Testing device and electronic equipment

Abstract

The utility model discloses a testing device and electronic equipment, and the testing device comprises a controller, a tested device, a probe, and a plurality of first relays. The controller is respectively connected with the probe through a plurality of first relays, and the probe is connected to a test point of the tested device; the controller controls the conduction of the target probe by switching the on-off state of the first relay, and collects a test signal of a target test point connected with the target probe through the target probe. The controller controls the on-off of the relay to control the target probe to acquire the test signal of the target test point, so that the probe does not need to be manually switched, the probe is intelligently switched to test, and the test is convenient and fast.

Description

Technical Field

[0001] The utility model relates to the technical field of test circuits, in particular to a test device and electronic equipment. Background Art

[0002] To detect defective power semiconductors during production, power semiconductor testing is required. During R&D or scientific research, key parameters of power semiconductors must be checked to ensure they meet standards. For example, parameters such as Tdon (turn-on delay), Tdoff (turn-off delay), Tr (rise time), and Tf (fall time) simulate the dynamic state of power semiconductors.

[0003] During the test process, it is necessary to switch the needle probe to collect test signals at different test points. However, in the prior art, the probe switching is performed manually, which is labor-intensive. Utility Model Content

[0004] Based on this, it is necessary to address the above problems and propose a testing device and electronic equipment, which controls the conduction of the target probe by switching the switch state of the first relay through the controller, so that the target probe can collect the test signal of the connected target test point, so that the probe can be switched effectively and automatically without human participation, thereby improving the test efficiency.

[0005] In a first aspect, the present invention provides a testing device, comprising a controller, a device under test, a probe, and a plurality of first relays;

[0006] The controller is connected to the probes respectively through a plurality of first relays, and the probes are connected to the test points of the device under test;

[0007] The controller controls the target probe to be turned on by switching the switch state of the first relay, and collects the test signal of the connected target test point through the target probe.

[0008] Optionally, the probe includes a low-voltage probe and a high-voltage probe;

[0009] The high-voltage probe is used to collect the high-voltage test signal of the target test point when the high-voltage probe is connected to the target test point to be tested currently, and the low-voltage probe is used to collect the low-voltage test signal of the target test point when the low-voltage probe is connected to the target test point to be tested currently.

[0010] Optionally, the testing device includes a driving power supply, a plurality of second relays and a plurality of pulse driving boards;

[0011] The controller is connected to a plurality of pulse drive boards respectively through a plurality of second relays, each of the pulse drive boards is connected to a test point of the device under test; the driving power supply is connected to the plurality of pulse drive boards respectively through a plurality of second relays;

[0012] The controller controls the target pulse driving board to be turned on by switching the switch state of the second relay, and outputs a test waveform to the connected test point through the target pulse driving board.

[0013] Optionally, the positive pole of the high-voltage probe is connected to the first end of the test point through multiple first relays, the negative pole of the high-voltage probe is connected to the second end of the test point through multiple first relays, the negative pole of the low-voltage probe is connected to the second end of the test point through multiple first relays, and the positive pole of the low-voltage probe is connected to the third end of the test point through multiple first relays.

[0014] Optionally, if the nth test point is connected in series with the mth test point, the plurality of first relays include a first target relay, a second target relay, a third target relay, a fourth target relay, and a Lith relay, wherein n and m are the numbers of the test points, i ranges from 1 to N, and N is the total number of test points;

[0015] The positive electrode of the high-voltage probe is connected to the first end of the first target relay and the first end of the second target relay respectively, and the second end of the first target relay is connected to the first end of the nth test point;

[0016] The negative pole of the high-voltage probe is respectively connected to the first end of the third target relay and the first end of the fourth target relay, the first end of the second target relay is connected to the first end of the first target relay, the first end of the third target relay is connected to the first end of the fourth target relay, the second end of the third target relay is respectively connected to the second end of the second target relay and the first end of the Ln-th relay, the second end of the Ln-th relay is respectively connected to the second end of the n-th test point and the first end of the m-th test point, and the second end of the fourth target relay is connected to the second end of the m-th test point.

