Bottom plate assembly of comprehensive test box

Abstract

The utility model relates to a bottom plate assembly of a comprehensive test box, which belongs to the technical field of test boxes, and comprises a bottom plate assembly arranged on the comprehensive test box, the bottom plate assembly comprises a test base detachably arranged on the comprehensive test box, and the middle area of the test base protrudes upwards to form a rectangular bearing platform. A through hole penetrating up and down is formed in the test base, and an anti-skid structure is detachably mounted on the upper surface of the bearing platform; the anti-skid structure comprises an anti-skid pad and anti-skid protrusions. The non-slip mat comprises a base material layer, a functional layer and a surface treatment layer. According to the comprehensive test box bottom plate assembly, the anti-skid structure is installed on the bearing platform, the friction force between the bearing platform and a placed object is increased, and therefore the object is prevented from sliding or toppling over due to vibration or external force in the test process, and the friction force is increased; and the articles are prevented from sliding or toppling over due to vibration or external force in the test process.

Description

Technical Field

[0001] This utility model relates to the field of test chamber technology, specifically to a comprehensive test chamber base plate assembly. Background Technology

[0002] Test chambers are a general term for products in the environmental testing industry. They simulate natural climate environments within an effective space and are essential testing equipment in fields such as aviation, automobiles, home appliances, and scientific research. They are used to test and determine the parameters and performance of electrical, electronic, and other products and materials after temperature environment changes such as high temperature, low temperature, alternating damp heat, or constant temperature, or to measure product parameters under simulated vibration environments.

[0003] A search revealed that patent document CN221077995U discloses a detachable integrated test chamber, including a test chamber body and a vibration table located below the test chamber body. The test chamber body includes an outer box and an inner box set inside the outer box. Both the outer box and the inner box have openings at their bottoms, and test bases that can be horizontally inserted into the bottom of the inner box are provided at the openings. The test bases include a horizontal vibration base, a vertical vibration base, and a sealed base. The vibration table has a first vibration platform and a second vibration platform. The first vibration platform can be inserted into the vertical vibration base from bottom to top, and the second vibration platform can be inserted horizontally into the horizontal vibration base. This utility model, by adding a pull-out test base to the bottom of the test chamber, allows selection of a sealed base, a horizontal vibration base, or a vertical vibration base according to different product testing requirements, enabling high and low temperature testing, horizontal vibration testing, and vertical vibration testing of the product, respectively. This integrates multiple testing functions into a single test chamber.

[0004] The aforementioned patent also has the following drawbacks: such as the lack of an anti-slip structure on the support platform used to place the product. Since the items are prone to sliding or tipping over due to vibration or external force during the test, it will affect the accuracy and safety of the test. Therefore, a comprehensive test chamber bottom plate assembly is proposed to solve the problems mentioned above. Utility Model Content

[0005] To address the shortcomings of existing technologies, this utility model provides a comprehensive test chamber base plate assembly, which has the advantages of increasing friction and preventing items from sliding or tipping over during testing due to vibration or external forces. It solves the problem of the lack of anti-slip structure on the support platform, which makes the test items prone to tipping over.

[0006] To achieve the above objectives, the present invention provides the following technical solution: a base plate assembly for a comprehensive test chamber, comprising a base plate assembly disposed on a comprehensive test chamber, the base plate assembly comprising a test base detachably mounted on the comprehensive test chamber, and a rectangular support platform forming an upward protrusion in the middle area of ​​the test base, the test base having a through hole extending vertically through the interior, and an anti-slip structure detachably mounted on the upper surface of the support platform;

[0007] The anti-slip structure includes an anti-slip pad and anti-slip protrusions;

[0008] The anti-slip mat includes a substrate layer, a functional layer, and a surface treatment layer, which are distributed from bottom to top.

[0009] Furthermore, a sealing cap is provided on the upper part of the test base along the circumferential edge of the through hole, and the through hole is shaped like a square.

[0010] Furthermore, the anti-slip mat has several mounting holes inside, which allows the anti-slip mat to be cut.

[0011] Furthermore, an adhesive layer is bonded between the substrate layer and the functional layer, and the adhesive layer is a strong adhesive.

[0012] Furthermore, the functional layer includes an anti-slip layer and a buffer layer, with the buffer layer located between the anti-slip layer and the substrate layer.

