Testing seat and testing device

Abstract

The utility model discloses a test seat and a test device, the test seat comprises a positioning main body and four test connection mechanisms, the positioning main body comprises four positioning members, and the four positioning members are sequentially spliced to form the positioning main body with a square installation area in the middle; each positioning piece is configured to be telescopically arranged in the direction close to the square mounting area, the test connecting mechanisms are in one-to-one correspondence with the positioning pieces, and the test connecting mechanisms are fixedly arranged on the sides, close to the square mounting area, of the corresponding positioning pieces; and each test connection mechanism comprises a plurality of test needle groups, and the plurality of test needle groups are configured to be movably arranged in the direction perpendicular to the telescopic direction of the corresponding positioning piece. By means of the mode, the compatibility of the test seat can be improved, the test seat can adapt to tested objects of various sizes, and the test efficiency and flexibility are improved.

Description

Technical Field

[0001] This invention applies to the technical field of device testing, particularly test sockets and testing devices. Background Technology

[0002] Before electronic devices are mass-produced, they generally undergo aging tests (to ensure lifespan and reliability) and performance tests (mass production tests of function and performance). Only electronic devices that pass both tests can be defined as good products.

[0003] Currently, discrete devices come in a variety of package types and sizes. Existing test sockets are not compatible with testing electronic devices of different sizes and pad spacings. Utility Model Content

[0004] This invention provides a test socket and a test device to solve the problem that the test socket is incompatible with electronic devices of different sizes and pad spacings.

[0005] To solve the above-mentioned technical problems, this utility model provides a test holder, including: a positioning body and four test connecting mechanisms. The positioning body includes four positioning components, which are sequentially spliced ​​to form a positioning body with a square installation area in the middle. Each positioning component is configured to be retractable along the direction close to the square installation area. The test connecting mechanisms correspond one-to-one with the positioning components and are fixedly set on the side of the corresponding positioning component close to the square installation area. Each test connecting mechanism includes multiple test pin groups, which are configured to be movable along the direction perpendicular to the retraction direction of the corresponding positioning component.

[0006] The positioning component includes: a first driving device, a telescopic shaft, and a positioning part connected in sequence; a corresponding test connection mechanism is fixedly installed on the side of the positioning part away from the telescopic shaft; the first driving device is used to drive the telescopic shaft to extend and retract, so as to change the position of the positioning part in the direction close to the square installation area.

[0007] The telescopic shaft includes a tube body, a movable seat, and a connecting shaft. The movable seat and the connecting shaft are disposed inside the tube body. The movable seat is connected to the first driving device, and the connecting shaft is fixedly connected to the side of the movable seat near the positioning part. A first limiting member and a second limiting member are respectively provided at opposite ends of the tube body. The first limiting member and the second limiting member cooperate to limit the movement range of the movable seat. The movable seat is used to receive the drive of the first driving device to drive the connecting shaft to move relative to the tube body within the movement range.

[0008] The test connection mechanism includes multiple test pin groups, a pitch shaft, and a second drive device; the test pin groups and the pitch shaft are movably arranged, and the second drive device is connected to the pitch shaft to drive the pitch shaft to change the spacing between the multiple test pin groups.

[0009] The variable pitch shaft is provided with multiple helical sliding grooves, each of which is used to movably install the corresponding test probe group. The pitch between the multiple helical sliding grooves gradually changes in the target circumferential direction of the variable pitch shaft.

[0010] The test probe assembly includes multiple test probes and a fixing plate. The multiple test probes are fixedly mounted on the fixing plate, and the fixing plate and the corresponding spiral sliding groove are slidably mounted.

[0011] The test connection mechanism includes multiple test pin groups, a slot plate, and a mounting plate. The test pin groups are movably mounted on the mounting plate, and the slot plate is mounted on the side of the test pin groups away from the mounting plate. The slot plate is provided with multiple sliding grooves, each corresponding to a test pin group, and the test pin groups pass through the corresponding sliding grooves. The spacing between the multiple sliding grooves gradually changes along the extension and retraction direction of the positioning component.

[0012] The mounting plate has a first slide bar and a second slide bar on the side near the test probe group. The extension direction of the first slide bar is the same as the movable direction of the test probe group, and the extension direction of the second slide bar is the same as the extension direction of the positioning member. Multiple test probe groups can be slidably set on the first slide bar, and the slot plate can be slidably set on the second slide bar.

