Automatic rotation test seat probe and test seat

Abstract

The utility model discloses an automatic rotation test seat probe and a test seat, the probe comprises a movable piece, a fixed piece and an elastic piece, a switching cavity in the movable piece is provided with a first connecting hole, a plurality of first inclined walls and a plurality of second inclined walls, a contact part of the fixed piece is provided with a second connecting hole, a plurality of first slopes and a plurality of second slopes, and the elastic piece is provided with a plurality of second inclined walls. The connecting part of the fixed part penetrates out of the connecting channel of the movable part and is fixedly connected with the test seat, the elastic parts in the switching cavity extend into the first connecting hole and the second connecting hole respectively, and the elastic parts can be compressed and stretched along with contact and separation of the chip and the needle tip. The joint of two adjacent first slopes and the second inclined wall are respectively abutted against the joint of the first inclined wall and the joint of two adjacent second slopes so as to enable the movable member to rotate, the automatic rotation of the probe can be realized, the severe abrasion of the single-side probe tip of the probe can be avoided, the abrasion of each probe branch head of the probe is more uniform, and the service life of the probe is prolonged. And the test service life of the probe is effectively prolonged.

Description

Technical Field

[0001] The utility model relates to the technical field of a test seat probe, in particular to an automatic rotating test seat probe and a test seat. Background Art

[0002] Currently, there are two types of test socket probes commonly used in chip test sockets. One is a tapered needle with only one needle tip. A single tapered probe has only one contact point with the chip pin. The other is a crown needle with multiple needle tips. A single crown probe has multiple needle tips that can contact the chip pins.

[0003] During the testing of QFN packaged chips, due to factors such as contact levelness and product tolerance, there is a certain amount of tolerance between the chip pins and the test socket, resulting in a deviation in which only part of the needle tip of a single test socket crown probe contacts the QFN packaged chip pins. After a period of use, there is a problem of uneven wear of the needle tips of a single crown probe. Among the needle tips of the crown needle, the needle tips that contact more with the QFN chip pins are severely worn, and the rapid wear causes their contact impedance to increase, which in turn leads to abnormal test yield and a short test service life of the crown probe. Utility Model Content

[0004] The purpose of the utility model is to provide an automatically rotating test socket probe and a test socket, which can realize automatic rotation of the probe during the test process, thereby avoiding the problem of severe wear of the needle tip on one side of the probe, making the wear of each needle head of the probe more uniform, and effectively extending the test service life of the probe.

[0005] In order to achieve the above object, the utility model discloses an automatic rotating test socket probe, which includes:

[0006] A movable member, wherein a switching cavity is provided in the movable member, a plurality of needle tips are provided at one end of the movable member along the circumferential direction, and a connecting channel communicating with the switching cavity is provided at the other end, a first connecting hole and a plurality of first inclined walls arranged along the circumferential direction are provided on the top wall of the switching cavity, and a plurality of second inclined walls arranged along the circumferential direction are provided on the bottom wall of the switching cavity;

[0007] A fixing member, the fixing member is provided with a connecting portion and a contact portion, the end surface of the contact portion facing the first inclined wall is provided with a second connecting hole and a plurality of first slopes arranged along the circumferential direction, the end surface of the contact portion facing the second inclined wall is provided with a second slope and is fixedly connected to the connecting portion, the connecting portion passes through the connecting channel and is fixedly connected to the test socket to fix the automatic rotating test socket probe to the test socket;

[0008] An elastic member, wherein the elastic member is disposed in the switching cavity, and both ends of the elastic member extend into the first connecting hole and the second connecting hole respectively.

[0009] When the chip moves and presses the needle tip, the elastic member is elastically compressed, and the connection between two adjacent first slopes abuts against the first inclined wall, so that the movable member rotates. After the movable member rotates, the first inclined wall is pressed against the first slope;

[0010] When the chip moves to release the needle tip, the elastic member stretches elastically, and the second inclined wall abuts against the connection between two adjacent second slopes to rotate the movable member. After the movable member rotates, the second inclined wall is pressed against the second slope.

