Elastic sheet type probe for large current test

Abstract

The utility model discloses an elastic sheet type probe for heavy current testing, which is characterized by comprising a contact pin connected with an elastic sheet and a contact. The other end of the elastic sheet is also connected with a needle seat; the needle seat is used for being connected with equipment for testing; the pin seat is further provided with a contact seat, when the contact pin is in contact with and pressed against equipment to be tested, the elastic piece is extruded and deformed, and the contact is in contact with the contact seat. According to the technical scheme of the utility model, the over-current capability of the elastic sheet type probe for the heavy current test is effectively improved, the compression amount of the elastic sheet is reduced through the arrangement of the contact and the contact seat, the service life of the elastic sheet is prolonged, and the service life of the elastic sheet type probe for the heavy current test is further prolonged.

Description

Technical Field

[0001] The utility model relates to the technical field of signal testing, in particular to a shrapnel type probe for high current testing. Background Art

[0002] Connectors for many products are becoming increasingly smaller, and the number of contact points on these connectors is also decreasing, while overload current requirements are increasing. The current contact width of these connectors is typically 1.0-1.5mm, with overload current requirements of 8-15 amps, and future overload current requirements may exceed 30 amps. Signal contact widths are typically 0.1-0.15mm, and service life is required to exceed 100,000 cycles. Existing current test spring probes cannot simultaneously meet both overcurrent capability and service life. As overcurrent capability increases, service life decreases. Utility Model Content

[0003] The purpose of the utility model is to provide a shrapnel-type probe for high current testing, aiming to improve the overcurrent capability and service life of the product.

[0004] To achieve this purpose, the present invention adopts the following technical solutions:

[0005] A spring-type probe for high current testing includes a pin connected to a spring and a contact; the other end of the spring is further connected to a needle holder, which is used to connect to a test device;

[0006] The needle holder is further provided with a contact seat. When the insertion pin contacts and presses the device to be tested, the elastic sheet is squeezed and deformed, and the contact contacts the contact seat.

[0007] In one embodiment, the contact seat includes a first abutment member and a second abutment member respectively connected to the needle seat, and a gap is formed between the first abutment member and the second abutment member.

[0008] In one embodiment, a cross-sectional area of ​​an end portion of the contact close to the contact seat decreases in a direction approaching the contact seat.

[0009] In one embodiment, the spring piece is composed of at least two arc-shaped spring pieces bent back and forth, and the arc-shaped spring pieces are respectively connected between the insertion pin and the needle seat.

[0010] In one embodiment, a plurality of the arc-shaped spring pieces are arranged in parallel.

[0011] In one embodiment, the plurality of arc-shaped spring pieces are provided in multiple layers.

[0012] In one embodiment, the width of the arc-shaped spring piece is smaller than the thickness of the arc-shaped spring piece.

[0013] In one embodiment, the pin is further provided with an upper balance bar, and the pin is connected to one end of the spring through the upper balance bar.

[0014] In one embodiment, the needle seat is further provided with a lower balancing rod, and the lower balancing rod is connected to the other end of the elastic sheet.

[0015] In one embodiment, the end of the pin has two arc-shaped protrusion structures.

[0016] In one embodiment, the tail of the needle seat has a sawtooth structure.

[0017] Compared with the prior art, the present invention has the following beneficial effects:

[0018] Compared with the existing technical solutions, the technical solution of the present utility model only utilizes the elasticity of the shrapnel probe to test the product to be tested. The technical solution of the present utility model is to set a contact on the pin and a contact seat on the pin seat. When the pin contacts and presses the device to be tested, the shrapnel is squeezed and deformed, and the contact contacts the contact seat, so that the current of the test product is diverted. Part of the current passes through the shrapnel to the test device, and the other part of the current passes from the contact through the contact seat to the test device. Therefore, the technical solution of the present utility model effectively improves the overcurrent capacity of the shrapnel probe for high current testing, and the setting of the contact and the contact seat reduces the compression of the shrapnel, thereby increasing the service life of the shrapnel, and thus increasing the service life of the shrapnel probe for high current testing. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0020] The structures, proportions, sizes, etc. depicted in the drawings of this specification are only used to match the contents disclosed in this specification so as to facilitate understanding and reading by those familiar with this technology. They are not intended to limit the conditions under which the present invention can be implemented, and therefore have no substantive technical significance. Any structural modifications, changes in proportional relationships, or adjustments in size, without affecting the efficacy and objectives that can be achieved by the present invention, should still fall within the scope of the technical contents disclosed in the present invention.

