Battery piece test board
By using a combination of conductive metal wires and telescopic components, the problems of shading and damage in the testing of 0BB cells were solved, achieving higher testing accuracy and stability.
Patent Information
- Application Number
- CN202422459124.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-10-11
- Publication Date
- 2025-10-21
- Estimated Expiration
- 2034-10-11
AI Technical Summary
In the production process of photovoltaic crystalline silicon solar cells, the performance testing of OBB cells is difficult to perform accurately. Traditional probe arrays can cause shading and cell damage, affecting the accuracy and stability of test results.
Conductive metal wires are used instead of traditional probe arrays, and telescopic components are installed at the end of the metal wire fixing mechanism to ensure that the metal wires are in perpendicular contact with the fine grid of the battery cell, and a stable connection is achieved through the metal wire fixing device.
It improves the accuracy of cell testing, reduces the shading area and interference with test results, lowers the risk of cell damage, and improves product yield.
Smart Images

Figure CN223461610U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The present application relates to the field of battery testing, in particular to a battery piece test board. BACKGROUND
[0002] With the development of science and technology, the use of energy is getting more and more attention. The role of photovoltaic power generation technology in life is also becoming more and more prominent. Photovoltaic power generation technology can convert light energy into electrical energy, making full use of the energy in nature.
[0003] With the development of battery piece process, the cost reduction and efficiency improvement is always the main development line. With the development of photovoltaic grid line process, the N-type battery penetration rate is improved, and the 0BB (0 busbar, no main grid) cost reduction process is gradually penetrated. Compared with the conventional SMBB, 0BB can reduce about 30% silver paste in the battery link. 0BB technology cancels the traditional thick main grid line design and the thinning of the auxiliary grid, reduces the shading area, increases the light absorption, and finally improves the overall power of photovoltaic.
[0004] In the production process of photovoltaic solar silicon battery pieces, testing the efficiency and yield of finished battery pieces after screen printing is an essential link. With the development of photovoltaic grid line process, the number of test probe rows of IV tester is also increasing. However, with the emergence of 0BB battery pieces, how to detect the performance problems of these 0BB battery pieces has emerged. In this process, a scheme of using copper or silver row instead of traditional probe row has emerged. However, 0BB battery pieces cancel the main grid, therefore, in the process of testing the electrical performance of battery pieces, the number of probe rows must be increased to ensure the accuracy and stability of the test. However, the probe row causes a certain shading to the surface of the battery piece during the test, resulting in that part of the EL defective battery pieces cannot be identified, leading to the emergence of defective products in the battery. And because copper or silver row replaces the traditional probe row and the number is increased, it is easy to cause the battery piece to crack, break, surface scratch and other defects, increasing the risk of battery piece scrap. Practical new type content
[0005] To solve one of the above technical problems, the utility model provides a battery piece test board.
[0006] The utility model embodiment provides a battery piece test board, the battery piece test board includes insulating substrate, conducting metal line and metal line fixing device, at least one group of metal line fixing device is provided in the bottom of insulating substrate, the metal line fixing device includes two metal line fixing mechanisms, and the conducting metal line is installed between two metal line fixing mechanisms, each metal line fixing mechanism is provided with telescopic piece between insulating substrate, be provided with test pad on insulating substrate.
[0007] Preferably, the metal wire fixing mechanism comprises a fixing column and a fixing head, one end of the fixing column is fixedly connected with the insulating substrate through the telescopic piece, the other end of the fixing column is connected with the top surface of the fixing head, the bottom surface of the fixing head is provided with a first clamping groove, and the conductive metal wire is embedded in the first clamping groove and fixed on the fixing head.
[0008] Preferably, the depth of the first clamping groove is consistent with the diameter of the conductive metal wire.
[0009] Preferably, the side surface of the fixing head or the side surface of the fixing column is provided with a second clamping groove, the conductive metal wire enters the second clamping groove after passing through the first clamping groove and is fixed on the fixing head or the fixing column.
