Chip testing equipment
By setting a protrusion on the test board to form a gap and using a fixing component to block the test line plug, the problem of loose or falling test lines is solved, and the continuity, stability and efficiency of chip testing are improved.
Patent Information
- Application Number
- CN202422574490.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-10-23
- Publication Date
- 2025-09-16
- Estimated Expiration
- 2034-10-23
AI Technical Summary
In existing automated chip testing equipment, test wires are easily loosened or dropped, which can affect the continuity, stability, and accuracy of chip testing and thus affect test efficiency.
Two opposing protrusions are provided on the test board to form a notch. When the plug of the test line extends into the notch and is electrically connected to the interface, it is connected to the protrusion through the fixing component, blocking the plug from moving away from the interface and preventing the test line from loosening or falling.
It ensures the continuity, stability and accuracy of chip testing, improves testing efficiency, and does not take up internal space of the equipment.
Smart Images
Figure CN223347009U_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the field of chip testing technology, and in particular to a chip testing device. Background Art
[0002] Throughout the chip production cycle, chip testing is a crucial step in verifying actual chip performance and ensuring product quality. With the continuous advancement of chip technology, chip complexity and integration are increasing, placing increasing demands on test equipment. To improve test efficiency and optimize test equipment space utilization, automated test equipment has become the industry's mainstream choice.
[0003] Existing automated testing equipment generally includes a test line, a frame, and a circuit board, a test socket, and a test board arranged in the frame. The test board is suspended in the frame so as to be arranged inside the testing equipment. Specifically, one end of the test board is electrically connected to the test socket above through the circuit board to connect to the chip to be tested through the test socket, and the other end of the test board is electrically connected to the test line through an interface to connect to the host computer. During the automated testing process, the test socket will continuously replace the chip for testing. The vibration of taking and placing the chip, the gravity of the test line itself, and other reasons will cause the connection between the test line and the interface to become loose after long-term use. In addition, the test environment often requires long-term continuous operation, which may eventually cause the test line to fall, the connection between the test line and the interface to be interrupted, and other problems, thereby affecting the continuity and stability of the chip test, and may also cause inaccurate test results and even affect the efficiency of the chip test. Utility Model Content
[0004] In view of this, the present application provides a chip testing device that can improve the problem that the test line is easy to loosen or fall off and the resulting impact on the continuity, stability, accuracy and efficiency of the chip test.
[0005] The present application provides a chip testing device, comprising:
[0006] circuit boards;
[0007] A test socket, electrically connected to the circuit board and used to electrically connect to the chip to be tested;
[0008] A test board comprising a mainboard, an interface, and two protrusions, wherein a first end of the mainboard is electrically connected to the circuit board, the two protrusions are oppositely disposed at a second end of the mainboard to form a notch in the test board, and the interface is electrically connected to the mainboard and located within the notch;
[0009] A test line, comprising a line and a plug, wherein the plug is connected to one end of the line and can be pluggably electrically connected to the interface;
[0010] A fixing component is connected to at least one of the protrusions and is in contact with the test line to prevent the plug from being electrically disconnected from the interface.
[0011] Optionally, the fixing component is contactably connected to the plug or the wiring.
[0012] Optionally, the fixing assembly is a clamp, which includes two clamping members, which are respectively arranged on both sides of the test board, and each of the clamping members is connected to the two protrusions to clamp and fix the test line.
[0013] Optionally, the clamp further includes two screws, each of which passes through the two clamping members and the corresponding protrusion to fix the two clamping members to the corresponding protrusion, and the screws can adjust the tightness of the fit between the two clamping members and the corresponding protrusion.
[0014] Optionally, the fixing assembly can be in contact with and connected to a lower end of the plug, where the lower end is an end of the plug away from the interface.
[0015] Optionally, the fixing assembly includes a stop rod, a pin shaft and a fixing piece, one end of the stop rod is rotatably connected to one of the protrusions through the pin shaft, and the other end of the stop rod is provided with a first through hole; the other protrusion is provided with a second through hole; the stop rod can rotate around the pin shaft to drive the stop rod to abut the lower end of the plug, and the other end of the stop rod moves to the other protrusion to align the first through hole with the second through hole, and the fixing piece is inserted into the aligned first through hole and second through hole.
