Test support

Abstract

The utility model provides a test support, and relates to the field of test equipment. The test support comprises a rotatable platform, an upper support and a lower support, the rotatable platform is provided with an accommodating space, the accommodating space is used for positioning and installing a to-be-tested piece along the horizontal direction, and the to-be-tested piece is configured to be rotatably positioned in the accommodating space along a preset angle range in the horizontal direction; the rotatable platform is rotatably installed on the upper support in the length direction of the rotatable platform. The lower support is located below the upper support, and the upper support is configured to reciprocate in the vertical direction relative to the lower support. By adopting the scheme, the traditional mainboard test barrier is broken through, and the integrated lifting platform is combined with the rotatable test frame, so that the to-be-tested piece (mainboard) is prevented from moving back and forth to be damaged in the test process, and the test efficiency is improved.

Description

Technical Field

[0001] The present disclosure relates to the field of testing equipment, and in particular to a testing bracket. Background Art

[0002] Measuring the motherboard's power supply performance for high overload currents requires multiple load cables. Stacking these cables can easily tilt the motherboard, making testing difficult. Furthermore, the motherboard's direct contact with the surface can easily cause solder beads to come into contact, causing short circuits and damage. Secondly, when testing the motherboard's control module, a fan is typically mounted on the underside of the motherboard for heat dissipation. However, due to its large size, fans are difficult to secure, so copper supports are often used. However, these supports are not securely fixed, and fan rotation can cause them to fall off. Moving the motherboard can also cause them to shift and become loose. Furthermore, for some signal point tests, the probe holder must be placed on the motherboard. However, motherboard movement or human contact can cause the probe to deviate from the test point, affecting test efficiency and potentially damaging the motherboard. Utility Model Content

[0003] The present disclosure provides a test bracket to at least solve the above technical problems existing in the prior art.

[0004] According to a first aspect of the present disclosure, a test bracket is provided, comprising: a rotatable platform, an upper bracket and a lower bracket, wherein the rotatable platform has a accommodating space, the accommodating space is used to accommodate a test piece, and the test piece is configured to be rotatably adjusted and positioned along its own test surface within the accommodating space; the rotatable platform is rotatably positioned and mounted on the upper bracket, and rotates within a preset angle range relative to its own central axis; the lower bracket is located below the upper bracket, and the upper bracket is configured to perform reciprocating motion in a vertical direction relative to the lower bracket.

[0005] In one embodiment, the test bracket also includes a connecting rod and an elastic positioning assembly, at least a portion of the structure of the connecting rod is movably locked with the rotatable platform, at least a portion of the structure of the connecting rod is locked with the elastic positioning assembly, the elastic positioning assembly is used to match the positioning hole of the test piece for positioning engagement, and the elastic positioning assembly has an adjustable clamping space.

[0006] In one embodiment, the elastic positioning assembly includes a snap-on structure and a pre-tightening spring, the snap-on structure is configured to snap into the positioning hole of the test piece along a preset direction, the pre-tightening spring is sleeved on the outer periphery of the snap-on structure, and the pre-tightening spring reserves the adjustable clamping space between its own axial direction and at least part of the structure of the snap-on structure.

[0007] In one embodiment, the test bracket further includes a first slide, the first slide being formed on the connecting rod, the elastic positioning assembly further including a slider portion and a first locking nut threadedly connected to the bottom of the slider portion, the slider portion being located below the buckle structure, the lower structure of the buckle structure protruding from the slider portion along its own radial direction, and the slider portion being slidably connected to the inner wall of the first slide;

[0008] The test bracket also includes a second slide and a second locking nut slidably connected to the second slide, the second slide is formed on the surface of the rotatable platform, and the second locking nut is configured to pass through the first slide and be movably locked with the connecting rod.

[0009] In one embodiment, the test bracket further includes a lifting assembly connected between the upper bracket and the lower bracket, and the upper bracket performs vertical reciprocating motion relative to the lower bracket through the lifting assembly.

