Air cooling device convenient to disassemble and assemble and used for probe test bench

By designing an air-cooling device that is easy to disassemble and assemble on the probe test bench, rapid heat dissipation is achieved by using air-cooling components and height adjustment components, solving the problem of slow heat dissipation of the probe test bench and improving production efficiency.

CN223413354UActive Publication Date: 2025-10-03昆山日月同芯半导体有限公司
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Patent Information

Application Number
CN202422637868.4
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-10-30
Publication Date
2025-10-03
Estimated Expiration
2034-10-30

AI Technical Summary

Technical Problem

The slow heat dissipation of the probe test bench affects production efficiency, and existing technology makes it difficult to cool it down quickly.

Method used

An air-cooling device that is easy to disassemble and assemble is designed, which includes an air-cooling component, a support component and a height adjustment component. The air-cooling component is stably supported by the support component, and the heat dissipation range is adjusted by the height adjustment component. The fan component provides rapid cooling.

Benefits of technology

The rapid cooling of the probe test bench is achieved, the installation and disassembly process is simplified, and the production efficiency is improved.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model relates to the technical field of probe testboards, and discloses a probe testboard air cooling device convenient to disassemble and assemble, comprising a testboard, one side of the testboard is provided with an air cooling assembly used for carrying out air cooling on the testboard, the air cooling assembly is provided with a support assembly capable of stably supporting the air cooling assembly, and the support assembly is provided with an air inlet and an air outlet. The supporting assembly is provided with a height adjusting assembly capable of freely adjusting the height of the air cooling assembly. By arranging the air cooling assembly, the supporting assembly and the height adjusting assembly, when the testboard needs to be cooled, the air cooling assembly and the supporting assembly are directly placed at the position, needing to be cooled, of the testboard, the supporting assembly can stably support the air cooling assembly, extra placing operation is not needed, and the cooling efficiency of the testboard is improved. And the height of the air cooling assembly can be changed by using the height adjusting assembly according to the height required by the air cooling assembly, so that the heat dissipation range can be conveniently adjusted, and the test bench can be rapidly cooled.
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Description

Technical Field

[0001] The utility model relates to the technical field of probe test benches, in particular to an air cooling device for a probe test bench which is easy to assemble and disassemble. Background Art

[0002] Currently, a probe test bench is a device used to perform electrical performance tests on electronic components such as semiconductor chips and integrated circuits.

[0003] A semiconductor probe test bench is disclosed in the Chinese utility model patent with the announcement number CN215812867U. Although the above-mentioned prior art solves the problems of the current probe bench being inconvenient to rotate and difficult to adjust in height, the temperature of the probe test bench will increase after use. Normal heat dissipation and cooling will be very slow without external force intervention. It takes about 2.5 hours to drop from 85° to 30°. Too long a cooling time will affect a large amount of production operation time, resulting in low production efficiency. Therefore, it is necessary to design an air-cooled cooling device that is very convenient to install and disassemble and can dissipate heat for the probe test bench. Utility Model Content

[0004] In order to solve the technical problem that the slow heat dissipation of a probe test bench affects the production efficiency, the utility model provides an air-cooling temperature reduction device for a probe test bench which is easy to disassemble and assemble.

[0005] The utility model is implemented by the following technical solutions: an air-cooling and cooling device for a probe test bench that is easy to disassemble and assemble, comprising a test bench, wherein one side of the test bench is provided with an air-cooling component for air-cooling the test bench, the air-cooling component is provided with a support component that can stably support the air-cooling component, the support component is provided with a height adjustment component that can arbitrarily adjust the height of the air-cooling component, the air-cooling component comprises a control box arranged on the test bench and a fan component arranged inside the control box for blowing air, the support component comprises a first support ring arranged on one side of the test bench, a plurality of support plates fixedly mounted on one side of the first support ring and having sliding grooves, a second support ring fixedly mounted on the same side of the plurality of support plates, connecting plates are fixedly mounted on four sides of the control box, and one end of each of the connecting plates passes through adjacent sliding grooves.

[0006] Through the above technical solution, when the test bench needs to dissipate heat, the air-cooling component and the support component are directly placed at the position where the test bench needs to be cooled. The support component will provide stable support for the air-cooling component, and the height adjustment component can be used to change the height of the air-cooling component according to the required height of the air-cooling component, which is convenient for adjusting the heat dissipation range. This setting allows the air-cooling component to be placed on the test bench very conveniently without the need for additional placement and fixing operations.

[0007] As a further improvement of the above solution, limit plates are fixedly installed on both sides of each connecting plate, and each limit plate is slidably mounted on the adjacent support plate.

[0008] Through the above technical solution, the limiting plate can prevent the connecting plate from tilting inside the sliding groove, thereby preventing the air-cooling component from tilting.

