VCSEL module polarization test equipment and test system

Abstract

The utility model relates to a VCSEL module polarization testing device and a VCSEL module polarization testing system. Comprising a polarization adjustment module and a power test module. The polarization adjusting module comprises a polaroid and a polarization driving unit, and the polarization driving unit is connected with the polaroid; the polaroid is arranged opposite to the VCSEL module to be measured and located on the light emitting side of the VCSEL module to be measured, the light incident surface of the polaroid is parallel to the light emitting surface of the VCSEL module to be measured, and the polaroid is configured to select laser in a preset polarization state in laser radiated by the VCSEL module to pass through; the polarization driving unit is configured to drive the polaroid to rotate by taking a central axis perpendicular to the light incident surface as a rotating axis; the power test module is arranged on the light emitting side of the polaroid, and the power test module is configured to collect the laser power of the laser in the polarization state selected by the polaroid at different rotation angles; wherein the laser power of the laser in the polarization state selected by the polaroid at different rotation angles is used for representing the aging test result of the VCSEL module to be tested.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of VCSEL module polarization test, in particular to a VCSEL module polarization test device and test system. BACKGROUND

[0002] VCSEL (Vertical-Cavity Surface-Emitting Laser) has the advantages of low threshold current, single longitudinal mode, low power consumption and high reliability, and is widely used in optical communication, 3D Sensor (3D sensor) and LiDAR (Light Detection and Ranging) fields, and is also an ideal light source for quantum precision measurement instruments such as atomic clocks, atomic magnetometers and atomic gyroscopes. As a core performance parameter of polarized light source, it is of great significance to measure the polarization extinction ratio efficiently and quickly. Especially in the VCSEL reliability test, a high-repetition, high-accuracy test system is crucial.

[0003] Traditional manual polarization test of VCSEL module is not suitable for industrialization and large-scale testing. Manual testing is low in efficiency and cannot accurately record the specific angle of different polarization directions. Especially in the VCSEL module reliability test, a fast, efficient and accurate test system is crucial. CONTENT OF THE INVENTION

[0004] Therefore, it is necessary to provide a VCSEL module polarization test device and test system to solve the above technical problems.

[0005] In a first aspect, the present application provides a VCSEL module polarization test device, comprising a polarization adjustment module and a power test module.

[0006] The polarization adjustment module comprises a polarizer and a polarization driving unit, and the polarization driving unit is connected with the polarizer.

[0007] The polarizer is arranged opposite to the VCSEL module to be tested and is located on the light emitting side of the VCSEL module to be tested. The light entrance surface of the polarizer is parallel to the light exit surface of the VCSEL module to be tested. The polarizer is configured to select the laser with a preset polarization state from the laser radiated by the VCSEL module to be tested.

[0008] The polarization driving unit is configured to drive the polarizer to rotate around the central axis perpendicular to the light entrance surface as the rotation axis.

[0009] The power test module is arranged on the light-emitting side of the polarizer, and is configured to collect laser power of laser of the polarizer in the selected polarization state at different rotation angles.

[0010] The laser power of the laser of the polarizer in the selected polarization state at different rotation angles is used to characterize the aging test result of the VCSEL module to be tested.

[0011] In one embodiment, the power test module includes an optical power meter and a signal processing unit connected to the optical power meter, the optical power meter is configured to collect the laser power, and the signal processing unit is configured to filter and amplify the laser power.

[0012] In one embodiment, the polarization driving unit is in transmission connection with the polarizer, and the polarization driving unit includes a stepper motor connected to the polarizer through a belt.

[0013] In one embodiment, a main control module is further included, and the main control module is connected with the polarization driving unit and the power test module respectively; the main control module is configured to enable the polarization driving unit and the power test module respectively.

[0014] In one embodiment, a power supply module is further included, and the power supply module is connected with the main control module, the power supply module includes a driving power supply and a driving board, and the driving board is provided with a plurality of test points, each test point corresponding to a solderable VCSEL module to be tested.

[0015] The driving power supply is electrically connected with the driving board, and is used to provide a power supply signal for the driving board.

[0016] In one embodiment, the driving power supply includes a multi-channel constant current driving power supply or a nanosecond-level narrow pulse driving power supply.

[0017] In one embodiment, a display module is further included, and the display module is connected with the main control module, and is used to visualize the rotation angle, the laser power and the aging test result.

