Test fixture

Abstract

The utility model relates to the technical field of testing, in particular to a testing jig. The test fixture comprises a base assembly and a test circuit board. The base assembly is provided with a first containing groove with a notch facing the first direction. The test circuit board is movably arranged on the base assembly, and the test circuit board is used for transmitting a test signal to the first accommodating groove. The first accommodating groove is used for placing an electronic product to be tested, and the test circuit board is movably arranged on the base assembly and is used for transmitting a test signal to the first accommodating groove. Therefore, the test circuit board can be moved relative to the base assembly according to the position of the to-be-tested electronic product placed in the first accommodating groove so as to adjust the test signal emitted by the test circuit board, so that the test signal is aligned with the to-be-tested electronic product, the precision of test data is improved, and the problem of abnormal test data is solved.

Description

Technical Field

[0001] This application relates to the field of testing technology, and more particularly to a testing fixture. Background Technology

[0002] Electronic products (displays, circuit boards, etc.) need to undergo performance testing during the production process. One of the performance tests is hole testing, which involves fixing the electronic product on a fixture and then having a test circuit board on the fixture test the holes in the electronic product.

[0003] In related technologies, if electronic products are not placed in the correct position, the test circuit board may not be aligned with the electronic products during testing, resulting in abnormal test data. Utility Model Content

[0004] The purpose of this application is to provide a test fixture that aims to solve the problem of abnormal test data.

[0005] To achieve the above objectives, the technical solution adopted in this application embodiment is: a test fixture, including a base assembly and a test circuit board.

[0006] The base assembly has a first receiving groove with the opening of the first receiving groove facing a first direction; the test circuit board is movably disposed on the base assembly and is used to transmit test signals to the first receiving groove.

[0007] The beneficial effects of the test fixture provided in this application are as follows: the first receiving slot is used to place the electronic product under test. Since the test circuit board is movably mounted on the base assembly and is used to transmit test signals to the first receiving slot, the test circuit board can be moved relative to the base assembly according to the position of the electronic product under test placed in the first receiving slot to adjust the test signal transmitted by the test circuit board so that the test signal is aligned with the electronic product under test, thereby improving the accuracy of the test data and solving the problem of abnormal test data.

[0008] In some embodiments, the test fixture further includes a support assembly, which includes a first support column and a second support column. The first support column is disposed on the base assembly. In the first direction, the second support column is located on one side of the base assembly and is rotatably disposed on the first support column. The test circuit board is disposed on the second support column.

[0009] In some embodiments, the first support column is provided with a mounting hole, and the second support column is rotatably inserted into the mounting hole.

[0010] In some embodiments, the second support column is interference-fitted with the mounting hole.

[0011] In some embodiments, the second support column is provided with a positioning groove, and at least a portion of the test circuit board is accommodated in the positioning groove.

[0012] In some embodiments, the base assembly further has a clearance groove communicating with the first receiving groove.

[0013] In some embodiments, in a direction opposite to the first direction, the depth of the clearance groove is greater than the depth of the first receiving groove, and a portion of the clearance groove penetrates the bottom of the first receiving groove, while another portion of the clearance groove extends in a direction away from the first receiving groove.

[0014] In some embodiments, the first receiving groove includes a plurality of sidewalls connected end to end in sequence, and an air-avoiding groove is provided at the connection of two adjacent sidewalls, extending in a direction away from the first receiving groove and communicating with the first receiving groove.

[0015] In some embodiments, the base assembly includes a support plate and a support frame, the support frame having a second receiving groove with the opening of the second receiving groove facing the first direction, the support plate covering the opening of the second receiving groove, and the first receiving groove being formed on the support plate.

[0016] In some embodiments, the support plate has a wire through hole extending through the support plate along the first direction. Attached Figure Description

[0017] To more clearly illustrate the technical solutions in the embodiments of this application, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0018] Figure 1 This is a schematic diagram of the structure of the test fixture in one embodiment of this application;

[0019] Figure 2 yes Figure 1 The exploded view of the test fixture shown;

[0020] Figure 3 yes Figure 1 The diagram shows the structure of the test fixture after the test circuit board has been removed.

[0021] Figure 4 yes Figure 3 A magnified view of part A shown.

[0022] Figure label:

[0023] 1. Base assembly; 11. Support plate; 111. First receiving groove; 1111. Side wall; 112. Clearance groove; 113. Clearance groove; 114. Cable hole; 12. Support frame; 121. Second receiving groove;

[0024] 2. Test the circuit board;

[0025] 3. Support components; 31. First support column; 311. Mounting hole; 32. Second support column; 321. Positioning groove. Detailed Implementation

[0026] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0027] It should be noted that when a component is referred to as being "fixed to" or "set on" another component, it can be directly on or indirectly on that other component. When a component is referred to as being "connected to" another component, it can be directly connected to or indirectly connected to that other component.

