Novel aging test box

Abstract

The utility model relates to the technical field of aging test, and discloses a novel aging test box which comprises a main body frame, a probe assembly is installed on one side of the surface of the main body frame, and a power supply circuit board is arranged on one side of the probe assembly. A box body is installed on the other side of the main body frame, a sliding rail assembly is installed on the side, away from the main body frame, of the interior of the box body, a jig assembly is arranged on the sliding rail assembly in a sliding mode, and the jig assembly is used for containing a circuit board to be detected. The PCB aging test tool is designed, the probe assembly is designed to supply power to the to-be-tested circuit board, the test is completed in cooperation with the detection tool assembly which is slidably arranged on the probe assembly, an electrified cable does not need to be welded, the PCB is electrified through the cable, and the detection process is greatly simplified.

Description

TECHNICAL FIELD

[0001] The utility model relates to the technical field of aging test, especially a novel aging test box. BACKGROUND

[0002] Current PCB aging test box is generally high temperature environment test, can hardly provide temperature environment and humidity environment simultaneously, and the aging test of PCB is generally welded on the PCB power cable, and the PCB is powered through the cable, which not only increases the soldering operation, but also increases the redundant process in the process, and also leads to plugging the wiring during feeding and discharging, which is inconvenient to operate, in addition, the common aging test box is usually designed with built-in temperature sensor, which will affect the temperature sensor when measuring temperature, and cannot accurately test the test temperature of the PCB, so it is particularly important to design an accurate, practical and convenient temperature control box jig according to the above actual production requirements. UTILITY MODEL CONTENTS

[0003] The utility model discloses a novel aging test box.

[0004] In order to realize the above-mentioned purpose, the utility model adopts the following technical scheme:

[0005] A novel aging test box, including the mainframe, the one side of mainframe surface is installed with probe subassembly, the one side of probe subassembly is provided with power supply circuit board,

[0006] The other side of the mainframe is installed with the box, and the slide rail assembly is installed on the side away from the mainframe in the box.

[0007] Preferably, the power supply circuit board is provided with a temperature sensor.

[0008] Preferably, the probe subassembly includes a probe fixing plate installed on one side of the mainframe and a spring probe installed on the inner side of the probe fixing plate, corresponding to the power supply pad position on the PCB of the aging test.

[0009] Preferably, a limiting block is installed on the side close to the mainframe above the slide rail assembly.

[0010] Preferably, the jig assembly comprises a base plate slidably connected with the slide rail assembly, a front panel mounted on the side of the base plate, a collision lock mounted on the front panel, a mounting box fixedly mounted on the base plate, first guide shafts mounted on both sides of the inside of the mounting box, springs mounted on the inner wall of one side of the mounting box, inclined grooves opened on the outside of the mounting box, a loading platform movably arranged outside the first guide shaft through a first linear bearing, and rolling bearings mounted on both sides of the loading platform, the rolling bearings are movably arranged in the corresponding inclined grooves, and the other end of the spring abuts against the loading platform.

[0011] Preferably, the loading platform comprises a bottom support and a top support, a second guide shaft is mounted at the bottom of the top support, a second linear bearing is mounted at the top of the bottom support, the second guide shaft is movably arranged in the second linear bearing, and the rolling bearings are mounted on the top support.

[0012] Preferably, the surface of the side of the box away from the jig assembly is provided with a humidity pipeline inlet and a sealing joint.

[0013] Compared with the prior art, the utility model has the beneficial effects that:

[0014] The utility model discloses a tool for the aging test of a PCB circuit board, which supplies power to the circuit board to be tested through a designed probe assembly, and completes the test by cooperating with a detection jig assembly slidably arranged, so that the detection process is greatly simplified. BRIEF DESCRIPTION OF DRAWINGS

[0015] Figure 1 A jig assembly pull-out state perspective view of a novel aging test box is provided for the utility model;

[0016] Figure 2 A whole perspective view of a novel aging test box is provided for the utility model;

[0017] Figure 3 A main body frame inside view of a novel aging test box is provided for the utility model;

[0018] Figure 4 A box body inside view of a novel aging test box is provided for the utility model;

[0019] Figure 5 A box body back inside view of a novel aging test box is provided for the utility model;

[0020] Figure 6 A jig assembly perspective view of a novel aging test box is provided for the utility model;

[0021] Figure 7 The utility model provides a novel aging test box's fixture assembly plan view is proposed;

[0022] Figure 8 The utility model provides a novel aging test box's loading platform and installation box connection side view is proposed;

[0023] Figure 9 The utility model provides a novel aging test box's loading platform three-dimensional schematic view is proposed;

[0024] Figure 10 The utility model provides a novel aging test box's installation box three-dimensional schematic view is proposed.

