Static test fixture

Abstract

The utility model discloses a static test fixture. The static test fixture comprises a base, a fixture and a clamping mechanism, the clamping mechanism is arranged on the base, the clamp can be placed on the base, a plurality of lifting driving pieces are arranged on the base, an installation block is arranged at the output end of each lifting driving piece, the clamp is provided with a corresponding locking hole, and the output ends of the lifting driving pieces are arranged in the locking holes in a penetrating mode. The locking holes comprise a first hole and a second hole which are different in diameter and communicated with each other, and the diameter of the mounting block is larger than that of the second hole and smaller than that of the first hole. According to the static test clamp, the lifting driving piece is matched with the locking hole, so that the clamp is convenient and simple to replace, the buffer pressing of the clamp can be realized through the arrangement of the damper, and the clamp is protected from being damaged by impact. And the clamp can slide out freely, so that friction and collision are avoided, and the durability of the clamp is greatly enhanced.

Description

TECHNICAL FIELD

[0001] The utility model relates to test fixture technical field, concretely relates to a static test fixture. BACKGROUND

[0002] Power semiconductor, also known as power electronic device or power electronic device, is one of the most core devices in the electronic industry chain. It can realize power conversion and circuit control, and mainly plays the role of power conversion, power amplification, power switching, line protection, inversion (DC to AC) and rectification (AC to DC) in the circuit.

[0003] Power semiconductor includes power semiconductor discrete devices (including modules) and power ICs. Among them, according to the structure of the device, power semiconductor discrete devices can be divided into diodes, thyristors and transistors.

[0004] Chinese patent document CN215728602U discloses a set of IGBT device static test fixture suitable for various packaging, the protected right " needs to replace the upper clamp of different packaging, pull the upper clamp fixed clamp, make the upper clamp fixed clamp cancel the fixation of probe test board and module fixed plate, at this time, pull the upper clamp handle, probe test board and module fixed plate can be separated from the female clamp, take out another packaging upper clamp, make the probe test board embedded in the inside of the female clamp, press the upper clamp fixed clamp, make the probe test board and module fixed plate fixed successfully, complete the replacement of the upper clamp, make the same female clamp can correspond to the use of different packaging upper clamp, reduce the production cost. The connection between the upper and lower clamps is fixed by pressing the upper clamp fixed clamp, the fixing effect is poor, and the artificial pressing behavior has error, which is easy to cause clamp wear, and too long pressing stroke is also easy to damage the probe. The design of the 53 groups of contact points of the female clamp has the possibility of poor contact, and the contact points are less, the overcurrent capacity is poor, and there is a risk of sparking when the current is too large.

[0005] Therefore, it is urgent to design a better static test fixture. UTILITY MODEL CONTENT

[0006] In view of the above problems existing in the prior art, a static test fixture is provided.

[0007] The specific technical scheme is as follows:

[0008] A static test fixture mainly comprises a base, a clamp and a clamping mechanism.

[0009] The clamping mechanism is arranged on the base, the clamp is arranged on the base, the base is provided with a plurality of lifting driving elements, the output end of each lifting driving element is provided with a mounting block, the clamp is provided with a corresponding locking hole, the output end of the lifting driving element is arranged in the locking hole, wherein the locking hole comprises two first holes and second holes with different diameters and in communication, the diameter of the mounting block is greater than the diameter of the second hole and less than the diameter of the first hole.

[0010] The static test fixture has the following characteristics: the base is provided with a plurality of dampers, and the clamp is arranged to abut against the dampers.

[0011] The static test fixture has the following characteristics: the base is provided with a first probe area, and the first probe area is provided with a partition strip on both sides.

[0012] The static test fixture has the following characteristics: the clamp comprises a first plate, a side stand, a second plate, and a PCB bracket.

[0013] The side stand is provided with a plurality of side stands, the plurality of side stands are arranged around the first plate, the second plate is arranged on the side stand, the locking hole is arranged on the first plate, and the PCB bracket is movably arranged on the second plate.

[0014] The static test fixture has the following characteristics: the second plate is provided with a second probe area.

[0015] The static test fixture has the following characteristics: the first plate is provided with a plurality of openings.

[0016] The static test fixture has the following characteristics: the PCB bracket comprises a first bracket plate and a second bracket plate, the second bracket plate is connected with the first bracket plate, and the first bracket plate is movably connected with the second plate.

[0017] The static test fixture has the following characteristics: the PCB bracket is movably connected with the clamp through a plurality of guide columns.

[0018] The static test fixture has the following characteristics: a plurality of elastic columns are arranged between the PCB bracket and the clamp.

