Switching transistor test fixture
By designing a switching transistor test fixture with a protective fixture and heat dissipation structure, the problems of fixture damage and difficulty in disassembly are solved, and safe testing and convenient disassembly of transistors are achieved.
Patent Information
- Application Number
- CN202422217817.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-09-10
- Publication Date
- 2025-10-17
- Estimated Expiration
- 2034-09-10
AI Technical Summary
Existing switching transistor test fixtures are prone to damaging transistors during testing and are difficult to disassemble and dissipate heat, which affects test results.
A test fixture including a base plate, a first clamp and a second clamp was designed. Silicone pads were used to protect the transistors. The clamps were powered and dissipated through cooling water pipes. A knob and slide rail structure was used for easy disassembly.
Effectively protect transistors from damage, easy to disassemble without affecting test results, and solve heat problems through cooling.
Smart Images
Figure CN223449983U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The utility model relates to transistor test fixture technical field, concretely is a switch transistor test fixture. BACKGROUND
[0002] Switch transistor is a kind of solid semiconductor device, with the effect of switch, switch transistor generally has three poles (terminal), when switch transistor finished product test, the poles of switch transistor, that is, each terminal is electrically tested, to complete the detection of switch transistor quality.
[0003] When testing switch transistor, clamp needs to be used, nowadays switch transistor test fixture is easy to damage switch transistor in the process of testing due to the action force of clamp, and switch transistor needs to be welded on clamp when testing, so that switch transistor is not easy to disassemble after testing, switch transistor will heat in the process of testing switch transistor, to cause the damage of switch transistor, therefore, aiming at the above problems, a switch transistor test fixture is provided. UTILITY MODEL CONTENTS
[0004] The utility model aims at providing a switch transistor test fixture to solve the problems in the above background.
[0005] To achieve the above object, the utility model provides the following technical scheme:
[0006] A switch transistor test fixture, including bottom plate, first clamping block and second clamping block, one end of the bottom plate is fixedly installed with flat plate, the middle position of one side of the flat plate is equipped with round hole, the other end of the flat plate is fixedly installed with U-shaped plate, one side of the U-shaped plate is fixedly installed with slide rail, the other end of the flat plate is fixedly connected with slide rail, the other side of the U-shaped plate is rotatably installed with lead screw, the other end of the flat plate is rotatably connected with lead screw, the tail end of the lead screw is fixedly connected with knob, the first clamping block includes first clamping block main body, left ear, right ear, first silica gel pad and cooling water pipe, the surface of the lead screw is spirally connected with left ear, the surface of the slide rail is slidably connected with right ear, the second clamping block includes second clamping block main body, second silica gel pad and buckle, one side of the second clamping block main body away from first clamping block is fixedly installed with spring, and the spring is fixedly connected with the inner wall of U-shaped plate, one side of the second clamping block close to first clamping block is equipped with limit block, the bottom of the limit block is fixedly connected with bottom plate, the buckle is equipped with test line, and the test line includes test wire and chuck.
[0007] Preferably, one side of the first clamp block body is fixedly provided with a left ear, the left ear is provided with a thread, the other side of the first clamp block body is fixedly provided with a right ear, the right ear is provided with a circular hole, one side of the first clamp block body close to the second clamp block is fixedly provided with a first silica gel pad, and the first clamp block body is internally embedded with a cooling water pipe.
[0008] Preferably, one side of the second clamp block body close to the first clamp block is fixedly provided with a second silica gel pad, and the upper portion of the second clamp block body is fixedly provided with a buckle.
[0009] Preferably, one end of the test wire is fixedly provided with a clamp head, the other end of the test wire is connected with a test circuit, and the clamp head comprises a clamp head shell, a card and a clamp head spring.
[0010] Preferably, the inner wall of the clamp head shell is fixedly provided with the clamp head spring, the other end of the clamp head spring is fixedly provided with the card, and the card is movably arranged on the inner wall of the clamp head shell, and one corner of the card is chamfered, so that the inlet position of the clamp head is in a V shape.
[0011] Preferably, the surface of the knob is provided with a pattern.
[0012] Compared with the prior art, the utility model has the beneficial effects that:
[0013] In the utility model, the silica gel pad can effectively protect the switching transistor, the clamp head can supply power to each terminal of the switching transistor, the switching transistor is easy to disassemble, the cooling liquid can take away the heat generated by the switching transistor during testing, and the damage of the switching transistor is avoided. BRIEF DESCRIPTION OF DRAWINGS
[0014] Figure 1 It is a whole structure schematic view of the utility model;
[0015] Figure 2 It is a whole structure top view schematic view of the utility model;
[0016] Figure 3 It is a first clamp block structure schematic view of the utility model;
[0017] Figure 4 It is a clamp head structure schematic view of the utility model.