[0010] Preferably, the bottom of the insulating substrate is provided with a needle sleeve opening downward, the telescopic piece is located inside the needle sleeve, and the metal wire fixing mechanism is inserted into the needle sleeve and fixedly connected with the telescopic piece.
[0011] Preferably, when the telescopic piece is in the maximum compressed state, a gap is left between the top surface of the fixing head and the bottom surface of the needle sleeve.
[0012] Preferably, the test pad is connected with a current test lead or a voltage test lead.
[0013] Preferably, a plurality of transition fixing mechanisms are further arranged between the two metal wire fixing mechanisms of the metal wire fixing device, and the conductive metal wire is sequentially fixed on the metal wire fixing mechanism on the other side from the metal wire fixing mechanism on one side through the plurality of transition fixing mechanisms.
[0014] The transition fixing mechanism comprises a fixing column and a fixing head, one end of the fixing column is fixedly connected with the insulating substrate through the telescopic piece, the other end of the fixing column is connected with the top surface of the fixing head, and the bottom surface of the fixing head is provided with a first clamping groove, and the conductive metal wire is embedded in the first clamping groove.
[0015] Preferably, the telescopic piece is a spring.
[0016] Preferably, the surfaces of the conductive metal wire and the metal wire fixing mechanism are gold-plated.
[0017] The battery piece test board provided by the utility model has the beneficial effects that: the battery piece test board provided by the utility model adopts the conductive metal wire to replace the traditional probe row with a large number of probes, when the battery piece is tested, the conductive metal wire can be perpendicular to the fine grid of the battery piece, so that the EL imaging does not appear the phenomenon of light and shade, and the accuracy of the test result is improved. Moreover, the light shielding area of the conductive metal wire is also smaller than that of the traditional probe row, and the interference on the test result is also smaller. Meanwhile, the telescopic piece is arranged at the tail end of the metal wire fixing mechanism, so that the conductive metal wire can contact the fine grid of the battery piece during the pressing process of the battery piece test board, and the accuracy of the test result is further ensured. BRIEF DESCRIPTION OF DRAWINGS
[0018] The drawings described herein are used to provide further understanding of the present application, and form a part of the present application. The illustrative embodiments of the present application and their descriptions are used to explain the present application, and do not constitute improper limitations on the present application. In the drawings:
[0019] Figure 1 The structure schematic view of the battery piece test board described in the utility model embodiment 1;
[0020] Figure 2 The structure schematic view of the metal wire fixing mechanism of the battery piece test board described in the utility model embodiment 1;
[0021] Figure 3 The structure schematic view of the battery piece test board described in the utility model embodiment 2;
[0022] Figure 4 The metal wire fixing device position schematic view of the battery piece test board described in the utility model embodiment 2;
[0023] Figure 5 The structure schematic view of the needle sleeve, the telescopic piece and the metal wire fixing mechanism integrally formed with the insulating substrate described in the utility model embodiment 2;
[0024] Figure 6 The structure schematic view of the needle sleeve integrally formed with the insulating substrate described in the utility model embodiment 2;
[0025] Figure 7 The another structure schematic view of the battery piece test board described in the utility model embodiment 3.
[0026] Reference signs:
[0027] 1, insulating substrate, 2, first conductive metal wire, 3, second conductive metal wire, 4, metal wire fixing mechanism, 5, second clamping groove, 6, first clamping groove, 7, test pad, 8, fixed head, 9, fixed column, 10, telescopic piece, 11, needle sleeve, 12, transition fixing mechanism, 13, conductive metal wire. DETAILED DESCRIPTION
[0028] In order to make the technical solutions and advantages of the embodiments of the present application more clearly understood, the exemplary embodiments of the present application are further described in detail below with reference to the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present application, and are not an exhaustive list of all the embodiments. It should be noted that the embodiments and features in the embodiments of the present application can be combined with each other unless they conflict.
[0029] Example 1
[0030] like Figure 1 As shown, this embodiment provides a cell test board, which includes an insulating substrate 1, conductive metal wires 13, and a metal wire fixture. The metal wire fixture is located at the bottom of the insulating substrate 1 and is used to mount the conductive metal wires 13. Test pads 7 are provided at the bottom of the insulating substrate 1 to which current or voltage test leads can be connected for current or voltage testing of the cell.
