Detector and security inspection equipment

Abstract

The utility model discloses a detector and security inspection equipment. The detector comprises a shielding member, a low-energy scintillator, a first photodiode, a high-energy scintillator and a second photodiode. The low-energy scintillator, the first photodiode, the high-energy scintillator and the second photodiode are sequentially arranged in the incidence direction of X-rays, the shielding piece and the low-energy scintillator are both located on the same side of the first photodiode, and the shielding piece is located on the same side of the second photodiode in the incidence direction of the X-rays. At least part of the orthographic projection of the shielding piece coincides with part of the orthographic projection of the first photodiode; wherein the shielding piece is used for absorbing low-energy rays in the X-rays and allowing high-energy rays in the X-rays to pass through. According to the scheme, the problem that the spatial resolution of the detector is low can be solved.

Description

Technical Field

[0001] This utility model relates to the field of X-ray security inspection technology, and in particular to a detector and security inspection equipment. Background Technology

[0002] Security screening equipment primarily checks passengers and their luggage for dangerous items such as firearms, ammunition, flammable, explosive, corrosive, toxic, and radioactive materials to ensure the safety of passengers and their property. Security screening equipment typically includes an X-ray source and a detector. The X-ray source emits X-rays, which pass through the object being inspected and are received by the detector. The detector converts the received X-rays into a detection signal. Because objects absorb X-rays to varying degrees, the detection signal appears as an image of different colors on the screen.

[0003] In related technologies, spatial resolution is an important indicator for evaluating the image quality of security inspection equipment, aiming to express the equipment's ability to distinguish fine objects. However, due to limitations in the size of the detector's photodiodes and manufacturing costs, the spatial resolution of the detector is relatively low, resulting in poor image quality for security inspection equipment. Utility Model Content

[0004] This utility model discloses a detector and security inspection equipment to solve the problem of low spatial resolution of the detector.

[0005] To solve the above problems, the present invention adopts the following technical solution:

[0006] A detector includes a blocking element, a low-energy scintillator, a first photodiode, a high-energy scintillator, and a second photodiode;

[0007] The low-energy scintillator, the first photodiode, the high-energy scintillator, and the second photodiode are arranged sequentially along the incident direction of the X-rays. The shielding member and the low-energy scintillator are both located on the same side of the first photodiode. Along the incident direction of the X-rays, at least a portion of the orthographic projection of the shielding member coincides with a portion of the orthographic projection of the first photodiode. The shielding member is used to absorb low-energy rays in the X-rays and to allow high-energy rays in the X-rays to pass through.

[0008] A security inspection device, comprising the aforementioned detector.

[0009] The technical solution adopted in this utility model can achieve the following beneficial effects:

[0010] In the detector disclosed in this utility model, both the blocking element and the low-energy scintillator are located on the same side of the first photodiode. Along the incident direction of the X-rays, at least a portion of the orthographic projection of the blocking element coincides with a portion of the orthographic projection of the first photodiode. The blocking element absorbs low-energy X-rays while allowing high-energy X-rays to pass through. In this design, the blocking element can block a portion of the first photodiode, effectively reducing the imaging area of ​​the low-energy detection portion of the detector. This facilitates the achievement of smaller pixels, thus effectively improving spatial resolution while maintaining the same area of ​​the photosensitive surface of the first photodiode, thereby enhancing the image quality of the security inspection equipment. Attached Figure Description

[0011] The accompanying drawings, which are included to provide a further understanding of the present invention and constitute a part of this invention, illustrate exemplary embodiments of the present invention and, together with the description thereof, serve to explain the present invention and do not constitute an undue limitation thereof. In the drawings:

[0012] Figure 1 This is a schematic diagram of the structure of the first detector disclosed in the embodiment of this utility model;

[0013] Figure 2 for Figure 1 Side view;

[0014] Figure 3 This is a schematic diagram of the structure of the second detector disclosed in the embodiment of this utility model;

[0015] Figure 4 for Figure 3 Side view;

[0016] Figure 5 This is a schematic diagram showing some components of the second detector disclosed in an embodiment of the present utility model;

[0017] Figure 6 This is a schematic diagram of the structure of the third detector disclosed in the embodiments of this utility model;

[0018] Figure 7 for Figure 6 Top view.