[0021] Figure 1 This is a schematic structural diagram of an embodiment of the present utility model;

[0022] Figure 2This is a front view of an embodiment of the present invention;

[0023] Illustrations: 100, shrapnel-type probe for high-current testing; 110, pin; 120, shrapnel; 121, arc-shaped shrapnel; 130, contact; 131, arrow-shaped; 140, needle holder; 141, contact holder; 1412, first abutment; 1413, second abutment; 141a, gap; 142, lower balance bar; 150, upper balance bar; 160, arc-shaped protrusion structure; 170, serration structure. DETAILED DESCRIPTION

[0024] In order to make the technical objectives, features, and advantages of the present invention more obvious and easy to understand, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the embodiments described below are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of the present invention.

[0025] In the description of the present invention, it should be understood that the terms "upper," "lower," "top," "bottom," "inner," "outer," etc., indicating orientations or positional relationships, are based on the orientations or positional relationships shown in the accompanying drawings and are intended solely to facilitate the description of the present invention and simplify the description. They are not intended to indicate or imply that the devices or elements referred to must have a specific orientation, be constructed, or operate in a specific orientation. Therefore, they should not be construed as limitations on the present invention. It should be noted that when a component is considered to be "connected" to another component, it may be directly connected to the other component or there may be a centrally located component.

[0026] The technical solution of the present invention will be further described below with reference to the accompanying drawings and through specific implementation methods.

[0027] An embodiment of the present utility model provides a spring-type probe 100 for high current testing.

[0028] See also Figure 1 and Figure 2 In one embodiment of the present invention, a high current test spring-type probe 100 includes a pin 110, the pin 110 is connected to a spring 120 and a contact 130; the other end of the spring 120 is further connected to a needle holder 140, and the needle holder 140 is used to connect to the test equipment;

[0029] The needle holder 140 is further provided with a contact seat 141 . When the insertion pin 110 contacts and presses the device to be tested, the elastic piece 120 is squeezed and deformed, and the contact 130 contacts the contact seat 141 .

[0030] It is understandable that the technical solution of the present invention is different from the prior art solution, which merely utilizes the elasticity of the spring-type probe 120 to test the product to be tested. The technical solution of the present invention provides a contact 130 on the pin 110 and a contact holder 141 on the pin holder 140. When the pin 110 contacts and presses the device to be tested, the spring 120 is squeezed and deformed, and the contact 130 contacts the contact holder 141, thereby diverting the current of the test product. Part of the current passes through the spring 120 to the test device, while the other part of the current passes from the contact 130 through the contact holder 141 to the test device. Therefore, the technical solution of the present invention effectively improves the overcurrent capability of the spring-type probe 100 for high-current testing. The provision of the contact 130 and the contact holder 141 reduces the compression of the spring 120, thereby increasing the service life of the spring 120 and, in turn, the service life of the spring-type probe 100 for high-current testing.

[0031] It should also be noted that the high-current testing shrapnel probe 100 is typically constructed from a highly conductive and thermally conductive copper alloy, using a surface plating process with varying ratios to balance surface hardness and current handling capacity. The highly conductive copper alloy has low internal resistance and is resistant to deformation. Processing methods for the high-current testing shrapnel probe 100 include stamping and laser cutting.

[0032] Optionally, the thickness of the spring-type probe 100 for high current testing is between 0.1 and 0.15 mm.

[0033] Optionally, a partial width of the pin 110 is 0.5 mm.

[0034] See also Figure 1 In a specific embodiment, the contact seat 141 includes a first abutment member 1412 and a second abutment member 1413 respectively connected to the needle seat 140 , and a gap 141 a is defined between the first abutment member 1412 and the second abutment member 1413 .

[0035] It can be understood that when the contact 130 contacts the first abutment 1412 and the second abutment 1413 at the same time, the configuration of the gap 141a can cause the first abutment 1412 and the second abutment 1413 to undergo elastic deformation, thereby ensuring the reliability of the electrical connection between the contact 130 and the first abutment 1412 and the second abutment 1413.

[0036] See also Figure 1 In a specific embodiment, along the direction approaching the contact seat 141 , the cross-sectional area of ​​one end portion of the contact 130 close to the contact seat 141 decreases.

[0037] Optionally, one end of the contact 130 near the contact seat 141 is in an arrow shape 131. It is understood that the contact 130 in the arrow shape 131 can more conveniently fit into the gap 141a formed between the first abutting member 1412 and the second abutting member 1413, further improving the reliability of the electrical connection between the contact 130 and the first abutting member 1412 and the second abutting member 1413.

[0038] See also Figure 2 The spring piece 120 is composed of at least two arc-shaped spring pieces 121 that are bent back and forth, and the arc-shaped spring pieces 121 are respectively connected between the pin 110 and the needle seat 140;

[0039] The plurality of arc-shaped spring pieces 121 are arranged in parallel; and / or,

[0040] The plurality of arc-shaped spring pieces 121 are provided in multiple layers.

