Ceramic tile flatness testing equipment
By setting up multiple laser scanning arrays and transmission devices on the surface of the tiles, a dense spot grid is formed, which solves the accuracy and efficiency of traditional tiles flatness detection and achieves high-precision flatness detection.
Patent Information
- Application Number
- CN202422524613.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-10-17
- Publication Date
- 2025-08-22
- Estimated Expiration
- 2034-10-17
AI Technical Summary
Traditional ceramic tile flatness detection methods are insufficiently accurate and inefficient. Traditional equipment can only measure in one direction, resulting in large errors and difficult to meet high-precision requirements.
Using multiple laser scanning arrays, the laser sensors are arranged in sequence along the first direction to form a dense light spot grid, and the tiles are moved through the transmission device for a comprehensive scan, and the data is analyzed in combination with the processing equipment to improve detection accuracy.
It realizes accurate detection of subtle changes in the surface of ceramic tile, improves detection accuracy and efficiency, reduces costs, and is suitable for the detection of large-area or complex surfaces.
Smart Images

Figure CN223258891U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the field of ceramic tile detection, in particular to a ceramic tile flatness testing device. Background Art
[0002] Ceramic tiles are widely used as building and decorative materials in modern architecture, and their flatness directly impacts the final decorative effect and service life. Traditional tile flatness testing methods typically rely on manual measurement or linear laser measurement. Due to the spacing between each laser sensor, the number of measured points is relatively small, resulting in limited accuracy. With the advancement of technology, the use of laser measurement technology for flatness testing is becoming increasingly popular.
[0003] At present, the inventors have found that traditional technologies have problems such as inaccurate detection results and low efficiency. Utility Model Content
[0004] Based on this, it is necessary to provide a tile flatness testing device that improves the accuracy of the test results.
[0005] In order to achieve the above objectives, the present invention provides a ceramic tile flatness testing device, comprising:
[0006] Multiple laser scanning arrays; each laser scanning array includes multiple laser sensors arranged in sequence along a first direction; each laser scanning array is arranged in sequence along a second direction; wherein the first direction and the second direction are located in the same plane parallel to the surface of the tile; each laser sensor projects a light spot on the surface of the tile; the coordinate value of each light spot in the first direction is different; the tile is moved by a conveyor and passes through the scanning range of each laser scanning array;
[0007] The processing equipment is connected to each laser sensor respectively.
[0008] In one embodiment, it further includes a bracket mechanism and a fixing mechanism;
[0009] The bracket mechanism is arranged above the conveying device; one end of the fixing mechanism is used to set each laser sensor, and the other end is fixed to the bracket mechanism.
[0010] In one embodiment, the number of laser scanning arrays is 2.
[0011] In one embodiment, the support mechanism includes a first support and a second support; the laser scanning array includes a first laser scanning array and a second laser scanning array;
[0012] The first laser scanning array is arranged on a side of the first bracket close to the second bracket, and the second laser scanning array is arranged on a side of the second bracket close to the first bracket.
[0013] In one embodiment, the first direction and the second direction are perpendicular.
[0014] In one embodiment, the intervals between the laser sensors in each laser scanning array are the same;
[0015] The distance between the first laser sensor in the first laser scanning array and the front end of the first bracket is the first distance; the distance between the first laser sensor in the second laser scanning array and the front end of the second bracket is the second distance; the difference between the first distance and the second distance is less than the width of the laser sensor.
[0016] In one embodiment, the spacing between laser sensors in each laser scanning array is zero.
[0017] In one embodiment, the difference between the first distance and the second distance is half the width of the laser sensor.
[0018] In one embodiment, the number of laser sensors in the first laser scanning array is 7, and the number of laser sensors in the second laser scanning array is 8.
[0019] In one embodiment, the device further includes a display device connected to the processing device.
[0020] One of the above technical solutions has the following advantages and beneficial effects:
[0021] The above-mentioned tile flatness testing equipment realizes dense laser projection on the tile surface by using a laser scanning array composed of multiple laser sensors arranged along a first direction. The laser beam projected by each laser sensor forms a light spot on the tile surface. Due to the precise arrangement of the sensors, the coordinate values of each light spot in the first direction are different. Multiple laser scanning arrays are further arranged along the second direction, so that the light spots in the entire detection area are denser. The reduction in the spacing between light spots means that each laser sensor can cover a smaller tile surface unit and can capture subtle surface changes. For example, if only a single row of laser scanning arrays is used, the spacing between sensors is large, and there may be local concave and convex details on the tile surface that are not captured. However, through the combination of multiple arrays, a high-density scanning grid is formed to ensure that even the slightest height changes on the tile surface can be accurately detected. BRIEF DESCRIPTION OF THE DRAWINGS
[0022] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present application and, together with the description, serve to explain the principles of the present application.
