Probe support, probe assembly and flying probe tester

Abstract

The utility model discloses a probe support of a flying probe testing machine, a probe assembly comprising the probe support, and the flying probe testing machine comprising the probe assembly. The probe support comprises a supporting assembly and a probe installation assembly, a sliding rod is arranged on the supporting assembly, the probe installation assembly is arranged on the sliding rod in a sleeving mode and can slide along the sliding rod, an elastic piece is arranged between the supporting assembly and the probe installation assembly, and the elastic piece enables the probe installation assembly to be kept at a first position. According to the utility model, the probe installation assembly is kept at the first position by using the elastic member between the support assembly and the probe installation assembly. When the probe contacts with the bonding pad and applies pressure to the bonding pad, the counter-acting force of the bonding pad pushes the probe installation assembly to compress the elastic piece, so that the probe installation assembly slides upwards along the sliding rod, excessive pressure is absorbed, the probe generates proper pressure to the bonding pad, and damage to the bonding pad is reduced.

Description

Technical Field

[0001] This utility model relates to the field of circuit board testing technology, specifically to a probe holder, a probe assembly including the probe holder, and a flying probe tester including the probe assembly. Background Art

[0002] When testing pads on printed circuit boards using flying probe testing equipment, the probe typically descends and rises at a rate of 10-50 times per second to contact different test points. To achieve reliable testing results, the probe must firmly adhere to the pad, but the contact force between the probe and the pad must not be excessive to avoid scratching the pad surface. As the surface treatment of soft gold plating on circuit boards becomes increasingly common, and with increasing integration, pad sizes are becoming smaller and denser, the requirements for probe marks on the pad surface are becoming increasingly stringent, demanding that no marks be visible under a 50x microscope. To address this issue, Chinese utility model patent document CN210982522U describes a probe holder. By setting the holder as a quadrilateral frame structure with grooves at the joints, the rigidity of the probe holder is reduced, allowing the crossbeam to deform more easily, thereby avoiding hard contact between the probe and the pad during testing and reducing damage to the pad surface.

[0003] In practical applications, the above solution does indeed reduce probe damage to the pads by causing the crossbeam to deform under the reaction force of the pads after the probe contacts the pad. However, this deformation of the crossbeam causes horizontal displacement of the probe tip. Furthermore, the greater the pressure applied by the probe to the pad, the greater the reaction force, the greater the crossbeam deformation, and the greater the probe tip displacement. In severe cases, this can cause the probe to detach from the pad, leading to detection failure. Therefore, extremely precise control of the pressure applied by the probe to the pad is necessary, which is very difficult. Utility Model Content

[0004] The technical problem to be solved by this utility model is to provide a probe holder for a flying probe tester, a probe assembly including the probe holder, and a flying probe tester including the probe assembly. The probe holder can reduce the damage to the pad surface caused by the probe and will not be displaced in the horizontal direction, so as to ensure the reliability of the test.

[0005] To solve the above-mentioned technical problems, this utility model provides a probe holder, including a support component and a probe mounting component. The support component is provided with a slide rod, and the probe mounting component is sleeved on the slide rod and can slide along the slide rod. An elastic element is provided between the support component and the probe mounting component, and the elastic element keeps the probe mounting component in a first position.

[0006] Furthermore, the support assembly includes an upper crossbeam and a lower crossbeam, with one end of the upper crossbeam and the lower crossbeam connected by a connecting plate and the other end connected by the slide rod.

[0007] Furthermore, a reinforcing plate is connected between the middle of the upper and lower crossbeams.

[0008] Furthermore, the probe mounting assembly includes a probe mounting part, which extends to one side with an upper sliding plate and a lower sliding plate. The upper sliding plate and the lower sliding plate are respectively provided with through holes, and the probe mounting assembly is sleeved on the slide rod through the through holes on the upper sliding plate and the lower sliding plate.

[0009] Furthermore, there are two elastic elements, respectively disposed between the upper crossbeam and the upper sliding plate and between the lower crossbeam and the lower sliding plate.

[0010] Furthermore, the elastic element is a spring or a sheet spring.

[0011] Furthermore, the slide bar is also provided with two positioning members, and the upper slide plate and the lower slide plate are respectively located above the two positioning members and abut against the two positioning members under the action of the elastic member.

[0012] Furthermore, the cross-section of the slide bar is non-circular, and the shape of the through holes on the upper slide plate and the lower slide plate matches the cross-sectional shape of the slide bar.

