Comprehensive experiment development board
By integrating the UNO core control module and multiple functional test modules into a comprehensive experimental development board, the problem of complex hardware construction of traditional Arduino UNO development boards has been solved, achieving the effects of simplified circuit connection and improved learning efficiency.
Patent Information
- Application Number
- CN202422952516.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-02
- Publication Date
- 2025-11-18
- Estimated Expiration
- 2034-12-02
AI Technical Summary
Traditional Arduino UNO development boards require complex circuit setups for experimental operation, causing users, especially beginners, to spend a lot of time and energy on hardware setup in the initial learning stage, affecting experimental and learning efficiency.
Design a comprehensive experimental development board that integrates the UNO core control module and multiple functional test modules. Simple connections between modules are achieved through functional area communication components and jumper interfaces, supporting multiple experimental functions while reducing the difficulty of hardware setup.
It improves the efficiency of experimental operations and software development, enabling beginners to focus on application experiments, simplifies the circuit building process, and enhances learning and development efficiency.
Smart Images
Figure CN223566228U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The utility model relates to integrated circuit technical field, especially a comprehensive experiment development board. BACKGROUND
[0002] Arduino is a microelectronic control application platform from Italy, and is widely used in various engineering fields and educational scenes of computer control and embedded systems because of its simple and easy use and powerful function. Among them, Arduino UNO is the most typical application model, and is also the basis that developers must learn and master.
[0003] The traditional UNO development board generally only contains the most basic control chip, and each IO interface is led out by a row of mothers, which has poor compatibility with mainstream operating systems and few available interfaces. Therefore, in the experiment operation, it must be matched with Dupont wire, breadboard and various discrete electronic components to build a circuit before operation, which is not only more complicated but also prone to errors. Some of these errors are caused by the lack of relevant electrical knowledge of the user, some are caused by the lack of experimental hands-on ability, and some are caused by the lack of quality of devices, wires and other materials. These all seriously affect the practical experience of users, especially beginners, and they have to spend more energy on electronic circuits at the initial stage of learning and cannot focus on application experiments themselves, resulting in low efficiency of experiments and learning. SUMMARY
[0004] The utility model aims at providing a kind of comprehensive experiment development board, based on Arduino UNO core, the extension and integration of multiple experimental functions, reduce the difficulty of hardware function module building in experimental process or software development process, improve experimental operation efficiency and software development efficiency.
[0005] The technical scheme adopted by the present application is as follows: a comprehensive experiment development board, comprising a circuit substrate and a UNO core control module disposed on the circuit substrate, and a plurality of function test modules;
[0006] Each of the function test modules has a corresponding function area on the circuit substrate, and each function area is marked with a corresponding function test type.
[0007] The UNO core control module includes a UNO core processor and a communication unit, the communication unit includes at least a host computer communication component and a function area communication component, the programming interface of the UNO core processor is connected to the programming and debugging data through the host computer communication component, and the function area communication component includes a plurality of jumper interfaces for communication connection with a plurality of function test modules.
[0008] Each of the function test modules comprises an experiment module which is welded or connected to the corresponding function area through a plug-in interface; and each of the function test modules is communicatively connected to the UNO core control module through a substrate wiring or a jumper interface.
[0009] Optionally, the upper computer communication assembly comprises a USB interface unit, an infrared interface unit and a Bluetooth interface unit.
[0010] In the USB interface unit, a USB control chip is welded to a substrate circuit and is communicatively connected to an RS232 serial port of the UNO core processor; in the infrared interface unit, an infrared receiving tube is connected to a busbar and is electrically connected to an SPI serial port receiving end of the UNO core processor through a substrate wiring, and an infrared transmitting tube is electrically connected to an SPI serial port transmitting end of the UNO core processor through a substrate wiring; and in the Bluetooth interface unit, a Bluetooth adapter is connected to a busbar and is electrically connected to an RS232 serial port of the UNO core processor through a substrate wiring.