[0031] Specifically, a metal wire fixture is provided at the bottom of the insulating substrate 1, which can be arranged parallel to the length of the insulating substrate 1. The metal wire fixture is used to mount the conductive metal wire 13. The metal wire fixture includes two metal wire fixtures 4. The two metal wire fixtures 4 are separated by a certain distance. The distance between the two metal wire fixtures 4 can be determined based on the size of the battery cell to be tested or other actual testing environment, and is not specifically limited in this embodiment.
[0032] A telescopic member 10 is provided between each metal wire fixing mechanism 4 and the insulating substrate 1. When an external force acts on the insulating substrate 1 or the metal wire fixing mechanism 4, the telescopic member 10 can extend or compress, thereby changing the distance between the insulating substrate 1 and the metal wire fixing mechanism 4. Thus, when using the cell test board of this embodiment to perform cell testing, the distance between the different metal fixing mechanisms and the insulating substrate 1 can be adjusted during the downward pressure process based on the surface flatness of the cell, ensuring that each conductive metal wire can contact the cell's fine grid, thereby improving the accuracy of the test results.
[0033] The cell test board proposed in this embodiment uses conductive metal wires to replace the traditional large number of probe rows. When performing cell testing, the conductive metal wires can be perpendicular to the fine grid of the cell, so that the EL imaging will not have the phenomenon of alternating light and dark, thereby improving the accuracy of the test results. Moreover, the light-blocking area of the conductive metal wires is smaller than that of the traditional probe rows, and the interference with the test results is also smaller. At the same time, a telescopic part 10 is provided at the end of the metal wire fixing mechanism 4, which can ensure that each conductive metal wire can contact the fine grid of the cell during the downward pressing process of the cell test board, further ensuring the accuracy of the test results.
[0034] In some alternative embodiments, the metal wire fixing mechanism 4 comprises a fixing column 9 and a fixing head 8, as shown in the figure. One end of the fixing column 9 is fixedly connected with the insulating substrate 1 through a telescopic piece 10. The other end of the fixing column 9 is connected with the top surface of the fixing head 8. Figure 2
[0035] Specifically, the fixing column 9 and the fixing head 8 can both adopt a cylindrical structure. The fixing column 9 is longer, and the fixing head 8 is shorter. The top of the fixing column 9 is fixedly connected with the insulating substrate 1 through the telescopic piece 10. The bottom of the fixing column 9 is fixedly connected with the top of the fixing head 8. The bottom surface of the fixing head 8 is provided with a first clamping groove 6. The conductive metal wire 13 is embedded in the first clamping groove 6 and fixed on the fixing head 8. The conductive metal wire 13 can be fixed on the fixing head 8 in a winding manner, i.e. after the conductive metal wire 13 is embedded in the first clamping groove 6, it can be bent upwards and wound on the fixing head 8, so as to realize the fixation of the metal wire fixing mechanism 4 on the conductive metal wire 13. The depth of the first clamping groove 6 is consistent with the diameter of the conductive metal wire 13, so as to ensure that the first clamping groove 6 can accommodate the conductive metal wire 13 and also can be in contact with the battery piece to be tested.
[0036] In some alternative embodiments, the side surface of the fixing head 8 or the side surface of the fixing column 9 is provided with a second clamping groove 5. After passing through the first clamping groove 6, the conductive metal wire 13 can be bent to the second clamping groove 5, so that the conductive metal wire 13 can enter the second clamping groove 5 and be fixed on the fixing head 8 or the fixing column 9 in a winding manner.
[0037] In some alternative embodiments, the bottom of the insulating substrate 1 is provided with a needle sleeve 11 opening downward. The telescopic piece 10 is located inside the needle sleeve 11. The metal wire fixing mechanism 4 is inserted into the needle sleeve 11 and fixedly connected with the telescopic piece 10.
