Chamfer ovality measuring device
By designing a chamfer ovality measuring device and using a center and a positioning sleeve in combination with a micrometer, the problems of low efficiency and low precision in chamfer ovality detection are solved, fast and accurate chamfer ovality measurement is achieved, and the processing quality of automobile half-axle sleeves is improved.
Patent Information
- Application Number
- CN202422982292.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-04
- Publication Date
- 2025-09-19
- Estimated Expiration
- 2034-12-04
AI Technical Summary
The existing technology has low efficiency and low precision in detecting chamfer ovality, and is unable to quickly identify chamfer ovality, which affects the processing accuracy and positioning reference of automobile axle sleeves.
A chamfer ovality measuring device was designed, which included a center and a positioning sleeve. The center was adapted to the chamfer of the inner hole of the half-shaft sleeve and was combined with a micrometer for fast and accurate measurement. The micrometer was fixed by a through hole and a locking screw to ensure measurement stability and accuracy.
It realizes the rapid and accurate identification of chamfer ovality, improves the detection efficiency and accuracy, is suitable for mass production, and ensures the processing quality of automobile half-axle sleeves.
Smart Images

Figure CN223361330U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of inspection tools, in particular to a chamfer ovality measuring device. Background Art
[0002] In the process of realizing the present invention, the inventors found that:
[0003] Nowadays, the outer diameter precision of automobile half-axle sleeves is very high, basically within 0.03mm, and all high-precision outer diameters require the left and right centers to be clamped and processed at one time to ensure their runout accuracy. Figure 1 The figure shows a schematic diagram of an automotive half-axle sleeve. To ensure external diameter accuracy and positioning error, two chamfers (60°±0.1° chamfers) are used at either end of the inner hole to position the outer diameter in a single clamping operation. Therefore, the positioning reference chamfers require high standards. If the chamfer ovality exceeds 0.03mm, the two jacks will tighten, and the center will press against the chamfer, causing deformation. The elliptical portion will be forced to become round, and the external diameter will also be deformed. After the external diameter is machined and formed, the center will relax, and the chamfer will return to its original elliptical shape, and the external diameter will also be deformed, becoming elliptical. Therefore, ensuring the chamfer ovality during the pre-processing of the chamfers on both sides is very important, and a tool that can quickly detect and identify chamfer ovality is needed.
[0004] Currently, chamfer ovality is usually determined by trial machining or three-coordinate detection. However, the trial run method cannot provide a specific ovality number. The three-coordinate detection method is slow, the number of points is limited, the recognition efficiency is low, and the error is large. Summary of the Invention
[0005] In order to solve the problems existing in the prior art, the utility model proposes a chamfer ovality measuring device, which can quickly identify and measure the chamfer ovality of an inner hole.
[0006] To this end, the technical solution of the utility model is a chamfer ovality measuring device, including a tip, characterized in that the tip includes a cone and a cylinder of an integrated structure, and the cone of the tip is adapted to the inner chamfers of the two ends of the half-shaft sleeve standard part.
[0007] It also includes a positioning sleeve, the inner diameter of which is larger than the inner diameter of the half-shaft sleeve and adapted to the outer diameter of the top column, and the top column and the positioning sleeve are seamlessly slidably matched;
[0008] A convex portion is provided on one side of the top end and extends in the opposite direction of the column body. A through hole is provided along the vertical direction of the cone surface on the same side and extends through the convex portion. A micrometer is installed in the through hole.
[0009] A further improvement to the above technical solution is that the through hole is a stepped hole, with the diameter of the hole on the side away from the cone larger than the diameter on the side closer to the cone, and a threaded hole radially connected to the stepped hole is provided on the side with the larger diameter, and a locking screw is provided in the threaded hole. This structure facilitates the installation and fixing of the dial indicator.
[0010] A further improvement to the above technical solution is that an elastic cover is provided on the side of the stepped hole with a larger diameter, and the cover has an opening, through which a locking screw secures the dial indicator. The cover with an opening is provided to ensure that the dial indicator is stably and firmly installed and does not move.
[0011] A further improvement to the above technical solution is that the top of the raised portion is parallel to the centerline of the through-hole, the side of the raised portion facing away from the tapered surface is parallel to the tapered surface, and its length is consistent with that of the dial indicator. The hardness of the tapered surface is controlled to be above HRC50. While ensuring functionality, the size and weight are minimized to facilitate use. A tapered surface hardness above HRC50 can extend service life.
[0012] A further improvement to the above technical solution is that the positioning sleeve is a convex-shaped structure with a through-hole in the middle, chamfered at both ends of the through-hole, and a printing area at the top of the convex shape. The chamfer facilitates the installation of the top, the convex shape facilitates alignment, and ensures that the positioning sleeve is perpendicular to the end face of the axle sleeve. The printing area is used to print the inspection fixture number.
[0013] Beneficial effect: Compared with the existing technology, the advantage of the present invention is that the present invention overcomes the defects of the existing technology, can quickly identify and inspect the ovality of chamfers, and has high inspection accuracy and efficiency, and is suitable for mass production. BRIEF DESCRIPTION OF THE DRAWINGS
[0014] Figure 1 It is a structural diagram of the half-axle sleeve described in the utility model.
[0015] Figure 2 This is a usage state diagram of the utility model.
