Intelligent debugging controller

Abstract

The utility model relates to the technical field of grating detection, in particular to an intelligent debugging controller which comprises a processing unit, a switching power supply, a voltage acquisition unit and a voltage selection unit. The switching power supply generates direct current to realize power supply voltage supply required by grating detection; the voltage selection unit generates voltage demand data required by grating detection; the voltage acquisition unit acquires real-time voltage data; the processing unit communicates with the voltage acquisition unit, the switching power supply and the voltage selection unit at the same time, receives voltage demand data generated by the voltage selection unit, receives real-time voltage data acquired by the voltage acquisition unit, compares the voltage demand data with the real-time voltage data, and outputs the voltage demand data and the real-time voltage data; the output state of the switching power supply is controlled in real time by taking the voltage demand data as reference; and a plurality of groups of voltage selection units are arranged. According to the invention, accurate switching of the voltage required in the grating detection process is realized.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of grating detection, and particularly relates to an intelligent debugging controller. BACKGROUND

[0002] As a precise optical element, gratings play a key role in many fields such as spectral analysis, laser technology, and optical information processing. The main function of gratings is to decompose incident light into different spectral components of different wavelengths through diffraction, or to spatially separate light beams of different directions. The performance of gratings directly affects the accuracy and reliability of these applications. Therefore, accurate detection and debugging of gratings are key steps to ensure their performance.

[0003] Grating detection equipment may require different power supply voltages at different test stages. Existing power supplies often lack precise control when switching between different voltages, resulting in instability or delays during voltage switching, which affects the detection effect of gratings. SUMMARY

[0004] In order to improve the accuracy and efficiency of grating detection, the present application provides an intelligent debugging controller, which includes a processing unit, a switching power supply, a voltage acquisition unit, and a voltage selection unit. The switching power supply generates direct current to supply the required power supply voltage for grating detection. The voltage selection unit generates voltage requirement data required for grating detection. The voltage acquisition unit acquires real-time voltage data. The processing unit communicates with the voltage acquisition unit, the switching power supply, and the voltage selection unit simultaneously. The processing unit receives voltage requirement data generated by the voltage selection unit and real-time voltage data collected by the voltage acquisition unit, and compares the voltage requirement data with the real-time voltage data. The state of the switching power supply is controlled in real time based on the voltage requirement data. The voltage selection unit is set to multiple groups.

[0005] By using the above technical solution, the processing unit dynamically collects real-time voltage data and compares it with voltage requirement data, and then dynamically adjusts the output of the switching power supply to achieve that the real-time voltage data approaches the voltage requirement data. When the voltage requirement data changes, the required voltage for grating detection can be accurately adjusted.

[0006] Optionally, the display unit is further included, the voltage acquisition unit includes two groups of voltage followers and a resistance subunit, the two groups of voltage followers are correspondingly arranged on two sides of the resistance subunit, and are used for realizing AD data acquisition of the voltage between the resistance subunit; the processing unit is pre-provided with a resistance algorithm module for calculating the resistance of the resistance subunit, and is in communication with the two groups of voltage followers and the display unit; the two groups of voltage followers transmit the voltage data between the resistance subunit to the processing unit, and the resistance algorithm module pre-provided in the processing unit calculates the resistance of the resistance subunit and displays and outputs in the display unit.

[0007] The resistance voltage error parameter is automatically calculated by adopting the technical scheme, the parameter result can be directly displayed, the resistance is visualized, and therefore the work efficiency is improved.

[0008] Optionally, the ADC module and the DAC module are further included, the ADC module and the DAC module are in communication with the processing unit, the DAC module is used for converting a digital signal into an analog signal, adjusting the size of the current, realizing control on the grating load, so that the grating overload protection state can be achieved, in the process of grating overload, the ADC module acquires the resistance voltage and converts the resistance voltage into a current value, and the converted current value is displayed on the display unit 5.

