Chip hardness testing device with anti-splashing structure
By adding a protective cover and lifting components to the chip hardness testing device, the problem of fragments scattering when the chip breaks has been solved, thus protecting surrounding instruments and personnel.
Patent Information
- Application Number
- CN202422974424.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-04
- Publication Date
- 2025-11-07
- Estimated Expiration
- 2034-12-04
AI Technical Summary
Existing chip hardness testing equipment lacks a splash-proof structure, which makes it easy for chip fragments to scatter when the chip breaks, endangering the safety of surrounding instruments and personnel.
A protective cover and lifting assembly are added to the chip hardness testing device. The height of the protective cover is adjusted by a threaded rod, a limit post and a motor, and the tester is pushed down by an electric push rod to form a sealed space to prevent fragments from splashing out.
It effectively prevents chip fragments from splashing out, protects the safety of surrounding instruments and personnel, and ensures the safety of the testing process.
Smart Images
Figure CN223526181U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The utility model belongs to chip hardness testing device field, and specifically relates to chip hardness testing device with prevent splashing structure. BACKGROUND
[0002] Chip needs to bear various forms of force loading in the manufacturing, processing, transportation and use process, therefore needs to use chip hardness testing device to detect the hardness of chip sample, ensures that chip is not damaged during use.
[0003] At present, the existing chip hardness testing device does not have the structure of preventing splashing, in the process of testing, once the chip is broken due to excessive force, the chip fragments are easy to burst out, which can cause harm to the surrounding instruments and workers.
[0004] Therefore, in view of the above-mentioned problems that the existing chip hardness testing device does not have the structure of preventing splashing, and the chip fragments can cause harm to the surrounding instruments and workers when the chip is broken during detection, the existing chip hardness testing device is improved, a protective cover capable of preventing the fragments from bursting is installed, and a moving assembly for adjusting the height of the protective cover is installed, so that the opening and closing of the protective cover is realized, and the chip fragments are prevented from splashing out during testing. SUMMARY
[0005] In order to overcome the problem that the existing chip hardness testing device does not have the structure of preventing splashing, and the chip fragments can cause harm to the surrounding instruments and workers during detection.
[0006] The technical scheme of the utility model is as follows: the chip hardness testing device with the structure of preventing splashing comprises a support platform, a supporting leg, a detector, a protective cover and a lifting assembly; the support platform is fixedly connected with four supporting legs at the bottom end, the detector is arranged on the support platform, the protective cover is sleeved outside the detector, the protective cover is located above the support platform, and the lifting assembly for adjusting the height of the protective cover is arranged on the support platform.
[0007] Preferably, the lifting assembly comprises a threaded rod, a limiting column and a motor; the threaded rod is inserted into the support platform, the limiting column is fixedly connected to the support platform, and the motor with the output end fixedly connected to the threaded rod is installed on the support platform.
[0008] Preferably, a screw hole matched with the threaded rod is formed in the protective cover, and the protective cover is sleeved outside the limiting column.
[0009] Preferably, a square limiting ring is fixedly connected to the support platform, and the chip sample to be detected is placed in the area defined by the limiting ring.
[0010] As preferred, the detector is composed of a display and a probe head, the display is plugged into the protective cover, the bottom end of the display is connected with the force detection head, and the probe head is located above the limiting ring.
[0011] As preferred, the protective cover is provided with left and right opposite lifting grooves, and the lifting platforms are movably connected in the lifting grooves.
[0012] As preferred, the protective cover is provided with left and right opposite electric push rods, and the output ends of the electric push rods are fixedly connected to the top ends of the lifting platforms through the protective cover.
[0013] The chip hardness testing device with the anti-splashing structure has the advantages that:
[0014] 1. The existing chip hardness testing device is improved, the protective cover and the lifting assembly located outside the detector are added, the height of the protective cover can be adjusted by the lifting assembly, the bottom end of the protective cover is tightly attached to the top end of the supporting platform during detection, the chip and the detector are wrapped inside, the outer wall of the protective cover forms a barrier, the fragments can be prevented from splashing out after the chip is broken, and the surrounding instruments and the workers are protected.
