Conductor with lower needle head

Abstract

The utility model provides an electric conductor with a lower needle head, which comprises a main body assembly, and the main body assembly comprises an upper needle plate, a limiting hole, an upper conductive column, an upper needle head, an upper connecting column and a spherical lower needle head. By optimizing the contact mode of the lower probe head and the PCB and the connection structure of the main spring and the connection spring and the upper and lower probe heads, the lower probe head of the novel conductor does not deform and is in stable contact with the PCB, so that the problem of large impedance caused by spring deformation and poor contact in use of a common spring probe is solved, and the service life of the novel conductor is prolonged. The stability of the whole electric conductor in the testing process is greatly improved, the testing accuracy and reliability are improved, the connecting structure design of the connecting spring and the lower needle head has universality, the lower needle head can adopt multiple shapes, the assembling mode of the lower needle head is basically the same as the assembling mode of the upper needle head, stable electrical connection and good testing performance can be achieved, and the testing efficiency is improved. The possibility is provided for diversified design and application of the electric conductor, the production cost is reduced, and the production efficiency is improved.

Description

TECHNICAL FIELD

[0001] The utility model relates to the technical field of electric conductor, especially a kind of electric conductor with lower needle head. BACKGROUND

[0002] Electric conductor is the key component in electronic equipment and circuit, which transmits electric energy or signal. Its performance directly affects the running efficiency and stability of the whole electronic system. Among many types of electric conductor, low-cost electric conductor is widely used in some cost-sensitive application scenarios due to its economy. However, in the field of electronic testing, the previous low-cost electric conductor has many limitations in practical application.

[0003] The traditional low-cost electric conductor usually adopts the way of electrically conducting through spring between lower needle head and PCB. This traditional structure has many problems. First, in the testing process, the spring bottom is easy to deform when it contacts with PCB, which not only affects the stability of electric conduction, but also makes it difficult to pierce the solder pad layer of PCB, resulting in large impedance of probe. Second, large impedance makes the transmission of test signal unstable, which further affects the accuracy and reliability of the whole test, and cannot meet the demand of high-precision test. Therefore, an electric conductor with lower needle head is proposed. SUMMARY

[0004] Therefore, the utility model provides an electric conductor with lower needle head to solve or alleviate the technical problems in the prior art, at least to provide a beneficial choice.

[0005] The technical scheme of the utility model embodiment is realized as follows: an electric conductor with lower needle head, comprising a main body assembly, the main body assembly comprises an upper needle plate, a limiting hole, an upper electrically-conductive column, an upper needle head, an upper connecting column, a main spring, an annular limiting groove, a connecting spring and a spherical lower needle head.

[0006] A limiting hole is formed in the center of the lower surface of the upper needle plate, and an upper electrically-conductive column is slidably connected to the inner side wall of the limiting hole. An upper needle head is fixedly connected to the center of the upper surface of the upper electrically-conductive column, and the top of the upper needle head penetrates the center of the inner top wall of the limiting hole. An upper connecting column is fixedly connected to the center of the lower surface of the upper electrically-conductive column, and a main spring is sleeved on the outer side wall of the upper connecting column. An annular limiting groove is formed in the top of the outer side wall of the upper connecting column, and the inner side wall of the annular limiting groove is connected to the top of the inner side wall of the main spring. A connecting spring is welded to one end of the main spring away from the upper connecting column, and a spherical lower needle head is welded to the inner side wall bottom of the connecting spring.

[0007] Further preferably, the needle-shaped lower needle head is fixedly connected with a lower conductive column at the top, and a lower connecting column is fixedly connected to the upper surface center of the lower conductive column.

[0008] Further preferably, an annular groove is arranged at the bottom of the outer side wall of the lower connecting column, and the inner side wall of the connecting spring is connected to the inner side wall of the annular groove.

[0009] Further preferably, a lower needle plate is fixedly connected to the lower surface of the upper needle plate, an insertion hole is arranged at the upper surface center of the lower needle plate, a test hole is arranged at the inner bottom wall of the insertion hole, and the bottom of the spherical lower needle head or the needle-shaped lower needle head penetrates the inside of the test hole.

