Aging test fixture

Abstract

The utility model discloses an aging test fixture, which comprises a carrier and a cover body arranged above the carrier and matched with the carrier, the carrier comprises an anti-static glass fiber probe plate; the insulating peek plate is arranged on the anti-static glass fiber probe plate, and a plurality of high-temperature-resistant probes are embedded in the insulating peek plate; the supporting pieces are pre-buried in the anti-static glass fiber probe plate, and each supporting piece comprises a supporting block arranged in the anti-static glass fiber probe plate and a high-temperature-resistant spring arranged on the supporting block in a sleeving mode and used for connecting the supporting block and the anti-static glass fiber probe plate. According to the utility model, the traditional carrier plate and the probe plate are integrated to form the anti-static glass fiber probe plate, and the insulating peek plate is designed on the anti-static glass fiber probe plate to pre-embed the high-temperature-resistant probes, so that the high-temperature-resistant probes are protected, and the probes are prevented from being completely exposed in a test environment; and meanwhile, the high-temperature-resistant spring of the supporting block is designed in the anti-static glass fiber probe plate, so that the high-temperature-resistant spring is prevented from being exposed in a test environment, and the risk of aging of the high-temperature-resistant spring is increased.

Description

Technical Field

[0001] The utility model relates to the field of testing, in particular to an aging test fixture. Background Art

[0002] Currently, most types of PCBA aging test fixtures are basically three-layer structures, namely the cover plate, carrier plate and probe plate. In this way, the carrier plate and probe plate are separated, which is not convenient for installation.

[0003] At the same time, the probes are directly installed on the probe board without any isolation protection and are exposed to the test environment. As a result, after the probes are aged at high temperatures for a long time, the anti-static efficiency of the probe board is reduced, and there may be risks to the wires.

[0004] Furthermore, the spring used to reset the support block is completely exposed to the test environment, which increases the risk of aging, thereby increasing the likelihood of poor contact and affecting test efficiency. Utility Model Content

[0005] The purpose of the utility model is to provide an aging test fixture to solve the above problems existing in the prior art.

[0006] Technical solution: A burn-in test fixture, including:

[0007] A carrier, and a cover disposed above the carrier and adapted to the carrier;

[0008] The carrier is used to place the PCBA product board. Through the adaptation of the cover and the carrier, positioning and aging test of the PCBA product board are completed. During the test, the test fixture needs to be placed in a predetermined test environment;

[0009] The carrier includes:

[0010] Anti-static glass fiber probe plate;

[0011] An insulating peek board is arranged on the anti-static glass fiber probe board, wherein a plurality of high-temperature resistant probes are embedded in the insulating peek board, and the high-temperature resistant probes include a high-temperature resistant test probe and a high-temperature resistant grounding probe;

[0012] The high temperature resistant grounding probe is higher than the high temperature resistant test probe;

[0013] The brackets are designed in multiple groups and are pre-buried in the anti-static glass fiber probe plate. Each group includes a bracket block arranged in the anti-static glass fiber probe plate and a high-temperature resistant spring sleeved on the bracket block for connecting the bracket block and the anti-static glass fiber probe plate.

[0014] The utility model combines the traditional carrier board and probe board into one to form an anti-static glass fiber probe board, and designs an insulating peek board on the anti-static glass fiber probe board to pre-embed the high-temperature resistant probe to complete the protection of the high-temperature resistant probe and avoid the probe being completely exposed to the test environment. At the same time, the high-temperature resistant spring of the support block is designed in the anti-static glass fiber probe board to prevent the high-temperature resistant spring from being exposed to the test environment, increasing the risk of aging itself, thereby increasing the poor contact situation and affecting the test efficiency.

[0015] At the same time, the guide sleeve of traditional test fixtures is made of plastic, which is prone to deformation after long-term high-temperature aging, resulting in inaccurate positioning and installation jams.

[0016] The support block is higher than the anti-static glass fiber probe plate;

[0017] The utility model avoids the occurrence of this problem by designing a graphite copper guide sleeve.

[0018] In a further embodiment, the anti-static glass fiber probe board is further provided with a plurality of coarse positioning blocks, stainless steel guide pillars, and stainless steel positioning pins.

