Probe crimping measurement device and system

Abstract

The utility model provides a probe crimping measurement device and system. The device comprises an electric connection module and a measurement module. One end of the electric connection module is connected with the measurement module, the other end of the electric connection module is connected with a device to be tested through the probe, the device to be tested comprises a plurality of test points, and each test point comprises a first crimping point and a second crimping point; the measurement module comprises a power supply output end and a voltage feedback end, the electric connection module comprises a plurality of connection paths and a gating switch for controlling the connection and disconnection of different connection paths, and each probe is electrically connected with the power supply output end and the voltage feedback end through the connection paths; during detection, the probe is in contact with the first crimping points and the second crimping points of a plurality of test points of the to-be-tested equipment, and the measurement module outputs a test signal and receives a feedback signal of the to-be-tested equipment to test the test points. According to the invention, the probe which is poorly crimped with the crimping point can be quickly and accurately positioned.

Description

Technical Field

[0001] This application belongs to the field of probe crimping measurement, and in particular relates to a probe crimping measurement device and system. Background Technology

[0002] When testing devices manufactured using surface mount technology (SMT) or printed circuit boards (PCBs), many tests are conducted by using probe bonding technology to bring out the test points (PADs) of the device under test (DUT). Therefore, the bonding yield between the probes and PADs directly affects the stability and yield of the test.

[0003] Currently, troubleshooting probe crimping defects mainly involves the following methods: 1. Blue film crimping technology, followed by visual inspection under a microscope. This method is time-consuming and cannot accurately reflect the actual crimping condition. 2. Dummy board functional testing technology, requiring manual multimeter measurement of the circuit, which incurs design costs and is inefficient. 3. LED board inspection, using the on / off state of the LED board to quickly observe the crimping condition. This method can only locate PAD points, not precise pinpoints. Existing crimping defect troubleshooting methods can only roughly locate poorly crimped PADs, but cannot precisely pinpoint the specific probe with a crimping defect. Summary of the Invention

[0004] One objective of this application is to provide a probe crimping measurement device that can quickly and accurately locate probes with poor crimping, solving the problems of long investigation time, high cost, and inaccurate positioning for poor crimping. Another objective of this application is to provide a probe crimping measurement system.

[0005] To achieve the above objectives, this application discloses a probe crimping measurement device, including an electrical connection module and a measurement module;

[0006] One end of the electrical connection module is connected to the measurement module, and the other end is connected to the device under test (DUT) through the probe. The DUT includes multiple test points, and each test point includes a first crimp point and a second crimp point.

[0007] The measurement module includes a power output terminal and a voltage feedback terminal. The electrical connection module includes multiple connection paths and a selection switch that controls the on / off state of different connection paths. Each probe is electrically connected to the power output terminal and the voltage feedback terminal through the connection paths respectively.

[0008] During testing, the probe contacts the first and second crimping points of multiple test points of the device under test, and the measurement module outputs test signals and receives feedback signals from the device under test to test the test points.

[0009] Optionally, the electrical connection module includes a first four-wire connection channel and a second four-wire connection channel, and the selection switch includes a first control switch group and a second control switch group correspondingly disposed on the first four-wire connection channel and the second four-wire connection channel, and the two crimping points of each test point are respectively connected to the first four-wire connection channel and the second four-wire connection channel;

[0010] When measuring a single test point, the first control switch group controls the first four-wire connection channel to be turned on, and the four terminals of the first four-wire connection channel are connected to the two crimping points of the current test point to form a false four-wire channel and obtain the detection information of the current test point; when measuring two adjacent test points, the second control switch group controls the second four-wire connection channel to be turned on, and the four terminals of the second four-wire connection channel are connected to the four crimping points of the two adjacent test points to form a true four-wire channel and obtain the detection information of the crimping points.

[0011] Optionally, the electrical connection module includes a third and fourth wire connection channel, and the selection switch includes a third control switch group disposed in the third and fourth wire connection channel. The measurement module switches the four crimping points connecting two adjacent test points through the third control switch group to obtain the detection information of the crimping points.

