Low-resistance testing device

Abstract

The utility model discloses a low resistance testing device, and relates to the technical field of circuit board manufacturing, the low resistance testing device comprises a top plate, a bottom plate, a support column, a pressing plate and a servo electric cylinder, the bottom plate is arranged at one side of the top plate at intervals, and the surface of the bottom plate facing the top plate is provided with a lower testing frame; the supporting column is arranged between the top plate and the bottom plate to connect the top plate with the bottom plate; the pressing plate is arranged between the top plate and the bottom plate in a sliding mode in the axial direction of the supporting column, an upper testing frame is arranged on the surface, facing the bottom plate, of the pressing plate, and the upper testing frame and the lower testing frame are used for clamping a circuit board to be detected; the servo electric cylinder is installed on the side, away from the pressing plate, of the top plate, and the servo electric cylinder is in driving connection with the pressing plate so as to drive the pressing plate to slide in the axial direction of the supporting column. According to the technical scheme provided by the utility model, the problem that the test result of the existing test device is not accurate enough is solved.

Description

Technical Field

[0001] This utility model relates to the field of circuit board manufacturing technology, and in particular to a low-resistance testing device. Background Technology

[0002] In the current electronics manufacturing industry, low-resistance testing is often required to ensure the stable performance of electrical contacts on circuit boards. The two-wire and four-wire low-resistance testers commonly used in the market primarily function to establish an electrical connection between the test instrument and the electrical contacts on the circuit board, thereby achieving accurate measurement of the contact resistance.

[0003] Existing testing equipment typically uses ordinary cylinders to drive the pressure plate to move up and down. Ordinary cylinders have limited control precision and cannot accurately control the rising and falling position of the pressure plate. This can lead to the pressure plate pressing down too much and damaging the circuit board or test fixture, or the pressure plate pressing down too little, resulting in inaccurate test results and requiring repeated testing, which results in low testing efficiency. Utility Model Content

[0004] The main purpose of this invention is to propose a low-resistance testing device, which aims to solve the problem that the test results of existing testing devices are not accurate enough.

[0005] To achieve the above objectives, the present invention proposes a low-resistance testing device, which includes:

[0006] roof;

[0007] A base plate is spaced apart on one side of the top plate, and a lower test frame is provided on the surface of the base plate facing the top plate;

[0008] A support column is provided between the top plate and the bottom plate to connect the top plate and the bottom plate;

[0009] A pressure plate is slidably disposed between the top plate and the bottom plate along the axial direction of the support column, and an upper test frame is provided on the surface of the pressure plate facing the bottom plate. The upper test frame and the lower test frame are used to clamp the circuit board to be tested.

[0010] A servo electric cylinder is installed on the side of the top plate away from the pressure plate. The servo electric cylinder is driven to the pressure plate to drive the pressure plate to slide along the axial direction of the support column.

[0011] In one embodiment, the low-resistance testing device further includes a flange, which is disposed on the side of the pressure plate facing the servo cylinder and is fixedly connected to the lead screw of the servo cylinder.

[0012] In one embodiment, the low-resistance testing device further includes a guide post disposed on the side of the pressure plate facing the top plate, and the guide post passes through the top plate and extends in a direction away from the pressure plate.

[0013] In one embodiment, the low-resistance testing device further includes a sensing component, which includes a sensing head and a sensing base. The sensing base is disposed on one side of the guide post, and the sensing head is disposed at the end of the guide post away from the pressure plate. The sensing head and the sensing base cooperate to limit the lifting stroke of the pressure plate.

[0014] In one embodiment, the sensing component further includes a bracket, which is disposed on one side of the guide post and fixedly connected to the top plate. Two sensing seats are provided at intervals along the length of the bracket to respectively limit the upper and lower strokes of the pressure plate.

[0015] In one embodiment, the low-resistance testing device further includes a first linear bearing, which is disposed on the side of the top plate away from the pressure plate and sleeved on the outside of the guide post.

[0016] In one embodiment, the low-resistance testing device further includes a second linear bearing, which is disposed on the side of the pressure plate away from the top plate and sleeved on the outside of the support column.

[0017] In one embodiment, the upper test fixture and / or the lower test fixture are provided with test pins on the side facing the circuit board. One end of the test pin is electrically connected to the potential to be tested on the circuit board, and the other end of the test pin is electrically connected to an external testing machine.

[0018] In one embodiment, the upper test frame and / or the lower test frame are provided with a plurality of positioning holes spaced apart, and two adjacent test pins are inclinedly arranged in their respective positioning holes.

[0019] In one embodiment, the low-resistance testing device further includes an insulating plate, which is fixedly disposed between the pressure plate and the upper test frame.

