Testing device for simulating DI and DO functions

Abstract

The utility model relates to a testing device for simulating DI and DO functions, a function board card circuit of the testing device comprises a voltage input circuit and an output display circuit, the voltage input circuit comprises a first resistor, a twenty-fifth capacitor and a third reverse switch transistor, and the third reverse switch transistor and the first resistor are connected in series into a power supply. One end of the power anode is connected with the power ground through the twenty-fifth capacitor; the output display circuit comprises a seventh photoelectric coupler and a fourth reverse switch transistor, one end of the fourth reverse switch transistor is grounded, the other end of the fourth reverse switch transistor is connected with the positive electrode of the input end of the seventh photoelectric coupler, and the negative electrode of the input end of the seventh photoelectric coupler is connected with the power ground through a seventeenth resistor; the negative electrode of the output end of the seventh photoelectric coupler is connected with the power ground through an eighteenth resistor. The device provided by the utility model completes the test of the DI / DO function only through a pure hardware mode, is simple and easy to use, and is high in test efficiency.

Description

Technical Field

[0001] This utility model relates to the field of automated testing, and in particular to a testing device that simulates DI and DO functions. Background Technology

[0002] In modern industrial automation control systems, the accurate testing and monitoring of DI (digital input) and DO (digital output) signals are crucial. As industrial production processes become increasingly complex and sophisticated, the requirements for the control and monitoring of various equipment and systems are also rising. Numerous sensors, actuators, and other devices need to interact with the control system via DI / DO signals to achieve precise control and status monitoring of the production process.

[0003] Traditional testing methods suffer from low efficiency due to manual measurement: Traditional DI / DO signal testing relies primarily on operators using multimeters to measure voltages one by one to determine the signal state. This method is not only inefficient but also prone to human error, especially when testing multiple signal points, resulting in significant time and labor costs. Furthermore, the construction of dedicated software and hardware testing systems is complex: While building a dedicated software and hardware testing system can achieve relatively comprehensive testing of DI / DO signals, this method requires a microcontroller and corresponding software display, making the system setup complex and costly. Moreover, for small-scale testing scenarios or temporary testing needs, building such a system is not economical or practical.

[0004] While some existing testing devices can meet the testing requirements of DI / DO signals to a certain extent, they still have some shortcomings. For example, some testing devices have relatively simple functions, only capable of performing simple signal continuity tests, and cannot intuitively display the signal status or perform analog input / output operations. In addition, some testing devices have complex structures and large sizes, making them inconvenient to carry and use in the field, thus limiting their application scope in practical engineering. This is exemplified by the technical content disclosed in Chinese invention patent "DI and DO Testing System and Method for GNC Components" (application number CN202211146452.1).

[0005] Given the shortcomings of traditional testing methods and existing related technologies, the industrial automation field urgently needs a simple, efficient, and low-cost DI / DO functional testing device that can quickly and accurately simulate signal input and output and monitor status, in order to meet the growing needs of industrial production and equipment maintenance, improve production efficiency, reduce testing costs, and ensure the stable operation of industrial automation systems.

[0006] In summary, the present invention provides a test device for simulating DI / DO functions, which effectively overcomes the shortcomings of traditional test methods and existing technologies, and provides a more convenient, efficient and reliable solution for DI / DO signal testing in the field of industrial automation. Summary of the Invention

[0007] To address the shortcomings of existing technologies, this invention proposes a testing device that simulates DI and DO functions. This invention uses LEDs to monitor and indicate the success of DI input, and utilizes buttons to simulate a high-level input triggering the optocoupler, further monitoring and indicating the success of DO output via LEDs. This invention replaces microcontroller monitoring or manual voltage testing with button-based operation, reducing testing complexity, lowering the cost of manual testing, and improving testing efficiency.

