Testing device

Abstract

The utility model provides a testing device which comprises testing interfaces, testing units, a conversion unit and a control unit, the multiple testing interfaces are electrically connected with the conversion unit, the conversion unit is electrically connected with the multiple testing units, the control unit is electrically connected with the conversion unit, and the testing interfaces are used for inserting samples to be tested. The test unit is used for performing interface test on the to-be-tested sample, and the control unit is used for controlling the conversion unit to switch connection between the test unit and the test interface. The test efficiency of the interface test of the to-be-tested sample can be improved.

Description

Technical Field

[0001] The present application generally relates to the field of interface testing, and more particularly to a testing device. Background Art

[0002] As computer technology continues to evolve, serial communication technology is also constantly adapting to this advancement. Currently, USB (Universal Serial Bus) serial communication has reached versions 3.0 and even 3.1, and various connector types have been developed, such as Type-A, Type-B, and Type-C. Type-A and Type-C are the most commonly used.

[0003] USB ports, USB data cables, or motherboards with various types of USB ports typically undergo multiple tests before shipment, including mechanical, electrical, safety, standards-specific, and physical interface certification. However, due to the wide variety of USB port and cable types, current testing equipment can only perform interface tests on a single type of USB port, cable, or motherboard, resulting in low testing efficiency. Summary of the Invention

[0004] This application is completed in view of the above-mentioned state of the prior art, and its purpose is to provide a testing device that can improve testing efficiency.

[0005] The present application provides a testing device, including: a test interface, a test unit, a conversion unit, and a control unit. A plurality of the test interfaces are electrically connected to the conversion unit, the conversion unit is electrically connected to a plurality of the test units, and the control unit is electrically connected to the conversion unit. The test interface is used to plug in a sample to be tested, the test unit is used to perform an interface test on the sample to be tested, and the control unit is used to control the conversion unit to switch the connection between the test unit and the test interface.

[0006] In some examples, when the sample to be tested is plugged into the test interface, the test interface generates a plug-in signal indicating that the test interface is plugged with the sample to be tested. The control unit obtains the plug-in signal and controls the conversion unit to switch the corresponding test unit based on the plug-in signal to allow the corresponding test unit to be connected to the test interface.

[0007] In some examples, the test interface includes a first test interface, the test unit includes a first test unit and a second test unit, and when the sample to be tested is of the first sample type, the control unit controls the conversion unit to connect the first test interface with the first test unit to allow the first test unit to perform an interface test on the front side of the sample to be tested; or, the control unit controls the conversion unit to connect the first test interface with the second test unit to allow the first test unit to perform an interface test on the back side of the sample to be tested.

[0008] In some examples, the test interface includes a second test interface, the test unit includes a third test unit, and when the sample to be tested is of the second sample type, the control unit controls the conversion unit to connect the second test interface with the third test unit to allow the third test unit to perform an interface test on the sample to be tested.

[0009] In some examples, the test interface includes a third test interface, the test unit includes a fourth test unit, and when the sample to be tested is of the third sample type, the control unit controls the conversion unit to connect the third test interface with the fourth test unit to allow the fourth test unit to perform an interface test on the sample to be tested.

[0010] In some examples, the test interface includes a fourth test interface, the test unit includes a fifth test unit, and when the sample to be tested is of the fourth sample type, the control unit controls the conversion unit to connect the fourth test interface with the fifth test unit to allow the fifth test unit to perform an interface test on the sample to be tested.

[0011] In some examples, a main control unit electrically connected to the test unit is further included. When the sample to be tested is plugged into the test interface and the sample to be tested is qualified, the test interface generates a connection signal. The test unit is used to obtain the connection signal and output a test signal indicating that the sample to be tested is qualified. The main control unit obtains the test signal and determines that the sample to be tested is qualified.

[0012] In some examples, the types of the samples to be tested include USB Type-C, USB Type-A, USB 3.0, and USB 2.0.

