Test signal chip structure convenient to replace

Abstract

The utility model discloses a test signal chip structure convenient to replace, which relates to the technical field of electronic test equipment and comprises a test equipment main body and an embedded groove, the embedded groove is arranged in the test equipment main body, and a fixing piece is fixed on the inner side of the embedded groove. According to the test signal chip structure convenient to replace, the clamping hooks at the bottom corners of the signal chip module are embedded into the embedding grooves formed in the test equipment main body, when the outer surfaces of the clamping hooks make contact with the clamping blocks arranged in the embedding grooves, the clamping blocks rotate along the fixing pieces along with the deepening of the clamping hooks, then the clamping blocks and the grooves in the clamping hooks form clamping connection, and the clamping blocks are clamped into the grooves in the clamping hooks. When the signal chip module needs to be disassembled and replaced, the inclined surface of the clamping block is manually abutted downwards, so that the clamping block rotates downwards, the clamping connection between the clamping block and the clamping hook is removed, the disassembly of the signal chip module is realized, a worker can quickly replace the signal chip module, the operation time is shortened, and the working efficiency is improved. And the test continuity is improved.

Description

TECHNICAL FIELD

[0001] The utility model relates to electronic testing equipment technical field, concretely is a test signal chip structure of convenient replacement. BACKGROUND

[0002] Signal chip is the key integrated circuit in electronic system, is used to handle analog and digital signal, signal chip has the processing capacity such as receiving, conversion, amplification, filtering to analog signal, digital signal, is the bridge connecting physical world and digital world, is widely used in various electronic systems, such as wireless communication, audio processing, real-time positioning system etc., becomes one of the core of modern electronic technology, for example, low-power bluetooth signal transmitting chip AK1595A, is applicable to the direction detection of indoor, can effectively reduce bluetooth tag cost.

[0003] But the existing signal chip still has certain problems in the testing process:

[0004] In the existing test system, signal chip is often installed in the test equipment through complex fixing mode, not only inconvenient to replace, but also when facing different test requirements, a large amount of time and resources are needed to disassemble and replace the chip, in addition, the existing signal chip is easy to damage the chip or connecting interface in the replacement process, which affects the continuity and accuracy of the test;

[0005] Therefore, we propose a test signal chip structure convenient to replace to solve the problems proposed in the above. UTILITY MODEL CONTENTS

[0006] The utility model aims at providing a test signal chip structure convenient to replace to solve the problems proposed in the above background art that signal chip is often installed in the test equipment through complex fixing mode, not only inconvenient to replace, but also when facing different test requirements, a large amount of time and resources are needed to disassemble and replace the chip, in addition, the existing signal chip is easy to damage the chip or connecting interface in the replacement process, which affects the continuity and accuracy of the test.

[0007] To achieve the above object, the utility model provides the following technical scheme: a test signal chip structure convenient to replace, including test equipment main part and embedding slot:

[0008] The embedding slot is fixed with fixed part in the inside of test equipment main part, the middle part of fixed part is fixed with first spring;

[0009] The middle part of fixed part is rotatably connected with clamping block, and the vertical section of clamping block is triangular structure, and clamping block is fixedly connected with first spring;

[0010] The upper portion of the test equipment body is provided with a signal chip module, the bottom corner of the signal chip module is fixed with a hook, the clamping block is in clamping connection with the hook, and four groups of clamping blocks and hooks are arranged along the four corners of the test equipment body and the signal chip module.

[0011] The signal chip module and the test equipment body are connected through the hook and the clamping block, so that the installation and disassembly of the two are realized, the complexity of the operation is reduced, and the damage to the chip is reduced.

[0012] Preferably, a sliding groove is formed in one side of the test equipment body, a second spring is fixed to the inner side of the sliding groove, one end of the second spring is fixed with a push plate, and one side of the push plate is fixed with a clamping plate.

[0013] The second spring is used as the connection of the push plate, so that the push plate can be elastically reset after being pressed, so that the installation is fast and convenient.

[0014] Preferably, a clamping groove is formed in one side of the sliding groove, a protective shell is arranged above the signal chip module, an embedded block is fixed to the bottom corner of the protective shell, a limiting groove is formed in the middle of the embedded block, and the clamping plate is in clamping connection with the limiting groove.

[0015] The embedded block at the bottom of the protective shell is embedded in the middle of the limiting groove, and the clamping plate and the limiting groove are clamped and fixed to realize the fixed connection of the protective shell and the test equipment body.

[0016] Preferably, a connecting piece is fixed to the upper end surface of the test equipment body, and a connecting groove is formed in the four corners of the protective shell, and the connecting piece is in clamping connection with the connecting groove.

[0017] The above technical scheme adds a protective shell to the signal chip module, the protective shell is used to protect the chip from physical damage and electrostatic interference, and the stability of signal testing is improved.

[0018] Preferably, a plurality of pins are arranged at the two ends of the signal chip module, a state indicating lamp is fixed to the upper end of the signal chip module, and interfaces are arranged at the two ends of the protective shell and correspond to the pins one by one.