[0011] Optionally, the UNO core processor adopts a QFP packaged ATMEGA328P-AU, thereby saving a board space and reducing crowding of original components; in the USB interface unit, a USB control chip adopts a chip CH340, and a USB interface adopts a Type-C interface, so that a connection data line is more easily obtained and can bear a larger transmission current.
[0012] Optionally, the function area communication assembly comprises a first jumper interface group and a second jumper interface group for interacting digital signals, a third jumper interface group for interacting analog signals, and a power signal interface group; wherein the second jumper interface group comprises a jumper interface for interacting serial port communication signals.
[0013] On the circuit substrate, the first jumper interface group, the second jumper interface group and the third jumper interface group are respectively marked with corresponding interface type marks.
[0014] Optionally, the jumper interfaces in the function area communication assembly of the UNO core control module, the jumper interfaces of each function test module for connecting the UNO core control module, and the plug-in interfaces of each function test module for plugging in corresponding experiment modules respectively adopt jumper components of different colors.
[0015] Optionally, the jumper interfaces in the function area communication assembly of the UNO core control module adopt black busbars or bus plugs; the plug-in interfaces of each function test module for plugging in corresponding experiment modules adopt blue busbars or bus plugs; and the jumper interfaces between each function test module and the UNO core control module adopt yellow busbars or bus plugs. This embodiment enables a user to intuitively distinguish the types of the interfaces through the colors of the interfaces, thereby preventing use errors.
[0016] Further, the jumper interface in the function area communication assembly of the UNO core control module adopts a series of row plugs and row sockets to expand each interface to two, facilitating the use of different connectors of the Dupont line.
[0017] Optionally, the substrate is further provided with a jumper placement area, and a plurality of jumper caps are sequentially arranged and fixed in the jumper placement area. The jumpers that are not needed can be placed in the jumper placement area to avoid loss.
[0018] Optionally, the plurality of function test modules include an ordinary LED test module, a temperature sensor test module, a reset test module, a full-color LED test module, a 3-digit code switch test module, a motor test module, a multi-channel steering engine test module, an ultrasonic test module, an LCD test module, and a buzzer test module.
[0019] Optionally, the comprehensive experiment development board further comprises a power module for converting an external power supply into voltage sources of multiple voltage grades, wherein the voltage sources of different voltage grades are provided with different power jumper interfaces, each power jumper interface adopts a red row plug or row socket, and corresponding voltage grade identifiers are arranged on the circuit substrate.
[0020] Advantages
[0021] The comprehensive experiment development board module of the utility model, a plurality of function test modules and UNO core control module can be matched to complete complex control and project development, have excellent integration, and the jumper interfaces of each function test module can be conveniently connected with the interfaces of the UNO core control module through jumpers, so that multiple typical control experiments can be completed without complex wiring, and the utility model can be used for teaching and training of related technologies, and can be used for engineering verification and development of computer control and embedded systems. BRIEF DESCRIPTION OF DRAWINGS
[0022] Figure 1 Fig. 2 shows a PCB layout schematic diagram of the comprehensive experiment development board in an embodiment of the utility model;
[0023] Figure 2 Fig. 3 shows a PCB layout schematic diagram of the comprehensive experiment development board in another embodiment of the utility model; Figure 1 Fig. 4 shows a PCB layout schematic diagram corresponding to the embodiment;
[0024] Figure 3 Fig. 5 shows a UNO core processor and part of the peripheral circuit principle schematic diagram of the comprehensive experiment development board in an embodiment of the utility model;
[0025] Figure 4 Fig. 6 shows a circuit principle schematic diagram of the plurality of function test modules of the comprehensive experiment development board in an embodiment of the utility model;
[0026] Figure 5 Figure 1 shows a power unit part circuit schematic diagram of the comprehensive experiment development board in an embodiment of the present application;
[0027] Figure 6 Figure 2 shows a communication unit part circuit schematic diagram of the comprehensive experiment development board in an embodiment of the present application. DETAILED DESCRIPTION
[0028] The application will be further described below in combination with the drawings and specific embodiments.