[0009] As a further improvement of the above-mentioned scheme, the height adjustment assembly includes a positioning ring mounted on the outside of multiple support plates and a threaded column arranged on one side of the positioning ring. A limiting plate is fixedly installed between the first support ring and the second support ring. One end of the threaded column is threaded through the positioning ring and abuts against the limiting plate.

[0010] With the above technical solution, the rotation of the threaded column will squeeze the limiting plate, so that the position of the positioning ring will be fixed.

[0011] As a further improvement of the above solution, a tightening block is fixedly installed on the other end of the threaded column to facilitate the rotation of the threaded column.

[0012] Through the above technical solution, the tightening block can facilitate the rotation of the threaded column, avoiding the need to use tools to rotate the threaded column.

[0013] As a further improvement of the above solution, each of the connecting plates is located directly above the positioning ring, and the bottom of each of the limiting plates is in contact with the top of the positioning ring.

[0014] Through the above technical solution, after the position of the positioning ring is fixed, the positions of the connecting plate and the limiting plate will also be restricted and cannot be lowered, thereby fixing the height.

[0015] As a further improvement of the above solution, a lifting plate is fixedly installed on the top of the second support ring, and the lifting plate is arranged in a concave shape.

[0016] Through the above technical solution, the lifting plate makes it easy to move the air-cooling component and the support component, and workers can directly lift, carry and move them by hand.

[0017] Compared with the prior art, the beneficial effects of the present invention are:

[0018] The utility model provides an air-cooling component, a supporting component and a height-adjusting component. When the test bench needs to dissipate heat, the air-cooling component and the supporting component are directly placed at the position where the test bench needs to be cooled. The supporting component will provide a stable supporting effect for the air-cooling component without the need for additional placement operations. In addition, the height-adjusting component can be used to change the height of the air-cooling component according to the required height of the air-cooling component, which facilitates the adjustment of the heat dissipation range. This arrangement can quickly cool down the test bench. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 This is a schematic diagram of the three-dimensional structure of the utility model;

[0020] Figure 2 This is a schematic diagram of the structure of the utility model with an air-cooling component;

[0021] Figure 3 This is a structural diagram of the utility model with a limiting plate.

[0022] Description of main symbols:

[0023] 1. Test bench; 201. Control box; 202. Fan assembly; 301. First support ring; 302. Support plate; 303. Second support ring; 304. Connecting plate; 401. Positioning ring; 402. Threaded column; 5. Limit plate; 6. Limit plate; 7. Tightening block; 8. Lifting plate. DETAILED DESCRIPTION

[0024] Below, the present invention is further described in conjunction with the accompanying drawings and specific implementation methods. It should be noted that, under the premise of no conflict, the various embodiments or technical features described below can be arbitrarily combined to form new embodiments.

[0025] Please combine Figure 1-Figure 3 , an air-cooling and temperature-reducing device for a probe test bench that is easy to assemble and disassemble of the present embodiment includes a test bench 1, a side of the test bench 1 is provided with an air-cooling assembly for air-cooling and cooling the test bench 1, the air-cooling assembly is provided with a supporting assembly that can stably support the air-cooling assembly, and the supporting assembly is provided with a height adjustment assembly that can arbitrarily adjust the height of the air-cooling assembly. When the test bench 1 needs to dissipate heat, the air-cooling assembly and the supporting assembly are directly placed at the position where the test bench 1 needs to be cooled, the supporting assembly will have a stable supporting effect on the air-cooling assembly, and the height adjustment assembly can be used to change the height of the air-cooling assembly according to the required height of the air-cooling assembly, so as to facilitate the adjustment of the heat dissipation range;

[0026] Combine Figure 1 and Figure 2 The air cooling component includes a control box 201 provided on the test bench 1 and a fan component 202 provided inside the control box 201 for blowing air. The air blown by the fan component 202 will cool the test bench 1;

[0027] Combine Figure 1-Figure 3The support assembly includes a first support ring 301 arranged on one side of the test bench 1, multiple support plates 302 fixedly installed on one side of the first support ring 301 and provided with sliding grooves, and a second support ring 303 fixedly installed on the same side of the multiple support plates 302. Connecting plates 304 are fixedly installed on the four sides of the control box 201, and one end of each connecting plate 304 passes through the adjacent sliding grooves. Limiting plates 5 are fixedly installed on both sides of each connecting plate 304, and each limiting plate 5 is slidably mounted on the adjacent support plate 302. The support assembly will support the air-cooling assembly, allowing the air-cooling to be placed directly on the test bench 1 for cooling without the need for additional placement operations.