[0028] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of this application, "multiple" means two or more, unless otherwise explicitly specified.

[0029] In this specification, references to "one embodiment," "some embodiments," or simply "embodiment" mean that one or more embodiments of this application include a specific feature, structure, or characteristic described in connection with that embodiment. Therefore, the phrases "in one embodiment," "in some embodiments," "in other embodiments," "in still other embodiments," etc., appearing in different parts of this specification do not necessarily refer to the same embodiment, but rather mean "one or more, but not all, embodiments," unless otherwise specifically emphasized. Furthermore, in one or more embodiments, specific features, structures, or characteristics may be combined in any suitable manner.

[0030] Electronic products (displays, circuit boards, etc.) need to undergo performance testing during the production process. One of the performance tests is hole testing, which involves fixing the electronic product on a fixture and then having a test circuit board on the fixture test the holes in the electronic product.

[0031] In related technologies, if electronic products are not placed in the correct position, the test circuit board may not be aligned with the electronic products during testing, resulting in abnormal test data.

[0032] In view of the above problems, this application provides a test fixture to solve the problem of abnormal test data.

[0033] To illustrate the technical solution of this application, the following description is provided in conjunction with specific accompanying drawings and embodiments.

[0034] Please refer to Figure 1 This application provides a test fixture, including a base assembly 1 and a test circuit board 2.

[0035] The base assembly 1 has a first receiving groove 111, the opening of the first receiving groove 111 facing a first direction (X direction in the figure); the test circuit board 2 is movably disposed on the base assembly 1, and the test circuit board 2 is used to transmit test signals to the first receiving groove 111.

[0036] In the test fixture provided in this application, the first receiving slot 111 is used to place the electronic product under test. Since the test circuit board 2 is movably mounted on the base assembly 1 and is used to emit test signals to the first receiving slot 111, the test circuit board 2 can be moved relative to the base assembly 1 according to the position of the electronic product under test placed in the first receiving slot 111 to adjust the test signal emitted by the test circuit board 2, so that the test signal is aligned with the electronic product under test, thereby improving the accuracy of the test data and solving the problem of abnormal test data.

[0037] It should be noted that the test fixture in this application embodiment can be used to test whether the holes on the electronic product under test are qualified (e.g., whether the hole depth is qualified). The method of the test circuit board 2 to test the holes in the electronic product is as follows: the test circuit board 2 emits a test signal (infrared light or laser) to the hole on the electronic product under test placed in the first receiving groove 111. The test signal is reflected from the electronic product under test and returned to the test circuit board 2. The test circuit board 2 calculates the distance between the bottom of the hole and the test circuit board 2 and the distance between the hole opening and the test circuit board 2 based on the time difference between the emission of the test signal and the return of the test signal after being reflected by the electronic product under test. This is to determine whether the depth of the hole in the electronic product under test is qualified.

[0038] In the test fixture of this application embodiment, the test circuit board 2 includes a signal transmitter for transmitting test signals and a signal receiver for receiving test signals.

[0039] It should be noted that the shape and size of the first receiving slot 111 in the test fixture of this application embodiment can be designed according to the shape and size of the electronic product under test, so as to avoid the electronic product under test not being placed in place, and to solve the problem of test instability caused by the electronic product under test not being placed in place. For example, please refer to Figure 1 The first receiving groove 111 is a rectangular groove. On the cross section perpendicular to the first direction, the outline of the first receiving groove 111 is rectangular. The length of the rectangle is equal to the length of the electronic product under test, and the width of the rectangle is equal to the width of the electronic product under test.

[0040] Optionally, in some embodiments, the test circuit board 2 is slidably mounted on the base assembly 1, the base assembly 1 having a groove and a slider slidably mounted within the groove, the test circuit board 2 being mounted on the slider. The slider can move the test circuit board 2 to adjust the test signal emitted by the test circuit board 2.

[0041] Optionally, in some embodiments, the test circuit board 2 is rotatably mounted on the base assembly 1. Please refer to... Figure 1 , Figure 3 and Figure 4 The test fixture also includes a support assembly 3, which includes a first support column 31 and a second support column 32. The first support column 31 is disposed on the base assembly 1. In a first direction, the second support column 32 is located on one side of the base assembly 1 and is rotatably disposed on the first support column 31. The test circuit board 2 is disposed on the second support column 32.

[0042] By adopting the above technical solution, the test circuit board 2 can be set on the side of the first receiving groove 111 facing the first direction, and when the second support column 32 rotates relative to the first support column 31, the relative position of the test circuit board 2 and the first receiving groove 111 can be changed, thereby changing the position and direction of the test signal emitted by the test circuit board 2.