[0013] The length and width of the square installation area range from 5 to 12 millimeters.

[0014] To solve the above-mentioned technical problems, the present invention provides a testing device including: a test base, a tester, and multiple connecting wires. The test base includes any of the test bases described above and is used to mount the object under test. One end of the connecting wire is used to connect to the corresponding test connection mechanism on the test base, and the other end of the connecting wire is used to connect to the tester.

[0015] To address the aforementioned technical problems, the test socket of this invention features four positioning components that are retractable along the direction approaching the square mounting area. This allows for changes in the length and width of the square mounting area to accommodate test objects of different sizes. Furthermore, multiple test probe groups are configured to move along a direction perpendicular to the retraction direction of the corresponding positioning components, thereby changing the position of the test probe groups to accommodate the pad positions of test objects of different sizes. This facilitates the connection of various test objects, improves the compatibility of the test socket, enables it to handle test objects of multiple sizes, and enhances testing efficiency and flexibility. Attached Figure Description

[0016] Figure 1 This is a schematic diagram of the structure of an embodiment of the test fixture provided by this utility model;

[0017] Figure 2 This is a schematic diagram of another embodiment of the test stand provided by this utility model;

[0018] Figure 3 This is a structural schematic diagram of one embodiment of the positioning component;

[0019] Figure 4 A schematic diagram of a structure of an embodiment of a telescopic shaft;

[0020] Figure 5 A schematic diagram of one embodiment of the test connection mechanism 120;

[0021] Figure 6 This is a schematic diagram of a structure of one embodiment of a spiral sliding groove;

[0022] Figure 7 This is a schematic diagram of the structure of one embodiment of the test needle assembly;

[0023] Figure 8 This is a schematic diagram of another embodiment of the test connection mechanism;

[0024] Figure 9 This is a schematic diagram of one embodiment of the testing device. Detailed Implementation

[0025] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0026] It should be noted that if the embodiments of this utility model involve directional indicators (such as up, down, left, right, front, back, etc.), the directional indicators are only used to explain the relative positional relationship and movement of the components in a certain specific posture (as shown in the figure). If the specific posture changes, the directional indicators will also change accordingly.

[0027] Furthermore, if the embodiments of this utility model involve descriptions such as "first" or "second," these descriptions are for descriptive purposes only and should not be construed as indicating or implying their relative importance or implicitly specifying the number of indicated technical features. Therefore, features defined with "first" or "second" may explicitly or implicitly include at least one of those features. Additionally, the technical solutions of the various embodiments can be combined with each other, but this must be based on the ability of those skilled in the art to implement them. If the combination of technical solutions is contradictory or impossible to implement, it should be considered that such a combination of technical solutions does not exist and is not within the scope of protection claimed by this utility model.

[0028] Please see Figure 1-2 , Figure 1 This is a structural schematic diagram of an embodiment of the test stand provided by this utility model. Figure 2 This is a schematic diagram of another embodiment of the test stand provided by this utility model.

[0029] The test stand 100 includes a positioning body (not shown in the figure) and four test connection mechanisms 120. The positioning body is the basic frame of the test stand 100 and is used to mount the object under test.

[0030] The positioning body comprises four positioning components 111, which are sequentially assembled to form a positioning body with a square installation area 130 in the center. In a specific application scenario, the four positioning components 111 can be a first positioning component, a second positioning component, a third positioning component, and a fourth positioning component. These components are sequentially assembled end-to-end to form the positioning body with the square installation area 130 in the center, with the tail end of the first positioning component connected to the head end of the fourth positioning component. The first and third positioning components are positioned opposite each other, and the second and fourth positioning components are positioned opposite each other to form the square installation area 130.

[0031] The square mounting area 130 of the positioning body is used to mount a square object under test (DUT) for testing. The DUT can include, but is not limited to, various types of electronic devices, such as IGBTs (Insulated Gate Bipolar Transistors), chips, electronic display devices, optoelectronic devices, sensors, micromotors, electronic transformers, relays, printed circuit boards, integrated circuits, etc.