[0019] The static test fixture has the following characteristics: the clamping mechanism comprises a stand and a quick clamp arranged on the stand, and the quick clamp is provided with a pressing block directed to the clamp.

[0020] The technical scheme has the following advantages:

[0021] The utility model provides a static test fixture, through the cooperation of elevating drive part and lock hole, realize the support clamping of fixture and take out, when elevating drive part opens, the output end of elevating drive part stretches into lock hole, can lock fixture on base by closing elevating drive part, can take down fixture by opening elevating drive part again, realized the replacement of fixture, convenient and simple replacement, the setting of damper can realize the buffer of fixture and press down, protected the impact damage of fixture. BRIEF DESCRIPTION OF DRAWINGS

[0022] Figure 1 It is the whole structure schematic diagram of the static test fixture provided by the utility model;

[0023] Figure 2 It is Figure 1 It is the structure schematic diagram of removing one side stand;

[0024] Figure 3 It is Figure 1 It is the structure schematic diagram of removing fixture;

[0025] Figure 4 It is the structure schematic diagram of fixture provided by the utility model;

[0026] Figure 5 It is Figure 1 It is the structure schematic diagram of bottom view.

[0027] In the drawing: 1, base;11, first probe area;2, fixture;201, lock hole;2011, first hole;2012, second hole;21, first board;211, opening;22, second board;222, second probe area;23, side stand;24, elastic column;241, first bracket board;242, second bracket board;25, guide column;3, clamping mechanism;31, stand;32, quick clamp;33, pressing block;4, elevating drive part;5, damper;6, baffle pressing strip;82, second probe mounting plate. DETAILED DESCRIPTION

[0028] In order to make the utility model's purpose, technical scheme and advantage more clear and obvious, following through embodiment, and combining with the drawing, this utility model is further detailedly explained. It should be understood that the specific embodiment described here is only used to explain the utility model, and is not used to limit the utility model.

[0029] The serial numbers assigned to components in this document, such as "first" and "second," are used only to distinguish the described objects and have no sequential or technical meaning. The terms "connection" and "linkage" used in this application, unless otherwise specified, include both direct and indirect connections (linkages). In the description of this utility model, it should be understood that the terms "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," and "counterclockwise," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are used only for the convenience of describing this utility model and for simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this utility model.

[0030] In this utility model, unless otherwise explicitly specified and limited, "above" or "below" the second feature can mean that the first feature is in direct contact with the second feature, or that the first feature is in indirect contact with the second feature through an intermediate medium. Furthermore, "above," "on top of," and "over" the second feature can mean that the first feature is directly above or diagonally above the second feature, or simply that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature can mean that the first feature is directly below or diagonally below the second feature, or simply that the first feature is at a lower horizontal level than the second feature.

[0031] Please see Figures 1 to 5 This utility model discloses a static test fixture, which includes: a base 1, a fixture 2 and a clamping mechanism 3;

[0032] The clamping mechanism 3 is mounted on the base 1, and the clamp 2 can be placed on the base 1.

[0033] Specifically, in this embodiment, the base 1 is a box structure with one side open. Optionally, in other embodiments, the base 1 can be a block or a closed box structure. The open side of the base 1 can be placed on a table or other structure, and a clamp 2 and a clamping mechanism 3 are provided on the side of the base 1 opposite to the open side.

[0034] The clamping mechanism 3 includes a stand 31 and a quick clamp 32 disposed on the stand 31. The quick clamp 32 is provided with a pressure block 33 pointing towards the clamp 2.

[0035] Specifically, the pressing block 33 points to the clamp 2, and by wiggling the quick clamp 32, the pressing block 33 can be driven to press down or release the clamp 2. The materials of the pressing block 33 and the clamp 2 are selected to be high polymer materials resistant to high temperature, which are relatively soft and will not damage the module, and will not be deformed in high temperature test. The high temperature resistant material enables the clamp 2 to work in high temperature working conditions, enriching the extreme working conditions of the module test, and the module is in close contact with the probe of the clamp 2 through pressing.

[0036] The base 1 is provided with a plurality of lifting driving members 4. Optionally, the lifting driving member 4 can be a pneumatic cylinder, a hydraulic cylinder or an electric cylinder. Optionally, in the embodiment, the lifting driving member 4 is provided with two, which are respectively arranged on the two sides of the clamp 2 to support the clamp 2 from both sides. Of course, the lifting driving member 4 can also be provided with three or more to realize more stable support of the clamp 2. The number of the lifting driving member 4 is only for illustration and is not used to limit the utility model.

