Test system suitable for array type optical switch

Abstract

The utility model relates to a test system suitable for an array type optical switch. The device comprises a test light path unit which is used for loading target test light to a target light channel to be tested and at least comprises a test light source and a light supply selection light switch adaptively connected with the test light source, and a test processing unit which at least comprises a data processing unit and a plurality of channel photoelectric conversion detection units, one channel photoelectric conversion detection unit is connected with an optical channel output port of one optical channel provided by the array type optical switch to be tested so as to perform photoelectric conversion on a post-channel optical signal output by the connected optical channel through the channel photoelectric conversion detection unit and transmit a channel test electric signal generated after conversion to the data processing unit; and the data processing unit sends the received channel test electric signal to the test main controller. According to the utility model, the array type optical switch can be effectively tested, and the efficiency, the accuracy and the consistency of the array type optical switch test are improved.

Description

Technical Field

[0001] This utility model relates to a testing system, and more particularly to a testing system suitable for array-type optical switches. Background Technology

[0002] Optical switches are key devices in optical networks that enable optical signal switching. They are widely used in optical transmission systems, optical cross-connects, and optical add-drop multiplexing. To ensure the performance of optical switches, it is generally necessary to test them and determine their performance based on the test results.

[0003] Currently, testing optical switches typically relies on manual operation, which is not only inefficient but also makes it difficult to guarantee the accuracy and consistency of the tests. In particular, when the optical switch is an array-type optical switch, since array-type optical switches have many switching channels, how to effectively achieve efficiency, accuracy, and consistency in testing array-type optical switches is a technical problem that urgently needs to be solved. Summary of the Invention

[0004] The purpose of this invention is to overcome the shortcomings of the existing technology and provide a testing system suitable for array-type optical switches, which can effectively test array-type optical switches and improve the efficiency, accuracy and consistency of array-type optical switch testing.

[0005] According to the technical solution provided by this utility model, a test system suitable for array-type optical switches is provided, the test system comprising:

[0006] The test main controller is adapted and connected to the array optical switch under test to configure the optical channel state of the array optical switch under test, so as to form the target optical channel under test based on the configured optical channel state;

[0007] The test optical path unit, adapted and connected to the input terminals of the optical channels provided by the test main controller and the array-type optical switch under test, is used to load target test light onto the target optical channel under test. It includes at least a test light source and a light supply selection optical switch adapted and connected to the test light source.

[0008] The light supply selection optical switch has several light supply selection channels. The optical channel input port on the array optical switch under test is connected to the light supply selection channel in the light supply selection switch in a one-to-one correspondence.

[0009] The test main controller configures the test light source to generate the target test light and configures the light supply state of the light supply selection switch so that the target test light is loaded onto the input end of the target test light channel through the corresponding light supply selection channel of the light supply selection switch.

[0010] The test processing unit, adapted and connected to the output terminals of the optical channels provided by the test main controller and the optical switches under test array, includes at least a data processing unit and several channel photoelectric conversion detection units.

[0011] A channel photoelectric conversion detection unit is connected to the optical channel output port of an optical channel provided by the array optical switch under test, so as to perform photoelectric conversion on the optical signal output from the connected optical channel through the channel photoelectric conversion detection unit, and transmit the converted channel test electrical signal to the data processing unit;

[0012] The data processing unit sends the received channel test electrical signals to the test main controller.

[0013] The test optical path unit also includes a light source LC flange that is adapted and connected to the test light source, wherein...

[0014] The test light source is connected to the beam splitter via the light source LC flange.

[0015] The first beam splitter is connected to the optical input terminal of the light supply selection switch so that the target test light is loaded onto the light supply selection switch through the first beam splitter.

[0016] The second beam splitter is connected to the data processing unit via a beam splitting photoelectric conversion detection unit, wherein the beam splitting ratio between the first beam splitter and the second beam splitter is 2:98.

[0017] One of the light selection channels of the light supply selection switch is connected to the power meter adapter via the power meter LC flange to measure the optical power of the target test light using the power meter, and the power meter is electrically connected to the test main controller.

[0018] The light supply selection switch is electrically connected to the DAC setpoint unit, which is connected to the data processing unit. The data processing unit configures the light supply state of the light supply selection switch through the DAC setpoint unit so as to load the target test light onto the input end of the target test light channel through a light supply selection channel.