[0019] Explanation of reference numerals in the attached figures:

[0020] 100-Detector, 111-Shielding component, 112-Low-energy scintillator, 113-First photodiode, 114-First circuit board, 121-High-energy scintillator, 122-Second photodiode, 123-Second circuit board, 130-Drive mechanism, 140-Low-energy ray filter, 150-Mounting bracket, 160-Support column. Detailed Implementation

[0021] To make the objectives, technical solutions, and advantages of this utility model clearer, the technical solutions of this utility model will be clearly and completely described below in conjunction with specific embodiments and corresponding drawings. Obviously, the described embodiments are only a part of the embodiments of this utility model, and not all of them. Based on the embodiments of this utility model, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this utility model.

[0022] The technical solutions disclosed in the various embodiments of this utility model are described in detail below with reference to the accompanying drawings.

[0023] like Figures 1 to 7 As shown, this utility model discloses a detector 100, which is applied in security inspection equipment. The detector 100 is used to receive X-rays emitted by an X-ray emission source in the security inspection equipment. The detector 100 includes a shielding member 111, a low-energy scintillator 112, a first photodiode 113, a high-energy scintillator 121, and a second photodiode 122.

[0024] The shielding element 111, the low-energy scintillator 112, and the first photodiode 113 constitute the low-energy detection section of the detector 100. The high-energy scintillator 121 and the second photodiode 122 constitute the high-energy detection section of the detector 100. Here, the low-energy detection section mainly absorbs low-energy rays in the X-ray energy spectrum, while the high-energy detection section mainly absorbs high-energy rays in the X-ray energy spectrum.

[0025] Specifically, the low-energy scintillator 112, the first photodiode 113, the high-energy scintillator 121, and the second photodiode 122 are arranged sequentially along the incident direction of the X-rays. The incident direction of the X-rays is as follows: Figure 2 and Figure 4 As indicated by arrow Y in the diagram. Here, X-rays first enter the low-energy scintillator 112, where energy is deposited and visible light is released. Then, the first photodiode 113 converts the visible light signal into an electrical signal, thus enabling the detection of low-energy X-rays. High-energy X-rays are not absorbed by the low-energy scintillator 112, but instead pass through it sequentially, through the low-energy scintillator 112 and the first photodiode 113, to reach the high-energy scintillator 121. Energy is then deposited in the high-energy scintillator 121, and visible light is released. Finally, the second photodiode 122 converts the visible light signal into an electrical signal, thus enabling the detection of high-energy X-rays. The specific working principles and structures of the low-energy scintillator 112, the first photodiode 113, the high-energy scintillator 121, and the second photodiode 122 are well-known technologies and will not be elaborated upon here.

[0026] Furthermore, this application includes a shielding element 111 in the low-energy detection section. Both the shielding element 111 and the low-energy scintillator 112 are located on the same side of the first photodiode 113. This can be understood as the shielding element 111 being located on the side of the first photodiode 113 opposite to the high-energy scintillator 121. Along the incident direction of the X-rays, at least a portion of the orthographic projection of the shielding element 111 coincides with a portion of the orthographic projection of the first photodiode 113. Here, the orthographic projection of the shielding element 111 can be entirely within the orthographic projection of the first photodiode 113; or, a portion of the orthographic projection of the shielding element 111 may be within the orthographic projection of the second photodiode 122. Here, the orthographic projection of the first photodiode 113 can be understood as the orthographic projection of its photosensitive surface.

[0027] The shielding element 111 is used to absorb low-energy X-rays while allowing high-energy X-rays to pass through. In other words, the shielding element 111 can absorb low-energy X-rays in the X-ray energy spectrum, but low-energy X-rays cannot pass through it, while high-energy X-rays can. This means the shielding element 111 absorbs little or no high-energy X-rays, having little impact on them. At this time, the shielding element 111 and the first photodiode 113 have an overlapping area in the X-ray incident direction. This overlapping area occupies a portion of the area, which cannot effectively absorb X-rays. Therefore, the effective X-ray absorption area of ​​the low-energy detection section is reduced, thereby reducing the imaging area of ​​the low-energy detection section in the detector 100.

[0028] In the embodiments disclosed in this application, the blocking member 111 can block a portion of the first photodiode 113, thereby effectively reducing the imaging area of ​​the low-energy detection portion in the detector 100. Specifically, the principle is that motion blur occurs when an object moves; that is, the projection within one integration time is converted into data output only once. The data cannot accurately represent the information of the original projection, as the projection is blurred by the pixels of the photodiode. The degree of blurring depends on the width of the projection per unit integration time, which is also the ray absorption area. If the ray absorption area is reduced, the number of pixels decreases, and the blur size also decreases, thereby improving the spatial resolution of the detector 100 and making the image clearer. Therefore, the detector 100 disclosed in this application can effectively improve the spatial resolution while maintaining the area of ​​the photosensitive surface of the first photodiode 113 unchanged, thus improving the image quality of the security inspection equipment.