[0023] In order to more clearly illustrate the technical solutions in the embodiments of the present application or related technologies, the following briefly introduces the drawings required for use in the embodiments or related technical descriptions. Obviously, for ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.
[0024] Figure 1 This is a structural block diagram of a tile flatness testing device in one embodiment;
[0025] Figure 2 A top view of the support structure and the fixed structure of a tile flatness testing device in one embodiment;
[0026] Figure 3 This is a three-dimensional diagram of the support structure and fixed structure of a tile flatness testing device in one embodiment. DETAILED DESCRIPTION
[0027] To facilitate understanding of the present application, the present application will be described more fully below with reference to the accompanying drawings. The accompanying drawings provide embodiments of the present application. However, the present application may be implemented in many different forms and is not limited to the embodiments described herein. Rather, these embodiments are provided to make the disclosure of the present application more thorough and comprehensive.
[0028] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art to which this application pertains. The terms used herein in the specification of this application are for the purpose of describing specific embodiments only and are not intended to limit this application.
[0029] In the subsequent description, the suffixes such as "module", "component" or "unit" used to represent elements are only used to facilitate the description of this application and have no specific meaning. Therefore, "module" and "component" can be used interchangeably.
[0030] It can be understood that the “connection” in the following embodiments should be understood as “electrical connection”, “communication connection”, etc. if there is transmission of electrical signals or data between the connected circuits, modules, units, etc.
[0031] When used herein, the singular forms "a", "an", and "the" may also include the plural forms, unless the context clearly indicates otherwise. It should also be understood that the terms "include / comprise" or "have" and the like specify the presence of stated features, integers, steps, operations, components, parts, or combinations thereof, but do not preclude the possibility of the presence or addition of one or more other features, integers, steps, operations, components, parts, or combinations thereof.
[0032] At present, the traditional measurement in industrial production is to use a single-line laser sensor for detection. Since it can only measure in one direction, it can only obtain a single line of data. And because there is a gap between each laser sensor, it cannot provide comprehensive flatness information, which limits its ability to detect complex or large-area surfaces. In addition, since it can only scan in one direction, there is a gap between each laser sensor when it is installed. When facing tiles of different specifications during production, the laser sensor needs to be moved or repositioned multiple times to cover the entire detection area. This makes the measurement process more cumbersome and inefficient, especially on large areas or complex surfaces. Furthermore, this traditional detection equipment can only measure in the longitudinal direction, and any lateral error or deviation will affect the final measurement results. Especially in situations where high-precision detection is required, errors may significantly affect the accuracy of the measurement.
[0033] The solution provided in this application can effectively solve the above problems.
[0034] In one embodiment, Figure 1 、 2 As shown, a tile flatness testing device is provided, comprising:
[0035] Multiple laser scanning arrays 10; each laser scanning array 10 includes multiple laser sensors 101 arranged sequentially along a first direction X; each laser scanning array 10 is arranged sequentially along a second direction Y; wherein the first direction X and the second direction Y are located in the same plane parallel to the surface of the tile 200; each laser sensor 101 projects a light spot on the surface of the tile; the coordinate value of each light spot in the first direction is different; the tile is moved by the conveying device 20 and passes through the scanning range of each laser scanning array 10;
[0036] The processing device 30 is connected to each laser sensor 101 respectively.
[0037] The laser scanning array includes multiple laser sensors arranged in an array. Each laser sensor can include a laser transmitter and a receiver. A conveyor device is used to move the tiles so that they can sequentially pass through the scanning range of each laser scanning array. The conveyor device ensures that the tiles can move stably and continuously in front of each laser sensor, ensuring that the sensors fully cover every part of the tile for uniform and accurate flatness testing. The conveyor device can be a conveyor belt, mobile platform, etc., ensuring that the tiles remain stable during the scanning process to improve measurement accuracy. The processing equipment is typically a computer or dedicated control system that can summarize and analyze the data from the laser sensors. Based on the received tile surface height information, it calculates the height difference between each point to determine whether the tile surface flatness meets the standard.
[0038] Specifically, during the scanning process, a laser transmitter emits a beam of light onto the tile surface. A receiver receives the reflected light and calculates the distance of the light spot. Each laser sensor senses the height of a specific location on the tile surface and transmits this data to a processing device. Because the laser sensors are arranged sequentially along a first direction, the coordinate values of each light spot on the tile surface in the first direction X are different. This enables precise measurement of height variations along this direction. The first direction X refers to a horizontal direction along the tile surface and can be understood as the horizontal arrangement of the laser sensors in the device. Each sensor has a different coordinate value in the first direction, meaning that they measure different lateral locations on the tile surface. The second direction Y is also a direction within the plane of the tile surface, but it represents the arrangement of the different laser scanning arrays. Arranging the laser scanning arrays sequentially allows coverage of a larger area on the tile surface, ensuring that the entire tile can be measured. The first and second directions can be perpendicular or non-perpendicular, as long as the coordinate values of the light spots in the first direction are different. In one embodiment, the first and second directions are perpendicular.