[0015] 2. The limiting ring can define the placement position of the chip, the probe head of the detector is located above the chip, the electric push rod drives the detector to move downward, the probe head is pressed against the surface of the chip, the indenter of the probe head is supported by diamond, and the hardness value is measured under the characteristic that the resonant frequency of the probe head changes with the hardness of the test piece under uniform contact pressure. BRIEF DESCRIPTION OF DRAWINGS
[0016] Figure 1 A first three-dimensional structure schematic view of the chip hardness testing device with the anti-splashing structure is shown.
[0017] Figure 2 A three-dimensional structure schematic view of the supporting base of the chip hardness testing device with the anti-splashing structure is shown.
[0018] Figure 3 A three-dimensional structure schematic view of the protective cover of the chip hardness testing device with the anti-splashing structure is shown.
[0019] Figure 4 A three-dimensional structure schematic view of the protective cover of the chip hardness testing device with the anti-splashing structure is shown.
[0020] Figure 5 A three-dimensional structure schematic view of the detector of the chip hardness testing device with the anti-splashing structure is shown.
[0021] Explanation of reference signs: 1, support platform; 2, supporting leg; 3, protective cover; 401, threaded rod; 402, limiting column; 403, motor; 5, limiting ring; 6, display; 7, detection head; 8, lifting groove; 9, lifting platform; 10, electric push rod. DETAILED DESCRIPTION
[0022] The utility model is further explained below in combination with the drawings and examples.
[0023] Please refer to Figures 1-5 The utility model provides a kind of embodiment: chip hardness testing device with anti-splashing structure includes support platform 1, supporting leg 2, detector, protective cover 3 and lifting assembly;Support platform 1 bottom end is fixedly connected with four supporting legs 2, and detector is provided on support platform 1, and protective cover 3 is sleeved outside detector, and protective cover 3 is located above support platform 1, and lifting assembly is provided on support platform 1 and is adjusted the height of protective cover 3, by being installed protective cover 3 and lifting assembly located outside detector for existing chip hardness testing device, lifting assembly can adjust the height of protective cover 3, when detecting, protective cover 3 bottom end is tightly attached to support platform 1 top end, chip and detector are wrapped inside, and the outer wall of protective cover 3 forms barrier, can avoid chip broken, and debris splashes, protective effect is played to surrounding instrument and staff.
[0024] Please refer to Figures 1-2 In the embodiment, lifting assembly includes threaded rod 401, limiting column 402 and motor 403;Threaded rod 401 is inserted in support platform 1, limiting column 402 is fixedly connected on support platform 1, and motor 403 is installed on support platform 1 and output end is fixedly connected on threaded rod 401, and screw hole matched with threaded rod 401 is formed in protective cover 3, and protective cover 3 is sleeved outside limiting column 402, square limiting ring 5 is fixedly connected on support platform 1, and the chip sample to be measured is placed in the area circled by limiting ring 5, and motor 403 drives threaded rod 401 to rotate, under the limitation of limiting column 402, protective cover 3 screwed on threaded rod 401 cannot rotate along with threaded rod 401, but moves up and down along limiting column 402, so that protective cover 3 is tightly attached to support platform 1, forms airtight space, avoids debris splashing when chip breaks, limiting ring 5 can circumscribe the placement position of chip, can play positioning effect, so that detector is located above chip.
[0025] Please refer to Figures 3-5In the embodiment, the detector is composed of the display 6 and the probe head 7, the display 6 is plugged into the protective cover 3, the display 6 is connected with the force detection probe head 7 at the bottom end, the probe head 7 is located above the limiting ring 5, the protective cover 3 is provided with left and right opposite lifting grooves 8, the lifting grooves 8 are movably connected with the lifting platforms 9, the detector is fixedly connected between the two lifting platforms 9, the protective cover 3 is provided with left and right opposite electric push rods 10, the output ends of the electric push rods 10 are fixedly connected with the top ends of the lifting platforms 9 through the protective cover 3, the electric push rods 10 extend the output ends, the output ends push the lifting platforms 9 to move downwards along the lifting grooves 8, so as to achieve the effect of pushing the detector to move downwards, the detector moves downwards, so that the probe head 7 is extruded with the chip surface, the pressure head of the probe head 7 is supported by diamond, and is in contact with the chip. Under the uniform contact pressure, the hardness value is measured according to the characteristic that the resonant frequency of the probe head 7 changes with the hardness of the test piece, and the hardness value data is displayed on the display 6 through the rotating pointer.
