Profiling connector
By designing a trumpet-shaped test pin and return spring, the poor contact problems caused by wear of existing profiling connectors are solved, achieving more stable connections and more efficient testing.
Patent Information
- Application Number
- CN202423108882.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-16
- Publication Date
- 2025-09-05
- Estimated Expiration
- 2034-12-16
AI Technical Summary
The test pins of existing profiling connectors wear out after long-term use, resulting in a decrease in contact surface, poor contact, and increased testing errors.
A trumpet-shaped test needle is designed, and the test end of the test needle has an inner groove arranged inwardly towards the second opening direction, which increases the contact area with the product probe, and provides buffering through a return spring, combining the guide groove and the guide portion to ensure accurate docking.
The contact area between the test needle and the probe is increased, the stability and reliability of the connection are improved, the test error caused by poor contact is reduced, and the testing efficiency and reliability are improved.
Smart Images
Figure CN223308261U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of connector connection processing, in particular to a contoured connector. Background Art
[0002] Currently, the contoured connectors on the market are mainly made of PE, Bakelite, etc., and are widely used in testing equipment, non-standard equipment and other fields.
[0003] Each test pin of the current contoured connector adopts a cylindrical structure. After long-term use, the test pin wears out, resulting in a gradual reduction in the contact area between the test pin and the product probe. As a result, when testing the product, the product probe and the test pin do not correspond, increasing the error caused by poor contact.
[0004] Therefore, it is necessary to improve the prior art to overcome the above defects. Utility Model Content
[0005] In view of this, an embodiment of the present application provides a contour connector to solve at least one problem existing in the background technology, which is suitable for docking with a product to test product performance. The contour connector includes:
[0006] A main body, used for docking with a product, the main body having a first accommodating cavity arranged in a horizontal direction, with a first opening and a second opening respectively formed at both ends of the first accommodating cavity, and the diameter of the first opening being smaller than that of the second opening;
[0007] A test assembly comprising a guide sleeve and a test needle, wherein the guide sleeve has a second accommodating cavity with an opening at a first end, at least a portion of the guide sleeve is inserted through the second opening into the first accommodating cavity, an accommodating space is formed between the first accommodating cavity and the second accommodating cavity, the test needle is located in the accommodating space, and the diameter of the test end of the test needle is larger than the diameter of the first opening, and the test needle can move relative to the accommodating space under the action of an external force;
[0008] The testing end of the testing needle has an inner groove that is concave toward the second opening, and the inner groove has an abutting portion that is suitable for abutting against a probe of a product.
[0009] Optionally, in the above-mentioned contoured connector, the inner groove is conical or truncated cone-shaped.
[0010] Optionally, in the above-mentioned contoured connector, the test assembly further comprises a return spring;
[0011] The test needle also includes a middle part connected to the test end and a connecting part connected to the middle part, the connecting part is located in the second accommodating cavity, the diameter of the middle part is smaller than the diameter of the test end, the return spring is sleeved on the outside of the middle part, and the two ends are respectively connected to the test end and the end of the guide sleeve.
[0012] Optionally, in the above-mentioned contoured connector, the main body includes a docking portion for docking with the product and a fixing portion detachably connected to the docking portion, the first opening is located on the docking portion, and the second opening is located on the fixing portion.
[0013] Optionally, in the above-mentioned contoured connector, one of the docking portion and the fixing portion is provided with a recessed portion, and the other of the docking portion and the fixing portion is provided with a protruding portion adapted to engage with the recessed portion.
[0014] Optionally, in the above-mentioned contoured connector, the docking portion further includes a guide groove, the guide groove having a third opening and a fourth opening relative to each other and a guide surface connecting the third opening and the fourth opening, the diameter of the third opening being the same as the diameter of the first opening and being connected to the first opening, and the diameter of the fourth opening being larger than the diameter of the third opening.