[0016] Optionally, the fixing assembly includes a stop rod and a pin shaft, one end of the stop rod is rotatably connected to one of the protrusions through the pin shaft; when the stop rod rotates around the pin shaft and the other end of the stop rod moves to the other protrusion, the stop rod abuts the lower end of the plug; the pin shaft can adjust the tight fit between the stop rod and one of the protrusions.
[0017] Optionally, the fixing assembly includes a stop rod and a pin shaft, one end of the stop rod is rotatably connected to one of the protrusions through the pin shaft, the stop rod can rotate around the pin shaft to drive the stop rod to abut the lower end of the plug, and the other end of the stop rod is arranged opposite to the other protrusion; the pin shaft can adjust the tight fit between the stop rod and one of the protrusions.
[0018] Optionally, the fixing assembly includes two baffles, which are arranged on opposite sides of the test board through the pin shaft. Each baffle is provided with an arc-shaped portion. When the baffle abuts against the lower end of the plug, the arc-shaped portions of the two baffles surround and clamp the wiring.
[0019] Optionally, a buffer layer is provided at the contact point between the fixing component and the test line.
[0020] As described above, in the chip testing device of the present application, the test board is provided with two protrusions, which are arranged relative to each other to form a notch, and the interface is located in the notch. When the plug of the test line extends into the notch and is electrically connected to the interface, the fixing component is connected to at least one of the two protrusions and contacts the test line to block the plug from moving away from the interface, thereby preventing the test line from loosening or falling. For example, the problem of loosening of the test line caused by external vibration or the weight of the test line can be reduced, which is conducive to ensuring the continuity, stability, accuracy and efficiency of the chip test; and, since the plug of the test line must extend into the notch when the plug of the test line is electrically connected to the interface, it is equivalent to setting the two protrusions, the fixing component, the interface and the plug of the test line (and part of the wiring connected to the plug) that form the notch in the space that originally accommodates the interface and the plug of the test line. Therefore, the internal space of the device will not be occupied because the fixing component is set on the test board. BRIEF DESCRIPTION OF THE DRAWINGS
[0021] Figure 1 This is a front view of the partial structure of the chip testing device of the first embodiment of the present application;
[0022] Figure 2 yes Figure 1 A structural side view of the chip testing equipment shown;
[0023] Figure 3 yes Figure 1 A bottom view of a partial structure of a chip testing device is shown;
[0024] Figure 4 This is a front view of the structure of the chip testing device according to the second embodiment of the present application, in which the fixing component does not abut against the test line;
[0025] Figure 5 yes Figure 4 A front view of the structure of the fixed component of the chip testing equipment abutting against the test line;
[0026] Figure 6 This is a front view of the structure of the chip testing device according to the third embodiment of the present application, in which the fixing component does not abut against the test line;
[0027] Figure 7 yes Figure 6 A front view of the structure of the fixed component of the chip testing equipment abutting against the test line;
[0028] Figure 8 This is a front view of the structure of the chip testing device according to the fourth embodiment of the present application, in which the fixing component does not abut against the test line;
[0029] Figure 9 yes Figure 8 A front view of the structure in which a fixed component of a chip testing device abuts against a test line.
[0030] Test socket 1
[0031] Circuit board 2, first surface 21, second surface 22
[0032] Test board 3
[0033] Notch 30, motherboard 31, interface 32, protrusion 33
[0034] Test line 4, trace 41, plug 42
[0035] Fixing assembly / fixture 5
[0036] Clamp 51, screw 52
[0037] Baffle 53, pin 54, fixing member 55, first through hole 50, second through hole 330 DETAILED DESCRIPTION
[0038] In order to solve the above-mentioned technical problems existing in the prior art, in the chip testing equipment of the present application, one end of the test board is electrically connected to the test socket through the circuit board to connect to the chip to be tested through the test socket, and the other end of the test board is electrically connected to the test line through the interface. The test board is provided with two protrusions, and the two protrusions are arranged opposite to each other to form a notch. The interface for testing is located in the notch. When the plug of the test line extends into the notch and is electrically connected to the interface, it is connected to at least one of the two protrusions through a fixing component and contacts the test line to block the plug from moving away from the interface, thereby preventing the test line from loosening or falling.