[0013] Compared with the prior art, this invention has at least the following advantages:

[0014] 1. In the present application, the control unit controls the conversion unit to switch the connection between the test unit and the test interface, so that when testing multiple types of samples to be tested, the samples to be tested can be quickly connected to the test unit through the test interface, thereby improving the test efficiency.

[0015] 2. In the present application, the control unit controls the conversion unit to switch the connection between the test unit and the test interface, and the front and back sides of a single type of sample to be tested can also be tested, which reduces the steps of manually switching the connection back and forth and further improves the test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 It is a schematic diagram showing the structure and connection relationship of the test device involved in the example of this application.

[0017] Figure 2 It is a schematic diagram showing the structure and connection relationship of a testing device involved in another example of the present application.

[0018] Figure 3 It is a structural diagram showing the first test interface in the test device involved in the example of this application.

[0019] Figure 4 It is a schematic diagram showing the structure of the second test interface in the test device involved in the example of this application.

[0020] Description of reference numerals:

[0021] 1…test device, 11…test interface, 12…test unit, 13…conversion unit, 14…control unit, 15…main control unit, 111…first test interface, 112…second test interface, 113…third test interface, 114…fourth test interface, 121…first test unit, 122…second test unit, 123…third test unit, 124…fourth test unit, 125…fifth test unit. DETAILED DESCRIPTION

[0022] The following will be combined with the drawings in the embodiments of this application to clearly and completely describe the technical solutions in the embodiments of this application. Obviously, the embodiments described are only part of the embodiments of this application, not all of them. Based on the embodiments in this application, all other embodiments filled in by ordinary technicians in this field without making creative efforts are within the scope of protection of this application.

[0023] It should be noted that the terms "first", "second", "third" and "fourth" in the specification and claims of this application and the above-mentioned drawings are used to distinguish different objects, rather than to describe a specific order. In addition, the terms "comprise" and "include" and any variations thereof are intended to cover non-exclusive inclusions. For example, a process, method, system, product or device that includes a series of steps or units is not limited to the listed steps or units, but may optionally include steps or units that are not listed, or may optionally include other steps or units that are inherent to these processes, methods, products or devices. In the following description, the same symbols are given to the same components, and repeated descriptions are omitted. In addition, the drawings are only schematic diagrams, and the ratio of the sizes of the components to each other or the shapes of the components may be different from the actual ones.

[0024] As computer technology continues to evolve, serial communication technology is also constantly adapting to this advancement. Currently, USB (Universal Serial Bus) serial communication has reached versions 3.0 and even 3.1, and various connector types have been developed, such as Type-A, Type-B, and Type-C. Type-A and Type-C are the most commonly used.

[0025] USB data cables typically undergo multiple tests before leaving the factory, including mechanical, electrical, safety, standards-specific, and physical interface certification. However, due to the wide variety of USB data cable types, current testing equipment can only perform interface tests on a single type of USB data cable, resulting in low testing efficiency.

[0026] To this end, the present application provides a testing device that can improve the testing efficiency of USB data line testing.

[0027] Figure 1 It is a schematic diagram showing the structure and connection relationship of the testing device 1 involved in the example of this application.

[0028] like Figure 1 As shown, the test device 1 may include: a test interface 11, a test unit 12, a conversion unit 13, and a control unit 14. Specifically, multiple test interfaces 11 are electrically connected to the conversion unit 13, the conversion unit 13 is electrically connected to multiple test units 12, and the control unit 14 is electrically connected to the conversion unit 13. The test interface 11 is used to plug in a sample to be tested, the test unit 12 is used to perform interface testing on the sample to be tested, and the control unit 14 is used to control the conversion unit 13 to switch the connection between the test unit 12 and the test interface 11.

[0029] It can be understood that interface testing can refer to electrical testing of the interface of the sample to be tested, such as obtaining electrical parameters such as resistance, voltage, current or resistivity of the interface of the sample to be tested to determine whether the sample to be tested is qualified, or refers to interface certification of the interface of the sample to be tested, such as obtaining the compatibility of the sample to be tested to determine whether the sample to be tested can be used on a specific device.