[0013] Furthermore, the surface treatment layer and anti-slip protrusions are both disposed on the upper surface of the anti-slip layer, increasing the friction between the anti-slip mat and the items placed on it, and preventing the items from sliding or shifting.

[0014] Furthermore, the test base is provided with a locking mechanism, which includes a fixed base fixed to the integrated test chamber, a buckle hinged to the fixed base, a buckle ring hinged to the buckle ring, and a fastener fixed to the test base, wherein the buckle ring is fastened to the fastener.

[0015] Compared with the prior art, this utility model provides a comprehensive test chamber bottom plate assembly, which has the following beneficial effects:

[0016] 1. The base plate assembly of this comprehensive test chamber increases the friction between the platform and the placed items by installing an anti-slip structure on the support platform. This prevents the items from sliding or tipping over due to vibration or external forces during the test. At the same time, the anti-slip pad can also protect the base plate assembly from scratches or wear to a certain extent, while reducing direct contact between the product and the base plate assembly, thus reducing the risk of product damage. It achieves the advantages of increasing friction and preventing items from sliding or tipping over due to vibration or external forces during the test, effectively solving the problem of test items easily tipping over due to the lack of an anti-slip structure on the support platform.

[0017] 2. The base plate assembly of the integrated test chamber can be locked by rotating the handle to move the buckle ring, so that the buckle ring can be fastened to the fastener. This allows the base plate assembly to be detachably connected to the integrated test chamber. Attached Figure Description

[0018] Figure 1 This is a schematic diagram of the overall structure of this utility model;

[0019] Figure 2 This is a schematic diagram of the anti-slip structure of this utility model;

[0020] Figure 3 This is a schematic diagram of the structure of the anti-slip mat of this utility model;

[0021] Figure 4 This is a schematic diagram of the functional layer of this utility model;

[0022] Figure 5 This is a schematic diagram of the locking mechanism of this utility model.

[0023] In the diagram: 1. Base plate assembly; 11. Test base; 12. Bearing platform; 13. Through hole; 14. Sealing cover; 2. Anti-slip structure; 201. Anti-slip pad; 202. Anti-slip protrusion; 203. Mounting hole; 2011. Substrate layer; 2012. Adhesive layer; 2013. Functional layer; 2014. Surface treatment layer; 20131. Anti-slip layer; 20132. Buffer layer; 3. Locking mechanism; 301. Fixed base; 302. Buckle; 303. Buckle ring; 304. Fastener. Detailed Implementation

[0024] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0025] Example 1:

[0026] Please see Figures 1 to 4 A comprehensive test chamber base plate assembly includes a base plate assembly 1 disposed on the comprehensive test chamber. The base plate assembly 1 includes a test base 11 that can be detachably installed on the comprehensive test chamber. The test base 11 has a rectangular support platform 12 that protrudes upward in the middle area. The test base 11 has a through hole 13 that runs vertically through it. A sealing cover 14 is disposed on the upper part of the test base 11 along the circumferential edge of the through hole 13. The through hole 13 is shaped like a square.

[0027] In this embodiment, an anti-slip structure 2 is detachably installed on the upper surface of the support platform 12. The anti-slip structure 2 includes an anti-slip pad 201 and anti-slip protrusions 202. The anti-slip pad 201 includes a substrate layer 2011, a functional layer 2013, and a surface treatment layer 2014, which are distributed sequentially from bottom to top. The anti-slip pad 201 has several mounting holes 203 inside, which allows the anti-slip pad 201 to be cut.

[0028] Specifically, an adhesive layer 2012 is bonded between the substrate layer 2011 and the functional layer 2013. The adhesive layer 2012 is a strong adhesive, such as double-sided tape, AB glue, or other specialized adhesives. The functional layer 2013 includes an anti-slip layer 20131 and a cushioning layer 20132, with the cushioning layer 20132 located between the anti-slip layer 20131 and the substrate layer 2011. The anti-slip structure 2 is installed on the support platform 12 to increase the friction between the support platform 12 and the placed items, thereby preventing the items from sliding or tipping over during testing due to vibration or external forces. Simultaneously, the anti-slip pad 201 can also protect the base plate assembly 1 from scratches or wear to a certain extent, while reducing direct contact between the product and the base plate assembly 1, thus lowering the risk of product damage.