[0038] Specifically, the needle sleeve 11 provided at the bottom of the insulating substrate 1 can play a limiting role on the telescopic piece 10, i.e. when the telescopic piece 10 is elongated or compressed under the action of external force, since the needle sleeve 11 is located on the outer peripheral surface of the telescopic piece 10, the telescopic piece 10 can only be elongated or compressed along the length direction of the needle sleeve 11, and will not deviate or bend.
[0039] In some alternative embodiments, when the telescopic piece 10 is in the maximum compressed state, there is a gap between the top surface of the fixing head 8 and the bottom surface of the needle sleeve 11. That is, when the telescopic piece 10 is compressed to the maximum stroke, or in other words, when the metal wire fixing mechanism 4 is closest to the insulating substrate 1, the fixing head 8 and the needle sleeve 11 will not be in contact, so as to ensure the accuracy of the test.
[0040] In some alternative embodiments, the telescopic piece 10 can adopt a spring. The spring constant and length and other parameters can be determined according to the actual test environment, and the present embodiment does not have special limitations.
[0041] Example 2
[0042] like Figure 2 As shown, this embodiment provides another cell test board based on Example 1. The cell test board includes an insulating substrate 1, a first conductive metal wire 2, a second conductive metal wire 3, and a metal wire fixture. The metal wire fixture is located at the bottom of the insulating substrate 1 and is used to mount the first conductive metal wire 2 and the second conductive metal wire 3. Test pads 7 are provided at the bottom of the insulating substrate 1 to which current or voltage test wires can be connected for current or voltage testing of the cell.
[0043] Specifically, in this embodiment, Figure 3 and Figure 4 As shown, two sets of metal wire fixtures are provided at the bottom of the insulating substrate 1, arranged parallel to the length of the insulating substrate 1. These metal wire fixtures are used to attach a first conductive metal wire 2 and a second conductive metal wire 3. Each set of metal wire fixtures includes two metal wire fixtures 4. The two metal wire fixtures 4 are spaced a certain distance apart and have identical structures. The distance between the two metal wire fixtures 4 can be determined based on the size of the battery cell to be tested or other practical testing conditions, and this embodiment does not impose any specific limitations.
[0044] One of the two sets of metal wire fixing devices is used to install the first conductive metal wire 2, and the other set is used to install the second conductive metal wire 3. Specifically, the first conductive metal wire 2 is installed between the two metal wire fixing mechanisms 4 of one set of metal wire fixing devices, and the second conductive metal wire 3 is installed between the two metal wire fixing mechanisms 4 of the other set of metal wire fixing devices. After being installed, the first conductive metal wire 2 and the second conductive metal wire 3 do not contact each other, that is, there is a certain gap between the first conductive metal wire 2 and the second conductive metal wire 3.
[0045] In some optional embodiments, the needle sleeve 11, the telescopic member 10 and the metal wire fixing mechanism 4 can be formed as a whole with the insulating substrate 1, such as Figure 5 As shown, the needle sleeve 11 and the insulating substrate 1 can also be integrally formed separately, and the telescopic member 10 and the metal wire fixing mechanism 4 can be separately formed and then assembled together, as shown in FIG. Figure 6 As shown, this embodiment does not impose any special restrictions.
[0046] In some optional embodiments, there are two test pads 7 on the bottom of the insulating substrate 1, one of which is connected to a current test wire for current testing, and the other is connected to a voltage test wire for voltage testing. In this way, during the cell testing process, the voltage and current can be collected separately, resulting in more accurate test results.
[0047] In some optional embodiments, the first conductive metal wire 2, the second conductive metal wire 3 and the metal wire fixing mechanism 4 are plated with gold. The diameter of the first conductive metal wire 2 and the second conductive metal wire 3 can be designed according to the actual test environment, and the present embodiment does not make special limitations.
[0048] Embodiment 3
[0049] As shown in Figure 7 Fig. 3, another battery piece test board is provided based on the embodiments 1 or 2. According to the size of the battery piece to be tested or other test environment parameters, a plurality of transition fixing mechanisms 12 can be additionally provided between the two metal wire fixing mechanisms 4 of the metal wire fixing device. The first conductive metal wire or the second conductive metal wire is sequentially fixed on the metal wire fixing mechanism on the other side from the metal wire fixing mechanism on one side through the plurality of transition fixing mechanisms.