[0011] Optionally, the contact portion is provided with four first slopes at intervals of ninety degrees along the circumferential direction, and the top wall of the switching cavity is provided with two first slope walls at intervals of one hundred and eighty degrees along the circumferential direction.

[0012] Optionally, the contact portion is provided with four second slopes at intervals of ninety degrees along the circumferential direction, and the bottom wall of the switching cavity is provided with two second slope walls at intervals of one hundred and eighty degrees along the circumferential direction.

[0013] Optionally, the contact portion is provided with four first slopes and four second slopes at intervals of ninety degrees in the circumferential direction, and the first slopes and the second slopes are spaced forty-five degrees in the axial direction.

[0014] Optionally, the movable part includes a needle tube, a needle tip and a bottom cover, the needle tube is hollow, the needle tip and the bottom cover are respectively inserted and fixed to the tube openings at both ends of the needle tube, so that the space inside the needle tube is formed into the switching chamber, the bottom cover is provided with the connecting channel, the needle tip is provided at the end away from the test seat, and the needle tip and the bottom cover are respectively provided at the end inserted into the needle tube with the first inclined wall and the second inclined wall.

[0015] Optionally, the outer wall of the needle tube extends outward to form a first positioning portion, and the outer wall of the bottom cover extends outward to form a second positioning portion, and the first positioning portion and the second positioning portion are respectively abutted and fixed to the two ends of the needle tube.

[0016] Optionally, four of the needle tips are provided on the end surface of the movable member away from the test seat at intervals of ninety degrees along the circumferential direction.

[0017] In order to achieve the above-mentioned object, the utility model discloses a test seat, which includes a test seat and the aforementioned automatic rotating test seat probe arranged on the test seat.

[0018] The utility model enables the movable part to rotate to change the position of each needle tip on the movable part during the test process by cooperating with the slope of the fixing part and the inclined wall of the movable part. The top wall of the switching cavity in the movable part is provided with a first connecting hole and a plurality of first inclined walls, and the bottom wall of the switching cavity is provided with a plurality of second inclined walls. One end of the contact part of the fixing part is provided with a second connecting hole and a plurality of first slopes, and the other end is provided with a plurality of second slopes. The connecting part of the fixing part passes through the connecting channel of the movable part and is fixedly connected to the test seat. The two ends of the elastic part in the switching cavity extend into the first connecting hole and the second connecting hole respectively. As the chip contacts and separates from the needle tip, the elastic part will compress and stretch, and the connection of the two adjacent first slopes and the second inclined wall will respectively abut against the first inclined wall and the connection of the two adjacent second slopes to make the movable part rotate, thereby realizing automatic rotation of the probe during the test process. By continuously changing the position of each needle tip during the test process, the problem of serious wear of the needle tip on one side of the probe can be avoided, and the wear of each needle head of the probe can be more even, thereby effectively extending the test service life of the probe. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 This is a three-dimensional structural diagram of the automatic rotating test socket probe according to an embodiment of the present utility model.

[0020] Figure 2 This is a cross-sectional structural diagram of the automatic rotating test socket probe according to an embodiment of the present invention, with the elastic member omitted.

[0021] Figure 3 This is a first exploded structural diagram of the automatic rotating test socket probe according to an embodiment of the present invention.

[0022] Figure 4 This is a second exploded structural diagram of the automatic rotating test socket probe according to an embodiment of the present invention. DETAILED DESCRIPTION

[0023] In order to explain the technical content, structural features, achieved objectives and effects of the present invention in detail, the following is a detailed description in conjunction with the embodiments and the accompanying drawings.

[0024] See also Figures 1 to 4 The utility model discloses an automatic rotating test seat probe, which includes:

[0025] A movable member 1 is provided with a switching chamber 11 therein. One end of the movable member 1 is provided with a plurality of needle tips 12 along the circumferential direction, and the other end is provided with a connecting channel 13 communicating with the switching chamber 11. The top wall of the switching chamber 11 is provided with a first connecting hole 14 and a plurality of first inclined walls 15 arranged along the circumferential direction. The bottom wall of the switching chamber 11 is provided with a plurality of second inclined walls 16 arranged along the circumferential direction.