[0029] It should be noted that both the surface treatment layer 2014 and the anti-slip protrusions 202 are located on the upper surface of the anti-slip layer 20131, increasing the friction between the anti-slip mat 201 and the items placed on it, preventing the items from sliding or shifting. The substrate layer 2011 is the supporting structure of the anti-slip mat 201 and may be made of rubber, silicone, PVC, or other polymer materials. The anti-slip layer 20131 typically contains materials with a high coefficient of friction, such as rubber particles, silicone particles, or specially treated PVC surfaces. The surface treatment layer 2014 includes special coatings or processing techniques, such as anti-slip textures, anti-slip agents, or anti-slip films, further enhancing the anti-slip effect while providing additional wear resistance and corrosion resistance.

[0030] Example 2:

[0031] Please see Figure 1 and Figure 5 Based on Embodiment 1, a locking mechanism 3 is provided on the test base 11. The locking mechanism 3 includes a fixed base 301 fixed on the integrated test chamber, a buckle 302 hinged to the fixed base 301, a buckle ring 303 hinged to the buckle ring 302, and a fastener 304 fixed on the test base 11. The buckle ring 303 and the fastener 304 are fastened together.

[0032] In this embodiment, the number of locking mechanisms 3 is at least four.

[0033] By adopting the above technical solution, rotating the buckle 302 can drive the buckle ring 303 to move, so that the buckle ring 303 can be fastened to the fastener 304, thus locking the base plate assembly 1 and making it detachably connected to the integrated test chamber.

[0034] The working principle of the above embodiments is as follows:

[0035] When in use, the anti-slip structure 2 is installed on the support platform 12 to increase the friction between the support platform 12 and the placed items, thereby preventing the items from sliding or tipping over due to vibration or external force during the test. At the same time, the anti-slip pad 201 can also protect the base plate assembly 1 from scratches or wear to a certain extent, while reducing the direct contact between the product and the base plate assembly 1, thus reducing the risk of product damage.

[0036] It should be noted that, in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

[0037] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A base plate assembly for a comprehensive test chamber, comprising a base plate assembly (1) disposed on a comprehensive test chamber, characterized in that: The base plate assembly (1) includes a test base (11) that can be detachably installed on the integrated test chamber, and a rectangular support platform (12) is formed by the upward protrusion of the middle area of ​​the test base (11). The test base (11) has a through hole (13) that runs vertically through it. The upper surface of the support platform (12) is detachably installed with an anti-slip structure (2). The anti-slip structure (2) includes an anti-slip pad (201) and anti-slip protrusions (202); The anti-slip mat (201) includes a substrate layer (2011), a functional layer (2013), and a surface treatment layer (2014), and the substrate layer (2011), the functional layer (2013), and the surface treatment layer (2014) are distributed from bottom to top.

2. The integrated test chamber bottom plate assembly according to claim 1, characterized in that: A sealing cover (14) is provided on the upper part of the test base (11) along the circumferential edge of the through hole (13), and the through hole (13) is shaped like a square.

3. The integrated test chamber bottom plate assembly according to claim 1, characterized in that: The anti-slip mat (201) has several mounting holes (203) inside, which allow the anti-slip mat (201) to be cut.

4. The integrated test chamber bottom plate assembly according to claim 1, characterized in that: An adhesive layer (2012) is bonded between the substrate layer (2011) and the functional layer (2013), and the adhesive layer (2012) is a strong adhesive.

5. The integrated test chamber bottom plate assembly according to claim 1, characterized in that: The functional layer (2013) includes an anti-slip layer (20131) and a buffer layer (20132), wherein the buffer layer (20132) is located between the anti-slip layer (20131) and the substrate layer (2011).

6. The integrated test chamber bottom plate assembly according to claim 5, characterized in that: The surface treatment layer (2014) and the anti-slip protrusions (202) are both provided on the upper surface of the anti-slip layer (20131) to increase the friction between the anti-slip pad (201) and the items placed on it, and to prevent the items from sliding or shifting.

7. The integrated test chamber bottom plate assembly according to claim 1, characterized in that: The test base (11) is provided with a locking mechanism (3), which includes a fixed base (301) fixed on the integrated test chamber, a buckle (302) hinged to the fixed base (301), a buckle (303) hinged to the buckle (302), and a fastener (304) fixed on the test base (11). The buckle (303) is fastened to the fastener (304).

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