[0012] Optionally, the third control switch group can be switched so that the two crimping points of two adjacent test points are connected to the power output terminal and the voltage feedback terminal respectively through the third four-wire connection channel to obtain the test point detection information; either crimping point of two adjacent test points can be connected to the power output terminal, and the other crimping point can be connected to the voltage feedback terminal to obtain the crimping point detection information.

[0013] Optionally, the first four-wire connection channel includes an output channel connected to the power output terminal and a feedback channel connected to the voltage feedback terminal. When measuring a single test point, the first control switch group controls the output channel and the feedback channel to be short-circuited. The two channels after short-circuiting are respectively connected to the first crimping point and the second crimping point of the current test point to obtain the test information of the current test point.

[0014] Optionally, the second four-wire connection channel includes an output channel connected to the power output terminal and a feedback channel connected to the voltage feedback terminal. When measuring two test points, the second control switch group controls the four channels of the output channel and the feedback channel to connect to the four crimping points of the two test points to form a detection loop and obtain the test information of the crimping points.

[0015] Optionally, the third and fourth wire connection channels include an output channel connected to the power output terminal and a feedback channel connected to the voltage feedback terminal. The four channels of the output channel and the feedback channel are connected to the four crimping points of the two test points to form a detection loop.

[0016] The power output terminal and voltage feedback terminal of the measurement module can be freely set. Based on the set power output terminal and voltage feedback terminal, the four channels on the third four-wire connection channel are connected to the corresponding crimping points to form the detection circuit through the third control switch group.

[0017] Optionally, the third and fourth wire connection channels include four channels that connect the output channel and the feedback channel to each probe, and a switching element is provided on the connection lines.

[0018] Optionally, a display unit is also included, which displays a simulation circuit diagram. The simulation circuit diagram includes crimping status lights corresponding to the first and second crimping points of multiple test points, used to indicate whether there is a fault in the crimping status between the corresponding crimping point and the probe.

[0019] This application also discloses a probe crimping measurement system, including the probe crimping measurement device and the device under test as described above.

[0020] The beneficial effects of the present invention are as follows:

[0021] The electrical connection module of the probe crimping measurement device of this application includes multiple connection paths. Each connection path is equipped with a selector switch to control the on / off state of different connection paths. By controlling the on / off state of the selector switches, the on / off state of different connection paths is controlled, allowing each probe to connect to the power output terminal or voltage feedback terminal through the connection path. During test point testing, the probes contact the first and second crimping points of multiple test points of the device under test (DUT). The measurement module outputs test signals and receives feedback signals from the DUT to test the test points. During the test, the feedback signals received by the measurement module can determine whether the probe has poor crimping with the crimping point. If a poor crimping fault exists, the on / off state of the selector switches can be controlled to create a true four-wire channel and a false four-wire channel to detect the poor crimping of the probe at the crimping point. This allows for quick and accurate location of the probe with poor crimping, solving the problems of long troubleshooting time, high cost, and inaccurate location. Attached Figure Description

[0022] To more clearly illustrate the technical solutions in the embodiments of this application, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0023] Figure 1 This is a schematic diagram of a specific embodiment of the probe crimping measurement device of this application;

[0024] Figure 2 This is a schematic diagram of a specific embodiment of the probe crimping measurement device of this application, specifically a pseudo-four-wire test.

[0025] Figure 3 This is a schematic diagram of a specific embodiment of the probe crimping measurement device of this application for true four-wire testing;

[0026] Figure 4 This is a schematic diagram of a specific example of the probe crimping measurement device of this application;

[0027] Figure 5 This is a schematic diagram of a specific embodiment of the probe crimping measurement system of this application. Detailed Implementation

[0028] In the following description, specific details such as specific system structures and techniques are provided for purposes of illustration rather than limitation to facilitate a thorough understanding of the embodiments of the present application. However, it will be apparent to those skilled in the art that the present application may be implemented in other embodiments without these specific details. In other cases, detailed descriptions of well-known systems, devices, circuits, and methods are omitted to avoid obscuring the description of the present application with unnecessary detail.

[0029] It should be understood that, when used in this application specification and the appended claims, the term "comprising" indicates the presence of the described features, integrals, steps, operations, elements and / or components, but does not exclude the presence or addition of one or more other features, integrals, steps, operations, elements, components and / or a collection thereof.