[0015] Optionally, in the above-mentioned contoured connector, the cavity of the product has a first guide portion;
[0016] The docking portion has at least one second guide portion adapted to the first guide portion, and the docking portion moves in and out of the cavity along the first guide portion through the second guide portion, so that the probe of the product is electrically connected to the test pin.
[0017] Optionally, in the above-mentioned contoured connector, the second guide portion has a curved surface.
[0018] Optionally, in the above-mentioned contoured connector, the probe has a diameter of 0.5 mm and the guide groove cross-section has an inclination angle of 30-40°; or
[0019] The diameter of the probe is 1 mm, and the inclination angle of the guide groove section is 40-50°.
[0020] Compared with the prior art, the present application has the following beneficial effects: by setting the test end of the test needle to have an inner groove that is concave inward toward the second opening direction, and the inner groove has an abutment portion suitable for abutting with the product probe, it can also be understood that the side where the test end of the test needle is connected to the product probe is set to a trumpet shape, which can increase the contact area between the test needle and the probe to adapt to probes of different sizes, and can also provide a more stable connection during the product advancement process, reducing test errors caused by poor contact; in addition, the trumpet-shaped test needle can better accommodate and fix the product probe, reduce the risk of shaking and displacement caused by changes in production rhythm, and maintain a relatively stable connection even in a non-uniform motion state, thereby improving the reliability of the test; further, the larger open end of the trumpet-shaped test needle is easier to position and align with the product probe during operation, making the testing process more efficient and reducing operational errors and time waste caused by alignment difficulties. BRIEF DESCRIPTION OF THE DRAWINGS
[0021] Figure 1 It is a schematic diagram of the connection between the contoured connector and the product shown in this application;
[0022] Figure 2 yes Figure 1 sectional view of
[0023] Figure 3 yes Figure 2 A partial enlarged view of
[0024] Figure 4 Schematic diagram of the contoured connector shown in this application.
[0025] Reference numerals: 10 - product, 20 - contoured connector, 30 - probe;
[0026] 1 - Main body, 11 - First accommodating cavity, 111 - First opening, 112 - Second opening, 12 - Docking portion, 121 - Recessed portion, 122 - Guide groove, 123 - Second guide portion, 1231 - Arc-shaped surface, 1221 - Third opening, 1222 - Fourth opening, 1223 - Guide surface, 13 - Fixing portion, 131 - Protruding portion;
[0027] 2-test assembly, 21-guide sleeve, 211-second accommodating chamber, 22-test needle, 221-test end, 2211-inner groove;
[0028] 3- Accommodation space. DETAILED DESCRIPTION
[0029] The exemplary embodiments disclosed in the present application will be described in more detail below. In the description below, a large number of specific details are given in order to provide a more thorough understanding of the present application. However, it is obvious to those skilled in the art that the present application can be implemented without one or more of these details. In other examples, in order to avoid confusion with the present application, some technical features well known in the art are not described; that is, all features of the actual embodiments are not described here, and well-known functions and structures are not described in detail.
[0030] It should be understood that when an element or layer is referred to as being "on," "adjacent to," "connected to," or "coupled to" another element or layer, it may be directly on, adjacent to, connected to, or coupled to the other element or layer, or there may be intervening elements or layers. Conversely, when an element is referred to as being "directly on," "directly adjacent to," "directly connected to," or "directly coupled to" another element or layer, there may be no intervening elements or layers. It should be understood that although the terms first, second, third, etc. may be used to describe various elements, components, regions, layers, and / or parts, these elements, components, regions, layers, and / or parts should not be limited by these terms. These terms are merely used to distinguish one element, component, region, layer, or part from another element, component, region, layer, or part. Therefore, without departing from the teachings of the present application, the first element, component, region, layer, or part discussed below may be represented as a second element, component, region, layer, or part. And when the second element, component, region, layer, or part is discussed, it does not necessarily mean that the first element, component, region, layer, or part is present in the present application.
