Dielectric temperature spectrum double-station synchronous measurement control system

Abstract

The utility model discloses a dielectric temperature spectrum double-station synchronous measurement control system. Comprising a cabinet, an electric control box arranged at the bottom of the cabinet, a first high-temperature furnace and a second high-temperature furnace which are arranged in the cabinet and oppositely located on the electric control box left and right, and a first clamping jig and a second clamping jig which are arranged in the cabinet and located on the first high-temperature furnace and the second high-temperature furnace respectively. The first high-temperature furnace and the second high-temperature furnace are both provided with a plurality of sample placing stations, a double-station multi-channel control panel is arranged in the electric cabinet, and the double-station multi-channel control panel is provided with a first measuring station interface and a second measuring station interface corresponding to the left and right sides of the first high-temperature furnace and the second high-temperature furnace; the first measuring station interface and the second measuring station interface are respectively provided with a plurality of measuring channel interfaces to correspond to a plurality of sample placing stations of the first high temperature furnace and the second high temperature furnace. The device has the characteristics of high test efficiency, strong anti-electromagnetic interference capability, stable frequency signal test and the like, and is convenient and fast to operate.

Description

TECHNICAL FIELD

[0001] The utility model relates to dielectric temperature spectrum measurement field, concretely relates to a dielectric temperature spectrum double position synchronous measurement control system. BACKGROUND

[0002] The dielectric temperature spectrum test system is an instrument system for studying the dielectric properties and thermal properties of materials at different frequencies. This test system has wide applications in the fields of electronic materials, polymer materials, ceramic materials, etc. In the field of material science and engineering, understanding the dielectric properties of materials is crucial for designing and manufacturing new materials and electronic devices. It can help researchers develop new materials, improve the performance of existing materials, and play an important role in the fields of electronic devices, sensors, energy storage devices, etc. The dielectric temperature spectrum test system combines dielectric testing and thermal analysis techniques, allowing comprehensive performance testing of materials over a wide range of temperatures and frequencies. Through dielectric temperature spectrum testing, researchers can gain a deeper understanding of the electrical and thermal properties of materials, providing important reference data for material design and application.

[0003] Current dielectric temperature spectrum test instruments generally can realize single-channel or multi-channel measurement, but need to wait until the furnace temperature drops to room temperature before measuring the next batch, so the measurement efficiency is low and far from meeting the needs of industrial testing. UTILITY MODEL CONTENT

[0004] The utility model aims at overcoming the defects of prior art, and provides a dielectric temperature spectrum double position synchronous measurement control system, which has high test efficiency, strong anti-electromagnetic interference ability, stable frequency signal test, etc., and is convenient and fast to operate, suitable for laboratories and industrial production.

[0005] The technical scheme of the utility model is as follows:

[0006] A dielectric temperature spectrum double position synchronous measurement control system, comprising a cabinet, an electric control box arranged at the bottom of the cabinet, a first high-temperature furnace and a second high-temperature furnace arranged in the cabinet and opposite to each other on the electric control box, a first clamping jig and a second clamping jig arranged in the cabinet and located above the first high-temperature furnace and the second high-temperature furnace respectively, the first high-temperature furnace and the second high-temperature furnace are each provided with a plurality of sample placement stations, and a plurality of samples can be placed synchronously, the first clamping jig and the second clamping jig are used for clamping the samples placed in the first high-temperature furnace and the second high-temperature furnace respectively, a double position multi-channel control board is arranged in the electric control box, the double position multi-channel control board is provided with a first measurement station interface and a second measurement station interface corresponding to the sample placement stations of the first high-temperature furnace and the second high-temperature furnace, and the first measurement station interface and the second measurement station interface are each provided with a plurality of measurement channel interfaces corresponding to the plurality of sample placement stations of the first high-temperature furnace and the second high-temperature furnace.