[0020] In one embodiment, the base plate is provided with a sliding groove and at least two stops, and the lower test frame is clamped between the two stops. The two stops are slidably disposed at both ends of the sliding groove to adjust the clamping space between the two stops.

[0021] This invention employs a servo electric cylinder instead of a traditional pneumatic cylinder, achieving precise control over the rising and falling positions of the pressure plate. This ensures the pressure plate accurately contacts the potential points on the circuit board, thereby improving the accuracy and reliability of the test. An upper test frame and a lower test frame are respectively installed on the pressure plate and the base plate. The circuit board is placed between the upper and lower test frames to perform resistance testing on the solder points on the circuit board. In this solution, the ball screw inside the servo electric cylinder converts the rotational motion of the motor into the linear motion of the pressure plate. The control unit in the servo electric cylinder receives signals from sensors and precisely controls the operation of the servo motor according to preset position information, thereby achieving precise positioning of the pressure plate and improving the accuracy of the test results. Attached Figure Description

[0022] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on the structures shown in these drawings without creative effort.

[0023] Figure 1 A schematic diagram of an embodiment of the low-resistivity testing device provided by this utility model;

[0024] Figure 2 A schematic diagram of another embodiment of the low-resistance testing device provided by this utility model;

[0025] Figure 3 This is a schematic diagram of another embodiment of the low-resistance testing device provided by this utility model.

[0026] Explanation of icon numbers:

[0027] 100. Low resistance testing device; 1. Top plate; 11. First linear bearing; 2. Base plate; 21. Lower test frame; 22. Slide groove; 23. Stop block; 3. Support column; 4. Pressure plate; 41. Upper test frame; 42. Flange; 43. Guide column; 44. Second linear bearing; 5. Servo electric cylinder; 6. Induction assembly; 61. Induction head; 62. Induction seat; 63. Bracket; 7. Insulation plate.

[0028] The realization of the purpose, functional features and advantages of this utility model will be further explained in conjunction with the embodiments and with reference to the accompanying drawings. Detailed Implementation

[0029] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the embodiments described are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts shall fall within the scope of protection of the present invention.

[0030] It should be noted that if the embodiments of the present invention involve directional indications (such as up, down, left, right, front, back, etc.), the directional indications are only used to explain the relative position relationship, movement status, etc. between the components in a certain specific posture. If the specific posture changes, the directional indications will also change accordingly.

[0031] In addition, if there are descriptions involving "first", "second", etc. in the embodiments of the present invention, the descriptions of "first", "second", etc. are only for descriptive purposes and cannot be understood as indicating or implying their relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features limited to "first" and "second" may explicitly or implicitly include at least one of such features. In addition, if "and / or" or "and / or" appears in the full text, its meaning includes three parallel schemes. Taking "A and / or B" as an example, it includes scheme A, or scheme B, or a scheme in which A and B are satisfied at the same time. In addition, the technical solutions between the various embodiments can be combined with each other, but it must be based on the ability of ordinary technicians in this field to implement. When the combination of technical solutions is mutually contradictory or cannot be implemented, it should be deemed that such a combination of technical solutions does not exist and is not within the scope of protection required by the present invention.

[0032] Existing testing equipment typically uses ordinary cylinders to drive the pressure plate to move up and down. Ordinary cylinders have limited control precision and cannot accurately control the rising and falling position of the pressure plate. This can lead to the pressure plate pressing down too much and damaging the circuit board or test fixture, or the pressure plate pressing down too little, resulting in inaccurate test results and requiring repeated testing, which results in low testing efficiency.

[0033] This invention proposes a low-resistance testing device.

[0034] Please see Figure 1 In one embodiment of this utility model, the low-resistance testing device 100 includes:

[0035] Top plate 1;

[0036] The base plate 2 is spaced apart on one side of the top plate 1, and the surface of the base plate 2 facing the top plate 1 is provided with a lower test frame 21;

[0037] Support column 3 is located between top plate 1 and bottom plate 2 to connect top plate 1 and bottom plate 2;

[0038] A pressure plate 4 is slidably disposed between a top plate 1 and a bottom plate 2 along the axial direction of a support column 3. An upper test frame 41 is provided on the surface of the pressure plate 4 facing the bottom plate 2. The upper test frame 41 and the lower test frame 21 are used to clamp the circuit board to be tested.

[0039] Servo electric cylinder 5 is installed on the side of top plate 1 away from pressure plate 4. Servo electric cylinder 5 is driven to pressure plate 4 to drive pressure plate 4 to slide along the axial direction of support column 3.