[0039] Among them, the shape, quantity, size and other forms of any of the circuit board, test socket, test board, test line and fixed components can be determined according to actual needs and are not limited in this application.
[0040] To make the objectives, technical solutions, and advantages of this application more clear, the technical solutions of this application will be clearly described below in conjunction with specific embodiments and corresponding drawings. Obviously, the embodiments described below are only some of the embodiments of this application, not all of them. Unless there is a conflict, the following embodiments and their technical features can be combined with each other and also belong to the technical solutions of this application.
[0041] In the description of the embodiments of the present application, the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", etc. to indicate the orientation or position relationship are based on the orientation or position relationship shown in the accompanying drawings, and are only for the convenience of describing the technical solutions of the corresponding embodiments, and do not indicate or imply that the device or element must have a specific orientation, be constructed and operated in a specific orientation, and should not be understood as a limitation on the present application.
[0042] First embodiment
[0043] See also Figures 1 to 3 As shown, the chip testing equipment (referred to as “testing equipment” or “equipment” in some places) includes a test socket 1 , a circuit board 2 , a test board 3 , a test line 4 and a fixing component 5 .
[0044] The circuit board 2 includes two surfaces disposed opposite to each other along its thickness direction (ie, direction y indicated by the arrow in the figure), which are respectively referred to as a first surface 21 and a second surface 22 . Figure 1 The figure shows the local structure of the chip test equipment along its own height direction (i.e. the direction y indicated by the arrow in the figure). Figure 1 In the placement orientation shown, the first surface 21 can be regarded as the upper surface of the circuit board 2 , and correspondingly, the second surface 22 can be regarded as the lower surface of the circuit board 2 .
[0045] The test socket 1 can be disposed on the first surface 21 and electrically connected to the circuit board 2 . That is, the test socket 1 is disposed on the upper surface of the circuit board 2 , so that the chip to be tested can be electrically connected to the test socket 1 .
[0046] The test board 3 includes a main board 31, an interface 32 and two protrusions 33. The main board 31 includes a first end and a second end arranged along the length direction of the test board 3 (i.e., the direction y indicated by the arrow in the figure). The first end of the main board 31 is arranged on the second surface 22 of the circuit board 2 and is electrically connected to the circuit board 2, that is, the test board 3 can be regarded as being suspended and installed on the lower surface of the circuit board 2. The two protrusions 33 are arranged at the second end of the main board 31 and are relatively arranged along the width direction of the test board 3 (i.e., the direction x indicated by the arrow in the figure) to form a gap 30. The main board 31 and the two protrusions 33 can be expressed as an integrally molded circuit board. The two protrusions 33 can be provided with wiring and electronic components, but the wiring and electronic components may not be located at the connection between the fixing assembly 5 and the two protrusions 33 below to avoid the fixing assembly 5 damaging the wiring and electronic components here. Of course, the two protrusions 33 may also not be provided with wiring and electronic components. The interface 32 is electrically connected to the main board 31 and is located in the gap 30. In Figure 1 and Figure 2In the placement orientation shown, the test board 3 can be regarded as being installed in a suspended manner in the test equipment.
[0047] The test line 4 includes a trace 41 and a plug 42, the plug 42 is connected to one end of the trace 41, and the other end of the trace 41 can be connected to the host computer that performs the test, and one end of the trace 41 and the plug 42 can extend into the notch 30 of the test board 3, and thereby be pluggable and electrically connected to the interface 32 of the test board 3.
[0048] The test equipment of the present application can be provided with multiple test sockets 1, multiple test boards 3, multiple test lines 4 and multiple fixed components 5. The specific number can be determined according to the adaptability of the scene. The number of test boards 3 and test sockets 1 can be equal and electrically connected to the same circuit board 2. The test boards 3 are electrically connected to the test lines 4 in a one-to-one correspondence. Each test board 3 is provided with a fixed component 5. Here, the test equipment can test multiple chips. These test boards 3 can be arranged in an array. Figure 1 and Figure 2 Three test sockets 1, three test boards 3, three test lines 4 and three fixing components 5 are shown, which are only exemplary and do not constitute a limitation on the scope of protection of this application.