[0030] It should also be understood that the term “and / or” as used in this application specification and the appended claims means any combination of one or more of the associated listed items and all possible combinations, and includes such combinations.

[0031] As used in this application specification and the appended claims, the term "if" may be interpreted, depending on the context, as "when," "once," "in response to determination," or "in response to detection." Similarly, the phrase "if determined" or "if detected [the described condition or event]" may be interpreted, depending on the context, as meaning "once determined," "in response to determination," "once detected [the described condition or event]," or "in response to detection [the described condition or event]."

[0032] Furthermore, in the description of this application and the appended claims, the terms "first," "second," "third," etc., are used only to distinguish descriptions and should not be construed as indicating or implying relative importance.

[0033] References to "one embodiment" or "some embodiments" as described in this specification mean that one or more embodiments of this application include a specific feature, structure, or characteristic described in connection with that embodiment. Therefore, the phrases "in one embodiment," "in some embodiments," "in other embodiments," "in still other embodiments," etc., appearing in different parts of this specification do not necessarily refer to the same embodiment, but rather mean "one or more, but not all, embodiments," unless otherwise specifically emphasized. The terms "comprising," "including," "having," and variations thereof mean "including but not limited to," unless otherwise specifically emphasized.

[0034] Figure 1 This application provides a probe crimping measurement device. For example... Figure 1 As shown, in this embodiment, the probe crimping measurement device includes an electrical connection module 100 and a measurement module 200;

[0035] One end of the electrical connection module 100 is connected to the measurement module 200, and the other end is connected to the device under test (DUT) via the probe. The DUT includes multiple test points, such as... Figure 1 As shown, PAD1, PAD2, PAD3, PAD4, etc., each test point includes a first crimping point A and a second crimping point B;

[0036] The measurement module 200 includes a power output terminal (Force) and a voltage feedback terminal (Sence). The electrical connection module 100 includes multiple connection paths and a selector switch (MUX) for controlling the on / off state of different connection paths. Each probe is electrically connected to the power output terminal and the voltage feedback terminal through the connection paths respectively.

[0037] During testing, the probe contacts the first and second crimping points of multiple test points of the device under test, respectively. The measurement module 200 outputs test signals and receives feedback signals from the device under test to test the test points.

[0038] Understandably, after the measurement module 200 forms a circuit by making contact with the test point through the probe, it applies a test signal through the power output terminal and receives the feedback signal generated by the device under test through the voltage feedback terminal. Based on the feedback signal, it determines whether there is an abnormality at the test point or whether there is a test fault due to poor contact between the probe and the test point.

[0039] The electrical connection module 100 of the probe crimping measurement device of this application includes multiple connection paths. Each connection path is equipped with a selection switch that controls the on / off state of different connection paths. By controlling the on / off state of the selection switch, the on / off state of different connection paths can be controlled so that each probe can be connected to the power output terminal or voltage feedback terminal through the connection path.

[0040] Specifically, during the testing of the test points, the probes contact the first and second crimping points of multiple test points of the device under test (DUT). The measurement module 200 outputs test signals and receives feedback signals from the DUT to test the test points. During the test, the feedback signals received by the measurement module 200 can determine whether the probes are not properly crimped with the crimping points. If a fault of poor crimping exists, a true four-wire channel and a false four-wire channel can be formed by controlling the on / off state of the selector switch to detect the poor crimping of the probes at the crimping points. This allows for quick and accurate location of probes with poor crimping, solving the problems of long troubleshooting time, high cost, and inaccurate location.

[0041] In an optional embodiment, the electrical connection module 100 includes a first four-wire connection channel and a second four-wire connection channel, and the selection switch includes a first control switch group (not shown) and a second control switch group (not shown) correspondingly disposed on the first four-wire connection channel and the second four-wire connection channel, and the two crimping points of each test point are respectively connected to the first four-wire connection channel and the second four-wire connection channel.