[0018] In one embodiment, a test parameter setting module is further included, and the test parameter setting module is connected with the main control module and is configured to provide test parameter settings.

[0019] The test parameters include at least one of a peak current, a driving pulse width, a modulation frequency and a rotation angle.

[0020] In one embodiment, an interaction module is further included.

[0021] The interaction module is connected with the master module and is configured to establish a communication connection with an external device to send the laser power to the external device.

[0022] In a second aspect, the application further provides a test system, comprising a displacement module and a VCSEL module polarization test device as described above.

[0023] The displacement module is configured to adjust the relative position between the polarizer in the polarization adjustment module and the VCSEL module to be tested in the VCSEL module polarization test device.

[0024] Polarization driving unit

[0025] The VCSEL module polarization test device and the test system described above drive the polarizer in the polarization adjustment module to rotate in a plane parallel to the light-emitting surface of the VCSEL module to be tested at a preset angle interval with the central axis of the light-emitting surface as the rotation axis, so as to select the polarization state of the laser radiation of the VCSEL module to be tested. The power test module collects the laser power of the laser in the polarization state selected by the polarizer at different rotation angles, so as to realize detection of multiple polarization states of the laser radiation of the VCSEL module to be tested. The laser power of the laser in the polarization state selected by the polarizer at different rotation angles can obtain accurate and comprehensive aging test results of the VCSEL module to be tested. BRIEF DESCRIPTION OF DRAWINGS

[0026] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the related art, the drawings needed to be used in the description of the embodiments of the present application or the related art will be briefly introduced. Obviously, the drawings in the following description are only some embodiments of the present application, and those skilled in the art can obtain other related drawings according to these drawings without creative labor.

[0027] Figure 1 Fig. 1 is a structural schematic block diagram of a VCSEL module polarization test device in one embodiment;

[0028] Figure 2 Fig. 2 is a structural schematic block diagram of a power test module in one embodiment;

[0029] Figure 3 Fig. 3 is a structural schematic block diagram of a VCSEL module polarization test device in one embodiment;

[0030] Figure 4 Fig. 4 is a structural schematic block diagram of a VCSEL module polarization test device in one embodiment;

[0031] Figure 5 A graph of laser power of laser light passing through polarizing plates at different rotation angles for one embodiment.

[0032] Explanation of reference signs:

[0033] 100: VCSEL module polarization test equipment; 110: polarization adjustment module; 111: polarizing plate; 112: polarization driving unit; 120: power test module; 121: optical power meter; 122: signal processing unit; 130: main control module; 140: power supply module; 141: driving power supply; 142: driving board; 200: VCSEL module to be tested. DETAILED DESCRIPTION

[0034] In order to make the above objectives, features and advantages of the present application more apparent, specific embodiments of the present application will be described in detail below with reference to the accompanying drawings. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present application. However, the present application can be practiced in a number of different ways beyond the specific embodiments described and it is therefore contemplated to cover all such modifications as fall within the scope of the application. It is to be understood that the terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting.

[0035] In the description of the present application, it should be understood that the terms "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, and are only for the purpose of facilitating the description of the present application and simplifying the description, and therefore cannot be understood as indicating or implying that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore cannot be understood as limiting the present application.

[0036] In addition, the terms "first", "second", "third", etc. are only used for descriptive purposes and cannot be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Therefore, the features defined with "first", "second", etc. can explicitly or implicitly include at least one of the features. In the description of the present application, the meaning of "a plurality of" is at least two, for example, two, three, etc., unless otherwise specifically limited.

[0037] In this application, unless otherwise specified or limited, the terms "installed," "connected," "connect," "fixed," etc. should be understood in a broad sense. For example, they can refer to fixed connection, detachable connection, or integration; mechanical connection or electrical connection; direct connection or indirect connection through an intermediate medium; internal communication between two elements or interaction between two elements, unless otherwise specified. Those skilled in the art will understand the specific meanings of the above terms in this application based on specific circumstances.

[0038] VCSEL polarization testing primarily utilizes a polarizing beam splitter (PBS) or polarizer. The PBS splits the light beam into two components: parallel polarization (transmitted light) and perpendicular polarization (reflected light). A photodetector measures the intensity of light in these two directions. By plugging these parameters into a formula, the extinction ratio can be calculated, which can then be used to characterize VCSEL aging. Due to the high flatness of VCSEL wafers, PBS allows for rapid, high-volume testing while ensuring repeatability and accuracy.