[0030] Depending on the type of the sample to be tested, there may be multiple test interfaces 11 , for example, for Type-A, Type-B and Type-C USB data cables, the test interfaces 11 may be the corresponding three interfaces.

[0031] Depending on the type of sample to be tested and the test requirements, there can be multiple test units 12. For example, for USB data cables with Type-A and Type-C connectors and USB data cables with 2.0 and 3.0 protocols, the test unit 12 can be a first test unit 121 for testing the front side of a Type-C, a second test unit 122 for testing the back side of a Type-C, a third test unit 123 for testing a Type-A, a fourth test unit 124 for testing USB 2.0, and a fifth test unit 125 for testing USB 3.0. It should be noted that the present application is not limited to this, that is, depending on the type of sample to be tested and the test requirements, more test units 12 can be provided.

[0032] In some examples, when the sample to be tested is plugged into the test interface 11, the test interface 11 may generate a plug-in signal indicating that the test interface 11 is plugged with the sample to be tested, and the control unit 14 may obtain the plug-in signal and control the conversion unit 13 to switch the corresponding test unit 12 based on the plug-in signal to allow the corresponding test unit 12 to be connected to the test interface 11. For example, assuming that the sample to be tested is Type-C, when the sample to be tested is plugged into the corresponding test interface 11, such as when it is plugged into the first test interface 111, the first test interface 111 generates a plug-in signal. After obtaining the plug-in signal, the control unit 14 may control the conversion unit 13 to electrically connect the first test interface 111 with the first test unit 121 (if the test is the front of the Type-C), or, after obtaining the plug-in signal, the control unit 14 may control the conversion unit 13 to electrically connect the first test interface 111 with the second test unit 122 (if the test is the back of the Type-C). In this way, manual conversion can be reduced, thereby improving test efficiency.

[0033] In some examples, if the sample to be tested is a port, the test interface 11 can be set as a male connector adapted to the sample to be tested; if the sample to be tested is a data cable, the test interface 11 can be set as a female interface adapted to the sample to be tested.

[0034] In some examples, the control unit 14 can be a microcontroller (MCU) in the test device 1. The conversion unit 13 can be a circuit or chip having multiple switching circuits, such as the CBTU02044HE chip. The test unit can be a circuit or chip for driving the read and write operation of a hard disk, such as the ASM235CM, or a test platform for verifying the electrical characteristics, circuit connectivity, burning reliability, and aging test of the sample under test, such as an automated test equipment (ATE), a joint test action group (JTAG), or a boundary-scan test platform.

[0035] In some examples, as described above, the test interface 11 may include a first test interface 111, and the test unit 12 may include a first test unit 121 and a second test unit 122. When the sample to be tested is of the first sample type, the control unit 14 may control the conversion unit 13 to connect the first test interface 111 with the first test unit 121 to allow the first test unit 121 to perform an interface test on the front side of the sample to be tested; or, the control unit 14 may control the conversion unit 13 to connect the first test interface 111 with the second test unit 122 to allow the first test unit 121 to perform an interface test on the back side of the sample to be tested. It is understood that the first sample type is a Type-C port or a USB data cable with a Type-C connector.

[0036] In some examples, when the first sample type is a USB data cable with a Type-C port or a Type-C connector, the interface test content on the front and back sides is the same, so the test unit 12 can be the same, that is, the first test unit 121 and the second test unit 122 can be the same.

[0037] In some examples, as described above, the test interface 11 may include a second test interface 112, and the test unit 12 may include a third test unit 123. When the sample to be tested is of the second sample type, the control unit 14 may control the conversion unit 13 to connect the second test interface 112 to the third test unit 123, so as to allow the third test unit 123 to perform an interface test on the sample to be tested. The second sample type may be a Type-A port, a Type-B port, a USB data cable with a Type-A connector, or a USB data cable with a Type-B connector.