[0017] Optionally, the plurality of first relays further include a fifth target relay, a sixth target relay, a seventh target relay, an eighth target relay, a Gi-th relay, and a Hi-th relay; wherein i ranges from 1 to N, and N is the total number of test points;

[0018] The positive electrode of the low-voltage probe is respectively connected to the first end of the fifth target relay and the first end of the seventh target relay, the first end of the fifth target relay is connected to the first end of the seventh target relay, the second end of the fifth target relay is connected to the first end of the Gn-th relay, the second end of the Gn-th relay is connected to the third end of the n-th test point, the second end of the seventh target relay is connected to the first end of the Gm-th relay, and the second end of the Gm-th relay is connected to the third end of the m-th test point;

[0019] The negative pole of the low-voltage probe is respectively connected to the first end of the sixth target relay and the first end of the eighth target relay, the first end of the sixth target relay is connected to the first end of the eighth target relay, the second end of the sixth target relay is connected to the first end of the Hn-th relay, the second end of the Hn-th relay is respectively connected to the second end of the n-th test point, the second end of the Ln-th relay and the first end of the m-th test point, the second end of the eighth target relay is connected to the first end of the Hm-th relay, and the second end of the Hm-th relay is respectively connected to the second end of the m-th test point and the second end of the fourth target relay.

[0020] Optionally, if the nth test point is not connected in series with other test points, the plurality of first relays include a second target relay, a third target relay, a fourth target relay, and an Lnth relay;

[0021] The positive electrode of the high-voltage probe is connected to the first end of the second target relay;

[0022] The negative pole of the high-voltage probe is respectively connected to the first end of the third target relay and the first end of the fourth target relay, the first end of the third target relay is connected to the first end of the fourth target relay, the second end of the third target relay is respectively connected to the second end of the second target relay and the first end of the Ln relay, the second end of the Ln relay is connected to the first end of the nth test point, and the second end of the fourth target relay is connected to the second end of the nth test point.

[0023] Optionally, the plurality of first relays further include a seventh target relay, an eighth target relay, a Gn-th relay, and an Hn-th relay;

[0024] The positive electrode of the low-voltage probe is connected to the first end of the seventh target relay, the second end of the seventh target relay is connected to the first end of the Gn-th relay, and the second end of the Gn-th relay is connected to the third end of the n-th test point;

[0025] The negative pole of the low-voltage probe is connected to the first end of the eighth target relay, the second end of the eighth target relay is connected to the first end of the Hn relay, and the second end of the Hn relay is respectively connected to the second end of the nth test point and the second end of the fourth target relay.

[0026] Preferably, the testing device further includes a host computer;

[0027] The host computer is connected to the controller and is used to send a signal of a test target test point to the controller;

[0028] The controller is used to receive the signal, control the target probe to be turned on by controlling the switch state of each first relay, and collect the test signal of the connected target test point through the target probe.

[0029] In a second aspect, the present invention provides an electronic device, which includes the testing device as described in the first aspect.

[0030] The following beneficial effects are achieved by adopting an embodiment of the utility model: a test device includes a controller, a device under test, a probe, and a plurality of first relays; the controller is connected to the probes via the plurality of first relays, the probes being connected to test points of the device under test; the controller switches the on / off state of the first relays to control the target probe to conduct, and the target probe collects a test signal from the connected target test point. The utility model controls the target probe to collect the test signal from the target test point by controlling the switching of the relays by the controller, thereby eliminating the need for manual probe switching and enabling intelligent probe switching for testing, which is convenient and efficient. BRIEF DESCRIPTION OF THE DRAWINGS

[0031] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0032] in:

[0033] Figure 1 This is a structural block diagram of a testing device in an embodiment of the present application;

[0034] Figure 2 This is a schematic diagram of a device under test in an embodiment of the present application;

[0035] Figure 3 This is a schematic diagram of the connection relationship of the series probes in the embodiment of the present application;

[0036] Figure 4 This is a schematic diagram of the connection relationship of a high-voltage probe with 7 test points in an embodiment of the present application;

[0037] Figure 5 This is a schematic diagram of the connection relationship of a low-voltage probe with 7 test points in an embodiment of the present application;

[0038] Figure 6 This is a schematic diagram of the connection relationship of a pulse drive board in an embodiment of the present application. DETAILED DESCRIPTION

[0039] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the embodiments described are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0040] The utility model provides a testing device, which can realize automatic switching of probes to test a device under test, and can be applied to any testing scenario.