[0049] In this example, the fixing component 5 is a clamp, and the clamp 5 includes two clamping members 51 .
[0050] Combine Figures 1 to 3 As shown, during the test process, after the plug 42 of the test line 4 is plugged into the interface 32 of the test board 3 to achieve electrical connection, the two clamping members 51 are respectively arranged on both sides of the test board 3 along the thickness direction of the test board 3 (i.e., the direction z shown by the arrow in the figure), and the single clamping members 51 are connected to the two protrusions 33, so as to clamp and fix the test line 4, and achieve contact with the test line 4 to block the plug 42 from moving away from the interface 32 of the test board 3, thereby preventing the test line 4 from loosening or falling, ensuring the firmness of the electrical connection between the plug 42 and the interface 32, and helping to ensure the continuity, stability, accuracy and efficiency of the chip test.
[0051] Furthermore, since the plug 42 of the test line 4 will inevitably extend into the notch 30 of the test board 3 when the plug 42 of the test line 4 is electrically connected to the interface 32, it is equivalent to setting the two protrusions 33 that form the notch 30, the fixing component 5, the interface 32, and the plug 42 of the test line 4 (and the portion of the wiring 41 connected to the plug 42) in the space that originally accommodates the interface 32 and the plug 42 (and the portion of the wiring 41 connected to the plug 42). Therefore, the internal space of the device will not be occupied by the setting of the fixing component 5 on the test board 3. In addition, although the fixing component 5 will occupy a certain space in the direction of its own thickness, in a scenario where the device is provided with multiple test boards 3 and multiple chips are tested, once a test board 3 accidentally deviates toward an adjacent test board 3, the fixing component 5 is conducive to maintaining the isolation between the two adjacent test boards 3 and avoiding the possible short circuit between the two adjacent test boards 3.
[0052] The clamp 5 may also adopt other structural forms, including but not limited to other mechanical clamps, snap-fit clamps, and magnetic clamps, and the specific structure can be determined according to the requirements of the test equipment and the actual operating environment. Among them, snap-fit clamps and magnetic clamps are easy to operate and suitable for test scenarios that require frequent plugging and unplugging of the test lead 4.
[0053] exist Figures 1 to 3 In the example shown, the two clamping members 51 directly clamp the plug 42 of the test line 4 without directly contacting the line 41. By directly contacting the side wall of the plug 42, as shown in FIG. Figure 3 All side walls of the plug 42 are shown in direct contact to directly provide support to the plug 42.
[0054] In other examples, the two clamps 51 may directly clamp and fix the wiring 41 , for example, clamp and fix a portion of the wiring 41 adjacent to the plug 42 without directly contacting the plug 42 , thereby ensuring the firmness of the electrical connection between the plug 42 and the interface 32 .
[0055] Continue reading Figure 3 In other examples, the clamp 5 may also include two screws 52. A single screw 52 passes through the two clamping members 51 and the corresponding protrusions 33 to secure the two clamping members 51 to the two protrusions 33. That is, the fixing assembly 5 in this example can be considered a screw-type clamp. This screw-type clamp can provide greater fixing strength, ensuring that the test line 4 maintains a stable electrical connection in a long-term testing environment. In addition, by tightening at least one of the screws 52, the tightness between the two clamping members 51 and the corresponding protrusion 33 can be adjusted, that is, the friction between the two clamping members 51 and the corresponding protrusion 33 can be adjusted. If the test line 4 becomes loose, the screw 52 can be tightened at any time to adjust it. This ensures that the test line 4 is firmly clamped while being easy to operate and will not be damaged by the two clamping members 51 clamping too tightly.
[0056] A buffer layer may be provided at the contact point between the fixing component 5 of any of the aforementioned examples and the test line 4, including but not limited to a structural layer made of flexible materials such as a rubber pad, to ensure that the test line 4 is not damaged during the clamping process, while providing additional friction to prevent the test line 4 from moving.