[0029] The present application aims to utilize the powerful application function of the microelectronic control application platform Arduino to realize an experiment development board capable of integrating multiple test functions, which can support independent test of each function or test of multiple functions at the same time under the condition that the IO ports do not conflict, without complex external circuits, simple operation, so that the user, especially beginners, can focus on the development and programming of the program, be flexibly applied to various experimental practices and project development, and reduce the learning difficulty and improve the learning and development efficiency.
[0030] Embodiment 1
[0031] This embodiment introduces a comprehensive experiment development board, which refers to Figures 1 to 6 , which comprises a circuit substrate, a UNO core control module arranged on the circuit substrate, and multiple function test modules; each of the function test modules is respectively provided with a corresponding function area on the circuit substrate, and each function area is respectively marked with a corresponding function test type, such as Figures 1 to 2 ;
[0032] The UNO core control module comprises a UNO core processor and a communication unit, the communication unit at least comprises a host computer communication component and a function area communication component, the programming interface of the UNO core processor accesses programming debugging data through the host computer communication component, and the function area communication component comprises multiple jumper interfaces for communication connection of multiple function test modules.
[0033] Each of the function test modules comprises an experiment module, which is welded or connected to the corresponding function area through a plug-in interface; each of the function test modules is in communication connection with the UNO core control module through substrate wiring or a jumper interface.
[0034] In this embodiment, the UNO core processor adopts QFP package ATMEGA328P-AU, which can save board space and reduce the crowding of original component arrangement. The plurality of function test modules include: ordinary LED test module, temperature sensor test module, reset test module, full-color LED test module, 3-digit code switch test module, motor test module, multi-channel steering gear test module, ultrasonic test module, LCD test module, and buzzer test module, etc. Figure 4 .
[0035] In combination with Figure 1 , Figure 3 , Figure 4 and Figure 6 , the upper computer communication assembly includes a USB interface unit, an infrared interface unit and a Bluetooth interface unit. The function area communication assembly includes a first jumper interface group IOL1, TOL2 and a second jumper interface group IOH1, TOH2 for interacting digital signals, a third jumper interface group ANALOG_IN1, ANALOG_IN2 for interacting analog signals, and a power signal interface group POWER1, POWER2; wherein the second jumper interface group includes jumper interfaces MOSI, MISO for interacting serial communication signals; on the circuit substrate, the first jumper interface group, the second jumper interface group and the third jumper interface group are respectively marked with corresponding interface type marks. As shown in Figure 3 and in combination with Figures 1 to 2 , the jumper interfaces in the function area communication assembly adopt series extension sockets and sockets to expand each interface to two, facilitating the use of different joint Dupont wires.
[0036] Referring to Figure 6 , in the USB interface unit, the USB control chip adopts chip CH340, and the USB interface adopts Type-C interface, making it easier to obtain connection data lines and able to withstand greater transmission current. The USB control chip is welded to the substrate circuit and is communicatively connected to the RS232 serial port PD1, PD0 of the UNO core processor. Referring to Figure 4 , in the infrared interface unit, the infrared receiving tube is connected by socket P2 and is electrically connected to the SPI serial port receiving end of the UNO core processor through the substrate wiring, and the infrared transmitting tube IR1 is electrically connected to the SPI serial port transmitting end of the UNO core processor through the substrate wiring. In the Bluetooth interface unit, the Bluetooth adapter is connected by socket P11 and is electrically connected to the RS232 serial port of the UNO core processor through the substrate wiring.
[0037] Referring to Figure 1 and Figure 2As shown, in the embodiment, the jumper interface in the functional area communication assembly of the UNO core control module, the jumper interface for connecting the UNO core control module in each functional test module, and the plug-in interface for plugging the corresponding experimental module in each functional test module are respectively provided with interface pieces of different colors.