[0010] In one embodiment, the lifting assembly includes a driving shaft, a first gear that is coaxially driven with the driving shaft along the horizontal direction, a second gear that is meshed with the first gear and a screw that is coaxially threaded with the second gear along the vertical direction, and the top of the screw is mounted on the upper bracket.

[0011] In one embodiment, the test bracket also includes a movable support structure, a sliding rod and a third slide. The movable support structure is fixedly connected to the middle of the sliding rod and is located below the rotatable platform. The third slide is formed on the side of the rotatable platform. The two ends of the sliding rod are respectively slidably connected to the third slides on both sides; the movable support structure is used to support the cooling fan.

[0012] In one embodiment, the test bracket further includes a guide assembly, which includes a plurality of sleeve structures and a plurality of guide column structures, each of the sleeve structures is located below the upper bracket, each of the guide column structures is located above the lower bracket, and one of the sleeve structures is correspondingly slidably mounted on the outside of one of the guide column structures.

[0013] In one embodiment, the test bracket further includes a rotating screw, which is rotatably connected between the rotatable platform and the upper bracket. The test bracket further includes a fixing knob, which passes through the top surface of the upper bracket and abuts against the outer wall of the rotating screw.

[0014] In one embodiment, the test bracket further includes a flexible carbon rod and a support frame slot, one end of the flexible carbon rod is mounted on the upper bracket, and the other end of the flexible carbon rod has a flexible positioning fixture; the support frame slot is used to support the test display screen.

[0015] The test stand disclosed herein includes, but is not limited to, a test stand suitable for motherboard testing. A motherboard to be tested is positioned and mounted within the accommodation space of a rotatable platform. Since the rotatable platform is rotatably mounted on an upper support, the upper support can reciprocate vertically relative to the lower support. Thus, the rotatable platform, upper support, and lower support form an integrated, stable structure for motherboard testing. The motherboard to be tested can also rotate relative to the upper support with the rotatable platform to facilitate rotation to an angle suitable for testing. Furthermore, the rotatable platform can also reciprocate vertically relative to the lower support with the upper support. Thus, the motherboard to be tested can be adjusted in both rotation angle and vertical height with the rotatable platform. Furthermore, since the rotatable platform, upper support, and lower support form an integrated, stable structure for motherboard testing, even if load lines are stacked, the motherboard under test will not tilt, and the motherboard can be prevented from directly contacting the desktop. This approach breaks through the barriers of traditional motherboard testing by combining an integrated lifting platform with a rotatable test stand. This prevents damage to the motherboard (motherboard) caused by back-and-forth movement during testing and improves test efficiency.

[0016] It should be understood that the contents described in this section are not intended to identify the key or important features of the embodiments of the present disclosure, nor are they intended to limit the scope of the present disclosure. Other features of the present disclosure will become readily understood through the following description. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] The above and other objects, features and advantages of the exemplary embodiments of the present disclosure will become readily understood by reading the detailed description below with reference to the accompanying drawings, in which several embodiments of the present disclosure are shown by way of example and not limitation, wherein:

[0018] In the drawings, the same or corresponding reference numerals denote the same or corresponding parts.

[0019] Figure 1 A schematic diagram of the axial structure of the test stand according to an embodiment of the present disclosure, in which part of the structure is hidden, is shown;

[0020] Figure 2 A schematic diagram of the axial structure of the upper bracket and the lifting assembly of the test bracket according to the embodiment of the present disclosure is shown;

[0021] Figure 3 A schematic diagram of the axial structure of the lower bracket in the test bracket according to an embodiment of the present disclosure is shown;

[0022] Figure 4 A schematic diagram of the axial structure of the connecting rod and the elastic positioning assembly in the test bracket according to an embodiment of the present disclosure is shown;

[0023] Figure 5 A schematic diagram of the axial structure of the movable support structure relative to the rotatable platform in the test stand according to an embodiment of the present disclosure is shown.