[0009] The current value in the grating output overload state is measured by adopting the technical scheme, and the current value can be directly displayed to an operator. BRIEF DESCRIPTION OF DRAWINGS

[0010] Figure 1 is a component structure diagram of the intelligent debugging controller of the application;

[0011] Figure 2 is a voltage comparison logic flow diagram of the intelligent debugging controller of the application;

[0012] Figure 3 is a resistance visual configuration circuit structure diagram in the intelligent debugging controller of the application;

[0013] Figure 4 is a circuit structure diagram for controlling the voltage range in the intelligent debugging controller of the application;

[0014] Figure 5 is a circuit structure diagram for measuring the current value in the grating output overload state of the application;

[0015] Figure 6 is a circuit structure diagram for grating test function testing in the intelligent debugging controller of the application;

[0016] Figure 7is a circuit structure diagram of a grating EDM function test in an intelligent debugging controller according to the present application;

[0017] Figure 8 is a circuit structure diagram of a grating DO / LO function test in an intelligent debugging controller according to the present application.

[0018] Explanation of reference signs:

[0019] 1, processing unit; 2, switching power supply; 3, voltage acquisition unit; 4, voltage selection unit; 5, display unit. DETAILED DESCRIPTION

[0020] The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are some of the embodiments of the present application, but not all the embodiments of the present application. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative work fall within the scope of protection of the present application.

[0021] It should be understood that the terms "include" and "contain" used in the specification and claims of the present application indicate the presence of the described features, whole, steps, operations, elements and / or components, but do not exclude the presence or addition of one or more other features, whole, steps, operations, elements, components and / or sets thereof.

[0022] Reference Figure 1 and Figure 2 In the embodiments, an intelligent debugging controller includes a processing unit 1, a switching power supply 2, a voltage acquisition unit 3 and a voltage selection unit 4. The switching power supply 2 generates direct current to achieve the supply of power supply voltage required in the grating detection process; the voltage selection unit 4 generates voltage demand data required for grating detection; the voltage acquisition unit 3 acquires real-time voltage data; the processing unit 1 communicates with the voltage acquisition unit 3, the switching power supply 2 and the voltage selection unit 4 at the same time, receives the voltage demand data generated by the voltage selection unit 4, receives the real-time voltage data acquired by the voltage acquisition unit 3, and compares the voltage demand data with the real-time voltage data, so that the output state of the switching power supply 2 is controlled in real time based on the voltage demand data, so that the real-time voltage data is equal to the voltage demand data. In the embodiments of the present application, the switching power supply 2 is selected to be an adjustable voltage stabilizing circuit composed of LM2596, as shown in Figure 3 .

[0023] In the embodiments of the present application, the voltage requirement data is taken as 10V grade for example, and similarly, the voltage requirement data can also be 24V grade or 30V grade. When the voltage requirement data is 10V grade, the processing unit 1 compares the real-time voltage data with the voltage requirement data, and if the real-time voltage data is not equal to 10V, the processing unit 1 controls the output value of the switching power supply 2 in real time to change the real-time voltage data, so that the real-time voltage data finally approaches 10V.

[0024] Specifically, the voltage acquisition unit 3 includes two groups of voltage followers and resistance sub-units, and an intelligent debugging controller also includes a display unit 5; the two groups of voltage followers are correspondingly arranged on the two sides of the resistance sub-unit, for realizing AD data acquisition of the voltage at the two ends of the resistance sub-unit; the processing unit 1 is pre-installed with a resistance algorithm module for calculating the resistance of the resistance sub-unit, and communicates with the two groups of voltage followers and the display unit 5, the two groups of voltage followers transmit the voltage data collected at the two ends of the resistance sub-unit to the processing unit 1, and the resistance algorithm module pre-installed in the processing unit 1 calculates the resistance of the resistance sub-unit and displays the output in the display unit 5, realizing automatic calculation of the resistance voltage division error parameter and directly displaying the parameter result, realizing visual configuration of the resistance, thereby improving the work efficiency. In the embodiments of the present application, the display unit 5 can be selected from the group consisting of but not limited to LCD (liquid crystal display) and OLED (organic light-emitting diode display). Figure 4 Among the two groups of voltage followers, one group of voltage followers is composed of an LMV321 operational amplifier and a resistance, and the other group of voltage followers is composed of a TL084 operational amplifier and a resistance.