[0038] Specifically, the jumper interface in the functional area communication assembly of the UNO core control module is provided with black row plugs or row sockets; the plug-in interface for plugging the corresponding experimental module in each functional test module is provided with blue row plugs or row sockets; and the jumper interface between each functional test module and the UNO core control module is provided with yellow row plugs or row sockets. This embodiment enables the user to intuitively distinguish the type of the interface through the color of the interface, thereby preventing the use of errors.
[0039] The embodiment further has a jumper placement area on the circuit substrate, and a plurality of jumper caps are sequentially arranged and fixed in the jumper placement area. The jumpers that are not needed can be placed in the jumper placement area, thereby avoiding loss.
[0040] Reference Figure 5 The comprehensive experimental development board of the embodiment further includes a power module for converting an external power supply into voltage sources of multiple voltage grades, wherein different voltage sources of different voltage grades are provided with different power jumper interfaces, each power jumper interface is provided with a red row plug or row socket, and a corresponding voltage grade identifier is provided on the circuit substrate.
[0041] The comprehensive experimental development board of the embodiment can realize a full-compliant standard UNO software and hardware development environment, integrates 15 independent experimental modules, has three groups of power output, multiple wired / wireless programming / debugging modes, supports all Windows operating systems, and has good compatibility.
[0042] Specifically, reference is made to 3 to Figure 6 :
[0043] As Figure 4 , in the LED test functional area, four light-emitting diodes LED1-LED4 are welded to the substrate circuit, and then connected to digital IO2 / 3 / 4 / 5 through the jumper via the row pin J1, thereby forming an ordinary LED test module.
[0044] In the digital temperature measurement functional area, an external DS18B20 digital temperature measurement module is provided in the functional area via the row socket DS1, and then connected to the core processor digital IO12 port via the jumper via the row pin J2, thereby forming a digital temperature measurement module, i.e., a temperature sensor test module.
[0045] In the steering engine test function area, the output pin P5-P8 of the four-way external steering engine is connected with the pin of the steering engine module through the jumper, and then connected with the digital IO6 / 7 / 8 / 9 port of the core processor through the substrate wire, to form a four-way steering engine test module, i.e. a multi-way steering engine test module.
[0046] The three-position dial switch S3 is welded in the dial switch function area, and the dial output signal KEYB is led out through the jumper and connected with the digital IO6 / 7 / 8 port of the core processor, to form a three-position dial switch test module.
[0047] In the reset function area, two self-reset button switches connected with the pin J4 through the substrate wire are connected with the digital IO6 / 7 port of the core processor through the J4 jumper, to form a self-reset switch test module.
[0048] In the motor test function area, the motor drive chip TB6612FNG is connected with the substrate line and the pin PT1-PT3, and then connected with the digital IO2 / 3 / 4 / 5 / 6 / 7 port of the core processor through the PT1-PT3 jumper, to form a double-way direct current motor / two-phase stepping motor test module.
[0049] The passive buzzer D13 and its peripheral circuit are connected with the digital IO13 of the core processor through the pin jumper, to form a buzzer test module.
[0050] In the full-color LED test function area, the full-color light-emitting diode is connected with the digital IO9 / 10 / 11 of the core processor through the pin jumper, to form a full-color LED test module.
[0051] In the ultrasonic test function area, the ultrasonic sensor is connected with the digital IO12 / 13 of the core processor through the jumper, to form an ultrasonic function test module.
[0052] In the LCD module function test area, the 0.96 inch OLCD screen can be connected with the substrate line through the pin, and then connected with the IIC interface of the core processor, to form an OLED display control module.
[0053] The WS2812B full-color lamp strip control chip is connected with the digital IO10 of the core processor through the jumper header2, to form a four-position full-color LED lamp strip control module.
