Withstand voltage testing device for pulse support capacitor

Abstract

The utility model relates to a withstand voltage test device for a pulse support capacitor, the pulse support capacitor comprises a capacitor body and two pin ends oppositely arranged at two ends of the capacitor body, and the withstand voltage test device comprises a test box body, two test clamps which are arranged in the test box body at an interval and respectively clamp the two pin ends, and a connecting rod arranged between the two test clamps, the test clamp comprises a first clamp body arranged in the test box body, a second clamp body rotatably arranged on the first clamp body, a first metal test piece arranged at the front end of the first clamp body, a second metal test piece arranged at the front end of the second clamp body and a connecting wire connected with the first metal test piece and extending outwards to the outside of the test box body. The pin end is clamped between the first metal test piece and the second metal test piece, the withstand voltage test device limited by the utility model is simple in overall structure and convenient to operate, and the withstand voltage test efficiency of the pulse support capacitor is effectively improved.

Description

Technical Field

[0001] The utility model belongs to the field of capacitor performance testing equipment, and in particular relates to a pulse bracket capacitor withstand voltage testing device. Background Art

[0002] A capacitor is a device that holds electric charge. It is one of the electronic components used extensively in electronic equipment and is widely used in circuits for DC isolation, AC passing, coupling, bypassing, filtering, tuning circuits, energy conversion, and control. During the capacitor production process, a withstand voltage test device is required to test the withstand voltage performance of the capacitor, and a fixture is required to fix the capacitor.

[0003] Currently, the capacitor market is constantly expanding, and the types of capacitors are also increasing. In the past, the withstand voltage test of capacitors was done by workers manually. This test method results in low work efficiency and unstable test, which needs further improvement. Summary of the Invention

[0004] The purpose of the utility model is to overcome the shortcomings of the prior art and provide a pulse bracket capacitor withstand voltage test device.

[0005] The utility model adopts the following technical solutions:

[0006] A pulse bracket capacitor withstand voltage test device, the pulse bracket capacitor includes a capacitor body and two pin ends relatively arranged at both ends of the capacitor body, including a test box, two test clips spaced apart in the test box for respectively clamping the two pin ends, and a connecting rod arranged between the two test clips, the test clip includes a first clip arranged in the test box, a second clip rotatably arranged on the first clip, a first metal test piece arranged at the front end of the first clip, a second metal test piece arranged at the front end of the second clip, and a connecting wire connected to the first metal test piece and extending outwardly outside the test box. During testing, the pin ends are clamped between the first metal test piece and the second metal test piece.

[0007] Furthermore, the two test clips can be moved toward or away from each other and arranged in the test box, and further comprises a fixing mechanism arranged in the test box for fixing the two test clips.

[0008] Furthermore, the fixing mechanism includes two movable plates arranged in the test box body and movable toward or away from each other, two first fixing members respectively arranged on the two test clamps and connected to the relatively movable plates, and two second fixing members respectively arranged on the two test clamps and connected to the connecting rod.

[0009] Furthermore, the first fixing member includes a first clearance hole provided on the first clamp body, a first fixing screw hole provided on the movable plate opposite to the first clearance hole, and a first fixing bolt passing through the first clearance hole and engaging with the first fixing screw hole.

[0010] Furthermore, the test box body includes a strip-shaped movable groove extending upward from its bottom and a strip-shaped movable hole extending upward from the top surface of the movable groove to be opposite to the first clearance hole. The movable plate is movably arranged in the movable groove, and the first fixing bolt passes through the first clearance hole and the strip-shaped movable hole in sequence to be connected to the movable plate opposite to the movable groove.

[0011] Furthermore, the second fixing member includes a second clearance hole arranged on the connecting rod, a second fixing screw hole arranged on the second clamp body opposite to the second clearance hole, and a second fixing bolt passing through the second clearance hole and cooperating with the second fixing screw hole. The second clearance hole is a strip hole extending along the moving direction of the test clamp.

