two voltage probes. The specific operation is as follows: the two current probes apply a DC current to the sample, while the two voltage probes detect the potential difference across the sample. The resistivity of the sample is calculated by measuring the current and voltage, taking into account the sample's geometry and the spacing between the probes.

[0051] The material of the probe mechanism of this specific embodiment can be replaced by a variety of materials, the electroplating method is not limited, and the shape can have a variety of similar designs according to the actual structure and use of the spectrometer. The combination method is not limited. For example, the reset spring supports the probe column at the lower end of the probe to achieve the reset action, or the spring can be wrapped around the probe to achieve the reset effect.

[0052] Compared to the traditional two-probe method, this specific embodiment reduces the influence of circuit resistance and contact resistance and can more accurately measure resistivity. This test mechanism is also suitable for measuring parameters such as the square resistance, minority carrier lifetime, and carrier mobility of semiconductor materials. It is very important for evaluating the conductive properties and quality of semiconductor materials and can ensure the accuracy of test data. It improves the accuracy of product voltage testing to meet customer voltage segmentation requirements. Specifically, its technical advantages are:

[0053] (1) The four-probe dual-board test system significantly improves the photoelectric test accuracy and enhances the measurement stability, meeting the product voltage segmentation requirements:

[0054] ① Improve test accuracy: The four-probe method can form a more accurate current path and voltage measurement point through the alternating contact of two pairs of probes, effectively avoiding the contact resistance error caused by surface contact problems such as small LED pins, pin oxidation, insufficient clamping force, and short probe test time, thereby effectively eliminating the influence of contact resistance and boundary effects; at the same time, the mechanism uses two independent boards for driving and measuring respectively, which can more accurately control the current and measure the voltage, thereby reducing measurement errors. Through the coordinated work of internal and external boards, the system can automatically correct errors.

[0055] ② Enhanced measurement stability: The design of the four-probe method ensures the control of current and voltage distribution during the test process, reduces the influence of surface effects on the test results, and makes the measurement results more stable and reliable.

[0056] (2) Improve the efficiency of light splitting:

[0057] ① Due to the coordinated work of internal and external boards, current supply and voltage testing can be performed simultaneously, shortening the test time and improving the test efficiency;

[0058] ② The improvement of spectroscopic efficiency and test accuracy can also avoid repeated spectroscopic operations that affect production capacity, yield rate and labor costs.

[0059] (3) Universality of technology grafting and savings in machine purchase costs:

[0060] ① Under the premise that the versatility of the machine is not affected, the internal and external boards and probe systems are only improved on the existing test machine. This test system can be easily grafted onto different spectrometers to improve the spectrometer test accuracy;

[0061] ② Save machine purchase costs: Due to the universality of the internal and external board test systems, there is no need to purchase corresponding bottom test disc machines to improve the test accuracy of the spectrometer, which reduces costs and has broad market application prospects.

[0062] The above shows and describes the basic principles, main features and advantages of the present invention. Those skilled in the art should understand that the present invention is not limited to the above embodiments. The above embodiments and descriptions are merely illustrative of the principles of the present invention. Various changes and improvements may be made to the present invention without departing from the spirit and scope of the present invention. Such changes and improvements are intended to fall within the scope of the present invention. The scope of protection claimed in this invention is defined by the appended claims and their equivalents.

Claims

1. A high-precision four-probe test mechanism for internal and external boards of an LED spectrometer, characterized in that: The invention comprises a left probe mechanism (1), a right probe mechanism (2), an inner board (3), an outer board (4), a test line (5), a clamping mechanism (6), and a graduated disk (7). The left probe mechanism (1) is connected to the inner board (3) and the outer board (4) respectively through the test line (5), and the right probe mechanism (2) is connected to the inner board (3) and the outer board (4) respectively through the test line (5). The left probe mechanism (1) and the right probe mechanism (2) are in contact with the pins (9) on the corresponding sides of the LED lamp bead (8) to be tested respectively. The LED lamp bead (8) is fixed and positioned on the graduated disk (7) through the clamping mechanism (6). The left probe mechanism (1) and the right probe mechanism (2) have the same structure and are both composed of a probe cover plate (101), a probe seat (102), a fixing seat (103), a probe receiving groove (104), a reset spring receiving groove (105), a probe The invention relates to a probe assembly comprising a probe base (102), a probe tip (107) and a return spring (108); a probe base (102) is fixed on a fixing base (103); a probe cover (101) is arranged above the probe base (102); the probe cover (101), the probe base (102) and the fixing base (103) are fixedly connected by bolts (109) passing through bolt holes (110); a probe receiving groove (104) and a return spring receiving groove (105) are arranged in the probe base (102); a probe (106) is installed in the probe receiving groove (104); the head of the probe (106) is a probe tip (107) which contacts the pin (9) of the LED lamp bead (8); and the tail end of the probe (106) is connected to the test line (5); and a return spring (108) which matches the probe (106) is installed in the return spring receiving groove (105).

2. The high-precision four-probe testing mechanism for internal and external boards of an LED spectrometer according to claim 1, characterized in that: The bottom surface of the probe (106) is provided with a probe column (111), and the probe (106) is in abutment with the return spring (108) via the probe column (111).

3. The high-precision four-probe testing mechanism for internal and external boards of an LED spectrometer according to claim 1, characterized in that: The fixing seat (103) is provided with a fixing hole (112), and the probe mechanism is fixed to a corresponding position of the spectrometer by passing a bolt fixing piece through the fixing hole (112).

4. The high-precision four-probe testing mechanism for internal and external boards of an LED spectrometer according to claim 1, characterized in that: One corner of the LED lamp bead (8) is provided with an LED lamp bead identification corner (10) for distinguishing the positive and negative poles of the lamp bead.

5. The high-precision four-probe testing mechanism for internal and external boards of an LED spectrometer according to claim 1, characterized in that: The LED lamp beads (8) are respectively connected to the inner board card (3) and the outer board card (4) through an online test circuit. The inner board card (3) and the outer board card (4) are connected to a spectroscopic and color separation system. The inner board card (3) and the outer board card (4) are PCI data acquisition cards. The LED lamp beads (8) are connected to the spectroscopic and color separation system through a light intensity detector on an integrating sphere. The optical fiber on the integrating sphere is connected to the spectroscopic and color separation system through a CCD spectrometer.

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