[0054] Two 3362 adjustable resistors are connected with the analog input A0 / A1 of the core processor through the jumper, to form an analog input control module
[0055] The embodiments of the present application are described above with reference to the accompanying drawings, but the present application is not limited to the above-described specific embodiments, and the above-described specific embodiments are merely illustrative, but not restrictive, and a person of ordinary skill in the art can make many forms under the inspiration of the present application without departing from the purpose of the present application and the scope protected by the claims, and these all belong to the protection of the present application.
Claims
1. An integrated experimental development board, characterized by, The UNO core control module and a plurality of function test modules are arranged on the circuit substrate. Each of the function test modules is provided with a corresponding function area on the circuit substrate, and each function area is marked with a corresponding function test type. The UNO core control module comprises a UNO core processor and a communication unit, the communication unit comprises at least a host computer communication component and a function area communication component, the programming interface of the UNO core processor accesses programming debugging data through the host computer communication component, and the function area communication component comprises a plurality of jumper interface for communication connection with the plurality of function test modules. Each of the function test modules comprises an experiment module, and the experiment module is welded or connected to the corresponding function area through the plug-in interface.
2. The comprehensive experimental development board according to claim 1, characterized in that, The host computer communication component comprises a USB interface unit, an infrared interface unit and a Bluetooth interface unit. In the USB interface unit, the USB control chip is welded to the substrate circuit and is connected to the RS232 serial port of the UNO core processor; in the infrared interface unit, the infrared receiving tube is connected to the SPI serial port receiving end of the UNO core processor through the substrate wiring, and the infrared transmitting tube is connected to the SPI serial port transmitting end of the UNO core processor through the substrate wiring; in the Bluetooth interface unit, the Bluetooth adapter is connected to the RS232 serial port of the UNO core processor through the substrate wiring.
3. The integrated experimental development board of claim 2, wherein, The UNO core processor adopts QFP packaging ATMEGA328P-AU; in the USB interface unit, the USB control chip adopts chip CH340, and the USB interface adopts Type-C interface.
4. The integrated experimental development board of claim 1, wherein, The function area communication component comprises a first jumper interface group and a second jumper interface group for interacting digital signals, a third jumper interface group for interacting analog signals, and a power signal interface group; the second jumper interface group comprises a jumper interface for interacting serial communication signals. On the circuit substrate, the first jumper interface group, the second jumper interface group and the third jumper interface group are marked with corresponding interface type marks.
5. The integrated experimental development board of claim 4, wherein, The jumper interfaces in the function area communication component of the UNO core control module, the jumper interfaces of each function test module for connecting the UNO core control module, and the plug-in interfaces of each function test module for plugging the corresponding experiment modules are respectively provided with interface pieces of different colors.
6. The integrated experimental development board of claim 5, wherein, The jumper interfaces in the function area communication component of the UNO core control module adopt black row plugs or row mothers; the plug-in interfaces of each function test module for plugging the corresponding experiment modules adopt blue row plugs or row mothers; and the jumper interfaces between each function test module and the UNO core control module adopt yellow row plugs or row mothers.
7. The integrated experimental development board of claim 6, wherein, The jumper interfaces in the function area communication component of the UNO core control module adopt series-connected row plugs and row mothers to expand each interface to two.
8. The integrated experimental development board of any of claims 1-7, wherein, The circuit substrate is further provided with a jumper placement area, and a plurality of jumper caps are sequentially arranged and fixed in the jumper placement area.
9. The integrated experimental development board of any of claims 1-7, wherein, The plurality of function test modules include: a common LED test module, a temperature sensor test module, a reset test module, a full-color LED test module, a 3-position code switch test module, a motor test module, a multi-channel steering engine test module, an ultrasonic test module, an LCD test module, and a buzzer test module.
10. The integrated experimental development board of any of claims 1-7, wherein, The power module is further included for converting an external power supply into voltage sources of multiple voltage grades, wherein different voltage sources of different voltage grades are provided with different power jump line interfaces, each power jump line interface adopts a red row plug or row female, and corresponding voltage grade labels are arranged on the circuit substrate.