[0007] Further, the first and second clamping jigs are identical in structure, and each comprises a jig box, a first high-temperature ceramic sheet, a second high-temperature ceramic sheet, a support column, a plurality of high-temperature ceramic rods and a plurality of spring probes, the first and second high-temperature ceramic sheets are arranged in front of and behind the rear part of the jig box, the second high-temperature ceramic sheet is connected with the support column and the plurality of high-temperature ceramic rods, the support column is located at the center of the second high-temperature ceramic sheet and penetrates through the center of the first high-temperature ceramic sheet from the front part of the jig box, the plurality of high-temperature ceramic rods are uniformly distributed around the support column and penetrate through the first high-temperature ceramic sheet, and the plurality of spring probes are movably arranged in the front part of the jig box and connected with the plurality of high-temperature ceramic rods in correspondence, and the high-temperature ceramic rods are driven by pulling the spring probes to clamp the sample.

[0008] Further, the first and second high-temperature ceramic sheets are made of high-temperature-resistant alumina ceramic sheets.

[0009] Further, the support column is made of a full-thread high-temperature-resistant alumina rod.

[0010] Further, the high-temperature ceramic rod is designed with double-wire holes.

[0011] Further, the surface of the high-temperature ceramic rod is plated with silver palladium paste.

[0012] Further, the first and second measurement station interfaces are each provided with six measurement channel interfaces.

[0013] Further, the double-station multi-channel control board is also provided with an LCR interface.

[0014] Compared with the prior art, the utility model has the beneficial effects that:

[0015] (1) The utility model adopts double-station multi-channel synchronous measurement technology, and the highest 12 channels can be measured at the same time, so that the test efficiency of products is greatly improved, and the use cost is reduced.

[0016] (2) The utility model is simple in structure and low in cost, and can reduce a set of impedance analyzer, realize laboratory multi-type material test and industrialized rapid production.

[0017] (3) The utility model adopts high-temperature-resistant tool clamp materials, and can realize high-temperature test of 0-1000 DEG C.

[0018] (4) The utility model can synchronously measure 12 channels, and can also test individually in single-station multi-channel mode, and test tasks can be reasonably arranged. BRIEF DESCRIPTION OF DRAWINGS

[0019] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following will briefly introduce the drawings needed to be used in the embodiments or prior art description. Obviously, the drawings in the following description are only some embodiments of the present application, and for those skilled in the art, other drawings can also be obtained from these drawings without creative labor.

[0020] Figure 1 The structure diagram of the dielectric temperature spectrum double-station synchronous measurement control system provided by the present application is shown in the figure.

[0021] Figure 2 The structure diagram of the first clamping fixture and the second clamping fixture is shown in the figure.

[0022] Figure 3 The structure diagram of the double-station multi-channel control board is shown in the figure. DETAILED DESCRIPTION

[0023] In order to make the purpose, technical solutions and advantages of the present application more clear, the present application will be further described in detail below with the drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application, and are not used to limit the present application.

[0024] In order to illustrate the technical solutions of the present application, the following will be described through specific embodiments.

