Shunt service life testing device

Abstract

The utility model relates to the technical field of resistance testing, and relates to a shunt service life testing device. According to the utility model, the fixing mechanism comprises a plurality of fixing bonding pads, products are welded on the fixing bonding pads, and the sampling assembly is used for testing and sampling the products on the fixing bonding pads, so that more products can be tested at the same time, and the testing space and the testing time are saved; the through holes in the first test board and the second test board are arranged in a staggered mode, a current loop is formed in the installation mode that the first test board and the second test board are buckled on the two sides of the product, and the problem that no current passes through the protruding part of the product with riveting columns or bent products during testing is solved. The free ends of the first test board and the second test board are fixedly supported by the positioning assembly, so that the problem that the first test board or the second test board is bent or fractured due to the fact that the weight of a product is too heavy can be prevented.

Description

Technical Field

[0001] The utility model relates to the technical field of resistance testing, in particular to a shunt life testing device. Background Art

[0002] The test boards currently on the market are single-chip test boards. When testing a product, only one product can be tested, which wastes unnecessary space and test time. Some products on the market use a bending process or weld rivets on the product. During the test process, it is generally required that current also pass through the bent part or the rivet part. The existing test boards are straight boards, which can only ensure that current passes through the board part, and cannot meet the testing needs of such products. Utility Model Content

[0003] The technical problem to be solved by the utility model is to provide a shunt life test device which can test more products at the same time, save test space and test time, and solve the problem that no current flows through the protruding parts of products with rivets or bent parts during testing.

[0004] In order to solve the above technical problems, the technical solutions adopted by the present invention are as follows:

[0005] A shunt life test device, comprising:

[0006] a base, on which a testing station is provided;

[0007] A testing mechanism is disposed on the base, comprising a first testing plate and a second testing plate of identical structure, wherein the first testing plate and the second testing plate are evenly provided with a plurality of through holes matching the product rivet studs, the first testing plate being disposed on the base, the second testing plate being disposed above the second testing plate, and the through holes on the first testing plate and the second testing plate being staggered;

[0008] A fixing mechanism is provided on the pad surfaces of the first test board and the second test board, the fixing mechanism including a plurality of fixing pads, the fixing pads being provided in a one-to-one correspondence with the through holes, the fixing pads being provided with sampling holes matching the product rivet studs, the sampling holes being connected to the through holes;

[0009] A sampling mechanism is provided on the sampling surfaces of the first test plate and the second test plate, the sampling mechanism including a plurality of sampling components, the sampling components being provided in a one-to-one correspondence with the fixed pads, the sampling components being connected to the fixed pads, and the sampling components being used to test and sample the products on the fixed pads;

[0010] A supporting mechanism is arranged on the base, and the supporting mechanism includes a supporting platform and a positioning assembly. The supporting platform is arranged on one side of the base, and one end of the second test plate is arranged on the supporting platform. The first test plate and the second test plate are both connected to the positioning assembly, and the positioning assembly is used to fix and support the free ends of the first test plate and the second test plate.

[0011] In one embodiment of the present invention, the sampling component includes a sampling pad, which is disposed on the sampling surface and electrically connected to the fixing pad. A sampling wire is disposed on the sampling pad.

[0012] In one embodiment of the present invention, the first test board is a PCB board, one end of the first test board is provided with a current inflow end, and the other end is provided with a current outflow end, and the current inflow end and the current outflow end are both electrically connected to the fixed pad.

[0013] In one embodiment of the present invention, the positioning assembly includes a support block, a card slot is provided on the support block, one end of the second test plate is clamped on the card slot, a support frame is provided on the support block, a support slider is provided at the bottom of the support frame, a plurality of slide grooves are provided on the base, and the support slider is slidably arranged on the slide grooves.

[0014] In one embodiment of the present invention, an adjustment component is provided on the support frame, and the adjustment component includes an adjustment nut and two adjustment rods. The two adjustment rods are respectively connected to the support frame, and the two adjustment rods are provided with threaded surfaces with opposite rotation directions. The two ends of the adjustment nut are respectively screwed together with the two adjustment rods, and the height position of the support block is adjusted by rotating the adjustment nut.