[0038] In some examples, as described above, the test interface 11 may include a third test interface 113, and the test unit 12 may include a fourth test unit 124. When the sample to be tested is of the third sample type, the control unit 14 may control the conversion unit 13 to connect the third test interface 113 to the fourth test unit 124, thereby allowing the fourth test unit 124 to perform an interface test on the sample to be tested. The third sample type may be a USB port, a data cable, or a motherboard using the 2.0 protocol.

[0039] In some examples, test interface 11 includes a fourth test interface 114, and test unit 12 includes a fifth test unit 125. When the sample to be tested is of the fourth sample type, control unit 14 controls conversion unit 13 to connect fourth test interface 114 to fifth test unit 125, allowing fifth test unit 125 to perform an interface test on the sample to be tested. The fourth sample type can be a USB port, a data cable, or a motherboard using the 3.0 protocol.

[0040] Figure 2 It is a schematic diagram showing the structure and connection relationship of the testing device 1 involved in another example of the present application.

[0041] In some examples, such as Figure 2 As shown, the test device 1 may further include a main control unit 15 electrically connected to the test unit 12. When the sample to be tested is plugged into the test interface 11 and the sample to be tested is qualified, the test interface 11 generates a connection signal, and the test unit 12 is used to obtain the connection signal and output a test signal indicating that the sample to be tested is qualified. The main control unit 15 obtains the test signal and determines that the sample to be tested is qualified. For example, if the sample to be tested is a USB Type-A and is qualified, when the sample to be tested is plugged into the second test interface 112, the second test interface 112 will generate a connection signal. After the third test unit 123 obtains the connection signal, it will output a test signal indicating that the sample to be tested is qualified. The main control unit 15 obtains the test signal and determines that the sample to be tested is qualified. Conversely, if the sample to be tested is a USB Type-A and is unqualified, when the sample to be tested is plugged into the second test interface 112, the second test interface 112 will not generate a connection signal, and the third test unit 123 will not obtain the connection signal. The main control unit 15 determines that the sample to be tested is unqualified.

[0042] In some examples, the test unit 12 obtains a connection signal and outputs a test signal indicating that the sample to be tested is qualified, which may refer to whether the simulated sample to be tested can be connected when plugged into a reading device. If the sample to be tested can be connected, it means that the sample to be tested can be used to connect the reading device to the device to be read, that is, it is qualified. Therefore, the test signal can be a signal of the simulated reading device, also called a device signal.

[0043] In some examples, the main control unit 15 may be a host or a CPU in the testing device 1 .

[0044] Figure 3 1 is a schematic structural diagram showing the first test interface 111 in the test device 1 involved in the example of this application. Figure 4 1 is a schematic diagram showing the structure of the second test interface 112 in the test device 1 involved in the example of this application.

[0045] In some examples, as described above, the types of the samples to be tested may include but are not limited to USB Type-C, USB Type-A, USB 3.0, and USB 2.0. Figure 3 As shown, corresponding to the USB Type-C connector, the first test interface 111 can be a plug interface with at least 24 pins, each pin corresponds to a USB Type-C pin to facilitate electrical testing of each pin of the USB Type-C, and the remaining pins can be ground protection pins. Figure 4 As shown, corresponding to the USB Type-A connector, the second test interface 112 can be a plug interface with at least 8 pins, each pin corresponding to a pin of the USB Type-A to facilitate electrical testing of each pin of the USB Type-A, and the remaining pins can be power drive and ground protection pins.

[0046] It is understood that USB 3.0 and USB 2.0 are communication protocols. Therefore, when performing interface testing, if the test is performed through the host end (ie, the end connected to the reading device, such as the host), a common test interface 11 can be used.