[0024] Description of the numbers in the figure:

[0025] 001-test bracket; 10-upper bracket; 20-lower bracket; 30-rotatable platform; 31-accommodating space; 32-second slide; 33-third slide; 34-rotating screw; 35-fixing knob; 40-test piece; 50-connecting rod; 51-first slide; 60-elastic positioning assembly; 61-snapping structure; 62-preload spring; 63-adjustable clamping space; 64-slider; 65-first locking nut; 70-second locking nut; 80-lifting assembly; 81-driving shaft; 82-first gear; 83-second gear; 84-screw; 85-connecting rod; 86-handle; 11-movable support structure; 12-slide; 13-sleeve structure; 14-flexible carbon rod; 21-guide column structure; 22-support frame slot. DETAILED DESCRIPTION

[0026] To make the purposes, features, and advantages of the present disclosure more apparent and understandable, the technical solutions in the embodiments of the present disclosure will be clearly and completely described below in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present disclosure, not all of them. All other embodiments obtained by those skilled in the art based on the embodiments of the present disclosure without creative work shall fall within the scope of protection of the present disclosure.

[0027] A laptop computer typically consists of a display side and a system side. The display side is the side with the display screen, and the system side is the side with the keyboard. Generally, the display side and system side can be pivoted to open and close. The system side comprises an upper housing and a lower housing, with the keyboard mounted in the upper housing. Various functional components are housed within the interior space enclosed by the upper and lower housings. For example, these functional components include a motherboard, which has test points for electrically connecting various functional circuits. Before shipment, the motherboard undergoes performance testing to ensure stable performance.

[0028] During the motherboard testing process, auxiliary fixtures are generally used, which may cause the following problems:

[0029] When measuring whether the motherboard's power supply performance is normal, when the overload current is large, multiple pull-up wires are required. When these pull-up wires are stacked together, it is easy for the motherboard to tilt, making testing difficult. In addition, when the motherboard directly contacts the desktop, it is easy for the solder beads to fall off during welding to come into contact, causing the motherboard to short-circuit and damage. When testing the motherboard's control module, a fan is usually fixed to the bottom of the motherboard for heat dissipation. However, due to the large size of the fan, it is difficult to fix it, so copper pillars are often used for support. However, the copper pillars are not firmly fixed, and the rotation of the fan can cause the copper pillars to fall off; moving the motherboard can also cause the copper pillars to shift and become loose. In addition, for some signal point tests, the probe holder needs to be placed on the motherboard. Due to the movement of the motherboard or human touch, the probe can deviate from the test point, affecting the test efficiency and posing a risk of damaging the motherboard.

[0030] To alleviate the above problems, refer to Figure 1-Figure 5 The embodiment of the present disclosure provides a test bracket 001. When used, the motherboard can be rotatably mounted on the test bracket 001, and can adapt to motherboards of different models and thicknesses for testing.

[0031] Specifically, the test bracket 001 of the embodiment of the present disclosure includes: a rotatable platform 30, which is constructed as a planar structure, having a accommodating space 31, and a test piece 40. For example, the test piece 40 is a mainboard, and the mainboard is accommodated in the accommodating space 31. The test piece 40 can be rotatably adjusted and positioned along its own test surface in the accommodating space 31; in this way, when the loading wires are stacked during the test of the mainboard, the test angle of the mainboard can be appropriately adjusted to avoid the loading wires pulling on the mainboard. Furthermore, the rotatable platform 30 is rotatably positioned and mounted on the upper bracket 10, and can rotate within a preset angle range relative to its own central axis; the lower bracket 20 is located below the upper bracket 10, and the upper bracket 10 is configured to perform reciprocating motion in the vertical direction relative to the lower bracket 20. In this way, the motherboard can follow the rotatable platform 30 and the upper bracket 10 to adjust its height relative to the lower bracket 20, which can prevent the motherboard from contacting the desktop, and further prevent the motherboard from directly contacting the desktop and easily touching the solder beads that fall off during welding, causing damage to the motherboard due to a short circuit.