[0015] In one embodiment of the present invention, a guide rod is provided on the support block, a guide sleeve is provided on the guide rod, the guide sleeve is connected to the cross bar, the cross bar is vertically connected to the vertical bar, an adjustment slider is provided at the bottom of the vertical bar, the vertical bar is connected to the guide frame, the guide frame is slid on the base, the adjustment slider is slid on the slide groove, a limit baffle is provided on one side of the base, the adjustment slider is arranged opposite to the limit baffle, and adjustment components are provided on both the cross bar and the vertical bar, and the adjustment components are used to adjust the relative position of the support block and the second test plate.

[0016] In one embodiment of the present invention, the adjustment component includes an adjustment nut and two adjustment rods, and the two adjustment rods are provided with threaded surfaces with opposite rotation directions. The two ends of the adjustment nut are respectively screwed together with the two adjustment rods, and the relative position of the support block is adjusted by rotating the adjustment nut.

[0017] In one embodiment of the present invention, the product includes a resistor and a detection board, a test pad is provided on the detection board, the resistor is welded on the detection board, and the test pad on the detection board is connected to the fixed pad.

[0018] In one embodiment of the present invention, a limit plate is provided on the base, one side of the first test plate is pressed against the limit plate, and the limit plate is arranged opposite to the through hole of the second test plate, so that the products on the first test plate and the second test plate are arranged alternately.

[0019] In one embodiment of the present invention, a support groove is provided on the support platform, a plurality of limit blocks are provided on the support groove, a limit groove matching the limit block is provided on the second test board, and the limit groove on the second test board is clamped on the limit block.

[0020] Beneficial effects of the utility model:

[0021] The fixing mechanism of the present invention includes multiple fixing pads, and the product is welded on the fixing pads. The sampling component tests and samples the product on the fixing pads, which can test more products at the same time, saving testing space and testing time; the through holes on the first test board and the second test board are staggered, and the two test boards of the first test board and the second test board are buckled on both sides of the product to form a current loop, which solves the problem that no current passes through the protruding parts of the product with rivets or bends during testing; the positioning component fixes and supports the free ends of the first test board and the second test board, which can prevent the first test board or the second test board from bending or breaking due to the excessive weight of the product. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] Figure 1 This is a schematic diagram of a shunt life test device of the utility model.

[0023] Figure 2 It is a schematic diagram of the pad surface of the second test board of the present invention.

[0024] Figure 3 It is a schematic diagram of the sampling surface of the second test plate of the present invention.

[0025] Figure 4 It is a product schematic diagram of the present utility model.

[0026] Explanation of the numbers in the figure: 1. Base; 11. Limiting plate; 12. Support table; 14. Supporting slot; 2. First test board; 3. Second test board; 31. Through hole; 32. Fixed pad; 33. Sampling hole; 34. Limiting slot; 35. Current inflow end; 36. Current outflow end; 37. PCB board; 4. Product; 41. Test board; 42. Resistor; 43. Rivet column; 5. Positioning assembly; 51. Support block; 52. Slot; 53. Support frame; 54. Support slider; 55. Adjusting rod; 56. Adjusting nut; 6. Guide sleeve; 61. Guide rod; 62. Cross bar; 63. Vertical bar; 64. Adjusting slider; 65. Guide frame; 66. Adjusting component; 67. Adjusting nut; 58. Limiting baffle; 7. Sampling assembly; 71. Sampling pad; 72. Sampling wire. DETAILED DESCRIPTION

[0027] The present invention will be further described below with reference to the accompanying drawings and specific embodiments so that those skilled in the art can better understand the present invention and implement it. However, the embodiments are not intended to limit the present invention.