[0010] Further preferably, a PCB test plate is fixedly connected to the bottom of the lower needle plate.

[0011] Further preferably, a limiting groove is arranged at the top of the upper needle head, a conductive pressure ball is connected to the inner side wall of the limiting groove, and a test pressure plate is fixedly connected to the top of the conductive pressure ball.

[0012] Further preferably, an upper chamfer is arranged at the bottom of the outer side wall of the upper connecting column.

[0013] Further preferably, a lower chamfer is arranged at the top of the outer side wall of the lower connecting column.

[0014] The embodiment of the utility model has the following advantages due to the adoption of the above technical scheme.

[0015] The utility model discloses a novel electrically conductive body lower needle head, which comprises a lower needle plate, a spherical lower needle head or a needle-shaped lower needle head, a connecting spring, an upper needle plate, an upper needle head, an upper connecting column and a main spring.

[0016] The above summary is only for the purpose of the description and is not intended to limit in any way. In addition to the above-described illustrative aspects, embodiments and features, further aspects, embodiments and features of the utility model will be readily apparent to those skilled in the art by reference to the drawings and the following detailed description. BRIEF DESCRIPTION OF DRAWINGS

[0017] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the accompanying drawings needed to be used in the description of the embodiments or the prior art will be briefly introduced. Obviously, the accompanying drawings in the following description only only some embodiments of the present application, and for those skilled in the art, other drawings can also be obtained without creative labor on the basis of these drawings.

[0018] Fig. 1 The overall cut structure diagram of the utility model;

[0019] Fig. 2 The upper needle head and spherical lower needle head structure diagram of the utility model;

[0020] Fig. 3 The main spring and needle-shaped lower needle head structure diagram of the utility model.

[0021] The accompanying drawings: 1, main body assembly; 11, upper needle plate; 12, limit hole; 13, upper conductive column; 14, upper needle head; 15, upper connecting column; 16, main spring; 17, annular limit recess; 18, connecting spring; 19, spherical lower needle head; 20, needle-shaped lower needle head; 21, lower conductive column; 22, lower connecting column; 23, annular groove; 24, lower needle plate; 25, jack; 26, test hole; 27, PCB test board; 28, limit groove; 29, conductive pressure ball; 30, test pressing plate; 31, upper chamfer part; 32, lower chamfer part. DETAILED DESCRIPTION

[0022] In the following, only some exemplary embodiments are simply described. As those skilled in the art can recognize, the described embodiments can be modified in various different ways without departing from the spirit or scope of the utility model. Therefore, the drawings and the description are considered to be exemplary in nature rather than limiting.

[0023] The embodiments of the utility model will be described in detail below with reference to the accompanying drawings.

[0024] As Figs. 1-3 shown, the utility model embodiment provides a conductive body with lower needle head, including main body assembly 1, main body assembly 1 includes upper needle plate 11, limit hole 12, upper conductive column 13, upper needle head 14, upper connecting column 15, main spring 16, annular limit recess 17, connecting spring 18 and spherical lower needle head 19;

[0025] The lower surface center of the upper needle plate 11 is provided with a limiting hole 12, the inner side wall of the limiting hole 12 is slidably connected with an upper conductive column 13, the upper surface center of the upper conductive column 13 is fixedly connected with an upper needle head 14, the top of the upper needle head 14 penetrates the inner top wall center of the limiting hole 12, the lower surface center of the upper conductive column 13 is fixedly connected with an upper connecting column 15, the outer side wall of the upper connecting column 15 is provided with an annular limiting groove 17, the inner side wall top of the main spring 16 is connected to the inner side wall of the annular limiting groove 17, the end of the main spring 16 away from the upper connecting column 15 is welded with a connecting spring 18, the inner side wall bottom of the connecting spring 18 is welded with a spherical lower needle head 19, through the contraction characteristics of the main spring 16 itself, the uppermost end of the main spring 16 is buckled into the annular limiting groove 17 on the upper connecting column 15, so as to realize the fastening connection between the upper connecting column 15 and the main spring 16.