[0032] Considering the specific implementation scheme of the test piece 40 being able to be rotatably adjusted and positioned along its own test surface within the accommodating space 31, the test bracket 001 of the embodiment of the present disclosure also includes a connecting rod 50 and an elastic positioning component 60, wherein one connecting rod 50 is correspondingly provided with an elastic positioning component 60, and the elastic positioning component 60 is rotatably connected to the rotatable platform 30 through the connecting rod 50, and the elastic positioning component 60 is used to position and lock with the positioning hole on the mainboard. Specifically, at least part of the structure of the connecting rod 50 is movably locked with the rotatable platform 30, and at least part of the structure of the connecting rod 50 is locked with the elastic positioning component 60. Exemplarily, the elastic positioning component 60 is used to match the positioning hole of the test piece 40 for positioning and engagement, and the elastic positioning component 60 has an adjustable clamping space 63, and the adjustable clamping space 63 is used to clamp mainboards of different thicknesses along its own axial direction, so that it can match the testing requirements of mainboards of different models.

[0033] Furthermore, considering the specific structure of the elastic positioning assembly 60, the elastic positioning assembly 60 of the disclosed embodiment includes a snap structure 61 and a preload spring 62. The snap structure 61 is configured to snap into place with the positioning hole of the test piece 40 along a predetermined direction. The preload spring 62 is sleeved around the outer periphery of the snap structure 61, and an adjustable clamping space 63 is reserved between the preload spring 62 and at least a portion of the snap structure 61 along its own axial direction. In this way, the elastic positioning assembly 60 positions the motherboard within the accommodation space 31 of the rotatable platform 30 via the snap structure 61. The elastic positioning assembly 60, through the preload spring 62, achieves an adjustable clamping space 63 to accommodate the testing needs of motherboards of varying thicknesses.

[0034] Considering that different models of motherboards have different dimensions and different positions of positioning holes, in order to adapt to the diversity of motherboard types, the elastic positioning assembly 60 is set to be able to move to any position along the length direction of the connecting rod 50. Specifically, the test bracket 001 of the embodiment of the present disclosure also includes a first slide 51 directly constructed inside the connecting rod 50. The first slide 51 can be directly formed on the connecting rod 50. Correspondingly, the elastic positioning assembly 60 also includes a slider 64 and a first locking nut 65 threadedly connected to the bottom of the slider 64. The slider 64 is located below the snap structure 61. The lower structure of the snap structure 61 protrudes from the slider 64 along its own radial direction. The slider 64 is slidably connected to the inner wall of the first slide 51. In this way, the elastic positioning assembly 60 can realize movement adjustment to any position along its own length direction along the first slide 51 of the connecting rod 50 through the slider 64. When the elastic positioning assembly 60 is adjusted to the adaptation position of the first slide 51 on the connecting rod 50, the first locking nut 65 is screwed to fix the elastic positioning assembly 60 in the adaptation position.

[0035] Considering the variety of positioning hole positions on the mainboard, in the test stand 001 of the present embodiment, one end of the connecting rod 50 can be moved and adjusted along the length of the rotatable platform 30 to adjust the rotation center position, so that the connecting rod 50 drives the elastic positioning assembly 60 to have a wide range of movement within the aforementioned accommodating space 31. Specifically, the test stand 001 also includes a second slide 32 and a second locking nut 70 slidably connected to the second slide 32. The second slide 32 can be directly formed through the surface of the rotatable platform 30 along its own thickness direction. For example, the surface of the rotatable platform 30 is constructed as an internal hollow frame structure. The second locking nut 70 can pass through the first slide 51 and be movably locked with the connecting rod 50. In this way, one end of the connecting rod 50 can be adjusted to the lateral adaptation position along the length of the rotatable platform 30. When one end of the connecting rod 50 moves to the lateral adaptation position, the second locking nut 70 is screwed to position and lock the connecting rod 50 in the lateral adaptation position.