[0039] In the same array, each laser sensor is arranged in sequence in the X direction to ensure that multiple points on the tile surface along this direction can be measured simultaneously. The coordinates of each laser sensor 101 in the X direction are different to ensure that the light points do not overlap with each other, ensuring the accuracy of the tile surface measurement. Multiple laser scanning arrays are arranged in sequence along the second direction Y, and the coordinate values of the light points of each laser sensor in the first direction are different. As long as the number of laser scanning arrays is large enough, the interval between the light points of each laser sensor can be reduced as much as possible, thereby obtaining all-round flatness data of the tile surface and significantly improving the test accuracy. Compared with 3D laser line scanning, the cost of the test equipment using this application will be greatly reduced.
[0040] When the equipment is in operation, a conveyor moves the tiles at a constant speed. When a tile enters the scanning range of the laser scanning array, multiple laser sensors begin operating simultaneously, projecting laser beams onto the tile surface, forming light spots. The height information corresponding to each light spot is captured by the sensor through laser reflection and transmitted via a data line to a processing device. The laser scanning array covers the entire tile surface, and by scanning multiple rows of light spots, it can construct a three-dimensional height map of the tile surface. The processing device processes the feedback data from each laser sensor and calculates the flatness of the tile surface. By comparing the height differences between different points on the surface, it can determine whether the tile is flat and generate a flatness report.
[0041] The above-mentioned tile flatness testing equipment realizes dense laser projection on the tile surface by using a laser scanning array composed of multiple laser sensors arranged along a first direction. The laser beam projected by each laser sensor forms a light spot on the tile surface. Due to the precise arrangement of the sensors, the coordinate values of each light spot in the first direction are different. Multiple laser scanning arrays are further arranged along the second direction, so that the light spots in the entire detection area are denser. The reduction in the spacing between light spots means that each laser sensor can cover a smaller tile surface unit and can capture subtle surface changes. For example, if only a single row of laser scanning arrays is used, the spacing between sensors is large, and there may be local concave and convex details on the tile surface that are not captured. However, through the combination of multiple arrays, a high-density scanning grid is formed to ensure that even the slightest height changes on the tile surface can be accurately detected.
[0042] In one embodiment, Figure 2 and 3 , further comprising a bracket mechanism 40 and a fixing mechanism 50;
[0043] The bracket mechanism 40 is disposed above the conveying device 20 ; one end of the fixing mechanism 50 is used to set each laser sensor 101 , and the other end is fixed to the bracket mechanism 40 .
[0044] Specifically, the bracket mechanism is arranged above the conveying device, and its main function is to provide fixed support for the laser scanning array to ensure that the laser sensor can maintain a stable working position. The bracket mechanism 40 can be designed as a structure with adjustable height or angle to ensure that the laser sensor array can be adjusted according to the thickness and specifications of the tiles to obtain the best detection effect. For example, by adjusting the height of the bracket mechanism, the laser sensor 101 can maintain a suitable distance from the surface of tiles of different thicknesses to avoid affecting the detection results due to distance errors. The bracket mechanism can also adopt a stable design to ensure that when running on the production line, the vibration of the conveying device or other external interference will not affect the working accuracy of the laser sensor. In this way, the bracket mechanism can ensure that the equipment maintains a high-precision and stable operating state during long-term detection.
[0045] Furthermore, the main function of the fixing mechanism is to firmly mount the laser sensor in a suitable position and fix it to the bracket mechanism. One end of the fixing mechanism is used to mount the laser sensor. Through the fixing mechanism, multiple laser sensors can maintain precise spacing and angles, ensuring that each laser sensor can emit a stable laser beam to the tile surface and correctly receive the reflected signal. The other end of the fixing mechanism is connected to the bracket mechanism to ensure that the entire laser scanning array can be stably installed and operated on the bracket. The fixing mechanism can be any mechanism in the field that can achieve the above functions, and will not be described in detail here.
[0046] In one embodiment, the number of laser scanning arrays is two.
[0047] Furthermore, the bracket mechanism includes a first bracket and a second bracket; the laser scanning array includes a first laser scanning array and a second laser scanning array; the first laser scanning array is arranged on a side of the first bracket close to the second bracket, and the second laser scanning array is arranged on a side of the second bracket close to the first bracket.
[0048] Specifically, there are two laser scanning arrays, namely the first laser scanning array and the second laser scanning array. Their combined use can further optimize the flatness detection of the tile surface. In order to achieve the best scanning effect, this embodiment also includes two brackets, namely the first bracket and the second bracket, to provide a reasonable installation position and stable support for the laser scanning array. The first laser scanning array is arranged on the first bracket and is close to one side of the second bracket. The second laser scanning array is arranged on the second bracket and is close to one side of the first bracket. This design allows the first laser scanning array and the second laser scanning array to be arranged close to each other, forming a compact and efficient scanning area.