[0037] Further, in the embodiment, the base 1 is provided with a plurality of dampers 5, and the clamp 2 can abut against the damper 5. The damper 5 is a device for providing resistance to movement and dissipating kinetic energy. The damper 5 is installed on the base 1, and the head of the damper 5 can abut against the clamp 2. Preferably, the head of the damper 5 is provided in an oval shape to protect the clamp 2 from impact damage. Optionally, in the embodiment, the damper 5 is provided with four, which are dispersedly arranged at the bottom of the clamp 2 to stably support the clamp 2. Optionally, the damper 5 can be provided with three or more, which are only for illustration and are not used to limit the utility model. The basic characteristics of the damper 5 selected in the embodiment are: 1. The main parts are made of stainless steel, which is firm and durable; 2. The damping force is large, and the dynamic response time is short; 3. The effective stroke of the damping should be between 150mm to 500mm; 4. The damper 5 needs to be resistant to high temperature and has the ability to work in high temperature conditions for a long time.

[0038] The output end of each lifting drive 4 is provided with a mounting block (not shown in the figure), and the clamp 2 is provided with a corresponding locking hole 201, and the output end of the lifting drive 4 is arranged in the locking hole 201, wherein the locking hole 201 includes two first holes 2011 and second holes 2012 with different diameters and in communication, the diameter of the mounting block is greater than the diameter of the second hole 2012 and less than the diameter of the first hole 2011, so that the mounting block can pass through the first hole 2011 as a whole and cannot pass through the second hole 2012, thereby realizing the connection between the lifting drive 4 and the clamp 2. After the lifting drive 4 enters the second hole 2012 with a smaller diameter, the clamp 2 cannot be pulled out of the locking hole 201, the lifting drive 4 is retracted, and the mounting block and the clamp 2 are slowly clamped. The diameter of the second hole 2012 is matched with the diameter of the output end of the lifting drive 4, so that the output end of the lifting drive 4 can smoothly enter the second hole 2012 and smoothly slide in it.

[0039] Optionally, in the embodiment, the base 1 is provided with a first probe area 11. In a specific embodiment, the first probe area 11 is provided with 24 sub-area contacts. For example, the design of the female clamp with 53 groups of contacts in the prior art has the possibility of poor contact, and the contact is less and the overcurrent capacity is poor, and there is a risk of sparking when the current is too large. However, in the design of 24 sub-area contacts in the embodiment, the contact can be increased by pressing down to reduce the risk of poor contact, and the contact is more and the overcurrent capacity is good, and there is no risk of sparking when the current is too large. The selection of power and signal probes requires: 1. The contact area of the probe head is large; 2. The probe is plated with gold or silver; 3. The probe is divided into two sections, which will reduce the transition resistance and reduce heat generation after pressing.

[0040] Further, the first probe area 11 is provided with a baffle pressing strip 6 on both sides. The baffle pressing strip 6 can be used to control the maximum stroke of the damper 5. The damper 5 is arranged on the side of the baffle pressing strip 6 away from the first probe area 11.

[0041] Specifically, in the embodiment, the clamp 2 includes a first plate 21, a side stand plate 23, a second plate 22, and a PCB bracket.

[0042] The side stand plate 23 is provided with a plurality of side stand plates 23, and the plurality of side stand plates 23 are arranged around the first plate 21. The second plate 22 is arranged on the side stand plate 23, the locking hole 201 is arranged on the first plate 21, and the PCB bracket is movably arranged on the second plate 22.

[0043] For example, four side plates 23 are provided, and the four side plates 23 are sequentially connected in a head-to-tail manner to surround the first plate 21. The second plate 22 is arranged on the side plates 23. The first plate 21, the four side plates 23, and the second plate 22 form a box structure in the shape of a quadrangular prism. The two ends of the first plate 21 protrude beyond the second plate 22 and the side plates 23. The protruding portions can be used as handles to facilitate holding the entire clamp 2. The locking hole 201 is arranged on the handle of the first plate 21.

[0044] Optionally, the second plate 22 is provided with a second probe area 222.

[0045] The first probe area 11 and the second probe area 222 can be directly provided with probes or provided with probes through probe mounting plates. The probes are arranged on the probe mounting plates, and the probe mounting plates are arranged on the target positions. For example, in the embodiment, the probes are arranged on the probe mounting plates, and the probe mounting plates are arranged on the base 1 and the second plate 22. The first probe mounting plate (not shown in the figure) is detachably arranged on the base 1, and the second probe mounting plate 82 is detachably arranged on the second plate 22. Optionally, in the embodiment, the first probe mounting plate can be arranged between the first plate 21 and the partitioning strip 6 on the base 1.

[0046] In order to realize the extension of the probes from the box structure to the second probe area 222 on the second plate 22, a plurality of openings 211 are arranged on the first plate 21.