[0041] Reference Figure 1 , Figure 1 This is a structural block diagram of a test device, such as Figure 1 As shown, the test device includes a controller, a device under test (DUT), a probe, and multiple first relays. The controller is connected to the probes through the multiple first relays, and the probes are connected to the test points of the device under test. The controller controls the target probe to conduct by switching the on / off state of the first relays, and collects the test signal of the connected target test point through the target probe. The probe includes a low-voltage probe and a high-voltage probe. The high-voltage probe is used to collect the high-voltage test signal of the target test point when the high-voltage probe is connected to the target test point currently under test, and the low-voltage probe is used to collect the low-voltage test signal of the target test point when the low-voltage probe is connected to the target test point currently under test.

[0042] In one possible design, the test device may include multiple groups of probes, wherein each group of probes includes a low-voltage probe and a high-voltage probe. The device under test may also include multiple test points, and each group of probes is connected to at least one test point. The controller connects each group of probes via multiple first relays, and each group of probes is connected to at least one test point. The controller controls the target probes to conduct by switching the switch states of the multiple first relays. When the target probes are conducted, the target probes collect test signals from the connected target test points. The target test points are test points whose test signals currently need to be collected, and the target probes are a group of probes used to collect test signals from the current target test points.

[0043] Among them, in one possible design, the positive pole of the high-voltage probe is connected to the first end of the test point through multiple first relays, the negative pole of the high-voltage probe is connected to the second end of the test point through multiple first relays, the negative pole of the low-voltage probe is connected to the second end of the test point through multiple first relays, and the positive pole of the low-voltage probe is connected to the third end of the test point through multiple first relays.

[0044] In one possible design, the test device also includes a driving power supply, a plurality of second relays, and a plurality of pulse drive plates DRV. The controller is connected to the plurality of pulse drive plates through the plurality of second relays, each pulse drive plate is connected to a test point of the device under test DUT, and the driving power supply is connected to the plurality of pulse drive plates through the plurality of second relays. The controller controls the target pulse drive plate to be turned on by switching the switch state of the second relay, and outputs the test waveform to the connected test point through the target pulse drive plate. In other words, the controller controls the pulse drive plate to generate the test waveform through the plurality of second relays. When it is necessary to collect the test signal of the target test point, the controller controls the target pulse drive plate connected to the target test point to be turned on by switching the switch state of the second relay, and outputs the test waveform to the connected target test point through the target pulse drive plate. That is, the controller is connected to the plurality of second relays, the plurality of second relays are connected to the corresponding plurality of pulse drive plates, the plurality of pulse drive plates are connected to the corresponding test points of the device under test, the driving power supply is connected to the plurality of pulse drive plates through the plurality of second relays, and the controller is used to control the switch state of the plurality of second relays to switch the target pulse drive plate to output the test waveform to the target test point.

[0045] Specifically, when it is necessary to collect the test signal of the current target test point, the controller outputs a first control signal to the target second relay, wherein the target second relay is a relay connected to the target pulse driving board, and the first control signal is a signal to control the closing of the second relay. The target second relay receives the first control signal and is in a closed state. At this time, the target pulse driving board outputs a test waveform to the target test point. At the same time, the controller outputs a second control signal to the non-target second relay, wherein the non-target second relay is a relay other than the target second relay among multiple second relays, and the second control signal is a signal to control the disconnection of the second relay. The non-target second relay receives the second control signal and is in a disconnected state.

[0046] The controller outputs a third control signal to the target first relay. The third control signal is a signal for controlling the closing of the first relay. The target first relay is a first relay used to conduct the target probe. The target first relay receives the third control signal and is in a closed state. At this time, the target probe is conducted and a test signal representing a test waveform at the target test point is collected. The controller also outputs a fourth control signal to the non-target first relay. The fourth control signal is a signal for controlling the opening of the first relay. The non-target first relay is a relay among the multiple first relays other than the target first relay. The non-target first relay receives the fourth control signal and is in an open state.

[0047] In one possible design, the test device further includes a DRV power switching circuit, a first end of which is connected to the controller, a second end of which is respectively connected to a plurality of second relays, and the controller controls the switching states of the plurality of second relays via the DRV power switching circuit. A third end of the DRV power switching circuit is further connected to a driving power supply via a low-voltage source interface.