[0040] This invention employs a servo electric cylinder 5 instead of a traditional pneumatic cylinder, achieving precise control over the rising and falling positions of the pressure plate 4. This ensures that the pressure plate 4 accurately contacts the potential points on the circuit board, thereby improving the accuracy and reliability of the test. An upper test frame 41 and a lower test frame 21 are respectively installed on the pressure plate 4 and the base plate 2. The circuit board is placed between the upper test frame 41 and the lower test frame 21 to perform resistance testing on the solder points on the circuit board. In this solution, the ball screw inside the servo electric cylinder 5 converts the rotational motion of the motor into the linear motion of the pressure plate 4. The control unit in the servo electric cylinder 5 receives signals from the sensor and precisely controls the operation of the servo motor according to the preset position information, thereby achieving precise positioning of the pressure plate 4 and improving the accuracy of the test results.

[0041] Specifically, the structure of the upper test frame 41 and the lower test frame 21 is not specifically limited; any structure capable of placing a circuit board and mounting test probes on it is acceptable. Understandably, the test frame has multiple positioning holes for fixing the test probes. The layout, number, and spacing of these positioning holes are not specifically limited; that is, the installation position and number of test probes can be adjusted according to actual needs to accommodate the different potential points on different circuit boards. The advantage of using the servo cylinder 5 is that it consists of a servo motor, encoder, ball screw, guide rail, sensor, and control unit. The servo motor is the power source of the servo cylinder 5; it receives control signals and converts them into mechanical motion. The encoder is mounted on the shaft of the servo motor to provide real-time feedback on the rotation angle of the motor shaft, ensuring the accuracy of the motion. The ball screw converts the rotational motion of the motor into the linear motion of the pressure plate 4. The pressure plate 4 slides along the axial direction of the support column 3, and the guide rail ensures the smoothness and accuracy of the pressure plate 4's movement. The control unit receives signals from the sensor and, based on preset position information, precisely controls the operation of the servo motor to achieve precise positioning of the pressure plate 4.

[0042] In the embodiments of this utility model, please refer to Figure 1 and Figure 2The low-resistance testing device 100 also includes a flange 42, which is located on the side of the pressure plate 4 facing the servo cylinder 5 and is fixedly connected to the lead screw of the servo cylinder 5. The flange 42 enhances the connection stability between the pressure plate 4 and the servo cylinder 5, ensuring structural reliability under high pressure and frequent movement. It should be noted that the flange 42 is typically a flat, round or square structure with bolt holes on its edges, and is fixed to the pressure plate 4 with bolts. This provides a stable connection interface and reduces wear on the connection parts. The flange 42 may also have precise positioning holes or grooves, which are fixedly connected to the lead screw of the servo cylinder 5 with bolts or other fasteners, ensuring precise movement of the pressure plate 4 under the drive of the servo cylinder 5.

[0043] In the embodiments of this utility model, please refer to Figure 1 and Figure 2 The low-resistance testing device 100 also includes a guide post 43, which is located on the side of the pressure plate 4 facing the top plate 1 and extends through the top plate 1 away from the pressure plate 4. The guide post 43 provides precise guidance for the movement of the pressure plate 4, ensuring linear movement during its ascent and descent, thereby improving the positioning accuracy of the test. It should be noted that the length of the guide post 43 must be greater than the maximum descent length of the pressure plate 4 to ensure that the guide post 43 remains connected to the top plate 1 even when the pressure plate 4 reaches its minimum displacement, thus ensuring precise movement of the pressure plate 4. The guide post 43 can be fixed to the top plate 1 by welding, threaded connection, or clamping. Furthermore, the outer surface of the guide post 43 can be specially treated, such as by plating or coating with wear-resistant materials, to improve its wear resistance and corrosion resistance.

[0044] In the embodiments of this utility model, please refer to Figure 2 The low-resistance testing device 100 also includes a sensing component 6, which includes a sensing head 61 and a sensing base 62. The sensing base 62 is located on one side of the guide post 43, and the sensing head 61 is located at the end of the guide post 43 away from the pressure plate 4. The sensing head 61 and the sensing base 62 cooperate to limit the lifting stroke of the pressure plate 4. The sensing head 61 can be a small sensor, such as a photoelectric sensor, a proximity sensor, or a Hall sensor. The sensing base 62 is located on one side of the guide post 43 and is used to cooperate with the sensing head 61. The sensing base 62 can be a photoelectric sensing base 62, a magnetic sensing base 62, or other types of sensing devices. The appropriate sensing base 62 is selected according to the actual type of sensing head 61 and the detection requirements. When the pressure plate 4 moves to a predetermined position, the sensing head 61 can detect the presence of the sensing base 62 and send a signal to the control system. After receiving the signal, the control system controls the servo cylinder 5 to stop driving, thereby limiting the lifting stroke of the pressure plate 4.