[0039] Currently, there is no suitable testing solution for the polarization characteristics of VCSEL modules. Taking VCSEL modules soldered on a multi-channel driver board using the SMT process as an example, when testing the polarization extinction ratio of multiple modules, it is difficult to ensure repeatability and accuracy using a polarization beam splitter solution.

[0040] The accuracy of polarization extinction ratio testing for VCSEL modules is poor. When testing polarization parameters, the VCSEL chip plane and the polarizer plane need to be kept as parallel as possible. However, VCSEL modules are typically fixed to multi-channel driver boards using SMT soldering. The flatness of the solder pads, the module soldering flatness, and the consistency of the channels cannot be guaranteed. If a polarization beam splitter solution is used for testing, the flatness makes it impossible to accurately evaluate the polarization characteristics of each channel. Furthermore, using a polarization beam splitter (PBS) solution cannot quickly and accurately evaluate the polarization characteristics of the VCSEL in each direction. A polarization beam splitter can only decompose a light beam into parallel polarization (transmitted light) and perpendicular polarization (reflected light). Therefore, a single test can only measure polarization characteristics in two directions, making it impossible to evaluate full-angle data.

[0041] In one embodiment, see the attached Figure 1 , attached Figure 1 FIG1 shows a schematic structural block diagram of a VCSEL module polarization test device 100 in this embodiment. The VCSEL module polarization test device 100 in this embodiment includes a polarization adjustment module 110 and a power test module 120 .

[0042] The polarization adjustment module 110 comprises a polarizer 111 and a polarization driving unit 112, and the polarization driving unit 112 is connected with the polarizer 111; the polarizer 111 is arranged opposite to the VCSEL module 200 to be tested and is located at the light-out side of the VCSEL module 200 to be tested, the light-in surface of the polarizer 111 is parallel to the light-out surface of the VCSEL module 200 to be tested, and the polarizer 111 is configured to select the laser of a preset polarization state from the laser radiated by the VCSEL module 200 to be tested; the polarization driving unit 112 is configured to drive the polarizer 111 to rotate around the central axis perpendicular to the light-in surface as the rotation axis; the power test module 120 is arranged at the light-out side of the polarizer 111, and the power test module 120 is configured to collect the laser power of the laser of the polarization state selected by the polarizer 111 at different rotation angles; wherein the laser power of the laser of the polarization state selected by the polarizer 111 at different rotation angles is used to represent the aging test result of the VCSEL module 200 to be tested.

[0043] The polarization driving unit 112 can be any unit capable of driving the polarizer 111 to rotate. Exemplarily, the polarization driving unit 112 can be a stepper motor, without being limited thereto. By driving the polarizer 111 to rotate through the polarization driving unit 112, it can be ensured that the rotation angle of the polarizer 111 is accurately controllable.

[0044] Exemplarily, the polarization driving unit 112 can drive the polarizer 111 to rotate 0-360° in the plane parallel to the light-out surface of the VCSEL module 200 to be tested. The polarization driving unit 112 can drive the polarizer 111 to rotate around the central axis perpendicular to the light-in surface as the rotation axis at an interval of every 10°. In other embodiments, the polarization driving unit 112 can also rotate at other preset angle intervals, such as 5°, 15°, 20°, 25°, 30°, etc., without being limited thereto.

[0045] The polarizer 111 can select different polarization states of the laser radiated by the VCSEL module 200 to be tested at different rotation angles. Exemplarily, the polarizer 111 selects the laser of a first polarization state radiated by the VCSEL module 200 to be tested at a first rotation angle. The polarizer 111 selects the laser of a second polarization state radiated by the VCSEL module 200 to be tested at a second rotation angle, without being limited thereto.

[0046] The power test module 120 can be any circuit, module, instrument, etc. capable of detecting optical power. For example, the power test module 120 can comprise an optical power meter 121.