[0025] EMBODIMENT

[0026] Please refer to Figure 1 The present embodiment provides a dielectric temperature spectrum double-station synchronous measurement control system, which comprises a cabinet 1, an electric control box 2 arranged at the bottom of the cabinet 1, a first high-temperature furnace 3 and a second high-temperature furnace 4 arranged in the cabinet 1 and located on the electric control box 2 oppositely, a first clamping fixture 5 and a second clamping fixture 6 arranged in the cabinet 1 and located on the first high-temperature furnace 3 and the second high-temperature furnace 4 respectively. Among them, the first high-temperature furnace 3 and the second high-temperature furnace 4 are both provided with six sample placing stations, and can synchronously place six samples. The functions of the first high-temperature furnace 3 and the second high-temperature furnace 4 are the same, and the temperature can be accurately controlled to ±0.1℃. When the operation is performed, the corresponding parameters are set in the software, and then the measurement is started by clicking. The first clamping fixture 5 and the second clamping fixture 6 are used for clamping the samples placed in the first high-temperature furnace 3 and the second high-temperature furnace 4 respectively. The structure and function of the first clamping fixture 5 and the second clamping fixture 6 are the same, and the first clamping fixture 5 and the second clamping fixture 6 are combined with the first high-temperature furnace 3 and the second high-temperature furnace 4 to form a dielectric temperature spectrum double-station synchronous measurement control system. Figure 2As shown, all include clamp box 51, first high temperature ceramic sheet 52, second high temperature ceramic sheet 53, support column 54, several high temperature ceramic rods 55 and several spring probes 56, first high temperature ceramic sheet 52 and second high temperature ceramic sheet 53 are arranged in the rear of clamp box 51, second high temperature ceramic sheet 53 is connected with support column 54 and several high temperature ceramic rods 55, support column 54 is located in the center of second high temperature ceramic sheet 53, and it is through the center of first high temperature ceramic sheet 52 and penetrates from the front of clamp box 51 (to ensure concentricity), several high temperature ceramic rods 55 are uniformly distributed around support column 54 and penetrate first high temperature ceramic sheet 52, several spring probes 56 are movably arranged in the front of clamp box 51 and are connected with several high temperature ceramic rods 55 correspondingly, by pulling spring probe 56 to drive high temperature ceramic rod 55 to clamp the sample, different materials and different thickness of the sample can be clamped at the same time, preferably, first high temperature ceramic sheet 52 and second high temperature ceramic sheet 53 are made of high-temperature-resistant alumina ceramic sheet, support column 54 is made of full-thread high-temperature-resistant alumina rod (to reduce deformation under high temperature), high-temperature-resistant ceramic rod 55 is designed with double wire holes, and the surface is plated with silver palladium paste (high-temperature-resistant, and can shield signal interference to stabilize signal transmission); double-station multi-channel control panel 7 is arranged in electric control box 2, combined with Figure 3 As shown, double-station multi-channel control panel 7 is provided with LCR interface 71, and first measurement station interface 72 and second measurement station interface 73 are arranged on the left and right of the sample placing station corresponding to first high temperature furnace 3 and second high temperature furnace 4, first measurement station interface 72 and second measurement station interface 73 are each provided with six measurement channel interfaces to correspond to six sample placing stations of first high temperature furnace 3 and second high temperature furnace 4, therefore, up to 12 channels can be measured at the same time, or single-station single-channel measurement can be selected, the measurement mode is diversified, and various test requirements can be met, through double-station multi-channel control panel 7, any measurement channel interface of first measurement station interface 72 and second measurement station interface 73 can be selected for selective measurement, two high temperature furnaces can be measured at the same time, or a single high temperature furnace can be selected for measurement, after the test is completed, the next station can start measurement immediately after adjusting data, the waiting time caused by furnace cooling is reduced, and the test efficiency is greatly improved.

[0027] The above is only a preferred embodiment of the present application, and is not used to limit the present application, and any modification, equivalent replacement and improvement made within the spirit and principle of the present application shall be included in the protection scope of the present application.

Claims

1. A dielectric spectroscopy dual-site simultaneous measurement control system, characterized by: The utility model relates to a high-temperature furnace, and particularly relates to a double-station multi-channel control board for high-temperature furnace.

2. The dielectric spectroscopy dual-site synchronous measurement control system according to claim 1, characterized in that: The first clamping fixture and the second clamping fixture are identical in structure and each include a fixture box, a first high-temperature ceramic sheet, a second high-temperature ceramic sheet, a support column, a plurality of high-temperature ceramic rods, and a plurality of spring probes.

3. The dielectric spectroscopy dual-site synchronous measurement control system according to claim 2, characterized in that: The first high-temperature ceramic sheet and the second high-temperature ceramic sheet are made of high-temperature resistant aluminum oxide ceramic sheets.

4. The dielectric spectroscopy dual-site synchronous measurement control system of claim 2, wherein: The support column is made of a full-thread high-temperature resistant aluminum oxide rod.

5. The dielectric spectroscopy dual-site synchronous measurement control system according to claim 2, wherein: The high-temperature ceramic rod is designed with double-wire holes.

6. The dielectric thermal spectrum dual-site synchronous measurement control system according to claim 2, characterized in that: The surface of the high-temperature ceramic rod is plated with silver palladium paste.

7. The dielectric spectroscopy dual-site synchronous measurement control system of claim 1, wherein: The first measurement station interface and the second measurement station interface each have six measurement channel interfaces.

8. The dielectric spectroscopy dual-site synchronous measurement control system of claim 1, wherein: The double-station multi-channel control board further has an LCR interface.

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