[0042] like Figure 2 As shown, when measuring a single test point, the first control switch group controls the first four-wire connection channel to be turned on. The four terminals of the first four-wire connection channel are connected to the two crimping points of the current test point, forming a pseudo-four-wire channel to obtain the detection information of the current test point. Based on the feedback signal of the test point, it is determined whether there is a fault at the current test point. If the current PAD point is faulty, it is determined that the crimping is faulty at that location. Specifically, the voltage information cannot be read due to the fault at the test point. This step can obtain the fault information of each test point.

[0043] like Figure 3 As shown, when measuring two adjacent test points, the second control switch group controls the second four-wire connection channel to be turned on. The four terminals of the second four-wire connection channel are connected to the four crimping points of the two adjacent test points to form a true four-wire channel. The detection information of the crimping points is obtained, and it is possible to determine which probe of the faulty PAD point is not crimped properly based on the feedback voltage and current signals.

[0044] Specifically, during the actual testing process, the electrical connection module 100 is arranged as follows: Figure 2 The pseudo four-wire connection channel shown and as follows Figure 3 The true four-wire connection channel shown is that during testing, a pseudo four-wire connection channel is formed on each PAD by crimping with a probe, and a true four-wire connection channel is formed between two adjacent PADs by crimping with a probe.

[0045] When testing a single test point, the first four-wire connection channel of the electrical connection module 100 is connected to the first and second crimp points of the test point, respectively. That is, the two probes connected to the four terminals of the first four-wire connection channel are crimped with the first and second crimp points to form a detection loop. This allows the two probes connected to the positive and negative terminals (Force+, Force-) of the power supply to be crimped with the first and second crimp points to form an output channel. Simultaneously, these two probes are also connected to the voltage feedback terminals (Sence+, Sence-) to form a feedback channel. The measurement module 200 outputs a test signal through the output channel and receives the detection information of the feedback signal through the feedback channel to determine whether a crimping failure exists. In an optional implementation, the first four-wire connection channel includes an output channel connected to the power output terminal and a feedback channel connected to the voltage feedback terminal. When measuring a single test point, the first control switch group controls the output channel and the feedback channel to be short-circuited. That is, one probe connected to Force+ and Sensence+ is short-circuited, and the other probe connected to Force- and Sensence- is short-circuited. The two channels after short-circuiting are respectively connected to the first crimp point and the second crimp point of the current test point to obtain the test information of the current test point. It can be understood that when testing a single test point, the single test point only has the first crimp point and the second crimp point. Therefore, both the feedback channel and the output channel need to be crimped to the first crimp point and the second crimp point. During connection, the four wires can be short-circuited and then connected to the first crimp point and the second crimp point of the test point to form a pseudo four-wire channel to form a loop. Based on the feedback signal of the test point, it is determined whether there is a fault at the current test point. If the current PAD point is faulty, it is determined that the poor crimping exists at that location. Specifically, since voltage information cannot be read due to a test point fault, this step can obtain the fault information of each test point.

[0046] In an optional implementation, the second four-wire connection channel includes an output channel connected to the power output terminal and a feedback channel connected to the voltage feedback terminal. When measuring two test points, the second control switch group controls the four channels of the output channel and the feedback channel to connect to the four crimping points of the two test points to form a detection loop and obtain the test information of the crimping points.

[0047] like Figure 3 As shown, when measuring two adjacent test points, the second four-wire connection channel of the electrical connection module 100 is connected to the first and second crimping points of the two test points respectively. That is, the probes connected to the four terminals of the second four-wire connection channel are crimped to the first and second crimping points of the two test points respectively. This forms an output channel by crimping the two probes connected to the power output terminal to the first crimping points of the two test points, and a feedback channel by crimping the two probes connected to the voltage feedback terminal to the second crimping points of the two test points. The second four-wire connection channel is turned on by controlling the second control switch group. The four terminals of the second four-wire connection channel are connected to the four crimping points of the two adjacent test points through probes, forming a true four-wire channel to obtain the detection information of the crimping points.