[0008] The technical solution of this invention is: a test device simulating DI and DO functions, comprising at least one DI dry contact input, at least one button-simulated DO output, and a function board circuit. Each DI dry contact input includes a first node and a second node. The first node is connected to ground through a sixth capacitor. A first button switch is provided between the first node and the second node. The function board circuit includes a voltage input circuit and an output display circuit. The voltage input circuit includes a first resistor, a twenty-fifth capacitor, and a third reverse switching transistor. The third reverse switching transistor and the first resistor are connected in series in a power supply. One end of the positive terminal of the power supply is connected to power ground through the twenty-fifth capacitor. The output display circuit includes a seventh optocoupler and a fourth reverse switching transistor. One end of the fourth reverse switching transistor is grounded, and the other end is connected to the positive terminal of the input of the seventh optocoupler. The negative terminal of the input of the seventh optocoupler is connected to power ground through a seventeenth resistor. The negative terminal of the output of the seventh optocoupler is connected to power ground through an eighteenth resistor. The positive terminal of the output of the seventh optocoupler is connected to power ground through a ninth resistor and a thirty-first capacitor. The connection between the positive terminal of the seventh optocoupler and the ninth resistor is connected to the positive terminal of the power supply through a third resistor. The capacitor connection serves as a dry contact input point, which is connected to ground via the fifth diode and the thirty-second resistor. The first node is connected between the first resistor and the third reverse switching transistor, and the second node is connected between the seventh optocoupler and the fourth reverse switching transistor. The button-simulated DO output includes the thirty-third resistor and the fifth push-button switch. The thirty-third resistor and the fifth push-button switch are connected in series to the positive terminal of the power supply. The output of the fifth push-button switch is connected to the fourteenth resistor, which is connected to ground via the sixteenth resistor. The output of the fourteenth resistor is connected to the gate of the second field-effect transistor, and the source of the second field-effect transistor is connected to the power supply. The second field-effect transistor's drain is connected to one pin of the optocoupler's input terminal via the seventh resistor. The other pin of the optocoupler's input terminal is connected to the positive power supply terminal, which is connected to the power supply ground via the twenty-eighth capacitor. One pin of the optocoupler's output terminal is connected to the positive power supply terminal, and the other pin is connected to the power supply ground via the twelfth resistor. The thirtieth capacitor is connected in parallel with the second reverse switching transistor and then connected to the other pin of the optocoupler's output terminal via the eighth resistor. The connection point between the eighth resistor and the thirtieth capacitor is the DO output point. The DO output point is connected to the power supply ground via the eleventh LED and the forty-second resistor.

[0009] According to the test device for simulating DI and DO functions as described above, the feature is that it includes four DI dry contact inputs.

[0010] According to the test device for simulating DI and DO functions as described above, its characteristic is that it has four-way button-controlled DO output.

[0011] According to the test device for simulating DI and DO functions as described above, the first button switch is a self-locking button switch.

[0012] According to the test device for simulating DI and DO functions as described above, the seventh optocoupler is a PC817C chip.

[0013] According to the test device for simulating DI and DO functions as described above, the fifth button switch is characterized in that: the fifth button switch is a self-locking button switch.

[0014] According to the test device for simulating DI and DO functions as described above, the characteristic is that the optocoupler is a PC817C chip.

[0015] This invention's device is independent of both software and hardware environments, requiring no microcontroller control board or testing software, thus reducing testing complexity. This invention's device performs DI / DO function testing solely through hardware, making it simple to use and highly efficient. Attached Figure Description

[0016] Figure 1 This is a functional block diagram of the equipment under test and the test fixtures.

[0017] Figure 2 This is a diagram simulating the DI dry contact input for the button.

[0018] Figure 3 This is a circuit diagram of a functional board for DI dry contact input and LED indication of DI input.

[0019] Figure 4 Block diagram for simulating DO output via buttons and indicating DO output via LEDs. Detailed Implementation

[0020] The technical solution of the present invention will be further described below with reference to the accompanying drawings.