[0016] Figure 3 It is the top structural diagram of the utility model.
[0017] Figure 4 It is a structural diagram of the positioning sleeve of the utility model.
[0018] Figure 5 1 is a structural diagram of a watch cover of the present invention, wherein: (a) is a front view; (b) is a top view.
[0019] Figure 6 It is a structural diagram of the locking screw of the utility model.
[0020] As shown in the figure: 1. Center; 2. Positioning sleeve; 3. Raised part; 4. Through hole; 5. Micrometer; 6. Locking screw; 7. Cover; 8. Printing area. DETAILED DESCRIPTION
[0021] The technical solution of the present invention will be clearly and completely described below in conjunction with the accompanying drawings, but this embodiment should not be understood as limiting the present invention.
[0022] The utility model Figures 2 to 6 As shown:
[0023] A chamfer ovality measuring device includes a tip 1, which includes a cone and a cylinder of an integrated structure. The cone of the tip is adapted to the inner chamfers of the two ends of the half-shaft sleeve A standard part.
[0024] It also includes a positioning sleeve 2, the inner diameter of the positioning sleeve is larger than the inner diameter of the half-shaft sleeve and is adapted to the outer diameter of the top column. The top column and the positioning sleeve are seamlessly slidably matched.
[0025] A protrusion 3 is provided on one side of the top end in the opposite direction of the column, and a through hole 4 is provided along the same side of the cone surface in a vertical direction and through the protrusion, in which a micrometer 5 is installed.
[0026] In this embodiment, the through hole 4 is a stepped hole, with the hole diameter on the side away from the cone being larger than the hole diameter on the side close to the cone. A threaded hole communicating with the stepped hole is radially provided on the side with the larger hole diameter, and a locking screw 6 is provided in the threaded hole. This structure facilitates the installation and fixing of the dial indicator.
[0027] In this embodiment, an elastic cover 7 is provided on the side of the stepped hole with a larger diameter. The cover has an opening, and a locking screw is passed through the cover to fix the dial indicator. The cover with an opening is provided to ensure that the dial indicator is installed stably and firmly without moving.
[0028] In this embodiment, the top of the raised portion is parallel to the centerline of the through-hole, the side of the raised portion away from the tapered surface is parallel to the tapered surface, and its length is consistent with the length of the dial indicator. The hardness of the tapered surface is controlled to be above HRC50. While ensuring functionality, the size and weight are minimized to ensure ease of use. A tapered surface hardness above HRC50 can extend service life.
[0029] In this embodiment, the positioning sleeve is a convex-shaped structure with a through hole in the middle and chamfered corners at both ends of the through hole. The top of the convex shape is provided with a printing area 8. The chamfer facilitates the installation of the top, and the convex shape facilitates straightening to ensure that the positioning sleeve is perpendicular to the end face of the axle sleeve. The printing area is used to print the inspection tool number.
[0030] The working principle of this utility model:
[0031] When in use, place the locating sleeve 2 on the upper end face of the workpiece chamfer to be measured, put in the top tip 1, make the locating sleeve stick to the end face of the half-shaft sleeve, and the top cone stick to the chamfer of the inner hole of the half-shaft sleeve to be measured. The micrometer 5 also presses against the chamfer of the inner hole of the half-shaft sleeve. Rotate the top tip, and the unevenness of the chamfered ellipse will be reflected in the rotation of the micrometer needle. The maximum and minimum values of the rotation of the micrometer needle are the ovality of the workpiece to be measured, so as to judge whether the inspected workpiece is qualified and whether it will flow into the next process of fine turning.
[0032] Parts not described in detail in this specification are well-known technologies in the art.
[0033] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.
Claims
1. A chamfer ovality measuring device, comprising a tip, characterized in that: The top consists of a cone and a cylinder of an integrated structure. The cone of the top is adapted to the inner chamfers of the two ends of the half-axle sleeve standard parts. It also includes a positioning sleeve, the inner diameter of which is larger than the inner diameter of the half-shaft sleeve and adapted to the outer diameter of the top column, and the top column and the positioning sleeve are seamlessly slidably matched; A protrusion is provided on one side of the top end in the opposite direction of the column, and a through hole is provided along the vertical direction of the cone surface on the same side and passes through the protrusion, and a micrometer is installed in the through hole.
2. The chamfer ellipticity measuring device according to claim 1, characterized in that: The through hole is a stepped hole, the aperture of the side away from the cone surface is larger than the side close to the cone surface, the side with the larger aperture is radially provided with a threaded hole communicating with the stepped hole, and a locking screw is provided in the threaded hole.
3. The chamfer ellipticity measuring device according to claim 2, characterized in that: An elastic cover is provided on the side of the step hole with a larger aperture, and an opening is provided on the cover. A locking screw fixes the dial indicator through the cover.
4. A chamfer ellipticity measuring device according to claim 1, 2 or 3, characterized in that: The top of the raised portion is parallel to the center line of the through hole, the side of the raised portion away from the conical surface is parallel to the conical surface, and the length of the raised portion is adapted to the length of the micrometer.
5. The chamfer ovality measuring device according to claim 4, characterized in that: The positioning sleeve is a convex-shaped structure with a through hole in the middle, chamfers at both ends of the through hole, and a printing area at the top of the convex shape.