[0057] It should be understood that the test device of this application is a complete device, including the necessary structural elements required for testing chips in the field, and not all of them are shown and described herein. For example, the test device also includes a frame, and the structural elements labeled above are disposed within the frame, thereby being disposed within the interior of the test device.
[0058] Second embodiment
[0059] For structural elements with the same name, the present application uses the same reference numerals to identify them in various embodiments. Figure 4 and Figure 5 As shown, the fixing assembly 5 includes a blocking rod 53 , a pin 54 and a fixing member 55 .
[0060] One end of the blocking rod 53 is rotatably connected to one of the protrusions 33 via a pin 54 , and the other end of the blocking rod 53 is provided with a first through hole 50 . The other protrusion 33 of the two protrusions 33 is provided with a second through hole 330 .
[0061] Before plugging the plug 42 of the test line 4 into the interface 32 of the test board 3, first rotate the other end of the blocking rod 53 in a direction away from the other protrusion 33, for example, rotate one end of the blocking rod 53 clockwise around the pin 54, so that the interface 32 of the test board 3 is not blocked by the blocking rod 53; then, plug the plug 42 of the test line 4 into the interface 32 of the test board 3 to achieve electrical connection; then, rotate the other end of the blocking rod 53 toward the other protrusion 33, for example, rotate one end of the blocking rod 53 around the pin 54 along the Figure 4 Rotate counterclockwise as indicated by the thick arrow until the first through hole 50 at the other end of the blocking rod 53 is aligned with the second through hole 330 of the other protrusion 33, and then insert the fixing member 55 into the aligned first through hole 50 and second through hole 330. Figure 5 As shown, the blocking rod 53 can be in contact with, or abut against, the lower end of the plug 42 , and the lower end is the end of the plug 42 away from the interface 32 of the test board 3 .
[0062] The test plate 3 may be provided with blocking rods 53 on both sides of the opposite sides. Figure 4 and Figure 5 Only one-side setting is shown. In the scenario where the fixing assembly 5 includes two blocking rods 53, the two blocking rods 53 are respectively arranged on opposite sides of the test plate 3 through the pin 54. For example, the two blocking rods 53 are respectively arranged on the same protrusion 33 (for example Figure 4On opposite sides of the convex portion 33 on the left side of the middle), one end of the two baffle rods 53 is rotatably connected to the same convex portion 33 through the pin shaft 54; for another example, one end of one baffle rod 53 is rotatably connected to one of the convex portions 33 through a pin shaft 54, and one end of the other baffle rod 53 is rotatably connected to the other convex portion 33 through another pin shaft 54. The baffle rod 53 on the left rotates counterclockwise around the corresponding pin shaft 54, and the baffle rod 53 on the right rotates clockwise around the corresponding pin shaft 54, thereby driving the other ends of the two baffle rods 53 to rotate until they abut against the lower end of the plug 42 and are located on opposite sides of the plug 42.
[0063] Further optionally, each blocking rod 53 is provided with an arc portion, and when the blocking rod 53 abuts the lower end of the plug 42, the arc portions of the two blocking rods 53 surround and clamp the wiring 41 (the portion adjacent to the plug 42). The function of the arc portion can be referred to the clamp 5 of the first embodiment above.
[0064] In various examples of this second embodiment, the fixing component 5 is contactably connected to the lower end of the plug 42, and the contactable connection is abutment. The plug 42 is blocked by the blocking rod 53, which can also prevent it from loosening or falling. At the same time, the internal space of the device will not be occupied because the fixing component 5 is set on the test board 3.
[0065] Third embodiment
[0066] Based on the description of the second embodiment above, the difference is that Figure 6 and Figure 7 As shown, the fixing assembly 5 includes a blocking rod 53 and a pin 54 .
[0067] One end of the blocking rod 53 is rotatably connected to one of the protrusions 33 through a pin shaft 54. The other end of the blocking rod 53 is not provided with the aforementioned first through hole 50. Correspondingly, the other protrusion 33 of the two protrusions 33 is not provided with the aforementioned second through hole 330. The fixing assembly 5 does not need to be provided with the aforementioned fixing part 55.