[0031] Spatially relative terms such as "below," "beneath," "beneath," "beneath," "above," "upper," etc., may be used herein for convenience to describe the relationship of one element or feature to other elements or features shown in the figures. It will be understood that the spatially relative terms are intended to encompass different orientations of the device in use and operation in addition to the orientations depicted in the figures.
[0032] The purpose of the terms used herein is only to describe specific embodiments and is not intended to limit the present application. When used herein, the singular forms "a", "an", and " / the" are intended to include the plural forms, unless the context clearly indicates otherwise. It should also be understood that the terms "comprising" and / or "including", when used in this specification, identify the presence of features, integers, steps, operations, elements and / or parts, but do not exclude the presence or addition of one or more other features, integers, steps, operations, elements, parts and / or groups. When used herein, the term "and / or" includes any and all combinations of the relevant listed items.
[0033] In order to fully understand the present application, detailed steps and detailed structures will be presented in the following description to illustrate the technical solution of the present application. The preferred embodiments of the present application are described in detail below. However, in addition to these detailed descriptions, the present application may also have other implementation methods.
[0034] Please refer to Figures 1-4 As shown, the contoured connector 20 shown in a preferred embodiment of the present application is suitable for docking with the probe 30 of the product 10 to test the performance of the product 10, which can be the conductivity or insulation or capacitance and inductance of the product 10, such as resistance, conductance, whether the product is leaking, short-circuited, etc.
[0035] refer to Figure 1 、 Figure 2 and Figure 4 As shown, the contoured connector 20 includes a main body 1 for docking with a product 10 and a test assembly 2. The main body 1 has a first accommodating chamber 11 arranged horizontally, with a first opening 111 and a second opening 112 respectively formed at both ends of the first accommodating chamber 11. The first opening 111 has a smaller diameter than the second opening 112. The test assembly 2 includes a guide sleeve 21 and a test pin 22. The guide sleeve 21 has a second accommodating chamber 211 with an opening at its first end. At least a portion of the guide sleeve 21 is inserted into the first accommodating chamber 11 through the second opening 112. An accommodating space 3 is formed between the first accommodating chamber 11 and the second accommodating chamber 211. The test pin 22 is located in the accommodating space 3. The diameter of the test end 221 of the test pin 22 is larger than the diameter of the first opening 111. The test pin 22 can move relative to the accommodating space 3 under the action of an external force. When the product 10 needs to be tested, one end of the main body 1 is docked with the product 10, and the test needle 22 located in the accommodating space 3 is pushed. Since the diameter of the test end 221 of the test needle 22 is larger than the diameter of the first opening 111, the test end 221 of the test needle 22 is abutted against the first opening 111 of the main body 1. Then, as the main body 1 is pushed forward, the probe 30 of the product 10 passes through the first opening 111 and is connected to the test end 221 of the test needle 22, thereby realizing performance testing of the product 10.
[0036] Specifically, in this embodiment, reference Figure 2 and Figure 3As shown, the testing end 221 of the test needle 22 has an inner groove 2211 that is recessed inward toward the second opening 112. The inner groove 2211 has an abutment portion adapted to abut against the probe 30 of the product 10. In this embodiment, the inner groove 2211 is conical or truncated cone-shaped. Alternatively, the entire testing end 221 of the test needle 22 may be shaped like a trumpet. The advantage of such a setting is that, on the one hand, when the trumpet-shaped test needle 22 abuts against the probe 30 of the product 10, the design of the inner groove 2211 can create a larger contact surface between the two, thereby making the connection between the probe 30 and the test needle 22 tighter and more stable, reducing the test error caused by poor contact, and the conical or truncated cone-shaped inner groove 2211 can better wrap the probe 30 of the product 10, thereby increasing the firmness of the connection, and even if the contoured connector 20 is subjected to external interference or vibration, it can maintain stable contact, thereby improving test reliability; on the other hand, the trumpet-shaped test end 221 has a certain guiding role, and when the probe 30 of the product 10 is close to the test needle 22, the shape of the inner groove 2211 can help the probe 30 to be more easily aligned with the abutment of the test needle 22, thereby reducing the alignment time and operation difficulty, and improving production efficiency.