[0032] Each positioning element 111 is configured to extend and retract along a direction L close to the square mounting area 130, thereby changing the length and width dimensions of the square mounting area 130 to accommodate the installation of objects of different sizes. The extension and retraction directions of each positioning element 111 are independent. In a specific application scenario, the extension and retraction directions of the first and third positioning elements are on a straight line and opposite to each other; the extension and retraction directions of the second and fourth positioning elements are on another straight line and opposite to each other. These two straight lines are perpendicularly arranged.

[0033] In one specific application scenario, the retractable design of the positioning component 111 can be achieved through sliding retraction, that is, using a slide rail or guide rod to achieve linear retraction of the component. In another specific application scenario, the retractable design of the positioning component 111 can be achieved through helical retraction, using a helical or threaded structure, with the length adjusted by rotation. In yet another specific application scenario, the retractable design of the positioning component 111 can be achieved through scissor retraction, that is, using intersecting hinges and connecting rods to achieve retraction. The specific method of retractable design of the positioning component 111 is not limited here. The retraction of the four positioning components 111 is independent and does not interfere with each other.

[0034] The positions of the four positioning components 111 of the positioning body can be fixed by connecting and fixing the non-telescopic areas.

[0035] The test connection mechanism 120 corresponds one-to-one with the positioning component 111. The test connection mechanism 120 is fixedly installed on the side of the corresponding positioning component 111 near the square mounting area 130. Each test connection mechanism 120 includes multiple test pin groups 121. One end of the test pin group 121 is used to connect to the pad on the test object, and the other end is used to connect to the test instrument, thereby realizing the connection between the test object and the test instrument, and thus facilitating the testing of the test object by the test instrument.

[0036] Multiple test probe groups 121 are configured to be movable along a direction P perpendicular to the extension / retraction direction of the corresponding positioning element 111, thereby changing the position of the test probe groups 121 to accommodate the pad positions of different sized test objects, thus facilitating the connection of various test objects. The movement of each test probe group 121 is independent and does not interfere with each other. Direction P and direction L are two mutually perpendicular directions on the plane of the positioning body.

[0037] In one specific application scenario, the movable configuration of the test probe assembly 121 can be achieved through sliding telescopic movement, that is, using a slide rail or guide rod to achieve linear telescopic movement of the component. In another specific application scenario, the movable configuration of the test probe assembly 121 can be achieved through a cam-driven variable-pitch slide, composed of gears, belts, chains, rollers, etc., where the transmission ratio between them is changed to achieve variable-pitch movement. In yet another specific application scenario, the movable configuration of the test probe assembly 121 can be achieved through a cam-driven plug-in mechanism, where the spacing between multiple test probe assemblies 121 is changed by altering the shape of the slot. The specific method of movable configuration of the test probe assembly 121 is not limited here.

[0038] Figure 1 The diagram shows the structure where the positioning element 111 is retracted and the spacing between multiple test pin groups 121 is maximized, i.e., the square mounting area 130 is the largest in size. Figure 2The diagram shows a structure where the positioning element 111 extends and the spacing between multiple test pin groups 121 is minimized, with the square mounting area 130 having the smallest size.

[0039] With the above structure, the test socket of this embodiment is configured with four positioning members that are retractable along the direction close to the square mounting area, thereby changing the length and width of the square mounting area to accommodate the corresponding installation of test objects of different sizes. Furthermore, by configuring multiple test probe groups to be movable along the direction perpendicular to the retraction direction of the corresponding positioning members, the position of the test probe groups can be changed to accommodate the pad positions of test objects of different sizes. This facilitates the connection of various test objects, improves the compatibility of the test socket, enables it to handle test objects of various sizes, and improves testing efficiency and flexibility.

[0040] In some embodiments, the length and width of the square mounting area 130 range from 5 to 12 millimeters, meaning the test base 100 can support test objects within this size range. The square mounting area 130 can be square or rectangular. Specific dimensions include, but are not limited to: 5*5 mm, 5*6 mm, 6*6 mm, 7*8 mm, 8*9 mm, 9*9 mm, 10*11 mm, 10*5 mm, 8*5 mm, 12*12 mm, etc.

[0041] Please see Figure 3 , Figure 3 This is a structural schematic diagram of one embodiment of the positioning element.

[0042] In some embodiments, the positioning member 111 includes a first driving device 114, a telescopic shaft 113, and a positioning part 112 connected in sequence.