[0012] Furthermore, the test box is provided with a threading hole for the connecting wires to pass through.

[0013] Furthermore, the test box includes a test table, a test flap that is flippably arranged on the test table, and a connecting hinge connected to a side of the test table and a side of the test flap, and the two test clips are arranged on the test table.

[0014] Furthermore, the test flip cover includes a flip cover body rotatably connected to the test bench and a transparent cover arranged on the top of the flip cover body opposite to the test bench, and the connecting hinge is arranged between the flip cover body and the test bench.

[0015] Furthermore, a triangular clamping portion is formed at the front end of the second clamping body, the bottom surface of the clamping portion contacts the top surface of the first clamping body, and the second metal test piece is arranged on the clamping portion.

[0016] From the above description of the utility model, it can be seen that compared with the prior art, the beneficial effects of the utility model are: the present application limits the structure of the withstand voltage test device, sets a connecting rod to simultaneously control the opening and closing of the two test clips to simultaneously loosen or clamp the two pin ends, and specifically limits the structural composition of the test clip. Through the first test metal sheet and the second test metal sheet in contact with the pin end, and in conjunction with the connecting wire connected to the withstand voltage test instrument, the pulse bracket capacitor can be quickly tested for withstand voltage. The overall structure is simple and easy to operate, which effectively improves the withstand voltage test efficiency of the pulse bracket capacitor. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 Schematic diagram of the structure of the pressure test device Figure 1 ;

[0018] Figure 2 Schematic diagram of the structure of the pressure test device Figure 2 ;

[0019] Figure 3 Schematic diagram of the structure of the pressure test device Figure 3 ;

[0020] Figure 4 Schematic diagram of the structure of the pressure test device Figure 4 ;

[0021] Figure 5 for Figure 1 An enlarged schematic diagram of the middle part of the structure;

[0022] 1-test box, 2-test clip, 3-connecting rod, 4-movable plate, 5-first fixing part, 6-second fixing part, 7-pulse bracket capacitor, 11-test table, 12-test flip cover, 13-connecting hinge, 14-flip cover body, 15-transparent cover, 16-threading hole, 17-moving slot, 18-moving hole, 21-first clamp, 22-second clamp, 23-first metal test piece, 24-second metal test piece, 25-clamping part 51-first clearance hole, 52-first fixing screw hole, 53-first fixing bolt, 61-second clearance hole, 62-second fixing screw hole, 63-second fixing bolt, 71-capacitor body, 72-pin end. DETAILED DESCRIPTION

[0023] The present invention is further described below through specific implementation methods.

[0024] Reference Figures 1 to 5 As shown, a pulse bracket capacitor withstand voltage test device includes a test box 1, two test clamps 2 that can be moved toward or away from each other and arranged in the test box 1, a connecting rod 3 arranged between the two test clamps 2, and a fixing mechanism arranged in the test box 1 for fixing the two test clamps 2, wherein the pulse bracket capacitor 7 includes a capacitor body 71 and two pin ends 72 relatively arranged at both ends of the capacitor body 71. During testing, the two test clamps 2 respectively clamp the two pin ends 72.

[0025] The test box 1 includes a test table 11, a test flap 12 that can be flipped and set on the test table 11, and a connecting hinge 13 connected to the side of the test table 11 and the side of the test flap 12. Two test clips 2 are movably set on the test table 11; specifically, the test flap 12 includes a flap body 14 that is rotatably connected to the test table 11 and a transparent cover 15 that is set on the top of the flap body 14 and opposite to the test table 11. The connecting hinge 13 is set between the flap body 14 and the test table 11. By limiting the structure of the test box 1 and setting the flip-up test flap 12, the withstand voltage test of the pulse bracket capacitor 7 can be carried out in a closed environment to ensure the accuracy of the test results.

