Simple flip test socket
The design of a simple flip-top test socket solves the problem of operational complexity in complex chip test sockets, achieving the effects of simplified operation, improved applicability, and reduced costs.
Patent Information
- Application Number
- CN202422318119.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-09-23
- Publication Date
- 2025-10-31
- Estimated Expiration
- 2034-09-23
AI Technical Summary
Existing chip test sockets are complex in design, increasing the learning burden for operators who are new to the testing equipment or have low technical skills. This can easily lead to testing errors, affecting testing efficiency and accuracy, and is also costly.
A simple flip-top test stand is designed, featuring an intuitive flip-top structure and automatic opening and closing mechanism. It provides an open viewing window and side heat dissipation channels, simplifying the operation process and improving applicability and ease of use.
It simplifies operation procedures, improves testing accuracy, reduces defective products, lowers testing costs, and extends the service life of the test fixture.
Smart Images
Figure CN223501113U_ABST
Abstract
Description
Technical Field
[0001] This utility model belongs to the field of chip testing technology, specifically relating to a simple flip-top test socket. Background Technology
[0002] With the continuous leaps in semiconductor technology, chips are increasingly pursuing high integration, and their testing requirements are becoming more complex. As a result, the design of common chip test sockets is becoming more complex and automated. While these designs improve testing efficiency to some extent, for operators who are new to testing equipment or have relatively low technical skills, the complex operating procedures, dense button layout, and closed testing environment increase their learning burden and are prone to test errors due to improper operation. This not only affects testing efficiency and the accuracy of results but also greatly increases testing costs.
[0003] Therefore, a simple flip-top test fixture was designed to simplify the operation process, improve the testing environment, and thus enhance the applicability and ease of use of the test operation. Utility Model Content
[0004] The purpose of this invention is to provide a simple flip-top test fixture to solve the problems mentioned in the background art.
[0005] To achieve the above objectives, this utility model provides the following technical solution: a simple flip-top test base, comprising a base, a positioning groove inside the base, a first abutment plate on the top left side of the base, a first mounting groove on the first abutment plate, a locking plate connected to the first mounting groove via a first rotating shaft, a second abutment plate on the top right side of the base, a second mounting groove on the top of the second abutment plate, a closing cover connected to the second mounting groove via a second rotating shaft, and a pressure window on the closing cover.
[0006] Preferably, the upper part of the card plate extends to the right to form a card block, and the left side of the cover is recessed with a card groove, and the card block cooperates with the card groove.
[0007] Preferably, a connecting hole is provided on the right side of the card plate, and a first elastic element is connected between the connecting hole and the right side of the inner wall of the first mounting groove.
[0008] Preferably, a second elastic element is sleeved on the second rotating shaft.
[0009] Preferably, the second elastic element is a torsion spring, and the two ends of the torsion spring are fixed to the second mounting groove, with the connection abutting against the covering surface of the cover.
[0010] Preferably, the first and second rotating shafts are provided with friction textures.
[0011] Preferably, an observation cavity is formed between the first abutment, the second abutment, and the base.
[0012] Preferably, the left and right sides of the chip form lateral heat dissipation channels with the first and second abutments, respectively.
[0013] Compared with existing technologies, the advantages of this utility model are as follows: This utility model features an intuitive flip-top structure with an automatic opening and closing mechanism. During actual testing, pushing the flip-top automatically locks the cover, and after testing, pushing the pusher unlocks the cover, which then automatically opens. This facilitates the removal of the tested chip, reducing the number of steps and increasing accuracy, thus simplifying chip testing and improving applicability to testers of varying skill levels. Furthermore, by incorporating two left and right support plates, the entire test socket is designed as a sufficiently open viewing window, providing a clear view of the testing area and facilitating observation of the testing process and chip status, significantly reducing the generation of defective products and lowering testing costs. This utility model also features a side heat dissipation channel, enhancing airflow during testing to optimize the testing environment, preventing chip overheating and aging of internal components, and ensuring the lifespan of the test socket. Attached Figure Description
[0014] Figure 1 This is a three-dimensional structural diagram of the present invention;
[0015] Figure 2 This is a partial three-dimensional structural schematic diagram of the present invention;
[0016] Figure 3 This is a magnified view of point a;
[0017] Figure 4 This is a partial exploded view of the present invention;
[0018] Figure 5 This is a cross-sectional view of the present invention in its working state.