[0037] In this embodiment, the test assembly 2 also includes a return spring (not shown); the test needle 22 also includes an intermediate portion connected to the test end 221 and a connecting portion connected to the intermediate portion. The connecting portion is located within the second accommodating cavity 211. The diameter of the intermediate portion is smaller than the diameter of the test end 221. The return spring is sleeved outside the intermediate portion, and its two ends are respectively connected to the test end 221 and the end of the guide sleeve 21. By providing a return spring for the test needle 22, the test needle 22 has a certain buffer space when subjected to external forces, avoiding damage to the probe 30 and the test needle 22 caused by direct advancement of the product 10. When the external force disappears, the return spring can quickly reset the test needle 22 to prepare for the next test.
[0038] As described above, the main body 1 includes a docking portion 12 for docking with the product 10 and a fixing portion 13 detachably connected to the docking portion 12. A first opening 111 is located on the docking portion 12, and a second opening 112 is located on the fixing portion 13. The detachable design facilitates assembly and disassembly of the main body 1. When the contoured connector 20 requires maintenance or repair, both the detachably connected docking portion 12 and the fixing portion 13 can be replaced, or the test assembly 2 therein can be inspected, cleaned, or replaced, reducing maintenance time and costs and improving device availability.
[0039] More specifically, a recessed portion 121 is provided on one of the docking portion 12 and the fixing portion 13, and a protruding portion 131 that is adapted to engage with the recessed portion 121 is provided on the other of the docking portion 12 and the fixing portion 13, so as to improve the connection stability between the docking portion 12 and the fixing portion 13 by the mutual engagement of the recessed portion 121 and the protruding portion 131, and the mutual engagement of the recessed portion 121 and the protruding portion 131 can effectively resist the impact and vibration of external forces, and prevent the connection from being interrupted or unstable due to shaking or movement during the test.
[0040] Furthermore, in this embodiment, the docking portion 12 also includes a guide groove 122 having a third opening 1221 and a fourth opening 1222 that are opposite each other, and a guide surface 1223 connecting the third opening 1221 and the fourth opening 1222. The third opening 1221 has the same diameter as the first opening 111 and is connected to the first opening 111, while the fourth opening 1222 has a larger diameter than the third opening 1221, resulting in the guide groove 122 having a trumpet-like shape as a whole. When the product 10 is docked with the contoured connector 20, the probe 30 can accurately find the first opening 111 along the guide groove 122 and then achieve precise docking with the inner groove 2211 of the test pin 22. This greatly improves the efficiency and accuracy of docking and reduces the risk of test failure or damage to the product 10 due to inaccurate docking. The larger fourth opening 1222 and the gradually shrinking guide arc surface can guide the probe 30 into the correct direction to a certain extent, preventing the probe 30 from deviating during the docking process. Even if there is a certain position deviation of the product 10 during docking, the guide groove 122 can help adjust the position of the probe 30 to ensure smooth docking. In addition, the larger fourth opening 1222 provides a certain amount of margin for error for the probe 30, preventing the probe 30 from colliding with the edge of the contoured connector 20 during insertion. This helps protect the integrity of the probe 30 and extend its service life.
[0041] In this embodiment, the cavity of the product 10 has a first guide portion; the docking portion 12 has at least one second guide portion 123 adapted to the first guide portion, and the docking portion 12 enters and exits the cavity along the first guide portion through the second guide portion 123, so that the probe 30 of the product 10 is electrically connected to the test needle 22.