[0048] In a possible design, the testing device further includes a signal source, and the multiple pulse driving boards are respectively connected to the signal source through signal source interfaces.

[0049] In one possible design, refer to Figure 2 , Figure 2 A schematic diagram of a device under test provided by the utility model is shown as follows: Figure 2 As shown, test points (1, 2, 3, 4, 5, 6, 7) can be connected in series in pairs, for example, test point 1 and test point 2, test point 3 and test point 4, test point 5 and test point 6, or they can be connected individually, such as test point 7. In order to save probe costs and simplify the connection relationship, the utility model can only set up one group of probes. For the test points connected in series in pairs, the connection relationship is as follows:

[0050] Assume that the nth test point is connected in series with the mth test point, where n and m are the numbers of the test points. Figure 3 , Figure 3 This is a schematic diagram of the connection relationship of the series probes provided by the utility model, as shown in Figure 3 As shown, the multiple first relays include a first target relay K10, a second target relay K11, a third target relay K17, a fourth target relay K18 and a Li-th relay, i ranges from 1 to N, and N is the total number of test points.

[0051] The positive electrode of the high-voltage probe is connected to the first end of the first target relay K10 and the first end of the second target relay K11, respectively. The second end of the first target relay K10 is connected to the first end of the nth test point. The negative electrode of the high-voltage probe is connected to the first end of the third target relay K17 and the first end of the fourth target relay K18, respectively. The first end of the second target relay K11 is connected to the first end of the first target relay K10, the first end of the third target relay K17 is connected to the first end of the fourth target relay K18, and the second end of the third target relay K17 is connected to the second end of the second target relay K11 and the Lnth relay (such as Figure 3 The first end of K12 in the Ln relay is connected to the second end of the nth test point and the first end of the mth test point respectively, and the second end of the fourth target relay K18 is connected to the second end of the mth test point.

[0052] The plurality of first relays further include a fifth target relay K21, a sixth target relay K24, a seventh target relay K31, an eighth target relay K35, a Gi relay, and a Hi relay, wherein i ranges from 1 to N, and N is the total number of test points. The positive pole of the low-voltage probe is connected to the first end of the fifth target relay K21 and the first end of the seventh target relay K31, respectively. The first end of the fifth target relay K21 is connected to the first end of the seventh target relay K31, and the second end of the fifth target relay K21 is connected to the Gn relay (such as Figure 3 The first end of K20 in the Gn relay is connected to the third end of the nth test point, and the second end of the seventh target relay K31 is connected to the Gm relay (as Figure 3 The first end of K30 in the figure, and the second end of the Gm relay are connected to the third end of the mth test point.

[0053] The negative electrode of the low-voltage probe is connected to the first end of the sixth target relay K24 and the first end of the eighth target relay K35, respectively. The first end of the sixth target relay K24 is connected to the first end of the eighth target relay K35, and the second end of the sixth target relay K24 is connected to the Hn relay (such as Figure 3 The first end of K25 in the eighth target relay is connected to the first end of the Hm relay (as shown in FIG1 ), the second end of the Hn relay is connected to the second end of the nth test point, the second end of the Ln relay and the first end of the mth test point respectively. The second end of the eighth target relay K35 is connected to the Hm relay (as shown in FIG1 ). Figure 3 The first end of K36 in the middle and the second end of the Hm-th relay are respectively connected to the second end of the m-th test point and the second end of the fourth target relay K18.

[0054] If the nth test point is not connected in series with other test points, the plurality of first relays include the second target relay K11, the third target relay K17, the fourth target relay K18, and the Lnth relay. The positive electrode of the high-voltage probe is connected to the first end of the second target relay K11, the negative electrode of the high-voltage probe is connected to the first end of the third target relay K17 and the first end of the fourth target relay K18, the first end of the third target relay K17 is connected to the first end of the fourth target relay K18, the second end of the third target relay K17 is connected to the second end of the second target relay K11 and the first end of the Lnth relay, the second end of the Lnth relay is connected to the first end of the nth test point, and the second end of the fourth target relay K18 is connected to the second end of the nth test point.