[0018] In the figure: 1, the base plate; 2, the first clamp block; 201, the first clamp block body; 202, the left ear; 203, the right ear; 204, the first silica gel pad; 205, the cooling water pipe; 3, the second clamp block; 301, the second clamp block body; 302, the second silica gel pad; 303, the buckle; 4, the flat plate; 5, the U-shaped plate; 6, the slide rail; 7, the screw rod; 8, the knob; 9, the spring; 10, the limiting block; 11, the test line; 1101, the test wire; 1102, the chuck; 11021, the chuck shell; 11022, the card; 11023, the chuck spring. DETAILED DESCRIPTION
[0019] The technical solutions in the embodiments of the utility model will be clearly and completely described below with reference to the drawings in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, rather than all the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by those skilled in the art without creative labor fall within the protection scope of the utility model.
[0020] In the description of the utility model, it should be understood that the orientation words such as 'front, back, up, down, left, right', 'horizontal, vertical, perpendicular, horizontal' and 'top, bottom' and the like indicated orientation or position relationship are usually based on the orientation or position relationship shown in the drawings, only for the convenience of describing the utility model and simplifying the description, without making the opposite statement, these orientation words do not indicate and imply that the indicated device or element must have a particular orientation or be constructed and operated in a particular orientation, therefore, it cannot be understood as the limitation to the protection scope of the utility model; the orientation words 'inner, outer' refer to the inner and outer of the contour of each component itself.
[0021] In addition, it should be noted that the use of 'first','second' and the like to limit parts only facilitates the differentiation of the corresponding parts, and the above words have no special meaning unless otherwise stated, therefore, it cannot be understood as the limitation to the protection scope of the utility model.
[0022] Please refer to Figures 1-4 The utility model provides a technical scheme:
[0023] The utility model provides a switching transistor test fixture, including bottom plate 1, first clamp block 2 and second clamp block 3, one end of bottom plate 1 is fixedly installed with flat plate 4, the middle position of one side of flat plate 4 is equipped with round hole, the other end of flat plate 4 is fixedly installed with U-shaped plate 5, one side of U-shaped plate 5 is fixedly installed with slide rail 6, the other end of flat plate 4 is fixedly connected with slide rail 6, the other end of U-shaped plate 5 is rotatably installed with lead screw 7, the other end of flat plate 4 is rotatably connected with lead screw 7, the tail end of lead screw 7 is fixedly connected with knob 8, first clamp block 2 includes first clamp block main part 201, left ear 202, right ear 203, first silica gel pad 204 and cooling water pipe 205, the surface of lead screw 7 is spirally connected with left ear 202, the surface of slide rail 6 is slidably connected with right ear 203, second clamp block 3 includes second clamp block main part 301, second silica gel pad 302 and buckle 303, the side of second clamp block main part 301 away from first clamp block 2 is fixedly installed with spring 9, and spring 9 is fixedly connected with the inner wall of U-shaped plate 5, the side of second clamp block 3 close to first clamp block 2 is equipped with limit block 10, the bottom of limit block 10 is fixedly connected with bottom plate 1, and buckle 303 is clamped with test wire 11, and test wire 11 includes test wire 1101 and chuck 1102.
[0024] The side of first clamp block main part 201 is fixedly installed with left ear 202, and left ear 202 is provided with a thread, the other side of first clamp block main part 201 is fixedly installed with right ear 203, and right ear 203 is provided with a circular hole, to ensure the smooth sliding of first clamp block 2, the side of first clamp block main part 201 close to second clamp block 3 is fixedly installed with first silica gel pad 204, to protect the switching transistor, and cooling water pipe 205 is embeddedly installed in first clamp block main part 201, to carry away the heat generated during the switching transistor test process, the side of second clamp block main part 301 close to first clamp block 2 is fixedly installed with second silica gel pad 302, buckle 303 is fixedly installed above second clamp block main part 301, to facilitate the fixation of test wire 1101, one end of test wire 1101 is fixedly installed with chuck 1102, the other end of test wire 1101 is connected to a test circuit, chuck 1102 includes chuck shell 11021, card 11022 and chuck spring 11023, to ensure that the terminal of the switching transistor can be clamped, the inner wall of chuck shell 11021 is fixedly installed with chuck spring 11023, the other end of chuck spring 11023 is fixedly installed with card 11022, and card 11022 is movably installed on the inner wall of chuck shell 11021, one corner of card 11022 is chamfered, to make the inlet position of chuck 1102 present a "V" shape, to facilitate the entry of the terminal of the switching transistor, and the surface of knob 8 is provided with a pattern, to increase the friction and prevent slipping.