[0045] In the embodiments of this utility model, please refer to Figure 2 The sensing component 6 also includes a bracket 63, which is located on one side of the guide post 43 and fixedly connected to the top plate 1. Two sensing seats 62 are spaced apart along the length of the bracket 63 to limit the upper and lower strokes of the pressure plate 4, respectively. By spaced two sensing seats 62 on the bracket 63, the upper and lower strokes of the pressure plate 4 can be precisely limited, ensuring that the pressure plate 4 stops at the correct position and improving the accuracy of the test. The bracket 63 is fixedly connected to the top plate 1 by welding, bolting, or other mechanical fixing methods to ensure that the bracket 63 will not shift during the lifting and lowering of the pressure plate 4. The spacing between the two sensing seats 62 is not specifically limited and can be selected according to actual needs.

[0046] In the embodiments of this utility model, please refer to Figure 1 and Figure 2 The low-resistance testing device 100 also includes a first linear bearing 11. The first linear bearing 11 is located on the side of the top plate 1 away from the pressure plate 4 and is sleeved on the outside of the guide post 43 to ensure that the pressure plate 4 moves linearly along the guide post 43 during lifting and lowering. The first linear bearing 11 can be a cylindrical or square rolling element bearing, with balls or rollers inside to reduce friction. The installation of the first linear bearing 11 reduces the friction between the guide post 43 and the top plate 1, making the lifting and lowering movement of the pressure plate 4 smoother and improving the movement efficiency. In addition, a sealing ring or sealing cover can be provided at the end of the linear bearing to protect the rolling elements inside the bearing from dust and impurities. When there are multiple guide posts 43, there are also multiple first linear bearings 11.

[0047] In the embodiments of this utility model, please refer to Figure 3 The low-resistance testing device 100 also includes a second linear bearing 44. The second linear bearing 44 is located on the side of the pressure plate 4 facing away from the top plate 1 and is sleeved on the outside of the support column 3, ensuring that the pressure plate 4 moves linearly along the support column 3 during lifting and lowering. The second linear bearing 44 can be a cylindrical or square rolling element bearing, containing balls or rollers to reduce friction and improve the smoothness of movement. The installation of the second linear bearing 44 ensures the smooth movement of the pressure plate 4 along the support column 3, reduces vibration caused by friction, and improves stability during the testing process. When there are multiple support columns 3, there are also multiple second linear bearings 44.

[0048] In embodiments of this invention, test pins are provided on the side of the upper test frame 41 and / or the lower test frame 21 facing the circuit board. One end of the test pin is electrically connected to the potential to be tested on the circuit board, and the other end is electrically connected to an external testing machine. Either the upper test frame 41 or the lower test frame 21 may have a test pin, or both may be provided. The test pins are typically long, thin metal pins, with one end designed to fit the shape of the potential contact point on the circuit board, and the other end matched to the interface of the external testing machine. Alternatively, they can be electrically connected to the testing machine via wires. The number and layout of the test pins can be adjusted according to different circuit board designs to adapt to different testing needs, enhancing the flexibility and adaptability of the testing device.

[0049] In embodiments of this invention, the upper test fixture 41 and / or the lower test fixture 21 are provided with multiple positioning holes spaced apart, allowing simultaneous testing of multiple test points. The shape and size of the positioning holes can be designed according to the diameter and tilt angle of the test probes to ensure that the test probes can be stably installed within the positioning holes. Furthermore, adjacent test probes are tilted within their respective positioning holes. When two electrical points on the circuit board are relatively close, while reserving space for the tips of the two test probes, it is necessary to ensure that the probe tips contact the electrical points on the circuit board. This allows adjacent test probes to be tilted within the positioning holes. The tilted arrangement of the two test probes reduces the risk of contact between adjacent test probes and lowers the possibility of short circuits.

[0050] In the embodiments of this utility model, please refer to Figure 3 The low-resistance testing device 100 also includes an insulating plate 7, which is fixedly disposed between the pressure plate 4 and the upper test frame 41. The shape of the insulating plate 7 is not specifically limited; it can be square or round, as long as it can cover the upper test frame 41 to prevent electrical conductivity between the upper test frame 41 and the top plate 1. The material of the insulating plate 7 is not specifically limited; any material with excellent electrical insulation properties is acceptable, such as polyester, polyimide, or G10 fiberglass board. The insulating plate 7 can be fixed between the pressure plate 4 and the upper test frame 41 by bolts, clips, or adhesives to ensure that it does not shift during the test.