[0043] Please refer to Figure 4 In some embodiments, the rotation axis of the second support column 32 is perpendicular to the first direction (the rotation axis of the second support column 32 is parallel to the Y direction in the figure), so that the end of the test circuit board 2 near the first receiving groove 111 moves back and forth in the first direction to change the position and direction of the test signal emitted by the test circuit board 2.

[0044] Figure 4 In the embodiment shown, the first support column 31 is provided with a mounting hole 311, and the second support column 32 is rotatably inserted into the mounting hole 311.

[0045] In the above embodiment, the mounting hole 311 extends along the Y direction, and a portion of the second support column 32 is rotatably accommodated within the mounting hole 311.

[0046] By adopting the above technical solution, the connection structure of the first support column 31 and the second support column 32 can be simplified, making it easier to connect the first support column 31 and the second support column 32, and the structure of the support component 3 can be simplified, thereby reducing the production cost and installation difficulty of the test fixture in this application embodiment.

[0047] In some embodiments, the second support column 32 is interference-fitted with the mounting hole 311.

[0048] By adopting the above technical solution, the second support column 32 can be prevented from rotating relative to the first support column 31 under its own gravity and the gravity of the test circuit board 2, so as to fix the position of the test circuit board 2 after adjusting the position, so as to maintain the direction of the signal emitted by the test circuit board 2, thereby improving the testing accuracy of the test fixture in this application embodiment.

[0049] In some embodiments, the rotation axis of the second support column 32 is parallel to the first direction, causing the end of the test circuit board 2 near the first receiving groove 111 to move at the opening of the first receiving groove 111, thereby changing the position and direction of the test signal emitted by the test circuit board 2.

[0050] In the above embodiment, the second support post 32 is rotatably sleeved on the first support post 31 about a rotation axis parallel to the first direction. That is, the second support post 32 has an insertion hole extending in the first direction, and a portion of the first support post 31 is rotatably inserted into the insertion hole. Furthermore, the first support post 31 and the insertion hole are interference-fitted to prevent the second support post 32 from rotating relative to the first support post 31 under its own weight and the weight of the test circuit board 2. This facilitates fixing the position of the test circuit board 2 after its position is adjusted, maintaining the direction of the signal emitted by the test circuit board 2, thereby improving the testing accuracy of the test fixture in this embodiment.

[0051] Please refer to Figure 4 In some embodiments, the second support column 32 is provided with a positioning groove 321, and at least part of the test circuit board 2 is accommodated in the positioning groove 321.

[0052] By adopting the above technical solution, the test circuit board 2 is housed in the positioning groove 321, which not only fixes the test circuit board 2 on the second support column 32, but also limits the position of the test circuit board 2. When installing the test circuit board 2, it helps to install the test circuit board 2 in a predetermined position so as to adjust the position and direction of the signal emitted by the test circuit board 2.

[0053] In some embodiments, in order to prevent the test circuit board 2 from moving relative to the second support post 32, a fastener can be used to fix the test circuit board 2 to the second support post 32.

[0054] For example, the fastener is a screw, which passes through the test circuit board 2 and the second support post 32 in sequence, and the screw is threadedly connected to the second support post 32.

[0055] Please refer to Figure 4 In some embodiments, there are two first support columns 31, and the two ends of the second support column 32 are rotatably mounted on one of the first support columns 31.

[0056] By adopting the above technical solution, the two first support columns 31 jointly support the second support column 32, making the force on the second support column 32 more balanced. This prevents the second support column 32 from rotating relative to the first support column 31 under its own weight and the weight of the test circuit board 2, helping to maintain the position of the second support column 32 relative to the first support column 31. This makes the structure of the support assembly 3 more stable, thereby improving the testing accuracy of the test fixture in this embodiment.

[0057] Please refer to Figure 3 In some embodiments, the base assembly 1 also has a clearance groove 112 communicating with the first receiving groove 111.

[0058] By adopting the above technical solution, the clearance groove 112 can accommodate the operator's fingers or part of the operating machine, and can facilitate the assembly and removal of the electronic product under test in the first receiving groove 111 on the base assembly 1.

[0059] Please refer to Figure 3 In some embodiments, in a direction opposite to the first direction, the depth of the clearance groove 112 is greater than the depth of the first receiving groove 111, and part of the clearance groove 112 penetrates the bottom of the first receiving groove 111, while another part of the clearance groove 112 extends in a direction away from the first receiving groove 111.

[0060] By adopting the above technical solution, when assembling and removing the electronic product under test in the first receiving groove 111 on the base assembly 1, the operator's fingers or part of the operating machine can contact the surface of the electronic product under test facing the bottom of the first receiving groove 111, so that the operator's fingers or part of the operating machine can support the electronic product under test, and facilitate the assembly and removal of the electronic product under test in the first receiving groove 111 on the base assembly 1.