[0019] The channel photoelectric conversion detection unit includes a channel photoelectric conversion amplification circuit and an ADC conversion circuit adapted and connected to the channel photoelectric conversion amplification circuit, wherein...

[0020] The optical signal after the channel is received by the channel photoelectric conversion and amplification circuit, which includes a channel photodiode and a channel amplifier circuit adapted and connected to the channel photodiode.

[0021] The channel amplifier circuit is connected to the ADC conversion circuit, and the ADC conversion circuit is connected to the data processing unit.

[0022] The channel amplifier circuit includes a channel amplifier, wherein,

[0023] The channel amplifier uses a TPA8304 amplifier chip. The input terminal of the amplifier chip is connected to the anode terminal of the channel photodiode, and the cathode terminal of the channel photodiode is connected to the VPBD terminal of the amplifier chip.

[0024] The VSUM terminal of the amplifier chip is grounded through the first capacitor, the VLOG terminal and the BFIN terminal of the amplifier chip are grounded through the second capacitor, and the GND terminal of the amplifier chip is directly grounded.

[0025] The VCC terminal of the amplifier chip is connected to a 5V voltage, and the BFNG terminal of the amplifier chip is connected to VOUT and then connected to the ADC conversion circuit.

[0026] The data processing unit is connected to the data processing USB communication port via a signal conversion interface circuit, and is also connected to the test main controller via the data processing USB communication port. The signal conversion interface is a USB-UART conversion interface circuit.

[0027] The test main controller is electrically connected to the switch driver board via the drive USB communication port, and connected to the optical switch array under test via the optical switch driver board, so as to configure the optical channel state of the optical switch array under test using the optical switch driver board.

[0028] The array-type optical switch under test includes an uplink optical path module and a downlink optical path module, wherein,

[0029] The uplink optical path module provides the uplink optical channel, and the downlink optical path module provides the downlink optical channel.

[0030] The number of optical supply selection channels provided by the optical supply selection switch shall not be less than the sum of the number of uplink optical channels and downlink optical channels.

[0031] The test light source includes a wavelength division multiplexer, wherein...

[0032] The wavelength division multiplexer is connected to the pump source and the attenuator, and the wavelength division multiplexer is connected to the isolator through erbium-doped fiber, and the test source light is output through the isolator.

[0033] The advantages of this invention are: the test main controller can configure the optical channel status of the array optical switch under test to determine the target optical channel under test in a test; the test main controller controls the test optical path unit to load the target test light onto the target test optical channel; the test processing unit can sample and process the optical signal after the channel and generate the channel test electrical signal, so that the test main controller can analyze the test status of the array optical switch under test based on all the channel test electrical signals.

[0034] When testing the array optical switch under test, the optical channel can be automatically switched during the test process, and the acquisition and processing of optical signals after the channel can improve the efficiency of testing the array optical switch under test. When testing different optical channels, the same test conditions are used. Therefore, the test consistency and accuracy of the array optical switch under test are high. Attached Figure Description

[0035] Figure 1 This is a structural block diagram of one embodiment of the testing system of this utility model.

[0036] Figure 2 This is a schematic diagram of one embodiment of the main testing unit of this utility model.

[0037] Figure 3 This is a circuit diagram of one embodiment of the cooperation between the channel photoelectric conversion detection unit and the data processing unit of this utility model.

[0038] Figure 4 This is a schematic diagram of one embodiment of the test light source of this utility model.

[0039] Explanation of reference numerals in the attached diagram: 1-Test light source, 2-Power meter, 3-Light source LC flange, 4-Power meter LC flange, 5-Splitter, 6-Splitter photoelectric conversion detection unit, 7-Light supply selection optical switch, 8-Optical input MT jumper interface, 9-Optical output MT jumper interface, 10-Channel photoelectric conversion detection unit group, 11-DAC setpoint unit, 12-Sampling conversion unit, 13-Data processing unit, 14-Data processing USB communication port, 15-Test main controller, 16-Test main unit, 17-Array optical switch under test, 18-Driver USB communication port, 19-Switch driver board, 20-Signal conversion interface circuit, 21-Pump source, 22-Attenuator, 23-Wavelength division multiplexer, 24-Erbium-doped fiber, 25-Isolator. Detailed Implementation

[0040] The present invention will be further described below with reference to the specific accompanying drawings and embodiments.