[0028] Reference Figure 1-4 As shown, a shunt life test device includes:

[0029] Base 1, on which a test station is provided;

[0030] A testing mechanism is provided on the base 1, comprising a first test plate 2 and a second test plate 3 of identical structure, wherein the first test plate 2 and the second test plate 3 are evenly provided with a plurality of through holes 31 matching the rivet studs 43 of the product 4, the first test plate 2 being provided on the base 1, the second test plate 3 being provided above the second test plate 3, and the through holes 31 on the first test plate 2 and the second test plate 3 being staggered;

[0031] A fixing mechanism is provided on the pad surfaces of the first test board 2 and the second test board 3. The fixing mechanism includes a plurality of fixing pads 32. The fixing pads 32 are arranged in a one-to-one correspondence with the through holes 31. The fixing pads 32 are provided with sampling holes 33 that match the rivet studs 43 of the product 4. The sampling holes 33 are connected to the through holes 31.

[0032] A sampling mechanism is provided on the sampling surfaces of the first test board 2 and the second test board 3. The sampling mechanism includes a plurality of sampling components 7. The sampling components 7 are provided in a one-to-one correspondence with the fixed pads 32. The sampling components 7 are connected to the fixed pads 32 and are used to test and sample the product 4 on the fixed pads 32.

[0033] A supporting mechanism is provided on the base 1, and the supporting mechanism includes a supporting platform 12 and a positioning assembly 5. The supporting platform 12 is provided on one side of the base 1, and one end of the second test plate 3 is provided on the supporting platform 12. The first test plate 2 and the second test plate 3 are both connected to the positioning assembly 5, and the positioning assembly 5 is used to fix and support the free ends of the first test plate 2 and the second test plate 3.

[0034] The fixing mechanism of the present invention includes multiple fixing pads 32, and the product 4 is welded to the fixing pads 32. The sampling component 7 tests and samples the product 4 on the fixing pads 32, and more products 4 can be tested at the same time, saving testing space and testing time; the through holes 31 on the first test board 2 and the second test board 3 are staggered, and the two test boards of the first test board 2 and the second test board 3 are buckled on both sides of the product 4 to form a current loop, which solves the problem that no current passes through the protruding part of the product 4 with rivets 43 or bent during testing; the positioning component 5 fixes and supports the free ends of the first test board 2 and the second test board 3, which can prevent the first test board 2 or the second test board 3 from bending or breaking due to the excessive weight of the product 4.

[0035] The base 1 is provided with a hollow portion for leaking out the sample components of the first test board 2 to ensure the convenience of testing.

[0036] In one embodiment of the present invention, the sampling component 7 includes a sampling pad 71 , which is disposed on the sampling surface and electrically connected to the fixing pad 32 . A sampling wire 72 is disposed on the sampling pad 71 .

[0037] Specifically, the sampling pad 71 is electrically connected to the fixed pad 32, the test equipment is connected to the sampling wire 72, and the sampling point (sampling component 7) and the current loop (fixed pad 32) are set on both sides of the test board, which can prevent the current path from interfering with the sampling point and ensure the detection accuracy.

[0038] In one embodiment of the present invention, the first test board 2 is a PCB board 37 , one end of the first test board 2 is provided with a current inflow end 35 , and the other end is provided with a current outflow end 36 , and both the current inflow end 35 and the current outflow end 36 are electrically connected to the fixed pad 32 .

[0039] Specifically, the test equipment is connected to the sampling wire 72, and the DC source wire is connected to the current inflow end 35 and the current outflow end 36 of the test board to test the product 4. The use of a PCB board can effectively reduce the test cost and ensure the accuracy of the resistance 42 test.

[0040] In one embodiment of the present utility model, the positioning assembly 5 includes a support block 51, a card slot 52 is provided on the support block 51, one end of the second test board 3 is clamped on the card slot 52, a support frame 53 is provided on the support block 51, a support slider 54 is provided at the bottom of the support frame 53, a plurality of slide grooves are provided on the base 1, and the support slider 54 is slidably provided on the slide grooves.