[0055] The plurality of first relays further include a seventh target relay K31, an eighth target relay K35, a Gnth relay, and an Hnth relay. The positive electrode of the low-voltage probe is connected to the first end of the seventh target relay K31, the second end of the seventh target relay K31 is connected to the first end of the Gnth relay, and the second end of the Gnth relay is connected to the third end of the nth test point. The negative electrode of the low-voltage probe is connected to the first end of the eighth target relay K35, the second end of the eighth target relay K35 is connected to the first end of the Hnth relay, and the second end of the Hnth relay is respectively connected to the second end of the nth test point and the second end of the fourth target relay K18.

[0056] In one possible design, the testing device also includes a host computer, which is connected to the controller and is used to send signals of the target test points to the controller. The controller is used to receive signals of the target test points and control the switching state of each first relay to control the conduction of the target probe. When the target probe is turned on, the test signal of the connected target test point is collected.

[0057] In one possible design, the test device also includes an oscilloscope connected to each probe. The target probe transmits the acquired test signal to the oscilloscope, which receives the test signal and converts it into a waveform image for display. In another possible design, the oscilloscope is also connected to a host computer to transmit the converted waveform image to the host computer for display.

[0058] Reference Figure 4 and Figure 5 , Figure 4 and Figure 5 The utility model provides a schematic diagram of the connection relationship between the high-voltage probe and the low-voltage probe at 7 test points, respectively. Figure 4 and Figure 5 As shown, when the connection relationship of the 7 test points is as follows Figure 2 When shown, the probe connection relationship is as follows:

[0059] The positive pole of the high-voltage probe is connected to the first end of the first target relay K10 and the first end of the second target relay K11 respectively. The second end of the first target relay K10 is connected to the first end of test point 1, the first end of test point 3 and the first end of test point 5 respectively. The negative pole of the high-voltage probe is connected to the first end of the third target relay K17 and the first end of the fourth target relay K18 respectively. The first end of the second target relay K11 is connected to the first end of the first target relay K10, the first end of the third target relay K17 is connected to the first end of the fourth target relay K18, and the second end of the third target relay K17 is connected to the second end of the second target relay K11 respectively. , the first end of the L1 relay K12, the first end of the L3 relay K13, the first end K14 of the L5 relay and the first end K15 of the L7 relay, the first end of the L1 relay K12 is respectively connected to the second end of the second target relay K11, the first end of the L3 relay K13, the first end K14 of the L5 relay and the first end K15 of the L7 relay, the first end of the L3 relay K13 is respectively connected to the second end of the second target relay K11, the first end K14 of the L5 relay and the first end K15 of the L7 relay, and the first end K14 of the L5 relay is connected to the first end K15 of the L7 relay. The second end of the L1 relay K12 is connected to the second end of test point 1 and the first end of test point 2, the second end of the L3 relay K13 is connected to the second end of test point 3 and the first end of test point 4, the second end of the L5 relay K14 is connected to the second end of test point 5 and the first end of test point 6, the second end of the L7 relay K15 is connected to the first end of test point 7, and the second end of the fourth target relay K18 is respectively connected to the second end of test point 2, the second end of test point 4, the second end of test point 6 and the second end of test point 7.

[0060] The positive pole of the low-voltage probe is respectively connected to the first end of the fifth target relay K21 and the first end of the seventh target relay K31, the first end of the fifth target relay K21 is connected to the first end of the seventh target relay K31, the second end of the fifth target relay K21 is respectively connected to the first end of the G1 relay K20, the first end of the G3 relay K22 and the first end of the G5 relay K23, the first end of the G1 relay K20 is respectively connected to the first end of the G3 relay K22 and the first end of the G5 relay K23, the first end of the G3 relay K22 is connected to the first end of the G5 relay K23, the second end of the G1 relay K20 is connected to the third end of test point 1, the second end of the G3 relay K22 is connected to the third end of test point 3, and the second end of the G5 relay K23 is connected to the third end of test point 5. The second end of the seventh target relay K31 is respectively connected to the first end of the G2 relay K30, the first end of the G4 relay K32, the first end of the G6 relay K33 and the first end of the G7 relay K34, the first end of the G2 relay K30 is respectively connected to the first end of the G4 relay K32, the first end of the G6 relay K33 and the first end of the G7 relay K34, the first end of the G4 relay K32 is respectively connected to the first end of the G6 relay K33 and the first end of the G7 relay K34, the first end of the G6 relay K33 is connected to the first end of the G7 relay K34, the second end of the G2 relay K30 is connected to the third end of test point 2, the second end of the G4 relay K32 is connected to the third end of test point 4, the second end of the G6 relay K33 is connected to the third end of test point 6, and the second end of the G7 relay K34 is connected to the third end of test point 7.