[0026] The fixing member 2 is provided with a connecting portion 21 and a contact portion 22. The end surface of the contact portion 22 facing the first inclined wall 15 is provided with a second connecting hole 221 and a plurality of first slopes 222 arranged along the circumferential direction. The end surface of the second inclined wall 16 facing the contact portion 22 is provided with a second slope 223 and is fixedly connected to the connecting portion 21. The connecting portion 21 passes through the connecting channel 13 and is fixedly connected to the test socket to fix the automatic rotating test socket probe to the test socket;

[0027] The elastic member 3 is disposed in the switching cavity 11, and both ends of the elastic member 3 extend into the first connecting hole 14 and the second connecting hole 221 respectively.

[0028] When the chip moves and presses the needle tip 12, the elastic member 3 is elastically compressed, and the connection between the two adjacent first slopes 222 abuts against the first slope wall 15, so that the movable member 1 rotates. After the movable member 1 rotates, the first slope wall 15 presses against the first slope 222;

[0029] When the chip moves and releases the needle tip 12 , the elastic member 3 stretches elastically, and the second inclined wall 16 abuts against the connection between two adjacent second slopes 223 to rotate the movable member 1 . After the movable member 1 rotates, the second inclined wall 16 presses against the second slope 223 .

[0030] The utility model rotates the movable part 1 to change the position of each needle tip 12 on the movable part 1 during the test by cooperating with the slope of the fixed part 2 and the inclined wall of the movable part 1. The top wall of the switching cavity 11 in the movable part 1 is provided with a first connecting hole 14 and a plurality of first inclined walls 15, and the bottom wall of the switching cavity 11 is provided with a plurality of second inclined walls 16. One end of the contact portion 22 of the fixed part 2 is provided with a second connecting hole 221 and a plurality of first inclined slopes 222, and the other end is provided with a plurality of second inclined slopes 223. The connecting portion 21 of the fixed part 2 passes through the connecting channel 13 of the movable part 1 and is fixedly connected to the test seat. The two ends of the elastic member 3 extend into the first connecting hole 14 and the second connecting hole 221 respectively. As the chip contacts and separates from the needle tip 12, the elastic member 3 will compress and stretch, and the connection between the two adjacent first slopes 222 and the second inclined wall 16 will respectively abut against the first inclined wall 15 and the connection between the two adjacent second slopes 223, so that the movable member 1 rotates, thereby realizing automatic rotation of the probe during the test process. By continuously changing the position of each needle tip 12 during the test process, the problem of severe wear of the needle tip 12 on one side of the probe can be avoided, and the wear of each needle tip 12 of the probe can be made more even, effectively extending the test service life of the probe.

[0031] See Figures 1 to 4 The contact portion 22 is provided with four first slopes 222 at intervals of ninety degrees along the circumferential direction, and the top wall of the switching chamber 11 is provided with two first inclined walls 15 at intervals of one hundred and eighty degrees along the circumferential direction.

[0032] Specifically, in this embodiment, the connection portion 21 of the fixing part 2 of the automatic rotating test socket probe is fixed to the test socket in the Pick&Place test of the integrated circuit Final Test. When the crown probe is compressed by the chip, the two first inclined walls 15 are respectively pressed against the two connections formed by the four first slopes 222. The two connections force the two first inclined walls 15 to slide into the two first slopes 222 respectively to achieve contact and fit, thereby driving the movable part 1 and the needle tip to rotate 45 degrees, but not limited to this.

[0033] See Figures 1 to 4 The contact portion 22 is provided with four second slopes 223 at intervals of ninety degrees along the circumferential direction, and the bottom wall of the switching chamber 11 is provided with two second inclined walls 16 at intervals of one hundred and eighty degrees along the circumferential direction.

[0034] Specifically, in this embodiment, during the process of the chip moving upward and the crown probe rebounding, the two connections formed by the four second slopes 223 are respectively against the two second inclined walls 16. The two connections force the two second inclined walls 16 to slide into the two second slopes 223 respectively to achieve contact and fit, thereby driving the movable part 1 and the needle tip to rotate 45 degrees, but not limited to this.