[0041] To effectively test array-type optical switches and improve the efficiency, accuracy, and consistency of the testing, this invention provides a testing system suitable for array-type optical switches. Specifically, the testing system includes:

[0042] The test main controller 15 is adapted and connected to the array optical switch 17 under test, and is used to configure the optical channel state of the array optical switch 17 under test, so as to form the target optical channel under test based on the configured optical channel state.

[0043] The test optical path unit is adapted and connected to the input terminals of the optical channels provided by the test main controller 15 and the array-type optical switch under test 17, and is used to load target test light onto the target optical channel under test. It includes at least a test light source 1 and a light supply selection optical switch 7 adapted and connected to the test light source 1.

[0044] The light supply selection optical switch 7 has several light supply selection channels, and the optical channel input port on the array optical switch 17 under test is connected to the light supply selection channel in the light supply selection switch 7 in a one-to-one correspondence.

[0045] The test main controller 15 configures the test light source 1 to generate the target test light, and configures the light supply state of the light supply selection switch 7 so that the target test light is loaded onto the input end of the target test light channel through the corresponding light supply selection channel of the light supply selection switch 7.

[0046] The test processing unit, adapted and connected to the output terminals of the optical channels provided by the test main controller 15 and the optical switch under test array 7, includes at least a data processing unit 13 and several channel photoelectric conversion detection units, wherein...

[0047] A channel photoelectric conversion detection unit is connected to the optical channel output port of an optical channel provided by the array optical switch 17 under test, so as to perform photoelectric conversion on the channel optical signal output by the connected optical channel through the channel photoelectric conversion detection unit, and transmit the converted channel test electrical signal to the data processing unit 13;

[0048] The data processing unit 13 sends the received channel test electrical signals to the test main controller 15.

[0049] It should be noted that the array optical switch can be any of the commonly used optical switch types, such as an MCS-type array optical switch. The array optical switch to be tested forms the array optical switch under test 17. Figure 1 The image shows an embodiment of testing the array-type optical switch 17 under test, by... Figure 1 It is understood that when testing the array-type optical switch 17 under test, a test main controller 15 should be provided. Specifically, the test main controller 15 includes a computer. Of course, the test main controller 15 can also take other forms, which can be selected according to the needs.

[0050] Based on the characteristics of array-type optical switches, it is known that for any array-type optical switch 17 under test, the array-type optical switch 17 under test can provide multiple optical channels, and the optical channels provided by the array-type optical switch 17 under test can be switched. When testing the array-type optical switch 17 under test, it generally means loading the target test light into the corresponding optical channel in the array-type optical switch 17 under test. After that, the optical signal passing through the optical channel is detected and measured. The purpose of testing the array-type optical switch 17 under test is consistent with the existing technology.

[0051] During a single test, only a portion of the optical channels within the array-type optical switch 17 under test can typically be tested. This means that only a portion of the optical channels can be loaded with the target test light during a single test. In this case, the optical channel currently receiving the target test light is designated as the target test optical channel. After propagating through the target test optical channel, the target test light forms a post-channel optical signal. Therefore, to meet the testing requirements of the array-type optical switch 17 under test, optical channels should be switched so that different optical channels can be used as target test optical channels.

[0052] In one embodiment of this utility model, the optical channel of the array optical switch 17 under test can be switched by the test main controller 15 to configure the optical channel state of the array optical switch 17 under test. Figure 1 and Figure 3 The figure shows an embodiment of the connection and cooperation between the test master controller 15 and the array optical switch under test 17. As shown in the figure, the test master controller 15 can be electrically connected to the switch driver board 19 through the drive USB communication port 18. Then, it is connected to the array optical switch under test 17 through the optical switch driver board 19, so as to drive the array optical switch under test 17 and configure the optical channel state of the array optical switch under test 17.

[0053] Specifically, the optical switch driver board 19 can adopt a commonly used form, which is related to the model of the array optical switch 17 under test. For example, if the array optical switch 17 under test adopts the MCS type mentioned above, the corresponding optical switch driver board 19 can be selected according to the manual of the array optical switch 17 under test. The selected optical switch driver board 19 should be able to meet the optical channel switching of the array optical switch 17 under test. The forms of the optical switch driver board 19 will not be listed here.