[0019] The following numbers are labeled in the diagram: 1-base, 2-positioning groove, 3-first abutment plate, 4-first mounting groove, 5-first rotating shaft, 6-clamping plate, 7-second abutment plate, 8-second mounting groove, 9-second rotating shaft, 10-closing cover, 11-pressing window, 12-clamping block, 13-clamping groove, 14-connecting hole, 15-first elastic element, 16-second elastic element, 17-torsion spring, 18-friction texture, 19-observation cavity, 20-side heat dissipation channel. Detailed Implementation
[0020] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.
[0021] Example 1
[0022] like Figures 1 to 5 The simplified flip-top test fixture shown includes a base 1, a positioning groove 2 inside the base 1, a first abutment plate 3 on the top left side of the base 1, a first mounting groove 4 on the first abutment plate 3, a locking plate 6 connected to the first mounting groove 4 via a first rotating shaft 5, a second abutment plate 7 on the top right side of the base 1, a second mounting groove 8 on the top of the second abutment plate 7, a cover 10 connected to the second mounting groove 8 via a second rotating shaft 9, and a pressure window 11 on the cover 10; the upper part of the locking plate 6 extends to the right to form a locking block 12, and a locking groove 13 is recessed on the left side of the cover 10, the locking block 12 and the locking groove 13 cooperating; A connection hole 14 is provided on the right side of the card plate 6. A first elastic element 15 is connected between the connection hole 14 and the right side of the inner wall of the first mounting groove 4. A second elastic element 16 is sleeved on the second rotating shaft 9. The second elastic element 16 is a torsion spring 17. The two ends of the torsion spring 17 are fixed on the second mounting groove 8, and the connection point abuts against the covering surface of the cover 10. Friction textures 18 are provided on the first rotating shaft 5 and the second rotating shaft 9. An observation cavity 19 is formed between the first abutment plate 3, the second abutment plate 7, and the base 1. Side heat dissipation channels 20 are formed between the left and right sides of the chip and the first abutment plate 3 and the second abutment plate 7, respectively.
[0023] This invention features an intuitive flip-top structure with an automatic opening and closing mechanism. During testing, the cover 10 is flipped to automatically lock; after testing, the pusher unlocks the cover 10, which then automatically opens, facilitating the removal of the tested chip. This streamlined process reduces operational steps and increases precision, enabling simplified chip testing and improving applicability to testers of varying skill levels. Furthermore, the inclusion of two side plates creates a sufficiently open viewing window, providing a clear view of the testing area and facilitating observation of the testing process and chip status, significantly reducing defective products and testing costs. Additionally, the invention includes a side heat dissipation channel 20, enhancing airflow during testing, optimizing the testing environment, preventing chip overheating and aging of internal components, and ensuring the lifespan of the test socket.
[0024] Example 2
[0025] like Figures 1 to 5The illustrated simple flip-top test fixture includes a base 1 and a rotatably mounted cover 10. One side of the cover 10 is fixedly mounted on the base 1, eliminating the need for beginners to determine the front / back or left / right orientation of the cover 10, thus reducing chip damage or invalid tests caused by incorrect cover placement. The base 1 is a hollow cuboid, with a positioning groove 2 formed in the hollow area. The positioning groove 2 is divided into upper and lower functional areas. The lower area is used to mount a test board, the size of which is the same as the positioning groove 2. The test board has multiple test holes for inserting probes. When the test board is positioned within the positioning groove 2, it forms an open-top cavity for placing the chip to be tested. The chip's size is also the same as the positioning groove 2. After being placed above the positioning groove 2, the chip is positioned by the four sides of the groove, preventing the chip from shifting during testing. This would cause the bottom pins to misalign with the probes, resulting in invalid tests or, worse, chip damage, damage to the chip caused by the chip moving and its panel directly contacting the probes.
[0026] It should be noted that after the chip is placed in the positioning slot 2, its overall height will protrude from the base 1, which not only satisfies the positioning of the chip for detection, but also facilitates the chip to be picked up and adjusted. After the inspector uses tweezers or other auxiliary tools to hold the chip protruding from both sides of the base 1, the chip can be picked up smoothly and easily.