[0068] Before plugging the plug 42 of the test line 4 into the interface 32 of the test board 3, first rotate the other end of the blocking rod 53 in a direction away from the other protrusion 33, for example, rotate one end of the blocking rod 53 clockwise around the pin 54, so that the interface 32 of the test board 3 is not blocked by the blocking rod 53; then, plug the plug 42 of the test line 4 into the interface 32 of the test board 3 to achieve electrical connection; then, rotate the other end of the blocking rod 53 toward the other protrusion 33, for example, rotate one end of the blocking rod 53 around the pin 54 along the Figure 6 The thick arrow indicates counterclockwise rotation until the other end of the blocking rod 53 contacts the other convex portion 33. In this example, the other end of the blocking rod 53 is tightly fitted with the other convex portion 33 through the force of the surface contact (i.e., friction). Figure 7As shown, the blocking rod 53 is in contact connection with the lower end of the plug 42 .
[0069] In this example, the pin 54 can adjust the tightness of the fit between the blocking rod 53 and one of the protrusions 33. If the plug 42 of the test lead 4 becomes loose in the interface 32, the pin 54 can be screwed in at any time to adjust the fit. This is simple to operate. For example, after rotating the other end of the blocking rod 53 toward the other protrusion 33 until the other end of the blocking rod 53 makes surface contact with the other protrusion 33, the pin 54 can be used to adjust the fit to increase the friction between the blocking rod 53 and the one of the protrusions 33. This is equivalent to tightening the pin 54 to keep the other end of the blocking rod 53 relatively fixed to the other protrusion 33.
[0070] The pin 54 can be specifically expressed as a screw. By screwing the screw, the friction force (or the tightness of the fit) between one end of the blocking rod 53 and one of the protrusions 33 can be adjusted.
[0071] Fourth embodiment
[0072] Based on the description of the third embodiment above, the difference is that Figure 8 and Figure 9 As shown, the fixing assembly 5 also includes a blocking rod 53 and a pin 54, but the blocking rod 53 is shorter.
[0073] One end of the blocking rod 53 is rotatably connected to one of the protrusions 33 via a pin 54. The blocking rod 53 can rotate about the pin 54 to drive the other end of the blocking rod 53 to rotate until it abuts the lower end of the plug 42. At this point, the other end of the blocking rod 53 is positioned opposite the other of the two protrusions 33. "Relatively positioned" means that a non-zero distance exists between the other end of the blocking rod 53 and the other protrusion 33 along the width of the test board 3, i.e., the blocking rod 53 and the other protrusion 33 are not in contact.
[0074] In this example, the fixing assembly 5 is also in contact with (ie, abuts against) the lower end of the plug 42 of the test line 4 to prevent the test line 4 from loosening or falling.
[0075] Optionally, the fixing assembly 5 includes two blocking rods 53 and two pins 54. The two blocking rods 53 are respectively arranged on opposite sides of the test plate 3. One end of one blocking rod 53 is rotatably connected to one of the protrusions 33 through a pin 54, and one end of the other blocking rod 53 is rotatably connected to the other protrusion 33 through another pin 54. Figure 8 and Figure 9As shown, the left baffle 53 rotates counterclockwise around the corresponding pin 54, and the right baffle 53 rotates clockwise around the corresponding pin 54, thereby driving the other ends of the two baffles 53 to rotate to abut against the lower end of the plug 42 and be located on opposite sides of the plug 42.
[0076] In other examples, the fixing assembly 5 may include two blocking rods 53 but only one pin 54, and the two blocking rods 53 are respectively arranged on the same protrusion 33 (for example Figure 8 On opposite sides of the protrusion 33 on the left side of the middle portion, one end of two blocking rods 53 is rotatably connected to the same protrusion 33 via the pin 54. The two blocking rods 53 rotate counterclockwise around the pin 54, thereby driving the other ends of the two blocking rods 53 to rotate until they abut against the lower end of the plug 42 and are located on opposite sides of the plug 42.