[0054] As explained above, when testing a target optical channel, the target test light needs to be loaded into the target optical channel. In one embodiment of this invention, the target test light can be generated by a test optical path unit. Specifically, the test optical path unit may include at least a test light source 1 and a light supply selection switch 7, such as... Figure 1 and Figure 2 As shown.

[0055] It should be noted that the light supply selection optical switch 7 is a single-input, multi-output optical switch. Therefore, the light supply selection optical switch 7 can provide multiple light supply selection channels; for example, an input terminal and a corresponding output terminal can form a light supply selection channel. When testing the array optical switch 17 under test, the optical channel input ports on the array optical switch 17 under test should be connected one-to-one with the light supply selection channels in the light supply selection switch 7. That is, one optical channel input port of the array optical switch 17 under test should be connected to one light supply selection channel. At this time, the optical channel input ports on the array optical switch 17 under test should be connected to the corresponding output terminals of the light supply selection channels. Generally, the number of light supply selection channels provided by the light supply selection optical switch 7 should not be less than the number of optical channel input ports of the array optical switch 17 under test.

[0056] When testing the array-type optical switch 17 under test, the test light source 1 is first configured to generate the target test light using the test main controller 15. At the same time, the light supply state of the light supply selection switch 7 is configured. After that, the target test light can be loaded into the optical channel input port corresponding to the target test optical channel through the corresponding light supply selection channel of the light supply selection switch 7.

[0057] Generally, the optical switch under test (OST) 17 has multiple optical channel input ports and multiple optical channel output ports. The number of optical channel output ports can be the same as the number of optical channel input ports. The optical channel input ports and optical channel output ports can be switched to their corresponding states by a switch within the OST 17, thereby forming an optical channel. The specific method and process of forming an optical channel can be consistent with existing technology and will not be elaborated here. When loading the target test light onto the target OST optical channel, the target test light should be loaded onto the optical channel input port corresponding to the target OST optical channel, and then output through the optical channel output port corresponding to the target test optical channel.

[0058] In one embodiment of this utility model, the test light source 1 includes a wavelength division multiplexer 23, wherein...

[0059] The wavelength division multiplexer 23 is connected to the pump source 21 and the attenuator 22, and the wavelength division multiplexer 23 is connected to the isolator 25 through the erbium-doped fiber 24, and the test source light is output through the isolator 25.

[0060] Figure 4The figure shows one embodiment of the test light source 1. The test light source 1 includes a wavelength division multiplexer 23, which is connected to a pump source 21. The pump source 21 can provide pump light, and the attenuator 22 can absorb the remaining pump light. The wavelength division multiplexer 23 and the isolator 25 can adopt the commonly used forms. The test source light can be output through the isolator 25. The test source light is the light that has not been split. After splitting the test source light, the target test light can be generated. The method and process of generating the target test light are illustrated below.

[0061] Figure 1 In this process, the test light source 1 can also be electrically connected to the test main controller 15. At this time, the wavelength of the test source light generated by the test light source 1 and the power of the test light source 1 can be adjusted by the test main controller 15. For example, the wavelength and power of the test source light generated by the test light source 1 can be adjusted by controlling the pump source 21. The specific method of adjusting the test light source 1 can be consistent with the existing technology, and will not be described in detail here.

[0062] In one embodiment of this utility model, the test optical path unit further includes a light source LC flange 3 adapted and connected to the test light source 1, wherein...

[0063] Test light source 1 is connected to beam splitter 5 via light source LC flange 3.

[0064] The first beam splitting end of the beam splitter 5 is connected to the optical input end of the light supply selection switch 7 so that the target test light is loaded onto the light supply selection switch 7 through the first beam splitting end of the beam splitter 5.

[0065] The second beam splitter of the beam splitter 5 is connected to the data processing unit 13 via the beam splitting photoelectric conversion detection unit 6, wherein the beam splitting ratio between the first beam splitter and the second beam splitter of the beam splitter 5 is 2:98.