[0026] The test clip 2 includes a first clamping body 21 arranged on the test table 11, a second clamping body 22 rotatably arranged on the first clamping body 21, a first metal test piece 23 arranged at the front end of the first clamping body 21, a second metal test piece 24 arranged at the front end of the second clamping body 22, and a connecting wire connected to the first metal test piece 23 and extending outward to the outside of the test box 1. During testing, the pin end 72 is clamped between the first metal test piece 23 and the second metal test piece 24; specifically, a triangular clamping portion 25 is formed at the front end of the second clamping body 22, so that the bottom surface of the clamping portion 25 contacts the top surface of the first clamping body 21, wherein the second metal test piece 24 is arranged on the bottom surface of the clamping portion 25 to ensure that when the test clip 2 clamps the pin end 72, the first metal test piece 23, the second metal test piece 24 and the pin end 72 are fully in contact, thereby ensuring the stability of the test results; further, a wire threading hole 16 for the connecting wire to pass through is provided on the test flip cover 12.

[0027] The fixing mechanism includes two movable plates 4 arranged in the test box body 1 and movable toward or away from each other, two first fixing members 5 respectively arranged on the two test clamps 2 and connected to the relatively movable plates 4, and two second fixing members 6 respectively arranged on the two test clamps 2 and connected to the connecting rod 3. By being arranged in the fixing mechanism and cooperating with the two movable test clamps 2, the test device can be applied to products of various specifications, thereby enhancing the compatibility of the device.

[0028] The first fixing member 5 includes a first clearance hole 51 set on the first clamp body 21, a first fixing screw hole 52 set on the movable plate 4 opposite to the first clearance hole 51, and a first fixing bolt 53 passing through the first clearance hole 51 and cooperating with the first fixing screw hole 52, wherein the test bench 11 includes a strip-shaped movable groove 17 extending upward from its bottom and a strip-shaped movable hole 18 extending upward from the top surface of the movable groove 17 to opposite to the first clearance hole 51. Specifically, the movable plate 4 can be movably set in the movable groove 18, and the first fixing bolt 53 passes through the first clearance hole 51 and the strip-shaped movable hole 18 in sequence to be connected with the movable plate 4 opposite to the movable groove 17.

[0029] The second fixing member 6 includes a second clearance hole 61 provided on the connecting rod 3, a second fixing screw hole 62 provided on the second clamp body 22 and opposite to the second clearance hole 61, and a second fixing bolt 63 passing through the second clearance hole 61 and engaging with the second fixing screw hole 62, wherein the second clearance hole 612 is a strip-shaped hole extending along the moving direction of the test clamp.

[0030] The specific working principle of the voltage withstand test is as follows:

[0031] Step 1: Connect the connecting wires on the two test clips 2 to the positive and negative terminals of the withstand voltage test instrument respectively, then flip the test cover 12 outward to open the test table 11;

[0032] Step 2: Press the connecting rod 3 downward to open the front ends of the two test clamps 2 simultaneously, and then place the two pin ends 72 of the pulse bracket capacitor 7 between the first test metal sheet 23 and the second test metal sheet 24 that are opposite to each other. Then, release the connecting rod 3, reset the test clamps 2, and clamp the pin ends 72 between the first test metal sheet 23 and the second test metal sheet 24;

[0033] Step 3, flip the test flap 12 inward so that it is reset and supported on the test bench 11, and then press the test switch of the withstand voltage test instrument to perform the test. After the test is completed, flip the test flap 12 outward, open the test bench 11, press the connecting rod 3, and open the two test clips 2 separately to take out the pulse bracket capacitor 7 and complete the withstand voltage test of the pulse bracket capacitor.

[0034] The present application defines the structure of the withstand voltage test device, sets a connecting rod 3 to simultaneously control the opening and closing of the two test clips 2 to simultaneously loosen or clamp the two pin ends 72, and specifically defines the structural composition of the test clip 2. The first test metal sheet 23 and the second test metal sheet 24 are in contact with the pin ends 72, and are combined with the connecting wires connected to the withstand voltage test instrument, so that the pulse bracket capacitor 7 can be quickly tested for withstand voltage. The overall structure is simple and easy to operate, which effectively improves the withstand voltage test efficiency of the pulse bracket capacitor 7.