[0025] Referring to Figure 5 The intelligent debugging controller includes an ADC module and a DAC module, both of which communicate with the processing unit 1, the DAC module is used for converting digital signals into analog signals, the processing unit adjusts the size of the current through the DAC module, realizes control of the grating load, so that the state of grating overload protection can be achieved, in the process of grating overload, the ADC module collects resistance voltage at any time and converts it into current value, and transmits it to the processing unit, the processing unit displays the converted current value on the display unit 5, thereby realizing measurement of the current value in the state of grating output overload. Specifically, the output of the DAC can control the gate voltage on the MOSFET, and then control the current size of the grating load.

[0026] When the grating load reaches or exceeds the pre-set safety threshold, the DAC can adjust the output to reduce the load, so as to protect the grating from damage, and realize the state of grating overload protection.

[0027] Referring to Figure 6The intelligent debugging controller further comprises a TEST function test module and a corresponding TEST test switch; the TEST function test module is used for testing the TEST function of the intelligent debugging controller, and the TEST test switch is used for controlling the opening state of the TEST function test module. The processing unit 1 communicates with the TEST test switch and the TEST function test module at the same time, is used for confirming the opening state of the TEST test switch, and controls the working state of the TEST function test module. When the TEST test switch is opened, the intelligent debugging controller realizes the self-checking function.

[0028] Reference Figure 7 The intelligent debugging controller further comprises an EDM function test module and a corresponding EDM test switch; the EDM function test module is used for testing the EDM function of the intelligent debugging controller, and the EDM test switch is used for controlling the opening state of the EDM function test module. The processing unit 1 communicates with the EDM test switch and the EDM function test module at the same time, is used for confirming the opening state of the EDM test switch, and controls the working state of the EDM function test module. When the EDM test switch is opened, the intelligent debugging controller performs the EDM function detection.

[0029] Specifically, the voltage selection unit 4 is set to be multiple, and the intelligent debugging controller further comprises a voltage selection switch corresponding to the voltage selection unit 4; the processing unit 1 communicates with the voltage selection switch and the voltage selection unit at the same time, the processing unit 1 confirms the selection state of the voltage selection switch, and then generates the voltage demand data of the voltage selection unit 4, and feeds back the result of the voltage selection switch to the operator through the display unit 5. If the operator only selects one voltage selection unit 4, the voltage selection unit 4 is selected effectively, and the processing unit 1 does not feed back information; if the operator selects multiple voltage selection units 4 at the same time, the selection is invalid, and the processing unit 1 transmits fault information to the display unit 5, and the display unit 5 displays the fault code.

[0030] For example, when the voltage selection unit 4 24V and the voltage selection unit 4 30V are selected at the same time, the display unit 5 displays P12; when the voltage selection unit 4 24V and the voltage selection unit 4 10V are selected at the same time, the display unit 5 displays P13; when the voltage selection unit 4 30V and the voltage selection unit 4 10V are selected at the same time, the display unit 5 displays P23; when the voltage selection unit 4 24V, the voltage selection unit 4 30V and the voltage selection unit 4 10V are selected at the same time, the display unit 5 displays P123.

[0031] The intelligent debugging controller further comprises a plurality of voltage test modules and corresponding voltage test switches, the voltage test modules being configured to test the voltage of the intelligent debugging controller, and the voltage test switches being configured to control the state of the voltage test modules, the voltage test switches and the switch detection module being in communication with the processing unit 1, the processing unit 1 being configured to detect the selection state of the voltage test switches, and further configured to control the working state of the voltage test modules, and to feed back the result of the voltage test switches to the operator.