[0061] The negative pole of the low-voltage probe is respectively connected to the first end of the sixth target relay K24 and the first end of the eighth target relay K35, the first end of the sixth target relay K24 is connected to the first end of the eighth target relay K35, the second end of the sixth target relay K24 is respectively connected to the first end of the H1 relay K25, the first end of the H3 relay K26 and the first end of the H5 relay K27, the first end of the H1 relay K25 is respectively connected to the first end of the H3 relay K26 and the first end of the H5 relay K27, the first end of the H3 relay K26 is respectively connected to the first end of the H5 relay K27, the second end of the H1 relay K25 is respectively connected to the second end of the test point 1 and the second end of the L1 relay K12, the second end of the H3 relay K26 is respectively connected to the second end of the test point 3 and the second end of the L3 relay K13, the H5 relay K27 is respectively connected to the second end of the test point 5 and the second end of the L5 relay K14, and the second end of the eighth target relay K35 is respectively connected to the first end of the H2 The first end of relay K36, the first end of the H4th relay K37, the first end of the H6th relay K38 and the first end of the H7th relay K39, the first end of the H2th relay K36 is respectively connected to the first end of the H4th relay K37, the first end of the H6th relay K38 and the first end of the H7th relay K39, the first end of the H4th relay K37 is respectively connected to the first end of the H6th relay K38 and the first end of the H7th relay K39, the first end of the H6th relay K38 is connected to the first end of the H7th relay K39, the second end of the H2nd relay K36 is respectively connected to the second end of test point 2 and the second end of the fourth target relay K18, the first end of the H4th relay K37 is respectively connected to the second end of test point 4 and the second end of the fourth target relay K18, the first end of the H6th relay K38 is respectively connected to the second end of test point 6 and the second end of the fourth target relay K18, and the first end of the H7th relay K39 is connected to the second end of the fourth target relay K18.

[0062] Reference Figure 6 , Figure 6A schematic diagram of the connection relationship of a pulse drive board provided by the utility model. In a possible design, the test device includes 7 pulse drive boards (DRV1, DRV2, DRV3, DRV4, DRV5, DRV6, DRV7), and 7 second relays (K1, K2, K3, K4, K5, K6, K7). The controller is connected to each second relay, the second relay K1 is connected to the pulse drive board DRV5, the second relay K2 is connected to the pulse drive board DRV3, the second relay K3 is connected to the pulse drive board DRV1, the second relay K4 is connected to the pulse drive board DRV2, the second relay K5 is connected to the pulse drive board DRV4, the second relay K6 is connected to the pulse drive board DRV6, and the second relay K7 is connected to the pulse drive board DRV7. The 7 pulse drive boards are correspondingly connected to one test point among the 7 test points.

[0063] Working principle description:

[0064] When the target test point is test point No. 1, the target second relay K3 is turned on to power the target pulse driver board DRV1. The target first relay is K10, K17, K12, K20, K21, K25, and K24. K10, K17, and K12 are turned on, and the high-voltage signal is transmitted to the oscilloscope through the high-voltage probe. K20, K21, K25, and K24 are turned on, and the signal is transmitted to the oscilloscope through the low-voltage probe.

[0065] When the target test point is test point 2, the target second relay K4 is turned on and K3 is closed at the same time to power the target pulse driver board DRV2. The target first relay is K11, K12, K18, K30, K31, K36, K35. K11, K12, and K18 are turned on, and the high-voltage signal is transmitted to the oscilloscope through the high-voltage probe. K30, K31, K36, and K35 are turned on, and the signal is transmitted to the oscilloscope through the low-voltage probe.