[0026] When working, first, the staff places the chip in the area circled by the limiting ring 5, then starts the motor 403, the motor 403 drives the threaded rod 401 to rotate, under the limitation of the limiting column 402, the protective cover 3 screwed on the threaded rod 401 moves downwards, until the bottom end of the protective cover 3 tightly abuts against the top end of the supporting platform 1, to form a closed space.
[0027] The electric push rod 10 is started, the electric push rod 10 extends the output end, the output end pushes the lifting platform 9 to move downwards along the lifting groove 8, drives the detector to move downwards, so that the probe head 7 is extruded with the chip surface, the pressure head of the probe head 7 is supported by diamond, and is in contact with the chip. Under the uniform contact pressure, the hardness value is measured according to the characteristic that the resonant frequency of the probe head 7 changes with the hardness of the test piece, and the hardness value data is transmitted to the display 6 through the hardness sensor inside the probe head 7, and is displayed on the display 6 through the rotating pointer. If the force is too large or the quality of the chip to be measured is poor, causing the chip to be broken, the inner wall of the protective cover 3 can play a blocking role, avoiding the chip fragments from splashing out, and protecting the surrounding staff and instruments.
[0028] Through the above steps, the existing chip hardness testing device is improved, the protective cover 3 located outside the detector and the lifting assembly are added, the lifting assembly can adjust the height of the protective cover 3, when detecting, the bottom end of the protective cover 3 tightly abuts against the top end of the supporting platform 1, the chip and the detector are wrapped inside, the outer wall of the protective cover 3 forms a block, which can avoid the fragments from splashing out after the chip is broken, and protects the surrounding instruments and staff, so as to solve the problem that the existing chip hardness testing device does not have a anti-splashing structure, and the chip fragments generated during detection are easy to cause harm to the surrounding instruments and staff.
[0029] The utility model discloses makes detailed explanation to the practical new type implementation mode in combination with the drawing above, but the utility model is not limited to the implementation mode above, still can make various changes in the knowledge range of the person skilled in the art who possesses within the premise of not departing from the utility model's tenet.
Claims
1. A chip hardness testing device with anti-splashing structure, comprising a support platform (1), a supporting leg (2) and a detector; characterized in that: Also include the protective cover (3) and lifting assembly; support platform (1) bottom fixedly connected with four supporting legs (2), the support platform (1) is provided with detector, the detector outside is sleeved with the protective cover (3), the protective cover (3) is located above the support platform (1), the support platform (1) is provided with the lifting assembly of adjusting the height of the protective cover (3).
2. The chip hardness tester with anti-splashing structure according to claim 1, characterized in that: The lifting assembly includes a threaded rod (401), a limiting column (402) and a motor (403); the support platform (1) is inserted with the threaded rod (401), the support platform (1) is fixedly connected with the limiting column (402), and the support platform (1) is installed with the motor (403) whose output end is fixedly connected to the threaded rod (401).
3. The chip hardness tester with anti-splashing structure according to claim 2, characterized in that: The protective cover (3) is provided with a threaded hole matched with the threaded rod (401) on the protective cover (3), and the protective cover (3) is sleeved on the outside of the limiting column (402).
4. The chip hardness tester with anti-splashing structure according to claim 3, characterized in that: The support platform (1) is fixedly connected with a square limiting ring (5), and the chip sample to be measured is placed in the area circled by the limiting ring (5).
5. The chip hardness tester with anti-splashing structure according to claim 4, characterized in that: The detector is composed of a display (6) and a probe head (7), the display (6) is inserted into the protective cover (3), the display (6) is connected with the force probe head (7) at the bottom, and the probe head (7) is located above the limiting ring (5).
6. The chip hardness tester with anti-splashing structure according to claim 5, characterized in that: The protective cover (3) is provided with left and right lifting grooves (8), the lifting grooves (8) are movably connected with lifting platforms (9), and the detector is fixedly connected between the two lifting platforms (9).
7. The chip hardness tester with anti-splashing structure according to claim 6, characterized in that: The protective cover (3) is provided with left and right electric push rods (10), and the output end of the electric push rod (10) is fixedly connected to the top end of the lifting platform (9) through the protective cover (3).