[0027] Example 3
[0028] like Figures 1 to 5 The simple flip-top test base shown has a first abutment plate 3 on the top left side of the base 1. The first abutment plate 3 has a first mounting groove 4 on the left side. The upper part of the first mounting groove 4 extends between the left and right sides of the first abutment plate 3, and the lower part of the first mounting groove 4 is located on the left side of the first abutment plate 3, forming a mirrored "7" shape. The upper part of the first mounting groove 4 is rotatably connected to a first rotating shaft 5, which extends through the entire first abutment plate 3. The first rotating shaft 5 is provided with a clamping plate 6. The upper part of the clamping plate 6 extends to the right to form a clamping block 12. The clamping block 12 is used to clamp the cover 10 to maintain the test state of the chip. The clamping block 12 is a right-angled triangle shape. The bottom side is perpendicular to the clamping plate 6, so that the side of the clamping block 12 that is close to the cover 10 is inclined. When the cover 10 is flipped downward, it can first contact the inclined surface of the clamping block 12, causing the clamping block 12 to swing to the left until the cover 10 is flipped to the bottom of the clamping block 12. At this time, the clamping block 12 swings to the right to reset and fixes the cover 10 at the right angle, thereby fixing the cover 10 and indirectly maintaining the test state of the chip.
[0029] To simplify the testing process, this embodiment also includes a connecting hole 14 on the right side of the clamping plate 6. A first elastic element 15, specifically a tension spring, connects the connecting hole 14 to the right side of the inner wall of the first mounting groove 4. Under the action of the tension spring, the clamping plate 6 remains parallel to the first abutment plate 3. When the clamping block 12 is forced to swing to the left, the clamping plate 6 rotates around the first pivot 5, tilting outwards at the top and inwards at the bottom, compressing the tension spring. When the cover 10 is flipped below the clamping block 12 and no longer exerts force on it, the tension spring resets, pushing the clamping plate 6 to rotate and reset, thereby causing the clamping block 12 to swing to the right, fixing the cover 10 at a right angle, thus automatically securing the cover 10. The tester only needs to flip the cover 10 downwards, push it past the clamping block 12, and stop flipping. At this point, the clamping block 12 resets under the action of the tension spring, securing the cover 10. The operation is simple and requires minimal adjustment.
[0030] Correspondingly, when the test is completed and the cover 10 needs to be opened, in order to prevent the tester from directly touching the locking block 12 and attempting to rotate the locking block 12 to release the cover 10, but accidentally pushing the cover 10 downwards and causing damage to the chip below, this embodiment also provides a pusher extending from the lower left side of the card plate 6. The pusher protrudes from the left side of the locking block 12. Then, the tester pushes the locking block 12 to swing the lower part of the entire card plate 6 to the right, and the locking block 12 swings to the left and no longer locks the cover 10, thus achieving easy and safe unlocking of the cover 10.
[0031] Example 4
[0032] like Figures 1 to 5The illustrated simple flip-top test fixture has a second abutment 7 on the top right side of the base 1. A second mounting groove 8 is formed on the top of the second abutment 7, and a second rotating shaft 9 is rotatably connected between the front and rear sides of the second mounting groove 8, extending through the entire second abutment 7. A cover 10 is mounted on the second rotating shaft 9 and flips over the second abutment 7 with the second rotating shaft 9 as the center. Flipping towards the first abutment 3 indicates that the cover 10 covers the chip. At this time, a locking block 12 engages with a recessed slot 13 on the left side of the cover 10, indirectly fixing the cover 10 and maintaining the chip's testing state. However, when the test is complete and the cover 10 needs to be flipped open, a novice user may, due to lack of experience, accidentally press the cover 10 downwards, potentially damaging the tested chip underneath. Furthermore, in this embodiment, a second elastic element 16 is also fitted on the second rotating shaft 9. The second elastic element 16 is specifically a torsion spring 17. Both ends of the torsion spring 17 are inserted and fixed to the bottom of the inner wall of the second mounting groove 8, and the other end is connected to the covering surface of the cover 10. Under normal conditions, the cover 10 will remain open due to the influence of the torsion spring 17. Therefore, when flipping the cover 10, a little force is required. After flipping the cover 10 until it is locked by the locking block 12, the force is stopped. During this period, the torsion spring 17 deforms. When the test is completed, after the pusher is pushed to unlock the cover 10, the cover 10 can be automatically opened under the reset action of the torsion spring 17, which is conducive to the removal of the chip.