[0066] Figure 1 and Figure 2 In this setup, the test light source 1 is connected to the light source LC flange 3, which improves the stability of the test source light transmission. The light source LC flange 3 is connected to the input end of the beam splitter 5, which can be a 2:98 beam splitter. After the test source light is split by the beam splitter 5, the target test light can be obtained at the first splitting end of the beam splitter 5. Subsequently, the target test light is loaded onto the light supply selection switch 7, that is, the target test light is loaded onto the input end of the light supply selection switch 7.

[0067] In order to monitor the power of the test light source 1, in one embodiment of this utility model, the second beam splitting end of the beam splitter 5 is connected to the data processing unit 13 via the beam splitting photoelectric conversion detection unit 6. Specifically, the beam splitting photoelectric conversion detection unit 6 can detect and convert the optical signal at the second beam splitting end of the beam splitter 5. Subsequently, the data processing unit 13 can be used to monitor the power. The methods of the beam splitting photoelectric conversion detection unit 6 in detecting and converting the optical signal, and the methods of the data processing unit 13 in monitoring the power, will be explained in detail below.

[0068] In one embodiment of this utility model, the light supply selection switch 7 is electrically connected to the DAC (digital-to-analog converter) setpoint unit 11, and the DAC setpoint unit 11 is connected to the data processing unit 13. The data processing unit 13 configures the light supply state of the light supply selection switch 7 through the DAC setpoint unit 11 so as to load the target test light onto the input end of the target test light channel through a light supply selection channel.

[0069] As explained above, the light supply selection optical switch 7 has multiple light supply selection channels. In order to enable the selection and configuration of the light supply selection channels, Figure 1 and Figure 2 The document illustrates an embodiment of configuring the light supply state of the light supply selection switch 7 using the DAC setpoint unit 11. Specifically, the DAC setpoint unit 11 can drive the light supply selection switch 7 to select the current light supply selection channel. Subsequently, the target test light can be loaded onto the optical channel input port corresponding to the target test optical channel.

[0070] Figure 3 The diagram illustrates an embodiment where the light supply selection optical switch 7 employs a 1×48 type optical switch. In this case, the light supply selection optical switch 7 has 48 output terminals, meaning it can provide a maximum of 48 light supply selection channels. Furthermore... Figure 3 The document also illustrates an embodiment in which the DAC input unit 11 uses a TPC2182 chip. Figure 2 The chip U2 in the diagram is the DAC reference unit 11.

[0071] Figure 3 In this context, U1 is one embodiment of the data processing unit 13, meaning that the data processing unit 13 can employ a commonly used microprocessor chip. When testing the array-type optical switch 17 under test, the data processing unit 13 can drive the light selection optical switch 7 through the DAC setpoint unit 11 according to the state of the target test optical channel, so that the target test light can be loaded onto the target test optical channel.

[0072] To achieve the testing objective of the array-type optical switch 17 under test, the optical signal after passing through the target test optical channel needs to be sampled, detected, and processed. In one embodiment of this invention, a test processing unit is used to sample, detect, and process the optical signal after passing through the target test optical channel. Specifically, the test processing unit may include a data processing unit 13 and several channel photoelectric conversion detection units. All the channel photoelectric conversion detection units constitute a channel photoelectric conversion detection unit group 10, such as... Figure 2 As shown.

[0073] The channel photoelectric conversion detection unit can sample and process the optical signal output from the corresponding optical channel output port, such as performing photoelectric conversion on the optical signal after the channel and generating a channel test electrical signal. It can be understood that when there is an optical signal after the channel at the output port of the optical channel corresponding to the channel photoelectric conversion detection unit, the output port of the optical channel should be the output port of the target optical channel to be tested.

[0074] In practice, the channel test electrical signal should be transmitted to the data processor 13. The data processor 13 can then send the channel test electrical signal to the test master controller 15, so that the test master controller 15 can perform test analysis on the array optical switch 17 under test to determine its test status. It should be noted that the content of the test analysis performed by the test master controller 15 is related to the test type of the array optical switch 17 under test, and should be based on meeting the test requirements of the array optical switch 17.

[0075] In one embodiment of this utility model, the channel photoelectric conversion detection unit includes a channel photoelectric conversion amplification circuit and an ADC conversion circuit adapted and connected to the channel photoelectric conversion amplification circuit, wherein...