[0013] This invention also provides a probe assembly comprising the aforementioned probe holder, wherein a test probe is mounted on the probe mounting assembly of the probe holder.

[0014] This invention also provides a flying probe testing machine, which includes the above-mentioned probe assembly.

[0015] This invention relates to a probe holder that utilizes a sliding rod on a support assembly. The probe mounting assembly is fitted onto the sliding rod and can slide along it. An elastic element between the support assembly and the probe mounting assembly holds the probe mounting assembly in a first position. During operation, when the probe contacts and applies pressure to the pad, the reaction force from the pad pushes the probe mounting assembly to compress the elastic element, causing the probe mounting assembly to slide upwards along the sliding rod. This absorbs excessive pressure, ensuring the probe exerts appropriate pressure on the pad and reducing damage. Attached Figure Description

[0016] Figure 1 This is a schematic diagram of the structure of the first embodiment of the probe assembly of this utility model.

[0017] Figure 2 yes Figure 1 Cross-sectional view AA in the illustrated embodiment.

[0018] Figure 3 This is a schematic diagram of the second embodiment of the probe assembly of this utility model.

[0019] In the diagram: 1. Support assembly; 2. Probe mounting assembly; 3. Test probe; 4. Slide rod; 5. Spring; 6. Positioning component; 7. Spring piece; 11. Upper crossbeam; 12. Lower crossbeam; 13. Connecting plate; 14. Reinforcing plate; 21. Probe mounting part; 22. Upper sliding plate; 23. Lower sliding plate. Detailed Implementation

[0020] The present invention will be further described below with reference to the accompanying drawings and specific embodiments, so that those skilled in the art can better understand and implement the present invention. However, the embodiments are not intended to limit the present invention.

[0021] like Figure 1-2 As shown, in one embodiment of the probe assembly provided by this utility model, the probe assembly includes a probe bracket and a test probe 3 mounted on the probe bracket. The probe bracket includes a support component 1 and a probe mounting component 2. A slide rod 4 is provided on the support component 1. The probe mounting component 2 is sleeved on the slide rod 4 and can slide along the slide rod 4. An elastic element is provided between the support component 1 and the probe mounting component 2. The elastic element keeps the probe mounting component 2 in a first position.

[0022] Specifically, the support assembly 1 includes an upper crossbeam 11 and a lower crossbeam 12. One end of the upper crossbeam 11 and the lower crossbeam 12 are connected by a connecting plate 13, and the other end is connected by a slide rod 4. The probe mounting assembly 2 includes a probe mounting part 21. The probe mounting part 21 extends to one side with an upper sliding plate 22 and a lower sliding plate 23. The upper sliding plate 22 and the lower sliding plate 23 are respectively provided with through holes. The probe mounting assembly 2 is sleeved on the slide rod 4 through the through holes on the upper sliding plate 22 and the lower sliding plate 23.

[0023] During operation, the probe holder moves the test probe 3 up and down, causing the probe tip to contact the pad under test and apply pressure. The pad generates a reaction force on the probe, which pushes the test probe 3 and the probe mounting part 21 to overcome the elastic force of the elastic element and slide upward along the slide rod 4, disengaging from the first position. This ensures that the test probe 3 can apply sufficient pressure to the pad while preventing damage to the pad due to excessive pressure. The specific pressure can be adjusted by adjusting the elastic force of the elastic element, making implementation simpler and more convenient.

[0024] In this embodiment, the support assembly 1 consists of an upper crossbeam 11, a lower crossbeam 12, and a connecting plate 13 at one end. The other ends of the upper crossbeam 11 and the lower crossbeam 12 are connected by a slide rod 4. The upper crossbeam 11, the lower crossbeam 12, the connecting plate 13, and the slide rod 4 together form a quadrilateral structure, which provides sufficient structural strength while reducing weight. Correspondingly, the probe mounting part 21 of the probe mounting assembly 2 extends to one side with an upper sliding plate 22 and a lower sliding plate 23. The upper sliding plate 22 and the lower sliding plate 23 cooperate with the upper crossbeam 11 and the lower crossbeam 12, respectively. There are also two elastic elements, which are respectively disposed between the upper crossbeam 11 and the upper sliding plate 22 and between the lower crossbeam 12 and the lower sliding plate 23, forming two sets of sliding guide structures. The two sets of sliding guide structures can ensure the stability of the test probe 3 in the vertical direction. In other embodiments, only one set of sliding guide structures can be used, and the stability of the test probe 3 in the vertical direction can be ensured by other means, such as setting the sliding plate of the probe mounting assembly 2 to be sufficiently thick.