[0029] In addition, the detector 100 disclosed in this application can improve spatial resolution without changing the area of ​​the photosensitive surface of the photodiode, thereby reducing the cost of improvement and thus reducing the manufacturing cost of the detector 100 and the security inspection equipment.

[0030] Furthermore, the detector 100 disclosed in this application improves spatial resolution while maintaining a high signal-to-noise ratio (SNR) for the image. In the detector 100 disclosed in this application, the blocking element 111 absorbs low-energy X-rays in the X-ray energy spectrum but absorbs almost no high-energy X-rays. Therefore, the amount of light entering the high-energy scintillator 121 decreases very little or not at all, thus having almost no impact on the SNR of the high-energy image, resulting in a high SNR for the image. Therefore, the detector 100 disclosed in this application can achieve both high spatial resolution and high SNR.

[0031] In the above embodiments, low atomic number materials can absorb low-energy radiation and basically do not absorb high-energy radiation; therefore, the shielding element 111 can be made of a low atomic number material. In the periodic table of elements, elements listed before or after copper can be low atomic number materials; therefore, materials before or after copper can be selected as low atomic number targets. For example, elements such as aluminum, potassium, calcium, titanium, chromium, manganese, iron, cobalt, and nickel.

[0032] In another alternative embodiment, the shielding element 111 can be located between the low-energy scintillator 112 and the first photodiode 113. At least a portion of the orthographic projection of the shielding element 111 can coincide with a portion of the orthographic projection of the low-energy scintillator 112 along the incident direction of the X-rays. In this embodiment, the shielding element 111 blocks between the low-energy scintillator 112 and the first photodiode 113, thereby blocking a portion of the photosensitive surface of the first photodiode 113. While the receiving area of ​​the low-energy scintillator 112 is not reduced, the receiving area of ​​the first photodiode 113 is reduced, thus still lowering the imaging area of ​​the low-energy detection portion.

[0033] In another alternative embodiment, such as Figure 1 and Figure 2 As shown, the low-energy scintillator 112 can be located between the first photodiode 113 and the blocking member 111. At least a portion of the orthographic projection of the blocking member 111 can coincide with a portion of the orthographic projection of the low-energy scintillator 112 along the incident direction of the X-rays. In this case, the blocking member 111 blocks a portion of the low-energy scintillator 112, and the blocked area absorbs the low-energy X-rays. Therefore, the blocked area of ​​the low-energy scintillator 112 does not emit visible light, while the unblocked area of ​​the low-energy scintillator 112 absorbs low-energy rays and deposits energy, thereby emitting visible light. Thus, the unblocked area of ​​the low-energy scintillator 112 performs the main detection function. However, the blocking member 111 blocks a portion of the low-energy scintillator 112, thereby reducing the effective X-ray receiving area of ​​the low-energy scintillator 112, further reducing the receiving area of ​​the first photodiode 113, and thus lowering the imaging area of ​​the low-energy detection section.

[0034] In this scheme, the shielding component 111 can simultaneously reduce the effective ray receiving area of ​​the low-energy scintillator 112 and the receiving area of ​​the first photodiode 113, thereby further ensuring the reliability of the imaging area reduction.

[0035] Optionally, the blocking member 111 can be a strip-shaped structure. The blocking member 111 can be located on the left side of the low-energy scintillator 112, or on the right side. Alternatively, the blocking member 111 can be a ring-shaped structure extending along the edge of the low-energy scintillator 112, in which case the ring-shaped area is the unblocked area. Or, the blocking member 111 can be multiple independent blocking portions, spaced apart on the surface of the low-energy scintillator 112.

[0036] In another alternative embodiment, the detector 100 may further include a drive mechanism 130, which may be connected to the shielding member 111. The drive mechanism 130 can drive the shielding member 111 to move along a direction perpendicular to the incident X-rays, so as to adjust the overlapping area of ​​the orthographic projection of the shielding member 111 and the orthographic projection of the low-energy scintillator 112. Here, movement along a direction perpendicular to the incident X-rays can be understood as movement along the plane containing the receiving surface of the low-energy scintillator 112.