[0076] The optical signal after the channel is received by the channel photoelectric conversion and amplification circuit, which includes a channel photodiode and a channel amplifier circuit adapted and connected to the channel photodiode.

[0077] The channel amplifier circuit is connected to the ADC conversion circuit, and the ADC conversion circuit is connected to the data processing unit.

[0078] In practice, each channel photoelectric conversion detection unit can adopt the same form. For example, the channel photoelectric conversion detection unit may include a channel photoelectric conversion amplifier circuit and an ADC (analog-to-digital converter) conversion circuit. In this case, the channel photoelectric conversion amplifier circuit can receive the optical signal after the channel and convert the received optical signal into an electrical signal. After that, the channel test electrical signal can be generated after analog-to-digital conversion by the ADC conversion circuit.

[0079] In one embodiment of this utility model, the channel amplification circuit includes a channel amplifier, wherein...

[0080] The channel amplifier uses a TPA8304 amplifier chip. The input terminal of the amplifier chip is connected to the anode terminal of the channel photodiode, and the cathode terminal of the channel photodiode is connected to the VPBD terminal of the amplifier chip.

[0081] The VSUM terminal of the amplifier chip is grounded through the first capacitor, the VLOG terminal and the BFIN terminal of the amplifier chip are grounded through the second capacitor, and the GND terminal of the amplifier chip is directly grounded.

[0082] The VCC terminal of the amplifier chip is connected to a 5V voltage, and the BFNG terminal of the amplifier chip is connected to VOUT and then connected to the ADC conversion circuit.

[0083] Figure 3 An embodiment of the channel amplifier circuit is shown in the figure. Figure 3 Chips U5 and U8 in the chip are both TPA8304 amplifier chips. Figure 3 In this circuit, the photodiode corresponding to chip U5 is PD1, the first capacitor corresponding to chip U5 is capacitor C1, and the second capacitor corresponding to chip U5 is capacitor C2. When a channel optical signal is received, the channel photodiode can convert the channel optical signal into an electrical signal, which is then amplified by the amplifier chip.

[0084] In practical implementation, the ADC conversion circuit can adopt existing commonly used forms, such as the TPC5120 conversion chip. Figure 3 The image shows an embodiment where the ADC conversion circuit uses a TPC5120 conversion chip and is connected to a corresponding amplifier chip. Figure 3 In this configuration, chip U3 corresponds to chip U5. When chip U3 and chip U5 work together, they form one channel of photoelectric conversion and detection unit. Furthermore, chip U7 and chip U8 work together to form another channel of photoelectric conversion and detection unit.

[0085] Depend on Figure 3 It is known that all the conversion chips are connected to the data processing unit 13, thereby transmitting all the converted channel test electrical signals to the data processing unit 13, so that the data processing unit 13 can then transmit them to the test main controller 15.

[0086] In practice, the spectral photoelectric conversion detection unit 6 can take the same form as the channel photoelectric conversion detection unit. Therefore, the form of the spectral photoelectric conversion detection unit 6 can be referred to the description of the channel photoelectric conversion detection unit here.

[0087] In one embodiment of this utility model, the data processing unit 13 is connected to the data processing USB communication port 14 via the signal conversion interface circuit 20, and is connected to the test main controller 15 via the data processing USB communication port 14. The signal conversion interface 20 is a USB-UART conversion interface circuit.

[0088] Specifically, in order to achieve a compatible connection between the data processing unit 13 and the test controller 15, the data processing unit 13 can be connected to the test controller 15 through the data processing USB communication port 14. Of course, a USB-UART conversion interface circuit should also be used to convert between USB signals and UART signals. Figure 3 The diagram illustrates an embodiment where the data processing unit 13 is connected to the signal conversion interface 20, and then connected to the data processing USB communication interface 14 via the signal conversion interface 20, ultimately achieving an electrical connection with the test main controller 15. When using... Figure 3 When using the connection method, the channel test electrical signal can be transmitted to the test main controller 15.

[0089] In one embodiment of this utility model, one light selection channel of the light selection switch 7 is adapted to the power meter 2 via the power meter LC flange 4, so as to use the power meter 2 to measure the optical power of the target test light, and the power meter 2 is electrically connected to the test main controller 15.