[0019] The above technical scheme adopts a unified standard interface design between the signal chip module and the test equipment, ensures the standardization and high speed of physical connection and data transmission between the chip module and the test equipment, and installs a state indicating lamp to indicate the working state, connection state and fault warning of the module, so that the user can quickly locate the problem.

[0020] Preferably, a plurality of heat dissipation grooves are uniformly formed in the two sides of the protective shell, and the heat dissipation grooves are designed in a strip shape.

[0021] By means of the above technical scheme, the plurality of heat dissipation grooves are arranged on the protective shell, the heat dissipation grooves are used for coping with the signal chip with large power, and good heat dissipation effect is provided for the signal chip, so that the stability of the signal chip is increased.

[0022] Compared with the prior art, the utility model has the advantages of:

[0023] 1. The clamping hook of the signal chip module bottom corner is embedded into the embedded groove arranged in the test equipment main body, when the outer surface of the clamping hook contacts the clamping block arranged in the embedded groove, the clamping block rotates along the fixing member with the embedding of the clamping hook, then the clamping block and the groove on the clamping hook form clamping connection, when it is needed to disassemble and replace the signal chip module, the clamping block is downwardly rotated by manually abutting the inclined surface of the clamping block, so that the clamping connection between the clamping block and the clamping hook is released, and then the disassembly of the signal chip module is realized, so that the staff can quickly replace the signal chip module, the operation time is shortened, and the test continuity is improved.

[0024] 2. The protective shell is arranged at the outer end of the signal chip module, the protective shell can be used for protecting the chip from physical damage and electrostatic interference, increasing the stability of signal test, and through simple clamping connection, the protective shell can be quickly installed and disassembled, the protection effect is increased, and the equipment stability is improved. BRIEF DESCRIPTION OF DRAWINGS

[0025] Figure 1 It is a front view of the utility model;

[0026] Figure 2 It is a main body disassembly structure schematic view of the utility model;

[0027] Figure 3 It is a signal chip module and test equipment main body cross section connection structure schematic view of the utility model;

[0028] Figure 4 It is a protective shell and test equipment main body connection structure schematic view of the utility model.

[0029] In the drawing: 1, test equipment main body;2, embedded groove;3, fixing member;4, first spring;5, clamping block;6, signal chip module;7, clamping hook;8, pin;9, status indicator lamp;10, connecting piece;11, sliding groove;12, clamping groove;13, second spring;14, push plate;15, clamping plate;16, protective shell;17, embedded block;18, limiting groove;19, connecting groove;20, interface;21, heat dissipation groove. DETAILED DESCRIPTION

[0030] The technical solutions in the embodiments of the utility model will be clearly and completely described below with reference to the drawings in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, rather than all the embodiments.

[0031] In order to solve the problem that the signal chip is often installed in the test equipment through a complex fixing mode in the prior art, the following scheme is disclosed, please refer to Figures 1-4 The utility model provides a kind of test signal chip structure of convenient replacement, including test equipment main body 1 and embedding groove 2: embedding groove 2 is opened in the inside of test equipment main body 1, the inside of embedding groove 2 is fixed with fixed part 3, and the middle part of fixed part 3 is fixed with first spring 4;The middle part of fixed part 3 is rotatably connected with clamping block 5, and clamping block 5 is triangular structure in vertical section, and clamping block 5 is fixedly connected with first spring 4;The upper of test equipment main body 1 is provided with signal chip module 6, and the bottom corner of signal chip module 6 is fixed with clamping hook 7, and clamping block 5 is engagedly connected with clamping hook 7, and clamping block 5 and clamping hook 7 are correspondingly provided with four groups along the four corners of test equipment main body 1 and signal chip module 6.Embedding groove 2 is opened in the inside of test equipment main body 1, and when the outer surface of clamping hook 7 contacts the clamping block 5 arranged in the inside of embedding groove 2, clamping block 5 rotates along fixed part 3 with the deepening of clamping hook 7, then, clamping block 5 and the slot on clamping hook 7 form engaged connection, when signal chip module 6 needs to be disassembled and replaced, the inclined surface of clamping block 5 is abutted downward by hand, so that clamping block 5 rotates downward, to release the engaged connection between clamping block 5 and clamping hook 7, and then the disassembly of signal chip module 6 is realized, so that workers can quickly replace signal chip module 6, shorten operation time and improve test continuity.

[0032] The side of test equipment main body 1 is provided with sliding slot 11, the inside of sliding slot 11 is fixed with second spring 13, one end of second spring 13 is fixed with push plate 14, and the side of push plate 14 is fixed with clamping plate 15;The side of sliding slot 11 is provided with clamping groove 12, the upper of signal chip module 6 is provided with protective shell 16, the bottom corner of protective shell 16 is fixed with embedding block 17, the middle part of embedding block 17 is provided with limiting groove 18, and clamping plate 15 is engagedly connected with limiting groove 18;The upper end surface of test equipment main body 1 is fixed with connecting piece 10, the four corners of protective shell 16 are provided with connecting groove 19, and connecting piece 10 is engagedly connected with connecting groove 19.By setting protective shell 16 on the outer end of signal chip module 6, protective shell 16 can be used to protect the chip from physical damage and electrostatic interference, increase the stability of signal test, and through simple engaged connection, protective shell 16 can be quickly installed and disassembled, increase the protection effect and improve the stability of equipment.