[0026] In one embodiment, specifically: further comprising a needle-shaped lower needle head 20, the top of the needle-shaped lower needle head 20 is fixedly connected with a lower conductive column 21, the upper surface center of the lower conductive column 21 is fixedly connected with a lower connecting column 22, the inner side wall of the connecting spring 18 is connected to the outer side wall of the lower connecting column 22, in addition to the spherical lower needle head 19 and the needle-shaped lower needle head 20, other shapes of lower needle heads can also be included, and the fixing mode of the lower needle head to the connecting spring 18 is not limited to welding connection, and the specific connection mode is determined according to the specific shape and material of the lower needle head.

[0027] In one embodiment, specifically: the outer side wall bottom of the lower connecting column 22 is provided with an annular groove 23, the inner side wall bottom of the connecting spring 18 is connected to the inner side wall of the annular groove 23, through the contraction characteristics of the connecting spring 18 itself, the bottom end of the connecting spring 18 is buckled into the annular groove 23 on the lower connecting column 22, so as to realize the fastening connection between the lower connecting column 22 and the connecting spring 18.

[0028] In one embodiment, specifically: the lower surface of the upper needle plate 11 is fixedly connected with a lower needle plate 24, the upper surface center of the lower needle plate 24 is provided with a plug hole 25, the inner bottom wall of the plug hole 25 is provided with a test hole 26, the bottom of the spherical lower needle head 19 or the needle-shaped lower needle head 20 penetrates the inside of the test hole 26, and the plug hole 25 facilitates the insertion of the spherical lower needle head 19 or the needle-shaped lower needle head 20 into the inside of the test hole 26.

[0029] In one embodiment, specifically: the bottom of the lower needle plate 24 is fixedly connected with a PCB test plate 27, the spherical lower needle head 19 or the needle-shaped lower needle head 20 passes through the test hole 26 to be connected with the PCB test plate 27.

[0030] In one embodiment, specifically: the top of the upper needle 14 is provided with a limiting groove 28, the inner side wall of the limiting groove 28 is connected with a conductive pressure ball 29, the top of the conductive pressure ball 29 is fixedly connected with a test pressure plate 30, the limiting of the conductive pressure ball 29 by the limiting groove 28 increases the stability of the connection between the conductive pressure ball 29 and the upper needle 14.

[0031] In one embodiment, specifically: the outer side wall bottom of the upper connecting column 15 is provided with an upper chamfer 31, the upper chamfer 31 at the bottom of the upper connecting column 15 facilitates the sleeving of the main spring 16 on the upper connecting column 15.

[0032] In one embodiment, specifically: the outer side wall top of the lower connecting column 22 is provided with a lower chamfer 32, the lower chamfer 32 at the top of the lower connecting column 22 facilitates the sleeving of the connecting spring 18 on the lower connecting column 22.

[0033] In the initial state, the upper conductive column 13 is in the limiting hole 12, the top of the upper needle 14 protrudes out of the limiting hole 12, one end of the main spring 16 abuts against the inner side wall of the annular limiting groove 17 of the upper connecting column 15, the other end is welded with the connecting spring 18, the bottom of the connecting spring 18 is welded with the spherical lower needle 19 (or when the connecting needle-shaped lower needle 20 is connected, the inner side wall of the connecting spring 18 abuts against the outer side wall of the lower connecting column 22, and abuts against the inner side wall of the annular groove 23 at the bottom of the lower connecting column 22), at this time, the bottom of the spherical lower needle 19 (or the needle-shaped lower needle 20) penetrates through the test hole 26 of the lower needle plate 24, the bottom of the lower needle plate 24 is fixed with a PCB test plate 27, the top limiting groove 28 of the upper needle 14 abuts against the conductive pressure ball 29, and the top of the conductive pressure ball 29 is fixed with the test pressure plate 30; during testing, pressure is applied to the test pressure plate 30, the pressure is transmitted to the upper needle 14 through the conductive pressure ball 29, the upper conductive column 13 slides downward in the limiting hole 12, the upper connecting column 15 moves downward, the main spring 16 is compressed, and the connecting spring 18 is driven to move downward, thereby further compressing the spherical lower needle 19 (or the needle-shaped lower needle 20), in this process, due to the connection relationship between the components, the main spring 16 and the connecting spring 18 are elastically deformed, force transmission and buffering are realized, when the pressure reaches a certain degree, the contact between the spherical lower needle 19 (or the needle-shaped lower needle 20) and the PCB test plate 27 is more close (compared with the traditional structure, the contact is more stable and not easy to deform), the electrical conduction between the measured integrated circuit (contacting the upper needle 14 through the test pressure plate 30 and other components, and finally forming a path with the spherical lower needle 19 or the needle-shaped lower needle 20 and the PCB test plate 27) and the conversion PCB (here, it can be understood as the conversion circuit part related to the PCB test plate 27) is realized, thereby completing the electrical connection in the testing process, after the testing is completed, when the pressure of the test pressure plate 30 disappears, under the elastic restoring force of the main spring 16 and the connecting spring 18, the components return to the initial state, preparing for the next test.