[0028] Combine Figure 1 and Figure 2 The height adjustment assembly includes a positioning ring 401 sleeved on the outside of multiple support plates 302 and a threaded column 402 arranged on one side of the positioning ring 401. A limiting plate 6 is fixedly installed between the first support ring 301 and the second support ring 303. One end of the threaded column 402 is threadedly penetrates the positioning ring 401 and abuts against the limiting plate 6. The other end of the threaded column 402 is fixedly installed with a tightening block 7 that facilitates the rotation of the threaded column 402. Each connecting plate 304 is located directly above the positioning ring 401, and the bottom of each limiting plate 5 is in contact with the top of the positioning ring 401. When the threaded column 402 rotates, it will squeeze the limiting plate 6, so that the position of the positioning ring 401 will be fixed. After the position of the positioning ring 401 is fixed, the positions of the connecting plate 304 and the limiting plate 5 will also be restricted and cannot be lowered, thereby fixing the height;

[0029] Combine Figure 1 A lifting plate 8 is fixedly installed on the top of the second support ring 303. The lifting plate 8 is set in a concave shape. The lifting plate 8 makes it easy to move the air-cooling component and the support component, and the staff can directly lift, carry and move them by hand.

[0030] The working principle of the air-cooling device for a probe test bench that is easy to assemble and disassemble in the embodiment of the present application is as follows: when the test bench 1 needs to be cooled, the staff member holds the lifting plate 8 and places the first support ring 301 at the position where cooling is required, so that the control box 201 and the fan assembly 202 are facing the position where cooling is required;

[0031] Then, tighten the tightening block 7 to loosen the threaded column 402, and then slide the positioning ring 401 up and down. By sliding the positioning ring 401, the height of the control box 201 can be moved up and down, thereby changing the range of the wind. The closer the distance, the smaller the range of the wind and the stronger the force.

[0032] After the height is determined, the threaded column 402 can be tightened to open the control box 201 and allow the fan assembly 202 to rotate for heat dissipation;

[0033] After the heat dissipation is completed, the staff only needs to lift the lifting plate 8 by hand to lift up the entire support assembly and the air-cooling assembly. This setting will make the installation and disassembly of the air-cooling assembly the fastest, and there is no need to use additional parts and structures for fixing, and it can be placed directly.

[0034] The above-mentioned embodiments are only preferred embodiments of the present invention and cannot be used to limit the scope of protection of the present invention. Any non-substantial changes and replacements made by technicians in this field on the basis of the present invention fall within the scope of protection required by the present invention.

Claims

1. An air-cooling device for a probe test bench that is easy to disassemble and assemble, comprising a test bench (1), characterized in that: A cooling assembly for cooling the test bench (1) is provided on one side of the test bench (1); a support assembly capable of stably supporting the cooling assembly is provided on the cooling assembly; a height adjustment assembly capable of arbitrarily adjusting the height of the cooling assembly is provided on the support assembly; the cooling assembly comprises a control box (201) provided on the test bench (1) and a fan assembly (202) provided inside the control box (201) for blowing air; the support assembly comprises a first support ring (301) provided on one side of the test bench (1); a plurality of support plates (302) fixedly mounted on one side of the first support ring (301) and having sliding grooves; a second support ring (303) fixedly mounted on the same side of the plurality of support plates (302); connecting plates (304) are fixedly mounted on four sides of the control box (201); one end of each connecting plate (304) passes through an adjacent sliding groove.

2. The air-cooling device for a probe test bench that is easy to disassemble and assemble according to claim 1, characterized in that: Limiting plates (5) are fixedly mounted on both sides of each connecting plate (304), and each limiting plate (5) is slidably sleeved with an adjacent supporting plate (302).

3. The air-cooling device for a probe test bench that is easy to disassemble and assemble according to claim 2, characterized in that: The height adjustment assembly comprises a positioning ring (401) sleeved on the outside of a plurality of support plates (302) and a threaded column (402) arranged on one side of the positioning ring (401); a limiting plate (6) is fixedly installed between the first support ring (301) and the second support ring (303); one end of the threaded column (402) is threadedly passed through the positioning ring (401) and abuts against the limiting plate (6).

4. The air-cooling device for a probe test bench that is easy to disassemble and assemble according to claim 3, characterized in that: The other end of the threaded column (402) is fixedly mounted with a tightening block (7) for facilitating the rotation of the threaded column (402).

5. The air-cooling device for a probe test bench that is easy to disassemble and assemble as claimed in claim 3, characterized in that: Each of the connecting plates (304) is located directly above the positioning ring (401), and the bottom of each of the limiting plates (5) is in contact with the top of the positioning ring (401).

6. The air-cooling device for a probe test bench that is easy to disassemble and assemble according to claim 1, characterized in that: A lifting plate (8) is fixedly mounted on the top of the second support ring (303), and the lifting plate (8) is arranged in a concave shape.

Citation Information

Patent Citations

  • Semiconductor probe test bench

    CN215812867U