[0061] Please refer to Figure 3 In some embodiments, at least two clearance slots 112 are provided, and at least two clearance slots 112 are located on opposite sides of the first receiving slot 111. Operators or some operating machines clamp the electronic product under test, which facilitates the assembly and removal of the electronic product under test in the first receiving slot 111 on the base assembly 1.

[0062] Please refer to Figure 3 In some embodiments, the first receiving groove 111 includes a plurality of side walls 1111 connected end to end in sequence, and an air-avoiding groove 113 is provided at the connection of two adjacent side walls 1111, extending in a direction away from the first receiving groove 111 and communicating with the first receiving groove 111.

[0063] By adopting the above technical solution, it is possible to prevent damage to the corners of the connection points between two adjacent sidewalls 1111 of the electronic product under test when assembling the electronic product under test into the first receiving slot 111.

[0064] Please refer to Figure 2 In some embodiments, the base assembly 1 includes a support plate 11 and a support frame 12. The support frame 12 has a second receiving groove 121 with the opening of the second receiving groove 121 facing a first direction. The support plate 11 covers the opening of the second receiving groove 121, and a first receiving groove 111 is formed on the support plate 11.

[0065] It should be noted that when testing the electronic product under test, the test circuit board 2 needs to be powered, and the data needs to be processed after the test circuit board 2 collects data. Therefore, the test fixture in this embodiment of the application also needs to be configured with battery components, signal processing components and other structures.

[0066] In the above embodiments, the battery assembly, data processing assembly, etc., can be housed in the second receiving slot 121, making the test fixture neater. Furthermore, placing the battery assembly and data processing assembly externally on the test circuit board 2 reduces the weight of the test circuit board 2, preventing the second support column 32 from rotating relative to the first support column 31 under its own weight and the weight of the test circuit board 2. This helps maintain the position of the second support column 32 relative to the first support column 31, thereby improving the testing accuracy of the test fixture in this embodiment.

[0067] Please refer to Figure 3 In some embodiments, the support plate 11 has a wire hole 114 that extends through the support plate 11 in a first direction.

[0068] By adopting the above technical solution, it is convenient to connect the test circuit board 2 to the battery assembly and data processing assembly housed in the second receiving slot 121.

[0069] Please refer to Figure 2 In some embodiments, the first receiving groove 111, the clearance groove 112, the clearance groove 113 and the wire passage hole 114 are all formed on the support plate 11, and the clearance groove 112 is formed by the inner wall of the through hole penetrating the support plate 11.

[0070] The above embodiments are only used to illustrate the technical solutions of this application, and are not intended to limit them. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of this application, and should all be included within the protection scope of this application.

Claims

1. A test fixture, characterized in that, include: The base assembly has a first receiving groove, the opening of which faces a first direction; A test circuit board is movably mounted on the base assembly, and the test circuit board is used to transmit test signals to the first receiving slot; The test fixture further includes a support assembly, which includes a first support column and a second support column. The first support column is disposed on the base assembly. In the first direction, the second support column is located on one side of the base assembly and is rotatably disposed on the first support column. The test circuit board is disposed on the second support column. Rotation of the second support column relative to the first support column can change the relative position of the test circuit board and the first receiving groove.

2. The test fixture according to claim 1, characterized in that, The first support column is provided with a mounting hole, and the second support column is rotatably inserted into the mounting hole.

3. The test fixture according to claim 2, characterized in that, The second support column is interference-fitted with the mounting hole.

4. The test fixture according to claim 1, characterized in that, The second support column is provided with a positioning groove, and at least part of the test circuit board is accommodated in the positioning groove.

5. The test fixture according to any one of claims 1 to 4, characterized in that, The base assembly also has a clearance groove that communicates with the first receiving groove.

6. The test fixture according to claim 5, characterized in that, In the direction opposite to the first direction, the depth of the clearance groove is greater than the depth of the first receiving groove, and part of the clearance groove penetrates the bottom of the first receiving groove, while another part of the clearance groove extends in a direction away from the first receiving groove.

7. The test fixture according to any one of claims 1 to 4, characterized in that, The first receiving groove includes a plurality of side walls connected end to end in sequence, and at the connection of two adjacent side walls, there is a clearance groove that extends in a direction away from the first receiving groove and communicates with the first receiving groove.

8. The test fixture according to any one of claims 1 to 4, characterized in that, The base assembly includes a support plate and a support frame. The support frame has a second receiving groove with the opening of the second receiving groove facing the first direction. The support plate covers the opening of the second receiving groove, and the first receiving groove is formed on the support plate.

9. The test fixture according to claim 8, characterized in that, The support plate has a wire through hole that extends through the support plate along the first direction.

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