[0033] It is important to note that the first abutment 3 and the second abutment 7 are at the same height, and both are higher than the height of the chip after it is placed. This ensures that the chip will not be affected when the cover 10 is flipped over. Simultaneously, the cover 10 has a pressure window 11, which is used to press the chip downwards through the pressure window 11 (not shown in the diagram), ensuring stable contact between the chip and the probe and guaranteeing the accuracy of the test. The pressure component can be any object with a horizontal bottom surface and a size smaller than the pressure window 11.
[0034] In summary, after inserting the chip, the tester only needs to manually push the cover 10 to flip it until it automatically locks. After the test is completed, the tester can manually push the pusher to unlock the cover 10, which will then automatically open, facilitating the removal of the tested chip. The operation involves fewer steps and higher precision, enabling simple chip testing and improving applicability to testers with different skill levels.
[0035] Example 5
[0036] like Figures 1 to 5The simplified flip-top test stand shown is further simplified in operation and reduced in error rate for chip testing. Friction textures 18 are provided on the first rotating shaft 5 and the second rotating shaft 9 to increase the friction between the first rotating shaft 5 and the second rotating shaft 9 and the first abutment 3 and the second abutment 7, so as to avoid the test stand being damaged by excessive force due to excessive force applied by some people.
[0037] Furthermore, this utility model only sets obstructions on the left and right sides of the base 1, opening up the field of vision on the front and back sides; and sets the first abutment 3 and the second abutment 7 at a certain height, forming an observation cavity 19 between the two and the base 1. The extremely open state allows the tester to observe the test situation at any time, and the test process is less likely to cause tension or anxiety; compared with the closed test seat, this embodiment can greatly reduce the generation of defective products during the test and the test cost.
[0038] Finally, after the chip is placed into the positioning slot 2, the left and right sides of the protruding part will form a side heat dissipation channel 20 with the first abutment 3 and the second abutment 7. This channel is used to dissipate the heat generated and accumulated during the chip testing process, maintain a suitable temperature for the testing environment, and avoid the impact of high temperature on chip performance, which could lead to inaccurate test results or extended test time. At the same time, it can also prevent the high temperature environment from accelerating the aging of the internal components of the test socket and extend their service life.
[0039] It should be noted that, in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.
[0040] The above description is only used to illustrate the technical solution of this utility model and is not intended to limit it. Any other modifications or equivalent substitutions made by those skilled in the art to the technical solution of this utility model, as long as they do not depart from the spirit and scope of the technical solution of this utility model, should be covered within the scope of the claims of this utility model.
Claims
1. A simple flip-top test fixture, comprising a base (1), wherein a positioning groove (2) is provided in the base (1), characterized in that, The base (1) has a first abutment plate (3) on the top left side, and a first mounting groove (4) is opened on the first abutment plate (3). A card plate (6) is connected in the first mounting groove (4) through a first rotating shaft (5). The base (1) has a second abutment plate (7) on the top right side, and a second mounting groove (8) is opened on the top of the second abutment plate (7). A cover (10) is connected in the second mounting groove (8) through a second rotating shaft (9). A pressure window (11) is opened on the cover (10).
2. The simplified flip-top test fixture according to claim 1, characterized in that, The upper part of the card plate (6) extends to the right to form a card block (12), and the left side of the cover (10) is recessed with a card groove (13), and the card block (12) cooperates with the card groove (13).
3. A simplified flip-top test fixture according to claim 2, characterized in that, A connecting hole (14) is provided on the right side of the card plate (6), and a first elastic element (15) is connected between the connecting hole (14) and the right side of the inner wall of the first mounting groove (4).
4. A simplified flip-top test fixture according to claim 1, characterized in that, A second elastic element (16) is sleeved on the second rotating shaft (9).
5. A simplified flip-top test fixture according to claim 4, characterized in that, The second elastic element (16) is a torsion spring (17), and the two ends of the torsion spring (17) are fixed on the second mounting groove (8), with the connection abutting against the covering surface of the cover (10).
6. A simplified flip-top test fixture according to claim 1, characterized in that, The first rotating shaft (5) and the second rotating shaft (9) are provided with friction texture (18).
7. A simplified flip-top test fixture according to claim 1, characterized in that, An observation cavity (19) is formed between the first abutment (3), the second abutment (7) and the base (1).
8. A simplified flip-top test fixture according to claim 1, characterized in that, A chip is placed in the positioning groove (2), and the left and right sides of the chip form side heat dissipation channels (20) with the first abutment (3) and the second abutment (7) respectively.