[0047] According to the laser frequencies of lasers with different polarization states collected by the power test module 120, the laser frequencies of lasers with different polarization states can characterize the aging test results of the to-be-tested VCSEL module 200. Exemplarily, each laser with a polarization state corresponding to a rotation angle corresponds to a standard laser power. By inputting the laser power of the laser with the polarization state selected by the polarizer 111 at a rotation angle obtained by the power test module 120 into a comparator configured with the standard laser power, the aging test of the to-be-tested VCSEL module 200 can be realized. When the difference between the laser power of the laser with the polarization state corresponding to the rotation angle obtained by the power test module 120 and the standard laser power corresponding to the same polarization state is greater than or equal to a preset value, the aging degree of the to-be-tested VCSEL module 200 is relatively serious. When the difference between the laser power of the laser with the polarization state selected by the polarizer 111 at a rotation angle obtained by the power test module 120 and the standard laser power corresponding to the same polarization state is less than the preset value, the aging degree of the to-be-tested VCSEL module 200 is relatively small.

[0048] In this embodiment, the polarization driving unit 112 in the polarization adjustment module 110 drives the polarizer 111 to rotate on a plane parallel to the light-emitting surface of the to-be-tested VCSEL module 200 at a preset angular interval with the central axis perpendicular to the incident light surface as the rotation axis, so that the polarizer 111 can be in different rotation angles, thereby selecting the polarization state of the laser radiated by the to-be-tested VCSEL module 200. The power test module 120 collects the laser powers of the lasers with the polarization states selected by the polarizer 111 at different rotation angles, so as to detect multiple polarization states of the laser radiated by the to-be-tested VCSEL module 200. The accurate and comprehensive aging test results of the to-be-tested VCSEL module 200 can be obtained through the laser powers of the lasers with the polarization states selected by the polarizer 111 at different rotation angles.

[0049] In one embodiment, refer to the appendix Figure 2 , appendix Figure 2 shows a schematic structural diagram of the power test module 120. The power test module 120 in this embodiment includes an optical power meter 121 and a signal processing unit 122. The signal processing unit 122 is connected to the optical power meter 121. The optical power meter 121 is configured to collect laser power, and the signal processing unit 122 is configured to perform filtering and amplification processing on the laser power.

[0050] Among them, the optical power meter 121 can have the characteristics of a wide measurement range and high linearity, so as to realize the detection of微小功率变化 (tiny power changes), and improve the detection accuracy.

[0051] In this embodiment, the signal processing unit 122 filters and amplifies the power curve formed by the laser power of the polarizer 111 with different rotation angles collected by the optical power meter 121, so as to obtain a more accurate test result.

[0052] In one embodiment, the polarization driving unit is transmission-connected to the polarizer. The polarization driving unit includes a stepping motor, and the stepping motor is connected to the polarizer via a belt.

[0053] In this embodiment, the stepper motor is connected to the polarizer through a belt transmission, automatically controlling the rotation of the polarizer, and can automatically test its polarization characteristics. Compared with manual testing, the automated system reduces human error and improves the reliability of the test results. This is especially important for large-scale production, as it can ensure that each device meets the polarization performance standards. Automated testing can quickly complete a large number of test tasks. Compared with manual testing, automated testing can complete the same number of tests in a shorter time, significantly improving production efficiency and being suitable for large-scale production environments. Actual testing has verified that a single VCSEL module can complete a full-angle test from 0°-360° within 20 seconds and collect the maximum and minimum polarization powers. It can be applied to large-scale production testing with extremely high testing efficiency. Automated testing can be repeated under the same conditions to ensure the repeatability of the test results and ensure performance consistency between different batches of VCSEL modules to be tested.

[0054] In one embodiment, see the attached Figure 3 , attached Figure 3 The second schematic block diagram of the structure of the VCSEL module polarization test device 100 in this embodiment is shown. The VCSEL module polarization test device 100 in this embodiment also includes a main control module 130, which is connected to the polarization drive unit 112 and the power test module 120 respectively; the main control module 130 is configured to enable the polarization drive unit 112 and the power test module 120 respectively.

[0055] The main control module 130 can be any module capable of enabling control. In this embodiment, the polarization drive unit 112 and the power test module 120 are enabled by the main control module 130, ensuring that the polarization drive unit 112 and the power test module 120 operate under the enablement of the main control module 130, thereby improving the controllability of the VCSEL module polarization test device 100.