[0037] In this scheme, the driving mechanism 130 can drive the blocking member 111 to move along the plane where the receiving surface of the low-energy scintillator 112 is located, thereby increasing or decreasing the blocking area of ​​the blocking member 111 on the low-energy scintillator 112, thereby adjusting the imaging area, thereby adjusting the spatial resolution, and further improving the applicability of the detector 100.

[0038] Optionally, the drive mechanism 130 can be a linear motor, cylinder, or other power structure. Alternatively, the drive mechanism 130 can include a drive motor and a lead screw, with the drive motor driving the lead screw to rotate. The shielding member 111 is provided with a threaded hole, and the lead screw cooperates with the threaded hole. The drive motor drives the shielding member 111 to reciprocate through the lead screw. Of course, the drive mechanism 130 is not limited to the above-mentioned power structure and can also be other power structures. Furthermore, the drive mechanism 130 is not limited to driving the shielding member 111 to move along a direction perpendicular to the incident X-rays; it can also drive the shielding member 111 along the incident X-rays to adjust the height between the shielding member 111 and the low-energy scintillator 112.

[0039] In another alternative embodiment, along the incident direction of the X-rays, the orthographic projection of the low-energy scintillator 112 can coincide with the orthographic projection of the first photodiode 113. In this case, the area of ​​the orthographic projection of the low-energy scintillator 112 is equal to the area of ​​the orthographic projection of the first photodiode 113, and the orthographic projections of the low-energy scintillator 112 and the first photodiode 113 completely coincide. This can also be understood as the outline of the orthographic projection of the low-energy scintillator 112 coinciding with the outline of the orthographic projection of the first photodiode 113. In this scheme, the orthographic projection of the low-energy scintillator 112 completely coincides with the orthographic projection of the first photodiode 113, thus avoiding the situation where X-rays directly hit the first photodiode 113, thereby avoiding interference with the electrical signal.

[0040] In another embodiment, along the incident direction of the X-rays, the projected area of ​​the low-energy scintillator 112 can be larger than the projected area of ​​the first photodiode 113, and the projected area of ​​the first photodiode 113 can be located within the projected area of ​​the low-energy scintillator 112. In this case, the low-energy scintillator 112 has a larger area, thus completely covering the first photodiode 113. In this embodiment, the projected area of ​​the first photodiode 113 is smaller than the projected area of ​​the low-energy scintillator 112, thus preventing the first photodiode 113 from receiving stray light and improving the imaging effect.

[0041] In another alternative, the shielding element 111 may include a copper sheet. In this embodiment, the copper sheet has good low-energy radiation absorption performance and hardly absorbs high-energy radiation. Therefore, using a copper sheet as the shielding element 111 can further improve the spatial resolution of the image and also improve the signal-to-noise ratio of the image.

[0042] Of course, the shielding element 111 is not limited to copper sheets, but may also include tungsten sheets, lead sheets, or iron sheets, and may also be made of other materials that can absorb low-energy rays and allow high-energy rays to pass through.

[0043] In another alternative embodiment, the low-energy scintillator 112 and the shielding member 111 are joined together along a direction perpendicular to the incident X-ray direction. That is, the low-energy scintillator 112 and the shielding member 111 are joined together as a single structure on one side of the first photodiode 113, or, as can be understood, the low-energy scintillator 112 and the shielding member 111 are arranged side-by-side on one side of the first photodiode 113. In this case, the low-energy scintillator 112 can cover a portion of the photosensitive surface of the first photodiode 113, and the shielding member 111 can also cover a portion of the photosensitive surface of the first photodiode 113. This can be understood as forming a joined low-energy scintillator by joining the shielding member 111 and the low-energy scintillator 112.

[0044] In this design, the shielding element 111 and the low-energy scintillator 112 are located on the same plane, thus reducing the stacking height of the low-energy detection section, which is more conducive to reducing the overall height or thickness of the detector 100. In addition, this design can also avoid the scattering effect of the shielding element 111, thereby further improving the detection performance.

[0045] In another alternative scheme, along the incident direction of the X-rays, the orthographic projections of both the low-energy scintillator 112 and the shielding member 111 are located within the orthographic projection of the first photodiode 113, and the sum of the areas of the orthographic projections of the low-energy scintillator 112 and the shielding member 111 is equal to the area of ​​the orthographic projection of the first photodiode 113. This can be understood as the outline of the orthographic projection of the spliced ​​low-energy scintillator formed by the shielding member 111 and the low-energy scintillator 112 coinciding with the outline of the orthographic projection of the first photodiode 113. In this scheme, the low-energy scintillator 112 and the shielding member 111 can completely cover the first photodiode 113, thus preventing X-rays from directly hitting the first photodiode 113 and avoiding interference with the electrical signal.