[0047] The PCB bracket includes a first bracket plate 241 and a second bracket plate 242. The second bracket plate 242 is connected with the first bracket plate 241. The first bracket plate 241 is movably connected with the second plate 22.

[0048] The PCB bracket is movably connected with the clamp 2 through a plurality of guide columns 25.

[0049] Specifically, in the embodiment, a plurality of guide columns 25 are arranged between the first bracket plate 241 and the second plate 22. The guide columns 25 play a guiding role. A plurality of elastic columns 24 are further arranged between the PCB bracket and the clamp 2. The elastic columns 24 pass through the second bracket plate 242 upward and pass through the second plate 22 downward. After the PCB bracket is pressed downward, the elastic columns 24 can rebound.

[0050] This utility model provides a static testing fixture. Through the cooperation of a lifting drive 4 and a locking hole 201, the fixture 2 is supported, clamped, and removed. When the lifting drive 4 is open, its output end passes through the locking hole 201. Closing the lifting drive 4 locks the fixture 2 onto the base 1. Opening the lifting drive 4 again removes the fixture 2, enabling easy and simple replacement. The damper 5 provides buffering downward pressure on the fixture 2, protecting it from impact damage. The lifting drive 4 allows the fixture 2 to slide freely, avoiding friction and collisions, greatly enhancing its durability. After a period of use, we believe the fixture's durability has increased by more than 50%, and the replacement frequency of new fixtures has decreased by approximately 90%.

[0051] Due to the ever-increasing demands of power semiconductor testing for high-temperature conditions, the operating junction temperature of Si chips has risen from 150℃ in the previous generation to 175℃, and the operating junction temperature of new SiC materials is even higher, reaching up to 200℃. Furthermore, the power density of packages is constantly improving, leading to a growing demand for testing under high-temperature and high-current conditions. To address this need, we improved the materials of the bottom of the quick clamp 32 and the pressure block 33 by using a high-temperature resistant polymer material. According to reports, the material can withstand temperatures above 250℃, is relatively soft and will not damage the module, and will not deform during high-temperature testing, nor will it release foreign matter that could contaminate the product. The original clamping method would fail due to metal deformation caused by high temperatures or prolonged stress and temperature shock, leading to severe metal fatigue and safety hazards. The newly added damper is heat-resistant and capable of operating under high-temperature conditions for extended periods.

[0052] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0053] The above embodiments only illustrate several implementation methods of this utility model, and their descriptions are relatively specific and detailed, but they should not be construed as limiting the scope of this utility model patent. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this utility model, and these all fall within the protection scope of this utility model. Therefore, the protection scope of this utility model patent should be determined by the appended claims.

Claims

1. A static test fixture, characterized by, The utility model relates to a base, clamp and clamping mechanism, and belongs to the technical field of clamping mechanism. The clamping mechanism is arranged on the base, the clamp is placed on the base, the base is provided with a plurality of lifting driving elements, the output end of each lifting driving element is provided with a mounting block, the clamp is provided with a corresponding locking hole, the output end of the lifting driving element is arranged in the locking hole, wherein the locking hole comprises two first holes and second holes with different diameters and in communication, the diameter of the mounting block is greater than the diameter of the second hole and smaller than the diameter of the first hole. The base is provided with a plurality of dampers, and the clamp is in abutment with the dampers.

2. The static test fixture of claim 1, wherein, The base is provided with a first probe area, and the first probe area is provided with a partition strip on both sides.

3. The static test fixture of claim 1, wherein, The clamp comprises a first plate, a side stand, a second plate and a PCB bracket.

4. The static test fixture of claim 1, wherein, The side stand is provided with a plurality of side stands, the plurality of side stands surround the first plate, the second plate is arranged on the side stand, the locking hole is arranged on the first plate, and the PCB bracket is movably arranged on the second plate. The second plate is provided with a second probe area.

5. The static test fixture of claim 4, wherein, The first plate is provided with a plurality of openings.

6. The static test fixture of claim 4, wherein, The PCB bracket comprises a first bracket plate and a second bracket plate, the second bracket plate is connected with the first bracket plate, and the first bracket plate is movably connected with the second plate.

7. The static test fixture of claim 4, wherein, The PCB bracket is movably connected with the clamp through a plurality of guide columns.

8. The static test fixture of claim 7, wherein, A plurality of elastic columns are further arranged between the PCB bracket and the clamp.

9. The static test fixture of claim 8, wherein, The clamping mechanism comprises a stand and a quick clamp arranged on the stand, and the quick clamp is provided with a pressing block directed to the clamp.

10. The static test fixture of any one of claims 1 to 9, wherein, ​

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