[0025] In the drawing: 1, main body frame, 2, power supply circuit board, 3, probe assembly, 4, box, 5, slide rail assembly, 6, the circuit board to be detected, 7, temperature sensor, 8, limit block, 9, bottom plate, 10, front panel, 11, impact lock, 12, installation box, 13, first guide shaft, 14, second guide shaft, 15, first linear bearing, 16, second linear bearing, 17, rolling bearing, 18, inclined plane groove, 19, spring, 20, bottom support, 21, top support, 22, humidity pipeline access portal, 23, sealing joint, 24, loading platform. DETAILED DESCRIPTION

[0026] The technical scheme in the embodiments of the utility model will be apparently and completely described below with reference to the drawings in the embodiments of the utility model, and obviously, the described embodiments are only part of the embodiments of the utility model, not all the embodiments.

[0027] Refer to Figures 1-10 A novel aging test box, including main body frame 1, the surface of main body frame 1 installs probe assembly 3 on one side, and the one side of probe assembly 3 is provided with power supply circuit board 2.

[0028] The other side of main body frame 1 is installed with box 4, and the inside of box 4 is installed with slide rail assembly 5 away from main body frame 1, and jig assembly is slidably arranged on slide rail assembly 5, and jig assembly is used to place the circuit board to be detected 6.

[0029] The device is used for the design of the aging test of PCB circuit board, and the probe assembly 3 is designed to supply power to the test circuit board, and the detection jig assembly is slidably arranged to complete the test, without welding power cable, and the PCB is continuously powered through the cable, which greatly simplifies the detection process.

[0030] In the embodiment, the temperature sensor 7 is arranged outside the power supply circuit board 2, and the test temperature can be read when the test is started. Since the temperature sensor is arranged outside the assembly of the box 4, the measurement error caused by humidity can be avoided.

[0031] In the embodiment, the probe assembly 3 comprises a probe fixing plate arranged on one side of the main frame 1 and spring probes arranged inside the probe fixing plate. The probe fixing plate can fix corresponding probes according to the positions of the power supply pads on the PCBs to be aged tested. The probes can be gold-plated spring probes. The corresponding probes are fixed on the probe fixing plate according to the positions of the power supply pads on the PCBs to be aged tested, and one end of each probe is in contact with the PCB to be aged tested, and the other end is connected with the power supply PCB.

[0032] In the embodiment, the limiting block 8 is arranged inside the box 4 and close to one side of the main frame 1, and is used to limit the stop position of the jig assembly.

[0033] In the embodiment, the jig assembly comprises a bottom plate 9 slidably connected with the slide rail assembly 5, a front panel 10 arranged on the side of the bottom plate 9, an impact lock 11 arranged on the front panel 10 (the impact lock 11 penetrates through the front panel), a mounting box 12 fixedly arranged on the bottom plate 9, first guide shafts 13 arranged on both sides of the mounting box 12, springs 19 arranged on the inner wall of one side of the mounting box 12, inclined grooves 18 arranged on the outer side of the mounting box 12, a platform 24 movably arranged outside the first guide shafts 13 through first linear bearings 15, and rolling bearings 17 arranged on both sides of the platform 24. The rolling bearings 17 are movably arranged in the corresponding inclined grooves 18, and the other end of the spring 19 is in contact with the platform 24. The surface of the front panel 10 is further provided with a handle, and the platform 24 is designed with positioning pins for preventing mistakes, and is matched with the circuit board to be tested. The platform 24 is used to place the circuit board to be tested, and the circuit board can move in the direction of the first guide shafts 13 through the first guide shafts 13. When the jig assembly is pushed into the box 4, the platform 24 in the jig assembly first contacts the limiting block 8 in the box 4, and as the jig assembly is continuously pushed in, the platform 24 starts to compress the spring 19 between the platform 24 and the mounting box 12. At this time, the platform 24 rises horizontally at the position where it contacts the limiting block 8 (realized by the rolling action of the rolling bearings 17 in the inclined grooves 18). When the jig assembly reaches the designed position and is fixed through the impact lock 11, the platform 24 also reaches the highest position at this time. At this time, the PCB to be aged tested is in contact with the probes on the power supply assembly. Since the spring 19 is arranged inside the power supply probe, the power supply probe and the power supply pad of the PCB to be aged tested can be elastically connected, so that false connection can be avoided. During the test, the power supply PCB on the power supply assembly is used for power supply test. After the test is completed, the button of the impact lock 11 is pressed by the finger, the jig assembly is pulled out, and a new PCB can be placed.