[0036] Considering the specific scheme of the movement of the upper support 10 relative to the lower support 20, the test stand 001 in the embodiment of the present disclosure further includes a lifting assembly 80. The lifting assembly 80 is connected between the upper support 10 and the lower support 20. The upper support 10 performs vertical reciprocating motion relative to the lower support 20 via the lifting assembly 80. It should be noted that the lifting assembly 80 can be automatically driven by a drive mechanism, or the lifting assembly 80 can be manually driven.

[0037] Specifically, the lifting assembly 80 includes a driving shaft 81, a first gear 82 that is coaxially driven with the driving shaft 81 in the horizontal direction, a second gear 83 that is meshed with the first gear 82, and a screw 84 that is coaxially threadedly connected to the second gear 83 in the vertical direction. The top of the screw 84 is mounted on the upper bracket 10. When the lifting assembly 80 adopts an automatic drive transmission mode, the driving shaft 81 can be connected to a drive motor through a speed reducer. When the lifting assembly 80 adopts a manual transmission mode, the driving shaft 81 can be synchronously driven and connected to a handle through a coupling or a structure with the same function. Manually shaking the handle can achieve clockwise or counterclockwise rotation of the driving shaft 81, thereby achieving clockwise or counterclockwise rotation of the first gear 82, and then achieving clockwise or counterclockwise spiral movement of the screw 84 by the second gear 83 relative to the upper bracket 10, ultimately achieving upward or downward movement of the upper bracket 10 relative to the lower bracket 20.

[0038] Considering that the upper support 10 can perform stable reciprocating movement relative to the lower support 20, the test stand 001 of the present embodiment also includes a guide assembly. The guide assembly includes multiple sleeve structures 13 and multiple guide post structures 21. Each sleeve structure 13 is located below the upper support 10, and each guide post structure 21 is located above the lower support 20. Each sleeve structure 13 slides onto the outside of each guide post structure 21. In this way, the sleeve structure 13 can perform vertical guiding movement along the guide post structure 21.

[0039] During motherboard testing, in order to reduce the temperature of the motherboard, the test stand 001 of the disclosed embodiment is matched with a cooling fan. To alleviate the problem of the cooling fan being difficult to fix and easy to fall off, the test stand 001 of the disclosed embodiment also includes a movable support structure 11, a slide bar 12, and a third slide 33. The movable support structure 11 is fixedly connected to the middle of the slide bar 12 and is located below the rotatable platform 30. The third slide 33 is formed on the side of the rotatable platform 30. The two ends of the slide bar 12 are respectively slidably connected to the third slide 33 on both sides. The movable support structure 11 is used to support the cooling fan. Exemplarily, the movable support structure 11 is a flat plate structure that matches the cooling fan.

[0040] Considering the specific solution of the adjustable rotation angle of the rotatable platform 30 relative to the upper bracket 10, the test bracket 001 of the embodiment of the present disclosure further includes a rotating screw 34, which is rotatably connected between the rotatable platform 30 and the upper bracket 10. The test bracket 001 further includes a fixed knob 35, which passes through the top surface of the upper bracket 10 and abuts against the outer wall of the rotating screw 34. Exemplarily, at least a portion of the structure of the rotating screw 34 is fixedly connected to the side of the rotatable platform 30, and at least a portion of the structure of the rotating screw 34 is threadedly connected to the inner side of the upper bracket 10. By turning the fixed knob 35 clockwise or counterclockwise, the abutment positioning of the rotating screw 34 is achieved.

[0041] Taking into account the different positions of the test points of the motherboard test, and the motherboard test generally matches the application of the display screen, the test bracket 001 of the embodiment of the present disclosure also includes a flexible carbon rod 14 and a support frame slot 22. One end of the flexible carbon rod 14 is installed on the upper bracket 10, and the other end of the flexible carbon rod 14 has a flexible positioning fixture; the support frame slot 22 is used to support the display screen for testing.