[0090] In order to monitor the power of the light source, Figure 1 and Figure 2 The diagram also shows an embodiment in which one of the light selection channels of the light selection switch 7 is adapted to the power meter 2 via the power meter LC flange 4. In this case, the optical power of the target test light can be measured by the power meter 2. When the power meter 2 is electrically connected to the test controller 15, the optical power of the target test light can be transmitted to the test main controller 15.

[0091] Specifically, the function of the power meter LC flange 4 is the same as that of the light source LC flange 3 mentioned above, that is, both can provide stability for optical transmission. In addition, the power meter LC flange 4 and the light source LC flange 3 can be implemented using an existing double flange. The method of forming the power meter LC flange 4 and the light source LC flange 3 using a double flange is consistent with the existing technology, and will not be elaborated here.

[0092] In specific implementation, the array-type optical switch 17 under test includes an uplink optical path module and a downlink optical path module, wherein...

[0093] The uplink optical path module provides the uplink optical channel, and the downlink optical path module provides the downlink optical channel.

[0094] The number of light supply selection channels provided by the light supply selection switch 7 is not less than the sum of the number of uplink optical channels and downlink optical channels.

[0095] Specifically, if the optical switch under test 17 is of type MCS, then the optical switch under test 17 may include an uplink optical path module and a downlink optical path module. It should be noted that the uplink optical path module and the downlink optical path module specifically refer to different directions of light propagation. Figure 1 In the example shown, the left side can be the downlink optical path module, and the right side can be the uplink optical path module. In the direction shown in the figure, in the uplink optical path module, the target test light is loaded from above and output from below; in the downlink optical path module, the target test light is loaded from below and output from above.

[0096] Figure 2 In the process, the optical selection switch 7 is connected to the corresponding optical channel input port of the array-type optical switch 17 under test via the optical input MT jumper interface 8, such as... Figure 2 In the diagram, CH1_I1 to CH1_I16 are 16 output terminals corresponding to the light supply selection optical switch 7. These 16 output terminals can be connected to the optical channel input ports corresponding to the downlink optical path module. CH17_A1 to CH40_A24 are 24 output terminals corresponding to the light supply selection optical switch 7. These 24 output terminals can be connected to the optical channel input ports corresponding to the uplink optical path module.

[0097] Figure 2 In the middle, the corresponding optical channel output ports of the uplink optical path module and the downlink optical path module are connected to the channel photoelectric conversion detection unit group through the optical output MT jumper interface 9. The optical output MT jumper interface 9 and the optical input MT jumper interface 8 can adopt the existing common forms, based on the ability to meet the transmission of optical input and optical output.

[0098] In practice, the tests performed on the array-type optical module under test may include tests for line sequence, insertion loss, crosstalk, and minimum insertion loss during scanning. The meanings of tests for line sequence, insertion loss, crosstalk, and minimum insertion loss during scanning are consistent with existing ones and are well known to those skilled in the art, and will not be elaborated here.

[0099] As can be seen from the above description, when performing the above test, the test main controller 15 can be used to configure the optical channel state of the array optical switch 17 under test. After that, the target test light can be loaded into the target optical channel under test, and the optical signal after the channel can be sampled and processed by the test processing unit. Finally, the test main controller 15 can analyze and process the test data, which can obtain the test state of line sequence, insertion loss, crosstalk and scan minimum insertion loss. The specific method and process of analyzing and obtaining the test state can be consistent with the existing technology, and will not be described in detail here.

Claims

1. A test system suitable for array-type optical switches, characterized in that, The testing system includes: The test main controller is adapted and connected to the array optical switch under test to configure the optical channel state of the array optical switch under test, so as to form the target optical channel under test based on the configured optical channel state; The test optical path unit, adapted and connected to the input terminals of the optical channels provided by the test main controller and the array-type optical switch under test, is used to load target test light onto the target optical channel under test. It includes at least a test light source and a light supply selection optical switch adapted and connected to the test light source. The light supply selection optical switch has several light supply selection channels. The optical channel input port on the array optical switch under test is connected to the light supply selection channel in the light supply selection switch in a one-to-one correspondence. The test main controller configures the test light source to generate the target test light and configures the light supply state of the light supply selection switch so that the target test light is loaded onto the input end of the target test light channel through the corresponding light supply selection channel of the light supply selection switch. The test processing unit, adapted and connected to the output terminals of the optical channels provided by the test main controller and the optical switch under test array, includes at least a data processing unit and several channel photoelectric conversion detection units. A channel photoelectric conversion detection unit is connected to the optical channel output port of an optical channel provided by the array optical switch under test, so as to perform photoelectric conversion on the optical signal output from the connected optical channel through the channel photoelectric conversion detection unit, and transmit the converted channel test electrical signal to the data processing unit; The data processing unit sends the received channel test electrical signals to the test main controller.