[0048] In this system, if a fault of poor crimping exists, and the test signal read back from the output channel is abnormal, then the first crimping point is faulty; if the feedback signal received from the feedback channel is abnormal, then the second crimping point is faulty. By testing a single test point, the test point with poor crimping can be identified from both test points. Combining this with the determination of whether the first or second crimping point is faulty during the two-point test, the system can determine whether the faulty crimping point is the first or second crimping point. Specifically, the four wires in this connection channel are connected to the four crimping points of two conductive PADs through four probes to form a loop. While receiving the feedback voltage signal, the measurement module 200 also reads back the current signal from the power output terminal. If one PAD point is known to be faulty (obtained by the aforementioned pseudo-four-wire channel), and the test result feedback indicates a current problem (exceeding the threshold), it indicates a problem with the F pin of the faulty PAD point. If the current is normal, but the voltage feedback from the sense voltage feedback terminal is faulty, it indicates a problem with the S pin of the faulty PAD point, allowing for a specific determination of which probe has a faulty crimp. If both PAD points are properly crimped, but the test result is still NG, it indicates a connection failure between the two PAD points.

[0049] This application enables the rapid and accurate location of probe crimping points with poor crimping by setting up a first four-wire connection channel and a second four-wire connection channel to perform false four-wire and true four-wire tests on a single test point and two test points respectively. This solves the problem of the inability to quickly troubleshoot crimping failures in the prior art. When a crimping failure is found, the probe with the crimping failure can be located quickly and accurately, improving testing efficiency and reducing labor costs.

[0050] In addition, the first control switch group and the second control switch group are mainly used to realize the on and off of each connection channel, thereby realizing true four-wire detection and false four-wire detection. The specific switch setting is not restricted.

[0051] In an optional embodiment, the electrical connection module 100 further includes a third four-wire connection channel, and the selection switch includes a third control switch group disposed in the third four-wire connection channel. The measurement module 200 switches the four crimping points connecting two adjacent test points through the third control switch group to obtain the detection information of the crimping points.

[0052] Furthermore, the electrical connection module 100 can also be equipped with a third or fourth wire connection channel. A third control switch group on this channel controls the connection between the power output terminal and the voltage feedback terminal of the four crimping points of the two test points. When one of the two crimping points of a test point has a crimping fault, the third control switch group is controlled to connect the two test points to the power output terminal and the voltage feedback terminal respectively through the third or fourth wire connection channel, forming an output channel and a feedback channel. The signal changes in the output and feedback channels are used to determine whether the fault lies with the first or second crimping point. Then, a selection switch is controlled to connect each test point to the power output terminal to form an output channel. The signal changes in the output channels of each test point are used to determine the test point with the crimping fault. By combining the above testing process, it can be determined that the test point with the crimping fault has a probe crimping fault, thus achieving accurate positioning of the probe with the crimping fault.

[0053] In an optional implementation, the third four-wire connection channel includes an output channel connected to the power output terminal and a feedback channel connected to the voltage feedback terminal. The four channels of the output channel and the feedback channel are connected to the four crimping points of the two test points to form a detection loop.

[0054] The power output terminal and voltage feedback terminal of the measurement module 200 can be freely set. Based on the set power output terminal and voltage feedback terminal, the four channels on the third four-wire connection channel are connected to the corresponding crimping points to form the detection circuit through the third control switch group.

[0055] Specifically, the four channels of the third and fourth wire connection channels are respectively connected to the four crimping points of two test points. During single-point testing, controlling the third control switch group connects each test point to the power output terminal to form a detection loop. The measurement module 200 receives test information from the changes in the output signal of each test point to determine if a crimping fault exists at each test point. During two-point testing, the third control switch group connects the first and second crimping points of the two test points to the output channel and feedback channel respectively to form a detection loop, performing fault detection on the first and second crimping points of each test point. Therefore, by combining the single-point and two-point testing processes, test points with crimping faults and the crimping points within those test points can be identified.

[0056] In this optional implementation, the power output terminal and the voltage feedback terminal can be freely set. Thus, the on / off state of the corresponding selector switch can be controlled according to the connection requirements between the power output terminal and the voltage feedback terminal and the corresponding test point, so that the crimping point is connected to the corresponding power output terminal and voltage feedback terminal to form a detection circuit.

[0057] In an optional embodiment, the third or fourth wire connection channel includes four channels that connect the output channel and the feedback channel to each of the probes, and a switching element is provided on the connection line.