[0049] In one embodiment, the intervals between the laser sensors in each laser scanning array are the same;
[0050] The distance between the first laser sensor in the first laser scanning array and the front end of the first bracket is the first distance; the distance between the first laser sensor in the second laser scanning array and the front end of the second bracket is the second distance; the difference between the first distance and the second distance is less than the width of the laser sensor.
[0051] Specifically, the difference between the first distance and the second distance is less than the width of the laser sensor, so that the coordinate values of the light spots in the first direction are different, thereby being able to cover more tile surfaces. In one embodiment, the interval between the laser sensors in each laser scanning array is 0, that is, there is no gap between the bodies of the laser sensors, which does not mean that there is no gap between the light spots of the laser sensors, so that more laser sensors can be set in a row. In one embodiment, the difference between the first distance and the second distance is half the width of the laser sensor. In one embodiment, the number of laser sensors in the first laser scanning array is 7, and the number of laser sensors in the second laser scanning array is 8. When the width of the tile remains unchanged, the more light spots that illuminate the tile, the more data collected. Traditionally, there are 7 light spots in a single row, and the equipment of the present application can achieve 15 simultaneous detections. It should be noted that if the accuracy needs to be further improved, 3 arrays, 4 arrays, etc. can be set, as long as the coordinate values of the light spots in the first direction are different.
[0052] In one embodiment, the device further includes a display device connected to the processing device.
[0053] The units described as separate components may or may not be physically separate, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed across multiple network units. Some or all of these units may be selected to achieve the purpose of this embodiment according to actual needs.
[0054] It should be noted that, in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations. Moreover, the terms "comprises," "comprising," or any other variations thereof are intended to cover non-exclusive inclusion, so that a process, method, article, or device comprising a series of elements includes not only those elements, but also other elements not explicitly listed, or elements inherent to such process, method, article, or device. In the absence of further limitations, an element defined by the phrase "comprising a ..." does not exclude the presence of other identical elements in the process, method, article, or device comprising the element.
[0055] The foregoing is merely a list of specific embodiments of the present application, intended to enable those skilled in the art to understand or implement the present application. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the present application. Therefore, the present application is not limited to the embodiments shown herein, but is intended to conform to the broadest scope consistent with the principles and novel features of the present application.
Claims
1. A tile flatness testing device, characterized in that: include: Multiple laser scanning arrays; any of the laser scanning arrays includes multiple laser sensors arranged sequentially along a first direction; The laser scanning arrays are arranged in sequence along the second direction; wherein the first direction and the second direction are located in the same plane parallel to the surface of the tile; each laser sensor projects a light spot on the surface of the tile; the coordinate values of each light spot in the first direction are different; the tile is moved by the conveying device and passes through the scanning range of each laser scanning array; The processing equipment is connected to each of the laser sensors respectively.
2. The tile flatness testing device according to claim 1, characterized in that: Also includes a bracket mechanism and a fixing mechanism; The bracket mechanism is arranged above the conveying device; one end of the fixing mechanism is used to set each of the laser sensors, and the other end is fixed to the bracket mechanism.
3. The tile flatness testing device according to claim 1 or 2, characterized in that: The number of the laser scanning arrays is 2.
4. The tile flatness testing device according to claim 2, characterized in that: The support mechanism includes a first support and a second support; the laser scanning array includes a first laser scanning array and a second laser scanning array; The first laser scanning array is arranged on a side of the first bracket close to the second bracket, and the second laser scanning array is arranged on a side of the second bracket close to the first bracket.
5. The tile flatness testing device according to claim 4, characterized in that: The first direction and the second direction are perpendicular.
6. The tile flatness testing device according to claim 4, characterized in that: The intervals between the laser sensors in each of the laser scanning arrays are the same; The distance between the first laser sensor in the first laser scanning array and the first end of the first bracket is a first distance; the distance between the first laser sensor in the second laser scanning array and the first end of the second bracket is a second distance; the difference between the first distance and the second distance is less than the width of the laser sensor.
7. The tile flatness testing device according to claim 6, characterized in that: The interval between the laser sensors in each laser scanning array is 0.
8. The tile flatness testing device according to claim 6, characterized in that: A difference between the first distance and the second distance is half the width of the laser sensor.
9. The tile flatness testing device according to claim 6, characterized in that: The number of laser sensors in the first laser scanning array is 7, and the number of laser sensors in the second laser scanning array is 8.
10. The tile flatness testing device according to claim 1, characterized in that: The device further includes a display device connected to the processing device.