[0046] The thickness of the low-energy scintillator 112 can be the same as the thickness of the shielding component 111. Of course, the thickness of the shielding component 111 can be calculated based on the specific low-energy ray energy.

[0047] The low-energy scintillator 112 and the blocking component 111 here can be spliced ​​together from left to right, such as... Figure 5 As shown, in this case, the low-energy scintillator 112 and the blocking member 111 are spliced ​​along the width direction of the first photodiode 113. Alternatively, the low-energy scintillator 112 and the blocking member 111 can be spliced ​​along the length direction of the first photodiode 113. Furthermore, the low-energy scintillator 112 can be a ring-shaped structure, and the blocking member 111 can be embedded in the inner ring region of the low-energy scintillator 112. In another embodiment, the blocking member 111 can be a ring-shaped structure, and the low-energy scintillator 112 can be embedded in the inner ring region of the blocking member 111.

[0048] In another embodiment, along the incident direction of the X-rays, the projected area of ​​the low-energy scintillator 112 and the shielding member 111 is larger than the projected area of ​​the first photodiode 113, and the projected area of ​​the first photodiode 113 lies within the projected area of ​​the low-energy scintillator 112 and the shielding member 111. In this case, the projected area of ​​the component formed by splicing the low-energy scintillator 112 and the shielding member 111 is larger, thus preventing the first photodiode 113 from receiving stray light, thereby improving the imaging effect.

[0049] In another alternative embodiment, the shielding element 111 can be a titanium dioxide layer. In this case, the titanium dioxide layer is spliced ​​onto the low-energy scintillator 112. This approach reduces the complexity of the splicing process, thereby lowering the manufacturing cost of the detector 100.

[0050] In the above embodiments, the shielding component 111 and the low-energy scintillator 112 can be a separate splicing structure, that is, the two are set separately and assembled separately. Alternatively, the shielding component 111 and the low-energy scintillator 112 can be an integrated splicing structure, that is, the shielding component 111 and the low-energy scintillator 112 are combined into a whole for assembly.

[0051] In another alternative embodiment, the detector 100 may further include a low-energy ray filter 140, which can be used to absorb low-energy rays in X-rays while allowing high-energy rays in X-rays to pass through. The low-energy ray filter 140 can be located between the first photodiode 113 and the high-energy scintillator 121. In this scheme, when X-rays are directed at the high-energy scintillator 121, the low-energy rays can be filtered out by the low-energy ray filter 140, thereby retaining only high-energy rays and avoiding the influence of low-energy rays on the high-energy detection part, thus further improving the reliability of the detector 100.

[0052] Low atomic number materials can absorb low-energy radiation and have virtually no absorption of high-energy radiation; therefore, the low-energy radiation filter 140 can be made of low atomic number materials. In the periodic table, elements listed before or after copper can be low atomic number materials; therefore, materials before or after copper can be selected as low atomic number target materials. Examples include aluminum, potassium, calcium, titanium, chromium, manganese, iron, cobalt, and nickel. Of course, the low-energy radiation filter 140 can also be made of other materials that can absorb low-energy radiation but allow high-energy radiation to pass through; this is not a limitation of the method described herein.

[0053] In another alternative embodiment, the detector may further include a first circuit board 114 and a second circuit board 123. A first photodiode 113 may be disposed on the first circuit board 114, and a second photodiode 122 may be disposed on the second circuit board 123. The first circuit board 114 may be located between the first photodiode 113 and the low-energy ray filter 140, and the second circuit board 123 may be located on the side of the second photodiode 122 facing away from the high-energy scintillator 121. This embodiment can further optimize the circuit structure of the detector 100.

[0054] In the above scheme, a support column 160 can be provided between the first circuit board 114 and the second circuit board 123. The support column 160 can support the first circuit board 114 and the second circuit board 123 to create an installation space, so that the second photodiode 122 and the high-energy scintillator 121 can be located between the installation space.

[0055] In another embodiment, the detector 100 further includes a mounting bracket 150, which is fixedly mounted on the second circuit board 123. The aforementioned drive mechanism 130 can be fixedly mounted on the mounting bracket 150. The specific structure of the mounting bracket 150 can be flexibly configured according to the operating conditions, and this document does not impose any restrictions.

[0056] Based on the detector 100 disclosed in the embodiments of this application, the embodiments of this application also disclose a security inspection device, which includes the detector 100 described in any of the embodiments above.