[0058] Specifically, the probes may include a first probe, a second probe, a third probe, and a fourth probe for making contact electrical connections with the device under test. Each of the first, second, third, and fourth probes is connected to one of the four terminals of a third / four-wire connection channel. The four terminals of the third / four-wire connection channel are connected to four channels of the output channel and the feedback channel via connecting wires, thus achieving the purpose of connecting the four probes to the four channels. A selector switch is provided on the connecting wires used to connect the four probes to the four channels so that the four probes can be connected to or disconnected from different channels, thereby achieving the purpose of switchable connection between the crimping point of the probe and the output channel and the feedback channel.

[0059] In a specific example, the third and fourth wire connection channel includes the first conductive line and the second conductive line.

[0060] The first conductive circuit includes a first wire, a second wire, a third wire, and a fourth wire that are respectively connected to the four channels, and the second conductive circuit includes a fifth wire, a sixth wire, a seventh wire, and an eighth wire that are respectively connected to the first probe, the second probe, the third probe, and the fourth probe.

[0061] Wherein, the first wire and the fifth wire are electrically connected to the two ends of the first switching element respectively; the second wire and the fifth wire are electrically connected to the two ends of the second switching element respectively; the third wire and the fifth wire are electrically connected to the two ends of the third switching element respectively; the fourth wire and the fifth wire are electrically connected to the two ends of the fourth switching element respectively; the first wire and the sixth wire are electrically connected to the two ends of the fifth switching element respectively; the second wire and the sixth wire are electrically connected to the two ends of the sixth switching element respectively; the third wire and the sixth wire are electrically connected to the two ends of the seventh switching element respectively; the fourth wire and the sixth wire are electrically connected to the two ends of the eighth switching element respectively; The first and seventh wires are electrically connected to the two ends of the ninth switching element, respectively; the second and seventh wires are electrically connected to the two ends of the tenth switching element, respectively; the third and seventh wires are electrically connected to the two ends of the eleventh switching element, respectively; the fourth and seventh wires are electrically connected to the two ends of the twelfth switching element, respectively; the first and eighth wires are electrically connected to the two ends of the thirteenth switching element, respectively; the second and eighth wires are electrically connected to the two ends of the fourteenth switching element, respectively; the third and eighth wires are electrically connected to the two ends of the fifteenth switching element, respectively; and the fourth and eighth wires are electrically connected to the two ends of the sixteenth switching element, respectively. It should be noted that in practical applications, those skilled in the art can configure the specific circuit structure of the third and fourth wire connection channels according to actual needs. This is merely an example, and this application does not impose any limitations on it.

[0062] In an optional embodiment, the device further includes a display unit displaying a simulation circuit diagram. The simulation circuit diagram includes crimping status lights corresponding to first and second crimping points of multiple test points, used to indicate whether there is a fault in the crimping status between the corresponding crimping point and the probe. Therefore, after receiving test information, the measurement module 200 can output a control signal to the crimping status light corresponding to the crimping point with a crimping failure to illuminate the light. This allows the tester to visually see the crimping point with a poor crimping status on the simulation circuit diagram of the display unit, facilitating rapid fault diagnosis and improving testing efficiency.

[0063] It should be noted that the display unit can be an existing device such as a display screen, and those skilled in the art can set it according to their needs. This application does not limit it in this regard.

[0064] The following specific example will further illustrate this application. For example... Figure 4As shown, in a specific example, the power output channels include a first channel (Force+) and a second channel (Force-), the voltage feedback channels include a third channel (Sence+) and a fourth channel (Sence-), and the first conductive line includes a first wire a, a second wire b, a third wire c, and a fourth wire d that are respectively connected to the first channel, the second channel, the third channel, and the fourth channel.

[0065] The second conductive circuit includes a fifth wire e, a sixth wire f, a seventh wire g, and an eighth wire h, which are respectively connected to the first probe, the second probe, the third probe, and the fourth probe.