[0032] If only one voltage test switch is selected, the voltage test switch selection is valid, and the processing unit 1 does not feed back information, at which time the voltage test can be performed; if multiple voltage test switches are selected at the same time, the voltage test switch selection is invalid, and the processing unit 1 transmits fault information to the display unit 5, and the display unit 5 displays the fault code to prompt the operator not to perform the voltage test.

[0033] For example, when the voltage test switch V1 and the voltage test switch V2 are both ON, the display unit 5 displays PU12; when the voltage test switch V1 and the voltage test switch V3 are both ON, the display unit 5 displays PU13; when the voltage test switch V2 and the voltage test switch V3 are both ON, the display unit 5 displays PU2; and when the voltage test switch V1, the voltage test switch V2 and the voltage test switch V3 are all ON, the display unit 5 displays PU123.

[0034] Specifically, the intelligent debugging controller further comprises an NPN / PNP conversion module and a corresponding NPN / PNP conversion switch, and the NPN / PNP conversion module and the corresponding NPN / PNP conversion switch are in communication with the processing unit 1, the processing unit 1 being configured to determine the state of the NPN / PNP conversion switch, and further configured to control the working state of the NPN / PNP conversion module, so that the NPN / PNP conversion module is configured to adapt to different types of grating detection.

[0035] Similarly, the intelligent debugging controller further comprises an OS1 module, an OS2 module and corresponding OS1 switches and OS2 switches, and the OS1 module, the OS2 module and the corresponding OS1 switches and OS2 switches are in communication with the processing unit 1, the processing unit 1 being configured to confirm the working state of the OS1 switch and the OS2 switch, and further configured to control the working state of the corresponding OS1 module and OS2 module.

[0036] OS1 switch is the first output short circuit protection function switch, when in the original position, no short circuit protection function test, when hit to the ON position, short circuit protection function test and current test, display current value and keep the maximum current value display. OS2 switch is the second output short circuit protection function switch, when in the original position, no short circuit protection function test, when hit to the ON position, short circuit protection function test and current test, display current value and keep the maximum current value display.

[0037] Similarly, the intelligent debugging controller also includes a DO / LO switching module and a corresponding DO / LO switching switch, the processing unit 1 is in communication with the DO / LO switching module and the corresponding DO / LO switching switch, the processing unit 1 is used to control the state of the DO / LO switching switch, and further control the working state of the DO / LO switching module. The DO / LO switching switch is in the original position for LO logic, when the DO / LO switching switch is in the ON position, it is DO logic, referring to Figure 8 , the processing unit 1 judges the state of the DO / LO switching switch, when valid, it is LO logic, at this time, CPU-OUT1=1, CPU-OUT2=0, VCCE1 is positive, VCCE2 is negative, when invalid, it is DO logic, at this time, CPU-OUT1=0, CPU-OUT2=1, VCCE2 is positive, VCCE1 is negative.

[0038] Principle of implementation: before using the intelligent debugging controller, connect the terminal block in order according to the sequence of the grating debugging line, confirm the grating model and the output logic before debugging, select the state of the NPN / PNP conversion switch, adjust the logic of the intelligent debugging controller to be consistent with the logic of the grating, and select the opening state of the start voltage test switch, the EDM test switch and the TEST test switch. During the detection process, the supply of the grating power supply voltage is controlled by the control switch power supply 2, and the output voltage value is compared with 10V by the processing unit 1 through AD acquisition, the output value of the DC is controlled at any time to change the output voltage value, the output power is stabilized; the load of the grating is controlled by the DAC, so as to achieve the state of the grating overload protection, and further realize the current value monitoring of the grating, the test function test, the grating EDM function test, the grating NPN / PNP mutual conversion and the grating DO / LO function test.

[0039] The above are the preferred embodiments of the present application, which do not limit the protection scope of the present application, therefore: any equivalent changes made on the structure, shape, principle of the present application should be covered within the protection scope of the present application.