[0066] When the target test point is test point 3, the target second relay K2 is turned on and K4 is turned off, supplying power to the target pulse driver board DRV3. The target first relays are K10, K13, K17, K22, K21, K26, and K24. When K10, K13, and K17 are turned on, the high-voltage signal is transmitted to the oscilloscope via the high-voltage probe. When K22, K21, K26, and K24 are turned on, the signal is transmitted to the oscilloscope via the low-voltage probe.

[0067] When the target test point is test point 4, the target second relay K5 is turned on and K2 is turned off, supplying power to the target pulse driver board DRV4. The target first relays are K11, K13, K18, K32, K31, K37, and K35. When K11, K13, and K18 are turned on, the high-voltage signal is transmitted to the oscilloscope through the high-voltage probe. When K32, K31, K37, and K35 are turned on, the signal is transmitted to the oscilloscope through the low-voltage probe.

[0068] When the target test point is test point 5, the target second relay K1 is turned on and K5 is turned off, supplying power to the target pulse driver board DRV5. The target first relays are K10, K17, K14, K23, K21, K27, and K24. When K10, K17, and K14 are turned on, the high-voltage signal is transmitted to the oscilloscope through the high-voltage probe. When K23, K21, K27, and K24 are turned on, the signal is transmitted to the oscilloscope through the low-voltage probe.

[0069] When the target test point is test point 6, the target second relay K6 is turned on and K1 is turned off to supply power to the target pulse driver board DRV6. The target first relays are K11, K15, K18, K31, K33, K38, and K35. When K11, K15, and K18 are turned on, the high-voltage signal is transmitted to the oscilloscope through the high-voltage probe. When K31, K33, K38, and K35 are turned on, the signal is transmitted to the oscilloscope through the low-voltage probe.

[0070] When the target test point is test point 7, the target second relay K7 is turned on and K6 is turned off to supply power to the target pulse driver board DRV7. The target first relays are K11, K15, K18, K31, K34, K39, and K35. When K11, K15, and K18 are turned on, the high-voltage signal is transmitted to the oscilloscope through the high-voltage probe. When K31, K34, K39, and K35 are turned on, the signal is transmitted to the oscilloscope through the low-voltage probe.

[0071] Based on the above device, the controller is connected to the probes through multiple first relays, and the probes are connected to the test points of the device under test. The controller controls the target probe to conduct by switching the on / off state of the first relay, and the target probe collects the test signal of the connected target test point. The utility model controls the on / off of the relay by the controller to control the target probe to collect the test signal of the target test point. This eliminates the need for manual probe switching and realizes intelligent probe switching for testing, which is convenient and efficient.

[0072] In an embodiment of the present invention, an electronic device is further provided. The electronic device comprises Figure 1 or Figure 2 or Figure 3 or Figure 4 or Figure 5The test setup in the illustrated embodiment.

[0073] The technical features of the above embodiments can be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0074] The above-described embodiments merely represent several implementation methods of the present application. While the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the present invention. It should be noted that a person of ordinary skill in the art may make various modifications and improvements without departing from the spirit of the present invention, all of which fall within the scope of protection of the present invention. Therefore, the scope of protection of the present invention shall be determined by the appended claims.

Claims

1. A testing device, characterized in that: The testing device includes a controller, a device under test, a probe and a plurality of first relays; The controller is connected to the probes respectively through a plurality of first relays, and the probes are connected to the test points of the device under test; The controller controls the target probe to be turned on by switching the switch state of the first relay, and collects the test signal of the connected target test point through the target probe.

2. The testing device according to claim 1, wherein: The probes include a low-pressure probe and a high-pressure probe; The high-voltage probe is used to collect the high-voltage test signal of the target test point when the high-voltage probe is connected to the target test point to be tested currently, and the low-voltage probe is used to collect the low-voltage test signal of the target test point when the low-voltage probe is connected to the target test point to be tested currently.

3. The testing device according to claim 1, wherein: The testing device includes a driving power supply, a plurality of second relays and a plurality of pulse driving boards; The controller is connected to a plurality of pulse drive boards respectively through a plurality of second relays, each of the pulse drive boards is connected to a test point of the device under test; the driving power supply is connected to the plurality of pulse drive boards respectively through a plurality of second relays; The controller controls the target pulse driving board to be turned on by switching the switch state of the second relay, and outputs a test waveform to the connected test point through the target pulse driving board.