[0066] The first wire and the fifth wire are electrically connected to the two ends of the first switching element S1, respectively; the second wire and the fifth wire are electrically connected to the two ends of the second switching element S2, respectively; the third wire and the fifth wire are electrically connected to the two ends of the third switching element S3, respectively; the fourth wire and the fifth wire are electrically connected to the two ends of the fourth switching element S4, respectively; the first wire and the sixth wire are electrically connected to the two ends of the fifth switching element S5, respectively; the second wire and the sixth wire are electrically connected to the two ends of the sixth switching element S6, respectively; the third wire and the sixth wire are electrically connected to the two ends of the seventh switching element S7, respectively; the fourth wire and the sixth wire are electrically connected to the two ends of the eighth switching element S8, respectively; the first wire The seventh wire is electrically connected to both ends of the ninth switching element S9; the second wire and the seventh wire are electrically connected to both ends of the tenth switching element S10; the third wire and the seventh wire are electrically connected to both ends of the eleventh switching element S11; the fourth wire and the seventh wire are electrically connected to both ends of the twelfth switching element S12; the first wire and the eighth wire are electrically connected to both ends of the thirteenth switching element S13; the second wire and the eighth wire are electrically connected to both ends of the fourteenth switching element S14; the third wire and the eighth wire are electrically connected to both ends of the fifteenth switching element S15; and the fourth wire and the eighth wire are electrically connected to both ends of the sixteenth switching element S16.

[0067] In a specific example, tests are performed on the first test point PAD1 and the second test point PAD2. PAD1 and PAD2 each include two crimping points, A and B, respectively. Assuming that point B on PAD1 is in a faulty crimping condition, the goal is to locate the probe crimping point with the faulty crimp. This can be achieved through the following testing procedure:

[0068] By controlling the closing of switching elements S1, S6, S11 and S16 of the electrical connection module 100 and the opening of other switching elements, PAD1 A is connected to the first channel Force+ of the measurement module 200, PAD1 B is connected to the second channel Force-, PAD2 A is connected to the third channel Sense+ of the measurement module 200, and PAD1 B is connected to the fourth channel Sense-.

[0069] The control measurement module 200 outputs a constant current source and then reads back the test information of PAD1 and PAD2. Since PAD1B is disconnected, the current reading values ​​of the Force+ and Force-l circuits are abnormal, indicating that the A and / or B crimping points of PAD1 are not properly crimped.

[0070] Then, the switching elements S1, S10, S7 and S16 of the control electrical connection module 100 are closed, so that PAD1A is connected to the first channel Force+ of the measurement module 200, PAD2A is connected to the first channel Force- of the measurement module 200, PAD1B is connected to Sense+, and PAD2B is connected to Sense-.

[0071] The control measurement module 200 outputs a constant current source, and the current is read back. The current values ​​of the Force+ and Force-1 circuits are normal, but the voltage values ​​of the Sense+ and Sense- circuits are abnormal, indicating poor crimping of the B contact points of PAD1 and / or PAD2. Combining the results of the two tests, the abnormal contact of PAD1 B can be located.

[0072] After the crimping point of the test point in this application is electrically connected to the probe, the measurement module 200 can determine whether there is a situation where poor crimping between the crimping point and the probe causes the test point to be inaccurately tested by measuring the changes in voltage and current in the test circuit. If so, the electrical connection relationship between the probe (crimping point) and the channel can be changed by controlling the switch of the electrical connection module 100, directly locating which probe and crimping point are poorly crimped. This allows the tester to troubleshoot the abnormality in a timely manner, avoiding the process of repeated crimping and testing, and improving the efficiency and accuracy of the test point.

[0073] Based on the same principle, such as Figure 5 As shown, this application also discloses a probe crimping measurement system. This probe crimping measurement system includes the probe crimping measurement device as described in this embodiment and the device under test.

[0074] Since the principle by which this system solves the problem is similar to that of the above-mentioned devices, the implementation of this system can be found in the implementation of the devices, and will not be repeated here.

[0075] The various embodiments in this specification are described in a progressive manner. Similar or identical parts between embodiments can be referred to interchangeably. Each embodiment focuses on describing the differences from other embodiments. In particular, the system embodiments are basically similar to the method embodiments, so the description is relatively simple; relevant parts can be referred to the descriptions in the method embodiments.

[0076] The foregoing is merely an embodiment of the present application and is not intended to limit the present application. For those skilled in the art, the present application may have various changes and variations. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principles of the present application should all be included within the scope of the claims of the present application.