[0021] like Figure 1 As shown, this utility model discloses a test device for simulating DI / DO function, including at least one DI dry contact input, at least one key-based simulated DO output, and a function board circuit. Figures 2 to 4 It illustrates four-channel DI dry contact input and four-channel button-simulated DO output.

[0022] like Figure 2 and Figure 3 As shown, each DI dry contact input of this utility model ( Figure 2There are a total of 4 inputs. Taking the first one as an example, it is the same as the first one in terms of structure. It includes a first node (DI1+) and a second node (DI1-). The first node is connected to ground through a sixth capacitor (C6). A first button switch (S1) is set between the first node and the second node. The first button switch is preferably a button switch with self-locking.

[0023] like Figure 3 As shown, the functional board circuit of this utility model includes a voltage input circuit and an output display circuit. The voltage input circuit includes a first resistor (R1), a twenty-fifth capacitor (C25), and a third reverse switching transistor (D3). The third reverse switching transistor and the first resistor are connected in series in the power supply, and one end of the power supply is connected to the power ground through the twenty-fifth capacitor. Figure 3 As shown, the output display circuit includes a seventh optocoupler (U7) and a fourth reverse switching transistor (D4). One end of the fourth reverse switching transistor is grounded, and the other end is connected to the positive terminal of the seventh optocoupler's input. The negative terminal of the seventh optocoupler's input is connected to the power supply ground through a seventeenth resistor (R17). The negative terminal of the seventh optocoupler's output is connected to the power supply ground through an eighteenth resistor (R18), and the positive terminal of the seventh optocoupler's output is connected to the power supply ground through a ninth resistor (R9) and a thirty-first capacitor (C31). The connection between the positive terminal of the seventh optocoupler's output and the ninth resistor (R9) is connected to the positive terminal of the power supply through a third resistor (R3). The seventh optocoupler is a PC817C chip. The connection between the ninth resistor and the thirty-first capacitor forms a dry contact input point (2K1000-DI1). The dry contact input point is connected to the power supply ground through a fifth diode (D5) and a thirty-second resistor, thus realizing the display of analog input DO and data isolation input.

[0024] like Figure 3 As shown, the first node (DI1+) is connected between the first resistor (R1) and the third reverse switching transistor (D3), and the second node (DI1-) is connected between the seventh optocoupler (U7) and the fourth reverse switching transistor (D4).

[0025] like Figure 4As shown, the analog DO output of this invention includes a 33rd resistor (R33) and a 5th push-button switch (S5). The 5th push-button switch is preferably a self-locking push-button switch. The 33rd resistor and the 5th push-button switch are connected in series to the positive terminal of the power supply. The output of the 5th push-button switch is connected to the 14th resistor (R14). The 14th resistor is connected to ground through the 16th resistor (R16). The output of the 14th resistor is connected to the gate of the second field-effect transistor (TF3414). The source of the second field-effect transistor is connected to ground. The drain of the second field-effect transistor is connected to one pin of the input terminal of the optocoupler (U6) through the 7th resistor (R7). The other pin of the input terminal of the optocoupler is connected to the positive terminal of the power supply. The positive terminal of the power supply is connected to ground through the 28th capacitor (C28). One pin of the optocoupler's output is connected to the positive terminal of the power supply, and the other pin is connected to ground via the twelfth resistor (R12). The thirtieth capacitor (C30) and the second reverse switching transistor (D2 RSD5V) are connected in parallel and then connected to the other pin of the optocoupler's output via the eighth resistor (R8). The optocoupler is a PC817C chip. The connection point between the eighth resistor (R8) and the thirtieth capacitor (C30) is the DO output point (D01). The DO output point is connected to ground via the eleventh LED (D11) and the forty-second resistor (R42).