[0057] The security inspection equipment disclosed in this application also includes an X-ray emission source, which is used to emit X-rays. In the specific security inspection process, as an object passes through or is transported by the security inspection equipment, the X-ray emission source emits X-rays. After passing through the object being inspected, the X-rays are received by the detector. The detector can convert the received X-rays into detection signals, and the detection signals can be displayed as images of different colors on the screen of the security inspection equipment or on the host computer.

[0058] The above description is merely an embodiment of this utility model and is not intended to limit the scope of this utility model. Various modifications and variations can be made to this utility model by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principle of this utility model should be included within the scope of the claims of this utility model.

Claims

1. A detector, characterized in that, It includes a shielding element (111), a low-energy scintillator (112), a first photodiode (113), a high-energy scintillator (121), and a second photodiode (122). The low-energy scintillator (112), the first photodiode (113), the high-energy scintillator (121), and the second photodiode (122) are arranged sequentially along the incident direction of the X-rays. The shielding member (111) and the low-energy scintillator (112) are both located on the same side of the first photodiode (113). Along the incident direction of the X-rays, at least a portion of the orthographic projection of the shielding member (111) coincides with a portion of the orthographic projection of the first photodiode (113). The shielding member (111) is used to absorb low-energy rays in the X-rays and to allow high-energy rays in the X-rays to pass through.

2. The detector according to claim 1, characterized in that, The low-energy scintillator (112) is located between the first photodiode (113) and the shield (111), and at least a portion of the orthographic projection of the shield (111) coincides with a portion of the orthographic projection of the low-energy scintillator (112) along the incident direction of the X-ray.

3. The detector according to claim 2, characterized in that, The detector (100) further includes a drive mechanism (130) connected to the shielding member (111). The drive mechanism (130) can drive the shielding member (111) to move in a direction perpendicular to the incident direction of the X-rays, so as to adjust the overlapping area of ​​the orthographic projection of the shielding member (111) in the incident direction of the X-rays and the orthographic projection of the low-energy scintillator (112) in the incident direction of the X-rays.

4. The detector according to claim 2, characterized in that, Along the incident direction of the X-rays, the orthographic projection of the low-energy scintillator (112) coincides with the orthographic projection of the first photodiode (113); Alternatively, along the incident direction of the X-rays, the projected area of ​​the low-energy scintillator (112) is larger than the projected area of ​​the first photodiode (113), and the projected area of ​​the first photodiode (113) is located within the projected area of ​​the low-energy scintillator (112).

5. The detector according to any one of claims 2 to 4, characterized in that, The shielding element (111) includes a copper sheet, a tungsten sheet, a lead sheet, or an iron sheet.

6. The detector according to claim 1, characterized in that, The low-energy scintillator (112) and the shielding member (111) are spliced ​​together in a direction perpendicular to the incident direction of the X-ray.

7. The detector according to claim 6, characterized in that, Along the incident direction of the X-rays, the orthographic projection of the low-energy scintillator (112) and the orthographic projection of the shielding member (111) are both located within the orthographic projection of the first photodiode (113), and the sum of the area of ​​the orthographic projection of the low-energy scintillator (112) and the area of ​​the orthographic projection of the shielding member (111) is equal to the area of ​​the orthographic projection of the first photodiode (113). Alternatively, along the incident direction of the X-rays, the projected area of ​​the low-energy scintillator (112) and the shielding member (111) after splicing is greater than the projected area of ​​the first photodiode (113), and the projected area of ​​the first photodiode (113) is located within the projected area of ​​the low-energy scintillator (112) and the shielding member (111).

8. The detector according to claim 6 or 7, characterized in that, The shielding element (111) is a titanium dioxide layer.

9. The detector according to claim 1, characterized in that, The detector (100) further includes a low-energy ray filter (140) for absorbing low-energy rays in the X-rays and allowing high-energy rays in the X-rays to pass through. The low-energy ray filter (140) is located between the first photodiode (113) and the high-energy scintillator (121).

10. The detector according to claim 9, characterized in that, The detector (100) further includes a first circuit board (114) and a second circuit board (123). The first photodiode (113) is disposed on the first circuit board (114), and the second photodiode (122) is disposed on the second circuit board (123). The first circuit board (114) is located between the first photodiode (113) and the low-energy ray filter (140), and the second circuit board (123) is located on the side of the second photodiode (122) away from the high-energy scintillator (121).

11. A security inspection device, characterized in that, The detector (100) includes any one of claims 1 to 10.

Images