[0056] In one embodiment, see the attached Figure 4 , attached Figure 4Fig. 3 shows a structural schematic block diagram of the VCSEL module polarization test device 100 in the embodiment. The VCSEL module polarization test device 100 further includes a power supply module 140 connected with the main control module 130. The power supply module 140 includes a driving power supply 141 and a driving board 142. The driving board 142 is provided with a plurality of test points (not shown in the figure) each of which is solderable to a VCSEL module to be tested. The driving power supply 141 is electrically connected with the driving board 142 and is configured to provide a power supply signal for the driving board 142. Figure 4

[0057] The main control module 130 can be connected with the driving power supply 141 and / or the driving board 142 and is configured to enable the driving power supply 141 and / or the driving board 142, so that the driving board 142 supplies power to the VCSEL module to be tested under the power supply of the driving power supply 141.

[0058] For example, the VCSEL module to be tested can be soldered to the driving board 142 through an SMT (Surface Mount Technology) process.

[0059] The driving power supply 141 is electrically connected with the driving board 142. The driving board 142 supplies power to the corresponding VCSEL module to be tested through each test point, so that the VCSEL module to be tested emits laser normally.

[0060] In one embodiment, the driving power supply includes a multi-channel constant current driving power supply or a nanosecond-level narrow pulse driving power supply.

[0061] In one embodiment, the VCSEL module polarization test device further includes a display module connected with the main control module and configured to visualize the rotation angle, the laser power and the aging test result.

[0062] For example, refer to Fig. 4. Figure 5 Fig. 4 shows a curve diagram of the laser power of laser light passing through the polarizer at different rotation angles. Figure 5 For example, refer to Fig. 4. Figure 5 Fig. 4 shows a curve diagram of the laser power of laser light passing through the polarizer at different rotation angles.

[0063] In the embodiment, the VCSEL module polarization test device further includes a display module. The rotation angle, the laser power and the aging test result are displayed through the display module, which improves the visualization of the VCSEL module polarization test device and enables the user to intuitively identify the performance of the VCSEL module under different polarization states.

[0064] ​In one embodiment, the VCSEL module polarization test device further comprises a test parameter setting module connected to the main control module and configured to provide test parameters; the test parameters include at least one of peak current, driving pulse width, modulation frequency, and rotation angle.

[0065] Illustratively, the test parameter setting module is configured to interact with a user to enable the user to configure the test parameters through the parameter setting module. The main control module is connected to the test parameter setting module, receives an electrical signal corresponding to a level of the peak current, the driving pulse width, the modulation frequency, and the rotation angle, and outputs a corresponding control signal to the driving power supply and / or the driving board of the power supply module, so that the power supply module supplies power under the corresponding test parameters.

[0066] In this embodiment, the test parameters are configured through the test parameter setting module, so that the test parameters of the VCSEL module polarization test device are adjustable, and the applicability of the VCSEL module polarization test device is improved.

[0067] In one embodiment, the VCSEL module polarization test device further comprises an interaction module connected to the main control module and configured to establish a communication connection with an external device to send laser power to the external device.

[0068] In this embodiment, the VCSEL module polarization test device can communicate with other external devices through the interaction module, so that the data can be shared, and the aging test results can be quickly fed back to other external devices, and the interactivity of the VCSEL module polarization test device is improved.

[0069] In one embodiment, the present application also provides a test system. The test system in this embodiment comprises a displacement module and a VCSEL module polarization test device as in any of the above embodiments. The displacement module is configured to adjust the relative position between the polarizer in the polarization adjustment module and the VCSEL module to be tested in the VCSEL module polarization test device.

[0070] Illustratively, the displacement module can be connected to the polarization adjustment module to move the polarization adjustment module, thereby adjusting the relative position between the polarizer in the polarization adjustment module and the VCSEL module to be tested.

[0071] Another illustrative example, the displacement module can be connected to the VCSEL module to be tested to move the VCSEL module to be tested, thereby adjusting the relative position between the polarizer in the polarization adjustment module and the VCSEL module to be tested. For example, through the driving board in the driving power supply of the power supply module in the VCSEL module polarization test device and the VCSEL module to be tested. Or, through the driving power supply and the driving board in the power supply module in the VCSEL module polarization test device and the VCSEL module to be tested.

[0072] In addition, in other embodiments, the displacement module can also be connected with the polarization adjustment module and the to-be-tested VCSEL module at the same time, for driving the polarization adjustment module and the to-be-tested VCSEL module to move respectively, so as to adjust the relative position between the polarizer in the polarization adjustment module and the to-be-tested VCSEL module, without being limited thereto.