[0041] Specifically, one end of the second test board 3 is set on the support platform 12, and the other end of the second test board 3 is clamped on the clamping slot 52. The second test board 3 is supported by both ends, and the middle part is supported by the rivet column 43 or the bending structure, which can prevent the PCB board 37 from bending or breaking due to the excessive weight of the product 4. A supporting slider 54 is provided at the bottom of the support frame 53. The supporting slider 54 is slidably mounted on the sliding groove and can be adjusted in position according to different specifications of the second test board 3, thereby ensuring effective support for the second test board 3 and improving detection accuracy.

[0042] In one embodiment of the present invention, an adjustment component is provided on the support frame 53, and the adjustment component includes an adjustment nut 56 and two adjustment rods 55. The two adjustment rods 55 are respectively connected to the support frame 53, and the two adjustment rods 55 are provided with threaded surfaces with opposite rotation directions. The two ends of the adjustment nut 56 are respectively screwed together with the two adjustment rods 55, and the height position of the support block 51 is adjusted by rotating the adjustment nut 56.

[0043] Specifically, by rotating the adjusting nut 56 to adjust the height position of the support block 51, the height of the second test board 3 can be quickly adjusted, so that the products 4 on the first test board 2 and the second test board 3 are staggered and conductive. At the same time, the support platform 12 can also be replaced with a support mechanism for overall up and down adjustment to ensure that the bending structure of the resistor 42 or the rivet column 43 structure and the fixed pad 32 are stable.

[0044] In one embodiment of the present utility model, a guide rod 61 is provided on the support block 51, and a guide sleeve 6 is provided on the guide rod 61. The guide sleeve 6 is connected to the cross bar 62, and the cross bar 62 is vertically connected to the vertical bar 63. An adjustment slider 64 is provided at the bottom of the vertical bar 63, and the vertical bar 63 is connected to the guide frame 65. The guide frame 65 is slidably provided on the base 1, and the adjustment slider 64 is slidably provided on the slide groove. A limit baffle 58 is provided on one side of the base 1, and the adjustment slider 64 is arranged opposite to the limit baffle 58. An adjustment component 66 is provided on both the cross bar 62 and the vertical bar 63, and the adjustment component 66 is used to adjust the relative position of the support block 51 and the second test plate 3.

[0045] Specifically, adjustment components 66 are provided on the horizontal bar 62 and the vertical bar 63. The horizontal bar 62 and the vertical bar 63 are vertically connected. The position of the support block 51 can be adjusted through the two adjustment components 66, so that the support block 51 can effectively support the second test board 3, preventing the PCB board 37 from bending or breaking due to the excessive weight of the product 4.

[0046] In one embodiment of the present invention, the adjustment component 66 has the same structure as the regulating component, and includes an adjustment nut 67 and two adjustment rods. The two adjustment rods are provided with threaded surfaces with opposite rotation directions. The two ends of the adjustment nut 67 are respectively screwed together with the two adjustment rods, and the relative position of the support block 51 is adjusted by rotating the adjustment nut 67.

[0047] The components in contact with the two test boards, such as the base 1, the supporting slider 54, the adjusting slider 64 and the supporting platform 12, are all coated with an insulating coating to prevent short circuits, leakage and other effects during the test process.

[0048] In one embodiment of the present invention, the product 4 includes a resistor 42 and a detection board 41 , a test pad is provided on the detection board 41 , the resistor 42 is welded on the detection board 41 , and the test pad on the detection board 41 is connected to the fixed pad 32 .

[0049] Specifically, a resistor 42 with a bending structure or a rivet column 43 structure is welded to a test board 41. Since the specifications of the test resistor 42 are different, test boards 41 of different thicknesses are selected for welding, so that the rivet columns 43 and other structures of the resistor 42 are on the same plane, which is convenient for subsequent assembly and avoids a virtual connection between the resistor 42 with a bending structure or a rivet column 43 structure and the second test board 3 or the first test board 2, which affects the detection accuracy. The resistor 42 that does not meet the specifications can also be tested synchronously, and has good applicability.