[0025] Work flow: The cooling liquid required in the utility model is provided from outside, the head of the switching transistor is placed between the first clamping block 2 and the second clamping block 3, the knob 8 is rotated to drive the lead screw 7 to rotate between the flat plate 4 and the U-shaped plate 5, meanwhile the left ear 202 will move along the lead screw 7, the right ear 203 will drive the first clamping block main body 201 to move towards the second clamping block 3 along the slide rail 6, when the first clamping block main body 201 and the second clamping block main body 301 extrude the switching transistor, the first silica gel pad 204 and the second silica gel pad 302 provide certain buffering effect for the switching transistor, when the extrusion force is too large, the spring 9 is compressed, at this time, the terminal of the switching transistor is outside the first clamping block 2 and the second clamping block 3, the test wire 11 is clamped on the buckle 303, wherein the test wire 1101 passes through the buckle 303, the clamp head 1102 is clamped on the terminal of the switching transistor, when the terminal is inserted into the groove opened by the clamp head shell 11021, the V-shaped groove at the front end of the two cards 11022 will play a guiding role, the terminal is sent to the depth of the clamp head 1102, when the terminal of the switching transistor enters the depth of the clamp head 1102, the terminal of the switching transistor will be clamped in the clamp head 1102 due to the action of the clamp spring 11023, the other end of the test wire 11 is connected to the test circuit, when testing, the cooling water pipe 205 is filled with cooling liquid inside, the heat generated by the switching transistor is taken away, after testing, the knob 8 is rotated reversely, the first clamping block 2 and the second clamping block 3 will be separated, due to the action of the limiting block 10, the second clamping block 3 will be limited within the range of the U-shaped plate 5.
[0026] The contents not described in detail in the specification belong to the prior art known by the person skilled in the art. The standard parts used in the utility model can be purchased from the market, the special-shaped parts can be ordered according to the description and the drawings, the specific connection mode of each part adopts the conventional means such as bolt, rivet and welding in the prior art, the machinery, parts and equipment adopt the conventional type in the prior art, and the circuit connection adopts the conventional connection mode in the prior art, which will not be described in detail here.
[0027] Although the embodiments of the utility model have been shown and described, it can be understood by those skilled in the art that various changes, modifications, replacements and variations can be made to the embodiments without departing from the principles and spirits of the utility model, the scope of the utility model is defined by the appended claims and their equivalents.
Claims
1. A switching transistor test fixture, comprising a base plate (1), a first clamping block (2) and a second clamping block (3), characterized in that: A flat plate (4) is fixedly mounted on one end of the bottom plate (1), a circular hole is provided in the middle of one side of the flat plate (4), a U-shaped plate (5) is fixedly mounted on the other end of the flat plate (4), a slide rail (6) is fixedly mounted on one side of the U-shaped plate (5), the flat plate (4) is fixedly connected to the other end of the slide rail (6), a screw rod (7) is rotatably mounted on the other side of the U-shaped plate (5), the flat plate (4) is rotatably connected to the other end of the screw rod (7), and a knob (8) is fixedly connected to the end of the screw rod (7), the first clamping block (2) comprises a first clamping block body (201), a left ear (202), a right ear (203), a first silicone pad (204) and a cooling water pipe (205), the surface of the screw rod (7) A left ear (202) is spirally connected, and a right ear (203) is slidably connected to the surface of the slide rail (6). The second clamping block (3) includes a second clamping block body (301), a second silicone pad (302) and a buckle (303). A spring (9) is fixedly installed on the side of the second clamping block body (301) away from the first clamping block (2), and the spring (9) is fixedly connected to the inner wall of the U-shaped plate (5). A limit block (10) is provided on the side of the second clamping block (3) close to the first clamping block (2). The bottom of the limit block (10) is fixedly connected to the bottom plate (1). The buckle (303) is clamped and installed with a test line (11), and the test line (11) includes a test wire (1101) and a clamp (1102).
2. A switching transistor test fixture according to claim 1, characterized in that: A left ear (202) is fixedly installed on one side of the first clamping block body (201), and the left ear (202) is provided with a thread. A right ear (203) is fixedly installed on the other side of the first clamping block body (201), and the right ear (203) is provided with a circular hole. A first silicone pad (204) is fixedly installed on one side of the first clamping block body (201) close to the second clamping block (3), and a cooling water pipe (205) is embedded in the interior of the first clamping block body (201).
3. The switching transistor test fixture according to claim 1, wherein: A second silicone pad (302) is fixedly mounted on one side of the second clamping block body (301) close to the first clamping block (2), and a buckle (303) is fixedly mounted above the second clamping block body (301).
4. The switching transistor test fixture according to claim 1, wherein: One end of the test wire (1101) is fixedly mounted with a clamp (1102), and the other end of the test wire (1101) is connected to a test circuit. The clamp (1102) comprises a clamp housing (11021), a card (11022) and a clamp spring (11023).
5. The switching transistor test fixture according to claim 4, characterized in that: A chuck spring (11023) is fixedly mounted on the inner wall of the chuck housing (11021), a card (11022) is fixedly mounted on the other end of the chuck spring (11023), and the card (11022) is movably mounted on the inner wall of the chuck housing (11021), and one corner of the card (11022) is chamfered so that the inlet position of the chuck (1102) is in a "V" shape.
6. The switching transistor test fixture according to claim 1, wherein: The surface of the knob (8) is provided with patterns.