[0035] See Figures 1 to 4 The contact portion 22 is provided with four first slopes 222 and four second slopes 223 at intervals of ninety degrees in the circumferential direction, and the first slopes 222 and the second slopes 223 are spaced forty-five degrees in the axial direction.

[0036] Specifically, in this embodiment, during the process of testing a chip, the first slope 222 and the second slope 223 are coordinated with the first inclined wall 15 and the second inclined wall 16 by means of the extrusion force applied by the chip pins to the crown probe and the rebound force of the elastic part 3 inside the crown probe after being released from the extrusion, so that the movable part 1 rotates 90 degrees relative to the fixed part 2, thereby realizing the self-rotation of the crown probe, so that each needle tip 12 can be evenly subjected to the extrusion wear of the chip pins, avoiding large wear of a single needle tip.

[0037] See Figures 1 to 4 The movable part 1 includes a needle tube 17, a needle tip 18 and a bottom cover 19. The needle tube 17 is hollow. The needle tip 18 and the bottom cover 19 are respectively inserted and fixed to the tube openings at both ends of the needle tube 17, so that the space inside the needle tube 17 forms a switching chamber 11. The bottom cover 19 is provided with a connecting channel 13. The end of the needle tip 18 away from the test seat is provided with a needle tip head 12. The ends of the needle tip 18 and the bottom cover 19 inserted into the needle tube 17 are respectively provided with a first inclined wall 15 and a second inclined wall 16.

[0038] Specifically, in this embodiment, the fixing part 2 is a needle tail, which is fixed in contact with the LB plate on the test seat. During assembly, the needle tip 18, the needle tube 17, and the bottom cover 19 are fixed to each other. Under the action of the elastic part 3, the telescopic movement of the movable part 1 relative to the fixing part 2 is realized. On the basis of this structure, a structure for realizing the rotation of the movable part 1 is provided. The first inclined wall 15 and the second inclined wall 16 are respectively provided on the needle tip 18 and the bottom cover 19, and the first slope 222 and the second slope 223 are provided on the contact part 22 of the needle tail, so that when the contact part 22 of the needle tail contacts the needle tip 18 and the bottom cover 19, the movable part 1 is forced to rotate.

[0039] Specifically, in this embodiment, when the crown probe contacts and compresses the chip pin, the needle tip 18 rotates relative to the needle tail with the cooperation of the first slope 222 and the first inclined wall 15 to drive the movable part 1 to rotate 45 degrees. When the chip is removed and the crown probe rebounds, the bottom cover 19 rotates relative to the needle tail with the cooperation of the second slope 223 and the second inclined wall 16 to drive the movable part 1 to rotate 45 degrees. The axial angles of the first slope 222 and the second slope 223 differ by 45 degrees, so as to realize the automatic rotation of the crown probe by 90 degrees in a chip test, but the present invention is not limited to this.

[0040] Optionally, the outer wall of the needle tube 17 extends outward to form a first positioning portion 171, and the outer wall of the bottom cover 19 extends outward to form a second positioning portion 191. The first positioning portion 171 and the second positioning portion 191 are respectively abutted and fixed to the two ends of the needle tube 17.

[0041] Specifically, in this embodiment, the needle tip 18 and the bottom cover 19 are positioned and assembled at both ends of the needle tube 17 through the first positioning portion 171 and the second positioning portion 191 respectively, ensuring that there is no axial angle difference between the first inclined wall 15 and the second inclined wall 16.

[0042] See Figures 1 to 4 The end surface of the movable part 1 away from the test seat is provided with four needle tips 12 at intervals of ninety degrees along the circumferential direction.

[0043] Since the crown probe has the disadvantage of piercing off-center when testing QFN chips, the crown probe is designed to rotate automatically to alleviate the severe wear of the needle tip 12 on one side of the crown probe, so that the needle tips 12 of the crown probe wear evenly, which is beneficial to improving the service life of the crown probe.