[0034] The above merely describes a specific implementation of the present application, but the protection scope of the present application is not limited thereto, and any skilled person in the art can easily think of various changes or replacements within the technical range disclosed by the present application, which should be encompassed in the protection scope of the present application. Therefore, the protection scope of the present application should be subject to the protection scope of the claims.

Claims

1. A conductive body with a lower needle tip, characterized in that: It includes a main body assembly (1), which includes an upper needle plate (11), a limiting hole (12), an upper conductive post (13), an upper needle (14), an upper connecting post (15), a main spring (16), an annular limiting groove (17), a connecting spring (18), and a spherical lower needle (19). A limiting hole (12) is provided at the center of the lower surface of the upper needle plate (11). An upper conductive post (13) is slidably connected to the inner wall of the limiting hole (12). An upper needle (14) is fixedly connected to the center of the upper surface of the upper conductive post (13). The top of the upper needle (14) penetrates the center of the inner top wall of the limiting hole (12). An upper connecting post (15) is fixedly connected to the center of the lower surface of the upper conductive post (13). A main spring (16) is sleeved on the outer wall of the upper connecting post (15). An annular limiting groove (17) is provided at the top of the outer wall of the upper connecting post (15). The top of the inner wall of the main spring (16) is attached to the inner wall of the annular limiting groove (17). A connecting spring (18) is welded to the end of the main spring (16) away from the upper connecting post (15). A spherical lower needle (19) is welded to the bottom of the inner wall of the connecting spring (18).

2. A conductive body with a lower needle tip according to claim 1, characterized in that: It also includes a needle-shaped lower needle (20), the top of which is fixedly connected to a lower conductive post (21), and a lower connecting post (22) is fixedly connected to the center of the upper surface of the lower conductive post (21), and the inner sidewall of the connecting spring (18) is attached to the outer sidewall of the lower connecting post (22).

3. A conductive body with a lower needle tip according to claim 2, characterized in that: The bottom of the outer side wall of the lower connecting column (22) is provided with an annular groove (23), and the bottom of the inner side wall of the connecting spring (18) is attached to the inner side wall of the annular groove (23).

4. A conductive body with a lower needle according to claim 2, characterized in that: The lower surface of the upper needle plate (11) is fixedly connected to the lower needle plate (24). The lower needle plate (24) has an insertion hole (25) at the center of its upper surface. The inner bottom wall of the insertion hole (25) has a test hole (26). The bottom of the spherical lower needle (19) or the needle-shaped lower needle (20) penetrates the interior of the test hole (26).

5. A conductive body with a lower needle tip according to claim 4, characterized in that: The bottom of the lower needle plate (24) is fixedly connected to a PCB test board (27).

6. A conductive body with a lower needle according to claim 1, characterized in that: The upper needle (14) has a limiting groove (28) at its top. A voltage-conducting ball (29) is attached to the inner wall of the limiting groove (28). A test pressure plate (30) is fixedly connected to the top of the voltage-conducting ball (29).

7. A conductive body with a lower needle tip according to claim 1, characterized in that: The bottom of the outer side wall of the upper connecting column (15) is provided with an upper chamfer (31).

8. A conductive body with a lower needle tip according to claim 2, characterized in that: The top of the outer wall of the lower connecting column (22) is provided with a lower chamfer (32).

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