[0042] The test bracket 001 of the embodiment of the present disclosure adopts an integrated lifting device formed by the upper bracket 10 and the lower bracket 20. For example, the first gear 82 and the second gear 83 adopt a bevel gear set. The lifting and lowering control of the lifting assembly 80 is driven by the bevel gear located at the bottom to rotate and drive the upper bracket 10 and the rotatable platform 30 to rise and fall synchronously. For example, by rotating the handle rocker, the first gear 82 directly connected to the handle rocker is rotated, and the second gear 83 is driven to rotate through the engagement between the gears. At the same time, the rotation of the second gear 83 drives the rotation of the screw 84, thereby realizing the lifting and lowering of the screw 84 relative to the upper bracket 10. The lifting assembly 80 of the embodiment of the present disclosure is arranged in pairs between the upper bracket 10 and the lower bracket 20. In this way, the first gears 82 on both sides achieve the purpose of synchronous rotation through the cylindrical connecting rod between the two, thereby meeting the requirement of arbitrarily adjusting the height of the entire test platform and facilitating testing. Test bracket 001 is provided with support bracket slots 22, allowing the number of brackets to be adjusted as needed. Furthermore, two flexible carbon rod holders are mounted on upper bracket 10, each holding a carbon rod. This allows for hands-free motherboard testing throughout the entire process, with adjustable test angles. This simplified operation significantly improves testing efficiency. Considering that motherboard testing typically involves a display screen, these support bracket slots 22 meet the needs of display screen applications.

[0043] Furthermore, the rotatable platform 30 can achieve 360° rotation and can be fixed at any angle. Its exterior is fixed by fixing knobs 35 on the upper ends of both sides of the upper bracket 10. The internal storage space 31 of the rotatable platform 30 is provided with a slide-type movable bracket that drives the elastic positioning assembly 60. During actual testing, there will be many vias on the motherboard, but the arrangement of the vias is not fixed. By moving the second locking nut 70 on the second slide rail, one end of the connecting rod 50 is moved to an appropriate position. The elastic positioning assembly 60 is then moved along the first slide rail of the connecting rod 50 to the appropriate position. It is then engaged with the via on the motherboard through the snap structure 61. Due to the action of the preload spring 62, the preload spring 62 uses the elasticity of the spring to adapt to motherboards of different thicknesses, thereby preventing damage or pressure on the entire motherboard. In addition, a movable support structure 11 is provided below the rotatable platform 30. When testing the motherboard, heat dissipation requirements are often met. If the heat dissipation is poor, it will cause the computer to fail to start. Therefore, the movable support structure 11 can be used to fix the position of the fan, thereby solving the problem of the fan being loosely fixed on the motherboard, and accurately dissipating heat at places on the motherboard with poor heat dissipation.

[0044] In summary, the motherboard height can be raised / lowered reliably and stably through the integrated lifting platform, so that the motherboard test height can be adjusted; the motherboard can be rotated 360° through the rotatable platform 30, without the need for manual disassembly and installation back and forth; the structure for fixing the motherboard adopts a slide rail type adjustable telescopic fixation, and uses the vias on the motherboard to achieve all-round fixation; the fan is installed under the motherboard to be tested, and the heat dissipation of any direction of the motherboard is achieved through the movable support structure 11, ensuring the smooth progress of the test. Test fixtures are set on the four sides of the lifting platform, and the test range covers the entire surface of the motherboard, which is convenient for testing components. The test bracket 001 of the disclosed embodiment breaks the traditional motherboard test barriers and adopts an integrated lifting platform combined with a rotatable platform 30, which avoids damage to the motherboard caused by moving back and forth during the test and improves the test efficiency. The use scenario of this motherboard test bench is flexible, can meet the testing of different board types, has low manufacturing cost and high reliability.

[0045] It should be understood that the various forms of processes shown above can be used to reorder, add, or delete steps. For example, the steps described in this disclosure can be performed in parallel, sequentially, or in a different order, as long as the desired results of the technical solutions of this disclosure can be achieved, and this document is not limited here.

[0046] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features being referred to. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. Throughout the present disclosure, "plurality" means two or more, unless otherwise specifically defined.