[0050] The basic structure of the transition fixing mechanism 12 is basically the same as that of the metal wire fixing mechanism 4. The transition fixing mechanism includes a fixing column and a fixing head. One end of the fixing column is fixedly connected with the insulating base plate through an expansion piece. The other end of the fixing column is connected with the top surface of the fixing head. The bottom surface of the fixing head is provided with a first clamping groove. The first conductive metal wire or the second conductive metal wire is embedded in the first clamping groove. In addition, since the transition fixing mechanism 12 does not need to bear the fixing function of the metal wire, the difference between the transition fixing mechanism 12 and the metal wire fixing mechanism 4 is that the second clamping groove does not need to be provided on the fixing head or the fixing column, and only the metal wire needs to be placed in the first clamping groove of the transition fixing mechanism 12. At the same time, it is necessary to ensure that the metal wire fixing mechanism 4 and the transition fixing mechanism 12 are on the same straight line.
[0051] Obviously, those skilled in the art can make various modifications and variations to the present application without departing from the spirit and scope of the present application. Thus, if these modifications and variations of the present application fall within the scope of the claims of the present application and their equivalent technologies, the present application also intends to include these modifications and variations.
Claims
1. A battery cell test plate, characterized by, The battery piece test board comprises an insulating substrate, a conductive metal wire and a metal wire fixing device, the bottom of the insulating substrate is provided with at least one set of metal wire fixing devices, each metal wire fixing device comprises two metal wire fixing mechanisms, and a conductive metal wire is arranged between the two metal wire fixing mechanisms; each metal wire fixing mechanism is provided with an elastic member between the insulating substrate and the metal wire fixing mechanism; and a test pad is arranged on the insulating substrate.
2. The battery cell test plate of claim 1, wherein, The metal wire fixing mechanism comprises a fixing column and a fixing head, one end of the fixing column is fixedly connected with the insulating substrate through the elastic member, the other end of the fixing column is connected with the top surface of the fixing head, the bottom surface of the fixing head is provided with a first clamping groove, and the conductive metal wire is embedded in the first clamping groove and fixed on the fixing head.
3. The battery cell test plate of claim 2, wherein, The depth of the first clamping groove is consistent with the diameter of the conductive metal wire.
4. The battery cell test plate of claim 2, wherein, A second clamping groove is arranged on the side surface of the fixing head or the side surface of the fixing column, and the conductive metal wire enters the second clamping groove after passing through the first clamping groove and is fixed on the fixing head or the fixing column.
5. The battery cell test plate of claim 2, wherein, The bottom of the insulating substrate is provided with a needle sleeve opening downward, the elastic member is arranged in the needle sleeve, and the metal wire fixing mechanism is inserted into the needle sleeve and fixedly connected with the elastic member.
6. The battery cell test plate of claim 5, wherein, When the elastic member is in the maximum compressed state, a gap is left between the top surface of the fixing head and the bottom surface of the needle sleeve.
7. The battery cell test plate of claim 1, wherein, The test pad is connected with a current test lead or a voltage test lead.
8. The battery cell test plate of claim 1, wherein, A plurality of transition fixing mechanisms are arranged between the two metal wire fixing mechanisms of the metal wire fixing device, and the conductive metal wire is sequentially fixed on the metal wire fixing mechanism on the other side through the plurality of transition fixing mechanisms from the metal wire fixing mechanism on one side. The transition fixing mechanism comprises a fixing column and a fixing head, one end of the fixing column is fixedly connected with the insulating substrate through the elastic member, the other end of the fixing column is connected with the top surface of the fixing head, the bottom surface of the fixing head is provided with a first clamping groove, and the conductive metal wire is embedded in the first clamping groove.
9. The battery cell test plate of claim 1, wherein, The surface of the conductive metal wire and the metal wire fixing mechanism is gold-plated.
10. The battery cell test plate of claim 1, wherein, The elastic member is a spring.