[0047] In other examples, when performing interface testing, the connector type can be determined, and then the sample to be tested can be plugged into the test interface 11 of the corresponding connector type. For example, USB 3.0 is backward compatible with USB Type-C and USB Type-A, so the test interface 11 can still be the test interface 11 corresponding to USB Type-C and USB Type-A, that is, the third test interface 113 and the fourth test interface 114 can actually be the first test interface 111 or the second test interface 112.

[0048] As described above, in some examples, if the USB 3.0 and USB 2.0 tests are performed through a connector (ie, a non-host end), the third test interface 113 and the fourth test interface 114 may not be provided.

[0049] In summary, in the present application, the control unit 14 controls the conversion unit 13 to switch the connection between the test unit 12 and the test interface 11. Therefore, when testing multiple types of test samples, the test samples can be quickly connected to the test unit 12 through the test interface 11, thereby improving test efficiency. In addition, by controlling the conversion unit 13 with the control unit 14 to switch the connection between the test unit 12 and the test interface 11, the front and back sides of a single type of test sample can also be tested, reducing the steps of manually switching the connection back and forth, and further improving test efficiency.

[0050] Although the present application has been described in detail above with reference to the accompanying drawings and examples, it should be understood that the above description does not limit the present application in any form. Those skilled in the art may modify and alter the present application as needed without departing from the spirit and scope of the present application, and such modifications and alterations are intended to fall within the scope of the present application.

Claims

1. A testing device, characterized in that: include: A test interface, a test unit, a conversion unit and a control unit, wherein the multiple test interfaces are electrically connected to the conversion unit, the conversion unit is electrically connected to the multiple test units, the control unit is electrically connected to the conversion unit, the test interface is used to plug in the sample to be tested, the test unit is used to perform interface testing on the sample to be tested, and the control unit is used to control the conversion unit to switch the connection between the test unit and the test interface.

2. The testing device according to claim 1, wherein: When the sample to be tested is plugged into the test interface, the test interface generates a plug-in signal indicating that the test interface is plugged with the sample to be tested. The control unit obtains the plug-in signal and controls the conversion unit to switch the corresponding test unit based on the plug-in signal to allow the corresponding test unit to be connected to the test interface.

3. The testing device according to claim 1, wherein: The test interface includes a first test interface, the test unit includes a first test unit and a second test unit, and when the sample to be tested is of the first sample type, the control unit controls the conversion unit to connect the first test interface with the first test unit to allow the first test unit to perform an interface test on the front side of the sample to be tested; or The control unit controls the conversion unit to connect the first test interface with the second test unit, so as to allow the first test unit to perform an interface test on the reverse side of the sample to be tested.

4. The testing device according to claim 1, wherein: The test interface includes a second test interface, and the test unit includes a third test unit. When the sample to be tested is of the second sample type, the control unit controls the conversion unit to connect the second test interface with the third test unit to allow the third test unit to perform an interface test on the sample to be tested.

5. The testing device according to claim 1, wherein: The test interface includes a third test interface, and the test unit includes a fourth test unit. When the sample to be tested is of the third sample type, the control unit controls the conversion unit to connect the third test interface with the fourth test unit to allow the fourth test unit to perform an interface test on the sample to be tested.

6. The testing device according to claim 1, wherein: The test interface includes a fourth test interface, and the test unit includes a fifth test unit. When the sample to be tested is of the fourth sample type, the control unit controls the conversion unit to connect the fourth test interface with the fifth test unit to allow the fifth test unit to perform an interface test on the sample to be tested.

7. The testing device according to claim 1, characterized in that It also includes a main control unit electrically connected to the test unit. When the sample to be tested is plugged into the test interface and the sample to be tested is qualified, the test interface generates a connection signal. The test unit is used to obtain the connection signal and output a test signal indicating that the sample to be tested is qualified. The main control unit obtains the test signal and determines that the sample to be tested is qualified.

8. The testing device according to claim 1, wherein: The types of the samples to be tested include USB Type-C, USB Type-A, USB 3.0 and USB 2.0.

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