Claims

1. A probe crimping measurement device, characterized in that, Includes electrical connection module and measurement module; One end of the electrical connection module is connected to the measurement module, and the other end is connected to the device under test (DUT) through the probe. The DUT includes multiple test points, and each test point includes a first crimp point and a second crimp point. The measurement module includes a power output terminal and a voltage feedback terminal. The electrical connection module includes multiple connection paths and a selection switch that controls the on / off state of different connection paths. Each probe is electrically connected to the power output terminal and the voltage feedback terminal through the connection paths respectively. During testing, the probe contacts the first and second crimping points of multiple test points of the device under test, and the measurement module outputs test signals and receives feedback signals from the device under test to test the test points.

2. The probe crimping measurement device according to claim 1, characterized in that, The electrical connection module includes a first four-wire connection channel and a second four-wire connection channel. The selection switch includes a first control switch group and a second control switch group correspondingly disposed on the first four-wire connection channel and the second four-wire connection channel. The two crimping points of each test point are respectively connected to the first four-wire connection channel and the second four-wire connection channel. When measuring a single test point, the first control switch group controls the first four-wire connection channel to be turned on, and the four terminals of the first four-wire connection channel are connected to the two crimping points of the current test point to form a false four-wire channel and obtain the detection information of the current test point; when measuring two adjacent test points, the second control switch group controls the second four-wire connection channel to be turned on, and the four terminals of the second four-wire connection channel are connected to the four crimping points of the two adjacent test points to form a true four-wire channel and obtain the detection information of the crimping points.

3. The probe crimping measurement device according to claim 1 or 2, characterized in that, The electrical connection module includes a third and fourth wire connection channel, and the selection switch includes a third control switch group disposed in the third and fourth wire connection channel. The measurement module switches the four crimping points connecting two adjacent test points through the third control switch group to obtain the detection information of the crimping points.

4. The probe crimping measurement device according to claim 3, characterized in that, Switch the third control switch group, and connect the two crimping points of two adjacent test points to the power output terminal and the voltage feedback terminal through the third four-wire connection channel to obtain the test point detection information; connect any one crimping point of two adjacent test points to the power output terminal and the other crimping point to the voltage feedback terminal to obtain the crimping point detection information.

5. The probe crimping measurement device according to claim 2, characterized in that, The first four-wire connection channel includes an output channel connected to the power output terminal and a feedback channel connected to the voltage feedback terminal. When measuring a single test point, the first control switch group controls the output channel and the feedback channel to be short-circuited. The two channels after short-circuiting are respectively connected to the first crimping point and the second crimping point of the current test point to obtain the test information of the current test point.

6. The probe crimping measurement device according to claim 2, characterized in that, The second four-wire connection channel includes an output channel connected to the power output terminal and a feedback channel connected to the voltage feedback terminal. When measuring two test points, the second control switch group controls the four channels of the output channel and the feedback channel to connect to the four crimping points of the two test points to form a detection loop and obtain the test information of the crimping points.

7. The probe crimping measurement device according to claim 4, characterized in that, The third and fourth wire connection channels include an output channel connected to the power output terminal and a feedback channel connected to the voltage feedback terminal. The four channels of the output channel and the feedback channel are connected to the four crimping points of the two test points to form a detection loop. The power output terminal and voltage feedback terminal of the measurement module can be freely set. Based on the set power output terminal and voltage feedback terminal, the four channels on the third four-wire connection channel are connected to the corresponding crimping points to form the detection circuit through the third control switch group.

8. The probe crimping measurement device according to claim 4, characterized in that, The third and fourth line connection channels include four channels that connect the output channel and the feedback channel to each probe, and a switching element is provided on the connection lines.

9. The probe crimping measurement device according to claim 1, characterized in that, It also includes a display unit, which displays a simulation circuit diagram. The simulation circuit diagram includes crimping status lights corresponding to the first and second crimping points of multiple test points, used to indicate whether there is a fault in the crimping status between the corresponding crimping point and the probe.

10. A probe crimping measurement system, characterized in that, Includes the probe crimping measurement device and the device under test as described in any one of claims 1-9.

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