[0043] A corresponding test connection mechanism 120 is fixedly installed on the side of the positioning part 112 away from the retractable shaft 113; the first drive device 114 is used to drive the retractable shaft 113 to extend and retract, so as to change the position of the positioning part 112 in the direction close to the square installation area 130, thereby changing the length and width of the square installation area 130 to adapt to the corresponding installation of test objects of different sizes.

[0044] The four positioning components 111 can be used to fix the positioning body as a whole by fixing the four driving devices 114, or they can be used to support and fix the four positioning components 111 as a whole by other brackets, and the first driving device 114 of the four positioning components 111 can be the same.

[0045] Please see Figure 4 , Figure 4 This is a structural schematic diagram of one embodiment of a retractable shaft.

[0046] In some embodiments, the telescopic shaft 113 includes a tube body 1131, a movable seat 1132, and a connecting shaft 1133; the movable seat 1132 and the connecting shaft 1133 are disposed inside the tube body 1131. The connecting shaft 1133 is telescopically positioned relative to the tube body 1131 under the drive of the movable seat 1132.

[0047] The movable seat 1132 is connected to the first driving device 114, and the connecting shaft 1133 is fixedly connected to the side of the movable seat 1132 near the positioning part 112. The movable seat 1132 receives the drive of the first driving device 114, which drives the connecting shaft 1133 to extend towards the positioning part 112 and retract towards the direction away from the positioning part 112.

[0048] The tube body 1131 is provided with a first limiting member 1134 and a second limiting member 1135 at opposite ends. The first limiting member 1134 and the second limiting member 1135 cooperate to limit the movement range of the movable seat 1132. In the extension and retraction direction of the connecting shaft 1133, the movable seat 1132 partially overlaps with the first limiting member 1134 and the second limiting member 1135 to limit movement.

[0049] The movable seat 1132 is used to receive the drive of the first drive device 114 to drive the connecting shaft 1133 to move relative to the tube body 1131 within the movement range.

[0050] The first drive device 114 includes, but is not limited to, electric drive devices, servo motors, hydraulic drive devices, and pneumatic drive devices, etc.

[0051] Please see Figure 5 , Figure 5 This is a structural schematic diagram of an embodiment of the test connection mechanism 120.

[0052] In some embodiments, the test connection mechanism 120 includes a plurality of test pin groups 121, a variable pitch shaft 122, and a second drive device 123.

[0053] The test probe group 121 and the pitch axis 122 are movably configured. The second drive device 123 is connected to the pitch axis 122 to drive the pitch axis 122 to change the spacing between the multiple test probe groups 121. By changing the spacing between the multiple test probe groups 121, the pitch axis 122 enables the four test connection mechanisms 120 to adapt to the pad positions of the test object for corresponding connection.

[0054] The variable pitch shaft 122 is provided with fixing members 124 at its opposite ends, which are used to fix the variable pitch shaft 122 on the positioning part 112 of the corresponding positioning member 111.

[0055] The second drive device 123 of the four test connection mechanisms 120 can be the same, which is achieved by deformation of the connection structure. The second drive device 123 includes, but is not limited to, electric drive devices, servo motors, hydraulic drive devices, and pneumatic drive devices, etc.

[0056] Please see Figure 6 , Figure 6 This is a schematic diagram of one embodiment of a spiral sliding groove.

[0057] In some embodiments, a plurality of helical sliding grooves 1221 are provided on the variable pitch shaft 122. Each helical sliding groove 1221 is used to movably install the corresponding test probe group 121. The pitch of the plurality of helical sliding grooves 1221 gradually changes in the target circumferential direction of the variable pitch shaft 122. Specifically, it can gradually increase or gradually decrease, depending on actual needs.

[0058] The test probe group 121 can be slidably installed in the corresponding spiral sliding groove 1221 and slides with the spiral sliding groove 1221, thereby gradually changing the distance between it and other test probe groups 121 to adapt to the position of the solder pad of the object under test.