[0041] It is understandable that the greater the number of the arc-shaped spring pieces 121 , the stronger the over-current capability of the spring-type probe 100 for high-current testing.

[0042] Specifically, the number of the arc-shaped spring pieces 121 arranged in parallel and the number of layers of the arc-shaped spring pieces 121 can be adaptively adjusted according to the elastic force, the elastic compression amount to be designed, and the overcurrent requirement.

[0043] It can also be understood that, the greater the number of the arc-shaped spring pieces 121 , the smaller the signal frequency attenuation of the spring-type probe 100 for high-current testing will be, and thus the better the signal frequency response capability will be.

[0044] Optionally, at least two of the arc-shaped spring pieces 121 are arranged in parallel.

[0045] Optionally, at least two of the arc-shaped spring pieces 121 are stacked.

[0046] Optionally, the width of the arc-shaped spring piece 121 is 0.1 mm.

[0047] Optionally, two arc-shaped spring pieces 121 are arranged in parallel, and the two arc-shaped spring pieces 121 are respectively provided with 8 layers.

[0048] In a specific embodiment, the width of the arc-shaped elastic piece 121 is smaller than the thickness of the arc-shaped elastic piece 121. It is understandable that such a design can ensure the flexibility of the arc-shaped elastic piece 121.

[0049] See also Figure 2In another specific embodiment of the present invention, the pin 110 is further provided with an upper balance bar 150 , and the pin 110 is connected to one end of the spring 120 through the upper balance bar 150 .

[0050] It is understandable that the provision of the upper balancing rod 150 can control the force direction of the elastic sheet 120 , thereby making the contraction of the elastic sheet 120 more stable and reliable.

[0051] Please continue reading Figure 2 In a specific embodiment, the needle seat 140 is further provided with a lower balance rod 142 , and the lower balance rod 142 is connected to the other end of the spring 120 .

[0052] It is understood that the lower balance bar 142 cooperates with the upper balance bar 150 to connect the spring piece 120 integrally, thereby ensuring the stability of the elastic deformation of the spring piece 120. Specifically, it ensures that the pin 110 of the spring-type probe 100 for high current testing does not deflect when it is compressed or restored.

[0053] See also Figure 2 The end of the pin 110 has two arc-shaped protrusions 160. It will be understood that these arc-shaped protrusions 160 are used to contact the connector of the product under test. Optionally, the contact width of the two arc-shaped protrusions 160 is between 1.0-1.5mm. When used as signal test contacts, the contact width of the two arc-shaped protrusions 160 is between 0.1-0.15mm.

[0054] Optionally, the end of the pin 110 may also be a flat-head structure, a U-shaped structure, or a zigzag structure.

[0055] In a specific embodiment, the tail of the needle holder 140 has a sawtooth structure 170. The sawtooth structure 170 is used to electrically connect to a test device, specifically, to a gold finger of a transfer signal board.

[0056] As described above, the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the above embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the above embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A shrapnel probe for high current testing, characterized in that: It includes a pin, the pin is connected to a spring and a contact; the other end of the spring is also connected to a needle seat, and the needle seat is used to connect to the test equipment; The needle holder is further provided with a contact seat. When the insertion pin contacts and presses the device to be tested, the elastic sheet is squeezed and deformed, and the contact contacts the contact seat.

2. The shrapnel probe for high current testing according to claim 1, characterized in that: The contact seat includes a first abutting piece and a second abutting piece respectively connected to the needle seat, and a gap is formed between the first abutting piece and the second abutting piece.

3. The shrapnel probe for high current testing according to claim 2, characterized in that: Along the direction approaching the contact seat, the cross-sectional area of ​​one end portion of the contact close to the contact seat decreases.

4. The shrapnel probe for high current testing according to claim 1, characterized in that: The spring piece is composed of at least two arc-shaped spring pieces that bend back and forth, and the arc-shaped spring pieces are respectively connected between the pin and the needle seat; A plurality of said arc-shaped spring pieces are arranged in parallel; and / or, The plurality of arc-shaped spring pieces are provided in multiple layers.

5. The shrapnel probe for high current testing according to claim 4, characterized in that: The width of the arc-shaped spring piece is smaller than the thickness of the arc-shaped spring piece.

6. The shrapnel probe for high current testing according to any one of claims 1 to 5, characterized in that: The pin is further provided with an upper balance bar, and the pin is connected to one end of the spring through the upper balance bar.

7. The shrapnel probe for high current testing according to claim 6, characterized in that: The needle seat is further provided with a lower balancing rod, and the lower balancing rod is connected to the other end of the elastic sheet.

8. The shrapnel probe for high current testing according to claim 1, characterized in that: The end of the pin has two arc-shaped protrusion structures.

9. The shrapnel probe for high current testing according to claim 1, characterized in that: The tail of the needle seat has a sawtooth structure.

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