[0044] Specifically, in this embodiment, during the contact between the chip pin and the needle tip 12 of the crown probe, the first slope 222 and the second slope 223 are set to enable the movable part 1 to rotate 90 degrees relative to the fixed part 2. Therefore, after testing a chip, the four needle tips 12 on the crown probe switch their respective positions in sequence according to the direction of rotation, so that during the chip testing process, each needle tip 12 can be squeezed and worn by the chip pin, but the present invention is not limited to this.

[0045] See also Figures 1 to 4 The utility model discloses a test seat, which includes a test seat and the aforementioned automatic rotating test seat probe arranged on the test seat.

[0046] The above disclosure is only a preferred embodiment of the present invention, and certainly cannot be used to limit the scope of rights of the present invention. Therefore, equivalent changes made according to the scope of the patent application of the present invention are still within the scope covered by the present invention.

Claims

1. An automatic rotating test socket probe, characterized in that: include: A movable member, wherein a switching cavity is provided in the movable member, a plurality of needle tips are provided at one end of the movable member along the circumferential direction, and a connecting channel communicating with the switching cavity is provided at the other end, a first connecting hole and a plurality of first inclined walls arranged along the circumferential direction are provided on the top wall of the switching cavity, and a plurality of second inclined walls arranged along the circumferential direction are provided on the bottom wall of the switching cavity; A fixing member, the fixing member is provided with a connecting portion and a contact portion, the end surface of the contact portion facing the first inclined wall is provided with a second connecting hole and a plurality of first slopes arranged along the circumferential direction, the end surface of the contact portion facing the second inclined wall is provided with a second slope and is fixedly connected to the connecting portion, the connecting portion passes through the connecting channel and is fixedly connected to the test socket to fix the automatic rotating test socket probe to the test socket; An elastic member, wherein the elastic member is disposed in the switching cavity, and both ends of the elastic member extend into the first connecting hole and the second connecting hole respectively. When the chip moves and presses the needle tip, the elastic member is elastically compressed, and the connection between two adjacent first slopes abuts against the first inclined wall, so that the movable member rotates. After the movable member rotates, the first inclined wall is pressed against the first slope; When the chip moves to release the needle tip, the elastic member stretches elastically, and the second inclined wall abuts against the connection between two adjacent second slopes to rotate the movable member. After the movable member rotates, the second inclined wall is pressed against the second slope.

2. The automatic rotating test socket probe according to claim 1, characterized in that: The contact portion is provided with four first slopes at intervals of ninety degrees along the circumferential direction, and the top wall of the switching cavity is provided with two first slope walls at intervals of one hundred and eighty degrees along the circumferential direction.

3. The automatic rotating test socket probe according to claim 1, characterized in that: The contact portion is provided with four second slopes at intervals of ninety degrees along the circumferential direction, and the bottom wall of the switching cavity is provided with two second slope walls at intervals of one hundred and eighty degrees along the circumferential direction.

4. The automatic rotating test socket probe according to claim 1, characterized in that: The contact portion is provided with four first slopes and four second slopes at intervals of ninety degrees in the circumferential direction, and the first slopes and the second slopes are spaced forty-five degrees in the axial direction.

5. The automatic rotating test socket probe according to claim 1, characterized in that: The movable part includes a needle tube, a needle tip and a bottom cover. The needle tube is hollow. The needle tip and the bottom cover are respectively plugged and fixed to the tube openings at both ends of the needle tube, so that the space inside the needle tube forms the switching chamber. The bottom cover is provided with the connecting channel. The needle tip is provided at the end away from the test seat. The needle tip head is provided. The needle tip and the bottom cover are respectively provided at the ends inserted into the needle tube with the first inclined wall and the second inclined wall.

6. The automatic rotating test socket probe according to claim 5, characterized in that: The outer wall of the needle tube extends outward to form a first positioning portion, and the outer wall of the bottom cover extends outward to form a second positioning portion. The first positioning portion and the second positioning portion are respectively abutted and fixed to the two ends of the needle tube.

7. The automatic rotating test socket probe according to claim 1, characterized in that: The end surface of the movable part away from the test seat is provided with four needle tips at intervals of 90 degrees along the circumferential direction.

8. A test socket, characterized in that: The invention comprises a test seat and an automatic rotating test seat probe according to any one of claims 1 to 7 arranged on the test seat.

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