[0026] This invention utilizes a button to simulate a DI dry contact input and uses an LED to monitor and indicate whether the DI input is successful. It also utilizes a button to simulate a high-level input triggering an optocoupler, and uses an LED to monitor and indicate whether the DO output is successful. Figure 2 S1 / S2 / S3 / S4 are the buttons mentioned above. By manually pressing the buttons, the actual operation of the DI dry contact can be simulated. Figure 2 The DI1 circuit shown is the DI input circuit. After the DI input signal, a high-level signal is output through the optocoupler, triggering the LED to light up. D5 / D6 / D9 / D10 in the diagram are the LEDs. This invention eliminates the need for operators to measure voltage individually with a multimeter for DI / DO signal input and detection, and also eliminates the need to build a hardware / software testing system (requiring a microcontroller and software display). This reduces testing complexity and the cost of manual testing, thereby improving testing efficiency.

Claims

1. A test device simulating DI and DO functions, comprising at least one DI dry contact input, at least one button-simulated DO output, and a function board circuit, each DI dry contact input including a first node and a second node, the first node being connected to ground via a sixth capacitor, and a first button switch being disposed between the first node and the second node, characterized in that: The functional board circuit includes a voltage input circuit and an output display circuit. The voltage input circuit includes a first resistor, a twenty-fifth capacitor, and a third reverse switching transistor. The third reverse switching transistor and the first resistor are connected in series in the power supply. One end of the power supply's positive terminal is connected to ground through the twenty-fifth capacitor. The output display circuit includes a seventh optocoupler and a fourth reverse switching transistor. One end of the fourth reverse switching transistor is grounded, and the other end is connected to the positive input terminal of the seventh optocoupler. The negative input terminal of the seventh optocoupler is connected to ground through the seventeenth resistor. The negative output terminal of the seventh optocoupler is connected to ground through the eighteenth resistor. The positive output terminal of the seventh optocoupler is connected to ground through the ninth resistor and the thirty-first capacitor. The connection point between the positive output terminal of the seventh optocoupler and the ninth resistor is connected to the positive power supply through the third resistor. The connection point between the ninth resistor and the thirty-first capacitor is a dry contact input point, which is connected to ground through the fifth diode and the thirty-second resistor. The first node is connected between the first resistor and the third reverse switching transistor. The second node is connected between the seventh optocoupler and the fourth reverse switching transistor. The button-simulated DO output includes a thirty-third resistor and a fifth button switch. The thirty-third resistor and the fifth button switch are connected in series to the positive terminal of the power supply. The output of the fifth button switch is connected to the fourteenth resistor. The fourteenth resistor is connected to the power supply ground through the sixteenth resistor. The output of the fourteenth resistor is connected to the gate of the second field-effect transistor. The source of the second field-effect transistor is connected to the power supply ground. The drain of the second field-effect transistor is connected to one pin of the input terminal of the optocoupler through the seventh resistor. The other pin of the input terminal of the optocoupler is connected to the positive terminal of the power supply. The positive terminal of the power supply is connected to the power supply ground through the twenty-eighth capacitor. One pin of the output terminal of the optocoupler is connected to the positive terminal of the power supply. The other pin of the output terminal of the optocoupler is connected to the power supply ground through the twelfth resistor. The thirtieth capacitor and the second reverse switching transistor are connected in parallel and then connected to the other pin of the output terminal of the optocoupler through the eighth resistor. The connection point of the eighth resistor and the thirtieth capacitor is the DO output point. The DO output point is connected to the power supply ground through the eleventh light-emitting diode and the forty-second resistor.

2. The test apparatus for simulating DI and DO functions according to claim 1, characterized in that: It includes four DI dry contact inputs.

3. The test device for simulating DI and DO functions according to claim 1, characterized in that: Four-way button simulates DO output.

4. The test device for simulating DI and DO functions according to claim 1, characterized in that: The first button switch is a self-locking button switch.

5. The test apparatus for simulating DI and DO functions according to claim 1, characterized in that: The seventh optocoupler is a PC817C chip.

6. The test apparatus for simulating DI and DO functions according to claim 1, characterized in that: The fifth button switch is a self-locking button switch.

7. The test apparatus for simulating DI and DO functions according to claim 1, characterized in that: The optocoupler is a PC817C chip.

Images