[0059] When the pitch is changed, the pitch-changing shaft 122 is driven to rotate by the second drive device 123, and the test needle assembly 121 slides within the corresponding helical sliding groove 1221 following the rotation, thereby changing the spacing between the multiple test needle assemblies 121 according to the spacing between different positions of the helical sliding groove 1221. The spacing between the multiple test needle assemblies 121 changes in the extension direction of the pitch-changing shaft 122; however, the height of the test needle assembly 121 remains unchanged in the direction perpendicular to the extension direction of the pitch-changing shaft 122.

[0060] Please see Figure 7 , Figure 7 This is a schematic diagram of a test needle assembly according to one embodiment.

[0061] In some embodiments, the test probe group 121 includes multiple test probes 1212 and a fixing plate 1211. The multiple test probes 1212 are fixedly disposed on the fixing plate 1211, and the fixing plate 1211 is slidably disposed with a corresponding spiral sliding groove 1221. Each test probe group 121 has at least two test probes 1212, specifically two, four, six, seven, etc.

[0062] Each test probe group 121 has multiple test probes 1212 that contact one of the pads of the device under test during testing, increasing the contact area with the pad, improving connection stability and the lifespan of the test probes, and can withstand instantaneous high current connection methods, even with a high current of 200A.

[0063] Please see Figure 8 , Figure 8This is a schematic diagram of another embodiment of the testing connection mechanism.

[0064] In some embodiments, the test connection mechanism 220 includes a plurality of test pin groups 221, a slot plate 222, and a mounting plate 225; the test pin groups 221 are movably mounted on the mounting plate 225, and the slot plate 222 is mounted on the side of the test pin groups 221 away from the mounting plate 225.

[0065] The slot plate 222 is provided with multiple sliding slots 224, each corresponding to a test probe group 221, and the test probe group 221 passes through the corresponding sliding slot 224 so as to slide on the mounting plate 225 driven by the sliding slot 224.

[0066] The spacing between the multiple sliding grooves 224 gradually changes along the extension and retraction direction of the positioning member 211, specifically it can gradually increase or gradually decrease.

[0067] In some embodiments, a first slide bar 226 and a second slide bar 225 are provided on the side of the mounting plate 225 near the test probe group 221. The extension direction of the first slide bar 226 is the same as the movable direction of the test probe group 121, and the extension direction of the second slide bar 225 is the same as the extension and retraction direction of the positioning member 211.

[0068] Multiple test pin groups 221 are slidably mounted on the first slide bar 226, and the slot plate 222 is slidably mounted on the second slide bar 225. When the slot plate 222 slides on the second slide bar 225, the test pin groups 221 are driven to slide multiple times on the first slide bar 226 through the sliding groove 224, thereby changing the spacing between the multiple test pin groups 221 to adapt to the position of the solder pads of different objects under test.

[0069] In some embodiments, the test probe group 221 includes multiple test probes 2211 and a fixing plate 2212. The multiple test probes 2211 are fixedly disposed on the fixing plate 2212, and the fixing plate 2212 is disposed through a corresponding sliding groove 224. A through member 2213 may extend from the fixing plate 2212 and be disposed through the corresponding sliding groove 224. Each test probe group 221 has at least two test probes 2211, specifically two, four, six, seven, etc.

[0070] Each test probe group 221 contacts one pad of the device under test during testing, increasing the contact area with the pad, improving connection stability and the lifespan of the test probe, and can withstand instantaneous high current connection methods, even with a high current of 200A.

[0071] With the above structure, the test socket of this embodiment is configured with four positioning members that are retractable along the direction close to the square mounting area, thereby changing the length and width of the square mounting area to accommodate the corresponding installation of test objects of different sizes. Furthermore, by configuring multiple test probe groups to be movable along the direction perpendicular to the retraction direction of the corresponding positioning members, the position of the test probe groups can be changed to accommodate the pad positions of test objects of different sizes. This facilitates the connection of various test objects, improves the compatibility of the test socket, enables it to handle test objects of various sizes, and improves testing efficiency and flexibility.

[0072] Please see Figure 9 , Figure 9 This is a schematic diagram of one embodiment of the testing device.

[0073] The testing device 30 includes a test base 31, a tester 33, and multiple connecting wires 32. One end of the connecting wire 32 is used to connect to the corresponding test connection mechanism on the test base 31, and the other end of the connecting wire 32 is used to connect to the tester 33, so as to connect the tester 33 and the test object on the test base 31 for testing.