[0019] In a further embodiment, the cover comprises:

[0020] An alumina cover plate, wherein a plurality of graphite copper guide sleeve holes are formed on the alumina cover plate, and graphite copper guide sleeves are provided in the graphite copper guide sleeve holes;

[0021] A plurality of pressure rods are designed and installed at the bottom of the alumina cover plate;

[0022] Spring clips are designed in multiple groups and installed on both sides of the alumina cover plate;

[0023] A stainless steel connecting rod handle is connected to the spring buckle.

[0024] In a further embodiment, the graphite copper guide sleeve is adapted to fit the stainless steel guide post.

[0025] In a further embodiment, a side portion of the anti-static glass fiber probe card is provided with a snap-in socket adapted to fit the spring buckle.

[0026] Beneficial effect: The utility model discloses an aging test fixture, which combines the traditional carrier board and the probe board into an anti-static glass fiber probe board, and designs an insulating peek board on the anti-static glass fiber probe board to pre-embed the high-temperature resistant probe to complete the protection of the high-temperature resistant probe and avoid the probe being completely exposed to the test environment. At the same time, the high-temperature resistant spring of the support block is designed in the anti-static glass fiber probe board to prevent the high-temperature resistant spring from being exposed to the test environment, increasing the risk of aging itself, thereby increasing the poor contact situation and affecting the test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] Figure 1 It is a structural diagram of the present utility model.

[0028] Figure 2 This is a structural schematic diagram of the PCBA product board of the present invention placed on a carrier.

[0029] Figure 3 It is a schematic diagram of the explosion structure of the utility model.

[0030] Figure 4 It is a schematic diagram of the support structure of the utility model.

[0031] The accompanying drawings are:

[0032] 1. Cover; 11. Alumina upper cover; 12. Graphite copper guide sleeve hole; 13. Press rod; 14. Spring buckle; 15. Stainless steel connecting rod handle;

[0033] 2. Carrier; 21. Anti-static glass fiber probe plate; 22. Stainless steel guide pillar; 23. Coarse positioning block; 24. Stainless steel positioning pin; 25. Support; 251. Support block; 252. High temperature resistant spring;

[0034] 26. High temperature resistant probe;

[0035] 3. PCBA product board. DETAILED DESCRIPTION

[0036] The present application relates to an aging test fixture, which is explained in detail below through specific implementation methods.

[0037] An aging test fixture, comprising:

[0038] A carrier 2, and a cover 1 disposed above the carrier 2 and adapted to the carrier 2;

[0039] The carrier 2 is used to place the PCBA product board 3. Through the adaptation of the cover 1 and the carrier 2, positioning and aging test of the PCBA product board 3 are completed. During the test, the test fixture needs to be placed in a predetermined test environment;

[0040] The carrier 2 includes:

[0041] Anti-static glass fiber probe plate 21;

[0042] An insulating peek board is provided on the anti-static glass fiber probe board 21, wherein a plurality of high temperature resistant probes 26 are embedded in the insulating peek board, and the plurality of high temperature resistant probes 26 have different heights;

[0043] The supports 25 are designed in multiple groups and are pre-buried in the anti-static glass fiber probe plate 21. Each group includes a support block 251 arranged in the anti-static glass fiber probe plate 21, and a high-temperature resistant spring 252 mounted on the support block 251 for connecting the support block 251 and the anti-static glass fiber probe plate 21.

[0044] The utility model combines the traditional carrier board and probe board into one to form an anti-static glass fiber probe board 21, and designs an insulating peek board on the anti-static glass fiber probe board 21 to pre-embed the high-temperature resistant probe 26 to complete the protection of the high-temperature resistant probe 26 and prevent the probe from being completely exposed to the test environment. At the same time, the high-temperature resistant spring 252 of the support block 251 is designed in the anti-static glass fiber probe board 21 to prevent the high-temperature resistant spring 252 from being exposed to the test environment, increasing the risk of aging itself, thereby increasing the poor contact situation and affecting the test efficiency.