[0050] In one embodiment of the present invention, a limiting plate 11 is provided on the base 1, one side of the first test plate 2 is pressed against the limiting plate 11, and the limiting plate 11 is arranged opposite to the through hole 31 of the second test plate 3, so that the products 4 on the first test plate 2 and the second test plate 3 are arranged alternately.

[0051] In one embodiment of the present invention, a support groove 14 is provided on the support platform 12, a plurality of limit blocks are provided on the support groove 14, a limit groove 34 matching the limit block is provided on the second test board 3, and the limit groove 34 on the second test board 3 is clamped on the limit block.

[0052] Specifically, the test pad on the detection board 41 is connected to the fixed pad 32, so that the product 4 is welded on the first test board 2 and the second test board 3, and the first test board 2 is placed on the base 1, with one side of it pressed against the limit plate 11, and the bending structure or rivet column 43 structure of the resistor 42 on it is set upward, and one end of the second test board 3 is set on the support platform 12, and the other end is connected to the support block 51, and the limiting groove 34 on it is clamped on the limit block. At this time, the bending structure or rivet column 43 structure of the resistor 42 on it is set downward. Due to the action of the support platform 12 and the limiting plate 11, the products 4 on the first test board 2 and the second test board 3 are staggered, and the bending structure or rivet column 43 structure of the resistor 42 on the first test board 2 is connected to the fixed pad 32 on the second test board 3, and the bending structure or rivet column 43 structure of the resistor 42 on the second test board 3 is connected to the fixed pad 32 on the first test board 2, thereby completing the current loop of multiple resistors 42.

[0053] Usage process

[0054] The resistor 42 with a bending structure or a rivet column 43 structure is welded on the detection board 41. Due to the different specifications of the test resistor 42, detection boards 41 of different thicknesses are selected for welding, so that the rivet column 43 and other structures of the resistor 42 are on the same plane, which is convenient for subsequent assembly and avoids the resistor 42 with a bending structure or a rivet column 43 structure from being connected to the second test board 3 or the first test board 2, which affects the detection accuracy. The resistor 42 that does not pass the specification can also be tested synchronously, which has good applicability. The test pad on the detection board 41 is connected to the fixed pad 32, so that the product 4 is welded on the first test board 2 and the second test board 3. The first test board 2 is placed on the base 1, one side of which is pressed against the limit plate 11, and the bending structure or rivet column 43 structure of the resistor 42 on it is set upward. One end of the second test board 3 is set on the support platform 12, and the other end is connected to the support block 51. The limiting groove 34 is clamped on the limiting block. At this time, the bending structure or rivet column 43 structure of the resistor 42 thereon is set downward. Due to the action of the support platform 12 and the limiting plate 11, the products 4 on the first test board 2 and the second test board 3 are staggered. The bending structure or rivet column 43 structure of the resistor 42 on the first test board 2 is connected to the fixed pad 32 on the second test board 3, and the bending structure or rivet column 43 structure of the resistor 42 on the second test board 3 is connected to the fixed pad 32 on the first test board 2. The installation method of buckling the two test boards of the first test board 2 and the second test board 3 on both sides of the product 4 forms a current loop, which solves the problem that no current passes through the protruding part of the product 4 with the rivet column 43 or the bent part during testing. The test equipment is connected to the sampling wire 72, and the DC source wire is connected to the current inflow end 35 and the current outflow end 36 of the test board to test the product 4.

[0055] The above-described embodiments are merely preferred embodiments for the purpose of fully illustrating the present invention, and the scope of protection of the present invention is not limited thereto. Equivalent substitutions or modifications made by those skilled in the art based on the present invention are within the scope of protection of the present invention. The scope of protection of the present invention shall be subject to the claims.