Claims

1. An intelligent commissioning controller, comprising: It includes processing unit (1), switching power supply (2), voltage acquisition unit (3) and voltage selection unit (4); the switching power supply (2) generates direct current, realizes the power supply voltage supply required by grating detection; the voltage selection unit (4) generates the voltage demand data required by grating detection; the voltage acquisition unit (3) acquires real-time voltage data; the processing unit (1) is communicated with voltage acquisition unit (3), switching power supply (2), voltage selection unit (4) simultaneously, the processing unit (1) receives the voltage demand data generated by voltage selection unit (4), receives the real-time voltage data collected by voltage acquisition unit (3), and compares voltage demand data with real-time voltage data, with voltage demand data as the benchmark, real-time control switching power supply (2) output state; the voltage selection unit (4) is set to multiple groups.

2. The intelligent commissioning controller of claim 1, wherein, It also includes display unit (5), the voltage acquisition unit (3) includes two groups of voltage followers and resistance subunits, two groups of the voltage followers are correspondingly arranged on the two sides of the resistance subunit, for realizing AD data acquisition of the voltage between the two ends of the resistance subunit; the processing unit (1) is preinstalled with a resistance algorithm module for calculating the resistance of the resistance subunit, the processing unit (1) is communicated with two groups of voltage followers and display unit (5), two groups of the voltage followers transmit the voltage data collected between the two ends of the resistance subunit to the processing unit (1), and the resistance algorithm module preinstalled in the processing unit (1) calculates the resistance of the resistance subunit according to the voltage data between the two ends of the resistance subunit and transmits it to the display unit (5).

3. The intelligent commissioning controller of claim 2, wherein, It also includes ADC module and DAC module, the ADC module and the DAC module are communicated with the processing unit (1), the DAC module is used for converting digital signal into analog signal, the processing unit (1) adjusts the size of current through the DAC module, so that the state of grating overload protection; the ADC module acquires resistance voltage value in time, transmits to the processing unit (1), and converts into current value, and the processing unit (1) displays the converted current value on the display unit (5).

4. The intelligent commissioning controller of claim 3, wherein, It also includes TEST function test module and TEST test switch; the TEST function test module is used for testing the TEST function of the intelligent debugging controller, and the TEST test switch is used for controlling the opening state of the TEST function test module; the processing unit (1) is communicated with the TEST test switch and the TEST function test module simultaneously, for confirming the opening state of the TEST test switch and controlling the working state of the TEST function test module.

5. The intelligent commissioning controller of claim 4, wherein, It also includes EDM function test module and EDM test switch; the EDM function test module is used for testing the EDM function of the intelligent debugging controller, and the EDM test switch is used for controlling the opening state of the EDM function test module.

6. The intelligent commissioning controller of claim 5, wherein, Also including NPN / PNP conversion module and NPN / PNP conversion switch; the NPN / PNP conversion module and the corresponding NPN / PNP conversion switch are communicated with processing unit (1), and processing unit (1) determines the state of NPN / PNP conversion switch, and then controls the working state of NPN / PNP conversion module.

7. The intelligent commissioning controller of claim 6, wherein, Also including voltage selection switch; the processing unit (1) is communicated with voltage selection switch and voltage selection unit (4) simultaneously, and the processing unit (1) confirms the selection state of voltage selection switch, and then generates the voltage demand data of voltage selection unit (4), and the result of voltage selection switch is fed back to operating personnel through display unit (5).

8. The intelligent commissioning controller of claim 7, wherein, Also including DO / LO switching module and DO / LO switching switch, the processing unit (1) is communicated with DO / LO switching module and the corresponding DO / LO switching switch simultaneously, and processing unit (1) is used for controlling the state of DO / LO switching switch, and then controlling the working state of DO / LO switching module, the DO / LO switching switch is LO logic in original position, and the DO / LO switching switch is DO logic when being in ON position.

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