[0045] At the same time, the guide sleeve of traditional test fixtures is made of plastic, which is prone to deformation after long-term high-temperature aging, resulting in inaccurate positioning and installation jams.

[0046] The utility model avoids the occurrence of this problem by designing a graphite copper guide sleeve.

[0047] The anti-static glass fiber probe plate 21 is further provided with a plurality of coarse positioning blocks 23 , stainless steel guide pillars 22 , and stainless steel positioning pins 24 .

[0048] The cover body 1 includes:

[0049] An alumina cover plate, wherein a plurality of graphite copper guide sleeve holes 12 are formed on the alumina cover plate, and graphite copper guide sleeves are provided in the graphite copper guide sleeve holes 12;

[0050] A plurality of pressure rods 13 are provided and installed at the bottom of the alumina cover plate;

[0051] Spring buckles 14 are designed in multiple groups and installed on both sides of the alumina cover plate;

[0052] The stainless steel connecting rod handle 15 is connected to the spring buckle 14 .

[0053] The graphite copper guide sleeve is adapted to the stainless steel guide column 22 .

[0054] The side of the anti-static glass fiber probe plate 21 is provided with a snap-in socket adapted to the spring buckle 14 .

[0055] Working principle description:

[0056] The PCBA product board 3 is placed on the anti-static glass fiber probe board 21 through the guidance of the coarse positioning block 23 and the stainless steel positioning pin 24. At this time, the high-temperature resistant spring 252 and the support block 251 are in the initial lifting state, and the high-temperature resistant probe 26 first contacts the PCBA board to release the residual electricity.

[0057] The alumina upper cover plate 11 equipped with the pressing rod 13 is pressed down and fastened by the precise positioning of the graphite copper guide sleeve and the stainless steel guide column 22 .

[0058] At the same time, the high temperature resistant spring 252 and the support block 251 are compressed, and the PCBA product board 3 is in full contact with the remaining high temperature resistant test probes, achieving better test results, improving the efficiency of probe contact, and ensuring that the entire test operation is safe and reliable.

[0059] The preferred embodiments of the present invention are described in detail above in conjunction with the accompanying drawings. However, the present invention is not limited to the specific details in the above embodiments. Within the technical concept of the present invention, various equivalent transformations can be made to the technical solutions of the present invention, and these equivalent transformations all fall within the scope of protection of the present invention.

Claims

1. A burn-in test fixture, comprising: A carrier (2), and a cover (1) disposed above the carrier (2) and adapted to the carrier (2); Characterized in that the carrier (2) comprises: Antistatic glass fiber probe plate (21); An insulating peek board, arranged on the antistatic glass fiber probe board (21), wherein a plurality of high-temperature resistant probes (26) are pre-embedded in the insulating peek board; The supporting parts (25) are designed in multiple groups and are pre-buried in the anti-static glass fiber probe plate (21), each group including a supporting block (251) arranged in the anti-static glass fiber probe plate (21), and a high-temperature resistant spring (252) sleeved on the supporting block (251) for connecting the supporting block (251) and the anti-static glass fiber probe plate (21).

2. The aging test fixture according to claim 1, characterized in that: The antistatic glass fiber probe plate (21) is further provided with a plurality of coarse positioning blocks (23), stainless steel guide pillars (22), and stainless steel positioning pins (24).

3. The aging test fixture according to claim 2, characterized in that: The cover (1) comprises: An alumina cover plate, wherein a plurality of graphite copper guide sleeve holes (12) are formed on the alumina cover plate, and graphite copper guide sleeves are provided in the graphite copper guide sleeve holes (12); A plurality of pressure rods (13) are provided and installed at the bottom of the alumina cover plate; Spring clips (14), designed in multiple groups, are installed on both sides of the alumina cover plate; A stainless steel connecting rod handle (15) is connected to the spring buckle (14).

4. The aging test fixture according to claim 3, characterized in that: The graphite copper guide sleeve is adapted to the stainless steel guide column (22).

5. The aging test fixture according to claim 3, characterized in that: The side of the antistatic glass fiber probe plate (21) is provided with a snap-in port adapted to the spring snap (14).

Images