2. The test system suitable for array-type optical switches according to claim 1, characterized in that: The test optical path unit also includes a light source LC flange that is adapted and connected to the test light source, wherein... The test light source is connected to the beam splitter via the light source LC flange. The first beam splitter is connected to the optical input terminal of the light supply selection switch so that the target test light is loaded onto the light supply selection switch through the first beam splitter. The second beam splitter is connected to the data processing unit via a beam splitting photoelectric conversion detection unit, wherein the beam splitting ratio between the first beam splitter and the second beam splitter is 2:

98.

3. The test system suitable for array-type optical switches according to claim 1, characterized in that: One of the light selection channels of the light supply selection switch is connected to the power meter adapter via the power meter LC flange to measure the optical power of the target test light using the power meter, and the power meter is electrically connected to the test main controller.

4. The test system suitable for array-type optical switches according to claim 1, characterized in that: The light supply selection switch is electrically connected to the DAC setpoint unit, which is connected to the data processing unit. The data processing unit configures the light supply state of the light supply selection switch through the DAC setpoint unit so as to load the target test light onto the input end of the target test light channel through a light supply selection channel.

5. The test system suitable for array-type optical switches according to any one of claims 1 to 4, characterized in that: The channel photoelectric conversion detection unit includes a channel photoelectric conversion amplification circuit and an ADC conversion circuit adapted and connected to the channel photoelectric conversion amplification circuit, wherein... The optical signal after the channel is received by the channel photoelectric conversion and amplification circuit, which includes a channel photodiode and a channel amplifier circuit adapted and connected to the channel photodiode. The channel amplifier circuit is connected to the ADC conversion circuit, and the ADC conversion circuit is connected to the data processing unit.

6. The test system suitable for array-type optical switches according to claim 5, characterized in that: The channel amplifier circuit includes a channel amplifier, wherein, The channel amplifier uses a TPA8304 amplifier chip. The input terminal of the amplifier chip is connected to the anode terminal of the channel photodiode, and the cathode terminal of the channel photodiode is connected to the VPBD terminal of the amplifier chip. The VSUM terminal of the amplifier chip is grounded through the first capacitor, the VLOG terminal and the BFIN terminal of the amplifier chip are grounded through the second capacitor, and the GND terminal of the amplifier chip is directly grounded. The VCC terminal of the amplifier chip is connected to a 5V voltage, and the BFNG terminal of the amplifier chip is connected to VOUT and then connected to the ADC conversion circuit.

7. The test system suitable for array-type optical switches according to any one of claims 1 to 4, characterized in that: The data processing unit is connected to the data processing USB communication port via a signal conversion interface circuit, and is also connected to the test main controller via the data processing USB communication port. The signal conversion interface is a USB-UART conversion interface circuit.

8. The test system suitable for array-type optical switches according to any one of claims 1 to 4, characterized in that: The test main controller is electrically connected to the switch driver board via the drive USB communication port, and connected to the optical switch array under test via the optical switch driver board, so as to configure the optical channel state of the optical switch array under test using the optical switch driver board.

9. The test system suitable for array-type optical switches according to any one of claims 1 to 4, characterized in that: The array-type optical switch under test includes an uplink optical path module and a downlink optical path module, wherein, The uplink optical path module provides the uplink optical channel, and the downlink optical path module provides the downlink optical channel. The number of optical supply selection channels provided by the optical supply selection switch shall not be less than the sum of the number of uplink optical channels and downlink optical channels.

10. The test system suitable for array-type optical switches according to any one of claims 1 to 4, characterized in that: The test light source includes a wavelength division multiplexer, wherein... The wavelength division multiplexer is connected to the pump source and the attenuator, and the wavelength division multiplexer is connected to the isolator through erbium-doped fiber, and the test source light is output through the isolator.

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