[0074] The test stand 31 includes the test stand 100 as described in any of the above embodiments, for mounting the object under test.

[0075] Therefore, the test socket of the test device in this embodiment can adapt to the corresponding installation of test objects of different sizes and change the position of the test probe group to adapt to the pad position of test objects of different sizes, thereby facilitating the connection of various test objects, improving the compatibility of the test socket, being able to cope with test objects of various sizes, and improving testing efficiency and flexibility.

[0076] The above description is merely an embodiment of this utility model and does not limit the patent scope of this utility model. Any equivalent structural or procedural transformations made based on the description and drawings of this utility model, or direct or indirect applications in other related technical fields, are similarly included within the patent protection scope of this utility model.

Claims

1. A test socket, characterized in that, The test socket includes: The positioning body includes four positioning components, which are sequentially spliced ​​together to form the positioning body with a square installation area in the middle; each positioning component is configured to be retractable along the direction close to the square installation area. Four test connection mechanisms are provided, each corresponding to one of the positioning components. The test connection mechanisms are fixedly disposed on the side of the corresponding positioning component near the square installation area. Each test connection mechanism includes multiple test pin groups, which are configured to be movable along a direction perpendicular to the extension and retraction direction of the corresponding positioning component.

2. The test fixture according to claim 1, characterized in that, The positioning component includes: a first driving device, a telescopic shaft, and a positioning part connected in sequence; The corresponding test connection mechanism is fixedly installed on the side of the positioning part away from the retractable shaft; The first driving device is used to drive the telescopic shaft to extend or retract, so as to change the position of the positioning part in the direction close to the square mounting area.

3. The test holder according to claim 2, characterized in that, The retractable shaft includes a tube body, a movable seat, and a connecting shaft; The movable seat and the connecting shaft are disposed inside the tube body. The movable seat is connected to the first driving device, and the connecting shaft is fixedly connected to the side of the movable seat near the positioning part. A first limiting member and a second limiting member are respectively provided at opposite ends of the tube body. The first limiting member and the second limiting member cooperate to limit the movement range of the movable seat. The movable seat is used to receive the drive of the first driving device to move the connecting shaft relative to the tube body within the moving range.

4. The test fixture according to claim 1, characterized in that, The test connection mechanism includes multiple test pin groups, a variable pitch shaft, and a second drive device. The test probe group is movably configured with respect to the pitch axis, and the second driving device is connected to the pitch axis to drive the pitch axis to change the spacing between the multiple test probe groups.

5. The test fixture according to claim 4, characterized in that, The variable pitch shaft is provided with multiple helical sliding grooves, each of which is used to movably install the corresponding test probe group. The pitch between the multiple helical sliding grooves gradually changes in the target circumferential direction of the variable pitch shaft.

6. The test fixture according to claim 5, characterized in that, The test probe group includes multiple test probes and a fixing plate. The multiple test probes are fixedly mounted on the fixing plate, and the fixing plate is slidably mounted with the corresponding spiral sliding groove.

7. The test fixture according to claim 1, characterized in that, The test connection mechanism includes multiple test pin groups, a slot plate, and a mounting plate; the test pin groups are movably mounted on the mounting plate, and the slot plate is mounted on the side of the test pin groups away from the mounting plate; The slot plate is provided with a plurality of sliding slots, each of which corresponds to a test probe group, and the test probe group passes through the corresponding sliding slot. The spacing between the multiple sliding grooves gradually changes along the extension and retraction direction of the positioning member.

8. The test fixture according to claim 7, characterized in that, The mounting plate is provided with a first slide bar and a second slide bar on the side near the test probe group. The extension direction of the first slide bar is the same as the movable direction of the test probe group, and the extension direction of the second slide bar is the same as the extension and retraction direction of the positioning member. Multiple test probe groups are slidably disposed on the first slide bar, and the slot plate is slidably disposed on the second slide bar.

9. The test fixture according to claim 1, characterized in that, The length and width of the square mounting area range from 5 to 12 millimeters.

10. A testing apparatus, characterized in that, The testing apparatus includes: A test fixture, comprising the test fixture as described in any one of claims 1-9, for mounting the object under test; Tester; Multiple connecting wires, one end of which is used to connect to the corresponding test connection mechanism on the test socket, and the other end of which is used to connect to the test instrument.

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