[0047] The above description is merely a specific embodiment of the present disclosure, but the scope of protection of the present disclosure is not limited thereto. Any changes or substitutions that can be easily conceived by a person skilled in the art within the technical scope disclosed in this disclosure should be included in the scope of protection of the present disclosure. Therefore, the scope of protection of the present disclosure should be based on the scope of protection of the claims.

Claims

1. A test stand, characterized in that: include: The rotatable platform has a receiving space, wherein the receiving space receives a test piece, and the test piece is configured to be rotatably adjusted and positioned along its own test surface within the receiving space; An upper bracket, wherein the rotatable platform is rotatably positioned and mounted on the upper bracket and rotates within a preset angle range relative to its own central axis; The lower bracket is located below the upper bracket, and the upper bracket is configured to perform reciprocating motion in a vertical direction relative to the lower bracket.

2. The test stand according to claim 1, characterized in that The test bracket also includes a connecting rod and an elastic positioning assembly. At least a portion of the structure of the connecting rod is movably locked with the rotatable platform. At least a portion of the structure of the connecting rod is locked with the elastic positioning assembly. The elastic positioning assembly is used to match the positioning hole of the test piece for positioning engagement. The elastic positioning assembly has an adjustable clamping space.

3. The test stand according to claim 2, characterized in that: The elastic positioning assembly includes a snap-on structure and a pre-tightening spring. The snap-on structure is configured to engage with the positioning hole of the test piece along a preset direction. The pre-tightening spring is sleeved on the outer periphery of the snap-on structure. The pre-tightening spring reserves the adjustable clamping space between itself and at least part of the structure of the snap-on structure along its own axial direction.

4. The test stand according to claim 3, characterized in that: The test bracket further includes a first slideway, which is formed on the connecting rod. The elastic positioning assembly further includes a slider portion and a first locking nut threadedly connected to the bottom of the slider portion. The slider portion is located below the buckle structure. The lower structure of the buckle structure protrudes from the slider portion in its radial direction. The slider portion is slidably connected to the inner wall of the first slideway. The test bracket also includes a second slide and a second locking nut slidably connected to the second slide, the second slide is formed on the surface of the rotatable platform, and the second locking nut is configured to pass through the first slide and be movably locked with the connecting rod.

5. The test stand according to claim 1, characterized in that: The test bracket further includes a lifting assembly connected between the upper bracket and the lower bracket. The upper bracket performs vertical reciprocating motion relative to the lower bracket through the lifting assembly.

6. The test stand according to claim 5, characterized in that: The lifting assembly includes a driving shaft, a first gear that is coaxially driven with the driving shaft in the horizontal direction, a second gear that is meshed with the first gear and a screw that is coaxially threaded with the second gear in the vertical direction, and the top of the screw is installed on the upper bracket.

7. The test stand according to claim 1, characterized in that: The test bracket also includes a movable support structure, a sliding rod and a third slide. The movable support structure is fixedly connected to the middle of the sliding rod and is located below the rotatable platform. The third slide is formed on the side of the rotatable platform. The two ends of the sliding rod are respectively slidably connected to the third slide on both sides; the movable support structure is used to support the cooling fan.

8. The test stand according to claim 1, wherein: The test bracket also includes a guide assembly, which includes multiple sleeve structures and multiple guide column structures. Each sleeve structure is located below the upper bracket, and each guide column structure is located above the lower bracket. One sleeve structure is correspondingly slidably mounted on the outside of one guide column structure.

9. The test stand according to claim 1, characterized in that: The test bracket further includes a rotating screw, which is rotatably connected between the rotatable platform and the upper bracket. The test bracket further includes a fixing knob, which passes through the top surface of the upper bracket and abuts against the outer wall of the rotating screw.

10. The test stand according to claim 1, characterized in that: The test bracket also includes a flexible carbon rod and a support frame slot. One end of the flexible carbon rod is installed on the upper bracket, and the other end of the flexible carbon rod has a flexible positioning fixture; the support frame slot is used to support the test display screen.

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