[0034] In this embodiment, the carrier 24 comprises a bottom support 20 and a top support 21, the bottom of the top support 21 is provided with a second guide shaft 14, the top of the bottom support 20 is provided with a second linear bearing 16, the second guide shaft 14 is movably arranged in the second linear bearing 16, the rolling bearing 17 is arranged on the top support 21, and the first linear bearing 15 is arranged on the bottom support 20.

[0035] In this embodiment, the surface of the box body 4 away from the jig assembly is provided with a humidity pipeline inlet 22 and a sealing joint 23, the humidity pipeline inlet 22 is used for connecting an external humidity machine, and the humidity environment test can be realized, and the sealing joint 23 is used for power supply of the heating sheet in the jig assembly, so as to simulate the performance change or service life of the circuit board under different temperature conditions.

[0036] The specific working process is as follows:

[0037] 1. Press the impact lock 11 button with fingers, and pull out the jig assembly.

[0038] 2. Place the PCB to be aged tested on the carrier 24 of the jig assembly from above, and the carrier 24 is designed with positioning pins for preventing mistakes.

[0039] 3. Push the jig assembly into the box body 4 assembly, and the impact lock 11 is automatically locked after reaching the position.

[0040] 4. When the jig assembly is pushed into the box body 4 assembly, the carrier 24 in the jig assembly first abuts against the limiting block 8 in the box body 4 assembly, and with the continuous pushing of the jig assembly, the horizontal spring 19 between the carrier 24 and the mounting box 12 is compressed, at this time, the carrier 24 rises horizontally at the position abutting against the limiting block 8, and when the jig assembly reaches the designed position and is fixed through the impact lock 11, the carrier 24 also reaches the highest position.

[0041] 5. The carrier 24 of the carrier 24 abuts against the probe on the power supply assembly, and since the power supply probe has a spring 19 structure inside, the power supply probe and the power supply pad of the PCB to be aged tested can be elastically connected, so that virtual connection is avoided.

[0042] 6. At this time, the external temperature controller or humidity machine creates a test environment in the aging box unit through the sealing joint 23 or the inlet.

[0043] 7. When the environment reaches, power-on test can be performed through the power supply PCB on the power supply assembly.

[0044] 8. After the test is completed, repeat the first step to take out the tested PCB and place a new PCB.

[0045] The above merely describes a preferred embodiment of the present application, but the protection scope of the present application is not limited thereto, and any skilled person in the art, according to the technical scheme and the inventive concept of the present application, makes equivalent replacement or change within the technical range disclosed by the present application, which should be covered within the protection scope of the present application.

Claims

1. A novel aging test chamber comprising a main frame, characterized by: One side of the main frame surface is provided with a probe assembly, one side of the probe assembly is provided with a power supply circuit board, which is electrically connected with the probe assembly, for supplying power to the circuit board connected with the probe assembly; The other side of the main frame is provided with a box, the inside of the box is provided with a slide rail assembly away from the main frame, the slide rail assembly is provided with a jig assembly which is used for placing the circuit board to be detected.

2. A novel aging test chamber as claimed in claim 1, wherein: The power supply circuit board is provided with a temperature sensor.

3. A novel aging test chamber as claimed in claim 1, wherein: The probe assembly includes a probe fixing plate installed on one side of the main frame and a spring probe installed on the inner side of the probe fixing plate, which corresponds to the power supply pad position on the PCB of the aging test.

4. A novel aging test chamber as claimed in claim 2, wherein: The slide rail assembly is provided with a limiting block installed in the box near the main frame.

5. A novel aging test chamber as claimed in claim 1, wherein: The jig assembly includes a bottom plate connected with the slide rail assembly, a front panel installed on the side of the bottom plate, an impact lock installed on the front panel, a mounting box fixedly installed on the bottom plate, first guide shafts installed on both sides of the mounting box, springs installed on the inner wall of one side of the mounting box, inclined grooves opened on the outer side of the mounting box, a carrier table movably arranged outside the first guide shaft through a first linear bearing, and rolling bearings installed on both sides of the carrier table, the rolling bearings are movably arranged in the corresponding inclined grooves, and the other end of the spring abuts against the carrier table.

6. A novel aging test chamber as claimed in claim 1, wherein: The carrier table includes a bottom support and a top support, the bottom of the top support is provided with a second guide shaft, the top of the bottom support is provided with a second linear bearing, the second guide shaft is movably arranged in the second linear bearing, the rolling bearings are installed on the top support, and the first linear bearing is arranged on the bottom support.

7. A novel aging test chamber as claimed in claim 1, wherein: The surface of the side of the box away from the jig assembly is provided with a humidity pipeline inlet and a sealing joint.

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