[0035] The above description is merely a preferred embodiment of the present invention and therefore cannot be used to limit the scope of implementation of the present invention. In other words, equivalent changes and modifications made according to the scope of application of the present invention and the contents of the specification should still fall within the scope of the present invention.

Claims

1. A pulse support capacitor withstand voltage test device, the pulse support capacitor includes a capacitor body and two pin ends oppositely arranged at two ends of the capacitor body, characterized in that: The invention comprises a test box, two test clips arranged at intervals in the test box for respectively clamping two pin ends, and a connecting rod arranged between the two test clips. The test clip comprises a first clip arranged in the test box, a second clip rotatably arranged on the first clip, a first metal test piece arranged at the front end of the first clip, a second metal test piece arranged at the front end of the second clip, and a connecting wire connected to the first metal test piece and extending outwardly to the outside of the test box. During testing, the pin end is clamped between the first metal test piece and the second metal test piece.

2. The device for testing the withstand voltage of a pulse support capacitor according to claim 1, characterized in that: The two test clips can be moved toward or away from each other and are arranged in the test box. The test box also includes a fixing mechanism arranged in the test box for fixing the two test clips.

3. The device for testing the withstand voltage of a pulse support capacitor according to claim 2, characterized in that: The fixing mechanism includes two movable plates arranged in the test box body and movable toward or away from each other, two first fixing members respectively arranged on the two test clamps and connected to the relatively movable plates, and two second fixing members respectively arranged on the two test clamps and connected to the connecting rod.

4. The device for testing the withstand voltage of a pulse support capacitor according to claim 3, characterized in that: The first fixing member includes a first clearance hole provided on the first clamp body, a first fixing screw hole provided on the movable plate opposite to the first clearance hole, and a first fixing bolt passing through the first clearance hole and engaging with the first fixing screw hole.

5. The device for testing the withstand voltage of a pulse support capacitor according to claim 4, characterized in that: The test box body includes a strip-shaped movable groove extending upward from its bottom and a strip-shaped movable hole extending upward from the top surface of the movable groove to be opposite to the first clearance hole. The movable plate is movably arranged in the movable groove, and the first fixing bolt passes through the first clearance hole and the strip-shaped movable hole in sequence to be connected to the movable plate opposite to the movable groove.

6. The device for testing the withstand voltage of a pulse support capacitor according to claim 3, characterized in that: The second fixing member includes a second clearance hole set on the connecting rod, a second fixing screw hole set on the second clamp body opposite to the second clearance hole, and a second fixing bolt passing through the second clearance hole and cooperating with the second fixing screw hole. The second clearance hole is a strip hole extending along the moving direction of the test clamp.

7. The device for testing the withstand voltage of a pulse support capacitor according to claim 1, characterized in that: The test box body is provided with a threading hole for the connecting wires to pass through.

8. The pulse support capacitor withstand voltage test device according to claim 1, characterized in that: The test box comprises a test table, a test flap which can be flipped and arranged on the test table, and a connecting hinge connected to the side of the test table and the side of the test flap. The two test clips are arranged on the test table.

9. The pulse support capacitor withstand voltage test device according to claim 8, characterized in that: The test flip cover comprises a flip cover body rotatably connected to the test bench and a transparent cover arranged on the top of the flip cover body opposite to the test bench, and the connecting hinge is arranged between the flip cover body and the test bench.

10. The pulse support capacitor withstand voltage test device according to claim 1, characterized in that: A triangular clamping portion is formed at the front end of the second clamping body. The bottom surface of the clamping portion contacts the top surface of the first clamping body. The second metal test piece is arranged on the clamping portion.

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