[0033] The signal chip module 6 is provided with a plurality of pins 8 at two ends, the upper end of the signal chip module 6 is fixed with a state indicating lamp 9, the protective shell 16 is provided with interfaces 20 at two ends, and the interfaces 20 are arranged in one-to-one correspondence with the pins 8; a plurality of heat dissipation grooves 21 are evenly arranged on the two sides of the protective shell 16, and the heat dissipation grooves 21 are designed in a strip shape. By arranging the state indicating lamp 9, the working state, the connection state and the fault warning of the module are indicated, the user can quickly locate the problem, and the heat dissipation grooves 21 are arranged on the two sides of the protective shell 16, the heat dissipation grooves 21 are used for the signal chip with large power, and good heat dissipation effect is provided for the signal chip, so that the stability of the signal chip is increased.

[0034] Working principle: for the convenient replacement test signal chip structure, firstly, for the connection of the signal chip module 6 and the test equipment main body 1, the clamping hook 7 at the bottom corner of the signal chip module 6 is embedded into the embedded groove 2 arranged in the test equipment main body 1, when the outer surface of the clamping hook 7 contacts the clamping block 5 arranged in the embedded groove 2, the clamping block 5 rotates along the fixing piece 3 with the deepening of the clamping hook 7, then the clamping block 5 and the groove on the clamping hook 7 are connected, when it is necessary to disassemble and replace the signal chip module 6, the inclined surface of the clamping block 5 is manually abutted downward, so that the clamping block 5 rotates downward, so as to release the clamping connection between the clamping block 5 and the clamping hook 7, and then the signal chip module 6 is disassembled, so that the worker can quickly replace the signal chip module 6, shorten the operation time, improve the test continuity, and then for the installation of the protective shell 16, the clamping block 5 and the limiting groove 18 are connected, the protective shell 16 and the test equipment main body 1 are fixed, and a plurality of heat dissipation grooves 21 are arranged in the protective shell 16, so as to cope with the signal chip with large power, and good heat dissipation effect is provided for the signal chip, so as to increase the stability of the signal chip.

[0035] Thus, a series of work is completed, and the contents not described in detail in the specification belong to the prior art known to those skilled in the art.

[0036] Although the utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions recorded in the foregoing embodiments, or make equivalent replacement to part of the technical features, and any modification, equivalent replacement, improvement, etc. within the spirit and principles of the utility model should be included in the protection scope of the utility model.

Claims

1. A convenient replacement test signal chip structure, comprising a test device body (1) and an embedded slot (2), characterized in that: the inside of the test device body (1) is provided with an embedded slot (2), the inner side of the embedded slot (2) is fixed with a fixing part (3), and the middle part of the fixing part (3) is fixed with a first spring (4); the middle part of the fixing part (3) is rotatably connected with a clamping block (5), the clamping block (5) is triangular in vertical section, and the clamping block (5) is fixedly connected with the first spring (4); the upper side of the test device body (1) is provided with a signal chip module (6), the bottom corner of the signal chip module (6) is fixed with a clamping hook (7), the clamping block (5) and the clamping hook (7) are clamped and connected, and the clamping block (5) and the clamping hook (7) are provided with four groups of corresponding clamping blocks along the four corners of the test device body (1) and the signal chip module (6).

2. A test chip structure for easy replacement according to claim 1, characterized in that: One side of the test device body (1) is provided with a sliding slot (11), the inner side of the sliding slot (11) is fixed with a second spring (13), one end of the second spring (13) is fixed with a push plate (14), and one side of the push plate (14) is fixed with a clamping plate (15).

3. A test chip structure for easy replacement according to claim 2, characterized in that: One side of the sliding slot (11) is provided with a clamping groove (12), the upper side of the signal chip module (6) is provided with a protective shell (16), the bottom corner of the protective shell (16) is fixed with an embedded block (17), the middle part of the embedded block (17) is provided with a limiting slot (18), and the clamping plate (15) and the limiting slot (18) are clamped and connected.

4. A test chip structure for easy replacement according to claim 3, characterized in that: The upper end surface of the test device body (1) is fixed with a connecting part (10), the four corners of the protective shell (16) are provided with a connecting groove (19), and the connecting part (10) and the connecting groove (19) are clamped and connected.

5. The easily replaceable test signal chip structure of claim 3, wherein: The two ends of the signal chip module (6) are provided with a plurality of pins (8), the upper end of the signal chip module (6) is fixed with a state indicating lamp (9), the two ends of the protective shell (16) are provided with an interface (20), and the interface (20) and the pin (8) are one-to-one corresponding.

6. The easily replaceable test signal chip structure of claim 3, wherein: The two sides of the protective shell (16) are uniformly provided with a plurality of heat dissipation grooves (21), and the heat dissipation grooves (21) are designed in strip shape.

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