[0073] In the embodiment, the relative position between the polarizer in the VCSEL module polarization test equipment and the to-be-tested VCSEL module is adjusted by the displacement module, so that the aging test of different to-be-tested VCSEL modules is realized, and the test flexibility of the test system is improved. It can be understood that the test system includes the VCSEL module polarization test equipment in any of the above embodiments, and the test system also has further technical effects in the case that the VCSEL module polarization test equipment in any of the above embodiments has further technical effects.

[0074] The technical features of the above embodiments can be combined arbitrarily. In order to make the description simple, all possible combinations of the technical features in the above embodiments are not described, however, as long as the combinations of the technical features do not exist contradictory, it should be considered that they are within the scope of the present application.

[0075] The above embodiments only express several implementation manners of the present application, and the description is more specific and detailed, but it should not be understood as a limitation on the patent scope of the present application. It should be pointed out that, for ordinary skilled in the art, without departing from the concept of the present application, a number of modifications and improvements can be made, which are all within the protection scope of the present application. Therefore, the protection scope of the present application should be subject to the appended claims.

Claims

1. A VCSEL module polarization testing device, characterized in that, The polarization adjustment module and the power test module are included. The polarization adjustment module includes a polarizer and a polarization driving unit, and the polarization driving unit is connected with the polarizer. The polarizer is arranged opposite to the VCSEL module to be tested and is located at the light emitting side of the VCSEL module to be tested, the light entrance surface of the polarizer is parallel to the light exit surface of the VCSEL module to be tested, and the polarizer is configured to select the laser with a preset polarization state from the laser radiated by the VCSEL module to be tested. The polarization driving unit is configured to drive the polarizer to rotate around the central axis perpendicular to the light entrance surface as the rotation axis. The power test module is arranged at the light exit side of the polarizer, and the power test module is configured to collect the laser power of the laser with the polarization state selected by the polarizer at different rotation angles. The laser power of the laser with the polarization state selected by the polarizer at different rotation angles is used to represent the aging test result of the VCSEL module to be tested.

2. The VCSEL module polarization test apparatus of claim 1, wherein, The power test module includes an optical power meter and a signal processing unit, the signal processing unit is connected with the optical power meter, the optical power meter is configured to collect the laser power, and the signal processing unit is configured to filter and amplify the laser power.

3. The VCSEL module polarization test apparatus of claim 1, wherein, The polarization driving unit is in transmission connection with the polarizer, and the polarization driving unit includes a step motor, the step motor is connected with the polarizer through a belt.

4. The VCSEL module polarization test apparatus of any of claims 1-3, wherein, A main control module is further included, the main control module is connected with the polarization driving unit and the power test module respectively, and the main control module is configured to enable the polarization driving unit and the power test module respectively.

5. The VCSEL module polarization test apparatus of claim 4, wherein, A power supply module is further included, the power supply module is connected with the main control module, the power supply module includes a driving power supply and a driving board, the driving board is provided with a plurality of test points, and each test point is correspondingly solderable to the VCSEL module to be tested. The driving power supply is in electrical connection with the driving board and is used to provide a power supply signal for the driving board.

6. The VCSEL module polarization test apparatus of claim 5, wherein, The driving power supply includes a multi-channel constant current driving power supply or a nanosecond level narrow pulse driving power supply.

7. The VCSEL module polarization test apparatus of claim 4, wherein, A display module is further included, the display module is connected with the main control module and is used to visualize the rotation angle, the laser power and the aging test result.

8. The VCSEL module polarization test apparatus of claim 4, wherein, A test parameter setting module is further included, the test parameter setting module is connected with the main control module and is configured to provide test parameter settings. The test parameters include at least one of the peak current, the driving pulse width, the modulation frequency and the rotation angle.

9. The VCSEL module polarization test apparatus of claim 4, wherein, An interaction module is further included. The interaction module is connected with the main control module and is configured to establish a communication connection with an external device to send the laser power to the external device.

10. A test system, characterized by The displacement module and the VCSEL module polarization test device according to any one of claims 1 to 9 are included. The displacement module is configured to adjust the relative position between the polarizer in the polarization adjustment module of the VCSEL module polarization test device and the VCSEL module to be tested.

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