[0077] It should be understood that the pin 54 of the fourth embodiment can also adjust the tightness of the fit between the blocking rod 53 and the corresponding protrusion 33. The specific principle can be found in the description of the third embodiment above and will not be repeated here.
[0078] The above descriptions are only some embodiments of the present application and do not limit the patent scope of the present application. For ordinary technicians in this field, any equivalent structural changes made using the contents of this specification and drawings are also included in the patent protection scope of the present application.
[0079] Although the terms "first," "second," and the like are used herein to describe various information, such information should not be limited to these terms. These terms are used only to distinguish information of the same type from one another. In addition, the singular forms "a," "an," and "the" are intended to include the plural forms as well. The terms "or" and "and / or" are to be interpreted as inclusive, meaning any one or any combination. Exceptions to this definition occur only when a combination of elements, functions, steps, or operations is inherently mutually exclusive in some manner.
Claims
1. A chip testing device, characterized in that: include: circuit boards; A test socket, electrically connected to the circuit board and used to electrically connect to the chip to be tested; A test board comprising a mainboard, an interface, and two protrusions, wherein a first end of the mainboard is electrically connected to the circuit board, the two protrusions are oppositely disposed at a second end of the mainboard to form a notch in the test board, and the interface is electrically connected to the mainboard and located within the notch; A test line, comprising a line and a plug, wherein the plug is connected to one end of the line and can be pluggably electrically connected to the interface; A fixing component is connected to at least one of the protrusions and is in contact with the test line to prevent the plug from being electrically disconnected from the interface.
2. The chip testing device according to claim 1, characterized in that: The fixing component is contactably connected to the plug or the wiring.
3. The chip testing device according to claim 2, characterized in that: The fixing assembly is a clamp, which includes two clamping members. The two clamping members are respectively arranged on both sides of the test board, and each of the clamping members is connected to the two protrusions to clamp and fix the test line.
4. The chip testing device according to claim 3, characterized in that: The clamp further includes two screws, each of which passes through the two clamping members and the corresponding protrusion to fix the two clamping members to the corresponding protrusion, and the screws can adjust the tightness of the fit between the two clamping members and the corresponding protrusion.
5. The chip testing device according to claim 1, characterized in that: The fixing assembly can be in contact with and connected to the lower end of the plug, and the lower end is the end of the plug away from the interface.
6. The chip testing device according to claim 5, characterized in that: The fixing assembly includes a blocking rod, a pin and a fixing member, one end of the blocking rod is rotatably connected to one of the protrusions through the pin, the other end of the blocking rod is provided with a first through hole; the other protrusion is provided with a second through hole; The blocking rod can rotate around the pin shaft to drive the blocking rod to abut the lower end of the plug, and the other end of the blocking rod moves to the other protrusion to align the first through hole with the second through hole, and the fixing member is inserted into the aligned first through hole and second through hole.
7. The chip testing device according to claim 5, characterized in that: The fixing assembly includes a blocking rod and a pin, and one end of the blocking rod is rotatably connected to one of the protrusions through the pin; The blocking rod can rotate around the pin shaft, and when the other end of the blocking rod moves to the other protrusion, the blocking rod abuts the lower end of the plug; the pin shaft can adjust the tightness of the fit between the blocking rod and one of the protrusions.
8. The chip testing device according to claim 5, characterized in that: The fixing assembly includes a stop rod and a pin shaft, one end of the stop rod is rotatably connected to one of the protrusions through the pin shaft, the stop rod can rotate around the pin shaft to drive the stop rod to abut the lower end of the plug, and the other end of the stop rod is arranged opposite to the other protrusion; the pin shaft can adjust the tightness of the fit between the stop rod and one of the protrusions.
9. The chip testing device according to any one of claims 6 to 8, characterized in that: The fixing assembly includes two baffles, which are arranged on opposite sides of the test board through the pin shaft. Each baffle is provided with an arc portion. When the baffle abuts the lower end of the plug, the arc portions of the two baffles surround and clamp the wiring.
10. The chip testing device according to claim 1, characterized in that: A buffer layer is provided at the contact point between the fixing component and the test line.