[0042] The first guide portion of the product 10 cavity mates with the second guide portion 123 of the docking portion 12 of the contour connector 20, providing a clear path for electrical connection between the probe 30 of the product 10 and the test pin 22. This ensures that during the docking process, the contour connector 20 can accurately enter and exit the product 10 cavity, allowing the probe 30 and the test pin 22 to achieve electrical connection in the correct position. This significantly improves the accuracy and reliability of the connection and reduces test errors caused by inaccurate connections.
[0043] It should be noted that in this embodiment, the diameter of the probe 30 is 0.5 mm, and the cross-sectional inclination angle of the guide groove 122 is 30-40°; alternatively, the diameter of the probe 30 is 1 mm, and the cross-sectional inclination angle of the guide groove 122 is 40-50°. In other embodiments, the specifications of the probe 30 and the inclination angle of the guide groove 122 are not specifically limited and can be determined based on actual conditions.
[0044] The second guide portion 123 has an arcuate surface 1231. The arcuate surface 1231 is provided to reduce frictional resistance and the possibility of damage to the product 10 and the connector during docking, thereby making it smoother for the contoured connector 20 to enter the cavity of the product 10.
[0045] The above is only a specific implementation of the present application. Any other improvements made based on the concept of the present application are considered to be within the scope of protection of the present application.
Claims
1. A contoured connector, characterized in that: Suitable for docking with products to test product performance, the profiling connector includes: A main body, used for docking with a product, the main body having a first accommodating cavity arranged in a horizontal direction, with a first opening and a second opening respectively formed at both ends of the first accommodating cavity, and the diameter of the first opening being smaller than that of the second opening; A test assembly comprising a guide sleeve and a test needle, wherein the guide sleeve has a second accommodating cavity with an opening at a first end, at least a portion of the guide sleeve is inserted through the second opening into the first accommodating cavity, an accommodating space is formed between the first accommodating cavity and the second accommodating cavity, the test needle is located in the accommodating space, and the diameter of the test end of the test needle is larger than the diameter of the first opening, and the test needle can move relative to the accommodating space under the action of an external force; The testing end of the testing needle has an inner groove that is concave toward the second opening, and the inner groove has an abutting portion that is suitable for abutting against a probe of a product.
2. The contoured connector according to claim 1, wherein: The inner groove is in a cone shape or a truncated cone shape.
3. The contoured connector according to claim 1, wherein: The test assembly further includes a return spring; The test needle also includes a middle part connected to the test end and a connecting part connected to the middle part, the connecting part is located in the second accommodating cavity, the diameter of the middle part is smaller than the diameter of the test end, the return spring is sleeved on the outside of the middle part, and the two ends are respectively connected to the test end and the end of the guide sleeve.
4. The contoured connector according to claim 1, wherein: The main body includes a docking portion docking with the product and a fixing portion detachably connected to the docking portion, the first opening is located on the docking portion, and the second opening is located on the fixing portion.
5. The contoured connector according to claim 4, wherein: One of the docking portion and the fixing portion is provided with a recessed portion, and the other of the docking portion and the fixing portion is provided with a protruding portion adapted to engage with the recessed portion.
6. The contoured connector according to claim 4, characterized in that The docking portion also includes a guide groove, which has a third opening and a fourth opening relative to each other and a guide surface connecting the third opening and the fourth opening. The diameter of the third opening is the same as the diameter of the first opening and is connected to the first opening. The diameter of the fourth opening is larger than that of the third opening.
7. The contoured connector according to claim 6, wherein: The cavity of the product has a first guide portion; The docking portion has at least one second guide portion adapted to the first guide portion, and the docking portion moves in and out of the cavity along the first guide portion through the second guide portion, so that the probe of the product is electrically connected to the test pin.
8. The contoured connector according to claim 7, wherein: The second guide portion has an arc-shaped surface.
9. The contoured connector according to claim 7, wherein: The diameter of the probe is 0.5 mm, and the inclination angle of the cross section of the guide groove is 30-40°; or the diameter of the probe is 1 mm, and the inclination angle of the cross section of the guide groove is 40-50°.