[0025] To further improve the stability of the support assembly 1, a reinforcing plate 14 can be connected between the middle of the upper crossbeam 11 and the lower crossbeam 12. Additionally, in this embodiment, the other ends of the upper crossbeam 11 and the lower crossbeam 12 are connected by a sliding rod 4, meaning the sliding rod 4 is fixedly connected to the other ends of the upper crossbeam 11 and the lower crossbeam 12, making the sliding rod 4 part of the support assembly 1. In other embodiments, the sliding rod 4 can be integrated with the probe mounting assembly 2, allowing the upper crossbeam 11 and the lower crossbeam 12 of the support assembly 1 to slide relative to the sliding rod 4. In this case, the reinforcing plate 14 between the middle of the upper crossbeam 11 and the lower crossbeam 12 is necessary.

[0026] As a further improvement, two positioning elements 6 are also provided on the slide bar 4. The upper slide plate 22 and the lower slide plate 23 are respectively located above the two positioning elements 6 and abut against the two positioning elements 6 under the action of the elastic element. Under the combined action of the positioning elements 6 and the elastic element, the probe mounting assembly 2 is held in the first position.

[0027] As a further improvement, the cross-section of the slide bar 4 is non-circular, and the shapes of the through holes on the upper slide plate 22 and the lower slide plate 23 match the cross-sectional shape of the slide bar 4. For example, the cross-section of the slide bar 4 can be elliptical, triangular, square, pentagonal, hexagonal, octagonal, etc. The non-circular cross-section of the slide bar 4 can prevent the probe mounting assembly 2 from swaying in the horizontal direction. Figure 2 As shown, in this embodiment, the cross-section of the slide bar 4 is elliptical. In other embodiments, the probe mounting assembly 2 can also be prevented from swaying in the horizontal direction in other ways. For example, this can be achieved by using two slide bars 4.

[0028] In this embodiment, the elastic element is spring 5. Figure 3In the embodiment shown, the elastic element is a spring sheet 7.

[0029] like Figures 1-3 As shown, the test probe 3 is installed on the probe mounting assembly 2 to form a probe assembly, which can then be further installed on the flying probe tester.

[0030] The above-described embodiments are merely preferred embodiments provided to fully illustrate the present invention, and the scope of protection of the present invention is not limited thereto. Equivalent substitutions or modifications made by those skilled in the art based on the present invention are all within the scope of protection of the present invention. The scope of protection of the present invention is defined by the claims.

Claims

1. A probe holder, characterized in that, The device includes a support assembly and a probe mounting assembly. The support assembly is provided with a slide rod, and the probe mounting assembly is sleeved on the slide rod and can slide along the slide rod. An elastic element is provided between the support assembly and the probe mounting assembly, and the elastic element keeps the probe mounting assembly in a first position.

2. The probe holder as described in claim 1, characterized in that, The support assembly includes an upper crossbeam and a lower crossbeam, with one end of the upper crossbeam and the lower crossbeam connected by a connecting plate and the other end connected by the sliding rod.

3. The probe holder as described in claim 2, characterized in that, A reinforcing plate is also connected between the middle of the upper and lower crossbeams.

4. The probe holder as described in claim 2, characterized in that, The probe mounting assembly includes a probe mounting part, which extends to one side with an upper sliding plate and a lower sliding plate. The upper sliding plate and the lower sliding plate are respectively provided with through holes. The probe mounting assembly is sleeved on the slide rod through the through holes on the upper sliding plate and the lower sliding plate.

5. The probe holder as described in claim 4, characterized in that, There are two elastic elements, which are respectively disposed between the upper crossbeam and the upper sliding plate and between the lower crossbeam and the lower sliding plate.

6. The probe holder as described in claim 5, characterized in that, The elastic element is a spring or a sheet spring.

7. The probe holder as described in claim 4, characterized in that, The slide bar is also provided with two positioning members. The upper slide plate and the lower slide plate are respectively located above the two positioning members and abut against the two positioning members under the action of the elastic member.

8. The probe holder as described in claim 4, characterized in that, The cross-section of the slide bar is non-circular, and the shape of the through holes on the upper slide plate and the lower slide plate matches the cross-sectional shape of the slide bar.

9. A probe assembly, characterized in that, A probe holder comprising any one of claims 1-8, wherein a test probe is mounted on the probe mounting assembly of the probe holder.

10. A flying probe testing machine, characterized in that, It includes the probe assembly as described in claim 9.

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