Claims

1. A shunt life test device, characterized in that: include: a base, on which a testing station is provided; A testing mechanism is disposed on the base, comprising a first testing plate and a second testing plate of identical structure, wherein the first testing plate and the second testing plate are evenly provided with a plurality of through holes matching the product rivet studs, the first testing plate being disposed on the base, the second testing plate being disposed above the second testing plate, and the through holes on the first testing plate and the second testing plate being staggered; A fixing mechanism is provided on the pad surfaces of the first test board and the second test board, the fixing mechanism including a plurality of fixing pads, the fixing pads being provided in a one-to-one correspondence with the through holes, the fixing pads being provided with sampling holes matching the product rivet studs, the sampling holes being connected to the through holes; A sampling mechanism is provided on the sampling surfaces of the first test plate and the second test plate, the sampling mechanism including a plurality of sampling components, the sampling components being provided in a one-to-one correspondence with the fixed pads, the sampling components being connected to the fixed pads, and the sampling components being used to test and sample the products on the fixed pads; A supporting mechanism is arranged on the base, and the supporting mechanism includes a supporting platform and a positioning assembly. The supporting platform is arranged on one side of the base, and one end of the second test plate is arranged on the supporting platform. The first test plate and the second test plate are both connected to the positioning assembly, and the positioning assembly is used to fix and support the free ends of the first test plate and the second test plate.

2. The shunt life test device according to claim 1, characterized in that: The sampling component includes a sampling pad, which is arranged on the sampling surface and electrically connected to the fixing pad. A sampling wire is arranged on the sampling pad.

3. The shunt life test device according to claim 1, wherein: The first test board is a PCB board. One end of the first test board is provided with a current inflow end, and the other end is provided with a current outflow end. Both the current inflow end and the current outflow end are electrically connected to the fixed pad.

4. The shunt life test device according to claim 1, wherein: The positioning assembly includes a support block, a card slot is provided on the support block, one end of the second test plate is clamped on the card slot, a support frame is provided on the support block, a support slider is provided at the bottom of the support frame, and a plurality of slide slots are provided on the base, and the support slider is slidably arranged on the slide slots.

5. The shunt life test device according to claim 4, characterized in that: The support frame is provided with an adjusting component, which includes an adjusting nut and two adjusting rods. The two adjusting rods are respectively connected to the support frame. The two adjusting rods are provided with threaded surfaces with opposite rotation directions. The two ends of the adjusting nut are respectively screwed together with the two adjusting rods. The height position of the support block is adjusted by rotating the adjusting nut.

6. The shunt life test device according to claim 4, characterized in that: The support block is provided with a guide rod, a guide sleeve is provided on the guide rod, the guide sleeve is connected to the cross bar, the cross bar is vertically connected to the vertical bar, an adjustment slider is provided at the bottom of the vertical bar, the vertical bar is connected to the guide frame, the guide frame is slidably mounted on the base, the adjustment slider is slidably mounted on the slide groove, a limit baffle is provided on one side of the base, the adjustment slider is arranged opposite to the limit baffle, and adjustment components are provided on both the cross bar and the vertical bar, and the adjustment components are used to adjust the relative position of the support block and the second test plate.

7. The shunt life test device according to claim 6, characterized in that: The adjustment component includes an adjustment nut and two adjustment rods. The two adjustment rods are provided with threaded surfaces with opposite rotation directions. The two ends of the adjustment nut are respectively screwed together with the two adjustment rods. The relative position of the support block is adjusted by rotating the adjustment nut.

8. The shunt life test device according to claim 1, wherein: The product includes a resistor and a detection board, wherein a test pad is provided on the detection board, the resistor is welded on the detection board, and the test pad on the detection board is connected to the fixed pad.

9. The shunt life test device according to claim 1, wherein: A limit plate is provided on the base, one side of the first test plate is pressed against the limit plate, and the limit plate is arranged opposite to the through hole of the second test plate, so that the products on the first test plate and the second test plate are arranged alternately.

10. The shunt life test device according to claim 1, wherein: The support platform is provided with a support groove, and a plurality of limit blocks are provided on the support groove. The second test board is provided with a limit groove matching the limit block, and the limit groove on the second test board is clamped on the limit block.

Images