4. The testing device according to claim 2, characterized in that The positive pole of the high-voltage probe is connected to the first end of the test point through multiple first relays, the negative pole of the high-voltage probe is connected to the second end of the test point through multiple first relays, the negative pole of the low-voltage probe is connected to the second end of the test point through multiple first relays, and the positive pole of the low-voltage probe is connected to the third end of the test point through multiple first relays.

5. The testing device according to claim 4, characterized in that: If the nth test point is connected in series with the mth test point, the plurality of first relays include the first target relay, the second target relay, the third target relay, the fourth target relay, and the Lith relay, wherein n and m are the numbers of the test points, i ranges from 1 to N, and N is the total number of test points; The positive electrode of the high-voltage probe is connected to the first end of the first target relay and the first end of the second target relay respectively, and the second end of the first target relay is connected to the first end of the nth test point; The negative pole of the high-voltage probe is respectively connected to the first end of the third target relay and the first end of the fourth target relay, the first end of the second target relay is connected to the first end of the first target relay, the first end of the third target relay is connected to the first end of the fourth target relay, the second end of the third target relay is respectively connected to the second end of the second target relay and the first end of the Ln-th relay, the second end of the Ln-th relay is respectively connected to the second end of the n-th test point and the first end of the m-th test point, and the second end of the fourth target relay is connected to the second end of the m-th test point.

6. The testing device according to claim 5, characterized in that: The plurality of first relays further include a fifth target relay, a sixth target relay, a seventh target relay, an eighth target relay, a Gi-th relay, and a Hi-th relay; wherein i ranges from 1 to N, and N is the total number of test points; The positive electrode of the low-voltage probe is respectively connected to the first end of the fifth target relay and the first end of the seventh target relay, the first end of the fifth target relay is connected to the first end of the seventh target relay, the second end of the fifth target relay is connected to the first end of the Gn-th relay, the second end of the Gn-th relay is connected to the third end of the n-th test point, the second end of the seventh target relay is connected to the first end of the Gm-th relay, and the second end of the Gm-th relay is connected to the third end of the m-th test point; The negative pole of the low-voltage probe is respectively connected to the first end of the sixth target relay and the first end of the eighth target relay, the first end of the sixth target relay is connected to the first end of the eighth target relay, the second end of the sixth target relay is connected to the first end of the Hn-th relay, the second end of the Hn-th relay is respectively connected to the second end of the n-th test point, the second end of the Ln-th relay and the first end of the m-th test point, the second end of the eighth target relay is connected to the first end of the Hm-th relay, and the second end of the Hm-th relay is respectively connected to the second end of the m-th test point and the second end of the fourth target relay.

7. The testing device according to claim 5, characterized in that: If the nth test point is not connected in series with other test points, the plurality of first relays include the second target relay, the third target relay, the fourth target relay and the Lnth relay; The positive electrode of the high-voltage probe is connected to the first end of the second target relay; The negative pole of the high-voltage probe is respectively connected to the first end of the third target relay and the first end of the fourth target relay, the first end of the third target relay is connected to the first end of the fourth target relay, the second end of the third target relay is respectively connected to the second end of the second target relay and the first end of the Ln relay, the second end of the Ln relay is connected to the first end of the nth test point, and the second end of the fourth target relay is connected to the second end of the nth test point.

8. The testing device according to claim 7, characterized in that: The plurality of first relays further include a seventh target relay, an eighth target relay, a Gn-th relay, and an Hn-th relay; The positive electrode of the low-voltage probe is connected to the first end of the seventh target relay, the second end of the seventh target relay is connected to the first end of the Gn-th relay, and the second end of the Gn-th relay is connected to the third end of the n-th test point; The negative pole of the low-voltage probe is connected to the first end of the eighth target relay, the second end of the eighth target relay is connected to the first end of the Hn relay, and the second end of the Hn relay is respectively connected to the second end of the nth test point and the second end of the fourth target relay.

9. The testing device according to claim 1, wherein: The testing device also includes a host computer; The host computer is connected to the controller and is used to send a signal of a test target test point to the controller; The controller is used to receive the signal, control the target probe to be turned on by controlling the switch state of each first relay, and collect the test signal of the connected target test point through the target probe.

10. An electronic device, characterized in that: The electronic device comprises the testing device according to any one of claims 1 to 9.

Images