[0051] In the embodiments of this utility model, please refer to Figure 2 and Figure 3The base plate 2 is provided with a sliding groove 22 and at least two stops 23. The lower test frame 21 is clamped between the two stops 23. The two stops 23 are slidably disposed at both ends of the sliding groove 22 to adjust the clamping space between the two stops 23. The sliding groove 22 can be a long strip-shaped groove on the base plate 2, and its length and width are designed according to the size and sliding range of the stops 23. The stops 23 are usually rectangular or square block structures, and their sides fit tightly with the inner wall of the sliding groove 22 to achieve smooth sliding. By sliding the stops 23 at both ends of the sliding groove 22, the operator can adjust the distance between the two stops 23 by rotating or pushing the stops 23, thereby changing the clamping space of the lower test frame 21 to accommodate different lengths of the lower test frame 21. It should be noted that the stops 23 are provided with fixing devices, such as threaded holes or locking devices, at both ends of the sliding groove 22 to fix the position of the stops 23 in the sliding groove 22 and prevent displacement during the test. The inner side of the stop block 23 may also be provided with a groove or protrusion that cooperates with the lower test frame 21 to ensure stable clamping of the lower test frame 21.

[0052] The above description is merely an exemplary embodiment of the present invention and does not limit the patent scope of the present invention. All equivalent structural transformations made using the contents of the present invention specification and drawings under the technical concept of the present invention, or direct / indirect application in other related technical fields are included in the patent protection scope of the present invention.

Claims

1. A low-resistance testing device, characterized in that, The low-resistance testing device includes: roof; A base plate is spaced apart on one side of the top plate, and a lower test frame is provided on the surface of the base plate facing the top plate; A support column is provided between the top plate and the bottom plate to connect the top plate and the bottom plate; A pressure plate is slidably disposed between the top plate and the bottom plate along the axial direction of the support column, and an upper test frame is provided on the surface of the pressure plate facing the bottom plate. The upper test frame and the lower test frame are used to clamp the circuit board to be tested. A servo electric cylinder is installed on the side of the top plate away from the pressure plate. The servo electric cylinder is driven to the pressure plate to drive the pressure plate to slide along the axial direction of the support column.

2. The low-resistance testing device as described in claim 1, characterized in that, The low-resistance testing device also includes a flange, which is located on the side of the pressure plate facing the servo cylinder and is fixedly connected to the lead screw of the servo cylinder.

3. The low-resistance testing device as described in claim 1, characterized in that, The low-resistance testing device also includes a guide post, which is located on the side of the pressure plate facing the top plate, and the guide post passes through the top plate and extends away from the pressure plate.

4. The low-resistance testing device as described in claim 3, characterized in that, The low-resistance testing device also includes a sensing component, which includes a sensing head and a sensing base. The sensing base is located on one side of the guide post, and the sensing head is located at the end of the guide post away from the pressure plate. The sensing head and the sensing base cooperate to limit the lifting stroke of the pressure plate.

5. The low-resistance testing device as described in claim 4, characterized in that, The sensing component also includes a bracket, which is located on one side of the guide post and fixedly connected to the top plate. Two sensing seats are spaced apart along the length of the bracket to respectively limit the upper and lower strokes of the pressure plate.

6. The low-resistance testing device as described in claim 3, characterized in that, The low-resistance testing device further includes a first linear bearing, which is located on the side of the top plate opposite to the pressure plate and is sleeved on the outside of the guide post; and / or, The low-resistance testing device also includes a second linear bearing, which is located on the side of the pressure plate away from the top plate and is sleeved on the outside of the support column.

7. The low-resistance testing device as described in claim 1, characterized in that, The upper test fixture and / or the lower test fixture are provided with test pins on the side facing the circuit board. One end of the test pin is electrically connected to the potential to be tested on the circuit board, and the other end of the test pin is electrically connected to an external testing machine.

8. The low-resistance testing device as described in claim 7, characterized in that, The upper test frame and / or the lower test frame are provided with a plurality of positioning holes spaced apart, and two adjacent test pins are inclinedly arranged in their respective positioning holes.

9. The low-resistance testing device as described in claim 1, characterized in that, The low-resistance testing device also includes an insulating plate, which is fixedly disposed between the pressure plate and the upper test frame.

10. The low-resistance testing apparatus according to any one of claims 1 to 9, characterized in that, The base plate is provided with a sliding groove and at least two stops. The lower test frame is clamped between the two stops. The two stops are slidably disposed at both ends of the sliding groove to adjust the clamping space between the two stops.

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